R565 - Reliability Data

Reliability Data Report
Product Family R565
LTC6945 / LTC6946 / LTC6947 /
LTC6948 / LTC6950 / LTC6954 /
LTC6957
Reliability Data Report
Report Number: R565
Report generated on: Wed Feb 10 17:21:00 PST 2016
OPERATING LIFE TEST
PACKAGE TYPE
SOIC/MSOP
QFN/DFN
Totals
SAMPLE SIZE
77
233
310
OLDEST DATE
NEWEST DATE
K DEVICE HRS
1
No. of FAILURES
2,3
CODE
CODE
(+125°C)
1133
1002
-
1133
1352
-
77
598
675
0
0
0
K DEVICE HRS
No. of FAILURES
PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C
PACKAGE TYPE
SAMPLE SIZE
QFN/DFN
306
Totals
306
OLDEST DATE
NEWEST DATE
CODE
CODE
1238
1302
77
0
-
-
77
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
CODE
CODE
CYCLES
1249
-
1302
-
153
153
0
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
TEMP CYCLE FROM -65 TO 150 DEG C
PACKAGE TYPE
QFN/DFN
Totals
SAMPLE SIZE
230
230
THERMAL SHOCK FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
CODE
CODE
CYCLES
QFN/DFN
230
1249
1302
115
0
Totals
230
-
-
115
0
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
CODE
CODE
1238
-
1249
-
88
88
0
0
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
CODE
CODE
1250
-
1302
-
77
77
0
0
HIGH TEMPERATURE BAKE AT 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
QFN/DFN
Totals
127
127
HIGH TEMPERATURE BAKE AT 175 DEG C
PACKAGE TYPE
SAMPLE SIZE
QFN/DFN
Totals
154
154
(1) Assumes Activation Energy = 0.7 Electron Volts
(2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =17.55 FITS
(3) Mean Time Between Failure in Years = 6503.03
Note: 1 FIT = 1 Failure in One Billion Hours.
Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL1 Preconditioning