POWER IC PRODUCTS QR-0008

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QR-0008:
Reliability Qualification Report for
IRS21864SPBF
Date:June 14th, 2006
Qualification Vehicle: IRS21864SPBF in 14L-SOICN package:
Based on the reliability test results, the IRS21864SPBF has passed standard International Rectifier industriallevel qualification with MSL3 at 260 °C peak reflow temperature (PRT).
The handling, packing, shipping and use of the moisture/reflow sensitive surface mount devices need to be per
IPC/JEDEC J-STD-033A spec.
Device and Lot Information
Rel Number
Product/Part #
Qualification Level
Silicon Technology
Silicon Generation
Wafer Fab
Lead Finish Plating
Moisture Sensitivity Level
Reliability Test Location
10269-1-2-3
IRS21864SPBF
Lead-Free Industrial per COP800-08-Rev00
600 V HVIC
Gen 5
Fab11
100% Sn
14L-SOICN Package: MSL3 @ 260 oC
Per JEDEC spec JA113 / JEDEC J-STD-020C (Test Samples were subjected
to preconditioning prior to AC, TC & THB reliability tests, HTB samples do not
require precon).
IR Temecula, USA
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Reliability Test Results:
Samples from three wafer lots and three assembly lots were tested in the following reliability tests to determine
typical lifetime performance under industrial level qualification. The tests samples passed AC, TC, THB and
HTB reliability test requirements.
THE STRESS TESTS CONDITIONS AND RESULTS ARE AS FOLLOWS:
Reliability Test #1 Test Duration:
Test Condition:
Bias Condition:
Electrical Testing:
Device
Lot ID
1
IRS21864SPbF
2
IRS21864SPbF
3
IRS21864SPbF
Autoclave Test (AC):
96 Hours
+121 °C, 100%RH and 15 PSIG
None
@ Room
Hour
SS
Reject
0
80
96
0
80
96
0
80
96
Reliability Test #2 Test Duration:
Test Condition:
Bias Condition:
Electrical Testing:
Temperature Cycling (TC):
1000 Cycles
-55 °C to 150 °C (ΔT=205 °C, Dry-Air to Dry-Air)
None
@ Room
Device
Lot ID Cycle
IRS21864SPbF
IRS21864SPbF
IRS21864SPbF
1
2
3
Reliability Test #3 Test Duration:
Test Condition:
Bias Condition:
Electrical Testing:
Device
IRS21864SPbF
IRS21864SPbF
IRS21864SPbF
IRS21864SPbF
IRS21864SPbF
IRS21864SPbF
1000
1000
1000
Reject
80
80
80
Remark
0
0
0
Temperature Humidity Bias (THB) Test:
1000 Hours
85 °C, 85%RH
VCC=20 V, VB=20 V, VS=0 V (Com)
@ Room
Lot
ID
1
2
3
Reliability Test #4 Test Duration:
Test Condition:
Bias Condition:
Electrical Testing:
Device
SS
Remark
Hour
SS
Reject
1000
1000
1000
80
80
80
0
0
0
Remark
High Temperature Bias (HTB) Test:
1008 Hours
Tj=150 °C
VCC=20 V, VBS=20 V, VS=480 V
@ Room
Lot
ID
1
2
3
Hour
SS
Reject
1000
1000
1000
80
77
80
0
0
0
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Remark
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Reliability Test #5 Test Duration:
Test Condition:
Bias Condition:
Electrical Testing:
Device
IRS21864SPbF
High Temperature Storage Life (HTSL) Test:
1008 Hours
Tj,A=150 °C
No bias required
@ Room
Lot
ID
1
Hour
SS
Reject
1000
80
0
Remark
Other Required Tests Results:
1.
Resistance to Solder Heat/Wave-Solder: Test 30 devices from one lot per package/device-vehicle in
accordance with JEDEC, JESD22A111 – Passed (reference report: 10260-1-RSH).
2. Solderability: Test 10 devices from one lot per package/device-vehicle in accordance with JESD-106-B –
Passed (reference report: 10260-1-SLDR).
3. ESD: The following is the results of ESD tests that were performed by the R/D (Design Center) group.
IRS21864SPbF:
Human Body Model ESD (100 pF/1500 Ω)
Device: IRS21864SPBF
Lot # 551Q
Date code: C05AQ
Number of samples: 3 per test model
Test date: 2/9/06
Test Pin Combination
Rating
All Power Pin Combinations
3.5 kV
Machine Model ESD (200 pF/ 0 Ω)
Device: IRS21864SPBF
Lot # 551Q
Date code: C05AQ
Number of samples: 3 per test model
Test date: 2/9/06
Test Pin Combination
Rating
All Pin Combinations
200 V to 400 V
4. LATCH-UP: The following is the results of the LU test that was performed by the R/D (Design Center) group.
Device: IRS21864SPBF
Lot # 551Q
Date code: C05AQ
Number of samples: 6
Test Date: 2/9/06
Sample 1 Sample 2
HO > VB
2.0 A
2.0 A
HO < VS
2.0 A
2.0 A
LO > VCC
2.0 A
2.0 A
LO < COM
2.0 A
2.0 A
Sample 3
2.0 A
2.0 A
2.0 A
2.0 A
Sample 4
2.0 A
2.0 A
2.0 A
2.0 A
Sample 5
2.0 A
2.0 A
2.0 A
2.0 A
Sample 6
2.0 A
2.0 A
2.0 A
2.0 A
End of report
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