Edition 2011-12-15 Published by Infineon Technologies AG 81726 Munich, Germany © 2012 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. RF and Protection Devices Application Guide Infineon Technologies A Leading Company in RF and Protection Devices Infineon Technologies focuses on the three central challenges facing modern society: Energy Efficiency, Mobility and Security and offers semiconductors and system solutions for industrial/consumer electronics, automotive electronics, chip card and security applications. Infineon’s products have a reputation for leading-edge innovation, high reliability, and exceptional quality performance in RF, protection, analog, mixed signal, embedded control, and the highest efficiency power solutions. With its technologies and design expertise, Infineon is the market leader in its focus segments. Infineon has more than 30 years of experience in developing RF products for numerous applications and always leads in the market with high performance, yet cost effective products. You can visit our website www.infineon.com to learn more about the broad product portfolio of Infineon Technologies. The Infineon business unit - RF and Protection Devices (RPD) - has evolved over the years from a supplier of standard RF discrete components like transistors and diodes to a more advanced portfolio of state-of-the-art, innovative and differentiated products including application specific MMICs, Silicon Microphones and ESD protection components. Please visit our website www.infineon.com/rfandprotectiondevices to learn more about Infineon’s latest RF and Protection products for your applications. Infineon’s application guide consisting of four different brochures is an easy-to-use tool primarily meant for engineers to efficiently guide them to the right device for their system. This application guide is updated frequently to include latest applications and trends. Each brochure focuses on a market segment that we support: 1. Application Guide for Mobile Communication: www.infineon.com/rpd_appguide_mobile 2. Application Guide for Consumer Applications: www.infineon.com/rpd_appguide_consumer 3. Application Guide for Industrial Applications: www.infineon.com/rpd_appguide_industrial 4. Application Guide for Protection: www.infineon.com/rpd_appguide_protection Our application experts worldwide are always ready to support you in designing your systems with our devices. Please contact Infineon’s Regional Offices or one of Infineon Worldwide Distribution Partners in your area to get all the support you might need. Kind Regards Dr. Heinrich Heiss Dipl.-Ing. Alexander Glas Director Technical Marketing & Application Engineering RPD Group Leader Technical Marketing & Application Engineering, Protection, RPD 3 RF and Protection Devices Application Guide for Protection INDEX Infi neo n T e chn olo gi e s ................................................................................................................................... 3 1 Infineon’s ESD and ESD/EMI Protection Devices ........................................................................... 5 2 2.1 2.2 ESD Protection is the Key Success Factor for Reliable Products ................................................ 8 Device Level ESD and System Level ESD – Two Sides of a Coin ...................................................... 8 General Design Rules to Minimize Residual ESD Stress .................................................................. 10 3 3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 High Speed Data Interface Protection ............................................................................................ 11 ESD Protection for USB 3.0 ............................................................................................................... 14 ESD Protection for USB 2.0 ............................................................................................................... 15 ESD Protection for Dual Port USB 2.0 ............................................................................................... 16 Serial ATA, e-SATA Generation 1 (1.5 Gbit/s), 2 (3 Gbit/s), 3 (6 Gbit/s) ........................................... 17 ESD Protection for HDMI 1.3a & 1.4 .................................................................................................. 18 ESD Protection for DisplayPort & DVI & MHL ................................................................................... 19 ESD Protection for High-Speed Digital Interface Switching ............................................................... 20 ESD and Transient Protection for VDSL, ADSL & Other Broadband Applications ............................ 22 4 4.1 4.2 4.3 4.4 4.5 4.6 4.7 General Purpose Interface Protection ........................................................................................... 23 ESD Protection for Low Data Rate Interfaces .................................................................................... 24 ESD Protection for Dual Channel General Purpose e.g. AV I/F Interfaces ....................................... 25 ESD Protection for Near Field Communication (NFC) ....................................................................... 26 Reverse Polarity Protection (RPP) Circuit ......................................................................................... 27 Reverse Polarity Protection for USB Charger .................................................................................... 28 Rectifier Circuit with Schottky Diodes ................................................................................................ 29 Clipping and Clamping ....................................................................................................................... 30 5 5.1 5.2 5.3 ESD / Surge Protection .................................................................................................................... 31 ESD Requirements:............................................................................................................................ 32 Surge Requirements: ......................................................................................................................... 32 ESD Surge Protection for Gigabit Ethernet ........................................................................................ 35 6 6.1 6.2 6.3 6.4 6.5 6.6 6.7 Interface Protection with Integrated ESD/EMI Devices ................................................................ 36 ESD/EMI Protection for Differential Mode Microphone Interface – BGF113 ..................................... 38 ESD/EMI Protection for SIM Card Interface – BGF106c ................................................................... 39 ESD/EMI Protection for 6-Pin SIM Card Interface – BGF125 ............................................................ 40 ESD/EMI Protection for 8-Pin SIM Card Interface – BGF124 ............................................................ 41 ESD/EMI Protection for Flash Memory: MicroSD/MiniSD/SD Card – BGF117 ................................. 42 ESD/EMI Protection for High-Speed MMC-Card (4 data lines) – BGF104c ...................................... 43 ESD/EMI Protection for LCD/Camera Interface - BGF108c / BGF109c ............................................ 44 Abbreviations ....................................................................................................................................................... 45 Alphanumerical List of Symbols ........................................................................................................................ 46 Package Information ........................................................................................................................................... 47 Support Material .................................................................................................................................................. 