PBSS4160DPN 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor Rev. 03 — 11 December 2009 Product data sheet 1. Product profile 1.1 General description NPN/PNP low VCEsat Breakthrough in Small Signal (BISS) transistor pair in a SOT457 (SC-74) Surface Mounted Device (SMD) plastic package. 1.2 Features Low collector-emitter saturation voltage VCEsat High collector current capability: IC and ICM High collector current gain (hFE) at high IC High efficiency due to less heat generation Smaller required Printed-Circuit Board (PCB) area than for conventional transistors 1.3 Applications Complementary MOSFET driver Half and full bridge motor drivers Dual low power switches (e.g. motors, fans) Automotive applications 1.4 Quick reference data Table 1. Quick reference data Symbol Parameter Conditions collector-emitter voltage open base Min Typ Max Unit - - 60 V - - 1 A - - 2 A - 200 250 mΩ - - −60 V TR1 (NPN) VCEO IC collector current (DC) ICM peak collector current RCEsat [1] single pulse; tp ≤ 1 ms collector-emitter saturation resistance IC = 1 A; IB = 100 mA collector-emitter voltage open base [2] TR2 (PNP) VCEO [1] IC collector current (DC) ICM peak collector current single pulse; tp ≤ 1 ms collector-emitter saturation resistance IC = −1 A; IB = −100 mA RCEsat [2] - - −900 mA - - −2 A - 250 330 mΩ [1] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for collector 1 cm2. [2] Pulse test: tp ≤ 300 μs; δ ≤ 0.02. PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 2. Pinning information Table 2. Pinning Pin Description 1 emitter TR1 2 base TR1 3 collector TR2 4 emitter TR2 5 base TR2 6 collector TR1 Simplified outline 6 5 4 1 2 3 Symbol 6 5 4 TR2 TR1 1 2 3 sym019 3. Ordering information Table 3. Ordering information Type number PBSS4160DPN Package Name Description Version SC-74 plastic surface mounted package; 6 leads SOT457 4. Marking Table 4. Marking codes Type number Marking code PBSS4160DPN B4 5. Limiting values Table 5. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit Per transistor unless otherwise specified; for the PNP transistor with negative polarity VCBO collector-base voltage open emitter - 80 V VCEO collector-emitter voltage open base - 60 V VEBO emitter-base voltage open collector IC collector current (DC) NPN PNP both ICM peak collector current IB base current (DC) IBM peak base current single pulse; tp ≤ 1 ms single pulse; tp ≤ 1 ms PBSS4160DPN_3 Product data sheet - 5 V [1] - 870 mA [2] - 1 A [1] - 770 mA [2] - 900 mA [3] - 1 A - 2 A - 300 mA - 1 A © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 2 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor Table 5. Limiting values …continued In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Ptot Parameter Conditions total power dissipation Tamb ≤ 25 °C Min Max Unit [1] - 290 mW [2] - 370 mW [3] - 450 mW [1] - 420 mW [2] - 560 mW [3] - 700 mW Per device Tamb ≤ 25 °C total power dissipation Ptot Tj junction temperature - 150 °C Tamb ambient temperature −65 +150 °C Tstg storage temperature −65 +150 °C [1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint. [2] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for collector 1 cm2. [3] Device mounted on a ceramic PCB, Al2O3, standard footprint. 006aaa493 800 (1) Ptot (mW) 600 (2) (3) 400 200 0 0 40 80 120 160 Tamb (°C) (1) Ceramic PCB, Al2O3, standard footprint (2) FR4 PCB, mounting pad for collector 1 cm2 (3) FR4 PCB, standard footprint Fig 1. Power derating curves PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 3 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 6. Thermal characteristics Table 6. Thermal characteristics Symbol Parameter Conditions thermal resistance from junction to ambient Rth(j-a) in free air Min Typ Max Unit [1] - - 431 K/W [2] - - 338 K/W [3] - - 278 K/W - - 105 K/W thermal resistance from junction to solder point Rth(j-sp) [1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint. [2] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for collector 1 cm2. [3] Device mounted on a ceramic PCB, Al2O3, standard footprint. 