AN785 - Silicon Labs

AN785
C R Y S TA L S ELEC TION G U I D E FOR T H E S i 4 X 6 X / S i 4 X 5 5 R F I C S
1. Introduction
The aim of this application note is to give a better understanding of crystal and TCXO interfacing to our
Si4x6x/Si4x55 ISM band transmitter, receiver and transceiver ICs. The most important parameters when selecting
the proper crystal oscillator are the following:
Nominal Frequency: 25…32 MHz (typically 30 MHz; for more details please see section 4)
Equivalent Series Resistance: ESR: max. 80 
Load Capacitance: Cload, CL: max. 10 pF
Shunt Capacitance: C0 (as low as possible, typically 3–4 pF)
Frequency Stability over Operating Temperature Range: typically ±10 ppm (depends on the application)
2. Theoretical Background
The 30 MHz crystal oscillator of the Si4x6x/Si4x55 family uses the crystal in parallel resonance mode. In this mode,
the resonator consists of the crystal itself and a “load capacitance.” Figure 1 shows this capacitance (CL) together
with the electrical model of the crystal.
Figure 1. Crystal in Parallel Resonance Mode
The most commonly used names for the components in crystal model are:
Lx
Motional inductance
Cx
Motional capacitance
Rx
Loss resistance
C0
Pin/holder capacitance
The addition of CL detunes the mechanical resonator from the series resonance frequency, fS, determined here by
LX and CX. fP= fS x (1 + CX / (2 x (C0 + CL))).
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In order to get an accurate oscillation frequency, fP, it is important to provide the required amount of load
capacitance specified by the crystal manufacturer. Normally, CX is not given in the data sheets, and there is only a
maximum shown for C0. Typical standard values of CL are 8, 10, 12 and 16 pF.
Figure 2. Resonator-Connected Capacitances
3. Si4x6x/Si4x55 Oscillator’s Features
The Si4x6x/Si4x55 includes an integrated crystal oscillator with a fast start-up time of less than 250 µs. The design
is differential with the required crystal load capacitance integrated on-chip to minimize the number of external
components. By default, all that is required off-chip is the crystal. The default crystal frequency is 30 MHz, but the
circuit is designed to handle any XTAL from 25 to 32 MHz. If a crystal with nominal frequency different than 30 MHz
is used, the POWER_UP API boot command must be modified. The WDS calculator crystal frequency field must
also be changed to reflect the frequency being used.
The crystal load capacitance can be digitally programmed to accommodate crystals with various load capacitance
requirements and to adjust the frequency of the crystal oscillator. The tuning of the crystal load capacitance is
programmed through the GLOBAL_XO_TUNE API property. The total internal capacitance is 11 pF and is
adjustable in 127 steps (70 fF/step).
When tight frequency tolerance is required (e.g., narrow band applications) there are two possible options:
1. Use an external high precision reference (e.g., TCXO, OCXO).
2. Use the crystal frequency adjustment to compensate for crystal production tolerances. The frequency
offset characteristics of the capacitor bank are demonstrated in Figure 3. Utilizing the on-chip temperature
sensor and suitable control software, the temperature dependency of the crystal can be canceled.
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Figure 3. Capacitor Bank Frequency Offset Characteristics
When placing the crystal on the PCB layout and routing the crystal and radio interconnections, the designer must
consider minimizing trace length, thus decreasing possible parasitic effects and EMC issues.
Figure 4. Reference Design Layout Example of a Crystal Connection
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4. Frequency Selection
The recommended nominal crystal frequency is 30 MHz for each radio type. One exception is when the product is
designed for the 868 MHz band, where the recommended crystal frequency is 26 MHz, as used in our reference
designs as well. Due to the architecture of the Si4x6x/Si4x55, unwanted spurious emission may be seen at
frequencies equal to the difference between the center frequency and the nearest crystal harmonic. Crystal
harmonics can also desensitize the receiver and degrade sensitivity. It is suggested to carefully choose the crystal
frequency to move its harmonics away from the desired radio frequency. Silicon Labs suggests using 26 MHz in
the 868 MHz European band. It should be noted that the maximum achievable data rate scales according to the
crystal frequency (433 kbps vs 500 kbps at 26 MHz in 2GFSK). Selecting the right crystal frequency is a trade-off
between RF carrier frequency, location of crystal harmonics and maximum achievable data rate.