48 4 RF and Protection Devices Application Guide for Protection 1 Infineon’s ESD and ESD/EMI Protection Devices In today’s electronics, being faster, smaller and smarter creates profitability by enabling new and better applications. The race to pack even more high-speed functions into a smaller space accelerates miniaturization roadmaps. However, the downscale of semiconductor chips together with the increase of doping levels results in a dramatic reduction of the thin gate oxide layer and the width of the pn-junction in semiconductor chips. In combination with greater circuit population, this increases the susceptibility of the semiconductor chip to ESD. Subsequent failures of the electronic equipment can be noticed immediately as hard failures or temporary equipment malfunction, or in latent damage that is not recognized until later in the equipment lifecycle. Hard failures are the easiest to recognize, and in general require the failed device to be replaced. In the best case, any failure will be detected before the equipment leaves the factory and customers will never receive it. Failures leading to temporary malfunction of equipment or latent failures are quite common and very difficult to detect or trace. Temporary malfunctions may go unreported by customers all-the-while resulting in negative customer impressions as the user repeatedly restarts or resets the equipment. Latent damage that eventually leads to hard failure or unreliable operation of the equipment while in the field may cause the most negative impression and lower customer confidence in the company that provided it. Product recalls requiring swapping or repairing equipment due to ESD failures can cost the manufacturer and/or the user several times more than the original equipment cost. Figure 1 Integrated circuit before ESD strike Integrated circuit after ESD strike An efficient system design normally includes the implementation of a shielded chassis in order to minimize the risk of ESD damage. Nevertheless, ESD strikes represent a permanent threat to device reliability as they can easily find a way to bypass the shielded chassis and be injected into the vulnerable ICs and ASICs. All connectors and antennas exposed to the outside world are possible entry points for ESD generated by end users or even self-generated ESD from moving equipment components. The relentless decrease in IC and ASIC geometries has reached a point where adequate ESD protection structures incorporated on the device’s substrate is no longer feasible. Now, the only way to ensure stable operation and to maximize reliability is to protect the equipment against ESD and transients with external protection devices. 5 RF and Protection Devices Application Guide for Protection The most effective and economical system level protection is accomplished when the requirements are considered early in the design cycle. ESD has become a pervasive normal operating condition that requires diligent consideration. Let’s explore this topic further. Infineon’s Value Proposition Infineon’s protection solutions improve ESD immunity at the system level beyond the requirements of the IEC 61000-4-2 level-4 standard with: Superior multi-strike absorption capability; Safe and stable clamping voltages to protect even the most sensitive electronic equipment; Protection devices that fully comply with high-speed signal quality requirements; Easy-to-use single devices in leading miniaturized packages for space-constrained applications; Array solutions for board space savings and reduced parts count; Flow through package pin outs enabling easier PCB layout with minimized crosstalk and parasitic influences on the signal quality. Extremely low leakage currents to extend battery life further; For further information about our ESD diode portfolio and their applications, please refer to our ESD Protection Brochure www.infineon.com/tvs.brochure. You can also visit our webpage for protection devices: www.infineon.com/protection. Furthermore, Infineon offers various high performance types of discrete ESD protection devices for mobile phone applications to protect our customers’ mobile phones from ESD attacks. Following is a short overview of the available ESD protection devices for various interfaces used in mobile phones. 6 RF and Protection Devices Application Guide for Protection Analog/Digital Interfaces RF Interfaces ESD5V3S1B ESD5V3L1B ESD8V0-series NFC ESD18VU1B ESD24VL1B TV/Audio LCD ESD5V3U-series ESD5V3L1B-series USB1.1/2.0 ESD5V3U-series USB3.0 ESD3V3U4ULC Camera ESD5V3U-series ESD5V3L1B-series ESD5V3U4U-HDMI ESD5V3U-series ESD5V3L1B-series SD Card MM Card I/O Data ESD8V0-series ESD5V3S1B-series ESD5V3L1B-series HDMI ESD5V3U4U-HDMI ESD5V3U-series Human Interfaces ESD8V0-series ESD5V3L1B-series ESD5V3L1U-02LRH SWP ESD3V3XU1US Keypad Figure 2 ESD0P2RF ESD0P1RF Mobile TV ESD0P2RF ESD0P1RF FM ESD0P2RF ESD0P1RF RPP Diode Power Supply USB Charger Overview of Infineon’s ESD Diodes for Interface Protection Headset Figure 3 e.g. mobile/ wireless/ portable devices, consumer & industrial units GPS BGF100/BGF200 BGF113 AV I/F BGF112 TV BGF111 LCD BGF108c/BGF109c SIM Card BGF106c BGF124/BGF125 µSD/SD Card BGF117 HSMM Card BGF104 Charger BGF119 HDMI BGF127/BGF128 Analog Baseband IC SIM Card Electronic Equipment ESD0P2RF ESD0P1RF WLAN Digital Baseband IC Headset Overview of Infineon’s Integrated ESD/EMI Devices for Interface Protection 7 RF and Protection Devices Application Guide for Protection 2 ESD Protection is the Key Success Factor for Reliable Products 2.1 Device Level ESD and System Level ESD – Two Sides of a Coin System level ESD protection is defined by the IEC 61000-4-2 standard. In general, all ICs and ASICs incorporate some level of ESD protection to see the device through the manufacturing process undamaged. The integrated protection is normally designed according to the HBM (Human Body Model) specification. ESD robustness, according to the HBM, is only sufficient for safe device handling and system assembly which takes place in a production environment where ESD is highly controlled and minimized. Once out in the real world, the equipment will face the threat of ESD strikes happening everywhere, at any time. In order for the equipment to survive beyond the factory environment, IEC 61000-4-2 system level ESD protection is required. The final system level protection solution is achieved through consideration of the systems native integrated protection in combination with a carefully selected external protection device so that all facets of the final protection solution meet the protection requirements of the application. The current industrial HBM robustness standard applied to semiconductor device level protection is 2 kV. In general, and with few exceptions, 2 kV HBM protection in current semiconductor devices is the highest protection level. Few have higher protection and more and more are being produced with lower protection, even down in the range of 250V to 350V. The 2 kV IEC 61000-4-2 defined system level ESD strike delivers 750% higher energy to the Device Under Test (DUT) than the 2 kV HBM strike. However, the days are gone where the 2 kV system level ESD robustness was sufficient or the standard. The new requirement for system level robustness is generally 8 kV, a 12,000% increase over the 2 kV HBM standard. There are many indications that the future robustness standard for system level protection will reach 15 kV, which serves up a 41000% higher destructive energy burst to the DUT than the 2 kV HBM strike. Residual ESD stress vs. ESD model 100 10 10 1 IEC_8kV IEC_2kV IEC_1kV 1000 100 diss_load Reference 1000 P 0ns factor 410 HBM_1kV Logarithmic scaling !!! 