REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED E Added vendor cage 88379 for device types 01 through 05. Figure 1; Added the pin reference numbers on the top view of case outline Y to indicate the pin orientation. -sld 99-03-29 K. A. Cottongim F Added vendor cage 88379 for the case outlines U and T. Table I; VOL test changed the test condition IOL from 12.0 mA to 8.0 mA. Redrew entire document. -sld 00-09-19 Raymond Monnin G Added vendor cage 0EU86 for device types 01 through 05. Updated drawing to reflect the latest requirements of MIL-PRF-38534. -sld 03-04-21 Raymond Monnin H Figure 1; Case outline Y, changed the dimension "D" min from 1.654 inches to 1.6 inches. Editorial changes troughout. -sld 05-02-07 Raymond Monnin J Updated drawing paragraphs. -sld 11-07-13 Charles F. Saffle REV SHEET REV SHEET J J J J J J J J 15 16 17 18 19 20 21 22 REV STATUS REV J J J J J J J J J J J J J J OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 CHECKED BY Michael C. Jones APPROVED BY Kendall A. Cottongim http://www.landandmaritime.dla.mil MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 128K X 8-BIT, MONOLITHIC SILICON DRAWING APPROVAL DATE 95-12-12 REVISION LEVEL J SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 1 OF 5962-96690 22 5962-E370-11 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 Federal stock class designator \ 96690 RHA designator (see 1.2.1) / \/ Drawing number 01 Device type (see 1.2.2) H Device class designator (see 1.2.3) X Case outline (see 1.2.4) X Lead finish (see 1.2.5) 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type 01 02 03 04 05 Generic number F128K8-150CQ5, F010-150/Q F128K8-120CQ5, F010-120/Q F128K8-90CQ5, F010-90/Q F128K8-70CQ5, F010-70Q F128K8-60CQ5, F010-60Q Circuit function FLASH EPROM, 128K x 8-bit FLASH EPROM, 128K x 8-bit FLASH EPROM, 128K x 8-bit FLASH EPROM, 128K x 8-bit FLASH EPROM, 128K x 8-bit Access time 150 ns 120 ns 90 ns 70 ns 60 ns 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 2 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter T U X Y Descriptive designator See figure 1 See figure 1 See figure 1 See figure 1 Terminals Package style 32 32 32 32 Flatpack, ceramic, single cavity Flatpack, ceramic, single cavity, lead formed SOJ, ceramic, single cavity DIP, ceramic, single cavity 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) 2/ .................................................... Signal voltage range (any pin except A9) 2/ .............................. Power dissipation (PD) ............................................................... Storage temperature range ........................................................ Lead temperature (soldering, 10 seconds) ................................ Data retention ............................................................................ Endurance (write/erase cycles) .................................................. A9 voltage for sector protect (VID) 3/ .......................................... -2.0 V dc to +7.0 V dc -2.0 V dc to +7.0 V dc 275 mW -65C to +150C +300C 10 years minimum 10,000 cycles minimum -2.0 V dc to +14.0 V dc 1.4 Recommended operating conditions. Supply voltage range (VCC) ........................................................ Input low voltage range (VIL) ...................................................... Input high voltage range (VIH) .................................................... Case operating temperature range (TC) ..................................... A9 voltage for sector protect (VID) .............................................. +4.5 V dc to +5.5 V dc -0.5 V dc to +0.8 V dc +2.0 V dc to VCC + 0.3 V dc -55 C to +125 C +11.5 V dc to +12.5 V dc 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Minimum DC voltage in input or I/O pins is -0.5 V dc. During voltage transitions, inputs may overshoot VSS to -2.0 V dc for periods up to 20 ns. Maximum DC voltage on output and I/O pins is VCC +0.5 V dc. During voltage transitions, outputs may overshoot to VCC +2.0 V dc for periods up to 20 ns. 3/ Minimum DC input voltage on A9 is -0.5 V dc. During voltage transitions, A9 may overshoot VSS to -2.0 V dc for periods up to 20 ns. Maximum DC input voltage on A9 is +13.5 V dc which may overshoot to +14.0 V dc for periods up to 20 ns. