FM25Q16B FM25Q16B 16M-BIT Serial Flash Memory with 4KB Sectors, Dual and Quad I/O SPI Rev.01 (Nov.16. 2011) 1 FM25Q16B Documents title 16M bit Serial Flash Memory with 4KB Sectors, Dual and Quad I/O SPI Revision History Revision No. 0.0 0.1 History Initial Draft Add 24ball TFBGA Draft date Remark Oct.18,2011 Nov.16.2011 preliminary preliminary Rev.01 (Nov.16. 2011) 2 FM25Q16B Table of Contents 1. FEATURES……………………………………….……………………………………..……………………5 2. GENERAL DESCRIPTION……………………….………………………………………………………....5 3. PIN / PAD CONFIGURATION………………….…………………………………………………………...6 3.1 3.2 3.3 3.4 3.5 8-Pin SOIC 150-MIL / 208-MIL / VSOP 208-MIL………………..………………………….6 8-Pad WSON 6X5-MM……………………………………………………..………………….6 8-Pin PDIP 300-MIL…………………………………………………………………………….6 16-Pin SOIC 300-MIL………………………………………………………………………..…7 24ball TFBGA…………………………………………………………………………………...7 4. PIN / PAD DESCRIPTION………………………………………………………………………..………….8 5. 4.1 SOIC 150/208-MIL, VSOP 208-MIL, WSON 6X5-MM, PDIP 300-MIL,24ball TFBGA….8 4.2 SOIC 300-MIL………………………………………………………..........……….…………..8 4.3 Package Type…………………………………………………………………………..……….8 SIGNAL DESCRIPTION……………………………………………………………………………………..9 5.1 5.2 5.3 5.4 5.5 Chip Select (/CS)……………………………………….………………………………………9 Serial Data Input, Output and IOs (DI, DO and IO0, IO1, IO2, IO3)………………………9 Write Protect (/WP)…………………………………………….……….……….……….…….9 HOLD (/HOLD)…………………………………………………………………….……………9 Serial Clock (CLK)…………………………………………………………..………….………9 6. BLOCK DIAGRAM…………………………………………………………………….…………………….10 7. FUNCTIONAL DESCRIPTION…………………………………………………..………………………..11 7.1 7.2 7.3 7.4 8. WRITE PROTECTION…………………………………………………………….….……..……………..12 8.1 9. Standard SPI Instructions………………………………………..………….………………..11 Dual SPI Instructions…………………………………….……………………………………11 Quad SPI Instructions……………………………………………….……..…………………11 Hold Function………………………………………………………………………………….11 Write protect Features………………………………………………………………..………12 STATUS REGISTER………………………………………………………………….…………………….13 9.1 9.2 9.3 9.4 9.5 9.6 9.7 9.8 BUSY………………………………………………………………………..………………….14 Write Enable Latch (WEL)……………………………………………………………………14 Block Protect Bits (BP2, BP1, BP0)…………………………………………………………14 Top/Bottom Block protect (TB)……………………………………….………………………14 Sector/Block Protect (SEC)…………………………………………………………………..14 Status Register protect (SRP1, SRP0)…………………………………….……………….15 Quad Enable (QE)……………………………………………………................…………..15 Status Register Memory Protection…………………………………………………………16 10. INSTRUCTIONS…………………………………………………………………………………………….17 10.1 10.2 10.3 10.4 10.5 10.6 10.7 10.8 10.9 10.10 10.11 10.12 10.13 10.14 10.15 10.16 10.17 Manufacturer and Device Identification………………………………….………………….17 Instruction Set Table 1……………………………………………….……………………….18 Instruction Set Table 2………………………………………………………………………..19 Write Enable (06h)…………………………………….………………………………………20 Write Disable (04h)……………………………………………………………………………20 Read Status Register-1 (05h) and Read Status Register-2 (35h)…………………….…21 Write Status Register (01h)…………………………………………………………………..22 Read Data (03h)……………………………………………………..……………………….23 Fast Read (0Bh)……………………………………………………………...……………….24 Fast Read Dual I/O (BBh)…………………………………………..……………………….25 Fast Read Quad I/O (EBh)……………………………………..……………………………27 Page Program (02h)…………………………………………………………………………..28 Quad Data Input Page Program (32h)...........................................................................29 Quad Data Page Program (38h)………………………………….…………………………30 Sector Erase (20h).........................................................................................................31 32KB Block Erase (52h)………………………………….…………………………………..32 64KB Block Erase (D8h)……………………………….…………………………………….33 Rev.01 (Nov.16. 2011) 3 FM25Q16B 10.18 10.19 10.20 10.21 10.22 10.23 10.24 10.25 10.26 10.27 10.28 10.29 Chip Erase (C7h / 60h)……………………………………………………………………….34 Erase/ Program Suspend (75h)……………………………………………………………35 Erase/ Program Resume (7Ah)…………………………………………………………….36 Deep Power-down (B9h)……………………………..……………………………………..37 Release Deep Power-down / Device ID (ABh)………………………………..…………..38 Read Manufacturer/ Device ID (90h),(EFh),(DFh)…………………..…………………….39 JEDEC ID (9Fh)……………………………………………………………………………….41 Mode Bit Reset (FFh)…………………………………………………………………………42 Enter Secured OTP (B1h)……………………………………………………………………43 Exit Secured OTP (C1h)………………………………………….…………………………..43 Read Security Register (2Bh)………………………………………………….…………….44 Write Security Register (2Fh)…………………….………………………………………….45 11. 4K-bit Secured OTP………………………………………………………………….……………………..46 12. ELECTRICAL CHARACTERISTICS………………………………………………………………………47 12.1 12.2 12.3 12.4 12.5 12.6 12.7 12.8 12.9 12.10 12.11 Absolute Maximum Ratings………………………………………………………………….47 Operating Ranges…………………………………………………….………………………47 Endurance and Data Retention……………………………………….……………………..47 Power-up Timing and Write Inhibit Threshold…………………..………………………….48 DC Electrical Characteristics…………………………………………..……………………49 AC Measurement Conditions…………………………………….…………………………..50 AC Electrical Characteristics…………………………………………………………………51 AC Electrical Characteristics (cont’d)……………………………………………………….52 Serial Output Timing…………………………………………………………..………………53 Input Timing……………………………………………………..……………………………..53 Hold Timing………………………………………………………………………..…………..53 13. PACKAGE SPECIFICATION………………………………………………………………………………54 13.1 13.2 13.3 13.4 13.5 13.6 13.7 13.8 8-Pin SOIC 150-mil……………………………………………………………………………54 8-Pin SOIC 208-mil……………………………………………………………………………55 8-Pin VSOP 208-mil…………………………………………………………………………..56 8-Pin PDIP 300-mil……………………………………………………………………………57 8-contact 6x5 WSON…………………………………………………………………………58 8-contact 6x5 WSON Cont’d…………………………………..…………………………….59 16-Pin SOIC 300-mil………………………………………………………………………….60 24ball TFBGA………………………………………………………………………………….61 14. ORDERING INFORMATION…………………………………….…………………………………………62 Rev.01 (Nov.16. 2011) 4 FM25Q16B 1. FEATURES ■ SPI Flash Memory -16M-bit / 2M–byte Serial Flash -256-bytes per programmable page -4K-bit secured OTP ■ Standard, Dual or Quad SPI -Standard SPI: CLK, /CS, DI, DO, /WP, /Hold -Dual SPI: CLK, /CS, IO0, IO 1, /WP, /Hold -Quad SPI: CLK, /CS, IO0, IO1, IO2, IO3 ■ High Performance -104MHz clock operation -208MHz equivalent Dual SPI -416MHz equivalent Quad SPI -50MB/S continuous data transfer rate -31MB/S random access (32-byte fetch) -Comparable to X16 Parallel Flash ■ Flexible Architecture -Uniform Sector Erase (4K-byte) -Block Erase (32K and 64K-bytes) -Erase Suspend & Resume ■ Endurance -100K program/ erase cycles -Single 2.7 to 3.6V supply -5mA active current -<3μA Deep Power-down (typ.) ■ wide Temperature Range --40℃ to +85℃ operating range ■ Advanced Security Features -Software and Hardware Write-protect -Top or Bottom, Sector or Block selection -Lock-Down and OTP protection ■ Package Options -8-pin SOIC 150-mil -8-pin SOIC 208-mil -8-pad WSON 6x5-mm -16-pin SOIC 300-mil -8-pin PDIP 300-mil -8-pin VSOP 208-mil -24 ball TFBGA ■ Package Material -Fidelix all product Green package Lead-free & Halogen-free RoHS Compliant ■ Low Power Consumption 2. GENERAL DESCRIPTION The FM25Q16B SPI flash supports the standard Serial peripheral Interface (SPI), and supports the Dual/Quad SPI: Serial Clock, Chip Select, Serial Data I/O0(DI), I/O1(DO), I/O2(/WP), and I/O3(/HOLD). SPI clock frequencies of up to 104MHz are supported allowing equivalent clock rates of 208MHz for Dual Output and 416MHz for Quad Output when using the Fast Read Dual/Quad I/O instructions. These transfer rates are comparable to those of 8 and 16-bit Parallel Flash memories. The FM25Q16B array is organized into 8,192 programmable pages of 256-bytes each. Up to 256 bytes can be programmed at a time using the Page Program instructions. Pages can be erased Sector, 32KB Block, 64KB Block or the entire chip. The devices operate on a single 2.7V to 3.6V power supply with current consumption as low as 5mA active and 3μA for Deep Power-down. All devices offered in space-saving packages. The device supports JEDEC standard manufacturer and device identification with a 4K-bit Secured OTP. Rev.01 (Nov.16. 2011) 5 FM25Q16B 3. PIN / PAD CONFIGURATION 3.1 8-Pin SOIC 150-MIL / 208-MIL / VSOP 208-MIL / CS 1 8 VCC DO(IO 1) 2 7 /HOLD(IO 3) / WP(IO 2) 3 6 CLK GND 4 5 DI(IO0) Figure 1a. Pin Assignments, 8-pin SOIC 150-mil / 208-mil / VSOP 208-mil 3.2 8-Pad WSON 6X5-MM /CS 1 8 VCC DO(IO1) 2 7 /HOLD(IO3) 3 6 CLK 4 5 DI(IO0) /WP(IO2) GND Figure 1b. Pad Assignments, 8-pad WSON 3.3 8-Pin PDIP 300-MIL /CS VCC DO(IO1) /HOLD(IO3) /WP(IO2) CLK GND DI(IO0) Figure 1c. Pin Assignments, 8-pin PDIP 300-mil Rev.01 (Nov.16. 2011) 6 FM25Q16B 3.4 16-Pin SOIC 300-MIL /HOLD(IO3 ) 1 16 CLK VCC 2 15 DI(IO0 ) N/C 3 14 N/C N/C 4 13 N/C N/C 5 12 N/C N/C 6 11 N/C /CS 7 10 GND DO(IO1 ) 8 9 /WP(IO2 ) Figure 1d. Pin Assignments, 16-pin SOIC 300-mil 3.5 24ball TFBGA Figure 1e. Pin Assignments, 24-Ball TFBGA Rev.01 (Nov.16. 2011) 7 FM25Q16B 4. PIN / PAD DESCRIPTION 4.1 SOIC 150-MIL / 208-MIL, VSOP 208-MIL, WSON 6X5-MM, PDIP 300-MIL, 24ball TFBGA PIN NO. PIN NAME I/O FUCTION 1 /CS I Chip Select Input 2 DO(IO1) I/O Data Output (Data Input Output 1)*¹ 3 /WP(IO2) I/O Write Protect Input (Data Input output) *² 4 GND 5 DI(IO0) I/O Data Input (Data Input Output 0)*¹ 6 CLK I Serial Clock Input 7 /HOLD(IO3) I/O Hold Input (Data Input output 3) *² 8 VCC Ground Power Supply *1 IO0 and IO1 are used for Dual and Quad instructions *2 IO0-IO3 are used for Quad instructions 4.2 SOIC 300-MIL PAD NO. PAD NAME I/O 1 /HOLD(IO3) I/O FUCTION 2 VCC Power Supply 3 N/C No Connect 4 N/C No Connect 5 N/C No Connect 6 N/C No Connect 7 /CS I 8 DO(IO1) I/O Data output (Data Input Output 1)* ¹ 9 /WP(IO2) I/O Write Protection Input (Data Input Output 2)* ² 10 GND Ground Hold Input(Data Input Output 3)* ² Chip Select Input 11 N/C No Connect 12 N/C No Connect 13 N/C No Connect 14 N/C No Connect 15 DI(IO0) I/O 16 CLK I Data Input (Data Input Output 0)* ¹ Serial Clock Input *1 IO0 and IO1 are used for Dual and Quad instructions *2 IO0_IO3 are used for Quad instructions 4.3 Package Type FM25Q16B is offered in an 8-pin plastic 150-mil width SOIC, 8-pin plastic 208-mil width VSOP, 8pin plastic 208-mil width SOIC, 6x5-mm WSON, 8-pin PDIP and 16-pin plastic 300-mil width SOIC as shown in figure 1a, 1b,1c and 1d respectively. Package diagrams and dimensions are illustrated at the end of this datasheet. Rev.01 (Nov.16. 