FM25S16 - FIDELIX

FM25S16
FM25S16
16M-BIT
Serial Flash Memory with 4KB Sectors, Single I/O SPI
Rev.07 (Mar.18. 2011)
1
FM25S16
Documents title
16M bit Serial Flash Memory with 4KB Sectors, Single I/O SPI
Revision History
Revision
No.
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
History
Draft date
Remark
Initial Draft
Correct typo.
Memory Status Register Memory Protection
FEATURES
DC Electrical Characteristics
Input Low Voltages(Vcc x 0.2)
Input High Voltages(Vcc x 0.8)
Instruction Set Table 1
Operating Ranges
CS Active Setup Time
CS Active Hold Time
Revision No Change
Revision History Change
Correct typo.
Write Status Register (01h)
previous bits => cleared to 0 Change
Read instructions tSHSL20ns => 10ns Change
Added ‘Clock freq. Read Data instruction (03h)’
Jul.03,2009
Aug.07.2009
preliminary
preliminary
Jun.18.2010
Final
Jun.29.2010
Final
Jul.22.2010
Final
Jul.30.2010
Final
Aug.18.2010
Final
Mar.18.2011
Final
Rev.07 (Mar.18. 2011)
2
FM25S16
Table of Contents
1.
GENERAL DESCRIPTION................................................................................................................5
2.
FEATURES........................................................................................................................................5
3.
PIN CONFIGURATION 8-Pin SOIC 150-MIL/208-MIL......................................................................6
4.
PAD CONFIGURATION 8-Contact WSON 6X5-MM.........................................................................6
5.
PIN CONFIGURATION PDIP 300-MIL ………………………………….……………...........................6
6.
PIN DESCRIPTION SOIC 208-MIL , PDIP 300-MIL and WSON 6X5 MM……………......................7
7.
PIN CONFIGURATION 8-Pin SOIC 300-MIL....................................................................................7
8.
PIN DESCRIPTION SOIC 300-MIL…................................................................................................8
8.1
Package Type.................................................................................................................9
8.2
Chip Select (/CS)............................................................................................................9
8.3
Serial Data Input / Output ……………………………………………….............................9
8.4
Write Protect (/WP).........................................................................................................9
8.5
HOLD (/HOLD).............................................................................................................. 9
8.6
Serial Clock (CLK)..........................................................................................................9
9.
BLOCK DIAGRAM...........................................................................................................................10
10.
FUNCTION DESCRIPTION.............................................................................................................11
10.1
10.2
SPI OPERTATIONS.......................................................................................................11
10.1.1
Standard SPI Instructions...............................................................................11
10.1.2
Dual SPI Instructions......................................................................................11
10.1.3
Quad SPI Instructions.....................................................................................11
10.1.4
Hold Function.................................................................................................11
WRITE PROT ECTION........ ..............................................................12
10.2.1
11.
Write Protect Features…................................................................................12
CONTROL AND STATUS REGISTERS…………...........................................................................13
11.1
11.2
STATUS REGISTER.....................................................................................................13
11.1.1
BUSY..............................................................................................................13
11.1.2
Write Enable Latch (WEL)..............................................................................13
11.1.3
Block Protect Bits (BP2, BP1, BP0)................................................................13
11.1.4
Top/Bottom Block Protect (TB).......................................................................13
11.1.5
Sector/Block Protect (SEC)............................................................................13
11.1.6
Status Register Protect (SRP1, SRP0)..........................................................14
11.1.7
Erase Suspend Status (SUS)………………………………..………………..……14
11.1.8
Quad Enable (QE)………………………..........................................................14
11.1.9
Status Register Memory Protection..............................................................16
INSTRUCTIONS........................................................................................................... 17
11.2.1
Manufacturer and Device Identification......................................................... 17
11.2.2
Instruction Set Table1................................................................................... 18
11.2.3
Instruction Set Table2................................................................................... 19
11.2.4
Write Enable (06h)……………………………………….………….……..……. 20
11.2.5
Write Disable (04h)……………………………………………….….................. 20
11.2.6
Read Status Register-1(05h) and Read Status Register-2 (35h)...……........ 21
11.2.7
Write Status Register (01h)………………………………………..................... 22
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FM25S16
11.2.8
Read Data (03h)………………………………………………….....................23
11.2.9
Fast Read (0Bh)……………………….……………........................................24
11.2.10
Fast Read Dual I/O (BBh)….……….….……..…………….………............... .25
11.2.11
Fast Read Quad I/O (EBh)………….….……..…………….………............... 27
11.2.12
Page Program (02h)….……………….….……………………....................... 29
11.2.13
Quad Data Input Page Program (32h)….……..…………..…....................... 30
11.2.14
Quad Data Page Program (38h)….………..…..…………..…....................... 31
11.2.15
Sector Erase (20h)….…………………………………….…........................... 32
11.2.16
32KB Block Erase (52h)….…………………………………........................... 33
11.2.17
64KB Block Erase (D8h)….…………………………..……............................ 34
11.2.18
Chip Erase (C7 / 60h)….………………………………………........................35
11.2.19
12.
13.
14.
Erase Suspend (75h)….….……………………...................... 36
11.2.20
Erase Resume (7Ah) ….…………………………....................... 36
11.2.21
Power-down (B9h)….………………………………………............................ 37
11.2.22
Release Power-down / Device ID (ABh).......................................................38
11.2.23
Read Manufacturer / Device ID (90h,EFh,DFh)….…………….………….... 40
11.2.24
JEDEC ID (9Fh)….…………....................................................................... 43
11.2.25
Mode Bit Reset (FFh)….……………........................................................... 44
11.2.26
Enter Secured OTP (B1h)….………........................................................... 45
11.2.27
Exit Secured OTP (C1h)….………............................................................. 45
11.2.28
Read Security Register (2Bh)..……........................................................... 46
11.2.29
Write Security Register (2Fh)….……..................................................... 47
11.2.30
4K-bit Secured OTP................................................................................... 48
ELECTRICAL CHARACTERISTICS …………………....................................................................49
12.1
Absolute Maximum Ratings..........................................................................................49
12.2
Operating Ranges........................................................................................................ 49
12.3
Endurance and Data Retention……………….............................................................. 50
12.4
Power-up Timing and Write Inhibit Threshold...............................................................50
12.5
DC Electrical Characteristics.........................................................................................51
12.6
AC Measurement Conditions........................................................................................ 52
12.7
AC Electrical Characteristics......................................................................................... 53
12.8
AC Electrical Characteristics (cont’d)………………......................................................54
12.9
Serial Output Timing.....................................................................................................55
12.10
Input Timing................................................................................................................ 55
12.11
Hold Timing................................................................................................................. 55
PACKAGE SPECIFICATION........................................................................................................ 56
13.1
8-Pin SOIC 150-mil …………………….........................................................................56
13.2
8-Pin SOIC 208-mil …………………….........................................................................57
13.3
8-Pin PDIP 300-mil ..................................................................................................... 58
13.4
8-contact 6x5 WSON................................................................................................... 59
13.5
8-contact 6x5 WSON Cont’d........................................................................................ 60
13.6
16-Pin SOIC 300-mil.................................................................................................... 61
ORDERING INFORMATION..........................................................................................................62
Rev.07 (Mar.18. 2011)
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FM25S16
1. GENERAL DESCRIPTION
The FM25S16 Serial Flash memory provides a storage solution for systems with limited space,
pins and power. The 25S series offers flexibility and performance well beyond ordinary Serial Flash
devices. They are ideal for code shadowing to RAM, executing code directly and storing voice, text
and data. The devices operate on a single 2.7V to 3.6V power supply with current consumption as
low as 5mA active and 1μA for power-down. All devices offered in space-saving packages.
The FM25S16 array is organized into 8,192 programmable pages of 256-bytes each. Up to 256
bytes can be programmed at a time using the Page Program instructions. Pages can be erased in
groups of 16 (sector erase) groups of 128 (32KB block erase), groups of 256 (64KB block erase)
or the entire chip (chip erase). The FM25S16 has 1,024 erasable sectors and 64 erasable blocks
respectively. The small 4KB sectors allow for greater flexibility in applications that require data and
parameter storage.
The FM25S16 supports the standard Serial peripheral Interface (SPI). SPI clock frequencies of
up to 104MHz are supported.
A Hold pin, Write protect pin and programmable write protection, with top or bottom array control,
provide further control flexibility. Additionally, the device supports JEDEC standard manufacturer
and device identification with a 4K-bit Secured OTP.
2. FEATURES
● SpiFlash Memory
-FM25S16: 16M-bit / 2M–byte
-256-bytes per programmable page
-4K-bit secured OTP
● Standard SPI
-standard SPI: CLK, /CS, DI, DO, /WP, /Hold
● Highest Performance Serial Flash
-Up to 7X that of ordinary Serial Flash
-104MHz clock operation
-50MB/S continuous data transfer rate
-31MB/S random access (32-byte fetch)
-Comparable to X16 Parallel Flash
● Package Material
-Fidelix all product Green package
Lead-free
RoHS Compliant
Halogen-free
-20-years data retention
-Erase Suspend & Resume
● Low Power, wide Temperature Range
-Single 2.7 to 3.6V supply
-5mA active current, <1μA Power-down (typ.)
--40℃ to +85℃ operating range
● Advanced Security Features
-Software and Hardware Write-protect
-Top or Bottom, Sector or Block selection
-Lock-Down and OTP protection
● Space Efficient Packaging
-8-pin SOIC 150mil
-8-pin SOIC 208mil
-8-pad WSON 6x5-mm
-16-pin SOIC 300-mil
-8-pin DIP 300mil
● Flexible Architecture with 4KB sectors
-Uniform Sector Erase (4K-byte)
-Block Erase (32K and 64K-bytes)
-program one to 256 bytes
-Up to 100,000 erase/write cycles
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FM25S16
3. PIN CONFIGURATION SOIC 150-MIL/208-MIL
/ CS
1
8
VCC
DO(IO 1)
2
7
/HOLD(IO 3)
/ WP(IO 2)
3
6
CLK
GND
4
5
DI(IO0)
Figure 1a. FM25S16 pin Assignments, 8-pin SOIC 208-mil
4. PAD CONFIGURATION WSON 6X5-MM
/CS
1
8
VCC
DO(IO1)
2
7
/HOLD(IO3)
3
6
CLK
4
5
DI(IO0)
/WP(IO2)
GND
Figure 1b. FM25S16 Pad Assignments, 8-pad WSON
5. PIN CONFIGURATION 8-Pin PDIP 300-Mil
/CS
VCC
DO(IO1)
/HOLD(IO3)
/WP(IO2)
CLK
GND
DI(IO0)
Figure 1c. FM25S16 Pin Assignments, 8-pin PDIP 300-mil
Rev.07 (Mar.18. 2011)
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FM25S16
6. PIN DESCRIPTION SOIC 208-MIL, PDIP 300-MIL WSON 6X5-MM
PIN NO.
