SP725 Series 5pF 8kV Diode Array

TVS Diode Arrays (SPA® Diodes)
General Purpose ESD Protection - SP725 Series
SP725 Series 5pF 8kV Diode Array
RoHS
Pb GREEN
Description
The SP725 is an array of SCR/Diode bipolar structures for
ESD and overvoltage protection of sensitive input circuits.
The SP725 has 2 protection SCR/Diode device structures
per input. There are a total of 4 available inputs that can be
used to protect up to 4 external signal or bus lines. Overvoltage protection is from the IN (Pins 1 - 4) to V+ or V-.
The SCR structures are designed for fast triggering at a
threshold of one +VBE diode threshold above V+ (Pin 5,6)
or one –VBE diode threshold below V- (Pin 7,8). From an
IN input, a clamp to V+ is activated if a transient pulse
causes the input to be increased to a voltage level greater
than one VBE above V+. A similar clamp to V- is activated if
a negative pulse, one VBE less than V-, is applied to an IN
input.
Pinout
SP725
(SOIC)
In
1
8
V-
In
2
7
V-
In
3
6
V+
In
4
5
V+
Refer to Fig 1 and Table 1 for further details. Refer to
Application Note AN9304 and AN9612 for further detail.
Features
• ESD Interface per HBM Standards
Functional Block Diagram
V+
- IEC 61000-4-2, Direct Discharge........... 8kV (Level 4)
- IEC 61000-4-2, Air Discharge................15kV (Level 4)
- MIL-STD-3015.7..................................................25kV
• Peak Current Capability
5, 6
- IEC 61000-4-5 8/20 µs Peak Pulse Current...... ± 14 A
- Single Transient Pulse, 100 µs Pulse Width....... ± 8 A
• Designed to Provide Over-Voltage Protection
IN
1
IN 2
IN
3, 4
- Single-Ended Voltage Range to......................... +30V
- Differential Voltage Range to............................. ±15V
• Fast Switching...............................................2ns Risetime
• Low Input Leakages...........................5 nA at 25 ºC Typical
• Low Input Capacitance.....................................5 pF Typical
V7, 8
• An Array of 4 SCR/Diode Pairs
• Operating Temperature Range..................-40 ºC to 105 ºC
Additional Information
Datasheet
Resources
Applications
Samples
Life Support Note:
Not Intended for Use in Life Support or Life Saving Applications
The products shown herein are not designed for use in life sustaining or life saving
applications unless otherwise expressly indicated.
© 2013 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 12/20/13
• Microprocessor/Logic
Input Protection
• Analog Device Input
Protection
• Data Bus Protection
• Voltage Clamp
TVS Diode Arrays (SPA® Diodes)
General Purpose ESD Protection - SP725 Series
Thermal Information
Absolute Maximum Ratings
Parameter
Continuous Supply Voltage, (V+) - (V-)
Forward Peak Current, IIN to VCC , IIN to GND
(Refer to Figure 5)
Peak Pulse Current, 8/20µs
ESD Ratings and Capability (Figure 1, Table 1)
Load Dump and Reverse Battery (Note 2)
Rating
+35
Units
V
± 8, 100 µs
A
± 14
A
Parameter
Thermal Resistance (Typical, Note 1)
Rating
θJA
SOIC Package
Units
oC/W
170
Storage Temperature Range
Maximum Junction Temperature
Maximum Lead Temperature
(Soldering 20-40s) (SOIC - Lead Tips Only)
C/W
o
C
-65 to 150
o
150
o
260
o
C
C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress only rating and operation of the device
at these or any other conditions above those indicated in the operational sections of this
specification is not implied.
Electrical Characteristics
TA = -40oC to 105oC, VIN = 0.5VCC , Unless Otherwise Specified
Parameter
Symbol
Min
Typ
Max
Units
-
2 to 30
-
V
-
2
-
V
-
2
-
V
IIN
-20
5
+20
nA
IQUIESCENT
-
50
200
nA
Operating Voltage Range,
VSUPPLY = [(V+) - (V-)]
VSUPPLY
Forward Voltage Drop
IN to V-
VFWDL
IN to V+
VFWDH
Input Leakage Current
Quiescent Supply Current
Test Conditions
IIN = 2A (Peak Pulse)
Equivalent SCR ON Threshold
Equivalent SCR ON Resistance
Input Capacitance
CIN
Input Switching Speed
tON
(Note 3)
-
1.1
-
V
VFWD/IFWD ; (Note 3)
-
0.5
-
Ω
5
-
pF
2
-
ns
-
Notes:
1. θ JA is measured with the component mounted on an evaluation PC board in free air
2.In automotive and battery operated systems, the power supply lines should be externally protected for load dump and reverse battery V+ and V- pins are connected to the same supply
voltage source as the device or control line under protection, a current limiting resistor should be connected in series between the external supply and the SP725 supply pins to limit
reverse battery current to within the rated maximum limits. Bypass capacitors of typically 0.01µF or larger from the V+ and V- pins to ground are recommended.