2011) 8 FM25Q16B 5. SIGNAL DESCRIPTION 5.1 Chip Select (/CS) When this input signal is high, the device is deselected and serial data output is at high impedance. Unless an internal program, erase or write status register cycle is in progress, the device will be in the standby power mode (this is not the deep power-down mode). Driving Chip Select (/CS) low enables the device, placing it in the active power mode. After power-up, a falling edge on Chip Select (/CS) is required prior to the start of any instruction. 5.2 Serial Data Input, Output and IOs (DI, DO and IO0, IO1, IO2, IO3) The FM25Q16B supports standard SPI, Dual SPI and Quad SPI operation. Standard SPI instructions use the serial DI (input) pin to write instructions, addresses or data to the device on the rising edge of the Serial Clock (CLK) input pin. Standard SPI also uses the serial DO (output) to read data or status from the device on the falling edge of CLK. Dual and Quad SPI instructions use the serial IO pins to write instructions, addresses or data to the device on the rising edge of CLK and read data or status from the device on the falling edge of CLK. Quad SPI instructions require the non-volatile Quad Enable bit (QE) in Status Register-2 to be set. When QE=1 the /WP pin becomes IO2 and /HOLD pin becomes IO3. 5.3 Write Protect (/WP) The Write Protect (/WP) pin can be used to protect the Status Register against data modification. Used in company with the Status Register’s Block Protect (SEC. TB, BP2, BP1 and BP0) bits and Status Register Protect (SRP) bits, a portion or the entire memory array can be hardware protected. The /WP pin is active low. When the QE bit of Status Register-2 is set for Quad I/O, the /WP pin (Hardware Write Protect) function is not available since this pin is used for IO2. See figure 1a, 1b, 1c and 1d for the pin configuration of Quad I/O operation. 5.4 HOLD (/HOLD) The /HOLD pin is used to pause any serial communications with the device without deselecting the device. When /HOLD goes low, while /CS is low, the DO pin will be at high impedance and signals on the DI and CLK pins will be ignored (don’t care). When /HOLD goes high, device operation can resume. The /HOLD function can be useful when multiple devices are sharing the same SPI signals. The /HOLD pin is active low. When the QE bit of Status Register-2 is set Quad I/O, the /HOLD pin function is not available since this pin used for IO3. See figure 1a, 1b, 1c and 1d for the pin configuration of Quad I/O operation. 5.5 Serial Clock (CLK) This input signal provides the timing for the serial interface. Instructions, addresses, or data present at serial data input are latched on the rising edge of Serial Clock (CLK). Data are shifted out on the falling edge of the Serial Clock (CLK). Rev.01 (Nov.16. 2011) 9 FM25Q16B 6. BLOCK DIAGRAM Block Segmentation xxFF00h 1FFF00h ● 1FF000h xxFFFFh Block 31 (64KB) 1FFFFFh ● 1FF0FFh Sector 15 (4KB) xxF000h xxF0FFh xxEF00h xxEFFFh Sector 14 (4KB) xxE000h xxE0FFh xxDF00h xxDFFFh Sector 13 (4KB) xxD000h xxD0FFh xx2F00h Write Protect Logic and Ro w Decode ● ● ● xx2FFFh Sector 2 (4KB) xx2000h xx20FFh xx1F00h xx1FFFh Sector 1 (4KB) xx1000h xx10FFh xx0F00h xx0FFFh Sector 0 (4KB) xx0000h xx00FFh 10FF00h ● 100000h Block 16 (64KB) 10FFFFh ● 1000FFh 0FFF00h ● 0F0000h Block 15 (64KB) 0FFFFFh ● 0F00FFh ● ● ● /WP (IO2) Write Control Logic 08FF00h ● 080000h Block 8 (64KB) 08FFFFh ● 0800FFh 07FF00h ● 070000h Block 7 (64KB) 07FFFFh ● 0700FFh Status Register ● ● ● High Voltage Generators /HOLD (IO3) CLK CS DI (IO0) DO (IO1) SPI Command And Control Logic Page Address Latch / Counter 00FF00h ● 000000h Beginning Page Address Block 0 (64KB) 00FFFFh ● 0000FFh Ending Page Address Column Decode And 256Byte Page buffer Data Byte Address Latch / Counter Figure 2. Block Diagram of FM25Q16B Rev.01 (Nov.16. 2011) 10 FM25Q16B 7. FUNCTIONAL DESCRIPTION 7.1 Standard SPI Instructions The FM25Q16B features a serial peripheral interface on four signals: Serial Clock (CLK). Chip Select (/CS), Serial Data Input (DI) and Serial Data Output (DO). Standard SPI instructions use the DI input pin to serially write instructions, addresses or data to the device on the rising edge of CLK. The DO output pin is used to read data or status from the device on the falling edge of CLK. SPI bus operation Modes 0 (0, 0) and 3 (1, 1) are supported. The primary difference between Mode 0 and Mode 3 concerns the normal state of the CLK signal when the SPI bus master is in standby and data is not being transferred to the Serial Flash. For Mode 0 the CLK signal is normally low on the falling and rising edges of /CS. For Mode 3 the CLK signal is normally high on the falling and rising edges of /CS. 7.2 Dual SPI Instructions The FM25Q16B supports Dual SPI operation when using the “Fast Read Dual I/O” (BB hex) instruction. This instruction allows data to be transferred to or from the device at two times the rate of the standard SPI. The Dual Read instruction is ideal for quickly downloading code to RAM upon power-up (code-shadowing) or for executing non-speed-critical code directly from the SPI bus (XIP). When using Dual SPI instructions the DI and DO pins become bidirectional I/0 pins; IO0 and IO1. 7.3 Quad SPI Instructions The FM25Q16B supports Quad SPI operation when using the “Fast Read Quad I/O” (EB hex). This instruction allows data to be transferred to or from the device at four times the rate of the standard SPI. The Quad Read instruction offers a significant improvement in continuous and random access transfer rates allowing fast code-shadowing to RAM or execution directly from the SPI bus (XIP). When using Quad SPI instruction the DI and DO pins become bidirectional IO0 and IO1, and the /WP and /HOLD pins become IO2 and IO3 respectively. Quad SPI instructions require the nonvolatile Quad Enable bit (QE) in Status Register-2 to be set. 7.4 Hold Function The /HOLD pin is used to pause a serial sequence of the SPI flash memory without resetting the clocking sequence. To enable the /HOLD mode, the /CS must be in low state. The /HOLD mode effects on with the falling edge of the /HOLD signal with CLK being low. The HOLD mode ends on the rising edge of /HOLD signal with CLK being low. In other words, /HOLD mode can’t be entered unless CLK is low at the falling edge of the /HOLD signal. And /HOLD mode can’t be exited unless CLK is low at the rising edge of the /HOLD signal. See Figure.3 for HOLD condition waveform. If /CS is driven high during a HOLD condition, it resets the internal logic of the device. As long as /HOLD signal is low, the memory remains in the HOLD condition. To re-work communication with the device, /HOLD must go high, and /CS must go low. See 12.11 for HOLD timing. CLK /HOLD Active Hold Active Hold Active Figure3. Hold condition waveform Rev.01 (Nov.16. 2011) 11 FM25Q16B 8. WRITE PROTECTION To protect inadvertent writes by the possible noise, several means of protection are applied to the Flash memory. 8.1 Write protect Features While Power-on reset, all operations are disabled and no instruction is recognized. An internal time delay of tPUW can protect the data against inadvertent changes while the power supply is outside the operating specification. This includes the Write Enable, Page program, Sector Erase, Block Erase, Chip Erase, Write Security Register and the Write Status Register instructions. For data changes, Write Enable instruction must be issued to set the Write Enable Latch (WEL) bit to “0”. Power-up, Completion of Write Disable, Write Status Register, Page program, Sector Erase, Block Erase and Chip Erase are subjected to this condition. Using setting the Status Register protect (SRP) and Block protect (SEC, TB, BP2, BP1, and BP0) bits a portion of memory can be configured as reading only called software protection. Write Protect(/WP) pin can control to change the Status Register under hardware control. The Deep Power Down mode provides extra software protection from unexpected data changes as all instructions are ignored under this status except for Release Deep Powerdown instruction. One time program(OTP) mode provide protection mode from program/erase operation Rev.01 (Nov.16. 2011) 12 FM25Q16B 9. STATUS REGISTER The Read Status Register instruction can be used to provide status on the availability of the Flash memory array, if the device is write enabled or disabled, the state of write protection and the Quad SPI setting. The Write Status Register instruction can be used to configure the devices write protection features and Quad SPI setting. Write access to the Status Register is controlled by in some cases of the /WP pin. S7 S6 S5 S4 S3 S2 S1 S0 SRP0 SEC TB BP2 BP1 BP0 WEL BUSY Status Register Protect 0 (NonVolatile) Sector Protect (NonVolatile) Top/Bott om Write Protect (NonVolatile) Block Protect (NonVolatile) Block Protect (NonVolatile) Block Protect (NonVolatile) Write Enable Latch Erase or Write in Progress Figure 4a. Status Register-1 S15 S14 S13 S12 S11 S10 S9 S8 (R) (R) (R) (R) (R) (R) QE SRP1 Reserved Quad Enable (NonVolatile) Status Register Protect 1 (NonVolatile) Reserved Reserved Reserved Reserved Reserved Figure 4b. Status Register-2 Rev.01 (Nov.16. 2011) 13 FM25Q16B 9.1 BUSY BUSY is a read only bit in the status register (S0) that is set to a 1 state when the device is executing a Page Program, Sector Erase, Block Erase, Chip Erase or Write Status Register instruction. During this time the device will ignore further instruction except for the Read Status Register and Erase Suspend instruction (see tW, tPP, tSE, tBE1, tBE2 and tCE in AC Characteristics). When the program, erase or write status register instruction has completed, the BUSY bit will be cleared to a 0 state indicating the device is ready for further instructions. 