Tin Whisker Reliability Report

Whisker Growth Reliability Test Result
Reliability Engineering
Linear Technology Corporation
Summary of LTC Tin Whisker Monitor Program
1
MONITOR PROGRAM
•
Tin Whisker Monitor Program is by package type and assembly location
•
All devices assembled at LTC Penang come from the same tin plating line
FAILURE CRITERIA
•
Temperature cycling (-40°C / +85°C for 2000 T/C): <45µm, measurement method in
accordance to JEDEC standard JESD201
•
Hi-temp/Humidity storage (60°C/85%RH) and ambient temperature/humity storage
(30°C/60%RH): <40µm, measurement method in accordance to JEDEC standard JESD201
•
Preconditions, storage conditions, failure criteria, inspection method conform to
JEDEC standard JESD201
INSPECTION METHOD
•
SEM measurement taken on the longest whisker of any samples
CONCLUSION
•
No whisker growth exceeding JEDEC JESD201 spec criteria as monitor devices completed
2000TC and 4000hrs HT/humidity storage evaluation
© 2005 Linear Technology
Tin Whisker Growth Evaluation (Q3 FY'2015)
Temperature Cycle Storage (+85'C/-40'C)
1000C
Device
Lot
Date
Code
L/F
Assembly
2000C
Without
IR @
IR @
Without
IR @
IR @
IR
215'C
260'C
IR
215'C
260'C
LT3080EST#TRPBF
744984.1
1401
CU
Car-M
0/96
0/96
0/96
0/96
0/96
0/96
LTC2634IMSE-LZ12#PBF
746660.1
1403
CU
PG
0/100
0/100
0/100
0/100
0/100
0/100
LT3505EDD#TRPBF
747160.1
1403
CU
PG
0/96
0/96
0/96
0/96
0/96
0/96
LT3082ETS8#TRPBF
747694.1
1404
CU
PG
0/96
0/96
0/96
0/96
0/96
0/96
LT1571EGN-2#TRPBF
747845.1
1404
CU
UTL
0/112
0/112
0/112
0/112
0/112
0/112
LT1939EDD#TRPBF
748058.1
1404
CU
UTL
0/96
0/96
0/96
0/96
0/96
0/96
LTC3412AFE#TRPBF
749457.1
1406
CU
PG
0/96
0/96
0/96
0/96
0/96
0/96
LTC2226HLX#3HCPBF
Z25664.1
1346
CU
ASE(G)
0/96
0/96
0/96
0/96
0/96
0/96
Temperature Humidity Storage (60'C / 85%RH)
1000hrs
Device
Lot
Date
Code
L/F
Assembly
2000hrs
3000hrs
4000hrs
Without
IR @
IR @
Without
IR @
IR @
Without
IR @
IR @
Without
IR @
IR @
IR
215'C
260'C
IR
215'C
260'C
IR
215'C
260'C
IR
215'C
260'C
LT3080EST#TRPBF
744984.1
1401
CU
Car-M
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
LTC2634IMSE-LZ12#PBF
746660.1
1403
CU
PG
0/100
0/100
0/100
0/100
0/100
0/100
0/100
0/100
0/100
0/100
0/100
0/100
LT3505EDD#TRPBF
747160.1
1403
CU
PG
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
LT3082ETS8#TRPBF
747694.1
1404
CU
PG
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
LT1571EGN-2#TRPBF
747845.1
1404
CU
UTL
0/112
0/112
0/112
0/112
0/112
0/112
0/112
0/112
0/112
0/112
0/112
0/112
LT1939EDD#TRPBF
748058.1
1404
CU
UTL
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
LTC3412AFE#TRPBF
749457.1
1406
CU
PG
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
LTC2226HLX#3HCPBF
Z25664.1
1346
CU
ASE(G)
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
0/96
FAILURE CRITERIA
Temperature cycling : <45um, measurement method in accordance to JEDEC standard No.201
Ambient and Hi-temp/Humidity storage : < 40um, measurement method in accordance to JEDEC standard No.201
Temperature Cycle Storage (+85'C/-40'C) @ 1000C
Device : LT3080EST#TRPBF
Lot : 744984.1
Without IR
31.0um
Date Code : 1401
IR @ 215C
IR @ 260C
34.3um
Device : LTC2634IMSE-LZ12#PBF
Lot : 746660.1
Without IR
28.5um
28.1um
Leadframe : Cu
Assembly : PG
Date Code : 1403
IR @ 215C
IR @ 260C
25.6um
Device : LT3505EDD#TRPBF
Lot : 747160.1
Without IR
19.2um
25.7um
Leadframe : Cu
Assembly : PG
Date Code : 1403
IR @ 215C
IR @ 260C
23.9um
Device : LT3082ETS8#TRPBF
Lot : 747694.1
Without IR
29.6um
Leadframe : Cu
Assembly : Carsem(M)
34.3um
18.1um
Leadframe : Cu
Assembly : PG
Date Code : 1404
IR @ 215C
IR @ 260C
37.1um
Device : LT1571EGN-2#TRPBF
Lot : 747845.1
