86877

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Add one vendor, CAGE 06665. Make changes to table I and throughout the
drawing. Remove one vendor, CAGE 34333.
90-02-01
M. A. FRYE
B
Add device type 02. Add case outlines G and P. Table I changes.
Add one vendor, CAGE 64155. Editorial changes throughout.
94-08-09
M. A. FRYE
C
Make change to VOL1 test as specified in table I. - ro
99-06-10
R. MONNIN
D
Add case outline Z and CAGE 27014. - ro
01-02-22
R. MONNIN
E
Drawing updated to reflect current requirements. - ro
06-01-10
R. MONNIN
F
Update drawing to current MIL-PRF-38535 requirements. –rrp
14-02-24
C. SAFFLE
REV
SHEET
REV
SHEET
REV STATUS
REV
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OF SHEETS
SHEET
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PMIC N/A
PREPARED BY
DONALD R. OSBORNE
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
CHECKED BY
D. A. DiCENZO
APPROVED BY
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
N. A. HAUCK
DRAWING APPROVAL DATE
87-07-15
REVISION LEVEL
F
MICROCIRCUIT, LINEAR, PRECISION VOLTAGE
COMPARATOR / BUFFER, MONOLITHIC SILICON
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
5962-86877
1 OF 11
5962-E162-14
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M)
and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device class M and Q:
5962
-
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
86877
01
G
A
Device
type
(see 1.2.2)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
For device class V:
5962
-
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
86877
01
Q
G
A
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
Generic number
Circuit function
PM111, LM111
LT111A
Precision voltage comparator / buffer
Precision voltage comparator / buffer
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designators will not be included in the PIN and will not be marked on the device.
Device class
M
Q or V
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Certification and qualification to MIL-PRF-38535
STANDARD
MICROCIRCUIT DRAWING
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DSCC FORM 2234
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A
REVISION LEVEL
F
SHEET
2
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
G
P
Z
2
Descriptive designator
MACY1-X8
GDIP1-T8 or CDIP2-T8
GDFP1-G10
CQCC1-N20
Terminals
Package style
8
8
10
20
Can
Dual-in-line
Flat pack with gull wing leads
Square leadless chip carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absolute maximum ratings. 1/
Ground to negative supply voltage .................................................................
Total supply voltage (V+ to V-) .......................................................................
Output to negative supply voltage ..................................................................
Input voltage ...................................................................................................
Differential input voltage .................................................................................
Output sink current .........................................................................................
Output short circuit duration ...........................................................................
Maximum strobe current ................................................................................
Power dissipation (PD) ...................................................................................
Storage temperature range ............................................................................
Junction temperature (TJ) ..............................................................................
Lead temperature (soldering, 60 seconds) .....................................................
Thermal resistance, junction-to-case (θJC):
Cases G, P, and 2 ....................................................................................
Case Z ......................................................................................................
-30.0 V
±36.0 V
-50.0 V
±15 V 2/
±30.0 V
50 mA
10 seconds
10 mA
500 mW
-65°C to +150°C
+175°C 3/
+300°C
See MIL-STD-1835
24°C/W
1.4 Recommended operating conditions.
Supply voltage (VS) ........................................................................................ ±15 V
Ambient operating temperature range (TA) .................................................... -55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
________
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Rating applies to VS = ±15 V. The positive input voltage limit is 30 V above the negative supply. The negative input voltage
limit is equal to the negative supply voltage or 30 V below the positive supply, whichever is less negative.
3/ For short term test (in the specific burn-in and life test configuration when required and up to 138 hours maximum)
TJ = +275°C.
STANDARD
MICROCIRCUIT DRAWING
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DSCC FORM 2234
APR 97
SIZE
5962-86877
A
REVISION LEVEL
F
SHEET
3
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein .
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MILPRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 50 (see MIL-PRF-38535, appendix A).
