[CQ-2235] CQ-2235 High-Speed Small Current Sensor 1. Genaral Description CQ-2235 is an open-type current sensor using a Hall sensor which outputs the analog voltage proportional to the AC/DC current. Quantum well ultra-thin film InAs (Indium Arsenide) is used as the Hall sensor, which enables the high-accuracy and high-speed current sensing. Simple AI-Shell package with the Hall sensor, magnetic core, and primary conductor realizes the space-saving and high reliability. 2. Feartures - Bidirectional type - Electrical isolation between the primary conductor and the sensor signal - 3.3V single supply operation - Ratiometric output - Low variation and low temperature drift of sensitivity and offset voltage - Low noise output: 1.2mVrms (typ.) - Fast response time: 1μs (typ.) - Small-sized package, halogen free - Standards: IEC/UL 60950-1, UL 508, CSA C22.2 No. 14 IEC 62109 (certification pending) MS1569-E-01W 2014/04 -1- [CQ-2235] 3. Table of Contents 1. Genaral Description ....................................................................................................................................... 1 2. Feartures ........................................................................................................................................................ 1 3. Table of Contents .......................................................................................................................................... 2 4. Block Diagram and Functions ....................................................................................................................... 3 5. Output Characteristics ................................................................................................................................... 4 6. Pin Configurations and Functions ................................................................................................................. 4 7. Safety Standards ............................................................................................................................................ 5 8. Absolute Maximum Ratings .......................................................................................................................... 5 9. Recommended Operating Conditions ............................................................................................................ 5 10. Electrical Characteristics ............................................................................................................................. 6 11. Characteristics Definitions .......................................................................................................................... 7 12. Recommended External Circuits ................................................................................................................10 13. Package .......................................................................................................................................................11 14. Reliability Tests ..........................................................................................................................................14 15. Precautions .................................................................................................................................................15 IMPORTANT NOTICE ...................................................................................................................................16 MS1569-E-01W 2014/04 -2- [CQ-2235] 4. Block Diagram and Functions P Magnetic Core Amplifier Hall Sensor EEPROM Unit DATA_IO VOUT VSS Compensation Bias Unit N Buffer VDD SCLK Figure 1. Functional block diagram of CQ-2235 Circuit Block Hall Sensor Amplifier Buffer Compensation Bias Unit EEPROM Unit Magnetic Core Table 1. Explanation of circuit block Function Hall element which detects magnetic flux density generated from the measured current. Amplifier of Hall element’s output. Output buffer with gain. This block outputs the voltage (VOUT) proportional to the current applied to the primary conductor. Compensation circuit which adjusts the temperature drifts of sensitivity and offset voltage. Drive circuit for