3.Refer to the Figure 3 graph for definitions of equivalent “SCR ON Threshold” and “SCR ON Resistance.” These characteristics are given here for thumb-rule information to determine peak
current and dissipation under EOS conditions.
Typical Application of the SP725
(Application as an Input Clamp for Overvoltage, Greater than 1VBE
Above V+ or less than -1VBE below V-)
+VCC
+VCC
INPUT
DRIVERS
OR
SIGNAL
SOURCES
LINEAR OR
DIGITAL IC
INTERFACE
IN 1 - 4
TO +VCC
V+
SP725
V-
SP725 INPUT PROTECTION CIRCUIT (1 OF 4 SHOWN)
© 2013 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 12/20/13
TVS Diode Arrays (SPA® Diodes)
General Purpose ESD Protection - SP725 Series
ESD Capability
ESD capability is dependent on the application and defined
test standard.The evaluation results for various test
standards and methods based on Figure 1 are shown in
Table 1.
Figure 1: Electrostatic Discharge Test
R1
The SP725 has a Level 4 HBM capability when tested as a
device to the IEC 61000-4-2 standard. Level 4 specifies a
required capability greater than 8kV for direct discharge and
greater than 15kV for air discharge.
For the “Modified” MIL-STD-3015.7 condition that is
defined as an “incircuit” method of ESD testing, the V+
and V- pins have a return path to ground and the SP725
ESD capability is typically greater than 25kV from 100pF
through 1.5kΩ . By strict definition of MIL-STD-3015.7 using
“pinto-pin” device testing, the ESD voltage capability is
greater than 10kV.
For the SP725 EIAJ IC121 Machine Model (MM) standard,
the ESD capability is typically greater than 2kV from 200pF
with no series resistance.
CHARGE
SWITCH
Standard
IEC 61000-4-2
(Level 4)
FORWARD SCR CURRENT (A)
FORWARD SCR CURRENT (mA)
80
40
0
600
Type/Mode
RD
CD
±VD
HBM, Air Discharge
330 Ω
150pF
15kV
HBM, Direct Discharge
330 Ω
150pF
8kV
Modified HBM
1.5k Ω
100pF
25kV
Standard HBM
1.5k Ω
100pF
10kV
0k Ω
200pF
2kV
Machine Model
Figure 3: High Current SCR Forward Voltage Drop Curve
5
120
IN
DUT
Table 1: ESD Test Conditions
TA = 25ºC
SINGLE PULSE
160
CD
IEC 61000-4-2: R 1 50 to 100MΩ
MIL-STD-3015.7: R 1 1 to 10MΩ
EIAJ IC121
200
DISCHARGE
SWITCH
H.V.
SUPPLY
± VD
MIL-STD-3015.7
Figure 2: Low Current SCR Forward Voltage Drop Curve
RD
TA = 25°C
SINGLE PULSE
4
3
2
I FWD
EQUIV. SAT. ON
THRESHOLD ~ 1.1V
1
V FWD
0
800
1000
FORWARD SCRVOLTAGE DROP (mV)
© 2013 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 12/20/13
1200
0
1
2
FORWARD SCRVOLTAGE DROP (V)
3
TVS Diode Arrays (SPA® Diodes)
General Purpose ESD Protection - SP725 Series
Peak Transient Current Capability for Long Duration Surges
The peak transient current capability rises sharply as the
width of the current pulse narrows. Destructive testing
was done to fully evaluate the SP725 ’s ability to withstand
a wide range of peak current pulses vs time. The circuit
used to generate current pulses is shown in Figure 4.
Figure 4: T
ypical SP725 Peak Current Test Circuit
with a Variable Pulse Width Input
The test circuit of Figure 4 is shown with a positive pulse
input. For a negative pulse input, the (-) current pulse input
goes to an SP725 ‘IN’ input pin and the (+) current pulse
input goes to the SP725 V- pin. The V+ to V- supply of the
SP725 must be allowed to float. (i.e., It is not tied to the
ground reference of the current pulse generator.) Figure
5 shows the point of overstress as defined by increased
leakage in excess of the data sheet published limits.
Note that adjacent input pins of the SP725 may be
paralleled to improve current (and ESD) capability. The
sustained peak current capability is increased to nearly
twice that of a single pin.
VX
CURRENT
SENSE
(-)
(+)
V- 8
1 IN
V- 7
2 IN
3 IN
SP725
4 IN
VOLTAGE
PROBE
+
V+ 6
-
V+ 5
C1
R 1 ~ 10Ω TYPICAL
VX ADJ. 10V/A TYPICAL
C1 ~ 100μF
Figure 5: S
P725 Typical Nonrepetitive Peak Current
Pulse Capability
Showing the Measured Point of Overstress in Amperes vs
pulse width time in milliseconds
14
12
PEAK CURRENT (A)
The maximum peak input current capability is dependent
on the ambient temperature, improving as the temperature
is reduced. Peak current curves are shown for ambient
temperatures of 25 º C and 105 º C and a 15V power supply
condition. The safe operating range of the transient peak
current should be limited to no more than 75% of the
measured overstress level for any given pulse width as
shown in the curves of Figure 5.