When selecting the reference crystal for an application, one of the most important factors is the accuracy, which
depends on the radio link parameters (data rate, deviation, RX filter bandwidth), as well as the desired operating
temperature range of the final application.
On the market there are numerous crystals that satisfy all of the criteria described in this document. However, it is
not possible and not intended to provide a complete list of all the supported manufacturers and part types in this
document.Table 1 summarizes the verified, recommended crystals.
5. Recommended Crystal Types
Table 1. Recommended Crystal Types
Crystals
4
Mfr
Freq
Type
CL
ESR max
Tolerance
Operating Temp.
NDK
26 MHz
NX2520SA 26 MHz
EXS00A-CS06378
8 pF
60 
+/- 10 ppm
–20 °C…+75 °C
NDK
26 MHz
NX2016SA 26 MHz
EXS00A-CS06236
8 pF
60 
+/- 10 ppm
–20 °C…+75 °C
NDK
30 MHz
NX2016SA 30 MHz
EXS00A-CS06568
8 pF
60 
+/- 25 ppm
–40 °C…+85 °C
NDK
32 MHz
NX2016SA 32 MHz
EXS00A-CS06238
8 pF
60 
+/- 25 ppm
–40 °C…+85 °C
NDK
26 MHz
NX2016SA 26 MHz
EXS00A-CS07337
8 pF
120 
+/- 50 ppm
–40 °C…+125 °C
NDK
30 MHz
NX2016SA 30 MHz
EXS00A-CS07338
8 pF
120 
+/- 50 ppm
–40 °C…+125 °C
TST
30 MHz
TZ1430A
10 pF
50 
+/- 10 ppm
–20 °C…+70 °C
TST
26 MHz
TZ0661E
10 pF
60 
+/- 20 ppm
–40 °C…+85 °C
Epson
30 MHz
FA-20H
10 pF
50 
+/- 10 ppm
–40 °C…+85 °C
Epson
30 MHz
FA-128
10 pF
50 
+/- 10 ppm
–40 °C…+85 °C
Abracon
26 MHz
ABM10
10 pF
70 
+/- 20 ppm
–20 °C…+70 °C
Abracon
30 MHz
ABM10
10 pF
70 
+/- 20 ppm
–20 °C…+70 °C
River
30 MHz
FCX-04
10 pF
50 
+/- 20 ppm
–20 °C…+70 °C
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Table 1. Recommended Crystal Types
ECS
30 MHz
ECS-300-8-36CKM
8 pF
50 
+/- 10 ppm
–20 °C…+70 °C
AVX Corp
30 MHz
CX2520DB
8 pF
50 
+/- 15 ppm
–10 °C…+70 °C
To obtain the proper radio configurations, it is recommended to use WDS and configure the crystal tolerances for
both ends of the link within the Radio Configuration Application (see Figure 5).
Figure 5. WDS Crystal Tolerance
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6. Using an External Oscillator (TCXO)
In several narrow-band systems, the accuracy requirements cannot be achieved without compensating the
temperature dependency of the crystal itself. A cost-effective method would be to utilize the on-chip temperature
sensor and digitally adjust the crystal capacitance bank (GLOBAL_XO_TUNE API property) with a suitable
software control loop. A more accurate but practical solution is to use a TCXO (temperature-compensated crystal
oscillator).
A TCXO or external signal source can easily be used in place of a conventional XTAL and should be connected to
the XIN pin. The incoming clock signal is recommended to have a peak-to-peak swing in the range of 600 mV to
1.4 V and ac-coupled to the XIN pin with a series capacitor. The maximum allowed swing on XIN is 1.8 V peak-topeak. The XO capacitor bank should be set to 0 whenever an external drive is used on the XIN pin using the
“GLOBAL_XO_TUNE” API property. In addition, the POWER_UP command should be invoked with the TCXO
option whenever the external drive is used.