PIN NAME
I/O
FUCTION
1
/CS
I
Chip Select Input
2
DO(IO1)
I/O
Data Output (Data Input Output 1)*¹
3
/WP(IO2)
I/O
Write Protect Input (Data Input output) *²
4
GND
5
DI(IO0)
I/O
Data Input (Data Input Output 0)*¹
6
CLK
I
Serial Clock Input
7
/HOLD(IO3)
I/O
Hold Input (Data Input output 3) *²
8
VCC
Ground
Power Supply
*1 IO0 and IO1 are used for Dual and Quad instructions
*2 IO0-IO3 are used for Quad instructions
7. PIN CONFIGURATION SOIC 300-MIL
/HOLD(IO3 )
1
16
CLK
VCC
2
15
DI(IO0 )
N/C
3
14
N/C
N/C
4
13
N/C
N/C
5
12
N/C
N/C
6
11
N/C
/CS
7
10
GND
DO(IO1 )
8
9
/WP(IO2 )
Figure 1d. FM25S16 Pin Assignments, 16-pin SOIC 300-mil
Rev.07 (Mar.18. 2011)
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FM25S16
8. PIN DESCRIPTION SOIC 300-MIL
PAD NO.
PAD NAME
I/O
FUCTION
1
/HOLD(IO3)
I/O
2
VCC
Power Supply
3
N/C
No Connect
4
N/C
No Connect
5
N/C
No Connect
6
N/C
No Connect
7
/CS
I
8
DO(IO1)
I/O
Data output (Data Input Output 1)* ¹
9
/WP(IO2)
I/O
Write Protection Input (Data Input Output 2)* ²
10
GND
Ground
11
N/C
No Connect
12
N/C
No Connect
13
N/C
No Connect
14
N/C
No Connect
15
DI(IO0)
I/O
16
CLK
I
Hold Input(Data Input Output 3)* ²
Chip Select Input
Data Input (Data Input Output 0)* ¹
Serial Clock Input
*1 IO0 and IO1 are used for Dual and Quad instructions
*2 IO0_IO3 are used for Quad instructions
Rev.07 (Mar.18. 2011)
8
FM25S16
8.1 Package Types
FM25Q16 is offered in an 8-pin plastic 150-mil width SOIC, 8-pin plastic 208-mil width SOIC, 6x5mm WSON, 8-pin PDIP and 16-pin plastic 300-mil width SOIC as shown in figure 1a, 1b,1c and 1d
respectively. Package diagrams and dimensions are illustrated at the end of this datasheet.
8.2 Chip Select (/CS)
The SPI Chip Select (/CS) pin enables and disables device operation. When /CS is high the device
is deselected and the Serial Data Output (DO, or IO0, IO1, IO2, IO3) pins are at high impedance.
When deselected, the device power consumption will be at standby levels unless an internal erase,
program or write status register cycle is in progress. When /CS is brought low the device will be
selected, power consumption will increase to active levels and instructions can be written to and
read data from the device. After power-up, /CS must transition from high to low before a new
instruction will be accepted. The /CS input must track the VCC supply level at power-up (see “Write
Protection” and figure 30). If needed a pull-up resister on /CS can be used to accomplish this.
8.3 Serial Data Input, Output and IOs (DI, DO and IO0, IO1, IO2, IO3)
The FM25Q16 supports standard SPI, Dual SPI and Quad SPI operation. Standard SPI
instructions use the unidirectional DI (input) pin to serially write instructions, addresses or data to
the device on the rising edge of the Serial Clock (CLK) input pin. Standard SPI also uses the
unidirectional DO (output) to read data or status from the device on the falling edge of CLK.
Dual and Quad SPI instructions use the bidirectional IO pins to serially write instructions,
addresses or data to the device on the rising edge of CLK and read data or status from the device
on the falling edge of CLK. Quad SPI instructions require the non-volatile Quad Enable bit (QE) in
Status Register-2 to be set. When QE=1 the /WP pin becomes IO2 and /HOLD pin becomes IO3.
8.4 Write Protect (/WP)
The Write Protect (/WP) pin can be used to prevent the Status Register from being written. Used in
conjunction with the Status Register’s Block Protect (SEC. TB. BP2, Bp1 and BP0) bits and Status
Register Protect (SRP) bits, a portion or the entire memory array can be hardware protected. The
/WP pin is active low. When the QE bit of Status Register-2 is set for Quad I/O, the /WP pin
(Hardware Write Protect) function is not available since this pin is used for IO2. See figure 1a, 1b,
1c and 1d for the pin configuration of Quad I/O operation.
8.5 HOLD (/HOLD)
The /HOLD pin allows the device to be paused while it is actively selected. When /HOLD is brought
low, while /CS is low, the DO pin will be at high impedance and signals on the DI and CLK pins will
be ignored (don’t care). When /HOLD is brought high, device operation can resume. The /HOLD
function can be useful when multiple devices are sharing the same SPI signals. The /HOLD pin is
active low. When the QE bit of Status Register-2 is set Quad I/O, the /HOLD pin function is not
available since this pin used for IO3. See figure 1a, 1b, 1c and 1d for the pin configuration of Quad
I/O operation.
8.6 Serial Clock (CLK)
The SPI Serial Clock Input (CLK) pin provides the timing for serial input and output operations.
(“See SPI Operations”)
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FM25S16
9. BLOCK DIAGRAM
1FFF 00h
Block Segmentation
1FFFFFh
Block 31 (64KB )
1FF000 h
xxFF 00h
1FF0FFh
xxFFFFh
Sector 15
(4KB)
xxF 000h
xxF0FFh
xxEF 00h
xxEFFFh
Sector 14
(4KB)
xxE 000 h
xxE 0FFh
xxDF 00h
xxDFFFh
Sector 13
(4KB)
xxD 0FFh
xxFFFFh
Sector 2 (4KB)
xx2000 h
xxF0FFh
xx1F00h
xx1FFFh
Sector 1 (4KB)
xx1000 h
xx10FFh
xx0F00h
xx0FFFh
10FF00h
Sector 0 (4KB)
xx0000 h
FM25Q16
xx2F00h
W rite Protect Logic and Row Decode
xxD 000 h
Block 16 (64KB)
100000 h
xx00FFh
0FFF 00h
1000 FFh
0FFFFFh
Block 15 (64KB )
0F0000 h
/WP (IO 2)
Write
Control
Logic
10FFFFh
0F00FFh
08FF00h
08FFFFh
Block 8 (64KB)
080000 h
0800 FFh
07FF00h
07FFFFh
Block 7 (64KB)
070000 h
Status
Register
00FF00h
High Voltage
Generators
/HOLD (IO 3)
CLK
CS
DI (IO 0)
DO (IO 1)
SPI
Command and
Control Logic
Page Address
Latch / Counter
000000 h
0700 FFh
Block 0*
(64KB)
Beginning
Page Address
00FFFFh
0000 FFh
Ending
Page
Address
Column Decode
and 256 Byte Page buffer
Data
Byte Address
Latch / Counter
Rev.07 (Mar.18. 2011)
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FM25S16
10. FUNCTIONAL DESCRIPTION
10.1 SPI OPERATIONS
10.1.1 Standard SPI Instructions
The FM25Q16 is accessed through an SPI compatible bus consisting of four signals: Serial Clock
(CLK). Chip Select (/CS), Serial Data Input (DI) and Serial Data Output (DO). Standard SPI
instructions use the DI input pin to serially write instructions, addresses or data to the device on the
rising edge of CLK. The DO output pin is used to read data or status from the device on the falling
edge of CLK.
SPI bus operation Modes 0 (0, 0) and 3 (1, 1) are supported. The primary difference between
Mode 0 and Mode 3 concerns the normal state of the CLK signal when the SPI bus master is in
standby and data is not being transferred to the Serial Flash. For Mode 0 the CLK signal is
normally low on the falling and rising edges of /CS. For Mode 3 the CLK signal is normally high on
the falling and rising edges of /CS.
10.1.2 Dual SPI Instructions
The FM25Q16 supports Dual SPI operation when using the “Fast Read Dual I/O” (BB hex)
instruction. This instruction allows data to be transferred to or from the device at three to four the
rate ordinary Serial Flash devices. The Dual Read instruction is ideal for quickly downloading code
to RAM upon power-up (code-shadowing) or for executing non-speed-critical code directly from the
SPI bus (XIP). When using Dual SPI instructions the DI and DO pins become bidirectional I/0 pins;
IO0 and IO1.
10.1.3 Quad SPI Instructions
The FM25Q16 supports Quad SPI operation when using the “Fast Read Quad I/O” (EB hex). This
instruction allows data to be transferred to or from the device six to seven times the rate of ordinary
Serial Flash. The Quad Read instruction offers a significant improvement in continuous and
random access transfer rates allowing fast code-shadowing to RAM or execution directly from the
SPI bus (XIP). When using Quad SPI instruction the DI and DO pins become bidirectional IO0 and
IO1, and the /WP and /HOLD pins become IO2 and IO3 respectively. Quad SPI instructions require
the non-volatile Quad Enable bit (QE) in Status Register-2 to be set.
10.1.4 Hold Function
The /HOLD pin is used to pause a serial sequence of the SPI flash memory without resetting the
clocking sequence. To activate the /HOLD mode, the /CS must be in active low state. The /HOLD
mode begins when the CLK in active low state coincides with the falling edge of the /HOLD signal.
The HOLD mode ends when the /HOLD signal’s rising edge coincides with the CLK in active low
state.
If the falling edge of the /HOLD signal does not coincide with the CLK in active low state, then the
device enters HOLD mode when the CLK reaches the next active low state. Similarly, if the rising
edge of the /HOLD signal does not coincide with the CLK in active low state, then the device exits
in HOLD mode when the CLK reaches the next active low state. See Figure.2 for HOLD condition
waveform.
If /CS is driven active high during a HOLD condition, it resets the internal logic of the device. As
long as /HOLD signal is low, the memory remains in the HOLD condition. To resume
communication with the device, /HOLD must be driven active high, and /CS must be driven active
low. See 12.11 for HOLD timing.
Rev.07 (Mar.18. 2011)
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FM25S16
Figure2. Hold condition waveform
10.2 WRITE PROTECTION
Applications that use non-volatile memory must take consideration the possibility of noise and
other adverse system conditions that may compromise data integrity. To address this concern the
FM25Q16 provides several means to protect data from inadvertent writes.
10.2.1 Write protect Features
z
Device resets when VCC is below threshold
z
Time delay write disable after Power-up
z
Write enable/disable instructions and automatic write disable after program and erase
z
Software and Hardware (/WP pin) write protection using Status Register
z
Write Protection using Power-down instruction
z
Lock Down write protection until next power-up
z
One Time Program (OTP) write protection
Upon power-up at power down the FM25Q16 will maintain a reset condition while VCC is below
the threshold value of VWI, (See Power-up Timing and Voltage Levels and Figure 30). While reset,
all operations are disabled and no instruction is recognized. During power-up and after the VCC
voltage exceeds VWI, instructions related with all program and erase are further disabled for a time
delay of tPUW. This includes the write Enable, Page program, Sector Erase, Block Erase, Chip
Erase, Write Security Register and the Write Status Register instructions. Note that the chip select
pin (/CS) must track the VCC supply level at power-up until the VCC-min level and tVSL time delay
is reached. If needed a pull-up resister on /CS can be used to accomplish this.