10000 10000 factor 120 IEC_15kV 400ns Ediss_load HBM_2kV Dissipated ESD Energy [nJ/Ohm] 100000 100000 E_HBM_1kV E_HBM_1kV E_HBM_2kV E_HBM_2kV E_IEC_1kV E_IEC_1kV E_IEC_2kV E_IEC_2kV E_IEC_8kV E_IEC_8kV E_IEC_15kV E_IEC_15kV factor 7.5 1 Figure 4 Residual ESD stress versus ESD model 8 RF and Protection Devices Application Guide for Protection The physical background causing electrostatic charging is the triboelectric effect or triboelectric charging, where electrical charge-carriers are separated from some materials after coming into contact with another different material. This separation of charge-carriers takes place in our daily experience. Just the process of sitting down and standing up from a chair can cause a 15 kV electrostatic voltage in the human body. Walking over a carpet can easily double the 15 kV static charge to 30 kV. During winter time, when the air has lower humidity, the problem of static discharge is further amplified in magnitude and frequency of occurrence. ESD Protection – An Application Tailored Business Each application has its own set of requirements for robustness, signal integrity, board area and price point. With Infineon’s portfolio of leading-edge ESD protection devices, the right ESD protection solution can be tailored for any application’s requirements. We continue with some general rules to minimize the residual stress of an ESD strike on the PCB and its components. 9 RF and Protection Devices Application Guide for Protection 2.2 General Design Rules to Minimize Residual ESD Stress For maximum system level ESD protection, several basic considerations should be kept in mind beginning with the overall system concept; from the industrial design to the PCB layout. The industrial design should be the first point of consideration. Where possible, the equipment housing should incorporate metal shielding around exposed connectors and HID interfaces to prevent ESD strikes from traveling deeper into the system. The PCB layout has a significant impact on the overall system level ESD performance of a system and is the next point of consideration. First, protection devices should be placed as near as possible to points of ESD entry such as connectors and exposed antennas or other identified points of entry. Second, spacing between traces where external signals originate and internal signal traces needs to be maximized to prevent high voltage ESD strikes from hopping from the external trace to internal traces where there is little protection offered to the semiconductors they feed. Third, any series inductance in-line with the ESD diode should be avoided. Series inductance can be caused by nearby PCB traces and GND via holes. Even inductances of less than 1 nH visibly impact the residual peak overshoot voltage. This peak voltage only lasts a few nano-seconds, but when extended by parasitic series inductance, it can cause huge damage to critically sensitive components such as GaAs devices in RF stages or high speed data circuits. In high speed stages, which typically have very low input capacitance, the residual overshoot, caused by the addition of series inductance, enters the device input un-smoothed with destructive consequences. ESD strike Figure 5 PCB-Line Induced voltage dITVS/dt Dynamic TVS Diode clamping voltage TVS current Rdyn Bond wire TVS diode PCB-Line Residual ESD current PCB inductance Main ESD current PCB Layout with parasitic Inductance in series with the ESD Diode 10 RF and Protection Devices Application Guide for Protection A simple example demonstrates the level of the inductive component of the residual peak clamping voltage: A 15 kV contact discharge strike (IEC 61000-4-2) generates a peak current of ~55 A. Assuming a parasitic inductance of 1 nH and a 0.85 ns rise-time of the ESD strike (defined as 10% / 90% in IEC61000-4-2) the inductive overshoot is in the range of 50 V, possibly higher. It is possible to significantly reduce parasitic series inductance using a “V” shaped layout to connect the ESD diode direct to the signal line. The GND via hole should be placed as near to the ESD diode solder pad as permitted by the PCB design rules. ESD strike TVS current Dynamic TVS Diode clamping voltage Bond wire PCB-Line Induced voltage dITVS/dt Rdyn TVS diode PCB-Line Figure 6 Residual ESD current PCB-Lines Main ESD current Optimized “V” Shaped Routing to Reduce Parasitic Series Inductance The length of the “V” shaped PCB lines becomes uncritical because they are not in series with the ESD diode any more. The PCB inductance is substituted by the serial “V” shaped PCB lines. Induced voltage is limited to the bond wire only. 3 High Speed Data Interface Protection High speed data interfaces such as FireWire, MIPI, SATA, DVI, DisplayPort, HDMI 1.3/1.4a, USB 2.0/3.0 and in future Thunderbolt are widely used in today’s consumer electronics. These interfaces are normally exposed to ESD during routine use. As data transmission speed continues to increase, e.g. maximum 3.4 Gbit/s per differential line-pair for HDMI and 5 Gbit/s for USB 3.0 SuperSpeed, the transmitter and receiver designs are shrunk to smaller geometries to support the growing data rate. This however causes ICs to be more sensitive to high current and high-energy ESD threats. According to the IEC 61000-4-2, level-4, an 8 kV ESD event will have a peak discharge current up to 30 A which ICs cannot withstand. To handle this large discharge current, external ESD protection devices are required on high speed data interfaces. However, the parasitic capacitance associated with external ESD protection devices can cause impedance mismatch and negatively impact signal integrity causing an increase in the BER (Bit Error Rate). The impact is more significant in proportion with the speed of the data link. 11 RF and Protection Devices Application Guide for Protection To achieve effective protection, both ESD robustness and low parasitic capacitance are required for high speed interfaces. Infineon Technologies offers a silicon based ESD diode portfolio with single-line and multiple-line array solutions with the ability to absorb more damaging ESD energy well above the 8kV industrial standard while maintaining signal integrity for optimum performance. A key factor in the ability to absorb damaging ESD energy is the dynamic resistance of the protection device after turn-on. Normally, lowering the dynamic resistance of a device creates higher parasitic capacitance because the die size is increased to reduce the device’s on resistance. This trade-off between resistance and capacitance is easily observed by comparing ESD diode data sheets, if the supplier provides the dynamic resistance of its devices. Infineon’s unique leading-edge protection technology provides the best trade-off between a device’s ability to absorb large amounts of ESD energy with the least impact on signal integrity. Infineon’s ultra-low capacitance ESD diodes provide very low dynamic resistance under high ESD stress. This low resistance steers the damaging ESD pulse away from the high-speed data interface IC and into the protection diode effectively clamping the ESD voltage pulse on the IC at a very low level and avoiding damage to the IC. The rule is that the lower the dynamic resistance, the lower the clamping voltage on the IC being protected. The best means for accurately measuring the dynamic resistance of a protection device is the Transmission Line Pulse method or TLP for short. The complete TLP process is documented in AN210. As an example, the dynamic resistance of the ESD diode ESD3V3U4ULC has been extracted by TLP measurement to be only 0.19 Ohms as shown in the following IV trace. More examples with protection technology comparisons can be found in AN210. Figure 7 TLP measurement of ESD3V3U4ULC from I/O to GND 12 RF and Protection Devices Application Guide for Protection Signal integrity is the key factor in achieving low bit error rate (BER) in high-speed data transmission. The measures of signal integrity are easily visualized with an eye diagram. Any time parasitic capacitance is introduced into a high-speed data path, the signal integrity of the path is lessened. In order to have minimal impact on signal integrity, Infineon ESD diodes are designed with ultra-low parasitic capacitance, typically only 0.4 pF (diode vs. GND). To judge the effect of Infineon ESD diodes in a USB3.0 SuperSpeed link, a complete system simulation with ESD3v3U4ULC on the host and client side includingdata cable loss was performed. The following eye diagram simulation results compares the receive eye pattern openings without ESD diodes (red contour) and with the protection of ESD diodes (blue contour). The ultra-low capacitance of the Infineon ESD diode causes only a negligible degradation in the eye–contour statistics while keeping a huge safety margin with respect to the USB 3.0 specification mask. USB3.0 SS eye-pattern Spec. Mask (BER 10E-12) USB3.0 SS eye-contour statistic of 10E12 bits - without TVS diode - USB3.0 SS eye-contour statistic of 10E12 bits - with TVS diode - Inner eye opening statistic of ~10E6 bits Figure 8 Eye diagram w. and w/o. ESD3V3U4ULC located at host and device sides Infineon’s growing portfolio of ESD diodes are offered in the world’s smallest packages and in arrays with flowthrough design to enable protection of high speed data interfaces in the most space constrained applications with the least impact on signal integrity. Differential pairs in high-speed data links must be impedance matched with identical delays in each signal path, and crosstalk with other signal paths must be avoided. These conditions are easily met using Infineon protection arrays in flow-through packages. The differential data pairs flow into one side of the package and out the other side of the package so that delays in each path remain the same while keeping adjacent signal crosstalk due to complex PCB layout maneuvers to a minimum. 