A TCXO or other external signal sources may introduce unwanted mixing products in the frequency spectrum
(frequency offset from the RF carrier is typically equal to the crystal frequency). The level of these unwanted
signals depends on the voltage amplitude at the XIN pin and the TX output power. The level of these spurious
signals does not affect the compliance of the Si4x6x to most of the regulatory standards around the world up to
+20 dBm (which is the maximum available output power of this chip family). However, certain applications may
require the usage of an external power amplifier (for which the Si446x has built-in support). In this case, the level of
these spurious signals might reach or exceed the limit raised against spurious signals by certain standards (like
European ETSI for +27 dBm at 869.525 MHz).
In case of such an application using the Si4x6x chip revisions other than C (e.g., B0 or B1), there are optimized
settings which provide additional suppression of these unwanted mixing products. To ensure a safe operation, the
following process must be followed for the revision B chips (e.g., B0 or B1):
Transitioning from SLEEP to any active state:
1. Turn on the TCXO and wait for its settling time.
2. Transition from SLEEP to any active mode (SPI_ACTIVE, SPI_ACTIVE, READY, TUNE, RX, TX, etc.).
3. Send the following bytes to the radio via the SPI interface: "F1 F0 01 0A". The nSEL must be pulled low
before the API command is sent and pulled high afterwards.
Transitioning from any active to SLEEP mode:
1. Send the following bytes to the radio via the SPI interface: "F1 F0 01 FA". The nSEL must be pulled low
before the API command is sent and pulled high afterwards.
2. Transition to SLEEP mode.
3. Turn off the TCXO to save current.
The additional settings above do not need to be set for Si4x6x revision C chips (e.g., C0, C1, or C2).
To obtain the proper radio configurations, it is recommended to use WDS and set the “Use external TCXO/Ref
source” option within the Radio Configuration Application (see Figure 6).
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Figure 6. WDS setting for TCXO
Figure 7. Reference Design Schematic with TCXO
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Figure 8. Reference Design Layout with TCXO
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7. Recommended TCXO Types
Table 2 summarizes the recommended and verified TCXOs.
Table 2. Recommended TCXO Types
TCXO
Manufacturer
Freq
Type
DC
Current
Waveform
Tolerance
Operating Temp.
TST
30 MHz
TX0338A
2 mA
Clipped Sine
±2 ppm
–30 °C…+75 °C
TST
26 MHz
TX0341E
2 mA
Clipped Sine
±2 ppm
–40 °C…+85 °C
NDK
30 MHz
NT2520SB 30 MHz
END4673A
1.5 mA
Clipped Sine
±2 ppm
–30 °C…+85 °C
NDK
26 MHz
NT2520SB 26 MHz
END4673B
1.5 mA
Clipped Sine
±2 ppm
–30 °C…+85 °C
NDK
26 MHz
NT2016SA 26 MHz
END4456A
1.5 mA
Clipped Sine
±2 ppm
–30 °C…+85 °C
NDK
26 MHz
NT3225SA 26 MHz
END4605A
1.5 mA
Clipped Sine
±2 ppm
–30 °C…+85 °C
NDK
26 MHz
NT2016SA 26 MHz
END4628A
1.5 mA
Clipped Sine
±3 ppm
–40 °C…+105 °C
NDK
30 MHz
NT2016SA 30 MHz
END4628B
1.5 mA
Clipped Sine
±3 ppm
–40 °C…+105 °C
Epson
30 MHz
TG-5031CJ
2 mA
Clipped Sine
±2 ppm
–30 °C…+85 °C
Epson
26 MHz
TG-5035CJ
2 mA
Clipped Sine
±2 ppm
–30 °C…+85 °C
Murata/RFM
26 MHz
XTC7006G-4
1.5 mA
Clipped Sine
±2 ppm
–40 °C…+85 °C
Murata/RFM
30 MHz
XTC7002
2 mA
Clipped Sine
±2 ppm
–30 °C…+75 °C
Golledge
30 MHz
GTXO83
2 mA
Clipped Sine
±2.5 ppm
–30 °C…+75 °C
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Revision 1.1 to Revision 1.2
Added
Added
new part (Si4x55).
Si4x6x revision C features.
Revision 1.2 to Revision 1.3
Added
new recommended crystal types and
TCXO types to tables 1 and 2.
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Tel: 1+(512) 416-8500
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