Reference Oscillator Crystal Requirements for the MC1320x

Freescale Semiconductor
Application Note
Document Number: AN3251
Rev. 1.2, 04/2011
Reference Oscillator Crystal Requirements
for the MC1320x, MC1321x, MC1322x, and
MC1323x IEEE 802.15.4 Devices
1
Introduction
This document describes the reference oscillator crystal
requirements for the MC1320x, MC1321x, MC1322x
and MC1323x families of IEEE 802.15.4 2.4 GHz low
power devices. These devices contain an on-board
reference oscillator that is designed for very low power
consumption and to meet tight frequency accuracy
requirements. The IEEE 802.15.4 standard requires a
frequency error of no greater than +/- 40 ppm. To ensure
proper operation over temperature, limitations exist on
the types of crystals that can be used.
Contents
1
2
3
4
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Reference Oscillator Crystal Basics . . . . . . . 2
16 MHz Oscillator (MC1320x and MC1321x) 7
13-26 MHz Oscillator
(MC1322x, 24 MHz Default)
8
5 32 MHz Oscillator (MC1323x) . . . . . . . . . . . 10
For the Freescale IEEE 802.15.4 devices:
• The 20x and 21x devices both use a 16 MHz
reference oscillator
• The 22x devices use a default 24 MHz reference
(although a 13-26 MHz reference can be used)
• The 23x devices use a 32 MHz reference.
There are also differences between how the crystal load
capacitance is provided for each family. This document
details use of these reference oscillators and also
© Freescale Semiconductor, Inc., 2007, 2008, 2009, 2010, 2011. All rights reserved.
provides specifications for the required crystals and lists of preferred crystals for each device.
2
Reference Oscillator Crystal Basics
The IEEE® 802.15.4 Standard requires that a wireless node frequency tolerances be kept within ± 40 ppm
accuracy. This means that a total offset up to 80 ppm between transmitter and receiver will still result in
acceptable performance. The following sections provide oscillator design and evaluation
recommendations to obtain the required performance.
2.1
Basic Oscillator
Figure 1 shows the 16 MHz reference oscillator for the MC1320x/MC1321x families which is used here
as a basic example. The oscillator is composed simply of the analog buffer amplifier, the crystal and the
capacitive loading. The buffer is an inverting amplifier, and when the circuit is in resonant oscillation, the
crystal provides the additional 180º phase shift required for oscillation (positive feedback).
REFERENCE
OSCILLATOR
(16MHz)
MC1320x/MC1321x
1 MEG (nom)
Fine Tune
Fine Tune
0-5pF
with steps of 20 fF.
0-5pF
with steps of 20 fF.
XTAL1
XTAL2
Y1
CRY STAL
CL1
Cstray
Cstray
CL2
Figure 1. 16 MHz Crystal Oscillator for MC1320x and MC1321x Devices
The buffer output is fed back to the input through a resistor to DC bias the amplifier in the midrange of its
analog swing. The resonant frequency of the crystal sets the frequency of operation. The resonant
frequency of the crystal is set and specified at a particular capacitive loading.
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
2
Freescale Semiconductor
The accuracy of the resonant frequency is dominated by:
• Capacitive loading on the crystal
• Temperature characteristics of the crystal.
The sum or net capacitive load to the crystal can consist of three components:
• External discrete load capacitors - properly sized as determined by the crystal spec and other load
components
• Programmable onboard trim capacitors - to provide the user with best possible accuracy, Freescale
provides trimmable load capacitors on these devices.
• Stray capacitance - for these frequencies, the specified load capacitance is small, typically at 7-9
pF. With such a low desired load value, the stray capacitance due to the device pads and pcb traces
impact the other load components.
2.2
Crystal Considerations
The primary determining factor in meeting the 802.15.4 Standard of +/-40 ppm is the tolerance of the
crystal oscillator reference frequency as set by the crystal. A number of factors can contribute to this
tolerance and a crystal specification will quantify each of them:
1. The initial tolerance, also known as make or cut tolerance, of the crystal resonant frequency itself
(at a specified load capacitance).