13 RF and Protection Devices Application Guide for Protection ESD Protection for USB 3.0 TX+ SuperSpeed Data IN TX+ TX- connector USB3.0: SS-Hub e.g. PC + RX+ RX- USB3.0: SS-Device e.g. storage RX+ TX+ RX- ESD diodes USB2.0 HUB HS/FS/LS TX+ D+ SuperSpeed Data IN + - TXRX- SuperSpeed Data OUT + - TX- USB3.0 cable SuperSpeed Link RX+ SuperSpeed Data OUT USB2.0 Device HS/FS/LS D+ + - USB2.0 Data OUT + RX D- TX- USB2.0 Data OUT RX+ RX- TX- USB2.0 Data IN TX+ + - connector 3.1 mated connector + RX - D- USB3.0 cable USB2.0 Link mated connector TX+ USB2.0 Data IN + - TX- ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 +3.3 ±15 8@16 11@30 0.2 3 8.5 0.35 4 TSLP-9-1 +3.3 ±20 8@16 11@30 0.2 3 8.5 0.35 1 TSSLP-2-1 ESD3V3U4ULC ESD3V3XU1U high speed SuperSpeed high speed SuperSpeed ESD5V5U5ULC USB2.0-HS, Vcc +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 5 SC74 ESD5V3L1B USB2.0-FS, Vcc +5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 14 RF and Protection Devices Application Guide for Protection 3.2 ESD Protection for USB 2.0 Host controller Device controller ESD diodes GND D+ D1+ Data IN / OUT D+ D1+ Data #1 IN / OUT D1- D1D- DVcc USB2.0 cable USB2.0 Host1 LS/FS/HS USB2.0 Device1 LS/FS/HS USB Connectors Vcc Vcc ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U1U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V3L1B USB2.0-FS, Vcc +5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 15 RF and Protection Devices Application Guide for Protection 3.3 ESD Protection for Dual Port USB 2.0 Host controller Device controller ESD diodes array GND D+ D1+ Data #1 IN / OUT D+ D1+ Data #1 IN / OUT D1- D1D- USB2.0 Connector Vcc USB2.0 Host2 LS/FS/HS DVcc USB2.0 Cable#1 USB2.0 Device1 LS/FS/HS Vcc USB2.0 Connector USB2.0 Host1 LS/FS/HS USB2.0 Device2 LS/FS/HS USB2.0 Cable#2 Vcc DD- D2- D2- Data #2 IN / OUT D2+ D+ Data #2 IN / OUT D2+ D+ GND ESD diodes array ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U1U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V5U5ULC USB2.0-HS, Vcc +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B USB2.0-FS, Vcc +5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. Vcc D1+ D1- D1+ D1- D2+ D2- D2+ D2- Flow through layout proposal for ESD5V5U5ULC in SC74. “V-shape” routing implemented for the Vcc line 16 RF and Protection Devices Application Guide for Protection Serial ATA, e-SATA Generation 1 (1.5 Gbit/s), 2 (3 Gbit/s), 3 (6 Gbit/s) TX+ Data IN 3Gb/s, 6Gb/s A+ A+ RXA- connector TXSerial ATA Hub e.g. PC + RX+ RX- Data OUT 3Gb/s, 6Gb/s + - A- (e)Serial ATA cable B+ Data OUT 3Gb/s, 6Gb/s RX+ + - connector 3.4 Serial ATA-Device e.g. storage B+ TX+ + - TXB- Data IN 3Gb/s, 6Gb/s B- ESD diodes ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD0P2RF high speed bidirectional ±5.3 ±20 29@16 38@30 1 3 16 0.23 1 TSLP-2-7 TSSLP-2-1 ESD3V3XU1B on request high speed bidirectional ±3.3 ±20 15@16 23@30 0.4 3 - 0.2 1 TSLP-2-7 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 17 RF and Protection Devices Application Guide for Protection 3.5 ESD Protection for HDMI 1.3a & 1.4 +5V HDMI Type A Connector HDMI Source/Sink 1 TMDS Data2 2 3 High-Speed ESD protection 4 5 TMDS Data1 6 TMDS Channels 7 8 TMDS Data0 9 High-Speed ESD protection 10 11 TMDS Clock 12 CEC SCL ESD protection communication channel (Low-Speed) SDA 13 CEC Line 14 N.C. 15 16 Hot Plug Detect ESD protection supply Voltage Vcc DDC (I²C Bus) 17 DDC/CEC GND 18 +5V 19 Hot Plug Detect ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD3V3U4ULC high speed +3.3 ±15 0.2 3 8.5 0.35 4 TSLP-9-1 ESD3V3XU1U high speed +3.3 ±15 0.2 3 8.5 0.35 1 TSSLP-2-1 ESD5V5U5ULC high speed <2.0Gbps +5.5 ±25 8@16 11@30 8@16 11@30 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B Control lines Vcc +5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 11 skinny trace „L2" Clock- width_ST TMDS clock Clock shield 10 Clock+ 9 Data 0- 8 Data shield 0 7 Data 0+ 100 Ohm differential lines gap_ST 4 TMDS 1 Data shield 1 Data 1+ gap_diff100 100 Ohm differential lines GND_via Data 2- 2 Data shield 2 1 Data 2+ TMDS 2 100 Ohm differential lines Keep the „gap_(lane vs. lane)“ high to minimize adjacent lane x-talk HDMI flow through layout recommendation for the TSLP-9-1 18 100 Ohm 3 Data 1- adjacent lane seperation to control alien x-talk 100 Ohm 5 TMDS 0 width_diff100 Infineon ESD Diode 6 100 Ohm differential lines 100 Ohm W_pad=0.25 mm Pitch: 0.5mm skinny trace „L1" 12 100 Ohm HDMI Receptacle type „A“ landing pads Notes: RF and Protection Devices Application Guide for Protection 3.6 ESD Protection for DisplayPort & DVI & MHL +3.3V DisplayPort Connector Display Port Source/(Sink) 1 ML_Lane 0/(3) 2 3 High-Speed ESD protection 4 5 6 ML_Lane 1/(2) ML_Lanes 0...3 TMDS Channels 7 8 ML_Lane 2/(1) 9 High-Speed ESD protection 10 11 ML_Lane 3/(0) 12 Config1 13 Config1 Config2 14 Config2 AUX_pos Communication channel (Low-Speed) ESD protection AUX_neg Hot Plug Detect ESD protection supply Voltage Vcc 15 AUX_pos 16 GND 17 AUX_neg 18 Hot Plug Detect 19 Return DP_PWR 20 Power +3.3V ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed Vcc +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD3V3U4ULC high speed +3.3 ±15 0.2 3 8.5 0.35 4 TSLP-9-1 ESD3V3XU1U high speed +3.3 ±15 0.2 3 8.5 0.35 1 TSSLP-2-1 ESD5V5U5ULC high speed <2.0Gbps +5.5 ±25 8@16 11@30 8@16 11@30 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B Control lines Vcc +5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 19 RF and Protection Devices Application Guide for Protection 3.7 ESD Protection for High-Speed Digital Interface Switching With increasing numbers of interfaces to the external world in mobile phones, the space constraint is becoming a tougher obstacle to overcome with each new generation. Port sharing for various functions has become mandatory in order to reduce the number of interface connectors. The following block diagram shows an example of port sharing between USB and the new Mobile High-definition Link (MHL). The combination is realized through a common Micro USB AB port together with a DPDT switch. Infineon offers a variety of solutions and package options for the implementation of SPDT and DPDT switches for high-speed digital interface switching in mobile phones. For the shared USB/MHL port application, the highest integration level and the lowest power consumption solution is achieved with the DPDT BGS22W device. Additional information on this device is available on request from your local Infineon representative. The SPDT BGS12A and its derivatives can also be used in the application as an integrated option. For discrete implementation, the BAR90 pin diode is available in several package options. The previously shown ESD5V3U1U is an excellent option for the protection of the switching function on the Micro USB AB connector port. For more detailed information, please visit our website: www.infineon.com/rfswitches or www.infineon.com/pindiodes. You can also contact Infineon’s Regional Offices or one of Infineon Worldwide USB PHY USB + USB DPDT Switch MHL + MHL/USB MHL - MHL PHY MICRO USB AB Distribution Partners in your area to get direct design-in support you might need. RF PIN Diode Switches rF2) [Ω] @IF [mA] rF2) [Ω] @IF [mA] CT3) [pF] @VR [V] τL4) [ns] Package BAR90-02LS 1.3 3.0 0.8 10.0 0.25 1.0 750 TSSLP-2-1 BAR90-098LRH D 1.3 3.0 0.8 10.0 0.25 1.0 750 TSLP-4-7 1.3 3.0 0.8 10.0 0.25 1.0 750 TSSLP-8-1 1.3 3.0 0.8 10.0 0.25 1.0 750 TSLP-2-7 Application Note Product1) BAR90-081LS BAR90-02LRH Notes: Q TR1054 1) D=Dual; T=Triple; Q=Quadruple; 2) at 100 MHz; 3) at 1 MHz; 4) Switching time between the forward bias of IF = 10 mA and reverse bias of IR = 6 or 3 mA; 5) Please visit our website http://www.infineon.com/pindiodes for alternative devices. 