LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only LED ARRAY Pb Lead-Free Parts LA92B/HRFUG.UGUG-R1-PF DATA SHEET DOC. NO : QW0905- LA92B/HRFUG.UGUG-R1-PF REV. : A DATE : 05 - Dec. - 2014 發行 立碁電子 DCC LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 1/8 PART NO. LA92B/HRFUG.UGUG-R1-PF Package Dimensions HRF UG 11.72 ±0.5 7.0 9.02 ψ2.9X2 1 + HRFUG 9.65 5.08 TYP 1 2 3.3±0.3 3 2.54TYP UG 2.54TYP + - 5.08 ±0.5 3 + 1.ANODE RED 2.COMMON CATHODE 3.ANODE GREEN UGUG □0.5 2 - 2.54±0.5 UG 1 2 3 + 1.ANODE GREEN 2.COMMON CATHODE 3.ANODE GREEN LHRFUG2692-PF LUGUG2692-PF 3.1 2.9 HRF 6.45 ±0.5 4.3 UG 1 2 3 3.3 1.5 MAX 1.ANODE RED 2.COMMON CATHODE 3.ANODE GREEN □0.5 TYP 18.0MIN UG 1 2 UG 3 2.0MIN 1 2 3 2.0MIN 2.54TYP 2.54TYP 1.ANODE GREEN 2.COMMON CATHODE 3.ANODE GREEN Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without not ice. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 2/8 PART NO. LA92B/HRFUG.UGUG-R1-PF Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT HRF UG Forward Current IF 25 25 mA Peak Forward Current Duty 1/10@10KHz IFP 75 75 mA Power Dissipation PD 65 65 mW Electrostatic Discharge ESD 2000 V Reverse Current @5V Ir 10 μA Operating Temperature Topr -40 ~ +85 ℃ Storage Temperature Tstg -40 ~ +100 ℃ Typical Electrical & Optical Characteristics (Ta=25 ℃) PART NO COLOR MATERIAL Emitted AlGaInP Lens Red Luminous Viewing Dominant Spectral Forward intensity angle wave halfwidth voltage length △λnm @20mA(V) @20mA(mcd) 2θ 1/2 (deg) λDnm Typ. Min. Max. Min. 630 20 1.5 2.4 220 550 70 574 20 1.7 2.6 65 90 70 574 20 1.7 2.6 65 90 70 574 20 1.7 2.6 65 90 70 Whtie Diffused AlGaInP Green AlGaInP Green LA92B/HRFUG.UGUG-R1-PF Whtie Diffused AlGaInP Green Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 3/8 PART NO. LA92B/HRFUG.UGUG-R1-PF Brightness Code For Standard LED Lamps UG CHIP Group Luminous Intensity(mcd) at 20 mA Min. Max. A11 A12 65 90 90 120 A13 120 160 A14 160 220 A15 220 300 A16 300 350 HRF CHIP Group Luminous Intensity(mcd) at 20 mA Min. Max. A15 220 300 A16 A17 300 350 350 450 A18 450 550 A19 550 700 A20 700 900 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA92B/HRFUG.UGUG-R1-PF Page 4/8 Brightness Code For Standard LED Lamps Color Code UG CHIP Group Wave length(nm) at 20 mA Min. Max. 7 568 570 8 570 572 9 572 574 10 574 576 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA92B/HRFUG.UGUG-R1-PF Page 5/8 Typical Electro-Optical Characteristics Curve HRF CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 2.0 50 Relative Intensity Normalize @20mA Forward Current(mA) 60 40 30 20 10 0 1.0 0.0 0 1.0 0.5 2.0 1.5 3.0 2.5 1.0 10 1.2 1.1 1.0 0.9 0.8 20 40 60 80 Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0.0 550 600 650 Wavelength (nm) 2.5 2.0 1.5 1.0 0.5 0.0 -20 0 20 40 60 Ambient Temperature( ℃) Ambient Temperature( ℃) Relative Intensity@20mA Fig.4 Relative Intensity vs. Temperature Relative Intensity@20mA Normalize @25 ℃ Forward Voltage@20mA Normalize @25 ℃ Fig.3 Forward Voltage vs. Temperature 0 1000 Forward Current(mA) Forward Voltage(V) -20 100 700 80 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA92B/HRFUG.UGUG-R1-PF Page 6/8 Typical Electro-Optical Characteristics Curve UG CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 2.0 Relative Intensity Normalize @20mA Forward Current(mA) 60 50 40 30 20 10 0 1.0 0 0 0.5 1.0 1.5 2.0 2.5 1.0 3.0 10 Fig.4 Relative Intensity vs. Temperature 1.2 1.1 1.0 0.9 0.8 20 40 60 80 Relative Intensity @20mA Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0 550 600 Wavelength (nm) 2.5 2.0 1.5 1.0 0.5 0 -20 0 20 40 60 Ambient Temperature( ℃) Ambient Temperature( ℃) 500 Relative Intensity @20mA Normalize @25 ℃ Forward Voltage@20mA Normaliz @25 ℃ Fig.3 Forward Voltage vs. Temperature 0 1000 Forward Current(mA) Forward Voltage(V) -20 100 650 80 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 7/8 PART NO. LA92B/HRFUG.UGUG-R1-PF Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350° C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile Dip Soldering Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260° C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) Temp(° C) 260° C3sec Max 260° 5° /sec max 120° 25° 0° 0 2° /sec max Preheat 50 100 Note: 1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. 150 Time(sec) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA92B/HRFUG.UGUG-R1-PF Page 8/8 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃± 5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃± 5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃± 5℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hours. 1.Ta=105 ℃±5℃ &-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=245 ℃±5℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11