2. The variation of the crystal resonant frequency with temperature .
3. The variation of the crystal resonant frequency with time, also commonly known as aging.
4. The variation of the crystal resonant frequency with load capacitance, also commonly known as
pulling. This is affected by:
a) The external load capacitor (CL) values - initial tolerance and variation with temperature.
b) The internal trim capacitor (Ctrim) values - initial tolerance and variation with temperature.
c) Stray capacitance (Cstray) on the crystal pin nodes - including stray on-chip capacitance, stray
package capacitance and stray board capacitance
2.2.1
Crystal Load Capacitance
For any of the 2.4 GHz wireless devices, Freescale requires crystal load capacitance to be in the range of
5-9 pF. This low capacitance is required because these oscillators are designed for low power and larger
capacitance can load the amplifiers more heavily.
The crystal manufacturer defines the load capacitance as that total external capacitance seen across the two
terminals of the crystal. The oscillator amplifier configuration used here has two balanced load
capacitances from each terminal of the crystal to ground. As such, the capacitance net loads for each pin
are seen to be in series by the crystal, and the total load seen at each crystal terminal is the sum of the CL,
Ctrim, and Cstray.
For the 16 MHz example, the external load capacitors are typically about 6.8 pF each, used in conjunction
with a crystal that requires an 8-9 pF load capacitance. This value is used with the default internal nominal
trim capacitor value (2.4 pF) and estimated stray capacitance value of 5-7 pF.
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
Freescale Semiconductor
3
The value for the stray capacitance is determined empirically for a specific board layout. A different board
layout may require different external load capacitor values. The on-chip trim capability may be used to
determine the closest CL standard value by adjusting the trim value and observing the frequency accuracy
of the device. Each device provides trim capability, although each family differs in its configuration (see
Section 2.3, “Design Evaluation and Optimization).
Because of the trim capability, it is possible during manufacturing test, to trim out virtually all of the initial
tolerance factors and put the frequency within less than 2-3 ppm on a board-by-board basis. Individual
trimming of each board in a production environment may allow use of a lower cost crystal, but requires
that each board go through a trimming procedure with added test cost. If the crystal is specified properly
and the load capacitance is centered properly, production trimming is commonly not required.
A tolerance analysis budget may be created using all the previously stated factors. It is an engineering
judgment whether the worst case tolerance will assume that all factors will vary in the same direction or if
the various factors can be statistically rationalized using RSS (Root-Sum-Square) analysis. The aging
factor is usually specified in ppm/year and the product designer can determine how many years are to be
assumed for the product lifetime. The total budget must fit within the +/-40 ppm limit of the IEEE 802.15.4
Standard.
2.2.2
Crystal Temperature Variation
The make or cut frequency tolerance of a crystal is typically specified at 25°C (room temperature). The
frequency of device (in the application) at room temperature should be set within the cut tolerance
(typically +/-10 ppm) or better. The oscillator frequency variation with temperature from this set point is
dominated by the crystal characteristics. Frequency stability (temperature drift) is a specified parameter
for the crystal over its temperature range. Figure 2 shows a curve of frequency tolerance versus
temperature for a typical AT-cut crystal. In this example, the crystal could meet +/-12 ppm max limit over
a temperature range of -40°C to +85°C. A manufacturer can change the shape of this curve by varying the
manufacturing of the crystal.
Figure 2. Typical AT-cut Crystal Frequency Tolerance vs. Temperature
Notice that the curve uses 25°C as its reference point, i.e., deviation is 0 ppm at this temperature.
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
4
Freescale Semiconductor
2.2.3
Crystal Equivalent Series Resistance (ESR)
Another crystal characteristic important to performance is its equivalent series resistance. ESR is the
resistive component of the crystal impedance at resonance. ESR is expressed in ohms, and the lower this
number is, the better the crystal. As ESR gets higher, the start and run load to the amplifier gets higher can
hinder oscillator start and run, especially at low temperatures.
2.2.4
Crystal Specification
Using the 16 MHz crystal for the MC1320x/MC1321x families as an example, Table 1 shows
recommended specifications. Freescale prefers to specify the crystal such that it is capable of maintaining
to total frequency tolerance of +/-30 ppm over the desired temperature range; this allows a margin of +/-10
ppm for manufacturing variation, component tolerance, and aging.
