Datasheet

UNISONIC TECHNOLOGIES CO., LTD
UTRS3085
Preliminary
CMOS IC
FAIL-SAFE, 500KBPS, RS-485 /
RS-422 TRANSCEIVERS WITH
±15KV ESD-PROTECTED

DESCRIPTION
The UTC UTRS3085 high-speed transceivers for RS-485/RS-422
communication contain one driver and one receiver. The device
features fail-safe circuitry, which guarantees a logic-high receiver
output when the receiver inputs are open or shorted. This means that
the receiver output will be logic high if all transmitters on a terminated
bus are disabled (high impedance). The UTC UTRS3085 offer higher
driver output slew-rate limits, allowing transmission up to 500kbps.
The transceiver typically draws 375µA of supply current when
unloaded or when fully loaded with the drivers disabled.
A device has a 1/8-unit-load receiver input impedance that allows
up to 256 transceivers on the bus.

FEATURES
* True fail-safe receiver while maintaining EIA/TIA-485 compatibility.
* Enhanced slew-rate limiting facilitates Error-Free data transmission.
* 5.0V single power supply.
* 1µA low-current shutdown mode.
* Allow up to 256 transceivers on the Bus.
* HBM ±15kV ESD-protected.
* Driver short circuit current limit.
* Thermal shutdown for overload protection.

ORDERING INFORMATION
Ordering Number
UTRS3085G-S08-R

Package
SOP-8
Packing
Tape Reel
MARKING
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CMOS IC
PIN CONFIGURATION
RO
1
8
VCC
RE
2
7
B
DE
3
6
A
DI
4
5
GND
PIN DESCRIPTION
PIN NO.
1
PIN NAME
RO
2
RE
3
DE
4
DI
5
6
7
8
GND
A
B
VCC

Preliminary
DESCRIPTION
Receiver output.
Receiver output enable. Drive RE low to enable RO; RO is high impedance when RE
is high. Drive RE high and DE low to enter low-power shutdown mode.
Driver output enable. Drive DE high to enable driver outputs. These outputs are high
impedance when DE is low. Drive RE high and DE low to enter low-power shutdown
mode.
Driver input. With DE high, a low on DI forces non-inverting output low and inverting
output high. Similarly, a high on DI forces non-inverting output high and inverting output
low.
Ground
Non-inverting receiver input and non-inverting driver output
Inverting receiver input and inverting driver output
Positive supply, 4.75V≤VCC≤5.25V
BLOCK DIAGRAM
RO 1
R
8 VCC
RE 2
7 B
DE 3
6 A
DI 4
D
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5 GND
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Preliminary
CMOS IC
ABSOLUTE MAXIMUM RATING
PARAMETER
SYMBOL
VCC
Supply Voltage
Control Input Voltage ( RE , DE)
RATINGS
+7.0
UNIT
V
-0.3~(VCC+0.3)
V
-0.3~(VCC+0.3)
V
Special Input Voltage (H/ F , SRL, TXP, RXP).
Driver Input Voltage
DI
-0.3~(VCC+0.3)
V
Driver Output Voltage (A, B, Y, Z)
±13
V
Receiver Input Voltage (A, B)
±13
V
Receiver Input Voltage, Full Duplex (A, B)
±25
V
Receiver Output Voltage (RO)
-0.3~(VCC+0.3)
V
Continuous Power Dissipation
Derate 5.88mW/°C above +70°C
471
mW
Operating Temperature Ranges
TOPR
-40~+85
°C
Storage Temperature Range
TSTG
-65~+150
°C
Lead Temperature (Soldering, 10sec)
TL
+300
°C
Note: Absolute maximum ratings are only stress ratings and it is not implied for functional device operation.
Absolute maximum ratings are the values beyond which the device will be damaged permanently.