STANDARD
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REVISION LEVEL
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TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
VIO
Input offset voltage
RS = 50 Ω,
1
–14.5 V
1
1
VS = ±2.5 V
±1.0
02
±2.0
±3.0
01
±4.0
2,3
1
±1.0
02
±2.0
2,3
Raised input offset
voltage
3/
VIO(R)
RS = 50 Ω,
1
VIC = 0 V, 13 V, and
-14.5 V,
2,3
VBAL = VBAL/STB = V+
Input offset voltage
temperature coefficient
Input offset current
∆VIO /
∆T
IIO
01
±3.0
02
±1.0
01
±4.5
02
±2.5
2,3
01,02
±25
µV/°C
VIC = 0 V, 13 V, and
1,2
01
±10
nA
±20
3
1,2
±5
02
±10
3
IIO(R)
1,2
VIC = 0 V,
∆IIO /∆T
01,02
+25°C to +125°C 4/
1,2
+25°C to -55°C 4/
1,3
±25
nA
±50
3
VBAL = VBAL/STB = V+
Input offset current
temperature coefficient
mV
RS = 50 Ω 4/
-14.5 V
Raised input offset 3/
current
mV
±4.0
2,3
RS = 50 Ω, VIC = 0 V,
Max
±3.0
01
2,3
VIC = 0 V, 13 V , and
Unit
01,02
±100
pA/°C
±200
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
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DSCC FORM 2234
APR 97
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REVISION LEVEL
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TABLE I. Electrical performance characteristics – Continued.
Test
Input bias current
Symbol
+IIB
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Group A
subgroups
VIC = 13 V and -14.5 V
-IIB
VIC = 13 V and -14.5 V
Collector output voltage
(STROBED)
VO(STB)
Common mode rejection
CMR
Output leakage current
ICEX
Input leakage current
Positive supply current
Negative supply current
Output short circuit
current
RS = 50 Ω, ISTB = -3.0 mA
Unit
Max
+0.1
3
-150
+0.1
1,2
-150
+0.1
3
-200
+0.1
-100
+0.1
3
-150
+0.1
1,2
-150
+0.1
3
-200
+0.1
1,2
VIC = 0 V
Limits
Min
-100
1,2
VIC = 0 V
Device
type
All
All
nA
1,2,3
All
14
V
1,2,3
All
80
dB
VS = ±18 V, VIN = 5 mV,
1
All
-1
10
VO = 32 V
2
-1
500
-5
500
-5
500
RS = 50 Ω,
VIC = 13 V and -14.5 V
II1
VS = ±18 V, VID = -29 V
II2
VS = ±18 V, VID = -29 V
1,2,3
I+
1
I-
IOS
All
6.0
2
6.0
3
7.0
1
10 ms maximum test
duration
All
All
-5.0
2
-5.0
3
-6.0
1
All
0
200
2
0
150
3
0
250
nA
nA
mA
mA
mA
See footnotes at end of table.
STANDARD
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DSCC FORM 2234
APR 97
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REVISION LEVEL
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SHEET
6
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Adjustment for input
offset voltage
VIO
(ADJ)+
RS = 50 Ω, TA = +25°C
1
All
Unit
Max
+5.0
VIO
(ADJ)-
mV
-5.0
V+ = 4.5 V, V- = 0 V,
Low level output voltage
VOL1
VIC = 0.71 V, IO = 8 mA,
1,2,3
All
0
0.4
0
0.4
0
1.5
0
1.5
V
VID = -6.0 mV
V+ = 4.5 V, V- = 0 V,
VOL2
VIC = -1.75 V, IO = 8 mA,
VID = -6.0 mV
Low level output voltage
VOL3
VOL4
Voltage gain
(emitter output)
+AVE
VS = ±15 V, VID = -5.0 mV,
1,2,3
All
VS = ±15 V, VID = -5.0 mV,
VIC = -14 V, IO = 50 mA
RL = 600 Ω
4
All
10
5,6
Response time, low-tohigh, collector output
tRLHC
VOD(overdrive) = -5 mA,
7,8B
tRHLC
V/mV
8
All
0
300
0
640
0
300
0
500
ns
CL = 50 pF(min),
8A
VIN = 100 mV
Response time, high-tolow collector output
V
VIC = 13 V, IO = 50 mA
VOD(overdrive) = +5 mA,
7,8B
All
ns
CL = 50 pF(min),
8A
VIN = 100 mV
1/
Unless otherwise specified, VIC = 0 V and VS = ±15 V.
