MC14015B D

MC14015B
Dual 4-Bit Static
Shift Register
The MC14015B dual 4−bit static shift register is constructed with
MOS P−Channel and N−Channel enhancement mode devices in
a single monolithic structure. It consists of two identical, independent
4−state serial−input/parallel−output registers. Each register has
independent Clock and Reset inputs with a single serial Data input.
The register states are type D master−slave flip−flops. Data is shifted
from one stage to the next during the positive−going clock transition.
Each register can be cleared when a high level is applied on the Reset
line. These complementary MOS shift registers find primary use in
buffer storage and serial−to−parallel conversion where low power
dissipation and/or noise immunity is desired.
•
•
•
SOIC−16
D SUFFIX
CASE 751B
MARKING DIAGRAM
Features
•
•
•
•
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Diode Protection on All Inputs
Supply Voltage Range = 3.0 Vdc to 18 Vdc
Logic Edge−Clocked Flip−Flop Design
Logic State is Retained Indefinitely with Clock Level either High or
Low; Information is Transferred to the Output only on the
Positive-going Edge of the Clock Pulse
Capable of Driving Two Low−power TTL Loads or One Low−power
Schottky TTL Load Over the Rated Temperature Range
NLV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable
This Device is Pb−Free and is RoHS Compliant
16
14015BG
AWLYWW
1
A
WL, L
YY, Y
WW, W
G
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Indicator
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
MAXIMUM RATINGS (Voltages Referenced to VSS)
Symbol
VDD
Vin, Vout
Iin, Iout
Parameter
DC Supply Voltage Range
Input or Output Voltage Range
(DC or Transient)
Input or Output Current
(DC or Transient) per Pin
Value
Unit
−0.5 to +18.0
V
−0.5 to VDD + 0.5
V
±10
mA
PD
Power Dissipation, per Package (Note 1)
500
mW
TA
Ambient Temperature Range
−55 to +125
°C
Tstg
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature
(8−Second Soldering)
260
°C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Temperature Derating: “D/DW” Package: –7.0 mW/_C From 65_C To 125_C
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be
taken to avoid applications of any voltage higher than maximum rated voltages to this high−impedance circuit. For proper operation, Vin and Vout
should be constrained to the range VSS ≤ (Vin or Vout) ≤ VDD.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either VSS or VDD). Unused outputs must be left open.
© Semiconductor Components Industries, LLC, 2014
July, 2014 − Rev. 9
1
Publication Order Number:
MC14015B/D
MC14015B
PIN ASSIGNMENT
CB
1
16
VDD
Q3B
2
15
DB
Q2A
3
14
RB
Q1A
4
13
Q0B
Q0A
5
12
Q1B
RA
6
11
Q2B
DA
7
10
Q3A
VSS
8
9
CA
BLOCK DIAGRAM
Q0
5
Q1
4
Q2
3
D
7
C
9
R Q3
10
Q0
13
Q1
12
Q2
11
6
D
15
C
1
R Q3
2
14
VDD = PIN 16
VSS = PIN 8
TRUTH TABLE
C
X
D
R
Q0
Qn
0
0
0
Qn−1
1
0
1
Qn−1
X
0
No Change
No Change
X
1
0
0
X = Don’t Care
Qn = Q0, Q1, Q2, or Q3, as applicable.
Qn−1 = Output of prior stage.
ORDERING INFORMATION
Package
Shipping†
MC14015BDG
SOIC−16
(Pb−Free)
48 Units / Rail
MC14015BDR2G
SOIC−16
(Pb−Free)
2500 Units / Tape & Reel
NLV14015BDR2G*
SOIC−16
(Pb−Free)
2500 Units / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP
Capable.