9.2 Write Enable Latch (WEL) Write Enable Latch (WEL) is a read only bit in the status register (S1) that is set to a 1 after executing a Write Enable instruction. The WEL status bit is cleared to a 0, When device is write disabled. A write disable state occurs upon power-up or after any of the following instructions: Write Disable, Page Program, Sector Erase, Block Erase, Chip Erase and Write Status Register. 9.3 Block Protect Bits (BP2, BP1, BP0) The Block Protect Bits (BP2, BP1, BP0) are non-volatile read/write bits in the status register (S4, S3, and S2) that provide write protection control and status. Block protect bits can be set using the Write Status Register Instruction (see tW in AC characteristics). All none or a portion of the memory array can be protected from Program and Erase instructions (see Status Register Memory Protection table). The factory default setting for the Block Protection Bits is 0, none of the array protected. 9.4 Top/Bottom Block protect (TB) The non-volatile Top/Bottom bit (TB) controls if the Block Protect Bits (BP2, BP1, BP0) protect from the Top (TB=0) or the Bottom (TB=1) of the array as shown in the Status Register Memory Protection table. The factory default setting is TB=0. The TB bit can be set with the Write Status Register Instruction depending on the state of the SRP0, SRP1 and WEL bits. 9.5 Sector/Block Protect (SEC) The non-volatile Sector protect bit (SEC) controls if the Block Protect Bits (BP2, BP1, BP0) protect 4KB Sectors (SEC=1)or 64KB Blocks (SEC=0) in the Top (TB=0) or the Bottom (TB=1) of the array as shown in the Status Register Memory protection table. The default setting is SEC=0. Rev.01 (Nov.16. 2011) 14 FM25Q16B 9.6 Status Register protect (SRP1, SRP0) The Status Register Protect bits (SRP1 and SRP0) are non-volatile read/write bits in the status register (S8 and S7). The SRP bits control the method of write protection: software protection, hardware protection, power supply lock-down or one time programmable (OTP) protection. SRP1 SRP0 /WP Status Register Description 0 0 X Software Protection /WP pin no control. The register can be written to after a Write Enable instruction, WEL=1. [Factory Default] 0 1 0 Hardware Protected When /WP pin is low the Status Register locked and can not be written to. 0 1 1 Hardware Unprotected When /WP pin is high the Status register is unlocked and can be written to after a Write Enable instruction, WEL=1 1 0 X Power Supply Lock-Down Status Register is protected and can not be written to again (1) until the next power-down, power-up cycle . 1 1 X One Time Program Status Register is permanently protected and can not be written to. Note: 1. When SRP1, SRP0=(1,0), a power-down, power-up cycle will change SRP1, SRP0 to(0,0) state. 9.7 Quad Enable (QE) The Quad Enable (QE) bit is a non-volatile read/write bit in the status register (S9) that allows Quad operation. When the QE bit is set to a 0 state (factory default) the /WP pin and /Hold are enabled. When the QE pin is set to a 1 the Quad IO2 and IO3 pins are enabled. WARNING : The QE bit should never be set to a 1 during standard SPI or Dual SPI operation if the /WP or /HOLD pins are tied directly to the power supply or ground. Rev.01 (Nov.16. 2011) 15 FM25Q16B 9.8 Status Register Memory Protection STATUS REGISTER (1) FM25Q16B (16M-BIT) MEMORY PROTECTION SEC TB BP2 BP1 BP0 BLOCK(S) ADDRESSES DENSITY PROTION X X 0 0 0 NONE NONE NONE NONE 0 0 0 0 1 31 1F0000h-1FFFFFh 64KB Upper 1/32 0 0 0 1 0 30 and 31 1E0000h-1FFFFFh 128KB Upper 1/16 0 0 0 1 1 28 thru 31 1C0000h-1FFFFFh 256KB Upper 1/8 0 0 1 0 0 24 thru 31 180000h-1FFFFFh 512KB Upper 1/4 0 0 1 0 1 16 thru 31 100000h-1FFFFFh 1MB Upper 1/2 0 1 0 0 1 0 000000h-00FFFFh 64KB Lower 1/32 0 1 0 1 0 0 and 1 000000h-01FFFFh 128KB Lower 1/16 0 1 0 1 1 0 thru 3 000000h-03FFFFh 256KB Lower 1/8 0 1 1 0 0 0 thru 7 000000h-07FFFFh 512KB Lower 1/4 0 1 1 0 1 0 thru 15 000000h-0FFFFFh 1MB Lower 1/2 X X 1 1 X 0 thru 31 000000h-1FFFFFh 2MB ALL 1 0 0 0 1 31 1FF000h-1FFFFFh 4KB Top Block 1 0 0 1 0 31 1FE000h-1FFFFFh 8KB Top Block 1 0 0 1 1 31 1FC000h-1FFFFFh 16KB Top Block 1 0 1 0 X 31 1F8000h-1FFFFFh 32KB Top Block 1 1 0 0 1 0 000000h-000FFFh 4KB Bottom Block 1 1 0 1 0 0 000000h-001FFFh 8KB Bottom Block 1 1 0 1 1 0 000000h-003FFFh 16KB Bottom Block 1 1 1 0 X 0 000000h-007FFFh 32KB Bottom Block Note : 1. X = don’t care Rev.01 (Nov.16. 2011) 16 FM25Q16B 10. INSTRUCTIONS The instruction set of the FM25Q16B consists of fifteen basic instructions that are fully controlled through the SPI bus (see Instruction Set table). Instructions are initiated with the falling edge of Chip Select (/CS). The first byte of data clocked into the DI input provides the instruction code. Data on the DI input is sampled on the rising edge of clock with most significant bit (MSB) first. Instructions vary in length from a single byte to several bytes and may be followed by address bytes, data bytes, dummy bytes (don’t care), and in some cases, a combination. Instructions are completed with the rising edge of edge /CS. Clock relative timing diagrams for each instruction are included in figures 5 through 30. All read instructions can be completed after any clocked bit. However, all instructions that Write, Program or Erase must complete on a byte (/CS driven high after a full 8-bit have been clocked) otherwise the instruction will be terminated. This feature further protects the device from inadvertent writes. Additionally, while the memory is being programmed or erased, or when the Status Register is being written, all instructions except for Read Register will be ignored until the program or erase cycle has completed. 10.1 Manufacturer and Device Identification ID code Instruction Manufacturer ID Fidelix F8h 90h, EFh, DFh, 9Fh Device ID FM25Q16B 14h 90h, EFh, DFh, ABh Memory Type ID SPI 32h 9Fh Capacity Type ID 16M 15h 9Fh Rev.01 (Nov.16. 2011) 17 FM25Q16B 10.2 Instruction Set Table 1(1) INSTRUCTION NAME BYTE 1 (CODE) BYTE 2 BYTE 3 BYTE 4 BYTE 5 Write Enable 06h Write Disable 04h Read Status Register-1 05h Read Status Register-2 35h (SR15- SR8)(2) Write Status Register 01h (SR7-SR0) (SR15-SR8) Page Program 02h A23-A16 A15-A8 A7-A0 (D7-D0) Quad Data Input (3) Page Program 32h A23-A16 A15-A8 A7-A0 (D7-D0, …) (3) Quad Page Program 38h A23-A0, (D7-D0) A15-A8 A7-A0 (D7-D0, …) (3) Block Erase (64KB) D8h A23-A16 A15-A8 A7-A0 Block Erase (32KB) 52h A23-A16 A15-A8 A7-A0 Sector Erase (4KB) 20h A23-A16 A15-A8 A7-A0 Chip Erase (SR7-SR0) BYTE 6 (2) C7h/60h Erase Suspend 75h Erase Resume 7Ah Deep Power-down B9h Mode Bit Reset(4) FFh Release Deep Powerdown/ Device ID ABh dummy dummy dummy (ID7-ID0) (5) Read Manufacturer/ Device ID(6) 90h dummy dummy 00h or 01h (M7-M0) Read Dual Manufacturer/ Device ID(6) EFh dummy dummy 00h or 01h (M7-M0) (ID7-ID0) Read Quad Manufacturer/ Device ID(6) DFh dummy dummy 00h or 01h (M7-M0…) (ID7-ID0…) Write Security Register 2Fh Read Security Register 2Bh Enter Secured OTP B1h Exit Secured OTP C1h Read JEDEC ID 9Fh (ID7-ID0) Memory Type (ID7-ID0) Capacity (ID7-ID0) (SC7-SC0) (7) (M7-M0) Manufacturer Rev.01 (Nov.16. 2011) 18 FM25Q16B Notes: 1. 2. 3. 4. 5. 6. 7. Data bytes are shifted with Most Significant Bit first. Byte fields with data in parenthesis “()” indicate data being read from the device on the IO pin. SR = status register, The Status Register contents will repeat continuously until /CS terminates the instruction. Quad Data Input Page Program Input Data IO0 = (D4, D0 …) IO1 = (D5, D1 …) IO2 = (D6, D2 …) IO3 = (D7, D3 …) This instruction is recommended when using the Dual or Quad Mode bit feature. See section 10.25 for more information. The Device ID will repeat continuously until /CS terminates the instruction. See Manufacturer and Device Identification table for Device ID information. SC = security register 10.3 Instruction Set Table 2 (Read Instructions) INSTRUCTION NAME BYTE 1 (CODE) BYTE 2 BYTE 3 BYTE 4 BYTE 5 Read Data 03h A23-A16 A15-A8 A7-A0 (D7-D0) Fast Read Data 0Bh A23-A16 A15-A8 A7-A0 dummy Fast Read Dual I/O BBh A23-A8(2) A7-A0, M7-M0(2) (D7-D0, …)(1) Fast Read Quad I/O EBh A23-A0, M7-M0(4) (x,x,x,x, D7-D0,…)(5) (D7-D0, …)(3) BYTE 6 (D7-D0) Notes: 1: Dual Output data IO0 = (D6, D4, D2, D0) IO1 = (D7, D5, D3, D1) 2: Dual Input Address IO0 = A22, A20, A18, A16, A14, A12, A10, A8, A6, A4, A2, A0, M6, M4, M2, M0 IO1 = A23, A21, A19, A17, A15, A13, A11, A9, A7, A5, A3, A1, M7, M5, M3, M1 3: Quad Output Data IO0 = (D4, D0…) IO1 = (D5, D1…) IO2 = (D6, D2…) IO3 = (D7, D3…) 4: Quad Input Address IO0 = A20, A16, A12, A8, A4, A0, M4, M0 IO1 = A21, A17, A13, A9, A5, A1, M5, M1 IO2 = A22, A18, A14, A10, A6, A2, M6, M2 IO3 = A23, A19, A15, A11, A7, A3, M7, M3 5: Fast Read Quad I/O Data IO0 = (x, x, x, x, D4, D0…) IO1 = (x, x, x, x, D5, D1…) IO2 = (x, x, x, x, D6, D2…) IO3 = (x, x, x, x, D7, D3…) Rev.01 (Nov.16. 