In considering the table, critical parameters include:
• Desired frequency - specified to the Hz
• Frequency tolerance @ 25°C - this is maximum allowed for “cut” or manufacturing frequency
variation.
— This number may allowed to be larger than +/-10 ppm for a more limited temperature range, if
the frequency stability allows it
— This number may be allowed to be larger if the user is willing to trim the center frequency at
manufacturing final test
• Frequency stability over the desired temperature range - this is the frequency drift of the crystal
with temperature.
• Equivalent series resistance (ESR) - this a maximum series impedance for the crystal at resonance.
Freescale recommends that this range from 40-60 Ω depending on the device.
• Load capacitance (CL) - the number typically ranges from 5-9 pF.
Table 1. Recommended 16 MHz Crystal Specifications1
Parameter
Value
Unit
16.000000
MHz
Frequency tolerance (cut tolerance)2
± 10
ppm
at 25 °C
Frequency stability (temperature drift)3
± 15
ppm
Over desired temperature range
Aging4
±2
ppm
max
Equivalent series resistance (ESR)
40-50
Ω
max
Load capacitance
5-9
pF
Shunt capacitance
<2
pF
Frequency
Mode of oscillation
Condition
max
fundamental
1
User must be sure manufacturer specifications apply to the desired package.
A wider frequency tolerance may acceptable if application uses trimming at production final test.
3 A wider frequency stability may be acceptable if application uses trimming at production final test.
4 A wider aging tolerance may be acceptable if application uses trimming at production final test.
2
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
Freescale Semiconductor
5
2.3
Design Evaluation and Optimization
Each design should initially be optimized and verified as different crystals, layouts and printed circuit
board characteristics can impact the frequency accuracy. Refer to the Freescale IEEE 802.15.4 / ZigBee
Node RF Evaluation and Test Guidelines, Document No. ZRFETRM.pdf for more information.
•
•
•
NOTE
Freescale provides several reference designs for each device family with
specific layouts and crystals. It is recommended that a designer use one
of these reference designs as their starting point to get the best oscillator
performance as well as best RF performance
In this application note, Freescale lists a number of recommended
crystals for each family. It is recommended to use these devices.
If the user chooses a custom crystal, it is suggested reference oscillator
start-up and LOW POWER run be evaluated at low temperature. High
ESR is a most critical characteristic. It is the user’s responsibility to
qualify their selected crystal in their application.
In evaluating a new layout and design, the first consideration is to center crystal loading such that the
default load causes the oscillator frequency to be near its designed center frequency.
• External load capacitors, when present should be of equal value.
• The frequency accuracy of the reference oscillator must be observed to adjust the load and trim
capacitance.
— The CLKO (clock out) signal is available on the MC1320x and MC1321x families and is
enabled by default
— On the MC1322x and MC1323x families, a peripheral timer (TPM) output must be
programmed and enabled to observe the system clock
— Be sure the frequency counter has a reference oscillator that allows measurement accuracy
within 1-2 ppm or better
• The load centering procedure is dependent on family
— For the MC1320x and MC1321x families allow the onboard trim capacitance to remain at
default (center range) and adjust the external load capacitors to center the reference frequency
by observing signal CLKO. If the external capacitors do not adjust the frequency with sufficient
accuracy, trim the onboard capacitance to center the frequency.
— For the MC1322x family no external load capacitors are normally present and the default value
of the onboard load capacitance is “no load”. Observe the system clock accuracy with a timer
output and trim the onboard load capacitance to set the center frequency. This trim value should
become the value programmed by user software at start-up; it may be adjusted at final test.
— For the MC1323x family, allow the onboard trim capacitance to remain at default (center
range) and adjust the external load capacitors to center the reference frequency by observing a
timer output. If the external capacitors do not adjust the frequency with sufficient accuracy,
trim the onboard capacitance to center the frequency.
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
6
Freescale Semiconductor
Once a design has been characterized, it is good practice to verify the center frequency as part of the
manufacturing final test. Unit-by-unit trimming is commonly not required if the design has been
characterized properly. However, Freescale devices provide trim capability and it can be incorporated into
the final test procedures.