the Hall element. Non-volatile memory for setting adjustment parameters. The parameters are set before the shipment. Magnetic core which gathers the magnetic flux density to the Hall element. MS1569-E-01W 2014/04 -3- [CQ-2235] 5. Output Characteristics VOUT VDD N P ← CQ-2235 (Top View) ← IIN 1/2 VDD VDD VOUT −INS N→P 0 P→N INS IIN Figure 2. Output characteristics of CQ-2235 6. Pin Configurations and Functions 7 6 CQ-2235 (Top View) 1 2 3 4 5 Figure 3. Pin assignment of CQ-2235 No. 1 2 3 4 5 6 7 Table 2. Pin configuration and functions of CQ-2235 Pin Name I/O Description DATA_IO Test pin (connect to ground) VDD PWR Power supply pin (3.3V) VSS GND Ground pin (0V) VOUT O Analog output pin SCLK Test pin (connect to ground) P I Primary current pin (+) N I Primary current pin (−) MS1569-E-01W 2014/04 -4- [CQ-2235] 7. Safety Standards ・IEC/UL 60950-1 – Information Technology Equipment – Edition 2. (File No.E359197) ・UL 508 – Industrial Control Equipment – Edition 17. (File No. E353882) ・CAN/CSA C22.2 No. 14-10 – Industrial Control Equipment – Edition 12.(File No. E353882) 8. Absolute Maximum Ratings Table 3. Absolute maximum ratings Parameter Symbol Min. Max. Units Notes Supply Voltage VDD −0.3 6.5 V VDD pin Analog Output Current IOUT −1 1 mA VOUT pin Storage Temperature Tstg −40 150 °C WARNING: Operation at or beyond these limits may result in permanent damage to the device. Normal operation is not guaranteed at these extremes. 9. Recommended Operating Conditions Table 4. Recommended operating conditions Parameter Symbol Min. Typ. Max. Units Notes Supply Voltage VDD 2.7 3.3 3.63 V Analog Output Current IOUT −0.5 0.5 mA VOUT pin Output Load Capacitance CL 100 pF VOUT pin Operating Ambient Ta −40 110 °C See Figure 4 Temperature WARNING: Electrical characteristics are not guaranteed when operated at or beyond these conditions. (95C) (32 A) Conditions ・Mounted on the test board complying with the EIA/JEDEC Standards (EIA/JESD51-xx.) ・VDD=3.63V Figure 4. Primary current derating curve of CQ-2235 NOTE) Cooling or thermal radiation will improve the derating curve above. MS1569-E-01W 2014/04 -5- [CQ-2235] 10. Electrical Characteristics Table 5. Electrical characteristics Conditions (unless otherwise specified): Ta = 25°C, VDD = 3.3V Parameter Symbol Conditions Min. Maximum Primary IRMSmax −50 Current (RMS) Current Consumption IDD No loads Sensitivity (Note 1) Vh See Figure 5 15.3 Offset Voltage (Note 1) Vof IIN = 0A 1.636 Linear Sensing Range INS −85 Linearity Error (Note 1) ρ See Figure 5, Figure 6 −1 Rise Response Time tr CL = 100pF See Figure 9 Fall Response Time tf CL = 100pF See Figure 9 Bandwidth fT −3dB, CL = 100pF Output Noise (Note 2) VNrms 100Hz to 4MHz Temperature Drift of Ta = −40 to 110C Vh-dmax Sensitivity See Figure 7 Temperature Drift of Ta = −40 to 110C, IIN = 0A Vof-dmax Offset Voltage See Figure 8 Ratiometric Error of Vh-R VDD = 2.97V to 3.63V −1 Sensitivity (Note 2) Ratiometric Error of VDD = 2.97V to 3.63V Vof-R −0.6 Offset Voltage (Note 2) IIN = 0A Ta = −40 to 110C −54A ≤ IIN ≤ 54A Total Accuracy (Note 3) ETO Ta = 25C Primary Conductor R1 Resistance Isolation Voltage VINS AC 50/60Hz, 60sec 3 (Note 2) Isolation Resistance RINS DC 1kV 500 (Note 2) Clearance Distance between the primary and the dCL 13.3 (Note 2) secondary Creepage Distance between the primary and the dCP 13.3 (Note 2) secondary Typ. Max. Units 50 A 9.6 15.7 1.664 85 1 1 1 300 1.2 mA mV/A V A %F.S. μs μs kHz mVrms ±0.4 % ±2.5 mV 6.2 15.5 1.650 1 % 0.6 %F.S. 1.3 %F.S. ±0.5 100 μΩ kV MΩ mm mm Note 1. These parameters can drift by the values in 14. Reliability Tests after the reflow and over the lifetime of this product. Note 2. These parameters are guaranteed by design. Note 3. Total accuracy ETO is calculated by the equation below. ETO = |100 × (Vh_meas − Vh) / Vh| + |100 × (Vof_meas − Vof_meas_35) / (Vh × |INS| × 2)| + |ρmeas| where Vh_meas[mV/A], Vof_meas[V], ρmeas[%F.S.] represent the measured value of sensitivity, offset voltage and linearity error respectively, Vh[mV/A] represent the typical value of sensitivity, and Vof_meas_35[V] represent the measured value of offset voltage at Ta = 35C. In the case of CQ-2235, ETO is calculated by the equation as below. ETO = |100 × (Vh_meas − 15.5) / 15.5| + |100 × (Vof_meas − Vof_meas_35) / (15.5 × 85 × 2)| + |ρmeas| MS1569-E-01W 2014/04 -6- [CQ-2235] 11. Characteristics Definitions 11.1. Sensitivity Vh [mV/mT], Offset Voltage Vof [V] Sensitivity is defined as the slope of the approximate straight line calculated by the least square method, using the data of VOUT voltage (VOUT) when the primary current (IIN) is swept within the range of linear sensing range (INS). Offset voltage is defined as the intercept of the approximate straight line above. 