Appendix: Analog Switch Array Measurements MT8806/08/09/12/14/15/16 ANALOG SWITCH ARRAY FAMILY: TEST CIRCUITS FOR KEY PARAMETER MEASUREMENTS A.1 Off-State Leakage Current (IOFF) Measurement A.2 RON/∆RON vs. VDC Measurements A.3 Frequency Response (F3dB) Measurement A.4 Feedthrough (FDT) Measurement A.5 Crosstalk (Xtalk) Measurement A.6 Control Input Crosstalk (CXtalk) Measurement A.7 Control Memory Timing Measurements 3-71 Appendix: Analog Switch Array Measurements Xi Yj Any "OFF" Switch nA IOFF VDD=12V, VEE=VSS=0V i can be equal to j All other switches are "OFF" IOFF is also measured on the VDD side. + − VDD=12V VSS VSS Figure A.1 - Off-State Leakage Current (I OFF) Measurement* Yj Xi Any "ON" Switch 0.4V + − mA VDD=12V, VEE=VSS=0V VDC=1/2 VDD= voltage centered at the middle of the switch and is w.r.t. VEE. ION VXi − VYj = 0.4V RON= VXi - VYj = 0.4V ION VDC VDC ION i can be equal to j Figure A.2 - RON / ∆RON Measurement * Xi Yj Any "ON" Switch VDD=5V, VSS=0V, VEE=-7V -3dB = 20LOG VOUT RS=50Ω RL=1kΩ VINA=2Vpp @1kHz VXi VOUT i can be equal to j Figure A.3 - Frequency Response (F3dB) Measurement † Yj Xi Any "ON" Switch VDD=5V, VSS=0V, VEE=-7V FDT = 20LOG VOUT RS=50Ω VINA=2Vpp f>1kHz RL=1kΩ VXi VOUT All other switches are "OFF" i can be equal to j Figure A.4 - Feedthrough (FDT) Measurement † Notes: * Test Conditions for MT8809 and MT8812 are respectively: VDD=12V, VSS=0V and VDD=14V, VSS=0V. † Test Conditions for MT8809 and MT8812 are respectively: VDD=5V, VDC=0V, VSS=-7V and VDD=7V, VDC=0V, VSS=-7V. All Xi and Yj analog I/O pins can be interchanged for all measurements. 3-72 Appendix: Analog Switch Array Measurements same integrated circuit Xi Xi Yj Yj Any "ON" Switch VDD = 5V, VSS = 0V, VEE = -7V Crosstalk = 20LOG VOUT Any other "ON" Switch RS=50Ω VXi RL RL RL VOUT i≠j VINA =2Vpp Figure A.5 - Crosstalk (Xtalk) Measurement † Digital Control Inputs Xi Digital +3V Input Yj 0V Any "ON" Switch RIN=1kΩ VOUT 0V CXtalk RL=10kΩ VOUT VDD = 5V, VSS = 0V, VEE = -7V i can be equal to j Figure A.6 - Control Input Crosstalk to Switch (CX talk ) † VDD VDD Digital Control Inputs Xi 1KΩ Xi Digital Control Inputs Yj Any Switch Yj Any Switch VOUT 1KΩ VOUT 50pF 50pF -7V -7V -7V Digital Inputs 50% (VIL) 0V VOUT tD/tS/tR (VIH) 5V tD/tS/tR (VIH) 5V 50% 50% 50% (VIL) 0V tD/tS/tR tD/tS/tR (ON) VDD (OFF)VDD 50% (ON) -7V 10% 50% 90% (OFF)-7V b) R L at -7V a) RL at VDD VDD = 5V, VSS = 0V, VEE = -7V i can be equal to j MT8809: VIH = 5V, VIL = -7V MT8812: VIH = 7V, VIL = -7V Figure A.7 - Control Memory Timing Measurements † Notes: † Test Conditions for MT8809 and MT8812 are respectively: VDD=5V, VDC=0V, VSS=-7V and VDD=7V, VDC=0V, VSS=-7V. All Xi and Yj analog I/O pins can be interchanged for all measurements. 3-73 Appendix: Analog Switch Array Measurements MT8806/08/09/12/14/15/16 ANALOG SWITCH ARRAY FAMILY: TYPICAL GRAPHS FOR SELECTED PARAMETERS 3-74 G.1 On-state Resistance (RON) vs. Temperature @ VDD=5V, 10V, 12V G.2 On-state Resistance (RON) vs. DC Offset (VDC) @ VDD=5V, 10V, 12V @ 25°C G.3 On-state Resistance (RON) vs. DC Offset (VDC) @ VDD=12V @ -40°C, 25°C, 85°C G.4 ∆RON vs. Temperature @ VDD=5V, 10V, 12V G.5 Total Harmonic Distortion (THD) vs. Frequency G.6 Total Harmonic Distortion (THD) vs. I/P Signal Amplitude (Vpeak) G.7 Crosstalk (Xtalk) vs. Frequency G.8 Feedthrough (FDT) vs. Frequency G.9 Off-State Leakage Current (IOFF) vs. Switch Voltage Appendix: Analog Switch Array Measurements RON (Ω) 150 130 VDD=5V 110 90 VDD=10V 70 50 VDD=12V Temp. (°C) 30 -50 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 G.1 - On-State Resistance (RON ) vs. Temperature RON (Ω) 130 110 VDD=5V 90 VDD=10V 70 50 VDD=12V 30 Vdc (V) 0 1 2 3 4 5 6 7 8 9 10 11 12 11 12 G.2 - On-State Resistance (R ON) vs. DC Offset (VDC) @ 25°C RON (Ω) 80 135°C 70 85°C 60 25°C 50 -40°C 40 -55°C 30 20 Vdc (V) 0 1 2 3 4 5 6 7 8 9 10 G.3 - On-State Resistance (R ON ) vs. DC Offset (VDC) @ V DD = 12V 3-75 Appendix: Analog Switch Array Measurements RON (Ω) 11 VDD=5V 8 VDD=10V VDD=12V 6 4 Temp. -50 (°C) -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 G.4 - ∆RON vs. Temperature THD (%) 0.25 0.2 0.15 0.1 0.05 Freq. (Hz) 0 10,000 20,000 30,000 40,000 50,000 60,000 70,000 80,000 4.5 5 G.5 - Distortion (THD) vs. Frequency THD (%) .08 .06 .04 .02 0 VP (V) 1 1.5 2 2.5 3 3.5 4 G.6 - Distortion (THD) vs. I/P Signal Amplitude (Vp) 3-76 Appendix: Analog Switch Array Measurements Xtalk (dB) -30 RL=10kΩ -50 RL=600Ω -70 RL=1kΩ -90 RL=75Ω . -110 LOG Freq (Hz) 1K 10K 100K 1M 10M G.7 - Crosstalk (X talk) vs. Frequency FDT (dB) -20 -40 -60 -80 -100 LOG Freq (Hz) 100 1K 10K 100K 1M 10M 100M G.8 - Feedthrough (FDT) vs. Frequency IOFF (nA) 8 4 0 -4 -8 -12 -16 VXi-VYj (V) 0 1 2 3 4 5 6 7 8 9 10 11 12 13 G.9 - Off-State Leakage Current (I OFF ) vs. Switch Voltage 3-77 Appendix: Analog Switch Array Measurements MT8806/08/09/12/14/15/16 ANALOG SWITCH ARRAY FAMILY: Analog Switch Array Applications The analog switch array is shown in Figure A.8 as a switching matrix for a typical key system. The system shown below allows connection of outside Central Office telephone lines to inside extension telephones. DTMF IN DTMF OUT PUBLIC ADDRESS KEYBOARD MICROPROCESSOR VOICE SYNTHESIS DISPLAY CALL PROGRESS TONES TRUNK 1 TRUNK 2 TRUNK 3 ANALOG SWITCH ARRAY ANALOG SWITCH ARRAY Figure A.8 - Typical Key System Application 3-78 For more information about all Zarlink products visit our Web Site at www.zarlink.com Information relating to products and services furnished herein by Zarlink Semiconductor Inc. trading as Zarlink Semiconductor or its subsidiaries (collectively “Zarlink”) is believed to be reliable. However, Zarlink assumes no liability for errors that may appear in this publication, or for liability otherwise arising from the application or use of any such information, product or service or for any infringement of patents or other intellectual property rights owned by third parties which may result from such application or use. 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This publication is issued to provide information only and (unless agreed by Zarlink in writing) may not be used, applied or reproduced for any purpose nor form part of any order or contract nor to be regarded as a representation relating to the products or services concerned. The products, their specifications, services and other information appearing in this publication are subject to change by Zarlink without notice. No warranty or guarantee express or implied is made regarding the capability, performance or suitability of any product or service. Information concerning possible methods of use is provided as a guide only and does not constitute any guarantee that such methods of use will be satisfactory in a specific piece of equipment. It is the user’s responsibility to fully determine the performance and suitability of any equipment using such information and to ensure that any publication or data used is up to date and has not been superseded. Manufacturing does not necessarily include testing of all functions or parameters. These products are not suitable for use in any medical products whose failure to perform may result in significant injury or death to the user. All products and materials are sold and services provided subject to Zarlink’s conditions of sale which are available on request. Purchase of Zarlink’s I2C components conveys a licence under the Philips I2C Patent rights to use these components in and I2C System, provided that the system conforms to the I2C Standard Specification as defined by Philips. Zarlink, ZL and the Zarlink Semiconductor logo are trademarks of Zarlink Semiconductor Inc. Copyright Zarlink Semiconductor Inc. All Rights Reserved. TECHNICAL DOCUMENTATION - NOT FOR RESALE