3
16 MHz Oscillator (MC1320x and MC1321x)
The MC1320x and MC1321x devices all use a common 16 MHz crystal reference oscillator design.
3.1
16 MHz Oscillator Description
The 16 MHz reference oscillator is used as an example of a basic oscillator and is shown in Figure 1. To
add additional detail, an on-board regulator provides constant operating voltage to the oscillator under
varying supply voltage, and the on-chip feedback resistor around the buffer is typically 1 Megohm.
With this design, external load capacitors (CL1 and CL2) provide the bulk of the required load capacitance,
and on-board mirrored trim capacitor networks provide the remainder of the required load capacitance.
The trim capacitance:
• Used for fine-tuning the reference frequency
• Capacitance value range is 0 to 5 pF, in 256 steps with a default value of 2.4 pF. Experience has
shown that frequency changes 3-4 Hz/step which allows for excellent control.
• Value is software programmable through a control register
Because of the IEEE® 802.15.4 Standard requirements and desired battery operation, the oscillator is a
very low power design. To provide higher start margin, current drive is increased during power-up and
start. After oscillation begins and is stable, a counter is used to “count” the device out of reset, and in turn,
operating current is reduced for lower power operation.
The characteristics of a crystal are such that it is high impedance at start, and much lower impedance at
resonance. As a result, the reduced operating current is not problematic in that the crystal is in resonance
and presents this low ESR.
3.2
Recommended 16 MHz Crystal specifications
The suggested 16 MHz crystal specifications are shown in Table 1. A number of the stated parameters are
related to desired package, desired temperature range and use of crystal capacitive load trimming.
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
Freescale Semiconductor
7
3.3
Evaluated 16 MHz Crystals
Freescale has evaluated crystals from several manufacturers that are available as standard part numbers for
this application. These are presented in Table 2.
Table 2. 16 MHz Crystals for MC1319x, MC1320x, and MC1321x
Package
Cut
Tolerance
(ppm)
Nihon Dempa Kogyo (NDK) NX3225SA-16MHZ
3.2x2.5 mm
±15
-30ºC to +85ºC Type NX3225SA,
Spec # EXS00A-03311
Epson Toyocom
TSX3225-16M-26360
3.2x2.5 mm
±18
-40ºC to +85ºC Package TSX-3225
AVX / Kyocera
CX3225SB 16000E0FPZ25 3.2x2.5 mm
±16
-40ºC to +85ºC Model CX3225SB,
Spec # K1101-06368-433
Daishinku KDS
DSX321G-16.0MHZ
±20
-10ºC to +60ºC Type DSX321G,
Spec # 1B216000BB0B
Manufacturer
4
Part Number
3.2x2.5 mm
Temperature
Range
Comment
13-26 MHz Oscillator (MC1322x, 24 MHz Default)
The MC1322x devices all use a common crystal reference oscillator design that is 24 MHz by default, but
can be used with crystals ranging from 13-26 MHz
4.1
13-26 MHz Oscillator Description (24 MHz default)
The 13-26 MHz reference oscillator consists of an analog buffer/amplifier and its associated loading (see
Figure 3). The oscillator uses an off-chip fundamental mode crystal of 13-26 MHz with 24 MHz the
recommended nominal frequency. An on-board regulator provides constant operating voltage to the
oscillator under varying supply voltage. An on-chip 1 MΩ feedback resistor around the buffer provides
DC-bias such that the buffer operates in analog mode.
The crystal is specified with a particular load capacitance (typically <= 9 pF) and all the load capacitors
are internal and programmable. For the purpose of reference, the integrated load capacitors on each leg
include:
• A single 4pF capacitor (1 program bit)
• Coarse tune capacitor array of 1, 2, 4 and 8pF (4 program bits)
• Fine tune capacitor array of 5 pF in 160 fF steps (5 program bits).
Therefore, the trimmable crystal load capacitance range can be between a load of 0 pF to 24 pF for each
leg. Experience has shown that frequency changes about 8 Hz/step for the course tune and about 1.25
Hz/step for the fine tune. The load value is software programmable through a control register.
