5054H series, 5054xF Crystal Oscillator Module ICs OVERVIEW The 5054H series, 5054xF are miniature crystal oscillator module ICs supported 40MHz to 170MHz 3rd overtone oscillation mode. The Oscillator circuit stage has voltage regulator drive, significantly reducing current consumption and crystal current, compared with existing devices, and significantly reducing the oscillator characteristics supply voltage dependency. There are 3 pad layout package options available for optimized mounting, making these devices ideal for miniature crystal oscillators. FEATURES ▪ Wide range of operating supply voltage: 1.70 to 3.63V (HxA to HxE ver.), 2.25 to 3.63V (xF ver.) ▪ Recommended oscillation frequency range (3rd overtone oscillator): 40 to 135MHz (HxA to HxE ver.), 133 to 170MHz (xF ver.) ▪ Operating temperature range: -40 to 125°C (HxA to HxE ver.), -40 to 105°C (xF ver.) ▪ Regulated voltage drive oscillator circuit for reduced power consumption and crystal drive current ▪ Standby function High impedance in standby mode, oscillator stops ▪ Optimized low crystal drive current oscillation for miniature crystal units ▪ Output drive capability: ±8mA ▪ 50±5% output duty (1/2VDD) ▪ 15pF output load capacitance ▪ 3 pad layout options for mounting 5054(H)Ax for Flip Chip Bonding, 5054(H)Bx, 5054(H)Cx for Wire Bonding ▪ Wafer form WF5054(H)xx ▪ Chip form CF5054(H)xx APPLICATIONS ▪ 5.0×3.2, 3.2×2.5, 2.5×2.0 size miniature crystal oscillator modules SERIES CONFIGURATION Operating supply voltage range[V] Recommended oscillation frequency range*1[MHz] C0 cancellation / Recommended C0 value [pF] Flip Chip Bonding Wire BondingⅠ Wire BondingⅡ 1.70 to 3.63 40 to 50 No/≤2 5054HAA - 5054HCA 1.70 to 3.63 50 to 65 No/≤2 5054HAB - 5054HCB PAD layout and Version name*2 1.70 to 3.63 65 to 85 Yes/1 to 2 5054HAC 5054HBC 5054HCC 1.70 to 3.63 85 to 105 Yes/1 to 2 5054HAD 5054HBD 5054HCD 1.70 to 3.63 105 to 135 Yes/1 to 2 5054HAE 5054HBE 5054HCE 2.25 to 3.63 133 to 170 Yes/1 to 2 5054AF 5054BF 5054CF *1. The oscillation frequency is a yardstick value derived from the crystal used for Seiko NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. It becomes WF5054(H)xx in case of the wafer form and CF5054(H)xx in case of the chip form. ORDERING INFORMATION Device Package WF5054(H)xx-x Wafer form Version name WF5054(H)□□-□ Form WF : Wafer form CF : Chip(Die) form CF5054(H)xx-x Chip form Chip thickness 5: 100μm Oscillation frequency range PAD layout A: for Flip Chip Bonding B: for Wire Bonding TypeⅠ C: for Wire Bonding TypeⅡ SEIKO NPC CORPORATION - 1 5054H series, 5054xF BLOCK DIAGRAM RPU INHN VReg C0 Cancel*1 RF CMOS XT RD CG Q VDD CD VSS XTN *1. The 5054HxA, HxB versions don’t have built-in C0 cancellation circuit. PAD LAYOUT 5054(H)Ax 5054(H)Bx 5054(H)Cx for Flip Chip Bonding for Wire Bonding TypeⅠ for Wire Bonding TypeⅡ 5 VSS INHN Y 4 (0,0) 6 (-300,-285) 3 1 2 XT XTN (300,285) (300,285) (300,285) Q Q VDD Y VDD 5 4 (0,0) 6 INHN Y INHN XTN (-300,-285) XT 4 (0,0) 6 2 1 (-300,-285) 3 5 VDD VSS 1 2 XT XTN VSS X X X 3 Q • Chip size: 0.60mm × 0.57mm, PAD size: 80μm × 80μm, Chip base: VSS level • Coordinates at the chip center are (0,0). PAD COORDINATES PAD PIN DESCRIPTION PAD coordinates[μm] PAD No. Pin Function No. X Y 5054 (H)Ax 5054 (H)Bx 5054 (H)Cx 1 -145.2 -193.5 1 2 1 XT 2 145.2 -193.5 2 1 2 XTN Crystal connection pins. Crystal is connected between XT and XTN. 3 208.5 -1.1 