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 3 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3. 3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figure 4, 5, and 6. 3.2.5 Block diagram. The block diagram shall be as specified on figure 7. 3.3.6 Output load circuit. The output load circuit shall be as specified on figure 8. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Programming procedure. The programming procedure shall be as specified by the manufacturer and shall be available upon request. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked. 3.7 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 4 3.8 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein. 3.9 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 3.10 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This reprogrammability test shall be done for the initial characterization and after any design process changes which may affect the reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of program/erase cycles listed in section 1.3 herein over the full military temperature range. The vendors procedure shall be kept under document control and shall be made available upon request of the acquiring or preparing activity. 3.11 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall be done for initial characterization and after any design or process change which may affect data retention. The methods and procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of the acquiring or preparing activity. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 5 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Min Unit Max DC parameters Input leakage current ILI VCC = 5.5 V dc, VIN = GND to VCC 1,2,3 All 10 A Output leakage current ILO VCC = 5.5 V dc, VIN = GND to VCC 1,2,3 All 10 A VCC Active current for read ICC1 CS = VIL, OE = VIH 1,2,3 All 35 mA VCC Active current for program or erase 3/ ICC2 CS = VIL, OE = VIH 1,2,3 All 50 mA VCC standby current ICC3 VCC = 5.5 V dc, CS = VIH, f = 5 MHz 1,2,3 All 1.6 mA Input low level 3/ VIL 1,2,3 All 0.8 V Input high level 3/ VIH 1,2,3 All Output low voltage VOL VCC = 4.5 V dc, IOL = 8.0 mA 1,2,3 All Output high voltage VOH1 VCC = 4.5 V dc, IOH = -2.5 mA 1,2,3 All 0.85 X VCC V VOH2 VCC = 4.5 V dc, IOH = -100 A 1,2,3 All VCC 0.4 Vdc V OE capacitance 3/ COE VIN = 0 V, f = 1.0 MHz, TA = +25C 4 All 15 pF A0-A16 capacitance 3/ CAD VIN = 0 V, f = 1.0 MHz, TA = +25C 4 All 15 pF 2.0 V 0.45 V Dynamic characteristics See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Min Unit Max Dynamic characteristics - continued CS capacitance 3/ CCS VIN = 0 V dc, f = 1.0 MHz, TA = +25C 4 All 15 pF WE capacitance 3/ CWE VIN = 0 V dc, f = 1.0 MHz, TA = +25C 4 All 15 pF I/O0-I/O7 capacitance 3/ CI/O VIN = 0 V dc, f = 1.0 MHz, TA = +25C 4 All 15 pF 7A,8A,8B All Functional testing Functional tests See 4.3.1c Read cycle AC timing characteristics Read cycle time 3/ tRC See figure 4 9,10,11 01 02 03 04 05 Address access time tACC See figure 4 9,10,11 01 02 03 04 05 150 120 90 70 60 ns Chip select access time tCE See figure 4 9,10,11 01 02 03 04 05 150 120 90 70 60 ns Output enable to output valid tOE See figure 4 9,10,11 01 02 03 04 05 55 50 40 35 30 ns 150 120 90 70 60 ns See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 7 TABLE I. Electrical performance characteristics - Continued. Test Symbol Group A subgroups Conditions -55C TA +125C unless otherwise specified Device type Limits Min Unit Max Read cycle AC timing characteristics - Continued Chip select to output high Z 3/ tDF See figure 4 9,10,11 01 02 03 04,05 35 30 25 20 ns Output Enable to output high Z 3/ tDF See figure 4 9,10,11 01 02 03 04,05 35 30 25 20 ns Output hold from address, tOH See figure 4 9,10,11 