5078 series VCXO Module ICs with Built-in Varicap OVERVIEW The 5078 series are CMOS output VCXO ICs that provide a wide frequency pulling range. They employ bipolar oscillator circuit and recently developed varicap diode fabrication process that provides a low phase noise characteristic and a wide frequency pulling range without any external components. The 5078 series are ideal for wide pulling range, low phase noise, VCXO modules. FEATURES ▪ VCXO with recently developed varicap diode built-in ▪ -40 to +105°C operating temperature range ▪ Oscillator: Fundamental frequency oscillation ▪ CMOS output ▪ Output frequency: 30 to 170MHz ▪ Frequency divider built-in ▪ Operating supply voltage range: 2.97 to 3.63V Selectable by version: fOSC, fOSC/2 ▪ Oscillator frequency range (for fundamental oscillation): ▪ Standby function 60 to 100MHz (Ax version) High impedance in standby mode, oscillator stops 100 to 170MHz (Bx version) ▪ 15pF output load capacitance ▪ Frequency pulling range: ±150ppm@A1 version, VC=1.65±1.65V, f=77.76MHz (γ=290, C0=2.4pF) ±130ppm@B1 version, VC=1.65±1.65V, f=155.52MHz (γ=330, C0=1.5pF) ▪ Low phase noise: -130dBc/Hz@A1 version, 1kHz Offset, f=77.76MHz (γ=290, C0=2.4pF) -162dBc/Hz@A1 version, 10MHz Offset, f=77.76MHz -125dBc/Hz@B1 version, 1kHz Offset, f=155.52MHz (γ=330, C0=1.5pF) -162dBc/Hz@B1 version, 10kHz Offset, f=155.52MHz APPLICATIONS SONET/SDH, Ethernet, Fibre Channel, LTE SERIES CONFIGURATION Version Name Recommended operating frequency range (fOSC)*1[MHz] 5078A1 60MHz to 100MHz fOSC 5078A2 60MHz to 100MHz fOSC/2 5078B1 100MHz to 170MHz fOSC 5078B2 100MHz to 170MHz fOSC/2 Output frequency (fOUT) *1. The recommended oscillation frequency is a yardstick value derived from the resonator used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to resonator characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. The recommended characteristics for the crystal element are: A versions: R1 < 20Ω, C0 < 1.5pF B versions: R1 < 20Ω, C0 < 1.5pF ORDERING INFORMATION Device Package WF5078xx-4 Wafer form Version name WF5078□□-4 Form WF: Wafer form CF: Chip(Die) form CF5078xx-4 Chip form Frequency divider function Oscillation frequency range SEIKO NPC CORPORATION - 1 5078 series PAD LAYOUT (Unit: μm) VDD Q (450,450) 7 XT 6 1 (0,0) Y XTN 2 (-450,-450) 3 4 VC INHN 5 VSS X Chip size: 0.9mm×0.9mm Chip thickness: 130μm PAD size: 80μm×80μm (PAD No.1, 2, 3, 4, 6, 7 pins) 80μm×160μm (PAD No.5 pin) Chip base: VSS potential PIN DESCRIPTION and PAD COORDINATES No. Pin I/O*1 Description Pad Coordinates （Unit : μm） X Y -345.0 177.0 -345.0 -98.0 -75.4 -345.0 93.2 -345.0 1 XT I 2 XTN O 3 VC I 4 INHN I 5 VSS - (-) ground 337.0 -305.0 6 Q O Output one of fOSC, fOSC/2 331.9 345.0 7 VDD - (+) supply voltage 50.1 345.0 *1. I: Input pin Crystal connection pin Control voltage input pin Input pin controlled output state(oscillator stops when LOW), Power-saving pull-up resistor built-in O: Output pin SEIKO NPC CORPORATION - 2 5078 series BLOCK DIAGRAM VDD INHN XT RPU1, RPU2 RVC1 CVC1 XTN RVC2 OSC Level Shifter 1/N Divider CMOS Q N=1,2 (Mask Option) CVC2 VC VSS SEIKO NPC CORPORATION - 3 5078 series SPECIFICATIONS Absolute Maximum Ratings VSS=0V Parameter Symbol *1 VDD *1*2 VIN Supply voltage range Input voltage range *1*2 Output voltage range VOUT Junction temperature*3 Tj Condition Rating Unit VDD pin -0.3 to +5.0 V Input pins -0.3 to VDD+0.3 V Output pins -0.3 to VDD+0.3 V +125 °C -55 to +125 °C Ta = -40 ~ +85°C ±20 mA Ta = -40 ~ +105°C ±10 mA Storage temperature range*4 TSTG Wafer, Chip form Output current*3 IOUT Q pin *1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded. Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions. *2. VDD is a VDD value of recommended operating conditions. *3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded. *4. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials). Recommended Operating Conditions VSS=0V Parameter Symbol Conditions Operating supply voltage VDD Between VDD and VSS pins*2 Input voltage VIN INHN, VC pins Operating temperature Ta Output load capacitance CL Oscillator frequency range*1 fOSC Output frequency range fOUT Rating Unit MIN TYP MAX 2.97 3.3 3.63 V 0 VDD V -40 +105 °C 15 pF 5078Ax 60 100 5078Bx 100 170 5078A1 60 100 5078A2 30 50 5078B1 100 170 5078B2 50 85 MHz MHz *1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. Mount a ceramic chip capacitor that is larger than 0.01μF proximal to IC (within approximately 3mm) between VDD and VSS in order to obtain stable operation of 5078 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible. Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range. SEIKO NPC CORPORATION - 4 5078 series Electrical Characteristics A1, A2 version VDD=2.97 to 3.63V, VC=0.5VDD, VSS=0V, Ta= -40 to +105°C unless otherwise noted. Parameter Current consumption A1 version: fOSC Current consumption A2 version: fOSC/2 Symbol IDD IDD Rating Conditions MIN measurement circuit 1, no load, INHN=Open VDD=3.3V, fOSC=77.76MHz, fOUT=77.76MHz measurement circuit 1, no load, INHN=Open VDD=3.3V, fOSC=77.76MHz, fOUT=38.88MHz MAX 5.2 8.0 mA 4.2 7.0 mA measurement circuit 1, Ta = -40 ~ +85°C 10 μA INHN=0V Ta = -40 ~ +105°C 100 μA Standby current ISTB High-level output voltage VOH measurement circuit 2, Q pin, IOH=-4mA Low-level output voltage VOL measurement circuit 2, Q pin, IOL=4mA VDD-0.4 V V 1 μA IZ High-level input voltage VIH measurement circuit 4, INHN pin Low-level input voltage VIL measurement circuit 4, INHN pin Pull-up resistance 1 RPU1 measurement circuit 5, INHN pin, INHN=0V 1 Pull-up resistance 2 RPU2 measurement circuit 5, INHN pin, INHN=0.7VDD 50 Oscillator block built-in RVC1 measurement circuit 6, between VC and XT 100 200 300 resistance RVC2 measurement circuit 6, between VC and XTN 100 200 300 Input leakage resistance*1 RVIN measurement circuit 7, VC pin, Ta=25°C CVC1 Oscillator block built-in capacitance CVC2 measurement circuit 3, Q pin, INHN=0V, Ta=25°C 0.7VDD FM V 0.3VDD V 4 9 MΩ 100 200 kΩ 10 kΩ MΩ Design value (a monitor pattern on a VC =0.3V 5.88 6.53 7.18 wafer is tested), Excluding parasitic VC =1.65V 3.51 4.13 4.75 capacitance. VC =3.0V 1.80 2.25 2.70 Design value (a monitor pattern on a VC =0.3V 8.82 9.80 10.78 wafer is tested), Excluding parasitic VC =1.65V 5.27 6.20 7.13 capacitance. VC =3.0V 2.70 3.38 4.06 20 50 -3dB frequency, Ta=25°C VDD=3.3V, VC=1.65V±1.65V, frequency measurement circuit 8, Crystal : 77.76MHz *1. These prescriptions indicate the following contents. Oscillator block built-in resistance: Resistance between VC - XT or