006aaa494 103 Zth(j-a) (K/W) δ=1 0.75 0.50 0.33 102 0.20 0.10 0.05 10 0.02 0.01 0 1 10−5 10−4 10−3 10−2 10−1 1 10 102 103 tp (s) FR4 PCB, standard footprint Fig 2. Transient thermal impedance from junction to ambient as a function of pulse time; typical values PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 4 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 006aaa495 103 Zth(j-a) (K/W) δ=1 0.75 0.50 102 0.20 0.33 0.10 0.05 10 0.02 0.01 0 1 10−5 10−4 10−3 10−2 10−1 1 10 102 103 tp (s) FR4 PCB, mounting pad for collector 1 cm2 Fig 3. Transient thermal impedance from junction to ambient as a function of pulse time; typical values 006aaa496 103 Zth(j-a) (K/W) δ=1 0.75 102 0.50 0.20 0.33 0.10 0.05 10 0.02 0.01 0 1 10−5 10−4 10−3 10−2 10−1 1 10 102 103 tp (s) Ceramic PCB, Al2O3, standard footprint Fig 4. Transient thermal impedance from junction to ambient as a function of pulse time; typical values PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 5 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 7. Characteristics Table 7. Characteristics Tamb = 25 °C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit Per transistor unless otherwise specified; for the PNP transistor with negative polarity collector-base cut-off current VCB = 60 V; IE = 0 A - - 100 nA VCB = 60 V; IE = 0 A; Tj = 150 °C - - 50 μA ICES collector-emitter cut-off current VCE = 60 V; VBE = 0 V - - 100 nA IEBO emitter-base cut-off current VEB = 5 V; IC = 0 A ICBO VBEsat base-emitter saturation voltage IC = 1 A; IB = 50 mA [1] VBEon base-emitter turn-on voltage VCE = 5 V; IC = 1 A [1] DC current gain VCE = 5 V; IC = 1 mA - - 100 nA - 0.95 1.1 V - 0.82 0.9 V TR1 (NPN) hFE VCEsat collector-emitter saturation voltage 250 500 - VCE = 5 V; IC = 500 mA [1] 200 420 - VCE = 5 V; IC = 1 A [1] 100 180 - IC = 100 mA; IB = 1 mA - 90 110 mV IC = 500 mA; IB = 50 mA - 115 140 mV IC = 1 A; IB = 100 mA [1] - 200 250 mV [1] - 200 250 mΩ - 11 - ns - 78 - ns - 90 - ns RCEsat collector-emitter saturation resistance IC = 1 A; IB = 100 mA td delay time tr rise time ton turn-on time IC = 0.5 A; IBon = 25 mA; IBoff = −25 mA ts storage time - 340 - ns tf fall time - 160 - ns toff turn-off time - 500 - ns fT transition frequency VCE = 10 V; IC = 50 mA; f = 100 MHz 150 220 - MHz Cc collector capacitance VCB = 10 V; IE = ie = 0 A; f = 1 MHz - 5.5 10 pF DC current gain VCE = −5 V; IC = −1 mA 200 350 - TR2 (PNP) hFE VCE = −5 V; IC = −500 mA [1] 150 250 - VCE = −5 V; IC = −1 A [1] 100 160 - PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 6 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor Table 7. Characteristics …continued Tamb = 25 °C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit VCEsat collector-emitter saturation voltage IC = −100 mA; IB = −1 mA - −110 −165 mV IC = −500 mA; IB = −50 mA - −120 −175 mV IC = −1 A; IB = −100 mA [1] - −250 −330 mV [1] - 250 330 mΩ - 11 - ns - 30 - ns RCEsat collector-emitter saturation resistance IC = −1 A; IB = −100 mA td delay time tr rise time ton turn-on time IC = −0.5 A; IBon = −25 mA; IBoff = 25 mA - 41 - ns ts storage time - 205 - ns tf fall time - 55 - ns toff turn-off time - 260 - ns fT transition frequency VCE = −10 V; IC = −50 mA; f = 100 MHz 150 185 - MHz Cc collector capacitance VCB = −10 V; IE = ie = 0 A; f = 1 MHz - 9 15 pF [1] Pulse test: tp ≤ 300 μs; δ ≤ 0.02. PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 7 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 006aaa505 800 hFE 006aaa506 1.2 VBE (V) (1) 1.0 600 (2) 0.8 (1) 400 (2) 0.6 (3) 200 (3) 0.4 0 10−1 1 102 10 0.2 10−1 103 104 IC (mA) 1 VCE = 5 V VCE = 5 V 10 (1) Tamb = 100 °C (1) Tamb = −55 °C (2) Tamb = 25 °C (2) Tamb = 25 °C (3) Tamb = −55 °C (3) Tamb = 100 °C Fig 5. TR1 (NPN): DC current gain as a function of collector current; typical values Fig 6. 006aaa513 1 102 103 104 IC (mA) TR1 (NPN): Base-emitter voltage as a function of collector current; typical values 006aaa514 1 VCEsat (V) VCEsat (V) 10−1 (1) (2) 10−1 (1) (2) (3) 10−2 10−1 1 10 (3) 10−2 102 103 104 IC (mA) 10−3 10−1 1 (1) IC/IB = 100 (2) Tamb = 25 °C (2) IC/IB = 50 (3) Tamb = −55 °C 103 104 IC (mA) (3) IC/IB = 10 TR1 (NPN): Collector-emitter saturation voltage as a function of collector current; typical values Fig 8. TR1 (NPN): Collector-emitter saturation voltage as a function of collector current; typical values PBSS4160DPN_3 Product data sheet 102 Tamb = 25 °C IC/IB = 20 (1) Tamb = 100 °C Fig 7. 