20 RF and Protection Devices Application Guide for Protection High-Speed CMOS Switches Product Application Note BGS12A BGS12AL7-4 AN175 BGS12AL7-6 BGS22W Notes: On Request Supply [V] Vctrl1) [V] IL2) [dB] Isolation3) [dB] P-0.1dB4) [dBm] BW5) [GHz] Package 2.4…2.8 1.4…2.8 0.3/0.6 34/27 > 21 - FWLP-6-1 2.4…2.8 1.4…2.8 0.4/0.5 32/25 > 21 - TSLP-7-4 2.4…2.8 1.4…2.8 0.4/0.5 32/25 > 21 - TSLP-7-6 2.8…4.7 1.5…Vdd 0.26/0.33 > 26 / > 20 > 30 4.5 TSNP-14 1) Digital Control Voltage; 2) IL = Insertion Loss at 1.0/ 2.0 GHz; 4) 0.1dB compression point; 5) measured at 1dB IL. 6) Please visit our website http://www.infineon.com/rfswitches for alternative devices. 21 3) Isolation at 1.0/ 2.0 GHz; RF and Protection Devices Application Guide for Protection 3.8 ESD and Transient Protection for VDSL, ADSL & Other Broadband Applications Vcc 4 Primary Protection DSL Line Driver TIP 3 2 1 DSL 70 RING ESD Diodes Notes: Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package DSL70 Broadband +50 ±15 2.7@16 4.0@30 0.1 27 6 2.5 2 SOT143 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 22 RF and Protection Devices Application Guide for Protection 4 General Purpose Interface Protection Infineon general purpose ESD diodes are designed to handle high-peak transient current far beyond current standards while remaining unchanged in protection characteristics even after repetitive strikes. These devices are especially well suited for ESD and transient protection of low-speed HID data normally used by keypads, buttons, touch screens and audio lines. These same devices provide excellent and economical protection for power and battery lines from which ESD has an entry point into the heart of the equipment. Even battery lines that are normally only accessed by field repair personnel are often protected to keep equipment safe during repairs and upgrades. The audio interfaces of a mobile phone such as the microphone, speaker and headset are highly exposed to the ESD environment during routine use. As shown in the audio circuit diagram below, an audio headset can trap and route ESD strikes to sensitive system components. ESD strikes can also enter the phone directly via the audio jack. The low output impedance of audio amplifiers in today’s mobile phone systems presents an exceptional challenge because an extremely low clamping voltage is required of the ESD protection solution to prevent damage to the amplifier. This makes low dynamic resistance a requirement in order for robust protection to be achieved. The RF amplifier in very close proximity also presents its own set of challenges that need to be overcome in order to prevent audio frequency rectification of the RF output stage that can enter the audio circuits and impact audio quality. Voltage Time Audio_out single ended Audio ESD-strike Headset cable -Vcc +Vcc Figure 9 Charge Pump Low loss EMI ferrite beat ESD Diode Amp. ESD-strike Headset Ear-phone +Vcc Audio_in NO-DC_offset Headset con. e.g. 3.5mm jack Application Example for typical ear-stick driver stage To combine robust ESD protection with EMI suppression, Infineon Technologies offers silicon based ESD diodes in a variety of packages that are tailored for audio interfaces. These ESD diodes have very low dynamic resistance, and therefore, very low clamping voltage to protect the voltage sensitive audio driver IC and other components. Infineon protection technology also inherently has ultra-low leakage current enabling battery powered devices to operate or standby longer, even with many points of protection. These factors, along with the world’s smallest single-line package and multiple-line flow through array solutions, simplify PCB layout and enable exceptional product performance with high reliability. 23 RF and Protection Devices Application Guide for Protection 4.1 ESD Protection for Low Data Rate Interfaces Low data rate interfaces to keypads, buttons, trackballs, and keyboards in portable or mobile equipment are significant entry points for ESD hazards. These circuits are typically powered by less than 5VDC. The ESD5V3L1B device provides a straightforward and effective ESD protection for those interfaces. The ESD8V0R1B and the ESD5V0S5US are also effective in these applications. 1.0x0.6x0.4mm 1.0x0.6x0.39mm 0.6x0.3x0.3mm Keypad * 7 4 1 0 8 5 2 # 9 6 3 R1 R2 R3 C1 C2 C3 C4 ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD8V0R1B General purpose +14/-8 ±18 +28/-27@±16 +35/-35@±30 0.5/0.6 ±1 +23/ -17 4 1 TSLP-2-17 TSSLP-2-1 ESD5V3L1B General purpose ±5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 ESD5V0S5US General purpose +5.0 ±30 10@16 14@±30 0.25 10 10.5 70 5 SOT363 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. Flow Through Layout Recommendation for ESD5V0S5US in SOT363 24 RF and Protection Devices Application Guide for Protection 4.2 ESD Protection for Dual Channel General Purpose e.g. AV I/F Interfaces +Vcc Audio out single ended Audio Amp. Audio_in right ESD strike ESD strike Headset cable ESD Diode -Vcc +Vcc Headset Ear-phone right Charge Pump Low loss Headset con. EMI e.g. 3.5 mm Ferrite jack beat +Vcc Audio_in left Charge Pump Headset Ear-phone left -Vcc Audio Amp. ESD Diode Headset cable ESD strike ESD strike Audio out single ended +Vcc ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3L1B General purpose +5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 ESD8V0R1B General purpose +14/-8 ±18 +28/-27@±16 +35/-35@±30 0.5/0.6 ±1 +23/ -17 4 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 25 RF and Protection Devices Application Guide for Protection ESD Protection for Near Field Communication (NFC) ESD Diode EMI-LP filter Tx+ GND antenna matching loop antenna Base band Tx+ Rx Security Controller RF = 13.56 MHz Vsignal vs. |GND| < 18 Vp NFC Transceiver IC 4.3 SIM SWP Main PCB / Top shell Application 1: single-ended antenna EMI-LP filter Tx+ TxGND antenna matching loop antenna Base band Rx Security Controller ESD Diode NFC Transceiver IC RF = 13.56 MHz Vsignal vs. |GND| < 18 Vp +Vsignal vs. –Vsignal < 36V SIM SWP Main PCB / Top shell Application 2: differential antenna ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD18VU1B on request NFC ±18.5 ±15 26@16 35@30 0.6 2 10 0.6 1 TSSLP-2-1 TSLP-2-17 ESD24VL1B NFC / charger protection ±24 ±20 55@16 72@30 1.3 1 40 2 1 TSSLP-2-1 TSLP-2-17 ESD3V3XU1U SWP interface +3.3 ±15 8@16 11@30 0.2 3 8.5 0.35 1 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 26 RF and Protection Devices Application Guide for Protection 4.4 Reverse Polarity Protection (RPP) Circuit DC GND +Vs/ GND GND +Vs +Vs DC GND/ +Vs RPP Diodes RPP Diode +Vs GND DC protected circuit DC protected circuit Prevents damage to the circuit System works with reverse polarity AF Schottky Diodes for RPP Product1) Application Note CT2) [pF] @VR [V] VF [mV] @IF [mA] VF [mV] @IF [mA] IR [μA] @VR [V] Package BAS3005A-02V - 10 5 260 10 450 500 < 300 30 SC79 BAS3005A-02LRH - 10 5 260 10 450 500 15 5 TSLP-2-17 BAS3010A-03W - 28 5 220 10 450 1000 < 200 30 SOD323 BAS3010S-02LRH - 10 5 340 100 570 1000 30 10 TSLP-2-17 BAS3020B - 30 5 350 1000 530 2000 40 30 SOT363 BAS4002S-02LRH - 7 5 330 10 470 200 0.5 5 TSLP-2-17 IR [μA] @VR [V] Package Notes: 1) D=Dual; T=Triple; Q=Quadruple; 2) at 1 MHz; 3) Please visit our website http://www.infineon.com/schottkydiodes for alternative devices. AF Schottky Diodes for advanced RPP (system works also with reverse polarity) Product1) Application Note CT2) [pF] @VR [V] VF [mV] BAS4002A-RPP Q - 2.2 5 BAS3007A-RPP Q - 10 5 Notes: @IF [mA] VF [mV] @IF [mA] 390 10 550 100 <2 30 SOT143 350 100 550 700 < 100 24 SOT143 1) D=Dual; T=Triple; Q=Quadruple; 2) at 1 MHz; 3) Please visit our website http://www.infineon.com/schottkydiodes for alternative devices. 