XTN Input leakage resistance: Resistance between VC - VSS (DC characteristic) Refer to pg.22 for VC Terminal Input Impedance. Maximum modulation -1 0.4 Output leakage current *1 Unit TYP pF pF kHz SEIKO NPC CORPORATION - 5 5078 series B1, B2 version VDD=2.97 to 3.63V, VC=0.5VDD, VSS=0V, Ta= -40 to +105°C unless otherwise noted. Parameter Current consumption B1 version: fOSC Current consumption B2 version: fOSC/2 Symbol IDD IDD Rating Conditions MIN MAX 10 15 mA 8.1 12 mA Ta = -40 ~ +85°C 10 μA Ta = -40 ~ +105°C 100 μA measurement circuit 1, no load, INHN=Open VDD=3.3V, fOSC=155.52MHz, fOUT=155.52MHz measurement circuit 1, no load, INHN=Open VDD=3.3V, fOSC=155.52MHz, fOUT=77.76MHz measurement circuit 1, Standby current ISTB High-level output voltage VOH measurement circuit 2, Q pin, IOH=-8mA Low-level output voltage VOL measurement circuit 2, Q pin, IOH=8mA INHN=0V VDD-0.4 Output leakage current IZ High-level input voltage VIH measurement circuit 4, INHN pin Low-level input voltage VIL measurement circuit 4, INHN pin Pull-up resistance 1 RPU1 measurement circuit 5, INHN pin, INHN=0V 1 Pull-up resistance 2 RPU2 measurement circuit 5, INHN pin, INHN=0.7VDD Oscillator block built-in RVC1 resistance*1 RVC2 Input leakage resistance*1 RVIN measurement circuit 3, Q pin, INHN=0V, Ta=25°C V -1 0.4 V 1 μA 0.7VDD V 0.3VDD V 4 9 MΩ 50 100 200 kΩ measurement circuit 6, between VC and XT 100 200 300 measurement circuit 6, between VC and XTN 100 200 300 measurement circuit 7, VC pin, Ta=25°C 10 Design value (a monitor pattern on a VC =0.3V 4.38 4.86 5.35 wafer is tested), Excluding parasitic VC =1.65V 2.62 3.08 3.55 capacitance. VC =3.0V 1.38 1.72 2.06 capacitance Design value (a monitor pattern on a VC =0.3V 6.24 6.94 7.63 wafer is tested), Excluding parasitic VC =1.65V 3.70 4.36 5.01 capacitance. VC =3.0V 1.89 2.36 2.83 20 50 CVC2 -3dB frequency, Ta=25°C VDD=3.3V, VC=1.65V±1.65V, frequency measurement circuit 8, Crystal : 155.52MHz *1. These prescriptions indicate the following contents. Oscillator block built-in resistance: Resistance between VC - XT or XTN Input leakage resistance: Resistance between VC - VSS (DC characteristic) Refer to pg.22 for VC Terminal Input Impedance. Maximum modulation FM kΩ MΩ Oscillator block built-in CVC1 Unit TYP pF pF kHz SEIKO NPC CORPORATION - 6 5078 series Switching Characteristics A1, A2 version VDD = 2.97 to 3.63V, VC=0.5VDD, VSS= 0V, Ta = -40 to +105°C unless otherwise noted Parameter Symbol Conditions AC “H” level output voltage VTOP measurement circuit 9, CL=15pF AC “L” level output voltage VBASE measurement circuit 9, CL=15pF Duty cycle Duty measurement circuit 9, Ta=25°C, VDD=3.3V Rating MIN TYP MAX 0.9VDD Unit V 45 0.1VDD V 55 % Output rise time tr measurement circuit 9, CL=15pF, 0.1VDD→0.9VDD 1.5 3.0 ns Output fall time tf measurement circuit 9, CL=15pF, 0.9VDD→0.1VDD 1.5 3.0 ns 2 ms 200 ns Output enable propagation delay tOE Output disable propagation delay tOD measurement circuit 10, Ta=25°C INHN= “Low”→“High” measurement circuit 10, Ta=25°C INHN= “High”→“Low” Note. The ratings are measured by using the NPC standard crystal and jig. They may vary due to crystal characteristics, so they must be carefully evaluated. The recommended crystal element characteristics are R1 < 20Ω and C0 < 1.5pF. B1, B2 