3 6 5 VDD (+) supply voltage 4 208.5 193.5 4 5 4 Q Output pin 5 -208.5 193.5 5 4 3 VSS (-) ground 6 -208.5 -1.1 6 3 6 INHN Input pin controlled output state (oscillator stops when Low), Power-saving pull-up resistor built-in SEIKO NPC CORPORATION - 2 5054H series, 5054xF SPECIFICATIONS Absolute Maximum Ratings VSS=0V Parameter Symbol Condition Rating Unit -0.3 to +4.0 V Input pins -0.3 to VDD+0.3 V -0.3 to VDD+0.3 V ±20 mA 150 °C -55 to +150 °C *1 VDD Between VDD and VSS *1*2 VIN Supply voltage range Input voltage range *1*2 Output voltage range VOUT Output pins Output current*3 IOUT Q pin Junction temperature*3 Tj *4 Storage temperature range TSTG Chip form, Wafer form *1. This parameter rating is the values that must never exceed even for a moment. This product may suffer breakdown if this parameter rating is exceeded. Operation and characteristics are guaranteed only when the product is operated at recommended operating conditions. *2. VDD is a VDD value of recommended operating conditions. *3. Do not exceed the absolute maximum ratings. If they are exceeded, a characteristic and reliability will be degraded. *4. When stored in nitrogen or vacuum atmosphere applied to IC itself only (excluding packaging materials). Recommended Operating Conditions VSS=0V Parameter Oscillator frequency*1 Symbol fOSC Condition VDD=1.70 to 3.63V VDD=2.25 to 3.63V Output frequency fOUT VDD=1.70 to 3.63V, CLOUT≤15pF VDD=2.25 to 3.63V, CLOUT≤15pF Operating supply voltage VDD Between VDD and VSS*2 Input voltage VIN Input pins Operating temperature Ta Output load capacitance CL 5054HxA ~ 5054HxE ver. 5054xF ver. Q output MIN TYP MAX 5054HxA ver. 40 - 50 5054HxB ver. 50 - 65 5054HxC ver. 65 - 85 5054HxD ver. 85 - 105 5054HxE ver. 105 - 135 5054xF ver. 133 - 170 5054HxA ver. 40 - 50 5054HxB ver. 50 - 65 5054HxC ver. 65 - 85 5054HxD ver. 85 - 105 Unit MHz MHz 5054HxE ver. 105 - 135 5054xF ver. 133 - 170 - 3.63 V V 5054HxA ~ 5054HxE ver. 1.70 5054xF ver. 2.25 VSS -40 - - VDD - +125 - +105 - 15 °C pF *1. The oscillation frequency is a yardstick value derived from the crystal used for Seiko NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. Mount a ceramic chip capacitor that is larger than 0.01μF proximal to IC (within approximately 3mm) between VDD and VSS in order to obtain stable operation of 5054 series. In addition, the wiring pattern between IC and capacitor should be as wide as possible. Note. Since it may influence the reliability if it is used out of range of recommended operating conditions, this product should be used within this range. SEIKO NPC CORPORATION - 3 5054H series, 5054xF Electrical Characteristics DC Characteristics (HxA to HxE versions) VDD=1.70 to 3.63V, VSS=0V, Ta= -40 to +125°C unless otherwise noted. Parameter Symbol HIGH-level output voltage LOW-level output voltage VOH VOL Condition MIN TYP MAX Q pin, measurement circuit 3, IOH=-8mA, Ta= -40 to +85°C VDD-0.4 - VDD Q pin, measurement circuit 3, IOH=-8mA VDD-0.45 - VDD Q pin, measurement circuit 3, IOL=8mA, Ta= -40 to +85°C 0 - 0.4 Q pin, measurement circuit 3, IOL=8mA 0 - 0.45 Unit V V HIGH-level input voltage VIH INHN pin, measurement circuit 4 0.7VDD - - V LOW-level input voltage VIL INHN pin, measurement circuit 4 - - 0.3VDD V Output leakage current IZ Q pin, measurement circuit 5 INHN=“Low” Q=VDD - - 10 Q=VSS -10 - - VDD=3.3V - 3.5 7.0 VDD=2.5V - 3.0 6.0 VDD=1.8V - 2.5 5.0 