After power-up the device is automatically placed in a write-disabled state with Status Register
Write Enable Latch (WEL) set to a 0. A Write Enable instruction must be issued before a Page
program, Sector Erase Chip Erase or Write Status Register and then instructions will be accepted.
After completing a program, erase or write instruction the write Enable (WEL) is automatically
cleared to write-disabled state of 0.
Software controlled write protection is facilitated using the Write Status Register instruction and
setting the Status Register protect (SRP) and Block protect (SEC, TB, BP2, BP1, and BP0) bits.
These setting allow a portion or all the memory to be configured as read only. Used in conjunction
with the Write Protect (/WP) pin, changes to the Status Register can be enabled or disabled under
hardware control. See Status Register for further information. Additionally, the Power-down
instruction offers an extra level of write protection as all instructions are ignored except for Release
power-down instruction.
Rev.07 (Mar.18. 2011)
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FM25S16
11. CONTROL AND STATUS REGISTER
The Read Status Register instruction can be used to provide status on the availability of the Flash
memory array, if the device is write enabled or disabled, the state of write protection and the Quad
SPI setting. The Write Status Register instruction can be used to configure the devices write
protection features and Quad SPI setting. Write access to the Status Register is controlled by in
some cases of the /WP pin.
11.1 STATUS REGISTER
11.1.1 BUSY
BUSY is a read only bit in the status register (S0) that is set to a 1 state when the device is
executing a Page Program, Sector Erase, Block Erase, Chip Erase or Write Status Register
instruction. During this time the device will ignore further instruction except for the Read Status
Register and Erase Suspend instruction (see tW, tPP, tSE, tBE1, tBE2 and tCE in AC
Characteristics). When the program, erase or write status register instruction has completed, the
BUSY bit will be cleared to a 0 state indicating the device is ready for further instructions.
11.1.2 Write Enable Latch (WEL)
Write Enable Latch (WEL) is a read only bit in the status register (S1) that is set to a 1 after
executing a Write Enable instruction. The WEL status bit is cleared to a 0, When device is write
disabled. A write disable state occurs upon power-up or after any of the following instructions:
Write Disable, Page Program, Sector Erase, Block Erase, Chip Erase and Write Status Register.
11.1.3 Block Protect Bits (BP2, BP1, BP0)
The Block Protect Bits (BP2, BP1, BP0) are non-volatile read/write bits in the status register (S4,
S3, and S2) that provide write protection control and status. Block protect bits can be set using the
Write Status Register Instruction (see tW in AC characteristics). All none or a portion of the memory
array can be protected from Program and Erase instructions (see Status Register Memory
Protection table). The factory default setting for the Block Protection Bits is 0, none of the array
protected.
11.1.4 Top/Bottom Block protect (TB)
The non-volatile Top/Bottom bit (TB) controls if the Block Protect Bits (BP2, BP1, BP0) protect from
the Top (TB=0) or the Bottom (TB=1) of the array as shown in the Status Register Memory
Protection table. The factory default setting is TB=0. The TB bit can be set with the Write Status
Register Instruction depending on the state of the SRP0, SRP1 and WEL bits.
11.1.5 Sector/Block Protect (SEC)
The non-volatile Sector protect bit (SEC) controls if the Block Protect Bits (BP2, BP1, BP0) protect
4KB Sectors (SEC=1)or 64KB Blocks (SEC=0) in the Top (TB=0) or the Bottom (TB=1) of the array
as shown in the Status Register Memory protection table. The default setting is SEC=0.
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FM25S16
11.1.6 Status Register protect (SRP1, SRP0)
The Status Register Protect bits (SRP1 and SRP0) are non-volatile read/write bits in the status
register (S8 and S7). The SRP bits control the method of write protection: software protection,
hardware protection, power supply lock-down or one time programmable (OTP) protection.
SRP1
SRP0
/WP
Status
Register
Description
0
0
X
Software
Protection
/WP pin no control. The register can be written to
after a Write Enable instruction, WEL=1. [Factory Default]
0
1
0
Hardware
Protected
When /WP pin is low the Status Register locked and can not
be written to.
0
1
1
Hardware
Unprotected
When /WP pin is high the Status register is unlocked and
can be written to after a Write Enable instruction, WEL=1
1
0
X
Power Supply
Lock-Down
Status Register is protected and can not be written to again
(1)
until the next power-down, power-up cycle .
1
1
X
One Time
Program
Status Register is permanently protected and can not be
written to.
Note:
1. When SRP1, SRP0=(1,0), a power-down, power-up cycle will change SRP1, SRP0 to(0,0) state.
11.1.7 Erase Suspend Status (SUS)
The Suspend Status bit is a read only bit in the status register (S15) that is set to 1 after executing
an Erase/Program Suspend (75h) instruction. The SUS status bit is cleared to 0 by Erase/Program
Resume (7Ah) instruction as well as a power-down, power-up cycle.
11.1.8 Quad Enable (QE)
The Quad Enable (QE) bit is a non-volatile read/write bit in the status register (S9) that allows
Quad operation. When the QE bit is set to a 0 state (factory default) the /WP pin and /Hold are
enabled. When the QE pin is set to a 1 the Quad IO2 and IO3 pins are enabled.
WARNING : The QE bit should never be set to a 1 during standard SPI or Dual SPI operation
if the /WP or /HOLD pins are tied directly to the power supply or ground.
Rev.07 (Mar.18. 2011)
14
FM25S16
Figure 3a. Status Register-1
Figure 3b. Status Register-2
Rev.07 (Mar.18. 2011)
15
FM25S16
11.1.9 Status Register Memory Protection
STATUS REGISTER(1)
FM25Q16 (16M-BIT) MEMORY PROTECTION
SEC
TB
BP2
BP1
BP0
BLOCK(S)
ADDRESSES
DENSITY
PROTION
X
X
0
0
0
NONE
NONE
NONE
NONE
0
0
0
0
1
31
1F0000h-1FFFFFh
64KB
Upper 1/32
0
0
0
1
0
30 and 31
1E0000h-1FFFFFh
128KB
Upper 1/16
0
0
0
1
1
28 thru 31
1C0000h-1FFFFFh
256KB
Upper 1/8
0
0
1
0
0
24 thru 31
180000h-1FFFFFh
512KB
Upper 1/4
0
0
1
0
1
16 thru 31
100000h-1FFFFFh
1MB
Upper 1/2
0
1
0
0
1
0
000000h-00FFFFh
64KB
Lower 1/32
0
1
0
1
0
0 and 1
000000h-01FFFFh
128KB
Lower 1/16
0
1
0
1
1
0 thru 3
000000h-03FFFFh
256KB
Lower 1/8
0
1
1
0
0
0 thru 7
000000h-07FFFFh
512KB
Lower 1/4
0
1
1
0
1
0 thru 15
000000h-0FFFFFh
1MB
Lower 1/2
X
X
1
1
X
0 thru 31
000000h-1FFFFFh
2MB
ALL
1
0
0
0
1
31
1FF000h-1FFFFFh
4KB
Top Block
1
0
0
1
0
31
1FE000h-1FFFFFh
8KB
Top Block
1
0
0
1
1
31
1FC000h-1FFFFFh
16KB
Top Block
1
0
1
0
X
31
1F8000h-1FFFFFh
32KB
Top Block
1
1
0
0
1
0
000000h-000FFFh
4KB
Bottom Block
1
1
0
1
0
0
000000h-001FFFh
8KB
Bottom Block
1
1
0
1
1
0
000000h-003FFFh
16KB
Bottom Block
1
1
1
0
X
0
000000h-007FFFh
32KB
Bottom Block
Rev.07 (Mar.18. 2011)
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FM25S16
11.2 INSTRUCTIONS
The instruction set of the FM25Q16 consists of fifteen basic instructions that are fully controlled
through the SPI bus (see Instruction Set table). Instructions are initiated with the falling edge of
Chip Select (/CS). The first byte of data clocked into the DI input provides the instruction code.
Data on the DI input is sampled on the rising edge of clock with most significant bit (MSB) first.
Instructions vary in length from a single byte to several bytes and may be followed by address
bytes, data bytes, dummy bytes (don’t care), and in some cases, a combination. Instructions are
completed with the rising edge of edge /CS. Clock relative timing diagrams for each instruction are
included in figures 4 through 29. All read instructions can be completed after any clocked bit.
However, all instructions that Write, Program or Erase must complete on a byte (/CS driven high
after a full 8-bit have been clocked) otherwise the instruction will be terminated. This feature further
protects the device from inadvertent writes. Additionally, while the memory is being programmed or
erased, or when the Status Register is being written, all instructions except for Read Register will
be ignored until the program or erase cycle has completed.
11.2.1 Manufacturer and Device Identification
MANUFACTRER ID
(M7-M0)
Fidelix Semiconductor Serial Flash
F8h
Device ID
(ID7-ID0)
(ID15-ID0)
Instruction
ABh, 90h
9Fh
FM25Q16
14h
3215h
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FM25S16
11.2.2 Instruction Set Table 1(1)
INSTRUCTION
NAME
BYTE 1
(CODE)
BYTE 2
BYTE 3
BYTE 4
BYTE 5
Write Enable
06h
Write Disable
04h
Read Status Register-1
05h
(S7-S0) (2)
Read Status Register-2
35h
(S15-S8)(2)
Write Status Register
01h
(S7-S0)
(S15-S8)
Page Program
02h
A23-A16
A15-A8
A7-A0
(D7-D0)
Quad Data Input
Page Program(3)
32h
A23-A16
A15-A8
A7-A0
(D7-D0, …)3
Quad Page Program
38h
A23-A0,
(D7-D0)
A15-A8
A7-A0
(D7-D0, …)3
Block Erase (64KB)
D8h
A23-A16
A15-A8
A7-A0
Block Erase (32KB)
52h
A23-A16
A15-A8
A7-A0
Sector Erase (4KB)
20h
A23-A16
A15-A8
A7-A0
ABh
dummy
dummy
dummy
(ID7-ID0) (5)
Read Manufacturer/
Device ID(6)
90h
dummy
dummy
00h or 01h
(M7-M0)
Read Dual Manufacturer/
Device ID(6)
EFh
dummy
dummy
00h or 01h
(M7-M0)
(ID7-ID0)
Read Quad Manufacturer/
Device ID(6)
DFh
dummy
dummy
00h or 01h
(M7-M0…)
(ID7-ID0…)
Write Security Register
2Fh
Read Security Register
2Bh
Enter Secured OTP
B1h
Exit Secured OTP
C1h
Read JEDEC ID
9Fh
(ID7-ID0)
Memory Type
(ID7-ID0)
Capacity
Chip Erase
C7h/60h
Erase Suspend
75h
Erase Resume
7Ah
Power-down
Mode Bit Reset
B9h
(4)
Release power
Device ID
Notes:
1.