version VDD = 2.97 to 3.63V, VC=0.5VDD, VSS= 0V, Ta = -40 to +105°C unless otherwise noted Parameter Symbol Conditions AC “H” level output voltage VTOP measurement circuit 9, CL=15pF AC “L” level output voltage VBASE measurement circuit 9, CL=15pF Duty cycle Duty measurement circuit 9, Ta=25°C, VDD=3.3V Rating MIN TYP MAX 0.9VDD Unit V 45 0.1VDD V 55 % Output rise time tr measurement circuit 9, CL=15pF, 0.1VDD→0.9VDD 1.2 2.4 ns Output fall time tf measurement circuit 9, CL=15pF, 0.9VDD→0.1VDD 1.2 2.4 ns 2 ms 200 ns Output enable propagation delay tOE Output disable propagation delay tOD measurement circuit 10, Ta=25°C INHN= “Low”→“High” measurement circuit 10, Ta=25°C INHN= “High”→“Low” Note. The ratings are measured by using the NPC standard crystal and jig. They may vary due to crystal characteristics, so they must be carefully evaluated. The recommended crystal element characteristics are R1 < 20Ω and C0 < 1.5pF. SEIKO NPC CORPORATION - 7 5078 series Timing chart 0.9V DD 0.9VDD Q 0.1VDD 0.1VDD Tw T tr DUTY measurement voltage 0.5VDD DUTY = Tw/T×100 (%) tf Figure 1. Output switching waveform VDD INHN VIH VIL VSS tOD tOE 0.1V VTOP Q 0.5VDD VBASE 0.1V fOUT Hi-Z Low fOUT Figure 2. Output disable and oscillation start timing chart SEIKO NPC CORPORATION - 8 5078 series FUNCTIONAL DESCRIPTION INHN Function Q output is stopped and becomes high impedance. INHN Q Oscillator HIGH or Open fOUT Operating LOW Hi-Z Stopped Power Saving Pull-up Resistor The INHN pin pull-up resistance changes its value to RPU1 or RPU2 in response to the input level (HIGH or LOW). When INHN is tied to LOW level, the pull-up resistance becomes large (RPU1), thus reducing the current consumed by the resistance. When INHN is left open circuit or tied to HIGH level, the pull-up resistance becomes small (RPU2), thus internal circuit of INHN becomes HIGH level. Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly. Oscillation Detection Function The 5078 series have an oscillation detection circuit. The oscillation detection circuit disables the output until crystal oscillation becomes stable when oscillation circuit starts up. This function avoids the abnormal oscillation in the initial power up and in a reactivation by INHN. Boot function It becomes easy to start oscillation by making XTN pin potential to VDD level when oscillation starts up. A current flows into VC pin when the voltage below a VDD level is being applied to VC pin. A boot function is canceled after an oscillation start. SEIKO NPC CORPORATION - 9 5078 series MEASUREMENT CIRCUITS These are measurement circuits for electrical characteristics and switching characteristics. ■ Note: Bypass capacitors specified in each measurement circuit below should be connected between VDD and VSS. If the bypass capacitors are not connected, the required characteristics may not be realized. Circuit wiring of bypass capacitors and load capacitors should be connected as short as possible (within approximately 3mm). If the circuit wiring is long, the required characteristics may not be realized. * The capacitor used in measurement circuits below; GRM188B11H103K (MURATA) 0.01μF MEASUREMENT CIRCUIT 1 Measurement Parameter: IDD, ISTB IDD, ISTB A 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN VC INHN