10 © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 8 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 006aaa509 1.2 VBEsat (V) 006aaa515 103 RCEsat (Ω) 1.0 102 (1) 0.8 10 (2) 0.6 (3) (1) (2) (3) 1 0.4 0.2 10−1 1 10 102 103 104 IC (mA) 10−1 10−1 IC/IB = 20 1 102 103 104 IC (mA) IC/IB = 20 (1) Tamb = −55 °C (1) Tamb = 100 °C (2) Tamb = 25 °C (2) Tamb = 25 °C (3) Tamb = 100 °C (3) Tamb = −55 °C Fig 9. 10 TR1 (NPN): Base-emitter saturation voltage as a function of collector current; typical values 006aaa511 2.0 IB (mA) = 65.0 58.5 52.0 45.5 39.0 32.5 IC (A) 1.6 26.0 1.2 Fig 10. TR1 (NPN): Collector-emitter saturation resistance as a function of collector current; typical values 006aaa516 103 RCEsat (Ω) 102 19.5 13.0 10 6.5 0.8 (1) 1 (2) 0.4 (3) 0 0 1 2 3 4 5 10−1 10−1 1 VCE (V) Tamb = 25 °C 10 102 103 104 IC (mA) Tamb = 25 °C (1) IC/IB = 100 (2) IC/IB = 50 (3) IC/IB = 10 Fig 11. TR1 (NPN): Collector current as a function of collector-emitter voltage; typical values Fig 12. TR1 (NPN): Collector-emitter saturation resistance as a function of collector current; typical values PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 9 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 006aaa474 600 (1) 006aaa476 −1.0 VBE (V) hFE −0.8 400 (1) (2) (2) −0.6 (3) 200 (3) −0.4 0 −10−1 −1 −10 −102 −103 −104 IC (mA) −0.2 −10−1 VCE = −5 V −1 −10 −102 −103 −104 IC (mA) VCE = −5 V (1) Tamb = 100 °C (1) Tamb = −55 °C (2) Tamb = 25 °C (2) Tamb = 25 °C (3) Tamb = −55 °C (3) Tamb = 100 °C Fig 13. TR2 (PNP): DC current gain as a function of collector current; typical values 006aaa489 −1 Fig 14. TR2 (PNP): Base-emitter voltage as a function of collector current; typical values 006aaa490 −1 VCEsat (V) VCEsat (V) −10−1 −10−1 (1) (2) (1) (2) (3) (3) −10−2 −10−1 −1 −10 −102 −103 −104 IC (mA) −10−2 −10−1 −1 −102 −103 −104 IC (mA) Tamb = 25 °C IC/IB = 20 (1) Tamb = 100 °C (1) IC/IB = 100 (2) Tamb = 25 °C (2) IC/IB = 50 (3) Tamb = −55 °C (3) IC/IB = 10 Fig 15. TR2 (PNP): Collector-emitter saturation voltage as a function of collector current; typical values Fig 16. TR2 (PNP): Collector-emitter saturation voltage as a function of collector current; typical values PBSS4160DPN_3 Product data sheet −10 © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 10 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 006aaa477 −1.1 VBEsat (V) 006aaa491 103 RCEsat (Ω) −0.9 102 (1) −0.7 (2) 10 −0.5 (3) (1) (2) (3) 1 −0.3 −0.1 −10−1 −1 −10 −102 −103 −104 IC (mA) 10−1 −10−1 IC/IB = 20 −1 (1) Tamb = −55 °C (1) Tamb = 100 °C (2) Tamb = 25 °C (3) Tamb = 100 °C (3) Tamb = −55 °C Fig 17. TR2 (PNP): Base-emitter saturation voltage as a function of collector current; typical values 006aaa478 IB (mA) = −35.0 −31.5 −28.0 −24.5 −21.0 IC (A) −1.6 −102 −103 −104 IC (mA) IC/IB = 20 (2) Tamb = 25 °C −2.0 −10 Fig 18. TR2 (PNP): Collector-emitter saturation resistance as a function of collector current; typical values 006aaa492 103 RCEsat (Ω) −17.5 −14.0 102 −10.5 −1.2 −7.0 10 (1) −0.8 −3.5 (2) 1 −0.4 (3) 0.0 0 −1 −2 −3 −4 −5 VCE (V) Tamb = 25 °C 10−1 −10−1 −1 −10 −102 −103 −104 IC (mA) Tamb = 25 °C (1) IC/IB = 100 (2) IC/IB = 50 (3) IC/IB = 10 Fig 19. TR2 (PNP): Collector current as a function of collector-emitter voltage; typical values Fig 20. TR2 (PNP): Collector-emitter saturation resistance as a function of collector current; typical values PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 11 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 8. Test information IB input pulse (idealized waveform) 90 % IBon (100 %) 10 % IBoff output pulse (idealized waveform) IC 90 % IC (100 %) 10 % t td ts tr ton tf toff 006aaa003 Fig 21. TR1 (NPN): BISS transistor switching time definition VBB RB VCC RC Vo (probe) oscilloscope 450 Ω (probe) 450 Ω oscilloscope R2 VI DUT R1 mlb826 IC = 0.5 A; IBon = 25 mA; IBoff = −25 mA; R1 = open; R2 = 100 Ω; RB = 300 Ω; RC = 20 Ω Fig 22. TR1 (NPN): Test circuit for switching times PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 12 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor − IB input pulse (idealized waveform) 90 % − I Bon (100 %) 10 % − I Boff output pulse (idealized waveform) − IC 90 % − I C (100 %) 10 % t td ts tr t on tf t off 006aaa266 Fig 23. TR2 (PNP): BISS transistor switching time definition VBB RB VCC RC Vo (probe) oscilloscope 450 Ω (probe) 450 Ω oscilloscope R2 VI DUT R1 mgd624 IC = −0.5 A; IBon = −25 mA; IBoff = 25 mA; R1 = open; R2 = 100 Ω; RB = 300 Ω; RC = 20 Ω Fig 24. TR2 (PNP): Test circuit for switching times PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 13 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 9. Package outline 3.1 2.7 6 3.0 2.5 1.7 1.3 1.1 0.9 5 4 2 3 0.6 0.2 pin 1 index 1 0.40 0.25 0.95 0.26 0.10 1.9 Dimensions in mm 04-11-08 Fig 25. Package outline SOT457 (SC-74) 10. Packing information Table 8. Packing methods The indicated -xxx are the last three digits of the 12NC ordering code.[1] Type number Package Description Packing quantity 3000 PBSS4160DPN [1] SOT457 4 mm pitch, 8 mm tape and reel; T1 -115 -135 4 mm pitch, 8 mm tape and reel; T2 [3] -125 -165 For further information and the availability of packing methods, see Section 14. [2] T1: normal taping [3] T2: reverse taping PBSS4160DPN_3 Product data sheet 10000 [2] © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 14 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 11. Soldering 3.45 1.95 solder lands 0.95 solder resist 0.45 0.55 3.30 2.825 occupied area solder paste 1.60 1.70 3.10 3.20 msc422 Dimensions in mm Fig 26. Reflow soldering footprint 5.30 solder lands 5.05 0.45 1.45 4.45 solder resist occupied area 1.40 msc423 4.30 Dimensions in mm Fig 27. Wave soldering footprint PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 15 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 12. Revision history Table 9. Revision history Document ID Release date Data sheet status Change notice Supersedes PBSS4160DPN_3 20091211 Product data sheet - PBSS4160DPN_2 Modifications: • This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal definitions and disclaimers. No changes were made to the technical content. • Figure 1, 7 and 15: updated PBSS4160DPN_2 20050714 Product data sheet - PBSS4160DPN_1 PBSS4160DPN_1 20040603 Objective data sheet - - PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 16 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 13. Legal information 13.1 Data sheet status Document status[1][2] Product status[3] Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. Definition [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 13.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. 13.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. Quick reference data — The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. 13.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 14. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] PBSS4160DPN_3 Product data sheet © NXP B.V. 2009. All rights reserved. Rev. 03 — 11 December 2009 17 of 18 PBSS4160DPN NXP Semiconductors 60 V, 1 A NPN/PNP low VCEsat (BISS) transistor 15. Contents 1 1.1 1.2 1.3 1.4 2 3 4 5 6 7 8 9 10 11 12 13 13.1 13.2 13.3 13.4 14 15 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1 General description . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Quick reference data . . . . . . . . . . . . . . . . . . . . 1 Pinning information . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2 Thermal characteristics . . . . . . . . . . . . . . . . . . 4 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Test information . . . . . . . . . . . . . . . . . . . . . . . . 12 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 14 Packing information . . . . . . . . . . . . . . . . . . . . 14 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 16 Legal information. . . . . . . . . . . . . . . . . . . . . . . 17 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 17 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Contact information. . . . . . . . . . . . . . . . . . . . . 17 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2009. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 11 December 2009 Document identifier: PBSS4160DPN_3