27 RF and Protection Devices Application Guide for Protection 4.5 Reverse Polarity Protection for USB Charger RPP Diode DC Adapter USB Charger IC USB Power ICHG SYSTEM + MOSFET Battery MOSFET AF Schottky Diodes for RPP Product1) Application Note CT2) [pF] @VR [V] VF [mV] @IF [mA] VF [mV] @IF [mA] IR [μA] @VR [V] Package BAS4002A-02LRH - 7 5 330 10 470 200 0.5 5 TSLP-2-17 BAS3005A-02LRH - 10 5 260 10 450 500 15 5 TSLP-2-17 BAS3010S-02LRH - 10 5 340 100 570 1000 30 10 TSLP-2-17 Notes: 1) D=Dual; T=Triple; Q=Quadruple; 2) at 1 MHz; 3) Please visit our website http://www.infineon.com/schottkydiodes for alternative devices. 28 RF and Protection Devices Application Guide for Protection 4.6 Rectifier Circuit with Schottky Diodes Bridge Rectifier AC Power Supply IC DC EMI/EMC filter AF Schottky Diodes for Rectifier Circuit Application Note VR,max2) [V] IF,max3) [mA] VBR [V] IR [μA] @VR [V] VF [V] @IF [mA] τrr [ns] Package D - 50 140 50 < 0.2 50 < 1.3 100 < 6.0 SOT143 BAS4002A-RPP D - 40 200 40 < 10 40 < 0.62 <2 - SOT143 BAS3007A-RPP D - 30 350 30 < 350 30 < 0.4 < 100 - SOT143 Product1) BGX50A Notes: 1) D=Dual; T=Triple; Q=Quadruple; 2) Reverse voltage in maximum ratings; 3) Please visit our website http://www.infineon.com/schottkydiodes for alternative devices. 29 3) Forward current in maximum ratings; RF and Protection Devices Application Guide for Protection 4.7 Clipping and Clamping Vs After Filtering Digital spikes Discrete spike filter RF Schottky Diodes for Clipping and Clamping Product1) Application Note CT2) [pF] @VR [V] VF [mV] @IF [mA] VF [mV] @IF [mA] IR [μA] @VR [V] Package BAT54 series - < 10 1 < 320 1 < 800 100 <2 25 SOT23 SOT323 TSLP-2-7 SC79 BAT64 series - 4 1 320 1 570 100 <2 25 SOT23 SOT323 SCD80 8 SOT23 SOT323 SOT343 SOT363 40 SOT23 SOT143 SOT323 SOT343 TSLP-2-1 70 SOT23 SOT143 SOT323 SOT343 SOT363 SCD80 TSLP-2-1 BAT68 series BAS40 series BAS70 series Notes: - - - 0.7 3 1,5 0 0 0 318 1 310 1 375 1 1) D=Dual; T=Triple; Q=Quadruple; 2) at 1 MHz; 3) Please visit our website http://www.infineon.com/schottkydiodes for alternative devices. 30 390 720 705 10 40 10 < 10 < 10 < 10 RF and Protection Devices Application Guide for Protection 5 ESD / Surge Protection Protection of a semiconductor IC against a surge or transient voltage is very critical in systems where AC mains power is involved. One such system is the Ethernet, the most used system for network communications directly from the backbone to servers to desktops. Ethernet has evolved from 10 Mbps data-rates to 1000 Mbps Gigabit Ethernet (1000base-T). On the horizon, the 10 Gbps Ethernet (10GBase-T) is visible for back office applications. Below is a simplified illustration of an Ethernet network. As shown graphically, there can be direct or indirect ESD strikes and surges affecting the ESD sensitive devices of any equipment on the network with destructive consequences resulting in reduction of the quality of service. Surges can be generated by a fault in the AC mains, switching of capacitors, or lightning. Surges can directly strike the RJ45 connector or they can be induced on the cable by electro-magnetic fields. Apart from surges on the AC mains, the system also needs to be protected from other causes of ESD strikes like human touch during installation, maintenance and normal operation. Emerging nations such as China have introduced strict regulations on the protection of Ethernet systems from surges due to the fluctuations in AC mains power. This is due to relatively unstable power distribution networks found in China and other countries. ESD and surge strikes can both enter equipment through the RJ45 connector where they must pass through the standard Ethernet quad-transformer before hitting the transceiver IC. Direct injected ESD and Surge strikes Induced surges File Server Gigabit Ethernet Adapter Card RJ45 Jack for Gigabit Ethernet Connection Gigabit EthernetSwitch Direct injected ESD and Surge strikes Workstations Figure 10 Ethernet structure The Gigabit Ethernet cable has four twisted differential pairs called “lanes”, each delivering full-duplex data. Each lane is capable of transferring data at 250 Mbps. Because of PAM (Pulse Amplitude Modulation) each symbol transferred requires 2 bits. 31 RF and Protection Devices Application Guide for Protection Therefore, fundamental transfer frequency is 62.5 MHz requiring a CAT5e or better cable (fT = 100 MHz minimum). The high data rate imposes high signal quality challenges to maintain integrity of the PAM waveform, especially over long link distance. Complete ESD and Surge robustness of the system is accomplished as follows: 1. Primary Side Protection: The primary side, which is comprised of the RJ45 connector, transformer and PCB, can be protected against very high voltage strikes using gas tubes which are triggered at a certain voltage level to short the strike energy to ground. 2. Secondary Side Protection: The secondary side, which is usually connected to a sensitive semiconductor IC such as an Ethernet PHY, requires a precise ESD and surge protection network to assure complete protection from any damage caused by secondary side induced surge pulse. To maintain maximum signal integrity on both the primary and secondary sides, the protection devices must have very low capacitance. 5.1 ESD Requirements: An IEC61000-4-2 level-4 ESD protection circuit should be able to handle ESD strikes of up to 8 kV contact discharge and 15 kV air discharge according to the standard. However, more and more Infineon customers are requesting 15 kV contact discharge ESD robustness in order to meet quality of service requirements, reduce repair costs and cost of ownership, and to increase the customer’s satisfaction with the overall experience with the equipment. 5.2 Surge Requirements: Surge waveforms according to the IEC 61000-4-5 standard are defined for a short circuit case as either 8/20 µs or 5/320 µs. For a DUT (Device under Test) acting as an open circuit, the relevant waveform characteristics defined in the standard are 1.2/50 µs or 10/700 µs. Test-current peak value is adjusted according to the intended test-class. This document focuses on the Chinese requirements for surge protection shown below. 5.2.1 Line-to-Line (L/L) Case In this case, the system is seen as a short circuit by the surge source. The system has to be protected against secondary side induced surge currents and surge voltages. The surge waveform is defined in the IEC61000-4-5 standard as a 5/320 µs current pulse at 25 A for a 1 kV test surge and at 50 A for a 2 kV test surge which are injected into the system on primary side (RJ45 connector side). The signal path and the return path for the current surge belong to the same lane. This surge acts in differential mode and is therefore transferred to the secondary side of the magnetic transformer based on the law L*dIsurge/dt. This induced voltage depends on the rise time of the primary L/L surge pulse, and the frequency response and high current saturation of the magnetic transformer. 