Q VSS IDD1:INHN=Open IDD2:INHN=Low SEIKO NPC CORPORATION - 10 5078 series MEASUREMENT CIRCUIT 2 Measurement Parameter: VOH, VOL 0.01μF(Ceramic Chip Capacitor) XT input signal: 1.5VP-P sine wave Signal Generator VDD XT 0.01μF 50Ω 5078xx XTN 50Ω Q VC INHN VOH VS ΔV Q VSS V 0.1μF Q VS adjusted so that ΔV=50×IOH VS VOH VOL ΔV VS VOL VS adjusted so that ΔV=50×IOL MEASUREMENT CIRCUIT 3 Measurement Parameter: IZ 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN VC INHN Q A IZ VSS SEIKO NPC CORPORATION - 11 5078 series MEASUREMENT CIRCUIT 4 Measurement Parameter: VIH, VIL 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN Q VC INHN VIH VIL V VSS CL=15pF (Including probe capacitance) VIH: VSS→VDD , voltage that changes enable output state VIL: VDD→VSS , voltage that changes disable output state MEASUREMENT CIRCUIT 5 Measurement Parameter: RPU1, RPU2 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN VC INHN IINHN VINHN V Q VSS A RPU1= (VDD-VINHN)/IINHN, VINHN= 0V RPU2= (VDD-VINHN)/IINHN, VINHN= 0.7VDD SEIKO NPC CORPORATION - 12 5078 series MEASUREMENT CIRCUIT 6 Measurement Parameter: RVC1, RVC2 0.01μF(Ceramic Chip Capacitor) IXT A VDD 0.01μF(Ceramic Chip Capacitor) VDD XT XT IXTN 5078xx A 5078xx XTN XTN Q VC INHN VC VSS INHN Q VSS RVC1 = VDD / IXT RVC2 = VDD / IXTN MEASUREMENT CIRCUIT 7 Measurement Parameter: RVIN 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN IVIN A VC INHN Q VSS RVIN = VDD / IVIN SEIKO NPC CORPORATION - 13 5078 series MEASUREMENT CIRCUIT 8 Measurement Parameter: FM 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN VC input signal: sine wave, 0 to VDD VC Function Generator Q CL=15pF (Including probe capacitance) 50Ω INHN VSS 200Ω 0.01μF EXT Trigger In Signal Source Analyzer (E5052B) MEASUREMENT CIRCUIT 9 Measurement Parameter: Duty, tr, tf, VTOP, VBASE 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN VC INHN Q VSS CL=15pF (Including probe capacitance) SEIKO NPC CORPORATION - 14 5078 series MEASUREMENT CIRCUIT 10 Measurement Parameter: tOE, tOD 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx 1kΩ XTN VC INHN Function Generator 50Ω Q VSS 1kΩ CL=15pF (Including probe capacitance) SEIKO NPC CORPORATION - 15 5078 series REFERENCE DATA The following characteristics are measured using the crystal below. Note that the characteristics will vary with the crystal used. Crystal used for measurement Crystal parameters Parameter A1 B1 fOSC(MHz) 77.76 155.52 C0(pF) 2.4 1.5 γ(=C0/C1) 290 330 R1(Ω) 7.0 9.3 C1 L1 R1 C0 Pulling Range [Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C [5078Ax] fOSC =77.76MHz [5078Bx] fOSC =155.52MHz 150 200 Pulling Range[ppm]VC =1.65V standard Pulling Range[ppm]VC =1.65V standard 150 100 50 0 -50 -100 -150 -200 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 100 50 0 -50 -100 -150 3.3 0.0 VC [V] 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 VC [V] [Measurement circuit diagram] 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN VC INHN 0.01μF Q 200Ω VSS Signal Source Analyzer (E5052B) CL=15pF SEIKO NPC CORPORATION - 16 5078 series Phase Noise [Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C [5078A1] fOSC =77.76MHz, fOUT =77.76MHz [5078A2] fOSC =77.76MHz, fOUT =38.88MHz -60 -60 VC=0V VC=0V -80 VC=1.65V VC=3.3V -100 Phase Noise[dBc/Hz] Phase