PCN20110805

Product Change Notices
PCN No.: 20110805
Date: September 1, 2011
Subject: Apply Cu bonding wire on below products
This is to inform you that Cu bonding wire will be applied on the products stated in below
(table 1) with below conditions:
1. AME to ensure " Electrical Characteristic" of Cu bonding wire package is 100%
compliance AME specifications.
2. AME qualified this new material package reliability.
3. The Part Number of each product is unchanged, but identification through D/C is
available.
Table 1
Part Number
Package
Part Number
Package
SOT-25
AME8802 Family
SOT-25
TSOT-23
AME8861 Family
TSOT-25
SOT-23
AME8800 Family
TSOT-25
AME8801 Family
SOT-25
AME8808 Family
AME8804 Family
SOT-26
AME8810 Family
AME8812 Family
TSOT-25
AME8847 Family
AME8840 Family
TSOT-26
AME8848 Family
SOT-223
AME8806 Family
SOT-25
AME8807 Family
SOT-26
AME8809 Family
AME8841 Family
SOP-8
AME8850 Family
AME8842 Family
SOP-8
AME8803 Family
AME8814 Family
SOT-26
AME8824 Family
TSOT-26
AME8863 Family
TSOT-25
TSOT-26
AME8805 Family
SOT-23
SOT-223
This notification is for your information and concurrence.
If you require AME Qual/Rel data or samples to qualify this change, please contact AME,
Inc. directly or AME’s authorized Sales Representative or Distributor.
Please note this PCN will be effective after 30 days of issuing date automatically If
we do not receive any response, comment or questions from you within 30
calendar days.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Bill Chou – Director, Engineering Department I
Email: [email protected]
Phone: +886.2.2627.8687 # 2110
Expected 1st Device Shipment Date: 10/1/2011
Effective Year/Work Week of Changed Product: NA
Cu bonding wire identification through D/C is available.
A line on top of the last character represents Cu bonding wire such as AAAww
For example :
Reason of Change:
Add Cu bonding wire to ensure the sufficient material source.
Qual/Rel Report:
Test Item
HTOL
ESD
Latch-up
MSL
HTS
Result
Description
MIL-STD-883F 1005.8 TSTRESS=125℃, Duration= 1000hrs Biased Pass
MIL-STD-883G
Human Body Model, Class 2,
Pass
Method 3015.7
2kV minimum
Method
JEDEC STANDARD
Level A, 100mA minimum
Pass
J-STD-020C
85/85 168 hours, IR-reflow 3 cycles
Peak Temp.= 260℃
MSL1
JESD22-A103D
150℃, 1000 hrs
Pass
85℃,85% RH, 1000hrs
Pass
Pass
NO.78 MARCH 1997
IPC/JEDEC
THT (85/85) JESD22-A101C
PCT
JESD22-A102D
121℃, 100% RH, 2atm, 168hrs
TCT
JESD22-A104D
-65℃ ~ 150℃, 500 cycles, DWELL=15min Pass
Solderability J-STD-D02C
IR-reflow
JESD22-A113F
Temp.=260℃, Duration=5sec
Pass
See IR reflow Profile, Perform 3 cycles test Pass
REL-2095-W-A
AME88xx Cu Wire Reliability Report
Products of this PCN were listed under below
Part Number
Package
Part Number
Package
SOT-25
AME8802 Family
SOT-25
TSOT-23
AME8861 Family
TSOT-25
SOT-23
AME8800 Family
TSOT-25
AME8801 Family
SOT-25
AME8808 Family
AME8804 Family
SOT-26
AME8810 Family
AME8812 Family
AME8840 Family
TSOT-25
TSOT-26
AME8847 Family
AME8848 Family
SOT-223
AME8806 Family
SOT-25
AME8807 Family
AME8809 Family
SOT-26
TSOT-25
SOP-8
AME8850 Family
AME8841 Family
TSOT-26
AME8842 Family
SOP-8
AME8803 Family
AME8814 Family
SOT-26
AME8824 Family
TSOT-26
AME8805 Family
SOT-23
SOT-223
AME8863 Family
Approved by
Prepared by
Amy Shen
Quality & Reliability Dept.
Jess Lin
Quality & Reliability Dept.
Manager
Engineer
Table of Contents
I、Failures In Time Calculation
II、Product Reliability Test Result
III、Package Reliability Test Result
IV、IR-reflow Test Result
I、Failures In Time Calculation:
Use HTOL test information mentioned in sectionⅣ, FIT (Failures In Time) can be calculated as below:
FIT = ( x 2 (ν ,
CL )
× 10 9 ) /( 2 × S × H × AF ) = ( 4 .61 × 10 9 ) /( 2 × 77 × 1000 × 280 .59 )
=106.69 (pieces per 109 hours) @ 40℃ with 90% Confidence Level.
Where AF is acceleration factor setting activation energy to 1.0eV as zero failure.
II、Product Reliability Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
HTOL
TSTRESS=125℃
77 pcs / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
Duration= 1000hrs
Biased, Read at
168/504/1000 hours
ESD
Human Body Model
Pin-to-Pin test
Class 2, 2kV minimum
Latch-up
Level A, 100mA minimum
III、Package Reliability Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
MSL
85/85 168 hours
22 pcs / 0 pcs
Level 1
77 pcs / 0 pcs
Pass
77 pcs / 0 pcs
Pass
77 pcs / 0 pcs
Pass
77 pcs / 0 pcs
Pass
5 pcs / 0 pcs
Pass
IR-reflow 3 cycles
Peak Temp.= 260℃
IPC/JEDEC J-STD-020C
HTS
Precondition NOTE 2
Temp.=150℃
Duration=1000 hours
Unbiased, Read at
1000 hours
THT
Precondition NOTE 2
Temp.=85℃, R.H.=85%
Duration=1000 hours
Unbiased,
Read at 1000 hours
PCT
Precondition NOTE 2
Temp.=121℃, R.H.=100%
15PSIG, Unbiased
Duration=168 hours
Read at 168 hours
TCT
Precondition NOTE 2
-65℃ ~ 150℃
500 cycles Unbiased,
Read at 500 cycles
Solderability
Temp.=260℃ (lead-free)
Duration=5sec
NOTE 2: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 260℃
IV、IR-reflow Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
IR-reflow
See IR reflow Profile
22 pcs / 0 pcs
Pass
Perform 3 cycles test
IR reflow Profile:
Profile Feature
Average Ramp-Up Rate
(Tsmax to Tp)
Preheat
- Temperature Min (Tsmin)
- Temperature Max (Tsmax)
- Time (tsmin to tsmax)
Time maintained above
- Temperature (TL)
- Time (tL)
Peak/Classification Temperature (Tp)
Time within 5℃ of actual Peak
Temperature (tp)
Ramp-Down Rate
Time 25℃ to Peak Temperature
Pb-Free Assembly
3℃/second max.
150℃
200℃
60~180 seconds
217℃
60~150 seconds
260℃
20~40 seconds
6℃/second max.
8 minutes max.