7704302XA SMD

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
H
Add vendors CAGE 07933, 04713, and 27014. Add device type 02. Inactive
case D for new design. Change input offset current limit for +25C. Change
group A subgroups for large signal voltage gain test and output voltage swing
test. Editorial changes throughout.
89-07-20
M.A. Frye
J
Sheet 4: Input bias current test, IB, device type 02; for group A subgroup 1,
add “-50 nA” in min column. For subgroups 2 and 3 add “-100 nA” in min
column. Changes in accordance with NOR 5962-R261-94.
94-08-12
M.A. Frye
K
Update boilerplate. Changes to thermal resistance, junction-to-ambient (θJA).
Add case outline X. Editorial changes throughout.
97-07-10
R. Monnin
L
Case outline "X" dimensions L, R, and R1 are updated. - rrp
97-12-15
R. Monnin
M
Changes to IIO, IB, VICR, AVD, and VOL tests in table I. Add ICC and IOS tests
to table I. - rrp
98-03-02
R. Monnin
N
Add device class “V” device and delete figure 1. - ro
03-04-24
R. Monnin
P
Drawing updated to reflect current requirements. - rrp
05-04-04
R. Monnin
R
Make correction to VOL test limit by deleting “20 V” and substituting “20 mV” as
specified under Table I. Update boilerplate paragraphs to current
MIL-PRF-38535 requirements. - ro
11-08-03
C. Saffle
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
CURRENT CAGE CODE 67268
REV
SHEET
REV
SHEET
REV STATUS
REV
R
R
R
R
R
R
R
R
R
R
OF SHEETS
SHEET
1
2
3
4
5
6
7
8
9
10
PMIC N/A
PREPARED BY
WILLIAM E. SHOUP
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
CHECKED BY
C. R. JACKSON
APPROVED BY
N. A. HAUCK
DRAWING APPROVAL DATE
77-09-13
REVISION LEVEL
R
MICROCIRCUIT, LINEAR, QUAD OPERATIONAL
AMPLIFIER, MONOLITHIC SILICON
SIZE
CAGE CODE
A
14933
SHEET
DSCC FORM 2233
APR 97
77043
1 OF 10
5962-E418-11
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and
M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part
or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device classes M and Q:
77043
01
C
A
Drawing
number
Device
type
(see 1.2.2)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
For device class V:
5962
-
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
01
V
C
A
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
77043
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
01
02
Circuit function
LM124
LM124A
Quad operational amplifier
Quad operational amplifier
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designators will not be included in the PIN and will not be marked on the device.
Device requirements documentation
Device class
M
Q or V
Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Certification and qualification to MIL-PRF-38535
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
SHEET
2
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
A 1/
C
D
X
2
Descriptive designator
Terminals
GDFP5-F14 or CDFP6-F14
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
GDFP1-G14
CQCC1-N20
14
14
14
14
20
Package style
Flat pack
Dual-in-line
Flat pack
Flat pack with gull wing leads
Square leadless chip carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absolute maximum ratings. 2/
Supply voltage (+V) ........................................................................................ 32 V dc relative to ground
Differential input voltage (VID) ........................................................................ 32 V dc
Input voltage (VIN) .......................................................................................... -0.3 V dc to +32 V dc
Power dissipation (PD) ...................................................................................
Output short circuit to GND (one amplifier) .....................................................
Storage temperature range .............................................................................
Lead temperature (soldering, 10 seconds) .....................................................
Junction temperature (TJ) ...............................................................................
750 mW 3/
Continuous 4/
-65C to +150C
+300C
+150C
Thermal resistance, junction-to-case (θJC) ..................................................... See MIL-STD-1835
Thermal resistance, junction-to-ambient (θJA):
Case C ........................................................................................................
Case D ........................................................................................................
Case X ........................................................................................................
Case 2 .........................................................................................................
103C/W
126C/W
176C/W
91C/W
1.4 Recommended operating conditions.
Ambient operating temperature range (TA) ..................................................... -55C to +125C
______
1/ Inactivate for new design. Acceptable only for use in equipment designed or redesigned on or before 29 November 1986.
2/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
3/ Dissipation is total of four amplifiers. Use external resistor to allow amplifier to saturate or reduce power dissipation in the
circuit.