2.
BYTE 6
FFh
down/
(ID7-ID0)
(S7-S0)
(M7-M0)
Manufacturer
Data bytes are shifted with Most Significant Bit first. Byte fields with data in parenthesis
“()” indicate data being read from the device on the IO pin.
The Status Register contents will repeat continuously until /CS terminates the instruction.
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FM25S16
3.
4.
5.
6.
Quad Data Input Page Program Input Data
IO0 = (D4, D0 …)
IO1 = (D5, D1 …)
IO2 = (D6, D2 …)
IO3 = (D7, D3 …)
This instruction is recommended when using the Dual or Quad Mode bit feature. See
section 10.2.28 for more information.
The Device ID will repeat continuously until /CS terminates the instruction.
See Manufacturer and Device Identification table for Device ID information.
11.2.3 Instruction Set Table 2 (Read Instructions)
INSTRUCTION
NAME
BYTE 1
(CODE)
BYTE 2
BYTE 3
BYTE 4
BYTE 5
Read Data
03h
A23-A16
A15-A8
A7-A0
(D7-D0)
Fast Read Data
0Bh
A23-A16
A15-A8
A7-A0
dummy
Fast Read Dual I/O
BBh
A23-A8(2)
A7-A0, M7-M0(2)
(D7-D0, …)(1)
Fast Read Quad I/O
EBh
A23-A0, M7-M0(4)
(x,x,x,x, D7-D0,…)(5)
(D7-D0, …)(3)
BYTE 6
(D7-D0)
Notes:
1: Dual Output data
IO0 = (D6, D4, D2, D0)
IO1 = (D7, D5, D3, D1)
2: Dual Input Address
IO0 = A22, A20, A18, A16, A14, A12, A10, A8, A6, A4, A2, A0, M6, M4, M2, M0
IO1 = A23, A21, A19, A17, A15, A13, A11, A9, A7, A5, A3, A1, M7, M5, M3, M1
3: Quad Output Data
IO0 = (D4, D0…)
IO1 = (D5, D1…)
IO2 = (D6, D2…)
IO3 = (D7, D3…)
4: Quad Input Address
IO0 = A20, A16, A12, A8, A4, A0, M4, M0
IO1 = A21, A17, A13, A9, A5, A1, M5, M1
IO2 = A22, A18, A14, A10, A6, A2, M6, M2
IO3 = A23, A19, A15, A11, A7, A3, M7, M3
5: Fast Read Quad I/O Data
IO0 = (x, x, x, x, D4, D0…)
IO1 = (x, x, x, x, D5, D1…)
IO2 = (x, x, x, x, D6, D2…)
IO3 = (x, x, x, x, D7, D3…)
Rev.07 (Mar.18. 2011)
19
FM25S16
11.2.4 Write Enable (06h)
The Write Enable instruction (Figure 4) sets the Write Enable Latch (WEL) bit in the Status
Register to a 1. The WEL bit must be set prior to every Page Program, Sector Erase, Block Erase,
Chip Erase and Write Status Register instruction. The Write Enable instruction is entered by driving
/CS low, shifting the instruction code “06h” into Data Input (DI) pin on the rising edge of CLK, and
then driving /CS high.
/CS
CLK
Mode 3
Mode 0
0
1
2
3
4
5
6
7
Mode 3
Mode 0
Instruction (06 h)
DI
High Impedance
DO
Figure 4. Write Enable Instruction Sequence Diagram
11.2.5 Write Disable (04h)
The Write Disable instruction (Figure 5) resets the Write Enable Latch (WEL) bit in the Status
Register to a 0. The Write Disable instruction in entered by driving /CS low, shifting the instruction
code “04h” into the DI pin and then driving /CS high. Note that the WEL bit is automatically reset
after Power-up and upon completion of the Write Status Register, Page Program, Sector Erase,
Block Erase and Chip Erase instructions.
/CS
Mode 3
CLK
0
1
2
3
4
5
Mode 0
6
7 Mode 3
Mode 0
Instruction (04 h)
DI
DO
High Impedance
Figure 5. Write Disable Instruction Sequence Diagram
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20
FM25S16
11.2.6 Read Status Register-1 (05h) and Read Status Register-2 (35h)
The Read Status Register instructions allow the 8-bit Status Register to be read, The instruction is
entered by driving /CS low and shifting the instruction code “05h” for Status Register-1 and “35h”
for Status Register-2 into the DI pin on the rising edge of CLK. The status register bits are then
shifted out on the DO pin at the falling edge of CLK with most significant bit (MSB) first as shown in
figure 6. The Status Register bits are shown in figure 3a and 3b include the BUSY, WEL, BP2-BP0,
TB, SEC, SRP0, SRP1 and QE bits (see description of the Status Register earlier in this
datasheet).
The Status Register instruction may be used at any time, even while a Program, Erase, Write
Security Register or Write Status Register cycle is in progress. This allows the BUSY status bit to
be checked to determine when the cycle is complete and if the device can accept another
instruction. The Status Register can be read continuously, as shown in Figure 6. The instruction is
completed by driving /CS high.
/CS
Mode 3
CLK
0
1
2
3 4
5 6
7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
Mode 0
Instruction(05h or 35h)
DI
Status Register out
DO
7
6 5
4
3 2 1
Status Register out
0 7
6 5
4
3 2 1
0
7
=MSB
Figure 6. Read Status Register Instruction Sequence Diagram
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21
FM25S16
11.2.7 Write Status Register (01h)
The Write Status Register instruction allows the Status Register to be written. A Write Enable
instruction must previously have been executed for the device to accept the Write Status Register
Instruction (Status Register bit WEL must equal 1). Once write is enabled, the instruction is entered
by driving /CS low, sending the instruction code “01h”, and then writing the status register data byte
or word as illustrated in figure 7. The Status Register bits are shown in figure 3 and described
earlier in this datasheet.
Only non-volatile Status Register bits SRP0, SEC, TB, BP2, BP1, BP0 (bits 7, 5, 4, 3, 2 of Status
Register-1) and QE, SRP1 (bits 9 and 8 of Status Register-2) can be written to. All other Status
Register bit locations are read-only and will not be affected by the Write Status Register instruction.
The /CS pin must be driven high after the eighth or sixteenth bit of data that is clocked in. If this is
not done the Write Status Register instruction will not be executed. If /CS is driven high after the
eighth clock, the QE and SRP1 bits will be cleared to 0. After /CS is driven high, the self-timed
Write Status Register cycle will commence for a time duration of tw (See AC Characteristics). While
the Write Status Register cycle is in progress, the Read Status Register instruction may still be
accessed to check the status of the BUSY bit. The BUSY bit is a 1 during the Write Status Register
cycle and a 0 when the cycle is finished and ready to accept other instructions again. After the
Write Status Register cycle has finished, The Write Enable Latch (WEL) bit in Status Register will
be cleared to 0.
The Write Status Register instruction allows the Block Protect bits (SEC, TB, BP2, BP1 and BP0)
to be set for protecting all, a portion, or none of the memory from erase and program instructions.
Protected areas become read-only (see Status Register Memory Protection table and description).
The Write Status Register instruction also allows the Status Register Protect bits (SRP0, SRP1) to
be set. Those bits are used in conjunction with the Write protect (/WP) pin, Lock out or OTP
features to disable writes to the status register. Please refer to 11.1.16 for detailed descriptions
Status Register protection methods. Factory default all Status Register bits are 0.
/CS
Mode 3
CLK Mode 0
0
1
2
3
4
5
6
7
8
9
11 12
13 14 15 16
17 18 19 20 21 22
Status Register1 In
Instruction (01h)
7
DI
10
6
5
4
3
2
X
23 Mode 3
Mode 0
Status Register2 In
X
X
X
X
X
X
X
9
8
High Impedance
DO
=MSB
Figure 7. Write Status Register Instruction Sequence Diagram
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22
FM25S16
11.2.8 Read Data (03h)
The Read Data instruction allows one more data bytes to be sequentially read from the memory.
The instruction is initiated by driving the /CS pin low and then shifting the instruction code “03h”
followed by a 24-bit address (A23-A0) into the DI pin. The code and address bits are latched on the
rising edge of the CLK pin. After the address is received, the data byte of the addressed memory
location will be shifted out on the DO pin at the falling edge of CLK with most significant bit (MSB)
first. The address is automatically incremented to the next higher address after byte of data is
shifted out allowing for a continuous stream of data. This means that the entire memory can be
accessed with a single instruction as long as the clock continues. The instruction is completed by
driving /CS high. The Read Data instruction sequence is shown in figure 8. If a Read Data
instruction is issued while an Erase, Program or Write Status Register cycle is in process
(BUSY=1) the instruction is ignored and will not have any effects on the current cycle. The Read
Data instruction allows clock rates from D.C to a maximum of fR (see AC Electrical Characteristics).
/CS
Mode 3
CLK Mode 0
0
1
2
3
4
5
6
7
8
9
10
24-Bit Address
Instruction (03h)
23 22 21
DI
28 29 30 31 32 33 34 35 36 37 38 39
3
2
1
0
Data Out 1
High Impedance
DO
7
6
5
4
3
Data Out 2
2
1
0
7
=MSB
Figure 8. Read Data Register Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
23
FM25S16
11.2.9 Fast Read (0Bh)
The Fast Read instruction is similar to the Read Data instruction except that it can operate at the
highest possible frequency of FR (see AC Electrical Characteristics). This is accomplished by
adding eight “dummy” clocks after the 24-bit address as shown in figure 9. The dummy clocks
allow the device’s internal circuits additional time for setting up the initial address. During the
dummy clocks, The data value on the DO pin is a “don’t care”.
/CS
Mode 3
0
1
2
3
4
5
6
7
8
9
10
28
29 30 31
CLK Mode 0
24-Bit Address
Instruction (0Bh)
23 22 21
DI
3
2
1
0
DO
/CS
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
CLK
Dummy Byte
DI
7
6
5
4
3
2
1
0
Data Out 1
DO
7
6
5
4
3
2
Data Out 2
1
0
7
6
5
4
3
2
1
0
7
=MSB
Figure 9. Fast Read Register Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
24
FM25S16
11.2.10 Fast Read Dual I/O (BBh)
The Fast Read Dual I/O (BBh) instruction allows for improved random access while maintaining
two IO pins, IO0 and IO1. It is similar to the Fast Read Output (0Bh) instruction but with the
capability to input the Address bits (A23-0) two bits and output data two bits per clock. This
reduced instruction overhead may allow for code execution (XIP) directly from the Dual SPI in
some applications.
The Fast Read Dual I/O instruction can further reduce instruction overhead through setting the
Mode bits (M7-0) after the input Address bits (A23-0), as shown in figure 10a. The upper nibble of
the Mode (M7-4) controls the length of the next Fast Read Dual I/O instruction through the
instruction or exclusion of the first byte instruction code. The lower nibble bits of the Mode (M3-0)
are don’t care (“X”), However, the IO pins should be high-impedance prior to the falling edge of the
first data out clock.