2011) 19 FM25Q16B 10.4 Write Enable (06h) Write Enable instruction is for setting the Write Enable Latch (WEL) bit in the Status Register. The WEL bit must be set prior to every Program, Erase and Write Status Register instruction. To enter the Write Enable instruction, /CS goes low prior to the instruction “06h” into Data Input (DI) pin on the rising edge of CLK, and then driving /CS high. /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 Instruction 06h DI High - Z DO Figure 5. Write Enable Instruction Sequence Diagram 10.5 Write Disable (04h) The Write Disable instruction is to reset the Write Enable Latch (WEL) bit in the Status Register. The Write Disable instruction is entered by driving /CS low, sending the instruction code “04h” into the DI pin and then driving /CS high. WEL bit is automatically reset write-disable status of “0” after Power-up and upon completion of the every Program, Erase and Write Status Register instructions. /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 DI DO Instruction 04h High - Z Figure 6. Write Disable Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 20 FM25Q16B 10.6 Read Status Register-1 (05h) and Read Status Register-2 (35h) The Read Status Register instructions are to read the Status Register. The Read Status Register can be read at any time (every Program, Erase, Write Status Register and Write Security Register cycle is in progress). It is recommended to check the BUSY bit before sending a new instruction when a Program, Erase, Write Status Register or Write Status Register operation is in progress. The instruction is entered by driving /CS low and sending the instruction code “05h” for Status Register-1 or “35h” for Status Register-2 into the DI pin on the rising edge of CLK. The status register bits are then shifted out on the DO pin at the falling edge of CLK with most significant bit (MSB) first as shown in (figure 7). The Status Register bits are shown in figure 4a and 4b include the BUSY, WEL, BP2-BP0, TB, SEC, SRP0, SRP1 and QE bits (see description of the Status Register earlier in this datasheet). The Status Register can be read continuously, as shown in (Figure 7). The instruction is completed by driving /CS high. /CS Mode 3 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 20 19 21 22 23 Mode 0 Instruction 05h or 35h Status Register 1 or 2 Out DO High - Z 7 MSB 6 5 4 3 2 Status Register 1 or 2 Out 1 0 7 6 5 4 3 2 1 0 MSB DI CLK Figure 7. Read Status Register Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 21 FM25Q16B 10.7 Write Status Register (01h) The Write Status Register instruction is for changing the values of Status Register Bits. A Write Enable instruction must previously have been issued prior to setting Write Status Register Instruction (Status Register bit WEL must equal 1). Once write is enabled, the instruction is entered by driving /CS low, sending the instruction code “01h”, and then writing the status register data byte or word as illustrated in figure 8. The Status Register bits are shown in figure 4 and described earlier in this datasheet. Only non-volatile Status Register bits SRP0, SEC, TB, BP2, BP1, BP0 (bits 7, 5, 4, 3, 2 of Status Register-1) and QE, SRP1 (bits 9 and 8 of Status Register-2) can be written to. All other Status Register bit locations are read-only and will not be affected by the Write Status Register instruction. The /CS pin must be driven high after the eighth or sixteenth bit of data that is clocked in. If this is not done the Write Status Register instruction will not be executed. If /CS is driven high after the eighth clock, the QE and SRP1 bits will be cleared to 0. After /CS is driven high, the self-timed Write Status Register cycle will commence for a time duration of tw (See AC Characteristics). While the Write Status Register cycle is in progress, the Read Status Register instruction may still be accessed to check the status of the BUSY bit. The BUSY bit is a 1 during the Write Status Register cycle and a 0 when the cycle is finished and ready to accept other instructions again. After the Write Status Register cycle has finished, The Write Enable Latch (WEL) bit in Status Register will be cleared to 0. The Write Status Register instruction can change the value of Block Protect bits (SEC, TB, BP2, BP1 and BP0) to define the protected area of memory from erase and program instructions. Protected areas become read-only (see Status Register Memory Protection table and description). The Write Status Register instruction also allows the Status Register Protect bits (SRP0, SRP1) to be set. Those bits are used in conjunction with the Write protect (/WP) pin, Lock out or OTP features to disable writes to the status register. Please refer to 9 for detailed descriptions Status Register protection methods. Factory default all Status Register bits are 0. /CS Mode 3 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 20 19 21 22 23 CLK Mode 0 DI Instruction 01h Status Register 1 In 7 MSB DO 6 5 4 3 2 Status Register 2 In 1 0 15 14 13 12 11 10 9 8 MSB High - Z Figure 8. Write Status Register Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 22 FM25Q16B 10.8 Read Data (03h) The Read Data instruction is to read data out from the device. The instruction is initiated by driving the /CS pin low and then sending the instruction code “03h” with following a 24-bit address (A23A0) into the DI pin. The code and address bits are latched on the rising edge of the CLK pin. After the address is received, the data byte of the addressed memory location will be shifted out on the DO pin at the falling edge of CLK with most significant bit (MSB) first. The address is automatically incremented to the next higher address after byte of data is shifted out allowing for a continuous stream of data. This means that the entire memory can be accessed with a single instruction as long as the clock continues. The instruction is completed by driving /CS high. The Read Data instruction sequence is shown in (figure 9). If a Read Data instruction is issued while an Erase, Program or Write Status Register cycle is in process (BUSY=1) the instruction is ignored and will not have any effects on the current cycle. The Read Data instruction allows clock rates from D.C to a maximum of fR (see AC Electrical Characteristics). /CS Mode 3 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 36 35 37 38 39 Mode 0 Instruction 24 Bit Address 03h 23 22 21 3 2 1 0 MSB High - Z DO Data Out 7 6 5 4 3 2 1 0 MSB DI CLK 7 Figure 9. Read Data Register Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 23 FM25Q16B 10.9 Fast Read (0Bh) The Fast Read instruction is high speed reading mode. The address is latched on the rising edge of the CLK. After the 24-bit address, this is accomplished by adding eight “dummy” clocks as shown in (figure 10). The dummy clocks means the internal circuits require time to set up the initial address. During the dummy clocks, the data value on the DO pin is a “don’t care”. Data of each bit shifts out on the falling edge of CLK. /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 28 29 30 31 CLK Mode 0 Instruction 24 Bit Address 0Bh DI 23 22 21 3 2 1 0 44 45 46 47 MSB High - Z DO /CS 32 33 7 6 34 35 36 37 38 39 40 41 42 43 48 49 50 53 52 51 54 55 CLK Dummy Byte 5 4 3 2 1 0 Data Out 1 DO High - Z 7 MSB 6 5 4 3 Data Out 2 2 1 0 7 6 5 4 3 2 1 0 MSB DI 7 Figure 10. Fast Read Register Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 24 FM25Q16B 10.10 Fast Read Dual I/O (BBh) The Fast Read Dual I/O instruction reduce cycle overhead through double access using two IO pins, IO0 and IO1. “Continuous read mode” The Fast Read Dual I/O instruction can further reduce instruction overhead through setting the Mode bits (M7-0) after the input Address bits (A23-0), as shown in (figure 11a). The upper nibble of the Mode (M7-4) controls the length of the next Fast Read Dual I/O instruction through the inclusion or exclusion of the first byte instruction code. The lower nibble bits of the Mode (M3-0) are don’t care (“X”), However, the IO pins should be high-impedance prior to the falling edge of the first data out clock. If the Mode bits (M7-0) equal “Ax” hex, then the next Fast Dual I/O instruction (after /CS is raised and then lowered) does not require the BBh instruction code, as shown in (figure 11b). This reduces the instruction sequence by eight clocks and allows the address to be immediately entered after /CS is asserted low. If Mode bits (M7-0) are any value other “Ax” hex, the next instruction (after /CS is raised and then lowered) requires the first byte instruction code, thus returning to normal operation. A Mode Bit Reset instruction can be used to reset Mode Bits (M7-0) before issuing normal instructions. /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 11 12 13 14 15 17 16 18 19 20 21 22 23 CLK Mode 0 Instruction 24 Bit Address 22 BBh DI High - Z 23 DO 20 18 16 14 12 10 8 6 4 2 0 6 21 19 17 15 13 11 9 7 5 3 1 7 A15 - 8 A23 - 16 A7 - 0 5 High - Z High - Z M7 - 0 /CS 4 24 25 26 27 28 29 30 31 32 33 34 35 37 36 38 39 CLK DI Switches from Input to Output DO 6 4 2 0 7 5 3 1 6 4 2 0 7 5 3 1 MSB MSB Data Out 1 6 4 2 0 7 5 3 1 Data Out 2 6 4 2 0 6 7 5 3 1 7 MSB MSB Data Out 3 DI Data Out 4 Figure 11a Fast Read Dual I/O Instruction (initial instruction or previous M7-0≠ Axh) Rev.01 (Nov.16. 2011) 25 FM25Q16B /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 11 12 13 14 15 CLK Mode 0 24 Bit Address DI 22 20 18 16 14 12 10 8 6 4 2 0 6 4 DO 23 21 19 17 15 13 11 9 7 5 3 1 7 5 A15 - 8 A23 - 16 A7 - 0 High - Z High - Z M7 - 0 /CS 16 17 18 19 20 21 22 23 24 25 26 27 29 28 30 31 CLK DI Switches from Input to Output DO 6 4 2 0 7 5 3 1 6 4 2 0 7 5 3 1 MSB MSB Data Out 1 6 4 2 0 7 5 3 1 Data Out 2 6 4 2 0 6 7 5 3 1 7 MSB MSB Data Out 3 DI Data Out 4 Figure 11b. Fast Read Dual I/O Instruction (previous M7-0= Axh) Rev.01 (Nov.16. 2011) 26 FM25Q16B 10.11 Fast Read Quad I/O (EBh) The Fast Read Quad I/O instruction is similar to the Fast Read Dual I/O instruction but with the capability to input the 24 bit address, mode bits through four pins IO0, IO1, IO2, and IO3 and four Dummy clock are required prior to the data output. The Quad I/O drastically eliminate instruction cycle and makes faster random access for code executing (XIP) directly from the Quad SPI. The Quad Enable bit (QE) of Status Register-2 must be set to enable the Fast read Quad I/O Instruction. “Continuous read mode” The Fast Read Quad I/O instruction can further reduce instruction overhead through setting the Mode bits (M7-0) with following the input Address bits (A23-0), as shown in (figure 12a). The upper nibble of the Mode (M7-4) controls the length of the next Fast Read Quad I/O instruction through the inclusion or exclusion of the first byte instruction code. The lower nibble bits of the Mode (M3-0) are don’t care (“X”). However, the IO pins should be high-impedance prior to the falling edge of the first data out clock. If the Mode bits (M7-0) equal “Ax” hex, then the next Fast Read Quad I/O instruction (after /CS is raised and then lowered) does not require the EBh instruction code, as shown in (figure 12b). This reduces the instruction sequence by eight clocks and allows the address to be immediately entered after /CS is asserted low. If the Mode bits (M7-0) are any value other than “Ax” hex, the next instruction (after /CS is raised and then lowered) requires the first byte instruction code, thus retuning normal operation. A Mode Bit Reset can be used to reset Mode Bits (M7-0) before issuing normal instructions. /CS Mode 3 0 1 2 4 3 5 6 7 8 9 11 10 12 13 14 15 16 17 18 19 20 21 22 23 CLK Mode 0 Instruction EBh High - Z IO1 High - Z IO2 High - Z IO3 IOS Switches from Input to Output Dummy 20 16 12 8 4 0 4 0 4 0 4 0 21 17 13 9 5 1 5 1 5 1 5 1 22 18 14 10 6 2 6 2 6 2 6 2 23 19 15 11 7 3 7 3 7 3 7 A23 - 16 A15 - 8 A7 - 0 3 Data Out 2 Data Out 1 M7 - 0 IO0 24 Bit Address 4 5 6 7 Figure 12a. Fast Read Quad I/O Instruction (Initial instruction or previous M7-0 ≠ Axh) /CS Mode 3 1 0 2 4 3 5 6 7 8 9 10 11 12 13 14 15 Mode 0 24 Bit Address IOS Switches from Input to Output Dummy IO0 20 16 12 8 4 0 4 0 4 0 4 0 IO1 21 17 13 9 5 1 5 1 5 1 5 1 IO2 22 18 14 10 6 2 6 2 6 2 6 2 IO3 23 19 15 11 7 3 7 3 7 3 7 A23 - 16 A15 - 8 A7 - 0 M7 - 0 Data Out 1 3 Data Out 2 CLK 4 5 6 7 Figure 12b. Fast Read Quad I/O Instruction (previous M7-0 = Axh) Rev.01 (Nov.16. 