Discrete Devices: MOSFET’s, IGBT’s, Diodes Qualification Level Automotive Industrial Consumer Industry standards AEC‐Q101 Rev D JESD‐47 IR internal guidelines Customer Specific Customer guidelines Sample Condition1,2,3,4 Duration Size High 3 X 77 150°C or 175°C, 1000 hours 100% Rated Temperature BVdss Reverse Bias (HTRB) High 3 X 77 150°C or 175°C, 1000 100% Rated hours Temperature Vgs Gate Bias (HTGB) Intermittent 3 X 77 Delta Tj = 100°C Operating Life/ Power 15,000 Package cycling cycles dependent: (IOL/PTC) 8572 Small: 2‐ cycles minute 6000 ON/OFF cycles Medium: 3.5‐ 12,000 minute cycles ON/OFF Large: 5 minute ON/OFF Leadless: 2/3‐ minute ON/OFF Condition 1 Duration Condition Duration 150°C or 175°C, 80% Rated BVdss 150°C or 175°C, 80% Rated Vgs Delta Tj = 100°C Package dependent: Small: 2‐ minute ON/OFF Medium: 3.5‐minute ON/OFF Large: 5 minute ON/OFF Leadless: 2/3‐minute ON/OFF 1000 hours 150°C or 175°C, 80% Rated BVdss 150°C or 175°C, 80% Rated Vgs N/A 500 hours Unbiased Temperature / Humidity (Unbiased HAST) or Unbiased Autoclave (AC) 130°C/85%R H/33 PSIa or 110°C/85% RH/17.7Psia 96 hours or 264 hours N/A Not required 121°C/100% RH/ 29.7PSIa, 96 hours N/A Not required Test 3 x 77 130°C/85%RH 33 PSIa 3 X 77 121°C/100%RH 96 hours 29.7 PSIa Revision Date: January 01, 2012 96 hrs 1000 hours 15,000 cycles 8572 cycles 6000 cycles 12,000 cycles 500 hours Not required Revision: 01 Reliability qualification per agreed customer contract Qualification Level Automotive Industrial Consumer Industry standards AEC‐Q101 JESD‐47 IR internal guidelines Sample Condition1,2,3,4 Duration Size Temperature 3 X 77 85°C/85%RH, 1000 hours 80% rated of and Humidity Max BVdss up Bias (H3TRB) to 100V or Test 96 hours Condition 1 Duration Condition Duration 85°C/85%R H, 80% rated of Max BVdss up to 100V 1000 hours 85°C/85%R H, 80% rated of Max BVdss up to 100V 500 hours 130°C/85%R H/33Psia, 80% rated of Max BVdss up to 42V ‐55°C to 150°C 96 hours 96 hours Samples tested at Room temp N/A 130°C/85%R H/33Psia, 80% rated of Max BVdss up to 42V ‐55°°C to 150°C PQFN: ‐40C to 125C Samples tested at Room temp High 3 x 77 Accelerated Temperature and Humidity Stress Test (HAST) Temperature 3 X 77 Cycle (TC) 130°C/85%RH /33Psia, 80% rated of Max BVdss up to 42V Parametric Verification (PV) 1 X 25 Test samples over device temperature range (Tri‐ temp) No TODD (Top Of Die Delamination) after MSL testing No TODD after MSL testing TODD allowed if samples pass reliability testing per JESD‐022 JESD‐46C with 6 month minimum notification & customer approval prior to change JESD‐46C: Customer notified 90 days before implementation Customer notified 30 days before implementation. MSL Criteria using JESD‐ 022 Process Change Notice ‐55°C to 150°C 1000 cycles 1000 cycles 500 cycles Revision Date: January 01, 2012 Reliability qualification per agreed customer contract N/A Customer Specific Customer guidelines Revision: 01 TODD requirement per agreed customer contract Process notification per agreed customer contract Conditions and additional requirements 1 – Family data may be used to qualify one or more products. 2 – Exceptions to AEC‐Q101 requirements are noted in the qualification report. 3 – Performed only as required per AEC‐Q101. 4‐ Per AEC Q101‐ Shift analysis before and after stress test will be analyzed. If the shift is greater than 20% or leakage tests exceed 5 times initial readings or 10 times for moisture testing it will be considered a failure. PRECONDITIONING REQUIREMENTS Minimum MSL3 preconditioning per JESD22‐A113 is required for surface mount capable devices that are put on TC, H3TRB/HAST, uHAST, AC, or IOL/PTC. FAILURE CRITERIA All devices parameters must pass the data sheet specification requirements. Links: AEC: http://www.aecouncil.com/AECDocuments.html Jedec: http://www.jedec.org/standards‐documents Revision Date: January 01, 2012 Revision: 01