DC ELECTRICAL CHARACTERISTICS
(VCC=+5.0V ±5%, TA=TMIN to TMAX, unless otherwise noted. Typical values are at VCC=+5.0V and TA=+25°C) (Note 1)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DRIVER
Differential Driver Output
VOD1
Fig.1
5.0
V
(No Load)
Fig.1, R=50Ω (RS-422)
1.8
V
Differential Driver Output
VOD2
Fig.1, R=27Ω (RS-485)
1.2
V
Change in Magnitude of
Differential Output Voltage
∆VOD Fig.1, R=50Ω or R=27Ω
0.2
V
(Note 2)
Driver Common-Mode Output
VOC
Fig.1, R=50Ω or R=27Ω
3
V
Voltage
Change In Magnitude of
Common-Mode Voltage
∆VOC Fig.1, R=50Ω or R=27Ω
0.2
V
(Note 2)
Input High Voltage
VIH1
DE, DI, RE , H/ F , TXP, RXP
Input Low Voltage
VIL1
DI Input Hysteresis
VHYS
DE, DI, RE , H/ F , TXP, RXP
SRL=VCC or Unconnected
SRL Input Current
IIN1
DE, DI, RE
IIN2
H/ F , TXP, RXP, Internal Pull-down
SRL
SRL (Note 3)
SRL
SRL=VCC
SRL=GND (Note 3)
DE=GND,
VIN=12V
VCC=GND or 5.25V VIN=-7V
DE=GND,
VIN=12V
VCC=GND or 5.25V VIN=-7V
-7V≤VOUT≤VCC
0V≤VOUT≤12V
0V≤VOUT≤VCC
Input High Voltage
Input Middle Voltage
Input Low Voltage
VIH2
VIM2
VIL2
SRL Input Current
IIN3
Input Current (A and B)
Full Duplex
IIN4
Output Leakage (Y and Z)
Full Duplex
IO
Driver Short-Circuit Output
Current (Note 4)
VOD1
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2.0
V
0.8
100
10
VCC-0.8
0.4VCC
mV
±2
µA
40
µA
0.6VCC
0.8
75
-75
125
-75
125
-100
-250
250
±25
V
V
V
V
µA
µA
µA
µA
µA
µA
mA
mA
mA
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Preliminary
CMOS IC
DC ELECTRICAL CHARACTERISTICS (Cont.)
PARAMETER
SYMBOL
TEST CONDITIONS
RECEIVER
Receiver Differential Threshold
VTH
-7V≤VCM≤+12V
Voltage
Receiver Input Hysteresis
∆VTH
Receiver Output High Voltage
VOH
IO=-4mA, VID=-50mV
Receiver Output Low Voltage
VOL
IO=4mA, VID=-200mV
Three-State Output Current at
IOZR
0.4V≤VO≤2.4V
Receiver
Receiver Input Resistance
RIN
-7V≤VCM≤+12V
Receiver Output Short-Circuit
IOSR
0V≤VRO≤VCC
Current
SUPPLY CURRENT
No Load,
DE=VCC
Supply Current
ICC
RE =DI=GND
or VCC, SRL=VCC
No Load,
RE =DI=GND
or VCC, SRL=GND
MIN
TYP
MAX
UNIT
-300
mV
25
0.4
mV
V
V
±1
µA
VCC-1.5
96
kΩ
±7
±95
mA
430
900
µA
DE=GND
375
600
µA
DE=VCC
475
1000
µA
DE=GND
420
800
µA
Supply Current in Shutdown
ISHDN DE=GND, VRE =VCC
1
10
µA
Mode
Notes: 1. All currents into the device are positive; all currents out of the device are negative. All voltages are referred
to device ground unless otherwise noted.
2. ∆VOD and ∆VOC are the changes in VOD and VOC, respectively, when the DI input changes state.
3. The SRL pin is internally biased to VCC/ 2 by a 100kΩ/100kΩ resistor divider. It is guaranteed to be VCC/ 2
if left unconnected.
4. Maximum current level applies to peak current just prior to foldback-current limiting; minimum current level
applies during current limiting.
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Preliminary
CMOS IC
SWITCHING CHARACTERISTICS
(VCC=+5.0V ±5%, TA=TMIN to TMAX, unless otherwise noted. Typical values are at VCC=+5.0V and TA=+25°C)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN TYP MAX
tDPLH
100
Fig.3 and 5, RDIFF=54Ω, CL1=CL2=100pF
Driver Input to Output
tDPHL
100
Driver Output Skew
tDSKEW Fig.3 and 5, RDIFF=54Ω, CL1=CL2=100pF
-3
±100
| tDPLH - tDPHL |
Driver Rise or Fall Time
tDR, tDF Fig.3 and 5, RDIFF=54Ω, CL1=CL2=100pF
200
Maximum Data Rate
fMAX
500
Driver Enable to Output High
tDZH
Fig.4 and 6, CL=100pF, S2 Closed
2500
Driver Enable to Output Low
tDZL
Fig.4 and 6, CL=100pF, S1 Closed