2011) 27 FM25Q16B 10.12 Page Program (02h) The Page Program instruction is for programming the memory to be “0”. A Write Enable instruction must be issued before the device accept the Page Program Instruction (Status Register bit WEL= 1). After the Write Enable (WREN) instruction has been decoded, the device sets the Write Enable Latch (WEL). The instruction is entered by driving the /CS pin low and then sending the instruction code “02h” with following a 24-bits address (A23-A0) and at least one data byte, into the DI pin. The /CS pin must be driven low for the entire time of the instruction while data is being sent to the device. (Please refer to figure 13). If the entire 256 data bytes are going to be programmed, A7-A0 (the eight least significant address bits) should be set to 0. If more than 256 bytes are sent the device, previously latched data are discarded and the last 256 data bytes are guaranteed to be programmed correctly within the same page. If less than 256 data bytes are sent to device, they are correctly programmed at the requested addresses without having any effects on the other bytes of the same page. The /CS pin must go high once the eighth bit of the last byte has been latched in, otherwise the Page Program instruction is not executed. Once /CS is driven high, the self-timed Page Program instruction will initiated for a duration of tPP (See AC Characteristics). While the Page Program cycle is in progress, the Read Status Register instruction may still be accessed for checking the status of the BUSY bit. The BUSY bit is a 1 during the Page Program cycle and becomes a 0 when the cycle is finished and the device is ready to accept other instructions again. After the Page Program cycle has finished and Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Page Program instruction applied to a page which is protected by the Block Protect (SEC, TB, BP2, BP1, and BP0) bits is not executed. /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 28 29 30 31 33 32 35 34 36 37 38 39 CLK Instruction 24 Bit Address 23 22 21 3 Data Byte 1 2 1 0 MSB 46 47 48 49 50 51 52 53 54 55 2079 45 2078 44 0 1 2077 43 CLK 2075 42 2 3 2076 41 2072 40 4 5 MSB /CS Data Byte 2 7 MSB 6 5 4 3 Data Byte 256 Data Byte 3 2 1 0 7 MSB 6 5 4 3 2 1 0 DI 6 7 2074 02h DI 2073 Mode 0 7 6 5 4 3 2 1 0 MSB Figure 13. Page Program Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 28 FM25Q16B 10.13 Quad Data Input Page Program (32h) The Quad Data Input Page Program instruction is to program the memory as being “0” at previously erased (FFh) memory areas. The Quad Data Input Page Program takes four pins: IO0, IO1, IO2 and IO3 as and data input, which can improve programmer performance and the effectiveness of application of lower clock less than 5MHz. System using faster clock speed will not get more benefit for the Quad Data Input Page Program as the required internal page program time is far more than the time data clock-in. To use Quad Data Input Page Program the Quad Enable in Status Register-2 must be set (QE=1), A Write Enable instruction must be executed before the device will accept the Quad Data Input Page Program instruction (Status Register-1, WEL=1). The instruction is initiated by driving the /CS pin low and then sending the instruction code “32h” with following a 24-bit address (A23-A0) and at least one data, into the IO pins. The /CS pin must be held low for the entire length of the instruction while data is being sent to the device. All other functions of Quad Data Input Page Program are perfectly same as standard Page Program. (Please refer to figure 14). /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 28 29 30 31 32 33 34 35 CLK Mode 0 Instruction IO0 24 Bit Address 32h 23 IO1 22 21 3 2 1 0 High - Z IO2 High - Z IO3 4 0 4 0 5 1 5 1 6 2 6 2 3 7 3 MSB High - Z 7 Data Byte 1 44 45 543 43 542 42 541 41 40 540 39 539 38 538 37 536 36 CLK 537 /CS Data Byte 2 0 4 0 4 0 4 0 IO1 5 1 5 1 5 1 5 1 5 1 IO2 6 2 6 2 6 2 6 2 6 2 IO3 7 3 7 3 7 3 7 3 7 3 Data Byte 3 Data Byte 4 Data Byte 5 Data Byte 6 Data Byte 7 4 0 4 0 4 0 4 0 5 1 5 1 5 1 5 1 6 2 6 2 6 2 6 2 4 0 4 IO0 7 3 7 3 7 3 7 3 Data Byte 253 Data Byte 254 Data Byte 255 Data Byte 256 Figure 14. Quad Data Input Page Program Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 29 FM25Q16B 10.14 Quad Data Page Program (38h) The Quad Data Input Page Program instruction is to program the memory as being “0” at previously erased (FFh) memory areas. The Quad Data Input Page Program takes four pins: IO0, IO1, IO2 and IO3 as address and data input, which can improve programmer performance and the effectiveness of application of lower clock less than 5MHz. System using faster clock speed will not get more benefit for the Quad Data Input Page Program as the required internal page program time is far more than the time data clock-in. To use Quad Data Input Page Program, the Quad Enable bit in Status Register-2 must be set (QE=1), A Write Enable instruction must be executed before the device will accept the Quad Data Input Page Program instruction (Status Register-1, WEL=1). The instruction is initiated by driving the /CS pin low then sending the instruction code “38h” with follwinga 24-bit address (A23-A0) and at least one data, into the IO pins. The /CS pin must be held low for the entire length of the instruction while data is being sent to the device. All other functions of Quad Page Program are perfectly same as standard Page Program. (Please refer to figure 15). /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 12 11 13 14 15 16 17 18 19 CLK Mode 0 Instruction IO0 24 Bit Address 38h High - Z IO1 High - Z IO2 High - Z IO3 20 16 12 8 4 0 4 0 4 0 4 0 21 17 13 9 5 1 5 1 5 1 5 1 22 18 14 10 6 2 6 2 6 2 6 2 23 19 15 11 7 3 7 3 7 3 7 3 Data Byte 1 MSB Data Byte 3 28 29 525 27 524 26 523 25 24 522 23 521 22 520 21 518 20 CLK 519 /CS Data Byte 2 0 4 0 4 0 4 0 IO1 5 1 5 1 5 1 5 1 5 1 IO2 6 2 6 2 6 2 6 2 6 2 IO3 7 3 7 3 7 3 7 3 7 3 Data Byte 4 Data Byte 5 Data Byte 6 Data Byte 7 Data Byte 8 4 0 4 0 4 0 4 0 5 1 5 1 5 1 5 1 6 2 6 2 6 2 6 2 4 0 4 IO0 7 3 7 3 7 3 7 3 Data Byte 253 Data Byte 254 Data Byte 255 Data Byte 256 Figure 15. Quad Page Program Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 30 FM25Q16B 10.15 Sector Erase (20h) The Sector Erase instruction is to erase the data of the selected sector as being “1”. The instruction is used for an 4K-byte sector. Prior to the Sector Erase Instruction, a Write Enable instruction must be issued. (Status Register bit WEL must be equal to 1). The instruction is initiated by driving the /CS pin low and shifting the instruction code “20h” followed a 24-bit sector address (A23-A0). (Please refer to figure 16). The /CS pin must go high once the eighth bit of the last byte has been latched in, oherwise the Sector Erase instruction will not be executed. After /CS goes high, the self-timed Sector Erase instruction will initiated for a time duration of tSE (See AC Characteristics). While the Sector Erase cycle is in progress, the Read Status Register instruction may still be read the status of the BUSY bit. The BUSY bit is a 1 during the Sector Erase cycle and becomes a 0 when the cycle is finished and the device is ready to accept other instructions again. After the Sector Erase cycle has finished the Write Enable Latch (WEL) bit in Status Register is cleared to 0. The Sector Erase instruction applied to addressed page which is protected by the Block Protect (SEC, TB, BP2, BP1, and BP0) bits is not executed. (See Status Register Memory protection table). /CS Mode 3 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 CLK Mode 0 DI Instruction 24 Bit Address 20h 23 22 21 3 2 1 0 MSB High - Z DO Figure 16. Sector Erase Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 31 FM25Q16B 10.16 32KB Block Erase (52h) The Block Erase instruction is to erase the data of the selected block as being “1”. The instruction is used for an 32K-byte Block erase operation. Prior to the Block Erase Instruction, a Write Enable instruction must be issued. (Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low and shifting the instruction code “52h” followed a 24-bit block address (A23A0). (Please refer to figure 17). The /CS pin must go high once the eighth bit of the last byte has been latched in, otherwise the Block Erase instruction will not be issued. After /CS is driven high, the self-timed Block Erase instruction will commence for a time duration of tBE1 (See AC Characteristics). While the Block Erase cycle is in progress, the Read Status Register instruction may still be read the status of the BUSY bit. The BUSY bit is a 1 during the Block Erase cycle and becomes a 0 when the cycle is finished and the device is ready to accept other instructions again. After the Sector Erase cycle has finished the Write Enable Latch (WEL) bit in Status Register is cleared to 0.The Block Erase instruction applied to addressed page which is protected by the Block Protect (SEC, TB, BP2, BP1, and BP0) bits is not executed. (See Status Register Memory Protection table). /CS Mode 3 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 CLK Mode 0 DI Instruction 24 Bit Address 52h 23 22 21 3 2 1 0 MSB High - Z DO Figure 17. 