11.2. Linearity Error ρ [%F.S.] Linearity error is defined as the ratio of the maximum error voltage (Vd) to the full scale (F.S.), where Vd is the maximum difference between the VOUT voltage (VOUT) and the approximate straight line calculated in the sensitivity and offset voltage definition. Definition formula is shown in below: ρ = Vd / F.S. × 100 Full scale (F.S.) is defined by the multiplication of sensitivity Vh and linear sensing range INS(max) − INS(min) (Figure 5). Approximate straight line by least square method VOUT(V) Vd −|INS| F.S. =2Vh×|INS| |INS| IIN(A) 0 Figure 5. Output characteristics of CQ-2235 For reference, linearity value of CQ-2335 in high temperature is shown in Figure 6. 3 85A |ρ| [%F.S.] 2.5 2 81A 1.5 78A 1 70A 0.5 54A 0 -60 -40 -20 0 20 40 60 80 100 120 Ta [℃] Figure 6. Temperature drift of linearity (for reference) MS1569-E-01W 2014/04 -7- [CQ-2235] 11.3. Ratiometric Error of Sensitivity Vh-R [%], Ratiometric Error of Offset Voltage Vof-R [%] Output of CQ-2235 is ratiometric, which means the values of sensitivity (Vh) and offset voltage (Vof) are proportional to the supply voltage (VDD). Ratiometric error is defined as the difference between the Vh (or Vof) and ideal Vh (or Vof) when the VDD is changed from 3.3V to VDD1 (2.97V ≤ VDD1 ≤ 3.63V). Definition formula is shown in below: Vh-R = 100 × {(Vh(VDD = VDD1) / Vh(VDD = 3.3V)) − (VDD1 / 3.3)} / (VDD1 / 3.3) Vof-R = 100 × {Vof(VDD = VDD1) − Vof(VDD = 3.3V) × (VDD1 / 3.3)) / F.S. Full scale (F.S.) is defined by the multiplication of sensitivity Vh and linear sensing range INS(max) − INS(min) in the condition of VDD = 3.3V (Figure 5). 11.4. Temperature Drift of Sensitivity Vh-d [%] Temperature drift of sensitivity is defined as the drift ratio of the sensitivity (Vh) at Ta=Ta1 (−40C ≤ Ta1 ≤ 110C) to the Vh at Ta=35C, and calculated from the formula below: Vh-d = 100 × (Vh(Ta1) / Vh(35C) − 1) Reference data of the temperature drift of sensitivity of CQ-2235 is shown in Figure 7. 11.5. Temperature Drift of Offset Voltage Vof-d [mV] Temperature drift of offset voltage is defined as the drift value between the offset voltage (Vof) at Ta=Ta1 (−40C ≤ Ta1 ≤ 110C) and the Vof at Ta=35C, and calculated from the formula below: Vof-d = Vof(Ta = Ta1) − Vof(Ta = 35C) Reference data of the temperature drift of offset voltage of CQ-2235 is shown in Figure 8. 10 40 VDD = 3.3V I = ±85A 8 VDD = 3.3V IIN = 0A 30 6 20 2 Vof-d [mV] Vh-d [%] 4 0 -2 10 0 -10 -4 -20 -6 -30 -8 -10 -40 -60 -40 -20 0 20 40 60 80 100 120 -60 -40 -20 Ta [C] Figure 7. Temperature drift of sensitivity (for reference, n=3) 0 20 40 60 80 100 120 Ta [C] Figure 8. Temperature drift of offset voltage (for reference, n=3) MS1569-E-01W 2014/04 -8- [CQ-2235] 11.6. Rise Response Time tr [µs], Fall Response Time tf [µs] Rise response time (or fall response time) is defined as the time delay from the 90% (or 10%) of input primary current (IIN) to the 90% (or 10%) of the VOUT voltage (VOUT) under the pulse input of primary current (Figure 9). IIN IIN 90% IIN 10% IIN Time Time VOUT VOUT 90% VOUT 10% VOUT tf tr Time Time Rise response time (tr) Fall response time (tf) Figure 9. Definition of response time MS1569-E-01W 2014/04 -9- [CQ-2235] 12. Recommended External Circuits 3.3V +5V 6 P SCLK VOUT IN CQ-2235 VSS VDD DATA_IO N 5 (b) R1 4 3 2 (c) RF AIN (a) R2 CF A/D VSS R2 0.1mF VREF R1 1 7 (a) 0.1mF bypass capacitor should be placed near by the CQ-2235. (b) CQ-2235 has the ratiometric output. By making the supply voltage of CQ-2235 and the reference voltage of A/D converter common, the A/D conversion error caused by the fluctuation of supply voltage is decreased. Voltage dividers (R1 and R2) are required if the reference voltage of A/D converter is less than +3.3V. For example, if the reference voltage of A/D converter is +1.8V which is its supply voltage level, R1=10kΩ, R2=12kΩ are recommended. If the reference voltage of A/D converter is different from its supply voltage level, one more voltage divider is required. (c) Add a low-pass filter if it is necessary. Figure 10. Recommended external circuits of CQ-2235 MS1569-E-01W 2014/04 - 10 - [CQ-2235] 13. Package 13.1. Outline Dimensions Unit: mm The tolerances of dimensions without any mention are ±0.1mm. Terminals: Cu Plating for Terminals: Sn (100%) RoHS compliant, halogen free Figure 11. Package outline MS1569-E-01W 2014/04 - 11 - [CQ-2235] 13.2. Pad Dimension Unit: mm Figure 12. Package outline If 2 or more trace layers are used as the current paths, please make enough number of through-holes to flow current between the trace layers. MS1569-E-01W 2014/04 - 12 - [CQ-2235] 13.3. Marking Production information is printed on the package surface by laser marking. Markings consist of 15 characters (company logo ‘AKM’ and 6 characters × 2 lines). AKM Q 2 2 3 5* Y M D *** Product Code (CQ-2235) + Option Option (3 characters) Production Date (Y/M/D) Figure 13. Markings of CQ-2235 Table 6. Production date code table Last Number of Year Month Day Character Number Character Month Character 0 0 C Jan. 1 1 1 D Feb. 2 2 2 E Mar. 3 3 3 F Apr. 4 4 4 G May. 5 5 5 H Jun. 6 6 6 J Jul. 7 7 7 K Aug. 8 8 8 L Sep. 9 9 9 M Oct. 0 N Nov. A P Dec. B C D E F G H J K L N P R S T U V W X Y MS1569-E-01W Day 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 2014/04 - 13 - [CQ-2235] 14. Reliability Tests No. Table 7. Test parameters and conditions of reliability tests Test Parameter Test Conditions 1 High Humidity Bias Test 2 High Temperature Bias Test 3 High Temperature Storage Test 4 Low Temperature Storage Test 5 Heat Cycle Test 6 Vibration Test n Test Time [JEITA EIAJ ED-4701 102] Ta = 85C, 85%RH, continuous operation 22 1000h [JEITA EIAJ ED-4701 101] Ta = 125C, continuous operation 22 1000h [JEITA EIAJ ED-4701 201] Ta = 150C 22 1000h 22 1000h 22 500 cycles 22 2hours to each direction [JEITA EIAJ ED-4701 202] Ta = −65C [JEITA EIAJ ED-4701 105] −65C ↔ 150C 30min. ↔ 30min. Tested in vapor phase [JEITA EIAJ ED-4701 403] Vibration frequency: 10 to 55Hz (1min.) Vibration amplitude: 1.5mm (x, y, z directions) Tested samples are pretreated as below before each reliability test: Pretreating Conditions: Desiccation: 125C/24h → Moisture Absorption: 85C/85%RH/168h → Reflow: 3 times (JEDEC MSL1) Criteria: Products whose drifts before and after the reliability tests do not exceed the values below are considered to be in spec. Sensitivity Vh (Ta = 35C) : Within ±1.5% Offset Voltage Vof (Ta = 35C) : Within ±66mV Linearity ρ (Ta = 35C) : Within ±1%F.S. EEPROM : No change MS1569-E-01W 2014/04 - 14 - [CQ-2235] 15. Precautions [Storage Environment] Products should be stored at an appropriate temperature and humidity (5 to 35°C, 40 to 85%RH). Keep products away from chlorine and corrosive gas. [Long-term Storage] Long-term storage may result in poor lead solderability and degraded electrical performance even under proper conditions. For those parts, which stored long-term shall be checked solderability before it is used. For storage longer than 2 years, it is recommended to store in nitrogen atmosphere. Oxygen of atmosphere oxidizes leads of products and lead solderability get worse. [Other precautions] 1) This product should not be used under the environment with corrosive gas including chlorine or sulfur. 2) This product is lead (Pb) free. All leads are plated with 100% tin. Do not store this product alone in high temperature and high humidity environment. Moreover, this product should be mounted on substrate within six months after delivery. 3) This product is damaged when it is used on the following conditions: - Supply voltage is applied in the opposite way. - Overvoltage which is larger than the value indicated in the specification. 4) This product will be damaged if it is used for a long time with the current (effective current) which exceeds the current rating. Careful attention must be paid so that maximum effective current is smaller than current rating. 