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
8
Freescale Semiconductor
Figure 3. 13-26 MHz Reference Oscillator
The onboard load capacitance is totally disabled by default when exiting reset. The only default crystal
load capacitance are the signal pads and stray capacitance. The oscillator will start with a frequency higher
than its specified cut tolerance. The applications software must program the required load capacitance into
the device to properly load the crystal for the cut tolerance and loading.
4.2
Recommended 24 MHz Crystal specifications
The recommended 24 MHz crystal specifications are shown in Table 3. A number of the stated parameters
are related to desired package, desired temperature range and use of crystal capacitive load trimming.
Table 3. Recommended 24 MHz Crystal Specifications
Parameter
Value
Unit
24.000000
MHz
Frequency tolerance (cut tolerance)
± 10
ppm
at 25 °C
Frequency stability (temperature drift)
± 15
ppm
Over desired temperature range
Aging
±2
ppm
max
Equivalent series resistance2
40-50
Ω
max
Load capacitance
5-9
pF
Frequency
1
Condition
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
Freescale Semiconductor
9
Table 3. Recommended 24 MHz Crystal Specifications (continued)
Parameter
Shunt capacitance
Value
Unit
<2
pF
max
Mode of oscillation
1
2
4.3
Condition
fundamental
A wider frequency tolerance may acceptable if application uses trimming at production final test.
The higher ESR may be acceptable with lower load capacitance.
Evaluated 24 MHz Crystals
Freescale has evaluated crystals from several manufacturers that are available as standard part numbers for
this application. Table 4 shows these values.
Table 4. 24 MHz Crystals for MC1322x
Package
Cut
Tolerance
(ppm)
Nihon Dempa Kogyo NX3225SA-24MHZ
(NDK)
3.2x2.5 mm
±10
-30ºC to +85ºC Type NX3225SA,
Spec # EXS00A-CS02020
Nihon Dempa Kogyo NX3225SA-24MHZ
(NDK)
3.2x2.5 mm
±10
-40ºC to +105ºC Type NX3225SA,
Spec # EXS00A-CS00225
Epson Toyocom
TSX-3325-24MHZ
3.2x2.5 mm
±10
-40ºC to +85ºC Package TSX-3225
Spec # OUTD-2B-0418(2)
Daishinku KDS
DSX321G-24.0MHZ
3.2x2.5 mm
±10
-40ºC to +85ºC Type DSX321G,
Spec # 1C224000AB0D
CTS
CTS_55012_X2_24M_40-85
3.2x2.5 mm
±10
-40ºC to +85ºC
Manufacturer
5
Part Number
Temperature
Range
Comment
Spec # 55012
32 MHz Oscillator (MC1323x)
The MC1323x devices all use a common 32 MHz crystal reference oscillator design.
5.1
32 MHz Oscillator Description
Figure 4 shows the 32 MHz reference oscillator. The crystal has an amplifier block with Amplitude Level
Control (ALC) to optimize power consumption and help startup. It uses an off-chip 32 MHz crystal and
has internal programmable trim load capacitors. The primary load capacitors are external.
With this design, external load capacitors (CL1 and CL2) provide the bulk of the required load capacitance,
and on-board mirrored trim capacitor networks provide the remainder of the required load capacitance.
• The onboard capacitors consist of two arrays on each pin, each trimmable by a 4-bit control field.
• The larger or coarse array can be from 0 - 4.215 pF with steps of 281 fF. The rate of frequency
change is about 125 Hz/step
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
10
Freescale Semiconductor
•
•
The smaller or fine array can be from 0 - 300 fF with steps of 20 fF. The rate of frequency change
is about 11 Hz/step.
The is software programmable through a control register
Figure 4. 32 MHz Reference Oscillator
5.2
Recommended 32 MHz Crystal specifications
Table 5 shows the recommended 32 MHz crystal specifications. A number of the stated parameters are
related to desired package, desired temperature range and use of crystal capacitive load trimming.