If the Mode bits (M7-0) equal “Ax” hex, then the next Fast Dual I/O instruction (after /CS is raised
and then lowered) does not require the BBh instruction code, as shown in figure 10b. This reduces
the instruction sequence by eight clocks and allows the address to be immediately entered after
/CS is asserted low. If Mode bits (M7-0) are any value other “Ax” hex, the next instruction (after /CS
is raised and then lowered) requires the first byte instruction code, thus returning to normal
operation. A Mode Bit Reset instruction can be used to reset Mode Bits (M7-0) before issuing
normal instructions (See 11.2.25 for detailed descriptions).
Figure 10a. Fast Read Dual Input/Output Instruction Sequence Diagram (M7-0 = 0xh or NOT Axh)
Rev.07 (Mar.18. 2011)
25
FM25S16
Figure 10b. Fast Read Dual Input/Output Instruction Sequence Diagram (M7-0 = Axh)
Rev.07 (Mar.18. 2011)
26
FM25S16
11.2.11 Fast Read Quad I/O (EBh)
The Fast Read Quad I/O (EBh) instruction is similar to the Fast Read Dual I/O (BBh) instruction
except that address and data bits are input and output through four pins IO0, IO1, IO2, and IO3 and
four Dummy clock are required prior to the data output. The Quad I/O dramatically reduces
instruction overhead allowing faster random access for code executing (XIP) directly from the
Quad SPI. The Quad Enable bit (QE) of Status Register-2 must be set to enable the Fast read
Quad I/O Instruction.
The Fast Read Quad I/O instruction can further reduce instruction overhead through setting the
Mode bits (M7-0) after the input Address bits (A23-0), as shown in figure 11a. The upper nibble of
the Mode (M7-4) controls the length of the next Fast Read Quad I/O instruction through the
instruction or exclusion of the first byte instruction code. The lower nibble bits of the Mode (M3-0)
are don’t care (“X”). However, the IO pins should be high-impedance prior to the falling edge of the
first data out clock.
If the Mode bits (M7-0) equal “Ax” hex, then the next Fast Read Quad I/O instruction (after /CS is
raised and then lowered) does not require the EBh instruction code, as shown in figure 11b. This
reduces the instruction sequence by eight clocks allows the address to be immediately entered
after /CS is asserted low. If the Mode bits (M7-0) are any value other than “Ax” hex, the next
instruction (after /CS is raised and then lowered) requires the first byte instruction code, thus
retuning normal operation. A Mode Bit Reset can be used to reset Mode Bits (M7-0) before issuing
normal instructions (See 11.2.25 for detailed descriptions.)
/CS
Mode 3
0
1
2
3
4
5
6
7
8
9
10
11
12 13
14
15
16
17
18 19
20
21
22
23
CLK Mode 0
IO Switches from
Input to Output
Instruction(EBh)
IO0
4
0
4
0
4
0
4
0
4
0
4
0
4
IO1
5
1
5
1
5
1
5
1
5
1
5
1
5
IO2
6
2
6
2
6
2
6
2
6
2
6
2
6
7
3
7
3
7
3
7
3
7
3
7
3
7
IO3
A23-16 A15-8
A7-0
M7-0
Dummy Dummy Byte1
Byte3 Byte2
Byte4
Figure 11a. Fast Read Quad Input/Output Instruction Sequence Diagram (M7-0 = 0xh or NOT Axh)
Rev.07 (Mar.18. 2011)
27
FM25S16
/CS
Mode 3
CLK
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Mode 0
IO Switches from
Input to Output
IO 0
IO1
IO 2
IO 3
4
0
4
0
4
0
4
0
4
0
4
0
4
5
1
5
1
5
1
5
1
5
1
5
1
5
6
2
6
2
6
2
6
2
6
2
6
2
6
7
3
7
3
7
3
7
3
7
3
7
3
7
A23 -16
A15 -8
A7-0
M7-0
Dummy
Dummy
Byte 1
Byte 2
Figure 11b. Fast Read Quad Input/Output Instruction Sequence Diagram (M7-0 = Axh)
Rev.07 (Mar.18. 2011)
28
FM25S16
11.2.12 Page Program (02h)
The Page Program instruction allows from one byte to 256 bytes (a page) of data to be
programmed at previously erased (FFh) memory locations. A Write Enable instruction must be
executed before the device will accept the Page Program Instruction (Status Register bit WEL= 1).
The instruction is initiated by driving the /CS pin low and then shifting the instruction code “02h”
followed by a 24-bits address (A23-A0) and at least one data byte, into the DI pin. The /CS pin
must be held low for the entire length of the instruction while data is being sent to the device. The
Page Program instruction sequence is shown is figure 12.
If an entire 256 byte page is to be programmed, the last address byte (the 8 least significant
address bits) should be set to 0. If the last address byte is not zero, and the number of clocks
exceeds the remaining page length, the addressing will wrap to the beginning of the page. In some
cases, less than 256 bytes (a partial page) can be programmed without having any effect on other
bytes within the same page. One condition to perform a partial page program is that the number of
clocks can not exceed the remaining page length. If more than 256 bytes are sent to the device the
addressing will wrap to the beginning of the page and overwrite previously sent data.
As with the write and erase instructions, the /CS pin must be driven high after the eighth bit of the
last byte has been latched. If this is not done the Page Program instruction will not be executed.
After /CS is driven high, the self-timed Page Program instruction will commence for a time duration
of tPP (See AC Characteristics). While the Page Program cycle is in progress, the Read Status
Register instruction may still be accessed for checking the status of the BUSY bit. The BUSY bit is
a 1 during the Page Program cycle and becomes a 0 when the cycle is finished and the device is
ready to accept other instructions again. After the Page Program cycle has finished and Write
Enable Latch (WEL) bit in the Status Register is cleared to 0. The Page Program instruction will not
be executed if the addressed page is protected by the Block Protect (SEC, TB, BP2, BP1, and
BP0) bits,
/CS
Mode 3
CLK
0
1
2
3
4
5
6
7
8
9
10
28 29 30 31
32 33 34 35
36
37 38 39
Mode 0
Instruction (02h)
Data Byte 1
24 -Bit Address
21
2
3
1
0
*
7
6
5
2074
22
23
2073
DI
4
2
3
1
0
*
/CS
49 50 51
52 53
54
55
2079
48
2078
47
2077
46
2076
45
2075
44
2072
40 41 42 43
Mode 0
CLK
Data Byte 3
Data Byte 2
DI
*
Mode 3
7
6
5
4
3
2
1
0
7
6
5
4
3
Data Byte 256
2
1
0
7
6
5
4
3
2
1
0
= MSB
Figure 12. Page Program Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
29
FM25S16
11.2.13 Quad Data Input Page Program (32h)
The Quad Data Input Page Program instruction allows up to 256 bytes of data to be programmed
at previously erased (FFh) memory locations using four pins: IO0, IO1, IO2 and IO3. The Quad Data
Input Page Program can improve performance for PROM Programmer and applications that have
slow clock speed <5MHz. System with faster clock speed will not realize much benefit for the Quad
Data Input Program instruction since the inherent page program time is much greater than the time
it takes to clock-in the data.
To use Quad Data Input Page Program the Quad Enable in Status Register-2 must be set (QE=1),
A Write Enable instruction must be executed before the device will accept the Quad Data Input
Page Program instruction (Status Register-1, WEL=1). The instruction is initiated by driving the /CS
pin low and then shifting the instruction code “32h” followed by a 24-bit address (A23-A0) and at
least one data, into the IO pins. The /CS pin must be held low for the entire length of the instruction
while data is being sent to the device. All other functions of Quad Data Input Page Program are
identical standard Page Program. The Quad Data Input Page Program instruction sequence is
shown in figure 13.
/ CS
Mode3
CLK
0
1
2
3
4
5
6
7
8
9
28 29 30 31 32 33 34 35 36 37 38 39
10
Mode0
Instruction(32h)
24- Bit Address
Byte1
Byte2
4
4
0
1
5
1
5
1
6
2
6
2
6
2
3
7
3
7
3
7
3
541
542
543
1
5
IO2
6
2
IO3
7
IO1
0
540
5
1
539
0
3
*
Byte4
0
537
4
23 22 21
Byte3
538
4
0
IO0
2
/CS
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
536
Byte5
Byte6
Byte7
Byte8
Byte9
Byte 10 Byte11 Byte 12
Byte 253 Byte 254 Byte 255 Byte 256
IO0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
IO1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
IO2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
IO3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
Mode0
CLK
*
Mode3
= MSB
Figure 13. Quad Data Input Page Program Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
30
FM25S16
11.2.14 Quad Data Page Program (38h)
The Quad Page Program instruction allows 24-bit address and up to 256 bytes of data to be
programmed at previously erased (FFh) memory locations using four pins: IO0, IO1, IO2 and IO3.
The Quad Page Program can improve performance for PROM Programmer and applications that
have slow clock speed <5MHz. System with faster clock speed will not realize much benefit for the
Quad Page Program instruction since the inherent page program time is much greater than the
time it takes to clock-in the data.
To use Quad Page Program the Quad Enable in Status Register-2 must be set (QE=1), A Write
Enable instruction must be executed before the device will accept the Quad Page Program
instruction (Status Register-1, WEL=1). The instruction is initiated by driving the /CS pin low then
shifting the instruction code “38h” followed by a 24-bit address (A23-A0) and at least one data, into
the IO pins. The /CS pin must be held low for the entire length of the instruction while data is being
sent to the device. All other functions of Quad Page Program are identical standard Page Program.
The Quad Page Program instruction sequence is shown in figure 14.
/ CS
Mode3
CLK
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21
Mode0
Instruction(38h)
Byte 2
Byte 3
8
4
0
4
0
4
0
4
0
4
0
21
17 13 9
5
1
5
1
5
1
5
1
5
1
IO2
22
18 14 10
6
2
6
2
6
2
6
2
6
2
IO3
23
19 15 11
7
3
7
3
7
3
7
3
7
3
537
538
539
540
541
6 Address Cycle
IO0
20 16
IO1
12
Byte 1
Byte 4
/CS
37
543
30 31 32 33 34 35 36
542
27 28 29
536
22 23 24 25 26
Mode 3
Mode 0
CLK
Byte 5
Byte 6
Byte 7
Byte 8
Byte 9
Byte 10 Byte 11 Byte 12
IO0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
4
0
IO1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
5
1
IO2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
6
2
IO3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
7
3
Byte253 Byte254 Byte255 Byte256
Figure 14. Quad Page Program Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
31
FM25S16
11.2.15 Sector Erase (20h)
The sector Erase instruction sets all memory within a specified sector (4K-bytes) to the erased
state of all 1s (FFh). A Write Enable instruction must be executed before the device will accept the
Sector Erase Instruction (Status Register bit WEL must equal 1). The instruction is initiated by
driving the /CS pin low and shifting the instruction code “20h” followed a 24-bit sector address
(A23-A0). The Sector Erase instruction sequence is shown in figure 15.