Noise[dBc/Hz] -80 Rms jitter(12kHz～20MHz) VC=0V : 100fs VC=1.65V : 77fs VC=3.3V : 71fs -120 -140 -160 -180 1.E+01 VC=1.65V VC=3.3V -100 Rms jitter(12kHz～20MHz) VC=0V : 181fs VC=1.65V : 140fs VC=3.3V : 130fs -120 -140 -160 1.E+02 1.E+03 1.E+04 1.E+05 1.E+06 1.E+07 -180 1.E+01 1.E+08 1.E+02 1.E+03 Offset Frequency[Hz] [5078B1] fOSC =155.52MHz, fOUT =155.52MHz 1.E+06 1.E+07 1.E+08 -60 VC=0V -80 VC=0V -80 VC=1.65V VC=3.3V -100 Phase Noise[dBc/Hz] Phase Noise[dBc/Hz] 1.E+05 [5078B2] fOSC =155.52MHz, fOUT =77.76MHz -60 Rms jitter(12kHz～20MHz) VC=0V : 72fs VC=1.65V : 51fs VC=3.3V : 46fs -120 -140 -160 -180 1.E+01 1.E+04 Offset Frequency[Hz] VC=1.65V VC=3.3V -100 Rms jitter(12kHz～20MHz) VC=0V : 140fs VC=1.65V : 106fs VC=3.3V : 97fs -120 -140 -160 1.E+02 1.E+03 1.E+04 1.E+05 1.E+06 1.E+07 -180 1.E+01 1.E+08 1.E+02 Offset Frequency[Hz] 1.E+03 1.E+04 1.E+05 1.E+06 1.E+07 1.E+08 Offset Frequency[Hz] [Measurement circuit diagram] 0.01μF(Ceramic Chip Capacitor) VDD XT 5078xx XTN VC INHN 0.01μF Q 200Ω VSS Signal Source Analyzer (E5052B) CL=15pF SEIKO NPC CORPORATION - 17 5078 series Modulation Bandwidth [Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C [5078A2] fOSC =77.76MHz, fOUT =38.88MHz 3 3 0 0 -3 -3 Fm[dB] 1kHz standard Fm[dB] 1kH z standard [5078A1] fOSC =77.76MHz, fOUT =77.76MHz -6 -9 -6 -9 -12 -12 -15 -15 -18 -18 1 10 100 1 VC Input Frequency[kHz] 3 3 0 0 -3 -3 -6 -9 -6 -9 -12 -12 -15 -15 -18 10 VC Input Frequency[kHz] 100 [5078B2] fOSC =155.52MHz, fOUT =77.76MHz Fm[dB] 1kHz standard Fm[dB] 1kHz standard [5078B1] fOSC =155.52MHz, fOUT =155.52MHz 1 10 VC Input Frequency[kHz] 100 -18 1 100 10 VC Input Frequency[kHz] [Measurement circuit diagram] Measurement circuit 8 SEIKO NPC CORPORATION - 18 5078 series Negative Resistance [Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C, C0=0pF [5078Ax] After boot release 0 0 -100 -100 -200 -200 -300 -300 Negative Resistance[Ω] Negativ e Resistance[Ω] [5078Ax] Boot -400 -500 -600 -700 VC=0V -800 VC=1.65V -900 VC=3.3V -1000 -500 -600 -700 VC=0V -800 VC=1.65V -900 VC=3.3V -1000 0 50 100 Frequency[MHz] 150 200 [5078Bx] Boot 0 50 100 Frequency[MHz] 150 200 [5078Bx] After boot release 0 0 -100 -100 -200 -200 -300 -300 Negative Resistance[Ω] Negative Resistance[Ω] -400 -400 -500 -600 -700 -400 -500 -600 -700 VC=0V -800 -900 VC=0V -800 VC=1.65V VC=1.65V -900 VC=3.3V -1000 VC=3.3V -1000 0 50 100 Frequency[MHz] 150 200 0 50 100 Frequency[MHz] 150 200 At the time of oscillation start, negative resistance becomes deep by boot function. The boot function is released when the oscillation is steady, and oscillation starts. [Measurement circuit diagram] 0.01μF(Ceramic Chip Capacitor) VDD Network-Analyzer (Agilent 4396B) S-Parameter Test Set (Agilent 85046A) XT 5078xx XTN VC INHN Q VSS Measurement results using 4396B Agilent analyzer on NPC test jig. Measurements will vary with test jig and measurement environment. SEIKO NPC CORPORATION - 19 5078 series Drive Level [Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C [5078Ax] fOSC =77.76MHz 200 DL [uW] 150 100 50 0 0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3 3.3 2.1 2.4 2.7 3 3.3 VC [V] [5078Bx] fOSC =155.52MHz 200 DL [uW] 150 100 50 0 0 0.3 0.6 0.9 1.2 1.5 1.8 VC [V] [Measurement circuit diagram] 0.01μF(Ceramic Chip