Whisker Growth Reliability Test Result Reliability Engineering Linear Technology Corporation Summary of LTC Tin Whisker Monitor Program 1 MONITOR PROGRAM • Tin Whisker Monitor Program is by package type and assembly location • All devices assembled at LTC Penang come from the same tin plating line FAILURE CRITERIA • Temperature cycling (-40°C / +85°C for 2000 T/C): <45µm, measurement method in accordance to JEDEC standard JESD201 • Hi-temp/Humidity storage (60°C/85%RH) and ambient temperature/humity storage (30°C/60%RH): <40µm, measurement method in accordance to JEDEC standard JESD201 • Preconditions, storage conditions, failure criteria, inspection method conform to JEDEC standard JESD201 INSPECTION METHOD • SEM measurement taken on the longest whisker of any samples CONCLUSION • No whisker growth exceeding JEDEC JESD201 spec criteria as monitor devices completed 2000TC and 4000hrs HT/humidity storage evaluation © 2005 Linear Technology Tin Whisker Growth Evaluation (Q3 FY'2015) Temperature Cycle Storage (+85'C/-40'C) 1000C Device Lot Date Code L/F Assembly 2000C Without IR @ IR @ Without IR @ IR @ IR 215'C 260'C IR 215'C 260'C LT3080EST#TRPBF 744984.1 1401 CU Car-M 0/96 0/96 0/96 0/96 0/96 0/96 LTC2634IMSE-LZ12#PBF 746660.1 1403 CU PG 0/100 0/100 0/100 0/100 0/100 0/100 LT3505EDD#TRPBF 747160.1 1403 CU PG 0/96 0/96 0/96 0/96 0/96 0/96 LT3082ETS8#TRPBF 747694.1 1404 CU PG 0/96 0/96 0/96 0/96 0/96 0/96 LT1571EGN-2#TRPBF 747845.1 1404 CU UTL 0/112 0/112 0/112 0/112 0/112 0/112 LT1939EDD#TRPBF 748058.1 1404 CU UTL 0/96 0/96 0/96 0/96 0/96 0/96 LTC3412AFE#TRPBF 749457.1 1406 CU PG 0/96 0/96 0/96 0/96 0/96 0/96 LTC2226HLX#3HCPBF Z25664.1 1346 CU ASE(G) 0/96 0/96 0/96 0/96 0/96 0/96 Temperature Humidity Storage (60'C / 85%RH) 1000hrs Device Lot Date Code L/F Assembly 2000hrs 3000hrs 4000hrs Without IR @ IR @ Without IR @ IR @ Without IR @ IR @ Without IR @ IR @ IR 215'C 260'C IR 215'C 260'C IR 215'C 260'C IR 215'C 260'C LT3080EST#TRPBF 744984.1 1401 CU Car-M 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 LTC2634IMSE-LZ12#PBF 746660.1 1403 CU PG 0/100 0/100 0/100 0/100 0/100 0/100 0/100 0/100 0/100 0/100 0/100 0/100 LT3505EDD#TRPBF 747160.1 1403 CU PG 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 LT3082ETS8#TRPBF 747694.1 1404 CU PG 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 LT1571EGN-2#TRPBF 747845.1 1404 CU UTL 0/112 0/112 0/112 0/112 0/112 0/112 0/112 0/112 0/112 0/112 0/112 0/112 LT1939EDD#TRPBF 748058.1 1404 CU UTL 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 LTC3412AFE#TRPBF 749457.1 1406 CU PG 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 LTC2226HLX#3HCPBF Z25664.1 1346 CU ASE(G) 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 0/96 FAILURE CRITERIA Temperature cycling : <45um, measurement method in accordance to JEDEC standard No.201 Ambient and Hi-temp/Humidity storage : < 40um, measurement method in accordance to JEDEC standard No.201 Temperature Cycle Storage (+85'C/-40'C) @ 1000C Device : LT3080EST#TRPBF Lot : 744984.1 Without IR 31.0um Date Code : 1401 IR @ 215C IR @ 260C 34.3um Device : LTC2634IMSE-LZ12#PBF Lot : 746660.1 Without IR 28.5um 28.1um Leadframe : Cu Assembly : PG Date Code : 1403 IR @ 215C IR @ 260C 25.6um Device : LT3505EDD#TRPBF Lot : 747160.1 Without IR 19.2um 25.7um Leadframe : Cu Assembly : PG Date Code : 1403 IR @ 215C IR @ 260C 23.9um Device : LT3082ETS8#TRPBF Lot : 747694.1 Without IR 29.6um Leadframe : Cu Assembly : Carsem(M) 34.3um 18.1um Leadframe : Cu Assembly : PG Date Code : 1404 IR @ 215C IR @ 260C 37.1um Device : LT1571EGN-2#TRPBF Lot : 747845.1 Without