All 0 ns CS or OE change, whichever is first 3/ Write cycle AC timing - Write/Erase/Program operations WE controlled Write cycle time 3/ tWC See figure 5 9,10,11 01 02 03 04 05 150 120 90 70 60 ns Chip select setup time tCS See figure 5 9,10,11 All 0 ns Write enable pulse width tWP See figure 5 9,10,11 01,02 03 04 05 50 45 35 30 ns Address setup time tAS See figure 5 9,10,11 All 0 ns Data setup time tDS See figure 5 9,10,11 01,02 03 04,05 50 45 30 ns Data hold time tDH See figure 5 9,10,11 All 0 ns See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 8 TABLE I. Electrical performance characteristics - Continued. Test Symbol Group A subgroups Conditions -55C TA +125C unless otherwise specified Device type Limits Min Unit Max Write cycle AC timing - Write/Erase/Program operations WE controlled - continued Address hold time tAH See figure 5 9,10,11 01,02 03-05 50 45 ns Write enable pulse width 3/ high tWPH See figure 5 9,10,11 All 20 ns Read recovery before 3/ write tGHWL See figure 5 9,10,11 All 0 ns Write cycle AC timing - Write/Erase/Program operations CS controlled Write cycle time 3/ tWC See figure 6 9,10,11 01 02 03 04 05 150 120 90 70 60 ns Write Enable setup time tWS See figure 6 9,10,11 All 0 ns Address setup time tAS See figure 6 9,10,11 All 0 ns Data setup time tDS See figure 6 9,10,11 01,02 03 04,05 50 45 30 ns Data hold time tDH See figure 6 9,10,11 All 0 ns Address hold time tAH See figure 6 9,10,11 01,02 03-05 50 45 ns Chip select pulse width tCP See figure 6 9,10,11 01,02 03 04 05 50 45 35 30 ns Chip select pulse width 3/ high tCPH See figure 6 9,10,11 All 20 ns Read recovery before 3/ write tGHEL See figure 6 9,10,11 All 0 ns See footnotes at top of next page. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 9 TABLE I. Electrical performance characteristics - Continued. 1/ Unless otherwise specified, 4.5 V VCC 5.5 V and VSS = 0 V. 2/ Unless otherwise specified, the DC test conditions are as follows: Input pulse levels: VIH = VCC - 0.3 V and VIL = 0.3 V. Unless otherwise specified, the AC test conditions are as follows: Input pulse levels: VIL = 0 V and VIH = 3.0 V. Input rise and fall times: 5 nanoseconds. Input and output timing reference levels: 1.5 V. 3/ Parameters shall be tested as part of device characterization and after design and process changes. Parameters shall be tested to the limits specified in table I for all lots not specifically tested. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 10 Case outline T Millimeters Symbol Min Inches Max A Min Max 3.18 .125 b 0.38 0.48 .015 .019 C 0.10 0.18 .004 .007 D1 18.92 19.18 .745 .755 E 10.29 10.41 .405 .415 E1 7.75 8.00 .305 .315 E2 1.27 TYP .050 TYP e 1.27 TYP .050 TYP L 9.65 10.67 .380 .420 Q 0.56 0.71 .022 .028 NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. For solder lead finish, dimensions b and C will increase by +.003 inches (+0.08 mm). 3. Pin numbers are for reference only. 4. The case outline T is available in either a pedestal or non-pedestal package. The Q dimension only applies to the pedestal version of case outline T. FIGURE 1. Case outline. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 11 Case outline U FIGURE 1. Case outline(s) - Continued STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 12 Case U outline - Continued Symbol Millimeters Min Inches Max A Min Max 3.35 .132 A1 2.41 3.18 .095 .125 A2 0.08 0.18 .003 .007 b 0.38 0.48 .015 .019 C 0.10 0.18 .004 .007 C2 0.76 TYP D 20.57 D1 .030 TYP 21.08 .810 19.05 TYP .830 .750 TYP E 10.29 10.54 .405 .415 E1 13.34 13.59 .525 .535 E2 7.75 8.00 .305 .315 E3 1.27 TYP .050 TYP e 1.27 TYP .050 TYP eA 11.07 TYP .436 TYP L 1.52 TYP .060 TYP Q 0.56 R 0.71 .022 0.18 TYP .028 .007 TYP NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. For solder lead finish, dimensions b and C will increase by +.003 inches (+0.08 mm). 