VDD=3.3V - 4.0 8.0 VDD=2.5V - 3.0 6.0 VDD=1.8V - 2.5 5.0 VDD=3.3V - 4.5 9.0 VDD=2.5V - 4.0 8.0 VDD=1.8V - 3.5 7.0 VDD=3.3V - 5.5 10.5 VDD=2.5V - 4.5 8.5 VDD=1.8V - 4.0 7.5 VDD=3.3V - 7.0 13.5 VDD=2.5V - 5.5 10.5 VDD=1.8V - 4.5 8.5 Measurement circuit 1, INHN=“VSS”, Ta= -40 to +85°C - - 10 Measurement circuit 1, INHN=“VSS” - - 20 5054HxA(fOSC), measurement circuit 1 no load, INHN=“OPEN” fOSC=50MHz, fOUT=50MHz 5054HxB(fOSC), measurement circuit 1 no load, INHN=”OPEN” fOSC=65MHz, fOUT=65MHz *1 Current consumption IDD 5054HxC(fOSC), measurement circuit 1 no load, INHN=”OPEN” fOSC=85MHz, fOUT=85MHz 5054HxD(fOSC), measurement circuit 1 no load, INHN=”OPEN” fOSC=100MHz, fOUT=100MHz 5054HxE(fOSC), measurement circuit 1 no load, INHN=”OPEN” fOSC=133MHz, fOUT=133MHz Standby current INHN pull-up resistance Oscillator feedback resistance IST μA mA μA RPU1 Measurement circuit 6 0.8 3 24 MΩ RPU2 Measurement circuit 6 30 70 150 kΩ 5054HxA ver. Design value 1.6 3.1 4.7 5054HxB ver. Design value 1.3 2.6 3.9 5054HxC ver. Design value 1.4 2.8 4.2 5054HxD ver. Design value 1.2 2.3 3.5 5054HxE ver. Design value 1.1 2.1 3.2 RF kΩ SEIKO NPC CORPORATION - 4 5054H series, 5054xF VDD=1.70 to 3.63V, VSS=0V, Ta= -40 to +125°C unless otherwise noted. Parameter Symbol CG CD CG CD Oscillator capacitance CG CD CG CD CG CD Condition 5054HxA ver. Design value (a monitor pattern on a wafer is tested) Excluding parasitic capacitance. 5054HxB ver. Design value (a monitor pattern on a wafer is tested) Excluding parasitic capacitance. 5054HxC ver. Design value (a monitor pattern on a wafer is tested) Excluding parasitic capacitance. 5054HxD ver. Design value (a monitor pattern on a wafer is tested) Excluding parasitic capacitance. 5054HxE ver. Design value (a monitor pattern on a wafer is tested) Excluding parasitic capacitance. MIN TYP MAX 7.2 9.0 10.8 8.0 10.0 12.0 5.6 7.0 8.4 7.2 9.0 10.8 2.4 3.0 3.6 3.2 4.0 4.8 0.8 1.0 1.2 1.6 2.0 2.4 0.0 0.0 0.0 0.8 1.0 1.2 Unit pF *1. The consumption current IDD (CLOUT) with a load capacitance (CLOUT) connected to the Q pin is given by the following equation, where IDD is the no-load consumption current and fOUT is the output frequency. IDD(CLOUT)[mA] = IDD[mA]+CLOUT[pF]×VDD[V]×fOUT[MHz]×10-3 SEIKO NPC CORPORATION - 5 5054H series, 5054xF DC Characteristics (xF version) VDD=2.25 to 3.63V, VSS=0V, Ta= -40 to +105°C unless otherwise noted. Parameter HIGH-level output voltage LOW-level output voltage Symbol VOH VOL Condition MIN TYP MAX Q pin, measurement circuit 3, IOH=-8mA, Ta= -40 to +85°C VDD-0.4 - VDD Q pin, measurement circuit 3, IOH=-8mA VDD-0.45 - VDD Q pin, measurement circuit 3, IOL=8mA, Ta= -40 to +85°C 0 - 0.4 Q pin, measurement circuit 3, IOL=8mA 0 - 0.45 Unit V V HIGH-level input voltage VIH INHN pin, measurement circuit 4 0.7VDD - - V LOW-level input voltage VIL INHN pin, measurement circuit 4 - - 0.3VDD V Output leakage current Q pin, measurement circuit 5 INHN=“Low”, Ta= -40 to +85°C Q=VDD - - 10 Q=VSS -10 - - Q pin, measurement circuit 5 INHN=“Low” Q=VDD - - 100 Q=VSS -100 - - 5054xF(fOSC), measurement circuit 1, no load, INHN=”OPEN”, fOSC=170MHz, fOUT=170MHz Measurement circuit 1, INHN=“VSS” Ta= -40 to +85°C VDD=3.3V - 15.0 29.5 VDD=2.5V - 13.0 25.5 - - 10 - - 100 IZ Current consumption*1 IDD Standby current IST Measurement circuit 1, INHN=“VSS” INHN pull-up resistance Oscillator feedback resistance Oscillator capacitance