Table 5. Recommended 32 MHz Crystal Specifications
Parameter
Value
Unit
32.000000
MHz
± 10
ppm
max at 25 °C
± 16-18
ppm
Over desired temperature range
Aging
±2
ppm
max
Equivalent series resistance
60
Ω
max
Load capacitance
9
pF
max
Shunt capacitance
<2
pF
max
Frequency
Frequency tolerance (cut tolerance)
Frequency stability (temperature drift)
Mode of oscillation
Condition
fundamental
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
Freescale Semiconductor
11
5.3
Evaluated 32 MHz Crystals
Freescale has evaluated crystals from several manufacturers that are available as standard part numbers for
this application. Table 6 shows these values.
Table 6. 32 MHz Crystals for MC1322x
Package
Cut
Tolerance
(ppm)
Nihon Dempa Kogyo (NDK) NX3225SA-32MHZ
3.2x2.5 mm
±10
-40ºC to +85ºC Type NX3225SA,
Spec # EXS00A-CS02368
Epson Toyocom
3.2x2.5 mm
±10
-40ºC to +85ºC Package TSX-3225
Spec # OUTD-2B-0546
Manufacturer
Part Number
TSX-3325-32MHZ
Temperature
Range
Comment
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
12
Freescale Semiconductor
NOTES
Reference Oscillator Crystal Requirements Application Note, Rev. 1.2
Freescale Semiconductor
13
How to Reach Us:
Home Page:
www.freescale.com
E-mail:
[email protected]
USA/Europe or Locations Not Listed:
Freescale Semiconductor
Technical Information Center, CH370
1300 N. Alma School Road
Chandler, Arizona 85224
+1-800-521-6274 or +1-480-768-2130
[email protected]
Europe, Middle East, and Africa:
Freescale Halbleiter Deutschland GmbH
Technical Information Center
Schatzbogen 7
81829 Muenchen, Germany
+44 1296 380 456 (English)
+46 8 52200080 (English)
+49 89 92103 559 (German)
+33 1 69 35 48 48 (French)
[email protected]
Japan:
Freescale Semiconductor Japan Ltd.
Headquarters
ARCO Tower 15F
1-8-1, Shimo-Meguro, Meguro-ku,
Tokyo 153-0064, Japan
0120 191014 or +81 3 5437 9125
[email protected]
Asia/Pacific:
Freescale Semiconductor Hong Kong Ltd.
Technical Information Center
2 Dai King Street
Tai Po Industrial Estate
Tai Po, N.T., Hong Kong
+800 2666 8080
[email protected]
For Literature Requests Only:
Freescale Semiconductor Literature Distribution Center
P.O. Box 5405
Denver, Colorado 80217
1-800-521-6274 or 303-675-2140
Fax: 303-675-2150
[email protected]
Document Number: AN3251
Rev. 1.2
04/2011
Information in this document is provided solely to enable system and software implementers to use
Freescale Semiconductor products. There are no express or implied copyright licenses granted
hereunder to design or fabricate any integrated circuits or integrated circuits based on the information
in this document.
Freescale Semiconductor reserves the right to make changes without further notice to any products
herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the
suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any
liability arising out of the application or use of any product or circuit, and specifically disclaims any
and all liability, including without limitation consequential or incidental damages. “Typical” parameters
that may be provided in Freescale Semiconductor data sheets and/or specifications can and do vary
in different applications and actual performance may vary over time. All operating parameters,
including “Typicals”, must be validated for each customer application by customer’s technical
experts. Freescale Semiconductor does not convey any license under its patent rights nor the rights
of others. Freescale Semiconductor products are not designed, intended, or authorized for use as
components in systems intended for surgical implant into the body, or other applications intended to
support or sustain life, or for any other application in which the failure of the Freescale Semiconductor
product could create a situation where personal injury or death may occur. Should Buyer purchase
or use Freescale Semiconductor products for any such unintended or unauthorized application,
Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries,
affiliates, and distributors harmless against all claims, costs, damages, and expenses, and
reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that Freescale
Semiconductor was negligent regarding the design or manufacture of the part.
Freescale™ and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other
product or service names are the property of their respective owners.
© Freescale Semiconductor, Inc. 2007, 2008, 2009, 2010, 2011. All rights reserved.