32KB Block Erase Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 32 FM25Q16B 10.17 64KB Block Erase (D8h) The Block Erase instruction is to erase the data of the selected block as being “1”. Prior to the Block Erase Instruction, a Write Enable instruction must be issued. (Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low and shifting the instruction code “D8h” followed a 24-bit block address (A23-A0). (Please refer to figure 18). The /CS pin must go high once the eighth bit of the last byte has been latched. If this is not done the Block Erase instruction will not be executed. After /CS is driven high, the self-timed Block Erase instruction will commence for a time duration of tBE1 (See AC Characteristics). While the Block Erase cycle is in progress, the Read Status Register instruction may still be accessed for checking the status of the BUSY bit. The BUSY bit is a 1 during the Block Erase cycle and becomes a 0 when the cycle is finished and the device is ready to accept other instructions again. After the Block Erase cycle has finished the Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Block Erase instruction applied to addressed page which is protected by the Block Protect (SEC, TB, BP2, BP1, and BP0) bits is not executed. (see Status Register Memory Protection table). /CS Mode 3 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 CLK Mode 0 DI Instruction 24 Bit Address D8h 23 22 21 3 2 1 0 MSB High - Z DO Figure 18. 64KB Block Erase Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 33 FM25Q16B 10.18 Chip Erase (C7h / 60h) The entire memory array can be erased in a single operation by using the Chip Erase command. The Chip-Erase instruction clears all bits in the device to be FFh (all 1s). A Chip-Erase instruction will be ignored if any of the memory area is protected. Prior to any Write operation, the WriteEnable (WREN) instruction must be executed. The instruction is initiated by driving the /CS pin low and shifting the instruction code “C7h” or “60h”. (Please refer to figure 19). The /CS pin must be forced high after the eighth bit has been latched in. If this is not done the Chip Erase instruction will not be executed. After /CS is driven high, the self-timed Chip Erase instruction will commence for a duration of tCE (See AC Characteristics). While the Chip Erase cycle is in progress, the Read Status Register instruction may still be accessed to check the status of the BUSY bit. The BUSY bit is a 1 during the Chip Erase cycle and becomes a 0 when the cycle is finished and the device is ready to accept other instructions again. After the Chip Erase cycle has finished the Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Chip Erase instruction applied to a page which is protected by the Block Protect (SEC, TB, BP2, BP1, and BP0) bits is not executed. (See Status Register Memory Protection table). /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 DI DO Instruction C7h or 60h High - Z Figure 19. Chip Erase Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 34 FM25Q16B 10.19 Erase / Program Suspend (75h) The Erase/Program Suspend instruction allows the system to interrupt a Sector Erase, Block Erase operation or a Page Program, Quad Data Input Page Program, Quad Page Program operation. Erase Suspend is valid only during the Sector or Block erase operation. The Write Status Register1(01h) instruction and Erase instructions (20h, 52h, D8h, C7h, 60h) are not allowed during Erase Suspend. During the Chip Erase operation, the Erase Suspend instruction is ignored. Program Suspend is valid only during the Page Program, Quad Data Input Page Program or Quad Page Program operation. The Write Status Register-1(01h) instruction and Program instructions (02h, 32h and 33h) are not allowed during Program Suspend. The Erase/Program Suspend instruction “75h” will be accepted by the device only if the SUS bit in the Status Register equals to 0 and the BUSY bit equals to 1 while a Sector or Block Erase or a Page Program operation is on-going. If the SUS bit equals to 1 or the BUSY bit equals to 0, the Suspend instruction will be ignored by the device. A maximum of time of “tSUS” (See AC Characteristics) is required to suspend the erase or program operation. After Erase/ Program Suspend, the SUS bit in the Status Register will be set from 0 to 1 immediately and The BUSY bit in the Status Register will be cleared from 1 to 0 within “tSUS”. For a previously resumed Erase/Program operation, it is also required that the Suspend instruction “75h” is not issued earlier than a minimum of time of “tSUS” following the preceding Resume instruction “7Ah”. Unexpected power off during the Erase/Program suspend state will reset the device and release the suspend state. SUS bit in the Status Register will also reset to 0. The data within the page, sector or block that was being suspended may become corrupted. It is recommended for the user to implement system design techniques against the accidental power interruption and preserve data integrity during erase/program suspend state. (Please refer to figure 20). /CS tSUS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 DI DO Instruction 75h High - Z Accept Read or Program Instruction Figure 20. Erase/ Program Suspend instruction (SPI Mode) Rev.01 (Nov.16. 2011) 35 FM25Q16B 10.20 Erase / Program Resume (7Ah) The Erase/ Program Resume instruction “7Ah” is to re-work the Sector or Block Erase operation or the Page Program operation upon an Erase/ Program Suspend. The Resume instruction “7Ah” will be accepted by the device only if the SUS bit in the Status Register equals to 1 and the BUSY bit equals to 0. After issued, the SUS bit will be cleared from 1 to 0 immediately, the BUSY bit will be set from 0 to 1 within 200ns and the Sector or Block will complete the erase operation or the page will complete the program operation. If the SUS bit equals to 0 or the BUSY bit equals to 1, the Resume instruction “7Ah” will be ignored by the device. Resume instruction cannot be accepted if the previous Erase/Program Suspend operation was interrupted by unexpected power off. It is also required that a subsequent Erase/Program Suspend instruction not to be issued within a minimum of time of “tSUS” following a previous Resume instruction. (Please refer to figure 21). /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 DI Instruction 7Ah Resume previously Suspended Program or Erase Figure 21. Erase / Program Resume instruction (SPI Mode) Rev.01 (Nov.16. 2011) 36 FM25Q16B 10.21 Deep Power-down (B9h) Executing the Deep Power-down instruction is the best way to put the device in the lowest power consumption. The Deep Power-down instruction reduces the standby current (from ICC1 to ICC2, as specified in AC characteristics). The instruction is entered by driving the /CS pin low with following the instruction code “B9h”. (Please refer to figure 22). The /CS pin must go high once the eighth bit of the instruction code has been latched in, otherwise the Deep Power-down instruction is not executed. After /CS is driven high, it requires a delay of tDP and the Deep power down mode is entered. While in the Release Deep Power-down /Device ID instruction, which restores the device to normal operation, will be recognized. All other instructions are ignored including the Read Status Register instruction, which is always available during normal operation. Deep Power-Down Mode automatically stops at Power-Down, and the device always Power-up in the Standby Mode. /CS tDP Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 DI Instruction B9h Stand-by Current Power-down Current Figure 22. Deep Pwer-down Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 37 FM25Q16B 10.22 Release Deep Power-down / Device ID (ABh) The Release from Deep Power-down / Device ID instruction is a multi-purpose instruction. It can be used to release the device from the Deep Power-down state or obtain the device electronic identification (ID) number. To release the device from the Deep Power-down state, the instruction is issued by driving the /CS pin low, sending the instruction code “ABh” and driving /CS high as shown in figure 23a. Release from Deep Power-down require the time duration of tRES1 (See AC Characteristics) for re-work a normal operation and accepting other instructions. The /CS pin must keep high during the tRES1 time duration. When used only to obtain the Device ID while not in the Deep Power-down state, instruction is initiated by driving the /CS pin low and sending the instruction code “ABh” with follwing3-dummy bytes. The Device ID bits are then shifted on the falling edge of CLK with most significant bit (MSB) first as shown in figure 23b. The Device ID value for the FM25Q16B is listed in Manufacturer and Device Identification table. The Device ID can be read continuously. The instruction is completed by driving /CS high. When used to release the device from the Deep Power-down state and obtain the Device ID, the instruction is the same as previously described, and shown in figure 23b, except that after /CS is driven high it must keep high for a time duration of tRES2 (See AC Characteristics). After this time duration the device will resume normal operation and other instructions can be accepted. If the Release from Deep Power-down /Device ID instruction is issued while an Erase, Program or Write cycle is in process (when BUSY equals 1) the instruction is ignored and will not have any effects on the current cycle. /CS tRES1 1 0 Mode 3 2 4 3 5 6 7 CLK Mode 0 Instruction ABh DI Power-down Current Stand-by Current Figure 23a. Release Deep Power-down Instruction Sequence /CS Mode 3 0 1 2 3 4 5 6 7 8 9 10 Mode 0 Instruction ABh 29 30 31 32 33 22 21 3 35 36 37 38 39 tRES2 2 1 0 MSB High - Z Device ID (14h) DO 34 3 Dummy Bytes 23 DI 28 CLK 7 6 5 4 3 2 1 0 MSB Power-down Current Stand-by Current Figure 23b. Release Deep Power-down / Device ID Instruction Sequence Diagram Rev.01 (Nov.16. 