Capacitor) VDD XT Tektronix CT-6 Current Probe DL = (IX' tal) 2 × Re 5078xx IX'tal: Current though Crystal (RMS) Re: Crystal’s effective resistance XTN VC INHN Q VSS CL=15pF SEIKO NPC CORPORATION - 20 5078 series Oscillator CL Characteristics [Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C [5078Ax] fOSC =77.76MHz 7.0 6.0 CLOSC [pF] 5.0 4.0 3.0 2.0 1.0 0.0 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 2.7 3.0 3.3 VC [V] [5078Bx] fOSC =155.52MHz 7.0 6.0 CLOSC [pF] 5.0 4.0 3.0 2.0 1.0 0.0 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 VC [V] [Measurement circuit diagram] 0.01μF(Ceramic Chip Capacitor) VDD CLOSC: Oscillator circuit equivalent capacitance determined by oscillator frequency XT 5078xx CLosc = XTN VC INHN 0.01μF Q 200Ω VSS CL=15pF Signal Source Analyzer (E5052B) C1 ⎛ f OSC ⎜⎜ ⎝ fs 2 ⎞ ⎟⎟ − 1 ⎠ − C0 C1: Crystal element equivalent series capacitance C0: Crystal element equivalent parallel capacitance fs: Crystal element series resonance frequency SEIKO NPC CORPORATION - 21 5078 series VC Terminal Input Impedance [Measurement conditions] Ta=25°C, VC=0V [5078Ax] 600 VC Input Impedance[kΩ] 500 400 300 200 100 0 0 10 20 30 40 50 60 70 80 90 10 0 70 80 90 10 0 VC Input Frequency[kHz] [5078Bx] 600 VC Input I mpedance[kΩ ] 500 400 300 200 100 0 0 10 20 30 40 50 60 VC Input Frequency[kHz] [Measurement circuit diagram] VDD XT 5078xx XTN Impedance Analyzer (HP 4194A) VC INHN Q VSS SEIKO NPC CORPORATION - 22 5078 series Current Consumption [Measurement conditions] VDD=3.3V, VSS=0V, Ta=25°C [5078Ax] 14 12 IDD[mA] 10 8 A1 6 A2 4 VC =0V VC =1.65V VC =3.3V 2 0 20 30 40 50 60 70 80 90 100 Output Frequency[MHz] [5078Bx] 14 12 B1 10 IDD[mA] B2 8 6 VC=0V VC=1.65V VC=3.3V 4 2 0 40 60 80 100 120 140 160 180 Output Frequency[MHz] [Measurement circuit diagram] Measurement circuit 1 SEIKO NPC CORPORATION - 23 5078 series Output Waveform [Measurement conditions] VDD=3.3V, VSS=0V, VC=1.65V, Ta=25°C [5078A1] fOSC =77.76MHz, fOUT=77.76MHz [5078A2] fOSC=77.76MHz, fOUT=38.88MHz [5078B1] fOSC =155.52MHz, fOUT=155.52MHz [5078B2] fOSC =155.52MHz, fOUT=77.76MHz [Measurement circuit diagram] Measurement circuit 9 Measurement equipment: Oscilloscope DSO80604B(Agilent), Differential probe 1134A (Probe head E2678A) SEIKO NPC CORPORATION - 24 5078 series Please pay your attention to the following points at time of using the products shown in this document. 1. The products shown in this document (hereinafter ”Products”) are designed and manufactured to the generally accepted standards of reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment, transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products. If you wish to use the Products in that apparatus, please contact our sales section in advance. In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any damages resulting from the use of that apparatus. 2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof. 3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that infringements. 4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass production products. 5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 104-0032, Japan Telephone: +81-3-5541-6501 Facsimile: +81-3-5541-6510 http://www.npc.co.jp/ Email:[email protected] ND13015-E-01 2013.06 SEIKO NPC CORPORATION - 25