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not
done the Sector Erase instruction will not be executed. After /CS is driven high, the self-timed
Sector Erase instruction will commence for a time duration of tSE (See AC Characteristics). While
the Sector Erase cycle is in progress, the Read Status Register instruction may still be accessed
for checking the status of the BUSY bit. The BUSY bit is a 1 during the Sector Erase cycle and
becomes a 0 when the cycle is finished and the device is ready to accept other instructions again.
After the Sector Erase cycle has finished the Write Enable Latch (WEL) bit in Status Register is
cleared to 0. The Sector Erase instruction will not be executed if the addressed page is protected
by the Block Protect (SEC, TB, BP2, BP1, and BP0) bits (see Status Register Memory protection
table).
Figure 15. Sector Erase Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
32
FM25S16
11.2.16 32KB Block Erase (52h)
The Block Erase instruction sets all memory within a specified block (32k-bytes) to the erased state
of all 1s (FFh). A Write Enable instruction must be executed before the device will accept the Block
Erase Instruction (Status Register bit WEL must equal 1). The instruction is initiated by driving the
/CS pin low and shifting the instruction code “52h” followed a 24-bit block address (A23-A0). The
Block Erase instruction sequence is shown in figure 16.
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not
done the Block Erase instruction will not be executed. After /CS is driven high, the self-timed Block
Erase instruction will commence for a time duration of tBE1 (See AC Characteristics). While the
Block Erase cycle is in progress, the Read Status Register instruction may still be accessed for
checking the status of the BUSY bit. The BUSY bit is a 1 during the Block Erase cycle and
becomes a 0 when the cycle is finished and the device is ready to accept other instructions again.
After the Sector Erase cycle has finished the Write Enable Latch (WEL) bit in Status Register is
cleared to 0.The Block Erase instruction will not be executed if the addressed page is protected by
the Block Protect (SEC, TB, BP2, BP1, and BP0) bits (see Status Register Memory Protection
table).
Figure 16. 32KB Block Erase Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
33
FM25S16
11.2.17 64KB Block Erase (D8h)
The Block Erase instruction sets all memory within a specified block (64k-bytes) to the erased state
of all 1s (FFh). A Write Enable instruction must be executed before the device will accept the Block
Erase Instruction (Status Register bit WEL must equal 1). The instruction is initiated by driving the
/CS pin low and shifting the instruction code “D8h” followed a 24-bit block address (A23-A0). The
Block Erase instruction sequence is shown in figure 17.
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not
done the Block Erase instruction will not be executed. After /CS is driven high, the self-timed Block
Erase instruction will commence for a time duration of tBE1 (See AC Characteristics). While the
Block Erase cycle is in progress, the Read Status Register instruction may still be accessed for
checking the status of the BUSY bit. The BUSY bit is a 1 during the Block Erase cycle and
becomes a 0 when the cycle is finished and the device is ready to accept other instructions again.
After the Block Erase cycle has finished the Write Enable Latch (WEL) bit in the Status Register is
cleared to 0. The Block Erase instruction will not be executed if the addressed page is protected by
the Block Protect (SEC, TB, BP2, BP1, and BP0) bits (see Status Register Memory Protection
table).
/CS
Mode 3
CLK
0
1
2
3
4
5
6
7
8
9
29
30 31 Mode 3
Mode 0
Mode 0
Instruction(D8h)
DI
24-bit Address
23
22
2
1
0
*
High Impedance
DO
*
= MSB
Figure 17. 64KB Block Erase Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
34
FM25S16
11.2.18 Chip Erase (C7h / 60h)
The Chip Erase instruction sets all memory within the device to the erased sate of all 1s (FFh). A
Write Enable instruction must be executed before the device will accept the Chip Erase Instruction
(Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low and
shifting the instruction code “C7h” or “60h”. The Chip Erase instruction sequence is shown in figure
18.
The /CS pin must be driven high after the eighth bit has been latched. If this is not done the Chip
Erase instruction will not be executed. After /CS is driven high, the self-timed Chip Erase
instruction will commence for a time duration of tCE (See AC Characteristics). While the Chip
Erase cycle is in progress, the Read Status Register instruction may still be accessed to check the
status of the BUSY bit. The BUSY bit is a 1 during the Chip Erase cycle and becomes a 0 when
the cycle is finished and the device is ready to accept other instructions again. After the Chip Erase
cycle has finished the Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Chip
Erase instruction will not be executed if any page is protected by the Block Protect (SEC, TB, BP2,
BP1, and BP0) bits (see Status Register Memory Protection table).
Figure 18. Chip Erase Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
35
FM25S16
11.2.19 Erase Suspend (75h)
The Erase Suspend instruction “75h” allows the system to interrupt a sector or block erase
operation and then read from or program data to, any other sector or block. The Write Status
Register instruction (01h) and Erase instructions (20h, 52h, D8, C7h, 60h) are not allowed during
suspend. Erase Suspend is valid only during the sector or block erase operation. If written during
the chip erase or program operation, the Erase Suspend instruction is ignored. A maximum of time
of “tSUS” (See AC Characteristics) is required to suspend the erase operation. The BUSY bit in the
status register will clear to 0 after Erase Suspend.
/CS
Mode 3
CLK
tSUS
0
1
2
3
4
5
6
Mode 3
7
Mode 0
Mode 0
Instruction (75h)
DI
High Impedance
DO
Accept Read or Program
Instruction
Figure 19. Erase Suspend instruction Sequence
11.2.20 Erase Resume (7Ah)
The Erase Resume instruction must be written to resume the sector or block erase operation after
an Erase Suspend. After issued the BUSY bit in the status register will be set to a 1 and the sector
or block will complete the erase operation. Erase Resume instruction will be ignored unless an
Erase Suspend operation is active.
Figure 20. Erase Resume instruction Sequence
Rev.07 (Mar.18. 2011)
36
FM25S16
11.2.21 Power-down (B9h)
Although the standby current during normal operation is relatively low, standby current can be
further reduced with the Power-down instruction. The lower power consumption makes the Powerdown instruction especially useful for battery powered applications (See ICC1 and ICC2 in AC
Characteristics). The instruction is initiated by driving the /CS pin low and shifting the instruction
code “B9h” as shown in figure 21.
The /CS pin must be driven high after the eighth bit has been latched, If this is not done the Powerdown instruction will not be executed. After /CS is driven high, the Power-down state will be
entered within the time duration of tDP (See AC Characteristics). While in the Release power-down
/Device ID instruction, which restores the device to normal operation, will be recognized. All other
instructions are ignored. This includes the Read Status Register instruction, which is always
available during normal operation. Ignoring all but one instruction makes the Power Down state a
useful condition for securing maximum write protection. The device always powers-up in the
normal operation with the standby current of ICC1.
Figure 21. Deep Pwer-down Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
37
FM25S16
11.2.22 Release Power-down / Device ID (ABh)
The Release from Power-down / Device ID instruction is a multi-purpose instruction. It can be used
to release the device from the power-down state or obtain the device electronic identification (ID)
number.
To release the device from the power-down state, the instruction is issued by driving the /CS pin
low, shifting the instruction code “ABh” and driving /CS high as shown in figure 22a. Release from
power-down will take the time duration of tRES1 (See AC Characteristics) before the device will
resume normal operation and other instructions are accepted. The /CS pin must remain high
during the tRES1 time duration.
When used only to obtain the Device ID while not in the power-down state, instruction is initiated
by driving the /CS pin low and shifting the instruction code “ABh” followed by 3-dummy bytes. The
Device ID bits are then shifted on the falling edge of CLK with most significant bit (MSB) first as
shown in figure 22b. The Device ID value for the FM25Q16 is listed in Manufacturer and Device
Identification table. The Device ID can be read continuously. The instruction is completed by
driving /CS high.
When used to release the device from the power-down state and obtain the Device ID, the
instruction is the same as previously described, and shown in figure 22b, except that after /CS is
driven high it must remain high for a time duration of tRES2 (See AC Characteristics). After this
time duration the device will resume normal operation and other instructions will be accepted. If
the Release from power-down /Device ID instruction is issued while an Erase, Program or Write
cycle is in process (when BUSY equals 1) the instruction is ignored and will not have any effects
on the current cycle.
/CS
tRES1
Mode 3
0
1
2
3
4
5
6
7
CLK
Mode 3
Mode 0
Mode 0
Instruction (ABh)
DI
High Impedance
DO
Power Down Current
Stand-by Current
Figure 22a. Release power-down Instruction Sequence
Rev.07 (Mar.18. 2011)
38
FM25S16
/CS
Mode 3
CLK
0
1
2
3
4
5
6
7
8
9
10
Mode 3
28 29 30 31 32 33 34 35 36 37 38
Mode 0
Mode 0
Instruction (ABh)
DI
3 Dummy Bytes
23 22 21
3
2
tRES2
1
0
*
High Impedance
Device ID
7
6
5
4
3
**
2
1
0
*
* = MSB
**
Power Down Current
Stand-by Current
Figure 22b. Release power-down / Device ID Instruction Sequence Diagram
Rev.07 (Mar.18. 2011)
39
FM25S16
11.2.23 Read Manufacturer/ Device ID (90h),(EFh),(DFh)
The Read Manufacturer/ Device ID instruction is an alternative to the Release from Power-down /
Device ID instruction that provides both the JEDEC assigned manufacturer ID and the specific
device ID.
The Read Manufacturer/ Device ID instruction is very similar to the Release from Power-down /
Device ID instruction. The instruction is initiated by driving the /CS pin low and shifting the
instruction code “90h” or “EFh” or “DFh” followed by a 24-bit address (A23-A0) of 000000h. After
which, the Manufacturer ID for FIDELIX SEMICONDUCTOR (F8h) and the Device ID are shifted
out on the falling edge of CLK with most significant bit(MSB) first as shown in figure 23a, 23b or
23c. The Device ID value for the FM25Q16 is listed in Manufacturer and Device Identification table.
If the 24-bit address is initially set to 000001h the Device ID will be read first and then followed by
the Manufacturer ID. The Manufacturer and Device IDs can be read continuously, alternating from
one to the other. The instruction is completed by driving/CS high.
Figure 23a. Read Manufacturer/ Device ID Diagram
Rev.07 (Mar.18. 2011)
40
FM25S16
Figure 23b. Read Dual Manufacturer/ Device ID Diagram
Rev.07 (Mar.18. 2011)
41
FM25S16
Figure 23c. Read Quad Manufacturer/ Device ID Diagram
Rev.07 (Mar.18. 2011)
42
FM25S16
11.2.24 JEDEC ID (9Fh)
For compatibility reasons, the FM25Q16 provides several instructions to electronically determine
the identity of the device. The Read JEDEC ID instruction is compatible with the JEDEC standard
for SPI compatible serial memories that was adopted in 2003. The instruction is initiated by driving
the /CS pin low and shifting the instruction code “9Fh”. The instruction JEDEC assigned
Manufacturer ID byte for FIDELIX SEMICONDUCTOR(F8h) and two Device ID bytes, Memory
Type(ID-15-ID8) and Capacity (ID7-ID0) are then shifted out on the falling edge of CLK with most
significant bit (MSB) first shown in figure 24. For memory type and capacity values refer to
Manufacturer and Device Identification table. The JEDEC ID can be read continuously. The
instruction is completed by driving/CS high.