2011) 38 FM25Q16B 10.23 Read Manufacturer/ Device ID (90h), (EFh), (DFh) The Read Manufacturer/ Device ID instruction is an alternative to the Release from Deep Powerdown / Device ID instruction that provides both the JEDEC assigned manufacturer ID and the specific device ID. The Read Manufacturer/ Device ID instruction is very similar to the Release from Deep Powerdown / Device ID instruction. The instruction is initiated by driving the /CS pin low and shifting the instruction code “90h” with following a 24-bit address (A23-A0) of 000000h. The instruction code of “EFh” is used for Dual I/O and the instruction code of “DFh” is used for Quad I/O with same instruction sequence. After then, the Manufacturer ID for FIDELIX (F8h) and the Device ID are shifted out on the falling edge of CLK with most significant bit(MSB) first as shown in figure 24a, 24b or 24c. The Device ID value for the FM25Q16B is listed in Manufacturer and Device Identification table. If the 24-bit address is initially set to 000001h the Device ID will be read first with following the Manufacturer ID. The Manufacturer and Device IDs can be read continuously, alternating from one to the other. The instruction is completed by driving/CS high. /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 28 29 30 31 CLK Mode 0 24 Bit Address 000000h or 000001h Instruction 90h DI 23 22 21 3 2 1 0 MSB High - Z DO /CS 32 33 34 35 36 37 38 39 40 41 42 43 45 44 46 47 CLK DI Manufacturer ID (F8h) DO 7 MSB 6 5 4 3 2 Device ID (14h) 1 0 7 6 5 4 3 2 1 0 MSB Figure 24a. Read Manufacturer/ Device ID Diagram Rev.01 (Nov.16. 2011) 39 FM25Q16B /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 12 13 14 15 CLK Mode 0 Instruction 24 Bit Address 22 23 EFh DI 21 3 2 1 0 36 37 38 39 High - Z DO /CS 24 25 26 27 28 29 30 31 32 33 34 35 CLK DI Switches from Input to Output DO 6 4 2 0 7 5 3 1 MSB 6 4 2 0 7 5 3 1 MSB Manufacturer ID (F8h) 6 4 2 0 7 5 3 1 Device ID (14h) 6 4 2 0 6 7 5 3 1 7 MSB MSB Manufacturer ID (F8h) DI Device ID (14h) Figure 24b. Read Dual Manufacturer/ Device ID Diagram /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 12 13 14 15 CLK Mode 0 Instruction DFh IO1 High - Z IO2 High - Z IO3 High - Z 24 Bit Address 23 22 21 IO0 3 2 1 0 /CS 20 21 22 23 24 25 26 27 CLK IOs Switches from Input to Output IO0 4 0 4 0 4 0 4 0 IO1 5 1 5 1 5 1 5 1 IO2 6 2 6 2 6 2 6 2 7 3 7 3 7 3 7 3 IO3 Manufacturer ID (F8h) Device ID (14h) Manufacturer ID (F8h) Device ID (14h) Figure 24c. Read Quad Manufacturer/ Device ID Diagram Rev.01 (Nov.16. 2011) 40 FM25Q16B 10.24 JEDEC ID (9Fh) For compatibility reasons, the FM25Q16B provides several instructions to electronically determine the identity of the device. The Read JEDEC ID instruction is congruous with the JEDEC standard for SPI compatible serial flash memories that was adopted in 2003. The instruction is entered by driving the /CS pin low with following the instruction code “9Fh”. JEDEC assigned Manufacturer ID byte for FIDELIX (F8h) and two Device ID bytes, Memory Type(ID-15-ID8) and Capacity (ID7-ID0) are then shifted out on the falling edge of CLK with most significant bit (MSB) first shown in figure 25. For memory type and capacity values refer to Manufacturer and Device Identification table. The JEDEC ID can be read continuously. The instruction is terminated by driving/CS high. /CS 1 0 Mode 3 2 4 3 5 6 7 8 9 10 12 11 13 14 15 CLK Mode 0 Instruction 9Fh DI Manufacturer ID High - Z F8h DO /CS 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 CLK DI Memory Type ID15 - 8 DO Capacity Type ID7 - 0 32h 15h Figure 25. Read JEDEC ID Rev.01 (Nov.16. 2011) 41 FM25Q16B 10.25 Mode Bit Reset (FFh) To lessen the effect of instruction overhead, Mode Bit Reset (FFh) can be applied to. In Fast Read Dual/Quad I/O operations, the BBh / EBh instruction is not required if the Mode Bits (M7-0) are set “Ax” hex. (See 11.2.10 Fast Read Dual I/O and 11.2.11 Fast Read Quad I/O for detail descriptions). If the system controller is reset during operation, the flash device will return to the standard SPI operation. Upon Reset of main chip, SPI instruction like Read ID (9Fh) or Fast Read (0Bh) would be sent from the system. FM25Q16B does not have a hardware reset pin like most of other SPI memory. For this reason, FM25Q16B will be put in the unrecognized status for any standard SPI instruction if Mode bits are set to “Ax” hex upon reset. To address this issue, it is recommended to set a Mode bit Reset instruction “FFh” for the first instruction once a system reset. This instruction can ensure the device to allow Standard SPI instruction to be accepted. (Please refer to figure 26). /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 Instruction IO0 FFh IO1 Dont’care IO2 Dont’care IO3 Dont’care Figure 26. Mode Bits Reset for Fast Read Dual/Quad I/O Rev.01 (Nov.16. 2011) 42 FM25Q16B 10.26 Enter Secured OTP (B1h) The Enter Secured OTP instruction is for entering the additional 4K-bit secured OTP mode. The additional 4K-bit secured OTP is independent from main array, which may be used to store unique serial number for system identifier. After entering the Secured OTP mode, and then follow standard read or program, procedure to read out the data or update data. The Secured OTP data cannot be updated again once it is lock-down Please note that WRSR/WRSCUR commands are not acceptable during the access of secure OTP region, once security OTP is lock down, only commands related with read are valid. (Please refer to figure 27). /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 Instruction B1h DI Figure 27. Enter Secured OTP instruction sequence 10.27 Exit Secured OTP (C1h) The Exit Secured OTP instruction is for exiting the additional 4K-bit secured OTP mode. (Please refer to figure 28). /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 DI Instruction C1h Figure 28. Exit Secured OTP instruction sequence Rev.01 (Nov.16. 2011) 43 FM25Q16B 10.28 Read Security Register (2Bh) The Read Security Register instruction is for reading the value of Security Register bits. The Read Security Register can be read at any time (even in program/erase/write status register condition) and continuously. The definition of the Security Register bits is as below: Secured OTP Indicator bit. The Secured OTP indicator bit shows the chip is locked by factory before ex-factory or not. When it is “0”, it indicates non-factory lock, “1” indicates factory-lock. Lock-down Secured OTP (LDSO) bit. By writing WRSCUR instruction, the LDSO bit may be set to “1” for customer lock-down purpose. However, once the bit it set to “1” (Lock-down), the LDSO bit and the 4K-bit Secured OTP area cannot be updated any more. While it is in 4K-bit Secured OTP mode, array access is not allowed to write. /CS Mode 3 1 0 2 4 3 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 CLK Mode 0 Instruction 2Bh DI Security Register Out High - Z DO 7 6 5 4 3 2 MSB Security Register Out 1 0 7 6 5 4 3 2 1 0 MSB Figure 29. Read Security Register instruction sequence Security Register Definition Bit7 Bit6 Bit5 Bit4 Bit3 Bit2 x x x x x x reserved reserved reserved reserved reserved reserved Volatile bit Volatile bit Volatile bit Volatile bit Volatile bit Volatile bit Bit1 LDSO (indicate if lock-down) 0 = not lockdown 1 = lockdown(cannot program/erase OTP) Bit0 Secured OTP indicator bit 0 = non factory lock 1 = factory lock NonVolatile bit NonVolatile bit Rev.01 (Nov.16. 2011) 44 FM25Q16B 10.29 Write Security Register (2Fh) The Write Security Register instruction is to change the value of Security Register bits. Even it is writing command, it does not require WREN instruction prior to writing WRSCUR instruction. The WRSCUR instruction may change the value of bit1 (LDSO bit) for customer to lock-down the 4K-bit Secured OTP area. If the LDSO bit is set to “1”, the Secured OTP area cannot be updated any more. To accept the instruction, /CS must keep high at the boundary. /CS Mode 3 0 1 2 3 4 5 6 7 CLK Mode 0 DI Instruction 2Fh Figure 30. Write Security Register instruction sequence Rev.01 (Nov.16. 2011) 45 FM25Q16B 11. 4K-bit Secured OTP It’s for unique identifier to provide 4K-bit one-time-program area for setting device unique serial number which may be set by factory or system customer. Please refer to table of “4K-bit secured OTP definition”. - Security register bit 0 indicates whether the chip is locked by factory or not. - To program the 4K-bit secured OTP by entering 4K-bit secured OTP mode (with ENSO command) and going through normal program procedure, and then exiting 4K-bit secured OTP mode by writing EXSO command - Customer may lock-down bit1 as “1”. Please refer to “table of security register definition” for security register bit definition and table of “4K-bit secured OTP definition” for address range definition. - Note. Once lock-down whatever by factory or customer, it cannot be changed any more. While in 4K-bit secured OTP mode, array access is not allowed to write. 4K-bit secured OTP definition Address range Size 000000 ~ 00000F 128-bit 000010 ~ 0001FF 3968-bit Standard Factory Lock ESN (Electrical Serial Number) N/A Customer Lock Determined by customer Rev.01 (Nov.16. 2011) 46 FM25Q16B 12. ELECTRICAL CHARACTERISTICS 12.1 Absolute Maximum Ratings (1) PARAMETERS SYMBOL Supply Voltage VCC Voltage Applied to Any Pin VIO Transient Voltage on any Pin VIOT CONDITIONS RANGE UNIT -0.6 to +4.0 V Relative to Ground -0.6 to VCC +4.0 V <20nS Transient -2.0V to VCC +2.0V V ˚C Relative to Ground Storage Temperature TSTG -65 Lead Temperature TLEAD See Note ˚C Electrostatic Discharge VESD -2000 to +2000 V (2) Human Voltage to +150 Body Model (3) Notes: 1. This device has been designed and tested for the specified operation ranges. Proper operation outside of these levels is not guaranteed. Exposure to absolute maximum rating may affect device reliability. Exposure beyond absolute maximum ratings may cause permanent damage. 2. Compliant with JEDEC Standard J-STD-20C for small body Sn-Pb or Pb-free (Green) assembly and the European directive on restrictions on hazardous substances (RoHS) 2002/95/EU. 3. JEDEC Std JESD22-A114A (C1=100pF, R1=1500ohms, R2=500 ohms). 