IR 31.6um Date Code : 1404 IR @ 215C IR @ 260C 32.1um Device : LT1939EDD#TRPBF Lot : 748058.1 Without IR 24.4um 29.5um Leadframe : Cu Assembly : UTL Date Code : 1404 IR @ 215C IR @ 260C 18.7um Device : LTC3412AEFE#TRPBF Lot : 749457.1 Without IR 24.4um 21.6um Leadframe : Cu Assembly : PG Date Code : 1406 IR @ 215C IR @ 260C 28.8um Device : LTC2226HLX#3HCPBF Lot : Z25664.1 Without IR 26.3um Leadframe : Cu Assembly : UTL 22.4um 29.4um Leadframe : Cu Assembly : ASE(G) Date Code : 1346 IR @ 215C IR @ 260C 25.1um Temperature Cycle Storage (+85'C/-40'C) @ 2000C Device : LT3080EST#TRPBF Lot : 744984.1 Without IR 44.1um Date Code : 1401 IR @ 215C IR @ 260C 36.8um Device : LTC2634IMSE-LZ12#PBF Lot : 746660.1 Without IR 35.5um 32.5um Leadframe : Cu Assembly : PG Date Code : 1403 IR @ 215C IR @ 260C 34.0um Device : LT3505EDD#TRPBF Lot : 747160.1 Without IR 22.0um 34.1um Leadframe : Cu Assembly : PG Date Code : 1403 IR @ 215C IR @ 260C 32.0um Device : LT3082ETS8#TRPBF Lot : 747694.1 Without IR 38.5um Leadframe : Cu Assembly : Carsem(M) 44.4um 23.8um Leadframe : Cu Assembly : PG Date Code : 1404 IR @ 215C IR @ 260C 41.2um Device : LT1571EGN-2#TRPBF Lot : 747845.1 Without IR 37.8um Date Code : 1404 IR @ 215C IR @ 260C 34.8um Device : LT1939EDD#TRPBF Lot : 748058.1 Without IR 25.0um 33.3um Leadframe : Cu Assembly : UTL Date Code : 1404 IR @ 215C IR @ 260C 29.2um Device : LTC3412AEFE#TRPBF Lot : 749457.1 Without IR 28.2um 27.4um Leadframe : Cu Assembly : PG Date Code : 1406 IR @ 215C IR @ 260C 33.0um Device : LTC2226HLX#3HCPBF Lot : Z25664.1 Without IR 30.5um Leadframe : Cu Assembly : UTL 30.5um 37.2um Leadframe : Cu Assembly : ASE(G) Date Code : 1346 IR @ 215C IR @ 260C 34.5um Temperature Cycle Storage (+85'C/-40'C) LT3080EST#TRPBF / 744984.1 Device : LT3080EST#TRPBF 50 Lot : 744984.1 40 2K No IR 31 44.1 IR @ 215C 34.3 36.8 IR @ 260C 28.1 32.5 UM 1K 30 20 1K No IR 2K IR @ 215C IR @ 260C LTC2634IMSE-LZ12#PBF / 746660.1 40 Device : LTC2634IMSE-LZ12#PBF 37 Lot : 746660.1 UM 34 1K 2K 31 No IR 28.5 35.5 28 IR @ 215C 25.6 34 IR @ 260C 25.7 34.1 25 1K No IR 2K IR @ 215C IR @ 260C UM LT3505EDD#TRPBF / 747160.1 40 Device : LT3505EDD#TRPBF 35 Lot : 747160.1 30 1K 2K 25 No IR 19.2 22 20 IR @ 215C 23.9 32 IR @ 260C 18.1 23.8 15 1K No IR 2K IR @ 215C IR @ 260C LT3082ETS8#TRPBF / 747694.1 Device : LT3082ETS8#TRPBF 49 Lot : 747694.1 41 2K No IR 29.6 38.5 IR @ 215C 34.3 44.4 IR @ 260C 37.1 41.2 UM 1K 33 25 1K No IR 2K IR @ 215C IR @ 260C UM LT1571EGN-2#TRPBF / 747845.1 40 Device : LT1571EGN-2#TRPBF 37 Lot : 747845.1 1K 2K No IR 31.6 37.8 IR @ 215C 32.1 34.8 IR @ 260C 29.5 33.3 34 31 28 1K No IR 2K IR @ 215C IR @ 260C LT1939EDD#TRPBF / 748058.1 36 Device : LT1939EDD#TRPBF Lot : 748058.1 UM 29 22 15 1K No IR 2K IR @ 215C 1K 2K No IR 24.4 25 IR @ 215C 18.7 29.2 IR @ 260C 21.6 27.4 IR @ 260C LTC3412AEFE#TRPBF / 749457.1 Device : LTC3412AEFE#TRPBF 41 Lot : 749457.1 35 2K No IR 24.4 28.2 IR @ 215C 28.8 33 IR @ 260C 29.4 37.2 UM 1K 29 23 1K No IR 2K IR @ 215C IR @ 260C LTC2226HLX#3HCPBF / Z25664.1 Device : LTC2226HLX#3HCPBF 40 UM Lot : Z25664.1 1K 2K No IR 26.3 30.5 IR @ 215C 22.4 30.5 IR @ 260C 25.1 34.5 30 20 1K No IR 2K IR @ 215C IR @ 260C Tin Whisker Growth Evaluation (Q3 FY'2015) Evaluation Flow: 24hrs bake @ 125C - 2XIR@260C - 100TC (+150C/ -60C) 48hrs PCT - 4000hrs storage at ambient (30 ±2 °C and 60 ±3% RH ) Source:UTL FR0274 LF QUAL Device LT1341CG Lot Date Code L/F Assembly Start Date 4000hrs SEM result 764866.1 1422 CU N 11-Aug-14 30-Jan-15 0/112 FAILURE CRITERIA Ambient and Hi-temp/Humidity storage : < 40um, measurement method in accordance to JEDEC standard No.201