32 RF and Protection Devices Application Guide for Protection IEC61000-4-5 surge generator Linepair #3 Linepair #4 primary side primary side secondary side Magnetic module – one lane Gigabit Ethernet Transceiver (PHY) Infineon TVS diode ESD/surge Linepair #2 Ethernet cable Twisted Pair#1 1:1 RJ45 Ethernet connector Surge current 5/350us 1kV (25A), 2kV(50A) RX1 1:1 TX1 75 Ohm Res each lane one common 2nF cap Gas-tube is NOT triggered at „Line to Line“ ESD/surge strike Res Spark gap e.g. gas tube Figure 11 Internal ESD protection Line to Line test configuration for Ethernet For a 5/320 µs primary side surge current, the induced surge pulse on secondary side is strongly compressed in time down to a total duration of much less than 20 µs. Secondary side generated short circuit peak current is less than 20 A even if the primary side L/L surge significantly exceeds 50 A (where the 50 A is related to the 2 kV test surge requirement). Surge pulse shape and amplitude injected on the primary side is completely different with respect to the secondary side induced surge pulse. For the L/L system level surge test, an ESD diode on the secondary side can be used, because the surge handling capability requirement is lower compared to the primary side injected surge pulse protection requirement. Much more important to the survival of the Ethernet PHY is the clamping voltage of the ESD diode in the case of a system level surge event. The lower the ESD diode clamping voltage, the lower the surge stress on the PHY. 5.2.2 Line-to-Ground (L/GND) Case In this case, the system is seen as an open-circuit by the surge source. The system needs to be protected against high voltage levels between the signal line and GND. The required surge waveform in the IEC6100-4-5 is defined at 10/700 µs, with a peak voltage level of 4 kV or 6 kV. This surge must be handled on the primary side without destructive parasitic air discharge breakthrough to the secondary side. A common solution is to use a gas-discharge tube on the primary side to reduce the surge voltage level to a safe level for the primary side and eliminate breakthrough air discharge damage on the secondary side. Once the gas tube is triggered, the system transforms into a short circuit which translates the surge waveform into a current pulse of 5/300 µs with 100 A or 150 A respectively for a 4 kV or 6 kV surge strike. 33 RF and Protection Devices Application Guide for Protection IEC61000-4-5 surge generator primary side primary side Magnetic module – one lane Linepair #1 Infineon TVS diode ESD/surge Gigabit Ethernet Transceiver (PHY) RX1 1:1 Surge voltage 10/700us 4kV...6kV, => Surge current 5/320us 100A...150A RJ45 Ethernet connector Linepair #2 Ethernet cable Twisted Pair secondary side 1:1 Linepair #4 75 Ohm Res each lane one common 2nF cap Linepair #3 surge voltage drop Gas-tube is triggered at „Line to GND“ ESD/surge strike Res Spark gap e.g. gas tube TX1 Internal ESD protection 10/700us Voltage wave => 5/320us Current wave surge voltage drop till spark-gap is triggered Figure 12 Line to GND test configuration for Ethernet For system protection against ESD strikes only, the recommended Infineon device is the ESD5V5ULC as shown in table below. TVS3V3L4U is the right choice if the system is required to be protected against both ESD and surge events as required by the Chinese government regulations. 34 RF and Protection Devices Application Guide for Protection 5.3 ESD Surge Protection for Gigabit Ethernet 1:1 5 3 4 Res TVS3V3L4U 6 2 Res 1:1 Quad Transformer Ethernet cable Twisted Pair RJ45 Ethernet connector 1:1 Gigabit Ethernet Transceiver (PHY) 1 Ethernet cable Twisted Pair 1:1 1:1 6 2 5 3 4 Res TVS3V3L4U 1 Ethernet cable Twisted Pair 1:1 Res 1:1 1:1 ESD ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package TVS3V3L4U on request GBit Ethernet +3.3 ±25 5.8@16 7.1@30 0.1 20 8 2.0 4 SC74 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. Flow Through Layout Recommendation for TVS3V3U4ULC in SC74 35 RF and Protection Devices Application Guide for Protection 6 Interface Protection with Integrated ESD/EMI Devices With increasing numbers of wireless functions integrated into portable and mobile equipment, not only robust protection from ESD, but also immunity from EMI is mandatory to ensure reliable and maximum functionality. Infineon offers various high performance types of integrated protection devices combining ESD and EMI protection in miniature packages for mobile phone applications. BGF100/BGF200 BGF113 AV I/F BGF112 TV BGF111 LCD BGF108c/BGF109c SIM Card BGF106c BGF124/BGF125 µSD/SD Card BGF117 HSMM Card BGF104 Charger BGF119 HDMI BGF127/BGF128 Digital Baseband IC Headset Analog Baseband IC Following is a short overview of the available ESD/EMI devices for various interfaces. Overview of Infineon’s Integrated ESD/EMI Devices for Interface Protection 36 RF and Protection Devices Application Guide for Protection Alternatively, discrete ESD diodes can also be used for general interface protection. The following diagram provides a summary of suitable ESD diodes for various interfaces. Analog/Digital Interfaces Headset RF Interfaces ESD5V3S1B ESD5V3L1B ESD8V0-series NFC ESD18VU1B ESD24VL1B TV/Audio LCD ESD5V3U-series ESD5V3L1B-series USB1.1/2.0 ESD5V3U-series USB3.0 ESD3V3U4ULC Camera ESD5V3U-series ESD5V3L1B-series SIM Card SD Card MM Card ESD5V3U4U-HDMI ESD5V3U-series ESD5V3L1B-series I/O Data ESD8V0-series ESD5V3S1B-series ESD5V3L1B-series HDMI ESD5V3U4U-HDMI ESD5V3U-series Human Interfaces ESD8V0-series ESD5V3L1B-series ESD5V3L1U-02LRH SWP ESD3V3XU1US Keypad Electronic Equipment e.g. mobile/ wireless/ portable devices, consumer & industrial units ESD0P2RF ESD0P1RF WLAN GPS ESD0P2RF ESD0P1RF Mobile TV ESD0P2RF ESD0P1RF FM ESD0P2RF ESD0P1RF RPP Diode Power Supply USB Charger Overview of Infineon’s ESD Diodes for Interface Protection For further information about Infineon’s ESD diode portfolio and applications, please refer to our ESD Protection Brochure www.infineon.com/tvs.brochure. You can also visit our webpage for protection devices: www.infineon.com/protection. 37 RF and Protection Devices Application Guide for Protection ESD/EMI Protection for Differential Mode Microphone Interface – BGF113 6.1 VMIC(A2 or A3) dep. on Application VMIC A1 A3 BGF113 15 kV 2 kV LPF B3 B1 MICP1 VMICP 100 nF C2 B2 GND MIC GND VMICN LPF C1 C3 MICN1 100 nF 15 kV 2 kV Baseband IC HiPAC – Integrated ESD/EMI Protection Device Notes: Product Application VRWM [V] ESD1) [kV] Stop Band Attenuation2) [dB] Protected Lines Package BGF113 Audio Line Interface ±4 ±15 40 2 WLP-8-6 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) Measured in 50 Ohm environment @ 1 GHz; 3) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3S1B General purpose ±5.3 ±20 ±15@±16 ±19@±30 0.4 ±5.5 ±11 17.5 1 TSLP-2-17 TSSLP-2-1 ESD5V3L1B General purpose ±5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 ESD8V0R1B General purpose +14/-8 ±18 +28/-27@±16 +35/-35@±30 0.5/0.6 ±1 +23/ -17 4 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 38 RF and Protection Devices Application Guide for Protection ESD/EMI Protection for SIM Card Interface – BGF106c 6.2 15 kV 15 kV 2 kV C2 Vcc BGF106c C1 CLK B1 I/O RST VCC C3 B3 low pass A2 A3 GND RST CLK I/O Flash Controller IC SIM Card Connector B2 (GND) HiPAC – Integrated ESD/EMI Protection Device Notes: Product Application VRWM [V] ESD1) [kV] Line capacitance of all lines to GND [pF] Protected Lines Package BGF106c SIM Card Interface +5.5 ±15 16.5 4 WLP-8-11 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V5U5ULC high speed low cap. +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B General purpose ±5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 39 RF and Protection Devices Application Guide for Protection ESD/EMI Protection for 6-Pin SIM Card Interface – BGF125 6.3 15 kV 15 kV 2 kV C2 Vcc BGF125 C1 CLK RST VCC B1 I/O B3 low pass A2 C3 A3 GND RST CLK I/O Flash Controller IC SIM Card Connector (6-pin) B2 (GND) HiPAC – Integrated ESD/EMI Protection Device Notes: Product Application VRWM [V] ESD1) [kV] Line capacitance of all lines to GND [pF] Protected Lines Package BGF125 SIM Card Interface ±5.0 ±15 10 4 WLP-8-10 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V5U5ULC high speed low cap. +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B General purpose ±5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 40 RF and Protection Devices Application Guide for Protection ESD/EMI Protection for 8-Pin SIM Card Interface – BGF124 6.4 15 kV 2 kV 15 kV D1 D+ D- CLK I/O RST VCC BGF124 A3 B3 C3 D2 D3 GND low pass Vcc RST CLK I/O USB-D+ A1 B1 C1 USB-D- Flash Controller IC SIM Card Connector (8-pin) 15 kV A2, C2 (GND) HiPAC – Integrated ESD/EMI Protection Device Notes: Product Application VRWM [V] ESD1) [kV] Line capacitance of all lines to GND [pF] Protected Lines Package BGF124 Sim Card Interface ±5.0 ±15 10 4 WLP-11-4 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V5U5ULC high speed low cap. +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B General purpose ±5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 41 RF and Protection Devices Application Guide for Protection ESD/EMI