2/
VIC is achieved by algebraically subtracting the common mode voltage from each VS (power supplies) and algebraically
adding it to VIN. VIC can be calculated by using the following formula:
VIC
= -[(V+) + (V-)] / 2 + VIN
3/
Subscript (R) indicates tests which are performed with input stage current raised by connecting BAL and BAL/STB terminals
to V+.
4/
If not tested, shall be guaranteed to the limits specified in table I herein.
STANDARD
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REVISION LEVEL
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Device types
01 and 02
Case outlines
G and P
Terminal
number
Z
2
Terminal symbol
1
GROUND
GND
NC
2
IN+
IN+
EMIT OUT
3
IN-
IN-
NC
4
V-
NC
NC
5
BALANCE
V-
IN+
6
BAL / STRB
BALANCE
NC
7
OUT
BAL / STRB
IN-
8
V+
NC
NC
9
---
OUTPUT
NC
10
---
V+
V-
11
---
---
NC
12
---
---
BALANCE
13
---
---
NC
14
---
---
NC
15
---
---
BAL / STRB
16
---
---
NC
17
---
---
COL OUT
18
---
---
NC
19
---
---
NC
20
---
---
V+
NC = No connection, no external connection should be made to these pins.
FIGURE 1. Terminal connections.
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4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) TA = +125°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table II herein.
4.2.2 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table II herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
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REVISION LEVEL
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TABLE II. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class Q
Device
class V
1
1
1
1,2,3,4,5,6, 1/
7,8A,8B
1,2,3,4,5,6, 1/
7,8A,8B
1,2,3,4,5,6,
7,8A,8B
1,2,3,4,5,6, 2/
7,8A,8B
1,2,3,4,5,6,
7,8A,8B
1
1
1
1
1
1
---
---
---
1,2,3,4,5,6,7,8A,8B
1/ PDA applies to subgroup 1.
2/ PDA applies to subgroups 1 and 7.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b.
TA = +125°C, minimum.
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MILSTD-883.
STANDARD
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REVISION LEVEL
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4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a.
End-point electrical parameters shall be as specified in table II herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
TA = +25°C ±5°C, after exposure, to the subgroups specified in table II herein.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in
MIL-HDBK-103 and QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein)
to DLA Land and Maritime-VA and have agreed to this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime-VA.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-86877
A
REVISION LEVEL
F
SHEET
11
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 14-02-24
Approved sources of supply for SMD 5962-86877 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
Reference
military specification
PIN
5962-8687701GA
60264
MTLM111QH
M38510/10304BGA
3/
AS111T008/883C
3/
LM111H/883
60264
MTLM111QD8
3/
AS111C008/883C
3/
LM111J8/883
3/
PM111RC
57300
AS111E020/883C
60264
MTLM111QL5
3/
PM111RCMDA
60264
MTLT111AQH
3/
LT111AH/883
60264
MTLT111AQD8
3/
LT111AJ8/883
5962-86877022A
60264
MTLT111AQLS
---
5962-8687701QGA
3/
LM111H-SMD
M38510/10304BGA
5962-8687701QPA
3/
LM111J-8-SMD
M38510/10304BPA
5962-8687701QZA
3/
LM111WG-SMD
---
5962-8687701Q2A
3/
LM111E-SMD
M38510/10304B2A
5962-8687701PA
5962-86877012A
5962-8687702GA
5962-8687702PA
M38510/10304BPA
M38510/10304B2A
---
---
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
Page 1 of 2
STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued
Vendor CAGE
number
Vendor name
and address
57300
Micross Components
7725 N. Orange Blossom Trail
Orlando, FL 32810-2696
60264
Minco Technology Labs, Inc.
1805 Rutherford Lane
Austin, TX 78754-5101
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
Page 2 of 2