2500
Driver Disable Time from Low
tDLZ
Fig.4 and 6, CL=15pF, S1 Closed
100
Driver Disable Time from High
tDHZ
Fig.4 and 6, CL=15pF, S2 Closed
100
tRPLH, Fig.7 and 9, |VID|≥2.0V; Rise and Fall Time
Receiver Input to Output
200
tRPHL of VID≤15ns
|tRPLH - tRPHL| Differential
Fig.7 and 9, |VID|≥2.0V; Rise and Fall Time
50
tRSKD
Receiver Skew
of VID≤15ns
Receiver Enable to Output Low
tRZL
Fig.2 and 8, CL=100pF, S1 Closed
100
Receiver Enable to Output High
tRZH
Fig.2 and 8, CL=100pF, S2 Closed
60
Receiver Disable Time from Low
tRLZ
Fig.2 and 8, CL=100pF, S1 Closed
300
Receiver Disable Time from
Fig.2 and 8, CL=100pF, S2 Closed
200
tRHZ
High
Time to Shutdown
tSHDN Note 1
200
Driver Enable from Shutdown to
4500
tDZH(SHDN) Fig.4 and 6, CL=15pF, S2 Closed
Output High
Driver Enable from Shutdown to
tDZL(SHDN) Fig.4 and 6, CL=15pF, S1 Closed
4500
Output Low
Receiver Enable from Shutdown
3500
tRZH(SHDN) Fig.2 and 8, CL=100pF, S2 Closed
to Output High
Receiver Enable from Shutdown
tRZL(SHDN) Fig.2 and 8, CL=100pF, S1 Closed
3500
to Output Low
UNIT
ns
ns
ns
ns
kbps
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Note: The device is put into shutdown by bringing RE high and DE low. If the enable inputs are in this state for less
than 50ns, the device is guaranteed not to enter shutdown. If the enable inputs are in this state for at least
600ns, the device is guaranteed to have entered shutdown.
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Preliminary
CMOS IC
FUNCTION TABLE
TRANSMITTING
INPUTS
RE
X
X
0
1
OUTPUTS
DE
DI
B/Z
A/Y
1
1
0
0
1
0
X
X
0
1
High-Z
1
0
High-Z
Shutdown
RECEIVING
INPUTS
DE
OUTPUT
A-B
RE
0
X
≥-0.05V
0
X
≤-0.2V
0
X
Open/Shorted
1
1
X
1
0
X
X = Don’t care
Shutdown mode, driver and receiver outputs high impedance
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RO
1
0
1
High-Z
Shutdown
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Preliminary
CMOS IC
TEST CIRCUIT
Y
TEST POINT
RECEIVER
OUTPUT
R
CRL
VOD
+
15pF
VOC
R
1K
VCC
S1
1K
S2
Z
Fig. 2 Receiver Enable/Disable Timing Test Load
Fig. 1 Driver DC Test Circuit
3V
DE
DI
Y
CL1
VID
OUTPUT
UNDER TEST
VCC
S1
CL
RDIFF
+
500Ω
Z
CL2
S2
Fig. 3 Driver Timing Test Circuit
VOH
RO
Fig. 4 Driver Enable/Disable Timing Test Load
1.5V
1.5V
RE
1.5V
1.5V
tZL(SHDN), tZL
tLZ
VCC
tPHL
A
B
Fig. 7 Receiver Propagation Delays
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RO
1.5V OUTPUT NORMALLY LOW
RO
1.5V
tPLH
Input
-1V
0V
Output
VOL
1V
3V
VOL+0.5V
OUTPUT NORMALLY HIGH
0V
tZH(SHDN), tZH
VOH-0.5V
tHZ
Fig. 8 Receiver Enable and Disable Times
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Preliminary

TEST CIRCUIT (Cont.)

TYPICAL APPLICATION CIRCUIT
CMOS IC
UTC assumes no responsibility for equipment failures that result from using products at values that
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specifications of any and all UTC products described or contained
herein. UTC products are not designed for use in life support appliances, devices or systems where
malfunction of these products can be reasonably expected to result in personal injury. Reproduction in
whole or in part is prohibited without the prior written consent of the copyright owner. The information
presented in this document does not form part of any quotation or contract, is believed to be accurate
and reliable and may be changed without notice.
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