Protection for Flash Memory: MicroSD/MiniSD/SD Card – BGF117 6.5 BGF117 µSD Card µSD Card Connector DAT2 DAT2 DAT3 DAT3 CMD CMD Vcc Vcc CLK Vcc 15kV 2kV R* CMD DAT0 CLK DAT1 LPF GND GND DAT2 DAT0 DAT0 DAT3 DAT1 DAT1 CLK * not applicabel f or CLK line Flash Controller IC HiPAC – Integrated ESD/EMI Protection Device Notes: Product Application VRWM [V] ESD1) [kV] Line capacitance of all lines to GND [pF] Protected Lines Package BGF117 SD Card Interface ±5.5 ±15 8 7 WLP-16-4 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V5U5ULC high speed low cap. +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B General purpose ±5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 42 RF and Protection Devices Application Guide for Protection ESD/EMI Protection for High-Speed MMC-Card (4 data lines) – BGF104c 6.6 MMC Card Connector BGF104c DAT2 C9 For x8 HSMMC card only VDD DAT3 C1 C10 15kV CMD 2kV R* C2 C3 DAT0 VDD C4 DAT1 LPF CLK C5 DAT2 VSS2 C12 C6 C13 CLK CMD VSS1 C11 DAT3 DAT0 C7 x4 HSMMC card DAT1 C8 * not applicabel f or CLK line Flash Controller IC HiPAC – Integrated ESD/EMI Protection Device Notes: Product Application VRWM [V] ESD1) [kV] Line capacitance of all lines to GND [pF] Protected Lines Package BGF104c SD Card Interface +14 ±15 16 7 WLP-16-3 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V5U5ULC high speed low cap. +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B General purpose +5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 43 RF and Protection Devices Application Guide for Protection 6.7 ESD/EMI Protection for LCD/Camera Interface - BGF108c / BGF109c 2 x BGF108c/BGF109c LCD Source Drive PD[15:0] 15 kV LPF 7 (10) Flash Controller IC 7 (10) PD[15:0] 15 kV 14 (20) VSYNC HSYNC DOTCLK ENABLE 7 (10) VSYNC HSYNC DOTCLK ENABLE 15 kV LPF 7 (10) FPC 1 1) Flexible Printed Circuit BGF108c (7 lines) / BGF109c (10 lines) HiPAC – Integrated ESD/EMI Protection Device Notes: Product Application VRWM [V] ESD1) [kV] Line capacitance of all lines to GND [pF] Protected Lines Package BGF108c LCD Interface 0…5 ±15 27 @ VR = 0V 17 @ VR = 3V 7 WLP-18-4 BGF109c LCD Interface -7…7 ±15 28 @ VR = 0V 17 @ VR = 3V 9 WLP-24-9 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. ESD Diodes Product Application VRWM [V] ESD1) [kV] VCL2) [VCL]@[A] Rdyn3) [Ω] IPP4) [A] VCL5) [V] CT6) [pF] Protected Lines Package ESD5V3U4U-HDMI high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 4 TSLP-9-1 ESD5V3U1U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 1 TSLP-2-7 TSSLP-2-1 ESD5V3U2U high speed low cap. +5.3 ±15 19@16 28@30 0.65 3 12 0.4 2 TSLP-3-7 TSFP-3 ESD5V5U5ULC high speed low cap. +5.5 ±25 8.9@16 11.5@30 0.2 6 10 0.45 4 SC74 ESD5V3L1B General purpose ±5.3 ±20 +10/-13@±16 +12/-17@±30 0.2 0.35 ±2.5 ±10 5 1 TSLP-2-17 TSSLP-2-1 Notes: 1) Electrostatic discharge as per IEC61000-4-2, contact discharge; 2) TLP clamping voltage for 100 ns pulse length; 3) Dynamic Resistance (ON-Resistance) evaluated with TLP measurement (100ns pulse length); 4) Maximum peak pulse current according to IEC61000-4-5 (8/20μs); 5) Clamping Voltage at IPP,max according to IEC61000-4-5 (8/20μs); 6) Typical capacitance at 1 MHz (unless specified), 0 V, I/O vs. GND; 7) Please visit our webpage http://www.infineon.com/tvsdiodes for alternative devices. 44 Abbreviations Abbr. Terms Abbr. Terms ADSL Asymmetric Digital Subscriber Line MICP Microphone Positive AN Application Note MIPI Mobile Industry Processor Interface ASIC Application Specific Integrated Circuit MM Card Multimedia Card AUX Auxiliary MMIC Monolithic Microwave Integrated Circuit AV I/F Interface Audio Video Intermediate Frequency Interface NFC Near-Field Communication (13.56 MHz) BB Baseband PAM Pulse Amplitude Modulation BER Bit Error Rate PCB Printed Circuit Board PD Programming Data PHY Physical Layer RF Radio Frequency RoHS Restriction of Hazardous Substances RPD RF and Protection Devices RPP Reserve Polarity Protection RST Reset Rx Receive SATA Serial Advanced Technology Attachment SC Semiconductor Package BPF Band Pass Filter CEC Consumer Electronics Control CLK Clock CMD Command DAT Data DC Direct Current DPDT Double Pole Double Throw DSL Digital Subscriber Line DUT Device under Test DVI Digital Visual Interface EMI Electromagnetic Interference SCL Serial Clock Line ESD Electro-Static Discharge SDA Serial Data Line FM Frequency Modulation (76 – 108 MHz) (µ)SD Card (Micro)Secure Digital Memory Card GND Ground SIM Card Subscriber Identity Module Card GPS Global Positioning System (1575.42 MHz) SOT Small Outline Transistor Package HBM Human Body Model SPDT Single Pole Double Throw HDMI High-Definition Multimedia Interface SWP Single Wire Protocol HID Human Interface Device TLP Transmission Line Pulse TMDS Transition Minimized Differential Signaling HS / FS / LS High Speed (480 Mbit/s) / Full Speed (12 Mbit/s) / Low Speed (1.5 Mbit/s) TR Technical Report TRX Transceiver TSFP Thin Small Flat Package TSSLP Thin Super Small Leadless Package TV Television TVS Transient Voltage Suppression Tx Transmit USB Universal Serial Bus VDSL Very High Speed Digital Subscriber Line VSYNC Vertical Synchronization VMIC Voltage Microphone WLAN Wireless Local Area Network WLP Wafer Level Package HSMM High-Speed Multimedia HSYNC Horizontal Synchronization IC Integrated Circuit IEC International Electrotechnical Commission I/O Input / Output LCD Liquid Crystal Display L/GND Line-to-Ground L/L Line-to-Line LNA Low Noise Amplifier LPF Low Pass Filter MHL Mobil High-definition Link ML Main Lane MICN Microphone Negative Alphanumerical List of Symbols Symbol Term Unit BW Bandwidth [GHz] CT Total Diode capacitance [pF] IF Forward current [mA] IPP Maximum peak pulse current [A] IR Reserve current [uA] IL Insertion loss [dB] P-0.1dB 0.1dB compression point [dBm] Rdyn Dynamic Resistance [Ω] rF Differential forward resistance [Ω] VBR Breakdown voltage [V] VCL Clamping voltage [V] Vctrl Digital control voltage [V] Vdd DC supply voltage [V] VF Forward voltage [mV] VR Reverse voltage [V] VRWM Reverse working voltage [V] τL Storage time [ns] τrr Reverse recovery time [ns] Package Information Package (JEITA-code) X L×W×H PIN-Count Scale 1:1 All products are available in green (RoHS compliant). All Dimensions in mm 1.6 × 0.8 × 0.55 2 1.7 × 0.8 × 0.7 2.0 × 2.1 × 0.9 4 WLP-16-4 ( - ) 1.55 × 1.55 × 0.6 3:1 8 4:1 8 2 7:1 7 TSLP-7-6 ( - ) 2.3 × 1.5 × 0.4 7 4:1 1.4 × 1.26 × 0.39 3:1 3:1 WLP-16-3 ( - ) WLP-8-11 ( - ) 1.15 × 1.15 × 0.6 0.62 × 0.32 × 0.31 4:1 WLP-8-10 ( - ) 1.16 × 1.16 × 0.6 TSSLP-2-1 ( - ) 1.2 × 1.2 × 0.55 TSLP-7-4 ( - ) 1.0 × 0.6 × 0.39 2.9 × 2.4 × 1.0 2:1 TSFP-3 ( - ) 3 5:1 WLP-8-6 ( - ) 3:1 16 3 4 2:1 TSLP-3-7 ( - ) 1.0 × 0.6 × 0.39 5:1 TSLP-9-1 ( - ) 2.3 × 1.0 × 0.31 2.0 × 2.1 × 0.9 SOT143 (SC - 61) 2.9 × 2.4 × 1.1 2:1 TSLP-2-7 ( - ) 2 5:1 9 6 3:1 TSLP-2-17 1.0 × 0.6 × 0.39 3 SOT363 (SC - 88) 2.0 × 2.1 × 0.9 3:1 2 2.5 × 1.25 × 0.9 2:1 SOT343 (SC-82) SOT323 (SC-70) 3 2 3:1 3:1 SOT23 ( - ) SOD323 (SC-76) SCD80 (SC-80) SC79 (SC-79) 2 8 1.2 × 1.2 × 0.6 4:1 16 1.92 × 1.92 × 0.65 3:1 Support Material Data Sheets / Application Notes / Technical Reports www.infineon.com/rfandprotectiondevices Products: - RF CMOS Switches RF MMICs RF Transistors RF Diodes PIN Diodes Schottky Diodes Varactor Diodes ESD/EMI Protection Devices www.infineon.com/rfswitches www.infineon.com/rfmmics www.infineon.com/rftransistors www.infineon.com/rfdiodes www.infineon.com/pindiodes www.infineon.com/schottkydiodes www.infineon.com/varactordiodes www.infineon.com/ESDdiodes Brochures: - Selection Guide www.infineon.com/rpd_selectionguide - Application Guide for Mobile Communication www.infineon.com/rpd_appguide_mobile - Application Guide for Consumer Applications www.infineon.com/rpd_appguide_consumer - Application Guide for Industrial Applications - Application Guide for Protection - ESD Protection Solutions – Consumer and Wireless Communication - GPS Front-End Components for Mobile and Wireless Applications www.infineon.com/rpd_appguide_industrial www.infineon.com/rpd_appguide_protection www.infineon.com/ESD.brochure www.infineon.com/gps Sample Kits www.infineon.com/rpdkits Evaluation Boards For more information please contact your sales counterpart at Infineon.