12.2 Operating Ranges SPEC PARAMETER SYMBOL CONDITIONS UNIT MIN MAX Supply Voltage VCC FR =85㎒, fR = 50㎒, 2.7 3.6 V Temperature,Operating Tj Industrial -40 +85 ˚C MIN MAX UNIT 12.3 Endurance and Data Retention PARAMETER CONDITIONS Erase/Program Cycles 4KB sector, 32/64KB block or full chip. Data Retention Full Temperature Range 100,000 Cycles 20 Rev.01 (Nov.16. 2011) years 47 FM25Q16B 12.4 Power-up Timing and Write Inhibit Threshold SPEC PARAMETER SYMBOL UNIT MIN VCC(min) to /CS Low tVSL (1) Time Delay Before Write Instruction tPUW Write Inhibit Threshold Voltage VWI MAX ㎲ 10 (1) (1) 1 10 ㎳ 1 2 V Note: 1. These parameters are characterized only. VCC VCC(max) Program. Erase and Write Instructions are Ignored /CS Must Track VCC VCC(min) Reset State tVSL Read Instructions Allowed Device is Fully Accessible VWI tPUW Time Figure 31. Power-up Timing and Voltage Levels Rev.01 (Nov.16. 2011) 48 FM25Q16B 12.5 DC Electrical Characteristics SPEC PARAMETER SYMBOL CONDITION UNIT MIN Input Capacitance (1) CIN VIN=0V (1) TYP (2) 6 ㎊ 8 ㎊ Output Capacitance COUT Input Leakage ILI ±2 ㎂ I/O Leakage ILO ±2 ㎂ 10 50 ㎂ 1 5 ㎂ 4/5/6 6/7.5/9 ㎃ 6/7/8 9/10.5/12 ㎃ 7/8/9 10/12/13.5 ㎃ 10/11/12 15/16.5/18 ㎃ Standby Current VOUT=0V (2) MAX /CS=VCC, ICC1 VIN=GND or VCC Deep Power-down /CS=VCC, ICC2 Current VIN=GND or VCC Current Read Data/ (2) C=0.1 VCC / 0.9VCC ICC3 Dual/Quad 1㎒ IO=Open Current Read Data/ (2) C=0.1 VCC / 0.9VCC ICC3 Dual/Quad 33㎒ IO=Open Current Read Data/ (2) C=0.1 VCC / 0.9VCC ICC3 Dual/Quad 50㎒ IO=Open Current Read Data/ (2) C=0.1 VCC / 0.9VCC ICC3 Dual/Quad 85㎒ IO=Open Current Write ICC4 /CS=VCC 8 12 ㎃ ICC5 /CS=VCC 20 25 ㎃ ICC6 /CS=VCC 20 25 ㎃ Current Chip Erase ICC7 /CS=VCC 20 25 ㎃ Input Low Voltages VIL -0.5 VCC x0.2 V Input High Voltages VIH VCC x0.8 VCC +0.4 V Output Low Voltages VOL IOL=1.6㎃ 0.4 V VOH IOH=-100㎂ Status Register Current page Program Current Sector/Block Erase Output VCC -0.2 V High Voltages Notes: 1. Tested on sample basis and specified through design and characterization data, TA = 25˚C, VCC = 3V. 2. Checked Board Pattern. Rev.01 (Nov.16. 2011) 49 FM25Q16B 12.6 AC Measurement Conditions SPEC PARAMETER SYMBOL UNIT MIN Load Capacitance Input Rise and Fall Times MAX CL 30 ㎊ TR, TF 5 ㎱ Input Pulse Voltages VIN 0.2 VCC to O. 8 VCC V Input Timing Reference Voltages IN 0.3 VCC to O. 7 VCC V OUT 0.5 VCC to O. 5 VCC V Output Timing Reference Voltages Note: 1. Output Hi-Z is defined as the point where data out is no longer driven. Input Levels Input and Output Timing Reference Levels 0.8 VCC 0.5 VCC 0.2 VCC Figure 32. AC Measurement I/O Waveform Rev.01 (Nov.16. 2011) 50 FM25Q16B 12.7 AC Electrical Characteristics SPEC DESCRIPTION SYMBOL ALT UNIT MIN TYP MAX Clock frequency FR fc D.C. 85 ㎒ FR fc D.C. 104 ㎒ FR D.C. 50 ㎒ Clock High, Low Time for Read Data (03h) tCRLH, 6 ㎱ instructions tCRLL Clock Rise Time (Slew Rate) tCLCH (2) 0.1 V/㎱ (2) 0.1 V/㎱ 7 ㎱ 5 ㎱ For all instructions, except Read Data (03h) 2.7V-3.6V VCC & Industrial Temperature Clock frequency For all instructions, except Read Data (03h) 3.0V-3.6V VCC & Commercial Temperature Clock freq. Read Data instrunction (03h) Clock Fall Time (Slew Rate) (1) tCHCL /CS Active Setup Time relative to CLK tSLCH tCSS /CS Not Active Hold Time relative to CLK tCHSL Data In Setup Time tDVCH tDSU 4 ㎱ Data In Hold Time tCHDX tDH 4 ㎱ /CS Active Hold Time relative to CLK tCHSH 7 ㎱ /CS Not Active Setup Time relative to CLK tSHCH 7 ㎱ /CS Deselect Time (for Read instructions/ Write, tSHSL 10/40 ㎱ tCSH Erase and Program instructions) (2) tDIS 7 ㎱ tCLQV tV 7/6 ㎱ Output Hold Time tCLQX tHO /Hold Active Setup Time relative to CLK tHLCH Output Disable Time tSHQZ Clock Low to Output Valid 2.7V-3.6V / 3.0V-3.6V 0 ㎱ 7 ㎱ Rev.01 (Nov.16. 2011) 51 FM25Q16B 12.8 AC Electrical Characteristics (cont’d) SPEC DESCRIPTION SYMBOL ALT UNIT MIN TYP MAX /HOLD Active Hold Time relative to CLK tCHHH 5 ㎱ /HOLD Not Active Setup Time relative to CLK tHHCH 7 ㎱ /HOLD Not Active Hold Time relative to CLK tCHHL 5 ㎱ (2) tLZ 7 ㎱ (2) tHZ 12 ㎱ /HOLD to Output Low-Z tHHQX /HOLD to Output High-Z tHLQZ Write Protect Setup Time Before /CS Low tWHSL Write Protect Setup Time After /CS High /CS High to Deep Power-down Mode /CS High to Standby Mode without Electronic (3) 20 ㎱ (3) 100 ㎱ tSHWL (2) 3 ㎲ tRES1 (2) 3 ㎲ tRES2 (2) 1.8 ㎲ 20 ㎲ tDP Signature Read /CS High to Standby Mode with Electronic Signature Read /CS High to next Instruction after Suspend (2) tSUS Write Status Register Time tw 10 15 ㎳ Byte Program Time tBP 10 150 ㎲ Page Program Time tPP 1.2 5 ㎳ Sector Erase Time(4KB) tSE 40 300 ㎳ Block Erase Time(32KB) tBE1 200 1000 ㎳ Block Erase Time(64KB) tBE2 300 1500 ㎳ Chip Erase Time FM25Q16B tCE 8 50 s Notes: 1. Clock high + Clock low must be less than or equal to 1/fc. 2. Value guaranteed by design and/or characterization, not 100% tested in production. 3. Only applicable as a constraint for a Write Status Register instruction when Sector Protect Bit is set to 1. 4. Commercial temperature only applies to Fast Read (FR1 & FR2). Industrial temperature applies to all other parameters. Rev.01 (Nov.16. 2011) 52 FM25Q16B 12.9 Serial Output Timing 12.10 Input Timing 12.11 Hold Timing Rev.01 (Nov.16. 2011) 53 FM25Q16B 13. PACKAGE SPECIFICATION 13.1 8-Pin SOIC 150-mil MILLIMETERS INCHES SYMBOL MIN MAX MIN MAX A 1.47 1.72 0.058 0.068 A1 0.10 0.24 0.004 0.009 A2 1.45 0.057 b 0.33 0.50 0.013 0.020 C 0.19 0.25 0.0075 0.098 4.8 4.95 0.189 0.195 5.8 6.19 0.228 0.244 3.8 4.00 0.150 0.157 (3) D E E1 e (3) (2) 1.27BSC 0.050 BSC L 0.40 1.27 0.015 0.050 θ 0˚ 8˚ 0˚ 8˚ y --- 0.076 --- 0.003 Notes: 1. Controlling dimensions: inches, unless otherwise specified. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. Rev.01 (Nov.16. 2011) 54 FM25Q16B 13.2 8-Pin SOIC 208-mil MILLIMETERS INCHES SYMBOL MIN MAX MIN MAX A 1.75 2.16 0.069 0.085 A1 0.05 0.25 0.002 0.010 A2 1.70 1.91 0.067 0.075 b 0.35 0.48 0.014 0.019 C 0.19 0.25 0.007 0.010 D 5.18 5.38 0.204 0.212 E 7.70 8.10 0.303 0.319 E1 5.18 5.38 0.204 0.212 e 1.27 BSC 0.050 BSC L 0.50 0.80 0.020 0.031 θ 0˚ 8˚ 0˚ 8˚ y --- 0.10 --- 0.004 Notes: 1. Controlling dimensions: inches, unless otherwise specified. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. Formed leads shall be planar with respect to one another within. 0004 inches at the seating plane. Rev.01 (Nov.16. 2011) 55 FM25Q16B 13.3 8-Pin VSOP 208-mil MILLIMETERS INCHES SYMBOL MIN TYP. MAX A --- --- 1.00 A1 0.05 0.10 A2 0.75 b 0.35 c IN TYP. MAX --- --- 0.039 0.15 0.002 0.004 0.006 0.80 0.85 0.030 0.031 0.033 0.42 0.48 0.014 0.017 0.019 0.127 REF. 0.005 REF. D 5.18 5.28 5.38 0.204 0.208 0.212 E 7.70 7.90 8.10 0.303 0.311 0.319 E1 5.18 5.28 5.38 0.204 0.208 0.212 e --- 1.27 --- --- 0.050 --- L 0.50 0.65 0.80 0.020 0.026 0.031 y --- --- 0.10 --- --- 0.004 θ 0˚ --- 8˚ 0˚ --- 8˚ Notes: 1. JEDEC outline : N/A. 2. Dimension “D”, “D1” does not include mold flash, mold flash shall not exceed 0.006 [0.15mm] per end. Dimension “E”, “E1” does not include inter lead flash. Inter lead flash shall not exceed 0.010 [0.25mm] per side. 3. Dimension “b” does not include dambar protrusion. Allowable dambar protrusion shall be 0.003 [0.08mm]. Rev.01 (Nov.16. 2011) 56 FM25Q16B 13.4 8-Pin PDIP 300-mil Dimension in inch Dimension in min SYMBOL MIN Nom MAX MIN Nom MAX A --- --- 0.210 --- --- 5.334 A1 0.015 --- --- 0.381 --- --- A2 0.125 0.130 0.135 3.18 3.30 3.43 B 0.016 0.018 0.022 0.41 0.46 0.56 B1 0.058 0.060 0.064 1.47 1.52 1.63 c 0.008 0.010 0.014 0.20 0.25 0.36 D 0.360 0.365 0.370 9.14 9.27 9.40 E 0.290 0.300 0.310 7.37 7.62 7.87 E1 0.245 0.250 0.255 6.22 6.35 6.48 e1 0.090 0.100 0.110 2.29 2.54 2.79 L 0.120 0.130 0.140 3.05 3.30 3.56 α 0 --- 15 0 --- 15 eA 0.335 0. 55 0 375 8.51 9 02 9.53 S --- --- 0.045 --- --- 1.14 Rev.01 (Nov.16. 2011) 57 FM25Q16B 13.5 8-contact 6x5 WSON MILLIM ERS INCHES SYMBOL MIN TYP. MAX MIN TYP. MAX A 0.70 0.75 0.80 0.0276 0.0295 0.0315 A1 0.00 0.02 0.05 0.0000 0.0008 0.0019 A2 0.55 0.0126 A3 0.19 0.20 0.25 0.0075 0.0080 0.0098 b 0.36 0.40 0.48 0.0138 0.0157 0.0190 (3) D 5.90 6.00 6.10 0.2320 0.2360 0.2400 D1 3.30 3.40 3.50 0.1299 0.1338 0.1377 E 4.90 5.00 5.10 0.1930 0.1970 0.2010 4.20 4.30 4.40 0.1653 0.1692 0.1732 E1 e (3) (2) 1.27 BSC K 0.20 L 0.50 0.0500 BSC 0.0080 0.60 0.75 0.0197 0.0236 0.0295 Rev.01 (Nov.16. 2011) 58 FM25Q16B 13.6 8-contact 6x5 WSON Cont’d. MILLIMETERS INCHES SYMBOL MIN TYP. MAX MIN TYP. MAX SOLDER PATTERN M 3.40 0.1338 N 4.30 0.1692 P 6.00 0.2360 Q 0.50 0.0196 R 0.75 0.0255 Notes: 1. Advanced Packaging Information; please contact Fidelix Co., Ltd. for the latest minimum and maximum specifications. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. The metal pad area on the bottom center of the package is connected to the device ground (GND pin). Avoid placement of exposed PCB bias under the pad. Rev.01 (Nov.16. 2011) 59 FM25Q16B 13.7 16-Pin SOIC 300-mil MILLIMETERS INCHES SYMBOL MIN MAX MIN MAX A 2.36 2.64 0.093 0.104 A1 0.10 0.30 0.005 0.012 b 0.33 0.51 0.013 0.020 C 0.18 0.28 0.007 0.000 10.08 10.49 0.397 0.413 10.01 10.64 0.394 0.419 7.39 7.59 0.291 0.299 (3) D E E1 e (3) (2) 1.27BSC 0.050 L 0.39 1.27 0.015 0.050 θ 0˚ 8˚ 0˚ 8˚ y --- 0.076 --- 0.003 Notes: 1. Controlling dimensions: inches, unless otherwise specified. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. Rev.01 (Nov.16. 2011) 60 FM25Q16B 13.8 24Ball TFBGA Rev.01 (Nov.16. 2011) 61 FM25Q16B 14. ORDERING INFORMATION FM XXXXX X - X X X X X X Fidelix Memory Packing Type Product Family T : Tube (Standard) R : Tape and Reel Y : Tray * Package NO Marking 25 : SPI Business Package Type Organization 1 : 8 Pin 208 mil SOIC S : Single - 3.0V 2 : 16 Pin 300 mil SOIC D : Dual - 3.0V 3 : 8 Pin 300 mil PDIP Q : Quad - 3.0V 4 : 8 Contact 6x5 WSON Y : Single - 1.8V 5 : 8 Pin 150 mil SOIC E : Dual - 1.8V 6 : 8 Contact 8x6 WSON M : Quad - 1.8V 7 : 8 Pin VSOP 8 : 24 ball TFBGA W : Wafer Device Depth 04 : 4M 08 : 8M 16 : 16M 32 : 32M 64 : 64M 4A : 128M Core / IO Voltage A : 3.0V / 3.0V B : 1.8V / 1.8V Temperature I (Industrial) : -40℃~85℃ C (Commercial) : 0℃~70℃ Generation Speed A : 1st 85 : 85MHz 1A : 104MHz B : 2nd C : 3rd Rev.01 (Nov.16. 2011) 62