/CS
Mode 3
CLK
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Mode 0
Instruction (9Fh))
DI
Manufacturer ID (4Ah)
High Impedance
DO
/CS
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
CLK
Mode 3
Mode 0
DI
Memory Type ID 15-ID8
DO
7
6
5
4
3
2
Capacity ID7-ID0
1
0
7
6
5
4
3
2
1
0
* = MSB
Figure 24. Read JEDEC ID
Rev.07 (Mar.18. 2011)
43
FM25S16
11.2.25 Mode Bit Reset (FFh)
For Fast Read Dual/Quad I/O operations, Mode Bits (M7-0) are implemented to further reduce
instruction overhead. By setting the Mode Bits (M7-0) to “Ax” hex, the next Fast Read Dual/Quad
I/O operations do not require the BBh/EBh instruction code (See 11.2.10 Fast Read Dual I/O and
11.2.11 Fast Read Quad I/O for detail descriptions).
If the system controller is reset during operation it will likely send a standard SPI instruction, such
as Read ID (9Fh) or Fast Read (0Bh), to the FM25Q16. However, as with most SPI Serial Flash
memories, the FM25Q16 does not have a hardware Reset pin, so if Mode bits are set to “Ax” hex,
the FM25Q16 will not recognize any standard SPI instruction. To address this possibility, it is
recommended to issue a Mode Bit Reset instruction “FFh” as the first instruction after a system
Reset. Doing so will release the mode Bits for the “Ax” hex state and allow Standard SPI instruction
to be recognized. The Mode Bits Reset instruction is shown in figure 25.
/CS
Mode 3
CLK
0
1
2
3
4
Mode 0
5
6
7
Mode 3
Mode 0
Instruction(FFh)
IO0
Don’ t Care
IO1
Don’ t Care
IO2
Don’ t Care
IO3
Figure 25. Mode Bits Reset for Fast Read Dual/Quad I/O
Rev.07 (Mar.18. 2011)
44
FM25S16
11.2.26 Enter Secured OTP (B1h)
The Enter Secured OTP instruction is for entering the additional 4K-bit secured OTP mode. The
additional 4K-bit secured OTP is independent from main array, which may be used to store unique
serial number for system identifier. After entering the Secured OTP mode, and then follow standard
read or program, procedure to read out the data or update data. The Secured OTP data cannot be
updated again once it is lock-down
Please note that WRSR/WRSCUR commands are not acceptable during the access of secure
OTP region, once security OTP is lock down, only commands related with read are valid.
The Enter Secured OTP instruction sequence is shown in figure 26.
/CS
Mode 3
CLK
0
1
2
3
4
5
6
7
Mode 3
Mode 0
Mode 0
Instruction(B1h)
DI
Figure 26. Enter Secured OTP instruction sequence
11.2.27 Exit Secured OTP (C1h)
The Exit Secured OTP instruction is for exiting the additional 4K-bit secured OTP mode.
The Exit Secured OTP instruction sequence is shown in figure 27
/CS
Mode 3
CLK
0
1
2
3
4
Mode 0
5
6
7
Mode 3
Mode 0
Instruction (C1h)
DI
Figure 27. Exit Secured OTP instruction sequence
Rev.07 (Mar.18. 2011)
45
FM25S16
11.2.28 Read Security Register (2Bh)
The Read Security Register instruction is for reading the value of Security Register bits. The Read
Security Register can be read at any time (even in program/erase/write status register condition)
and continuously.
The definition of the Security Register bits is as below:
Secured OTP Indicator bit. The Secured OTP indicator bit shows the chip is locked by factory
before ex-factory or not. When it is “0”, it indicates non-factory lock, “1” indicates factory-lock.
Lock-down Secured OTP (LDSO) bit. By writing WRSCUR instruction, the LDSO bit may be set
to “1” for customer lock-down purpose. However, once the bit it set to “1” (Lock-down), the LDSO
bit and the 4K-bit Secured OTP area cannot be updated any more. While it is in 4K-bit Secured
OTP mode, array access is not allowed to write.
/CS
Mode 3
CLK
0
1
2
3 4
5 6
7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
Mode 0
Instruction (2Bh)
DI
Security Register out
DO
7
6 5
4
3 2 1
Security Register out
0 7
6 5
4
3 2 1
0
7
=MSB
Figure 28. Read Security Register instruction sequence
Security Register Definition
Bit7
Bit6
Bit5
Bit4
Bit3
Bit2
x
x
x
x
x
x
reserved
reserved
reserved
reserved
reserved
reserved
Volatile
bit
Volatile
bit
Volatile
bit
Volatile
bit
Volatile
bit
Volatile
bit
Bit1
LDSO
(indicate if
lock-down)
0 = not lockdown
1 = lockdown(cannot
program/erase
OTP)
Bit0
Secured
OTP
indicator bit
0 = non
factory lock
1 = factory
lock
NonVolatile bit
NonVolatile bit
Rev.07 (Mar.18. 2011)
46
FM25S16
11.2.29 Write Security Register (2Fh)
The Write Security Register instruction is for changing the values of Security Register bits. Unlike
Write Status Register, the WREN instruction is not required before writing WRSCUR instruction.
The WRSCUR instruction may change the value of bit1 (LDSO bit) for customer to lock-down the
4K-bit Secured OTP area. Once the LDSO bit is set to “1”, the Secured OTP area cannot be
updated any more.
The /CS must go high exactly at the boundary; otherwise, the instruction will be rejected and not
executed.
/ CS
Mode 3
CLK
0
1
2
3
4
5
6
7
Mode 3
Mode 0
Mode 0
Instruction
(2 Fh )
DI
High Impedance
DO
Figure 29. Write Security Register instruction sequence
Rev.07 (Mar.18. 2011)
47
FM25S16
11.3 4K-bit Secured OTP
It’s for unique identifier to provide 4K-bit one-time-program area for setting device unique serial
number which may be set by factory or system customer. Please refer to table of “4K-bit secured
OTP definition”.
- Security register bit 0 indicates whether the chip is locked by factory or not.
- To program the 4K-bit secured OTP by entering 4K-bit secured OTP mode (with ENSO
command) and going through normal program procedure, and then exiting 4K-bit secured OTP
mode by writing EXSO command
- Customer may lock-down bit1 as “1”. Please refer to “table of security register definition” for
security register bit definition and table of “4K-bit secured OTP definition” for address range
definition.
- Note. Once lock-down whatever by factory or customer, it cannot be changed any more. While
in 4K-bit secured OTP mode, array access is not allowed to write.
4K-bit secured OTP definition
Address range
Size
000000 ~ 00000F
128-bit
000010 ~ 0001FF
3968-bit
Standard
Factory Lock
ESN
(Electrical Serial Number)
N/A
Customer Lock
Determined by customer
Rev.07 (Mar.18. 2011)
48
FM25S16
12. ELECTRICAL CHARACTERISTICS
12.1 Absolute Maximum Ratings (1)
PARAMETERS
SYMBOL
Supply Voltage
VCC
Voltage Applied to Any Pin
VIO
Transient Voltage on any Pin
VIOT
CONDITIONS
RANGE
UNIT
-0.6 to +4.0
V
Relative to Ground
-0.6 to VCC +4.0
V
<20nS Transient
-2.0V to VCC +2.0V
V
Relative to Ground
Storage Temperature
TSTG
-65 to +150
˚C
Lead Temperature
TLEAD
See Note(2)
˚C
Electrostatic Discharge
VESD
-2000 to +2000
V
Human
Body Model(3)
Voltage
Notes:
1. This device has been designed and tested for the specified operation ranges. Proper operation
outside of these levels is not guaranteed. Exposure to absolute maximum rating may affect
device reliability. Exposure beyond absolute maximum ratings may cause permanent damage.
2. Compliant with JEDEC Standard J-STD-20C for small body Sn-Pb or Pb-free (Green) assembly
and the European directive on restrictions on hazardous substances (RoHS) 2002/95/EU.
3. JEDEC Std JESD22-A114A (C1=100pF, R1=1500ohms, R2=500 ohms).
12.2 Operating Ranges
PARAMETER
SYMBOL
CONDITIONS
SPEC
MIN
MAX
UNIT
Supply Voltage
VCC
FR =85㎒, fR = 50㎒,
2.7
3.6
V
Temperature,Operating
Tj
Industrial
-40
+85
˚C
Rev.07 (Mar.18. 2011)
49
FM25S16
12.3 Endurance and Data Retention
PARAMETER
CONDITIONS
MIN
Erase/Program Cycles
4KB sector, 32/64KB block or full chip.
Data Retention
Full Temperature Range
MAX
UNIT
100,000
Cycles
20
years
12.4 Power-up Timing and Write Inhibit Threshold
PARAMETER
SPEC
SYMBOL
MIN
MAX
UNIT
VCC(min) to /CS Low
tVSL(1)
10
Time Delay Before Write Instruction
tPUW(1)
1
10
㎳
1
2
V
Write Inhibit Threshold Voltage
VWI
(1)
㎲
Note:
1. These parameters are characterized only.
VCC
VCC(max)
Program. Erase and Write Instructions are Ignored
/CS Must Track VCC
VCC(min)
Reset
State
tVSL
Read Instructions
Allowed
Device is Fully
Accessible
VWI
tPUW
Time
Figure 30. Power-up Timing and Voltage Levels
Rev.07 (Mar.18. 2011)
50
FM25S16
12.5 DC Electrical Characteristics
PARAMETER
SYMBOL
Input Capacitance
CIN(1)
CONDITION
SPEC
MIN
TYP
VIN=0V(2)
(1)
(2)
6
㎊
8
㎊
Output Capacitance
COUT
Input Leakage
ILI
±2
㎂
I/O Leakage
ILO
±2
㎂
10
50
㎂
1
5
㎂
4/5/6
6/7.5/9
㎃
6/7/8
9/10.5/12
㎃
7/8/9
10/12/13.5
㎃
10/11/12
15/16.5/18
㎃
Standby Current
Power-down Current
Current Read Data/
Dual/Quad 1㎒(2)
Current Read Data/
Dual/Quad 33㎒(2)
Current Read Data/
Dual/Quad 50㎒
(2)
Current Read Data/
Dual/Quad 85㎒
(2)
Current Write
ICC1
ICC2
ICC3
ICC3
ICC3
ICC3
VOUT=0V
UNIT
MAX
/CS=VCC,
VIN=GND or VCC
/CS=VCC,
VIN=GND or VCC
C=0.1 VCC / 0.9VCC
IO=Open
C=0.1 VCC / 0.9VCC
IO=Open
C=0.1 VCC / 0.9VCC
IO=Open
C=0.1 VCC / 0.9VCC
IO=Open
ICC4
/CS=VCC
8
12
㎃
ICC5
/CS=VCC
20
25
㎃
ICC6
/CS=VCC
20
25
㎃
Current Chip Erase
ICC7
/CS=VCC
20
25
㎃
Input Low Voltages
VIL
-0.5
VCC x0.2
V
Input High Voltages
VIH
VCC x0.8
VCC +0.4
V
Output Low Voltages
VOL
IOL=1.6㎃
0.4
V
VOH
IOH=-100㎂
Status Register
Current page
Program
Current Sector/Block
Erase
Output
High Voltages
VCC -0.2
V
Notes:
1. Tested on sample basis and specified through design and characterization data, TA = 25˚C,
VCC = 3V.