5) Since magnetic cores are fragile parts, do not use the fallen products. 6) The characteristic can change by the influences of nearby current and magnetic field. Please make sure of the mounting position. As this product contains gallium arsenide, observe the following procedures for safety. 1) Do not alter the form of this product into a gas, powder, liquid, through burning, crushing, or chemical processing. 2) Observe laws and company regulations when discarding this product. MS1569-E-01W 2014/04 - 15 - [CQ-2235] IMPORTANT NOTICE 0. Asahi Kasei Microdevices Corporation (“AKM”) reserves the right to make changes to the information contained in this document without notice. When you consider any use or application of AKM product stipulated in this document (“Product”), please make inquiries the sales office of AKM or authorized distributors as to current status of the Products. 1. All information included in this document are provided only to illustrate the operation and application examples of AKM Products. AKM neither makes warranties or representations with respect to the accuracy or completeness of the information contained in this document nor grants any license to any intellectual property rights or any other rights of AKM or any third party with respect to the information in this document. You are fully responsible for use of such information contained in this document in your product design or applications. AKM ASSUMES NO LIABILITY FOR ANY LOSSES INCURRED BY YOU OR THIRD PARTIES ARISING FROM THE USE OF SUCH INFORMATION IN YOUR PRODUCT DESIGN OR APPLICATIONS. 2. The Product is neither intended nor warranted for use in equipment or systems that require extraordinarily high levels of quality and/or reliability and/or a malfunction or failure of which may cause loss of human life, bodily injury, serious property damage or serious public impact, including but not limited to, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or explosions, safety devices, elevators and escalators, devices related to electric power, and equipment used in finance-related fields. Do not use Product for the above use unless specifically agreed by AKM in writing. 3. Though AKM works continually to improve the Product’s quality and reliability, you are responsible for complying with safety standards and for providing adequate designs and safeguards for your hardware, software and systems which minimize risk and avoid situations in which a malfunction or failure of the Product could cause loss of human life, bodily injury or damage to property, including data loss or corruption. 4. Do not use or otherwise make available the Product or related technology or any information contained in this document for any military purposes, including without limitation, for the design, development, use, stockpiling or manufacturing of nuclear, chemical, or biological weapons or missile technology products (mass destruction weapons). When exporting the Products or related technology or any information contained in this document, you should comply with the applicable export control laws and regulations and follow the procedures required by such laws and regulations. The Products and related technology may not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable domestic or foreign laws or regulations. 5. Please contact AKM sales representative for details as to environmental matters such as the RoHS compatibility of the Product. Please use the Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances, including without limitation, the EU RoHS Directive. AKM assumes no liability for damages or losses occurring as a result of noncompliance with applicable laws and regulations. 6. Resale of the Product with provisions different from the statement and/or technical features set forth in this document shall immediately void any warranty granted by AKM for the Product and shall not create or extend in any manner whatsoever, any liability of AKM. 7. This document may not be reproduced or duplicated, in any form, in whole or in part, without prior written consent of AKM. MS1569-E-01W 2014/04 - 16 -