3. Pin numbers are for reference only. 4. The case outline U is available in either a pedestal or non-pedestal package. The Q dimension only applies to the pedestal version of case outline U. FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 13 Case Outline X Symbol Millimeters Inches Min Max Min Max A 2.70 3.70 .106 .156 A1 1.02 1.52 .040 .060 b 0.38 0.48 .015 .019 C 0.15 0.25 .006 .010 D 20.83 21.34 .820 .840 D1 18.92 19.18 .745 .755 E 10.80 11.05 .425 .435 e 1.27 TYP eA 9.30 R .050 TYP 9.80 .366 0.89 TYP .386 .035 TYP NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. For solder lead finish, dimensions b and C will increase by +.003 inches (+0.08 mm). FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 14 Case outline Y Symbol Millimeters Inches Min Max Min Max A 3.56 5.13 .140 .202 A1 0.48 1.19 .019 .047 A2 3.18 4.90 .125 .193 B 0.23 0.30 .009 .012 B1 14.99 15.49 .590 .610 D 40.64 42.82 1.6 1.686 D1 14.73 15.34 .580 .604 D2 37.90 38.30 1.492 1.508 e 2.41 2.67 .095 .105 e1 0.41 0.51 .016 .020 NOTES: 1. The U.S preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. For solder lead finish, dimensions B and e1 will increase by +.003 inches (+0.08mm). 3. Pin numbers are for reference only. FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 15 Device types All Device types All Case outlines All Case outlines All Terminal number Terminal symbol Terminal number Terminal symbol 1 NC 17 I/O3 2 A16 18 I/O4 3 A15 19 I/O5 4 A12 20 I/O6 5 A7 21 I/O7 6 A6 22 CS 7 A5 23 A10 8 A4 24 OE 9 A3 25 A11 10 A2 26 A9 11 A1 27 A8 12 A0 28 A13 13 I/O0 29 A14 14 I/O1 30 NC 15 I/O2 31 WE 16 VSS 32 VCC FIGURE 2. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 16 CS OE WE Mode Data I/O Device Current H X X Standby High Z Standby L L H Read Data Out Active L H L WrIte Data In Active NOTES: 1. H = VIH = High Logic Level 2. L = VIL = Low Logic Level 3. X = Do not care (either high or low) 4. High Z = High impedance state FIGURE 3. Truth table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 17 FIGURE 4. Read cycle timing diagram. FIGURE 5. Write/Erase/Program operations, WE controlled. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 18 Notes: 1. PA represents the address of the memory location to be programmed. 2. PD represents the data to be programmed at byte address. 3. D7 is the output of the complement of the data written to the device. 4. DOUT is the output of the data written to the device. 5. Figures indicate the last two bus cycles of a four bus cycle sequence. FIGURE 6. Write/Erase operations, CS controlled. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 19 FIGURE 7. Block diagram. FIGURE 8. Typical output test circuit. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 20 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1,4,7,9 Final electrical parameters 1*,2,3,4,7,8A,8B,9,10,11 Group A test requirements 1,2,3,4,7,8A,8B,9,10,11 Group C end-point electrical parameters 1,2,3,4,7,8A,8B,9,10,11 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 21 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table on figure 3. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990, or telephone (614) 692-1081. 6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime -VA and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-96690 A REVISION LEVEL J SHEET 22 STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN DATE: 11-07-13 Approved sources of supply for SMD 5962-96690 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/. Vendor CAGE number Vendor similar PIN 2/ 5962-9669001HTA 5962-9669001HTA 5962-9669001HTA 5962-9669001HTC 5962-9669001HTC 5962-9669001HTC 5962-9669001HUA 5962-9669001HUA 5962-9669001HUA 5962-9669001HUC 5962-9669001HUC 5962-9669001HUC 5962-9669001HXA 5962-9669001HXC 5962-9669001HYA 5962-9669001HYA 5962-9669001HYA 5962-9669001HYC 5962-9669001HYC 5692-9669001HYC 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 54230 54230 0EU86 54230 88379 0EU86 54230 88379 AS29F010F-150/Q WMF128K8-150FEQ5 ACT-F128K8N-150F6Q AS29F010F-150/Q WMF128K8-150FEQ5 ACT-F128K8N-150F6Q AS29F010DCG-150/Q WMF128K8-150FFQ5 ACT-F128K8N-150F7Q AS29F010DCG-150/Q WMF128K8-150FFQ5 ACT-F128K8N-150F7Q