μA mA μA RPU1 Measurement circuit 6 0.8 3 24 MΩ RPU2 Measurement circuit 6 30 70 150 kΩ RF Design value 2.1 4.0 6.0 kΩ CG Design value (a monitor pattern on a wafer is tested) Excluding parasitic capacitance 0.0 0.0 0.0 0.8 1.0 1.2 CD pF *1. The consumption current IDD (CLOUT) with a load capacitance (CLOUT) connected to the Q pin is given by the following equation, where IDD is the no-load consumption current and fOUT is the output frequency. IDD(CLOUT)[mA] = IDD[mA]+CLOUT[pF]×VDD[V]×fOUT[MHz]×10-3 SEIKO NPC CORPORATION - 6 5054H series, 5054xF AC Characteristics VDD=1.70 to 3.63V, VSS=0V, Ta= -40 to +125°C unless otherwise noted. Parameter Condition Symbol Measurement circuit 1 CLOUT=15pF 0.1VDD to 0.9VDD VDD=2.25 to 3.63V tr1 Output rise time Measurement circuit 1 CLOUT=15pF 0.1VDD to 0.9VDD VDD=1.70 to 2.25V tr2 Measurement circuit 1 CLOUT=15pF 0.9VDD to 0.1VDD VDD=2.25 to 3.63V tf1 Output fall time Measurement circuit 1 CLOUT=15pF 0.9VDD to 0.1VDD VDD=1.70 to 2.25V tf2 Output duty cycle Measurement circuit 1 CLOUT=15pF Ta=25°C DUTY Output disable delay time tOD MIN TYP MAX HxA, HxB, HxC, HxD, HxE ver. - 1.0 2.0 Ta= -40 to +105°C, xF ver. - 1.0 2.0 Ta= -40 to +85°C HxA, HxB, HxC, HxD, HxE ver. - 1.5 2.5 HxA, HxB, HxC, HxD, HxE ver. - 1.5 3.0 HxA, HxB, HxC, HxD, HxE ver. - 1.0 2.0 Ta= -40 to +105°C, xF ver. - 1.0 2.0 Ta= -40 to +85°C HxA, HxB, HxC, HxD, HxE ver. - 1.5 2.5 HxA, HxB, HxC, HxD, HxE ver. - 1.5 3.0 VDD=1.70 to 3.63V HxA, HxB, HxC, HxD, HxE ver. 45 50 55 VDD=2.25 to 3.63V, xF ver. 45 50 55 - - 200 Measurement circuit 2, Ta=25°C, CLOUT≤15pF Unit ns ns % ns Timing chart 0.9VD D 0.9VDD Q 0.1VD D DUTY measurement voltage 0.5VDD DUTY = Tw/T×100 (%) 0.1VD D Tw T tr tf Figure 1.Output switching waveform VDD INHN VIH VIL VSS t OD VDD 0.1V 0.5VDD Q 0.1V VSS fOUT Hi-Z Low fOUT Figure 2.Output disable delay (tOD) timing chart SEIKO NPC CORPORATION - 7 5054H series, 5054xF FUNCTIONAL DESCRIPTION INHN Function When INHN goes Low level, the Q output becomes high impedance. INHN Q Oscillator High(Open) fOUT Operating Low Hi-Z Stopped Power Saving Pull-up Resistor The INHN pin pull-up resistance changes its value to RPU1 or RPU2 in response to the input level (High or Low). When INHN is tied to Low level, the pull-up resistance becomes large (RPU1), thus reducing the current consumed by the resistance. When INHN is left open circuit or tied to High level, the pull-up resistance becomes small (RPU2), thus internal circuit of INHN becomes High level. Consequently, the IC is less susceptible to the effects of noise, helping to avoid problems such as the output stopping suddenly. Oscillation Detection Function The 5054 series incorporate an oscillation detection circuit. The oscillation detection circuit disables the output until the oscillator circuit starts up. This function avoids the problem where the oscillator does not start, due to abnormal oscillation conditions, where power is applied or when the oscillator is restarted using INHN. C0 cancellation circuit Oscillation circuit with a built-in C0 cancellation circuit provides a fixed compensation amount to cancel the effect of the crystal C0. It reduces the C0 parameter in the equivalent circuit, reducing the shallow negative resistance for increasing values of C0. This cancellation circuit makes it easier to maintain the oscillation margin. SEIKO NPC CORPORATION - 8 5054H series, 5054xF