-
VARIABLE TIME DURATION
CURRENT PULSE GENERATOR
R1
+
TA = 25ºC
10
V+ TO V-SUPPLY = 15V
8
6
CAUTION: SAFE OPERATING CONDITIONS LIMIT
THE MAXIMUM PEAK CURRENT FOR A GIVEN
PULSE WIDTH TO BE NO GREATER THAN 75%
OF THE VALUES SHOWN ON EACH CURVE
TA = 105ºC
4
2
0
0.0001
0.01
0.1
1
10
100
1000
PULSE WIDTH TIME (ms)
© 2013 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 12/20/13
TVS Diode Arrays (SPA® Diodes)
General Purpose ESD Protection - SP725 Series
Soldering Parameters
Pb – Free assembly
Pre Heat
- Temperature Min (Ts(min))
150°C
- Temperature Max (Ts(max))
200°C
- Time (min to max) (ts)
60 – 180 secs
Average ramp up rate (Liquidus) Temp
(TL) to peak
5°C/second max
TS(max) to TL - Ramp-up Rate
5°C/second max
Reflow
- Temperature (TL) (Liquidus)
217°C
- Temperature (tL)
60 – 150 seconds
260+0/-5 °C
Time within 5°C of actual peak
Temperature (tp)
20 – 40 seconds
Ramp-down Rate
5°C/second max
Time 25°C to peak Temperature (TP)
8 minutes Max.
Do not exceed
260°C
Critical Zone
TL to TP
Ramp-up
TL
TS(max)
tL
Ramp-do
Ramp-down
Preheat
TS(min)
25
Peak Temperature (TP)
tP
TP
Temperature
Reflow Condition
tS
time to peak temperature
Time
Package Dimensions — Small Outline Plastic Packages (SOIC)
Package
N
INDEX
AREA
0.25(0.010) M
H
B M
E
SOIC
Pins
8
JEDEC
MS-012
Millimeters
-B-
Min
1
2
3
L
SEATING PLANE
-A-
h x 45o
A
D
-C-
µ
e
A1
B
C
0.10(0.004)
0.25(0.010) M C A M B S
Notes:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication
Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash,
protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and
protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be
located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating
plane, shall not exceed a maximum value of 0.61mm (0.024 inch).
10.Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily
exact.
© 2013 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 12/20/13
Max
Inches
Min
Max
Notes
A
1.35
1.75
0.0532
0.0688
-
A1
0.10
0.25
0.0040
0.0098
-
B
0.33
0.51
0.013
0.020
9
C
0.19
0.25
0.0075
0.0098
-
D
4.80
5.00
0.1890
0.1968
3
E
3.80
4.00
0.1497
0.1574
4
1.27 BSC
e
0.050 BSC
-
H
5.80
6.20
0.2284
0.2440
-
h
0.25
0.50
0.0099
0.0196
5
L
0.40
1.27
0.016
8
N
µ
0o
0.050
8
8o
0o
6
7
8o
-
TVS Diode Arrays (SPA® Diodes)
General Purpose ESD Protection - SP725 Series
Part Numbering System
Product Characteristics
SP 725 AB *
G=Green
TG=Tape and Reel
TVS Diode Arrays
(SPA® Diodes)
Package Type
AB: 8 Leaded SOIC
Series
Lead Plating
Matte Tin
Lead Material
Copper Alloy
Lead Coplanarity
0.004 inches (0.102mm)
Substitute Material
Silicon
Body Material
Molded Epoxy
Flammability
UL 94 V-0
Notes:
1. All dimensions are in millimeters.
2. Dimensions include solder plating.
3. Dimensions are exclusive of mold flash & metal burr.
4.Blo is facing up for mold and facing down for trim/form, i.e. reverse trim/form.
5. Package surface matte finish VDI 11-13.
Ordering Information
Part Number
Temp. Range (ºC)
Package
SP725ABG
-40 to 105
8 Ld SOIC
SP725ABTG
-40 to 105
8 Ld SOIC Tape and Reel
Marking
Min. Order Qty.
1
1960
SP725AB(T)G 1
2500
SP725AB(T)G
Notes:
1. SP725AB(T)G means device marking either SP725ABG or SP725ABTG.
Embossed Carrier Tape & Reel Specification - SOIC Package
User Feeding Direction
Pin 1 Location
Symbol
Millimetres
Inches
Min
Max
Min
Max
E
1.65
1.85
0.065
0.073
F
5.4
5.6
0.213
0.22
P2
1.95
2.05
0.077
0.081
D
1.5
1.6
0.059
0.063
4.1
0.154
1.50 Min
D1
P0
3.9
0.059 Min
40.0 ± 0.20
10P0
0.161
1.574 ± 0.008
W
11.9
12.1
0.468
0.476
P
7.9
8.1
0.311
0.319
A0
6.3
6.5
0.248
0.256
B0
5.1
5.3
0.2
0.209
K0
2
2.2
0.079
0.087
t
0.30 ± 0.05
0.012 ± 0.002
© 2013 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 12/20/13