WMF128K8-150DEQ5 WMF128K8-150DEQ5 AS29F010CW-150/Q WMF128K8-150CQ5 ACT-F128K8N-150P4Q AS29F010CW-150/Q WMF128K8-150CQ5 ACT-F128K8N-150P4Q 5962-9669002HTA 5962-9669002HTA 5962-9669002HTA 5962-9669002HTC 5962-9669002HTC 5962-9669002HTC 5962-9669002HUA 5962-9669002HUA 5962-9669002HUA 5962-9669002HUC 5962-9669002HUC 5962-9669002HUC 5962-9669002HXA 5962-9669002HXC 5962-9669002HYA 5962-9669002HYA 5962-9669002HYA 5962-9669002HYC 5962-9669002HYC 5692-9669002HYC 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 54230 54230 0EU86 54230 88379 0EU86 54230 88379 AS29F010F-120/Q WMF128K8-120FEQ5 ACT-F128K8N-120F6Q AS29F010F-120/Q WMF128K8-120FEQ5 ACT-F128K8N-120F6Q AS29F010DCG-120/Q WMF128K8-120FFQ5 ACT-F128K8N-120F7Q AS29F010DCG-120/Q WMF128K8-120FFQ5 ACT-F128K8N-120F7Q WMF128K8-120DEQ5 WMF128K8-120DEQ5 AS29F010CW-120/Q WMF128K8-120CQ5 ACT-F128K8N-120P4Q AS29F010CW-120/Q WMF128K8-120CQ5 ACT-F128K8N-120P4Q Standard microcircuit drawing PIN 1/ 1 of 3 STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN - CONTINUED DATE: 11-07-13 Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-9669003HTA 5962-9669003HTA 5962-9669003HTA 5962-9669003HTC 5962-9669003HTC 5962-9669003HTC 5962-9669003HUA 5962-9669003HUA 5962-9669003HUA 5962-9669003HUC 5962-9669003HUC 5962-9669003HUC 5962-9669003HXA 5962-9669003HXC 5962-9669003HYA 5962-9669003HYA 5962-9669003HYA 5962-9669003HYC 5962-9669003HYC 5692-9669003HYC 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 54230 54230 0EU86 54230 88379 0EU86 54230 88379 AS29F010F-90/Q WMF128K8-90FEQ5 ACT-F128K8N-090F6Q AS29F010F-90/Q WMF128K8-90FEQ5 ACT-F128K8N-090F6Q AS29F010DCG-90/Q WMF128K8-90FFQ5 ACT-F128K8N-090F7Q AS29F010DCG-90/Q WMF128K8-90FFQ5 ACT-F128K8N-090F7Q WMF128K8-90DEQ5 WMF128K8-90DEQ5 AS29F010CW-90/Q WMF128K8-90CQ5 ACT-F128K8N-090P4Q AS29F010CW-90/Q WMF128K8-90CQ5 ACT-F128K8N-090P4Q 5962-9669004HTA 5962-9669004HTA 5962-9669004HTA 5962-9669004HTC 5962-9669004HTC 5962-9669004HTC 5962-9669004HUA 5962-9669004HUA 5962-9669004HUA 5962-9669004HUC 5962-9669004HUC 5962-9669004HUC 5962-9669004HXA 5962-9669004HXC 5962-9669004HYA 5962-9669004HYA 5962-9669004HYA 5962-9669004HYC 5962-9669004HYC 5692-9669004HYC 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 54230 54230 0EU86 54230 88379 0EU86 54230 88379 AS29F010F-70/Q WMF128K8-70FEQ5 ACT-F128K8N-070F6Q AS29F010F-70/Q WMF128K8-70FEQ5 ACT-F128K8N-070F6Q AS29F010DCG-70/Q WMF128K8-70FFQ5 ACT-F128K8N-070F7Q AS29F010DCG-70/Q WMF128K8-70FFQ5 ACT-F128K8N-070F7Q WMF128K8-70DEQ5 WMF128K8-70DEQ5 AS29F010CW-70/Q WMF128K8-70CQ5 ACT-F128K8N-070P4Q AS29F010CW-70/Q WMF128K8-70CQ5 ACT-F128K8N-070P4Q 2 of 3 STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN - CONTINUED DATE: 11-07-13 Standard microcircuit drawing PIN 1/ 5962-9669005HTA 5962-9669005HTA 5962-9669005HTA 5962-9669005HTC 5962-9669005HTC 5962-9669005HTC 5962-9669005HUA 5962-9669005HUA 5962-9669005HUA 5962-9669005HUC 5962-9669005HUC 5962-9669005HUC 5962-9669005HXA 5962-9669005HXC 5962-9669005HYA 5962-9669005HYA 5962-9669005HYA 5962-9669005HYC 5962-9669005HYC 5692-9669005HYC Vendor CAGE number Vendor similar PIN 2/ 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 0EU86 54230 88379 54230 54230 0EU86 54230 88379 0EU86 54230 88379 AS29F010F-60/Q WMF128K8-60FEQ5 ACT-F128K8N-060F6Q AS29F010F-60/Q WMF128K8-60FEQ5 ACT-F128K8N-060F6Q AS29F010DCG-60/Q WMF128K8-60FFQ5 ACT-F128K8N-060F7Q AS29F010DCG-60/Q WMF128K8-60FFQ5 ACT-F128K8N-060F7Q WMF128K8-60DEQ5 WMF128K8-60DEQ5 AS29F010CW-60/Q WMF128K8-60CQ5 ACT-F128K8N-060P4Q AS29F010CW-60/Q WMF128K8-60CQ5 ACT-F128K8N-060P4Q 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number Vendor name and address 0EU86 Austin Semiconductor Incorporated DBA Micross Components 8701 Cross Park Drive Suite 105 Austin, TX 78754 54230 White Electronic Designs Corporation Military Division 3601 East University Drive Phoenix, AZ 85034 88379 Aeroflex Plainview Incorporated DBA Comstron Division 35 South Service Road Plainview, NY 11803 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin. 3 of 3