MEASUREMENT CIRCUITS Measurement circuit 1 Measurement Parameter: IDD, IST, DUTY, tr, tf A *AC characteristics observed on the Q pin using an oscilloscope. IDD, IST VDD 0.1μF SW1 XT X'tal Q Parameter SW1 SW2 IDD OFF OFF IST ON or OFF ON DUTY, tr, tf ON OFF XTN INHN VSS CLOUT=15pF (Including probe capacitance) SW2 Measurement circuit 2 Measurement Parameter: tOD Input signal : 1Vp-p, sine wave 0.1μF VDD 0.001μF Signal Generator RL1=1kΩ XTN Q 50Ω INHN 15pF VSS RL2=1kΩ Input signal ：VDD→VSS Function Generator 50Ω Measurement circuit 3 Measurement Parameter: VOH, VOL Input signal : 1Vp-p, sine wave 0.1μF VDD 0.001μF Signal Generator XTN 50Ω Q 50Ω VOH VOL VSS Q ΔV VS adjusted so that ΔV=50×IOH VOH VS Q 0.1μF V ΔV VS VS VOL VS adjusted so that ΔV=50×IOL SEIKO NPC CORPORATION - 9 5054H series, 5054xF Measurement circuit 4 Measurement Parameter: VIH, VIL VDD 0.1μF XT Q X'tal XTN VSS INHN VIH, VIL V VIH: VSS→VDD voltage that changes output state VIL: VDD→VSS voltage that changes output state Measurement circuit 5 Measurement Parameter: IZ VDD 0.1μF Q IZ VSS INHN VDD or VSS A Measurement circuit 6 Measurement Parameter: RPU1, RPU2 VDD 0.1μF VSS INHN VIN V A IPU RPU1 = RPU2 = VDD (VIN = 0V) IPU VDD 0.7VDD IPU (VIN = 0.7VDD) SEIKO NPC CORPORATION - 10 5054H series, 5054xF DATA REFERENCE CHARACTERISTICS EXAMPLE (5054 Typical Characteristics) The characters given below were measured using a Seiko NPC standards jig and standard crystal element, and do not represent a guarantee of device characteristics. Note that the characteristics will vary due to measurement environement and the oscillator element used. Crystal used for measurement Crystal parameters Parameter 50MHz 65MHz 80MHz 100MHz 125MHz 170MHz C0(pF) 1.3 1.7 1.6 1.7 2.0 2.8 R1(Ω) 59 40 59 44 33 45 L1 C1 R1 C0 Current Consumption Current Consumption Characteristics Ta=25℃, No load 18 Current consumption [mA] l 16 14 3.3 V 12 2.5 V 10 1.8 V 8 6 4 2 HxA HxB HxC HxD HxE xF 0 40 60 80 100 120 140 160 180 Frequency [MHz] SEIKO NPC CORPORATION - 11 5054H series, 5054xF Negative Resistance Negative Resistance Characteristics 5054HxB version, Ta=25℃ 0 0 -100 -100 -200 -200 -300 -400 -500 -600 C0=2pF -700 C0=0pF(None) C0=1pF VDD=1.8V -800 Negative Resistance [Ω] Negative Resistance [Ω] Negative Resistance Characteristics 5054HxA version, Ta=25℃ -300 -400 C0=2pF -600 C0=1pF C0=0pF(None) -700 VDD=1.8V -800 VDD=2.5V -900 -500 VDD=2.5V -900 VDD=3.3V VDD=3.3V -1000 -1000 20 40 60 80 100 120 140 160 180 20 200 40 60 0 0 -100 -100 -200 -200 -300 -400 -500 -600 -700 C0=2pF VDD=1.8V C0=1pF 140 160 180 200 -300 -400 -500 -600 -700 -800 VDD=2.5V C0=0pF(None) -900 VDD=3.3V -1000 C0=2pF VDD=1.8V C0=1pF VDD=2.5V C0=0pF(None) VDD=3.3V -1000 20 40 60 80 100 120 140 160 180 200 20 40 60 Frequency [MHz] 0 -100 -200 -200 -300 -400 C0=2pF C0=1pF C0=0pF(None) -700 VDD=1.8V -800 VDD=2.5V -900 VDD=3.3V -1000 20 40 60 80 100 120 140 160 180 200 Frequency [MHz] Negative Resistance [Ω] 0 -600 100 120 140 160 180 200 Negative Resistance Characteristics 5054xF version, Ta=25℃ -100 -500 80 Frequency [MHz] Negative Resistance Characteristics 5054HxE version, Ta=25℃ Negative Resistance [Ω] 120 Negative Resistance Characteristics 5054HxD version, Ta=25℃ Negative Resistance [Ω] Negative Resistance [Ω] Negative Resistance Characteristics 5054HxC version, Ta=25℃ -900 100 Frequency [MHz] Frequency [MHz] -800 80 -300 -400 -500 -600 C0=2pF