AN548 S i 4 4 3 2 C O MP L I A N C E TE S T R E S U L TS I N C H I N E S E A MR B A N D 1. Introduction This document provides AMR compliance results for the Si4432 when operated from 470 to 510 MHz. The results demonstrate full compliance in the Chinese AMR band. All tests are performed using an ISMDK3 kit with a 4432-TB1-D-470 TX/RX Direct Tie test card. The Wireless Development Suite (WDS) is used to control the test card. The results can be duplicated by using the same configuration and scripts available on the Silicon Labs website and referenced in the EZRadioPRO® Quick-Start Guide. All settings were used directly from the Excel Register Calculator worksheet provided on the Silicon Labs website. For measurement results with different RF parameters, contact customer support. 2. Relevant Measurements to Comply with AMR AMR compliance in China only pertains to effective radiated power, occupied bandwidth, frequency error, spurious emissions and band edge. There are no receiver sensitivity, selectivity or blocking measurements to comply with AMR. The maximum output power under Chinese AMR is +17 dBm. 3. AMR Compliance Results Silicon Labs has tested the Si4432 chip and 4432-T-B1-D-470 TX/RX Direct Tie test card for AMR compliance in the 470–510 MHz frequency band at an output power level of +17 dBm. These AMR compliance tests were performed by HTW Labs, an AMR certified electromagnetic compatibility (EMC) test house. 3.1. Test Conditions Temperature: 15–35 °C Humidity: 30–60 % Atmospheric pressure: 950–1050 mbar Test voltage: DC 3.3 V 3.2. Test Items and Results The test items and results (the EUT passed all tests) are shown in the following sections. 3.2.1. Effective Radiated Power The effective radiated power is the power radiated in the direction of the maximum field strength under specified conditions of measurements for any condition of modulation. Its limit is 17 dBm. The EUT passed the test. Rev. 0.1 5/11 Copyright © 2011 by Silicon Laboratories AN548 AN548 3.2.2. Occupied Bandwidth Occupied bandwidth is the bandwidth which includes 99% of the radiated power. The EUT was modulated with PN9 sequence, 38.4 kbps data rate, and ± 50 kHz FSK deviation, modulation mode GFSK. Its limit is 200 kHz. The EUT passed the test. Nominal Frequency (MHz) EUT Operating Condition Occupied Frequency Bandwidth (kHz) Data Rate (kbps) Deviation (kHz) Limit (kHz) Result 471 50 38.4 140.281 200 PASS 490 50 38.4 155.311 200 PASS 509 50 38.4 144.289 200 PASS 3.2.3. Frequency Error Frequency error is the difference, under normal and extreme conditions, between the measured unmodulated carrier frequency and the nominal frequency as stated by the manufacturer. Its limit is 100 ppm. The EUT passed the test. Nominal Frequency (MHz) Measurement Frequency (MHz) Frequency Error (ppm) Limit (ppm) Result 471 471.001 21.23 100 PASS 490 490.001 20.41 100 PASS 509 508.997 58.94 100 PASS 2 Rev. 0.1 AN548 3.2.4. Spurious Emissions Spurious emissions are unwanted emissions at frequencies other than those of the desired carrier frequency and its sidebands associated with normal test modulation. For frequencies below 1 GHz, the limit is –36 dBm. For frequencies above 1 GHz, the limit is –30 dBm. The EUT passed the test. Notes: 1. Measurement ERP = Read Level + Factor. 2. With the result above, the effective radiated power was calculated on the basis of the reference value. 3. Data of measurement within this frequency range shown “ -- ” in the table above means the reading of emissions are attenuated more than 20 dB below the permissible limits or the field strength is too small to be measured. Rev. 0.1 3 AN548 3.2.5. Band Edge All emissions within the frequency range from the band edge above or below the band edge shall not exceed an ERP of –30 dBm. The EUT passed the test. 4 Rev. 0.1 AN548 NOTES: Rev. 0.1 5 AN548 CONTACT INFORMATION Silicon Laboratories Inc. 400 West Cesar Chavez Austin, TX 78701 Tel: 1+(512) 416-8500 Fax: 1+(512) 416-9669 Toll Free: 1+(877) 444-3032 Please visit the Silicon Labs Technical Support web page: https://www.silabs.com/support/pages/contacttechnicalsupport.aspx and register to submit a technical support request. The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice. Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features or parameters. Silicon Laboratories reserves the right to make changes without further notice. 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Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders. 6 Rev. 0.1