2. Checked Board Pattern.
Rev.07 (Mar.18. 2011)
51
FM25S16
12.6 AC Measurement Conditions
PARAMETER
SYMBOL
Load Capacitance
Input Rise and Fall Times
SPEC
MIN
MAX
UNIT
CL
30
㎊
TR, TF
5
㎱
Input Pulse Voltages
VIN
0.2 VCC to O. 8 VCC
V
Input Timing Reference Voltages
IN
0.3 VCC to O. 7 VCC
V
OUT
0.5 VCC to O. 5 VCC
V
Output Timing Reference Voltages
Note:
1.
Output Hi-Z is defined as the point where data out is no longer driven.
Input Levels
Input and Output
Timing Reference Levels
0.8 VCC
0.5 VCC
0.2 VCC
Figure 31. AC Measurement I/O Waveform
Rev.07 (Mar.18. 2011)
52
FM25S16
12.7 AC Electrical Characteristics
DESCRIPTION
SPEC
SYMBOL
ALT
FR
fc
D.C.
85
㎒
FR
fc
D.C.
104
㎒
FR
D.C.
50
㎒
Clock High, Low Time for Read Data (03h)
tCRLH,
6
㎱
instructions
tCRLL(1)
Clock Rise Time peak to peak
tCLCH(2)
0.1
V/㎱
Clock Fall Time peak to peak
tCHCL(2)
0.1
V/㎱
7
㎱
5
㎱
MIN
TYP
UNIT
MAX
Clock frequency
For all instructions, except Read Data (03h)
2.7V-3.6V VCC & Industrial Temperature
Clock frequency
For all instructions, except Read Data (03h)
3.0V-3.6V VCC & Commercial Temperature
Clock freq. Read Data instrunction (03h)
/CS Active Setup Time relative to CLK
tSLCH
tCSS
/CS Not Active Hold Time relative to CLK
tCHSL
Data In Setup Time
tDVCH
tDSU
4
㎱
Data In Hold Time
tCHDX
tDH
4
㎱
/CS Active Hold Time relative to CLK
tCHSH
7
㎱
/CS Not Active Setup Time relative to CLK
tSHCH
7
㎱
/CS Deselect Time (for Read instructions/ Write,
tSHSL
tCSH
10/40
㎱
tSHQZ(2)
tDIS
7
㎱
tCLQV
tV
7/6
㎱
Output Hold Time
tCLQX
tHO
/Hold Active Setup Time relative to CLK
tHLCH
Erase and Program instructions)
Output Disable Time
Clock Low to Output Valid
2.7V-3.6V / 3.0V-3.6V
0
㎱
7
㎱
12.8 AC Electrical Characteristics (cont’d)
Rev.07 (Mar.18. 2011)
53
FM25S16
DESCRIPTION
SYMBOL
ALT
SPEC
MIN
TYP
MAX
UNIT
/HOLD Active Hold Time relative to CLK
tCHHH
5
㎱
/HOLD Not Active Setup Time relative to CLK
tHHCH
7
㎱
/HOLD Not Active Hold Time relative to CLK
tCHHL
5
㎱
/HOLD to Output Low-Z
/HOLD to Output High-Z
tHHQX(2)
tLZ
7
㎱
(2)
tHZ
12
㎱
tHLQZ
(3)
Write Protect Setup Time Before /CS Low
tWHSL
20
㎱
Write Protect Setup Time After /CS High
tSHWL(3)
100
㎱
/CS High to Power-down Mode
/CS High to Standby Mode without Electronic
(2)
tDP
3
㎲
tRES1(2)
3
㎲
tRES2(2)
1.8
㎲
tSUS(2)
20
㎲
Signature Read
/CS High to Standby Mode with Electronic
Signature Read
/CS High to next Instruction after Suspend
Write Status Register Time
tw
10
15
㎳
Byte Program Time
tBP
10
150
㎲
Page Program Time
tPP
1.5
5
㎳
Sector Erase Time(4KB)
tSE
40
300
㎳
Block Erase Time(32KB)
tBE1
200
1000
㎳
Block Erase Time(64KB)
tBE2
300
1500
㎳
Chip Erase Time FM25Q16
tCE
10
50
s
Notes:
1. Clock high + Clock low must be less than or equal to 1/fc.
2. Value guaranteed by design and/or characterization, not 100% tested in production.
3. Only applicable as a constraint for a Write Status Register instruction when Sector Protect Bit is
set to 1.
4. Commercial temperature only applies to Fast Read (FR1 & FR2). Industrial temperature applies to
all other parameters.
Rev.07 (Mar.18. 2011)
54
FM25S16
12.9 Serial Output Timing
12.10 Input Timing
12.11 Hold Timing
Rev.07 (Mar.18. 2011)
55
FM25S16
13. PACKAGE SPECIFICATION
13.1 8-Pin SOIC 150-mil
SYMBOL
MILLIMETERS
INCHES
MIN
MAX
MIN
MAX
A
1.47
1.72
0.058
0.068
A1
0.10
0.24
0.004
0.009
A2
1.45
0.057
b
0.33
0.50
0.013
0.020
C
0.19
0.25
0.0075
0.098
4.8
4.95
0.189
0.195
5.8
6.19
0.228
0.244
3.8
4.00
0.150
0.157
(3)
D
E
(3)
E1
(2)
e
1.27BSC
0.050 BSC
L
0.40
1.27
0.015
0.050
θ
0˚
8˚
0˚
8˚
y
---
0.076
---
0.003
Notes:
1. Controlling dimensions: inches, unless otherwise specified.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the
bottom of the package.
Rev.07 (Mar.18. 2011)
56
FM25S16
13.2 8-Pin SOIC 208-mil
SYMBOL
MILLIMETERS
INCHES
MIN
MAX
MIN
MAX
A
1.75
2.16
0.069
0.085
A1
0.05
0.25
0.002
0.010
A2
1.70
1.91
0.067
0.075
b
0.35
0.48
0.014
0.019
C
0.19
0.25
0.007
0.010
D
5.18
5.38
0.204
0.212
E
7.70
8.10
0.303
0.319
E1
5.18
5.38
0.204
0.212
e
1.27 BSC
0.050 BSC
L
0.50
0.80
0.020
0.031
θ
0˚
8˚
0˚
8˚
y
---
0.10
---
0.004
Notes:
1. Controlling dimensions: inches, unless otherwise specified.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the
bottom of the package.
4. Formed leads shall be planar with respect to one another within. 0004 inches at the seating
plane.
Rev.07 (Mar.18. 2011)
57
FM25S16
13.3 8-Pin PDIP 300-mil
Dimension in inch
Dimension in min
SYMBOL
MIN
Nom
MAX
MIN
Nom
MAX
A
---
---
0.210
---
---
5.334
A1
0.015
---
---
0.381
---
---
A2
0.125
0.130
0.135
3.18
3.30
3.43
B
0.016
0.018
0.022
0.41
0.46
0.56
B1
0.058
0.060
0.064
1.47
1.52
1.63
c
0.008
0.010
0.014
0.20
0.25
0.36
D
0.360
0.365
0.370
9.14
9.27
9.40
E
0.290
0.300
0.310
7.37
7.62
7.87
E1
0.245
0.250
0.255
6.22
6.35
6.48
e1
0.090
0.100
0.110
2.29
2.54
2.79
L
0.120
0.130
0.140
3.05
3.30
3.56
α
0
---
15
0
---
15
eA
0.335
0.355
0.375
8.51
9.02
9.53
S
---
---
0.045
---
---
1.14
Rev.07 (Mar.18. 2011)
58
FM25S16
13.4 8-contact 6x5 WSON
SYMBOL
MILLIMETERS
INCHES
MIN
TYP.
MAX
MIN
TYP.
MAX
A
0.70
0.75
0.80
0.0276
0.0295
0.0315
A1
0.00
0.02
0.05
0.0000
0.0008
0.0019
A2
0.55
0.0126
A3
0.19
0.20
0.25
0.0075
0.0080
0.0098
b
0.36
0.40
0.48
0.0138
0.0157
0.0190
(3)
D
5.90
6.00
6.10
0.2320
0.2360
0.2400
D1
3.30
3.40
3.50
0.1299
0.1338
0.1377
E
4.90
5.00
5.10
0.1930
0.1970
0.2010
4.20
4.30
4.40
0.1653
0.1692
0.1732
(3)
E1
e(2)
1.27 BSC
K
0.20
L
0.50
0.0500 BSC
0.0080
0.60
0.75
0.0197
0.0236
0.0295
Rev.07 (Mar.18. 2011)
59
FM25S16
13.5 8-contact 6x5 WSON Cont’d.
SYMBOL
MILLIMETERS
MIN
TYP.
INCHES
MAX
MIN
TYP.
MAX
SOLDER PATTERN
M
3.40
0.1338
N
4.30
0.1692
P
6.00
0.2360
Q
0.50
0.0196
R
0.75
0.0255
Notes:
1. Advanced Packaging Information; please contact FIDELIX SEMICONDUCTOR for the latest
minimum and maximum specifications.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom
of the package.
4. The metal pad area on the bottom center of the package is connected to the device ground (GND
pin). Avoid placement of exposed PCB bias under the pad.
Rev.07 (Mar.18. 2011)
60
FM25S16
13.6 16-Pin SOIC 300-mil
SYMBOL
MILLIMETERS
INCHES
MIN
MAX
MIN
MAX
A
2.36
2.64
0.093
0.104
A1
0.10
0.30
0.005
0.012
b
0.33
0.51
0.013
0.020
C
0.18
0.28
0.007
0.000
10.08
10.49
0.397
0.413
E
10.01
10.64
0.394
0.419
E1(3)
7.39
7.59
0.291
0.299
(3)
D
(2)
e
1.27BSC
0.050
L
0.39
1.27
0.015
0.050
θ
0˚
8˚
0˚
8˚
y
---
0.076
---
0.003
Notes:
1. Controlling dimensions: inches, unless otherwise specified.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the
bottom of the package.
Rev.07 (Mar.18. 2011)
61
FM25S16
14. ORDERING INFORMATION
Rev.07 (Mar.18. 2011)
62