NIC Doc #R-NTC02 Page 1 of 6 70 Maxess Road ! Melville, New York 11747 (631) 396-7500 ! Fax (631) 396-7575 NTC SERIES TANTALUM CHIP CAPACITORS ! ! ! ! FAILURE RATE ESTIMATION DE-RATED OPERATION LIST OF RELIABILITY TESTS LIFE TEST SUMMARY FAILURE RATE ESTIMATION Introduction This report contains reliability test results of various surface mount tantalum chip capacitors subjected to routine Monitoring Reliability Testing (MRT). The products used in this testing are all representative of manufacturing process for tantalum chip capacitors. Estimation Of Failure Rate There are various methods used to estimate the field failure rate of tantalum chip capacitors. NIC uses the following equation to estimate the field failure rate: λ = λ0 (V/V0 ) 3 x 2 (T-To)/10 λ: failure rate at operating condition (V = applied voltage, T = environmental temperature) λ0: failure rate at rated condition (V0 = rated voltage, T0= rated temperature) Example, for a capacitor: Rated: Operated: V0 = 20V DC, T0 = 85°C V = 5V DC, T = 45°C Failure Rate: NTC-T / NTC-L / NTC-P : 1%/1000 hours at +85°C with 1.0Ω/V circuit resistance If λ0 is equal to 1%/1000 hrs., the estimated failure rate is as follows: λ = λ0 (5/20)3 x 2 (45-85)/10 λ = λ0 x (1/64) x (1/16) λ = 0.001% / 1000 hrs. λ = 10 FIT NIC Doc #R-NTC02 Page 2 of 6 70 Maxess Road ! Melville, New York 11747 (631) 396-7500 ! Fax (631) 396-7575 DE-RATED OPERATION Recommended Operations (Standard Applications) Ω/V Circuit Resistance: ≥3.0Ω Voltage Derating: 70% of Rated Working Voltage Rated Voltage Recommend Maximum Operating Voltage 4.0VDC 6.3VDC 10VDC 16VDC 20VDC 25VDC 35VDC 50VDC 2.8VDC 4.4VDC 7VDC 11.2VDC 14VDC 17.5VDC 24.5VDC 35VDC Recommended Operations (Low Impedance Circuit Applications) Ω/V Circuit Resistance: <3.0Ω Voltage Derating: 33% of Rated Working Voltage Rated Voltage Recommend Maximum Operating Voltage 4.0VDC 6.3VDC 10VDC 16VDC 20VDC 25VDC 35VDC 50VDC 1.3VDC 2.1VDC 3.3VDC 5.3VDC 6.6VDC 8.3VDC 11.6VDC 16.5VDC NIC Doc #R-NTC02 Page 3 of 6 70 Maxess Road ! Melville, New York 11747 (631) 396-7500 ! Fax (631) 396-7575 LIST OF RELIABILITY TESTS TEST ITEM SAMPLE SIZE Visual & Mechanical Examination 8 DC Leakage (Initial) 20 Capacitance (Initial) 20 Dissipation Factor (Initial) 20 Impedance (Initial) 5 Solderability 5 Resistance To Solder Heat 12 Bond Strength Of The End Face Plating 12 Mounting 78/66/24 Adhesion 18 Rapid Change Of Temperature 18 Climatic Sequence 18 Damp Heat, Steady Heat Endurance: 1. @ 85°C, Rated Voltage 2. @ 125°C, Derated Voltage Characteristics At High & Low Temperatures Surge: 1. @ 85°C, R.V. x 1.15 2. @125°C, D.V. x 1.15 Reverse Voltage (R.V. x -0.1, or - 3V) 9 24 15 6 6 NIC Doc #R-NTC02 Page 4 of 6 70 Maxess Road ! Melville, New York 11747 (631) 396-7500 ! Fax (631) 396-7575 LIFE TEST SUMMARY High Temperature Operating Life (Endurance) Test Summary This section summarizes the reliability test results for tantalum chip capacitors.. The failure rate prediction is based on 85°C high temperature life (endurance) test results. Failure Rate Prediction Based Upon Endurance Test Results Period 6/89 9/89 12/89 1/90 1/90 4/90 4/90 7/90 6/90 9/90 8/90 12/90 1/91 4/91 4/91 7/91 6/91 9/91 9/91 12/91 1/92 4/92 4/92 9/92 8/92 10/92 10/92 12/92 1/93 4/93 4/93 7/93 7/93 10/93 Lot No No. Of Devices No. Of Failures Accumulated Acceleration Equivalent Failure Rate Device Hours Factor Device Hours 85°C 9F 72 0 144,000 1 144,000 9J 72 0 144,000 1 144,000 9M 72 0 144,000 1 144,000 0C 72 0 144,000 1 144,000 0F 72 0 144,000 1 144,000 0J 72 0 144,000 1 144,000 0M 72 0 144,000 1 144,000 1C 72 0 144,000 1 144,000 1F 72 0 144,000 1 144,000 1J 72 0 144,000 1 144,000 1M 72 0 144,000 1 144,000 2C 72 0 144,000 1 144,000 2F 72 0 144,000 1 144,000 2J 72 0 144,000 1 144,000 2M 72 0 144,000 1 144,000 3C 72 0 144,000 1 144,000 3F 72 0 144,000 1 144,000 NIC Doc #R-NTC02 Page 5 of 6 70 Maxess Road ! Melville, New York 11747 (631) 396-7500 ! Fax (631) 396-7575 Failure Rate Prediction Based Upon Endurance Test Results (continued) Period 10/93 12/93 1/94 4/94 4/94 7/94 7/94 10/94 10/94 12/94 1/95 4/95 5/95 7/95 7/95 10/95 10/95 12/95 11/95 1/96 2/96 4/96 2/96 4/96 4/96 8/96 5/96 8/96 8/96 10/96 8/96 10/96 11/96 2/97 11/96 3/97 2/97 4/97 2/97 5/97 4/97 7/97 5/97 8/97 Lot No No. Of Devices No. Of Failures Accumulated Acceleration Equivalent Failure Rate Device Hours Factor Device Hours 85°C 3J 72 0 144,000 1 144,000 3M 72 0 144,000 1 144,000 4C 72 0 144,000 1 144,000 4F 72 0 144,000 1 144,000 4J 72 0 144,000 1 144,000 4M 72 0 144,000 1 144,000 5C 72 0 144,000 1 144,000 5F 72 0 144,000 1 144,000 5J 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 5K 6A 6B 6C 6D 6f 6G 6K 6L 7A 7A 7D 7E NIC Doc #R-NTC02 Page 6 of 6 70 Maxess Road ! Melville, New York 11747 (631) 396-7500 ! Fax (631) 396-7575 Failure Rate Prediction Based Upon Endurance Test Results (continued) Period Lot No 8/97 7G 10/97 8/97 7H 10/97 11/97– 7K 2/98 12/97– 7M 3/98 4/988E 6/98 10/98 – 8J 12/98 1/99 – 8M 3/99 Cumulative Total No. Of Devices No. Of Failures Accumulated Acceleration Equivalent Failure Rate Device Hours Factor Device Hours 85°C 72 0 144.000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 72 0 144,000 1 144,000 3,312 0 6,624,000 1 6,624,000 * This estimated failure rate reflects acceleration factor used. 0.0151%/ 1000 hrs.*