4/ Short circuits from output to +V can cause excessive heating and destruction. Maximum output current is
approximately 60 mA independent of magnitude of +V. Where V supply > +15 V dc, continuous short circuits can
exceed PD ratings and cause destruction. Destructive dissipation can result from simultaneous shorts on all amplifiers.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
SHEET
3
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
VIO
Input offset voltage
Conditions
-55C  TA  +125C
+V = 5.0 V dc
Group A
subgroups
Device
type
unless otherwise specified
1/
1
01
Limits
Min
IIO
1
+IIN = (-IIN), VCM = 0 V
4
30
01
10
02
30
2,3
IB
Input bias current
+IIN or -IIN,
1
2/
1
Input common mode
voltage range
VICR
+V = 30 V
01
-150
2,3
VCM = 0 V
3/
AVD
+V = 15 V (for large VO
02
-50
2,3
-100
1
All
0
+V –
1.5
0
+V –
2.0
4
swing), RL  2 k,
Output voltage swing
Common mode rejection
ratio
Amplifier to amplifier
coupling
3/
All
4,5,6
V
50
5,6
VO = 1 V to 11 V
nA
-300
2,3
Large signal voltage
gain
nA
100
2,3
1
mV
2
02
2,3
Input offset current
Max
5
7
2,3
1
Unit
V/mV
25
All
26
V
VOUT
+V = 30 V, RL  2 k
VOH
+V = 30 V, RL  10 k
VOL
RL  10 k
CMRR
+V = 30 V, TA = +25C
4
All
70
dB
1 kHz, 20 kHz, TA = +25C
4
All
80
dB
27
20
mV
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
SHEET
5
TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Conditions
-55C  TA  +125C
+V = 5.0 V dc
Group A
subgroups
Device
type
unless otherwise specified
Limits
Min
Unit
Max
Power supply rejection
ratio
PSRR
TA = +25C
4
All
65
dB
Output current source
IO
+VIN = 1.0 V, -VIN = 0 V,
1
All
20
mA
(source)
+V = 15 V
IO
+VIN = 0 V, -VIN = +1.0 V,
(sink)
+V = 15 V
Output current sink
2,3
1
+VIN = 0 V, -VIN = +1.0 V,
VO = 200 mV
Power supply current
+V = 30 V
Short circuit current
IOS
10
5
1
12
All
mA
A
1.2
1
3.0
2,3
4.0
1
VO = 0 V
All
2,3
1,2,3
ICC
10
All
mA
-60
mA
1/
VO = 1.4 V dc, +V from 5 V dc to 30 V dc; and over full input common mode range ( 0 V dc to +V = -1.5 V dc ).
2/
The direction of the input current is out of the integrated circuit due to the PNP input state. This current is essentially
constant, independent of output state, so no loading change exists on the input lines.
3/
If not tested, shall be guaranteed to specified limit in table I herein.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 49 (see MIL-PRF-38535, appendix A).
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
SHEET
6
Device types
Case outlines
Terminal
number
01 and 02
A, C, D, X
2
Terminal symbol
1
VO 1
NC
2
-VIN 1
VO 1
3
+VIN 1
-VIN 1
4
+V
+VIN 1
5
+VIN 2
NC
6
-VIN 2
+V
7
VO 2
NC
8
VO 3
+VIN 2
9
-VIN 3
-VIN 2
10
+VIN 3
VO 2
11
GND
NC
12
+VIN 4
VO 3
13
-VIN 4
-VIN 3
14
VO 4
+VIN 3
15
---
NC
16
---
GND
17
---
NC
18
---
+VIN 4
19
---
-VIN 4
20
---
VO 4
NC = No connection
FIGURE 1. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
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4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) TA = +125C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table II herein.
4.2.2 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table II herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
SHEET
8
TABLE II. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
---
Device
class Q
---
Device
class V
---
1,2,3,4,5,6 1/
1,2,3,4,5,6 1/
1,2,3,4,5,6
1,2,3,4,5,6
1,2,3, 1/
4,5,6
1,2,3,4,5,6
1
1
1
1
1
1
---
---
---
1/ PDA applies to subgroup 1.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b.
TA = +125C, minimum.
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
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9
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a.
End-point electrical parameters shall be as specified in table II herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25C 5C,
after exposure, to the subgroups specified in table II herein.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-0544.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and
have agreed to this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime-VA.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
77043
A
REVISION LEVEL
R
SHEET
10
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 11-08-03
Approved sources of supply for SMD 77043 are listed below for immediate acquisition information only and shall be
added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to
include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of
compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is
superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an
online database of all current sources of supply at http://www.dscc.landandmaritime.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
Reference
military specification
PIN
3/
M38510/11005BAX
01295
LM124JB
M38510/11005BCX
27014
LM124J/883
4/
LM124DC/883B
7704301DA
01295
LM124WB
M38510/11005BDX
7704301XA
4/
LM124WG/883
---
77043012A
01295
LM124FKB
---
4/
LM124E/883
01295
LM124AJB
27014
LM124AJ/883
7704302DA
01295
LM124AWB
---
7704302XA
27014
LM124AWG/883
---
77043022A
01295
LM124AFKB
---
27014
LM124AE/883
01295
LM124JQMLV
7704301AA
7704301CA
7704302CA
5962-7704301VCA
---
---
1/ The lead finish shown for each PIN representing a hermetic package is the most
readily available from the manufacturer listed for that part. If the desired lead
finish is not listed contact the vendor to determine its availability.
2/ Caution. Do not use this number for item acquisition. Items acquired to this
number may not satisfy the performance requirements of this drawing.
3/ The “A” case outline is no longer available.
4/ Not available from an approved source of supply.
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STANDARD MICROCIRCUIT DRAWING BULLETIN – CONTINUED.
DATE: 11-08-03
Vendor CAGE
number
Vendor name
and address
01295
Texas Instruments, Incorporated
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
Point of contact: U.S. Highway 75 South
P.O. Box 84, M/S 853
Sherman, TX 75090-9493
27014
National Semiconductor
2900 Semiconductor Drive
P.O. Box 58090
Santa Clara, CA 95052-8090
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
2 of 2