C0=1pF -700 C0=0pF(None) -800 VDD=2.5V -900 VDD=3.3V -1000 20 40 60 80 100 120 140 160 180 200 Frequency [MHz] Measurement equipment: Agilent 4396B Impedance Analyzer The figures show the measurement result of the crystal equivalent circuit C0 capacitance, connected between the XT and XTN pins. They were performed with Agilent 4396B using the Seiko NPC test jig. They may vary in a measurement jig, and measurement environment. SEIKO NPC CORPORATION - 12 5054H series, 5054xF Frequency Deviation by Voltage Frequency Deviation Characteristics 5054HxB version, fOSC=65MHz, Ta=25℃ 0ppm: VDD=2.5V 5 4 4 3 2 1 0 -1 -2 -3 -4 -5 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 Frequency Deviation [ppm] 5 3 2 1 0 -1 -2 -3 -4 -5 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 VDD [V] VDD [V] Frequency Deviation Characteristics 5054HxC version, fOSC=80MHz, Ta=25℃ 0ppm: VDD=2.5V Frequency Deviation Characteristics 5054HxD version, fOSC=100MHz, Ta=25℃ 0ppm: VDD=2.5V 5 5 4 4 3 2 1 0 -1 -2 -3 -4 -5 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 Frequency Deviation [ppm] Frequency Deviation [ppm] Frequency Deviation [ppm] Frequency Deviation Characteristics 5054HxA version, fOSC=50MHz, Ta=25℃ 0ppm: VDD=2.5V 3 2 1 0 -1 -2 -3 -4 -5 1.6 1.8 2.0 2.2 2.4 VDD [V] 4 3 3 2 1 0 -1 -2 -3 -4 -5 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 VDD [V] Frequency Deviation [ppm] Frequency Deviation [ppm] 5 4 2.0 3.0 3.2 3.4 3.6 3.8 Frequency Deviation Characteristics 5054xF version, fOSC=170MHz, Ta=25℃ 0ppm: VDD=2.5V 5 1.8 2.8 VDD [V] Frequency Deviation Characteristics 5054HxE version, fOSC=125MHz, Ta=25℃ 0ppm: VDD=2.5V 1.6 2.6 2 1 0 -1 -2 -3 -4 -5 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 VDD [V] Measurement equipment: Agilent 53132A Frequency Counter SEIKO NPC CORPORATION - 13 5054H series, 5054xF Drive Level Drive Level Characteristics 5054HxB version, fOSC=65MHz, Ta=25°C 300 300 250 250 Drive Level [μW] Drive Level [μW] Drive Level Characteristics 5054HxA version, fOSC=50MHz, Ta=25°C 200 150 100 200 150 100 50 50 0 0 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 1.6 3.8 1.8 2.0 2.2 2.4 2.8 3.0 3.2 3.4 3.6 3.8 Drive Level Characteristics 5054HxD version, fOSC=100MHz, Ta=25°C 300 300 250 250 Drive Level [μW] Drive Level [μW] Drive Level Characteristics 5054HxC version, fOSC=85MHz, Ta=25°C 200 150 100 200 150 100 50 50 0 0 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 1.6 3.8 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 VDD [V] VDD [V] Drive Level Characteristics 5054HxE version, fOSC=125MHz, Ta=25°C Drive Level Characteristics 5054xF version, fOSC=170MHz, Ta=25°C 3.8 800 300 700 Drive Level [μW] 250 Drive Level [μW] 2.6 VDD [V] VDD [V] 200 150 100 50 600 500 400 300 200 100 0 0 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 VDD [V] 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 VDD [V] Measurement equipment: Agilent DSO80604B Digital Oscilloscope Tektronix CT-6 Current probe Agilent 53132A Frequency Counter SEIKO NPC CORPORATION - 14 5054H series, 5054xF Phase Noise Phase Noise Characteristics 5054HxB version, VDD=3.3V, f OSC=65MHz, Ta=25℃ -40 -60 -60 Phase Noise [dBc/Hz] -40 -80 -100 -120 -140 -80 -100 -120 -140 -160 -160 -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 Offset Frequency [Hz] Offset Frequency [Hz] Phase Noise Characteristics 5054HxC version, VDD=3.3V, f OSC=80MHz, Ta=25℃ Phase Noise Characteristics 5054HxD version, VDD=3.3V, f OSC=100MHz, Ta=25℃ -40 -40 -60 -60 Phase Noise [dBc/Hz] Phase Noise (dBc/Hz) -80 -100 -120 Phase Noise [dBc/Hz] -140 -80 -100 -120 -140 -160 -160 -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 Offset Frequency [Hz] Offset Frequency [Hz] Phase Noise Characteristics 5054HxE version, VDD=3.3V, f OSC=125MHz, Ta=25℃ Phase Noise Characteristics 5054xF version, VDD=3.3V, f OSC=170MHz, Ta=25℃ -40 -40 -60 -60 Phase Noise [dBc/Hz] Phase Noise [dBc/Hz] Phase Noise Characteristics 5054HxA version, VDD=3.3V, f OSC=50MHz, Ta=25℃ -80 -100 -120 -140 -80 -100 -120 -140 -160 -160 -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 -180 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 1.0E+06 1.0E+07 1.0E+08 Offset Frequency [Hz] Offset Frequency [Hz] Measurement equipment: Signal Source Analyzer Agilent E5052B SEIKO NPC CORPORATION - 15 5054H series, 5054xF Output Waveform 5054HxA version, VDD=3.3V, fOUT=50MHz, CLOUT=15pF, Ta=25°C 5054HxB version, VDD=3.3V, fOUT=65MHz, CLOUT=15pF, Ta=25°C SEIKO NPC CORPORATION - 16 5054H series, 5054xF 5054HxC version, VDD=3.3V, fOUT=85MHz, CLOUT=15pF, Ta=25°C 5054HxD version, VDD=3.3V, fOUT=106.25MHz, CLOUT=15pF, Ta=25°C SEIKO NPC CORPORATION - 17 5054H series, 5054xF 5054HxE version, VDD=3.3V, fOUT=133MHz, CLOUT=15pF, Ta=25°C 5054xF version, VDD=3.3V, fOUT=170MHz, CLOUT=15pF, Ta=25°C Measurement equipment: Agilent DSO80604B Oscilloscope Agilent 1134A Differential Probe Agilent E2678A Probe Head SEIKO NPC CORPORATION - 18 5054H series, 5054xF Please pay your attention to the following points at time of using the products shown in this document. 1. The products shown in this document (hereinafter ”Products”) are designed and manufactured to the generally accepted standards of reliability as expected for use in general electronic and electrical equipment, such as personal equipment, machine tools and measurement equipment. The Products are not designed and manufactured to be used in any other special equipment requiring extremely high level of reliability and safety, such as aerospace equipment, nuclear power control equipment, medical equipment, transportation equipment, disaster prevention equipment, security equipment. The Products are not designed and manufactured to be used for the apparatus that exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products. If you wish to use the Products in that apparatus, please contact our sales section in advance. In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any damages resulting from the use of that apparatus. 2. Seiko NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof. 3. The information described in this document is presented only as a guide for using the Products. No responsibility is assumed by us for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that infringements. 4. The constant of each circuit shown in this document is described as an example, and it is not guaranteed about its value of the mass production products. 5. In the case of that the Products in this document falls under the foreign exchange and foreign trade control law or other applicable laws and regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 104-0032, Japan Telephone: +81-3-5541-6501 Facsimile: +81-3-5541-6510 http://www.npc.co.jp/ Email:[email protected] ND15001-E-01 2015.11 SEIKO NPC CORPORATION - 19