Without IR
31.6um
Date Code : 1404
IR @ 215C
IR @ 260C
32.1um
Device : LT1939EDD#TRPBF
Lot : 748058.1
Without IR
24.4um
29.5um
Leadframe : Cu
Assembly : UTL
Date Code : 1404
IR @ 215C
IR @ 260C
18.7um
Device : LTC3412AEFE#TRPBF
Lot : 749457.1
Without IR
24.4um
21.6um
Leadframe : Cu
Assembly : PG
Date Code : 1406
IR @ 215C
IR @ 260C
28.8um
Device : LTC2226HLX#3HCPBF
Lot : Z25664.1
Without IR
26.3um
Leadframe : Cu
Assembly : UTL
22.4um
29.4um
Leadframe : Cu
Assembly : ASE(G)
Date Code : 1346
IR @ 215C
IR @ 260C
25.1um
Temperature Cycle Storage (+85'C/-40'C) @ 2000C
Device : LT3080EST#TRPBF
Lot : 744984.1
Without IR
44.1um
Date Code : 1401
IR @ 215C
IR @ 260C
36.8um
Device : LTC2634IMSE-LZ12#PBF
Lot : 746660.1
Without IR
35.5um
32.5um
Leadframe : Cu
Assembly : PG
Date Code : 1403
IR @ 215C
IR @ 260C
34.0um
Device : LT3505EDD#TRPBF
Lot : 747160.1
Without IR
22.0um
34.1um
Leadframe : Cu
Assembly : PG
Date Code : 1403
IR @ 215C
IR @ 260C
32.0um
Device : LT3082ETS8#TRPBF
Lot : 747694.1
Without IR
38.5um
Leadframe : Cu
Assembly : Carsem(M)
44.4um
23.8um
Leadframe : Cu
Assembly : PG
Date Code : 1404
IR @ 215C
IR @ 260C
41.2um
Device : LT1571EGN-2#TRPBF
Lot : 747845.1
Without IR
37.8um
Date Code : 1404
IR @ 215C
IR @ 260C
34.8um
Device : LT1939EDD#TRPBF
Lot : 748058.1
Without IR
25.0um
33.3um
Leadframe : Cu
Assembly : UTL
Date Code : 1404
IR @ 215C
IR @ 260C
29.2um
Device : LTC3412AEFE#TRPBF
Lot : 749457.1
Without IR
28.2um
27.4um
Leadframe : Cu
Assembly : PG
Date Code : 1406
IR @ 215C
IR @ 260C
33.0um
Device : LTC2226HLX#3HCPBF
Lot : Z25664.1
Without IR
30.5um
Leadframe : Cu
Assembly : UTL
30.5um
37.2um
Leadframe : Cu
Assembly : ASE(G)
Date Code : 1346
IR @ 215C
IR @ 260C
34.5um
Temperature Cycle Storage (+85'C/-40'C)
LT3080EST#TRPBF / 744984.1
Device : LT3080EST#TRPBF
50
Lot : 744984.1
40
2K
No IR
31
44.1
IR @ 215C
34.3
36.8
IR @ 260C
28.1
32.5
UM
1K
30
20
1K
No IR
2K
IR @ 215C
IR @ 260C
LTC2634IMSE-LZ12#PBF / 746660.1
40
Device : LTC2634IMSE-LZ12#PBF
37
Lot : 746660.1
UM
34
1K
2K
31
No IR
28.5
35.5
28
IR @ 215C
25.6
34
IR @ 260C
25.7
34.1
25
1K
No IR
2K
IR @ 215C
IR @ 260C
UM
LT3505EDD#TRPBF / 747160.1
40
Device : LT3505EDD#TRPBF
35
Lot : 747160.1
30
1K
2K
25
No IR
19.2
22
20
IR @ 215C
23.9
32
IR @ 260C
18.1
23.8
15
1K
No IR
2K
IR @ 215C
IR @ 260C
LT3082ETS8#TRPBF / 747694.1
Device : LT3082ETS8#TRPBF
49
Lot : 747694.1
41
2K
No IR
29.6
38.5
IR @ 215C
34.3
44.4
IR @ 260C
37.1
41.2
UM
1K
33
25
1K
No IR
2K
IR @ 215C
IR @ 260C
UM
LT1571EGN-2#TRPBF / 747845.1
40
Device : LT1571EGN-2#TRPBF
37
Lot : 747845.1
1K
2K
No IR
31.6
37.8
IR @ 215C
32.1
34.8
IR @ 260C
29.5
33.3
34
31
28
1K
No IR
2K
IR @ 215C
IR @ 260C
LT1939EDD#TRPBF / 748058.1
36
Device : LT1939EDD#TRPBF
Lot : 748058.1
UM
29
22
15
1K
No IR
2K
IR @ 215C
1K
2K
No IR
24.4
25
IR @ 215C
18.7
29.2
IR @ 260C
21.6
27.4
IR @ 260C
LTC3412AEFE#TRPBF / 749457.1
Device : LTC3412AEFE#TRPBF
41
Lot : 749457.1
35
2K
No IR
24.4
28.2
IR @ 215C
28.8
33
IR @ 260C
29.4
37.2
UM
1K
29
23
1K
No IR
2K
IR @ 215C
IR @ 260C
LTC2226HLX#3HCPBF / Z25664.1
Device : LTC2226HLX#3HCPBF
40
UM
Lot : Z25664.1
1K
2K
No IR
26.3
30.5
IR @ 215C
22.4
30.5
IR @ 260C
25.1
34.5
30
20
1K
No IR
2K
IR @ 215C
IR @ 260C
Tin Whisker Growth Evaluation (Q3 FY'2015)
Evaluation Flow: 24hrs bake @ 125C - [email protected] - 100TC (+150C/ -60C)
48hrs PCT - 4000hrs storage at ambient (30 ±2 °C and 60 ±3% RH )
Source:UTL FR0274 LF QUAL
Device
LT1341CG
Lot
Date
Code
L/F
Assembly
Start Date
4000hrs
SEM result
764866.1
1422
CU
N
11-Aug-14
30-Jan-15
0/112
FAILURE CRITERIA
Ambient and Hi-temp/Humidity storage : < 40um, measurement method in accordance to JEDEC standard No.201