R552 - Reliability Data

Reliability Data Report
Product Family R552
LT6654 / LT6656 / LT6657
Reliability Data Report
Report Number: R552
Report generated on: Wed Apr 06 17:02:49 PDT 2016
OPERATING LIFE TEST
PACKAGE TYPE
SOT
Totals
SAMPLE SIZE
622
622
OLDEST DATE
NEWEST DATE
K DEVICE HRS
CODE
CODE
(+125°C)
0935
-
1406
-
634
634
1
No. of FAILURES
2,3
0
0
HIGHLY ACCELERATED STRESS TEST AT +130 DEG C / 85% RH
PACKAGE TYPE
SOT
Totals
SAMPLE SIZE
541
541
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
4
CODE
CODE
(+85°C)
1010
-
1406
-
2093
2,093
0
0
K DEVICE HRS
No. of FAILURES
PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C
PACKAGE TYPE
SAMPLE SIZE
QFN/DFN
50
SOT
Totals
2576
2,626
OLDEST DATE
NEWEST DATE
CODE
CODE
1245
1245
1
0
0946
-
1411
-
116
117
0
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
CYCLES
TEMP CYCLE FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
CODE
CODE
QFN/DFN
50
1245
1245
5
0
SOT
Totals
2926
2,976
0946
-
1411
-
500
505
0
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
THERMAL SHOCK FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
CODE
CODE
CYCLES
QFN/DFN
SOT
50
2870
1245
0946
1245
1411
5
493
0
0
Totals
2,920
-
-
498
0
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
CODE
CODE
1313
-
1313
-
154
154
0
0
HIGH TEMPERATURE BAKE AT 175 DEG C
PACKAGE TYPE
SOT
Totals
SAMPLE SIZE
154
154
(1) Assumes Activation Energy = 1.0 Electron Volts
(2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =2.89 FITS
(3) Mean Time Between Failure in Years = 39479.88
(4) Assumes 20X Acceleration from 85 °C to +130 °C
Note 1: 1 FIT = 1 Failure in One Billion Hours.
Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL Preconditioning
Reliability Data Report
Report Number: R552
Report generated on: Wed Apr 06 17:02:49 PDT 2016
HIGH TEMPERATURE BAKE AT 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
OLDEST DATE
NEWEST DATE
QFN/DFN
50
SOT
Totals
K DEVICE HRS
No. of FAILURES
CODE
CODE
1245
154
1010
1245
50
0
1010
154
204
-
0
-
204
0