Specification AXIOM55LN Oscillator type: Low Phase Noise

Designed and
Manufactured
in Germany
Specification
Oscillator type:
Rev.: 1
Date: 2015-01-19
AXIOM55LN
Low Phase Noise OCXO with Sine Wave Output
equivalent to Oscilloquartz Model OCXO 8789
Parameter
Frequency range
Standard frequencies
Frequency stability
Initial tolerance @ +25°C
vs. operating temperature range
vs. supply voltage variation (pushing)
vs. load change (pulling)
Long term (aging) per day (Note 3)
Long term (aging) per year (Note 3)
Frequency adjustment range
Electronic Frequency Control (EFC)
EFC voltage VC
EFC slope (∆f / ∆VC)
EFC nonlinearity
EFC input impedance
RF output
Signal waveform
Load RL
Output level
Harmonics
Spurious
Warm-up time @ +25°C
Phase noise max.
Short term stability (Allan deviation)
Reference voltage VREF output
Supply voltage VS
Current consumption (steady state)
Current consumption (warm-up)
Enclosure (see drawing) (LxWxH)
Weight
Packing
Notes:
1.
2.
3.
min.
typ.
5
max.
Unit
Condition
20
MHz
MHz
(Note 2)
(Note 2)
±200
ppb
VC @ VREF/2
steady state
±0.2
±0.2
±0.5
±70
ppb
ppb
ppb
ppb
VS ±5 %
RL ±10 %
after 30 days operation
after 30 days operation
VREF
ppm
V
5.000 / 10.000
Option 1 & 2
See tables 1 & 2
±0.8
0
VREF/2
Positive
±5
±10
100
+6
Sine wave
50
+8
3
5.000
-105
-135
-150
-157
-162
-162
+10
-30
-75
5
10.000
-100
-130
-150
-157
-162
-162
%
kΩ
Ω
dBm
dBc
dBc
min
MHz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
-12
11.4
1·10
10.0
12.0
12.6
200
500
51.0x51.0x19.0 max.
70
Palette
V
V
mA
mA
±10%
fnom ±1 MHz
∆ffinal/f0 < ±0.1 ppm
@ 1 Hz
@ 10 Hz
@ 100 Hz
@ 1 kHz
@ 10 kHz
@ 100 kHz
τ=1s
@ +25°C
mm
g
Terminology and test conditions are according to IEC60679-1 and MIL-PRF-55310, unless otherwise stated
Please consult factory for other frequencies
Lower aging on request
GmbH & Co. KG
Roemerring 9
D-74821 Mosbach
Germany
AXIOM55LN Rev.1
Drawing D1
Page 1(4)
www.axtal.com
fon: +49 (6261) 939834
fax: +49 (6261) 939836
E-mail: [email protected]
Designed and
Manufactured
in Germany
Absolute Maximum Ratings
Parameter
min.
max.
Supply Voltage VS
Control Voltage VC
Storage Temperature
-0.5
-0.5
-40
VS + 10%
15
+125
Unit
Condition
V
V
°C
VS to GND
VC to GND
Frequency stability vs. temperature
Stability
[ppb]
±5
±10
±25
±50
Option 1
05
10
25
50
Table 1
Lower Temperature
Option 2
T [°C]
0
0
1
-10
2
-20
3
-30
4
-40
Table 2
Upper Temperature
Option 2
T [°C]
A
+50
B
+60
C
+70
D
+75
E
+80
Standard: “1B” = -10°C to +60°C
Ordering Code
Option 1
Option 2
[Stability]
[Temperature range]
AXIOM55LN
Table 1
Table 2
Example: AXIOM55LN-10-1B_Rev.1 – 10.000 MHz
Model
Handling and Testing
Parameter
Handling and Testing
Processing
Parameter
Electrostatic discharge (ESD)
THD devices
SMD devices
Washable
RoHS- Compliant
GmbH & Co. KG
Roemerring 9
D-74821 Mosbach
Germany
Revision
Frequency [MHz]
Rev.1
10.000
Procedure
Application Note AXAN-011
Application Note AXAN-012
Procedure
IEC60749-26
IEC60749-27
Yes
Yes
AXIOM55LN Rev.1
Drawing D1
Page 2(4)
HBM
MM
No
No
Source
www.axtal.com
www.axtal.com
Condition
2000 V
200 V
www.axtal.com
fon: +49 (6261) 939834
fax: +49 (6261) 939836
E-mail: [email protected]
Designed and
Manufactured
in Germany
Enclosure drawing
Pin connections:
Pin #
1
2
3
4
5
6
7
Symbol
GND
VREF
VC
N.C.
N.C.
RF OUT
VS
Function
Ground
Reference voltage
Control Voltage (EFC)
No Connection
No Connection
RF Output
Supply Voltage
GmbH & Co. KG
Roemerring 9
D-74821 Mosbach
Germany
* See Application Note AXAN-011
AXIOM55LN Rev.1
Drawing D1
Page 3(4)
www.axtal.com
fon: +49 (6261) 939834
fax: +49 (6261) 939836
E-mail: [email protected]
Designed and
Manufactured
in Germany
Environmental conditions
Test
Sealing tests
(if applicable)
Solderability
Resistance to
soldering heat
Shock*
Vibration,
sinusoidal*
Vibration,
random*
Endurance tests
- ageing
- extended aging
IEC
60068
Part …
2-17
IEC
60679-1
Clause
5.6.2
MIL-STD202G
Method
112E
MIL-STD810F
Method
MIL-PRF55310D
Clause
3.6.1.2
2-20
2-58
5.6.3
208H
210F
2-27
5.6.8
213B
516.4
3.6.40
2-6
5.6.7.1
516.4-4
2-64
5.6.7.3
201A
204D
214A
3.6.38.1
3.6.38.2
3.6.38.3
3.6.38.4
3.6.52
3.6.48
514.5
Test conditions (IEC)
Gross leak: Test Qc,
Fine leak: Test Qk
Test Ta Method 1
Test Td1 Method 2
Test Td2 Method 2
Test Ea, 3 x per axes 100g,
6 ms half-sine pulse
Test Fc, 30 min per axes,
10 Hz - 55 Hz 0,75mm; 55 Hz - 2 kHz, 10g
Test Fdb
108A
5.7.1
5.7.2
4.8.35
30 days @ 85°C, OCXO @25°C
1000h, 2000h, 8000h @85°C
Revision History
Rev.
Drawing
Date
[dd.mm.yyyy]
1
1
D0
D1
14.01.2015
19.01.2015
GmbH & Co. KG
Roemerring 9
D-74821 Mosbach
Germany
Remarks
First issue
Phase noise columns changed
AXIOM55LN Rev.1
Drawing D1
Page 4(4)
Author
Checked
HH
HH
BN
HH
www.axtal.com
fon: +49 (6261) 939834
fax: +49 (6261) 939836
E-mail: [email protected]