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2
MC14015B
ELECTRICAL CHARACTERISTICS (Voltages Referenced to VSS)
−55_C
Characteristic
Symbol
25_C
VDD
Vdc
Min
Max
Min
Typ
(Note 2)
125_C
Max
Min
Max
Unit
Output Voltage
Vin = VDD or 0
“0” Level
VOL
5.0
10
15
−
−
−
0.05
0.05
0.05
−
−
−
0
0
0
0.05
0.05
0.05
−
−
−
0.05
0.05
0.05
Vdc
Vin = 0 or VDD
“1” Level
VOH
5.0
10
15
4.95
9.95
14.95
−
−
−
4.95
9.95
14.95
5.0
10
15
−
−
−
4.95
9.95
14.95
−
−
−
Vdc
Input Voltage
(VO = 4.5 or .05 Vdc)
(VO = 9.0 or 1.0 Vdc)
(VO = 13.5 or 1.5 Vdc)
“0” Level
VIL
5.0
10
15
−
−
−
1.5
3.0
4.0
−
−
−
2.25
4.50
6.75
1.5
3.0
4.0
−
−
−
1.5
3.0
4.0
(VO = 0.5 or 4.5 Vdc)
(VO = 1.0 or 9.0 Vdc)
(VO = 1.5 or 13.5 Vdc)
“1” Level
5.0
10
15
3.5
7.0
11
−
−
−
3.5
7.0
11
2.75
5.50
8.25
−
−
−
3.5
7.0
11
−
−
−
5.0
5.0
10
15
–3.0
–0.64
–1.6
–4.2
−
−
−
−
–2.4
–0.51
−1.3
−3.4
–4.2
–0.88
–2.25
–8.8
−
−
−
−
–1.7
−0.36
–0.9
−2.4
−
−
−
−
IOL
5.0
10
15
0.64
1.6
4.2
−
−
−
0.51
1.3
3.4
0.88
2.25
8.8
−
−
−
0.36
0.9
2.4
−
−
−
mAdc
Input Current
Iin
15
−
±0.1
−
±0.00001
±0.1
−
±1.0
mAdc
Input Capacitance
(Vin = 0)
Cin
−
−
−
−
5.0
7.5
−
−
pF
Quiescent Current
(Per Package)
IDD
5.0
10
15
−
−
−
5.0
10
20
−
−
−
0.005
0.010
0.015
5.0
10
20
−
−
−
150
300
600
mAdc
IT
5.0
10
15
Output Drive Current
(VOH = 2.5 Vdc)
(VOH = 4.6 Vdc)
(VOH = 9.5 Vdc)
(VOH = 13.5 Vdc)
(VOL = 0.4 Vdc)
(VOL = 0.5 Vdc)
(VOL = 1.5 Vdc)
VIH
Vdc
IOH
Source
Sink
Total Supply Current (Notes 3 & 4)
(Dynamic plus Quiescent,
Per Package)
(CL = 50 pF on all outputs, all
buffers switching)
Vdc
mAdc
IT = (1.2 mA/kHz)f + IDD
IT = (2.4 mA/kHz)f + IDD
IT = (3.6 mA/kHz)f + IDD
mAdc
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
2. Data labelled “Typ” is not to be used for design purposes but is intended as an indication of the IC’s potential performance.
3. The formulas given are for the typical characteristics only at 25_C.
4. To calculate total supply current at loads other than 50 pF:
IT(CL) = IT(50 pF) + (CL − 50) Vfk
where: IT is in mA (per package), CL in pF, V = (VDD − VSS) in volts, f in kHz is input frequency, and k = 0.002.
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3
MC14015B
SWITCHING CHARACTERISTICS (Note 5) (CL = 50 pF, TA = 25_C)
Characteristic
Symbol
Output Rise and Fall Time
tTLH, tTHL = (1.5 ns/pF) CL + 25 ns
tTLH, tTHL = (0.75 ns/pF) CL + 12.5 ns
tTLH, tTHL = (0.55 ns/pF) CL + 9.5 ns
tTLH,
tTHL
Propagation Delay Time
Clock, Data to Q
tPLH, tPHL = (1.7 ns/pF) CL + 225 ns
tPLH, tPHL = (0.66 ns/pF) CL + 92 ns
tPLH, tPHL = (0.5 ns/pF) CL + 65 ns
Reset to Q
tPLH, tPHL = (1.7 ns/pF) CL + 375 ns
tPLH, tPHL = (0.66 ns/pF) CL + 147 ns
tPLH, tPHL = (0.5 ns/pF) CL + 95 ns
tPLH,
tPHL
Clock Pulse Width
VDD
Min
Typ
(Note 6)
Max
5.0
10
15
−
−
−
100
50
40
200
100
80
Unit
ns
ns
5.0
10
15
−
−
−
310
125
90
750
250
170
5.0
10
15
−
−
−
460
180
120
750
250
170
tWH
5.0
10
15
400
175
135
185
85
55
−
−
−
ns
fcl
5.0
10
15
−
−
−
2.0
6.0
7.5
1.5
3.0
3.75
MHz
tTLH, tTHL
5.0
10
15
−
−
−
−
−
−
15
5
4
ms
Reset Pulse Width
tWH
5.0
10
15
400
160
120
200
80
60
−
−
−
ns
Setup Time
tsu
5.0
10
15
350
100
75
100
50
40
−
−
−
ns
Clock Pulse Frequency
Clock Pulse Rise and Fall Times
5. The formulas given are for typical characteristics only at 25_C.
6. Data labelled “Typ” is not to be used for design purposes but is intended as an indication of the IC’s potential performance.
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4
MC14015B
VDD
PULSE
GENERATOR
2
D
PULSE
GENERATOR
1
0.01 mF
CERAMIC
ID
500 mF
C
R
VDD
Q0
Q1
Q2
Q3
CL
CL
CL
CL
VSS
1
f
CLOCK
50%
DATA
Figure 1. Power Dissipation Test Circuit and Waveform
tTLH
tTHL
DATA
INPUT
VDD
90%
50%
10%
0V
tsu
PULSE
GENERATOR
2
VDD
D
PULSE
GENERATOR
1
Q0
CL
Q1
SYNC
CLOCK
INPUT
CL
Q2
C
R
t-
tTLH
tWH
tPLH
CL
Q3
tTHL
90%
Q0
tWL = tWH = 50% Duty Cycle
tTLH = tTHL ≤ 20 ns
0V
tPHL
CL
VSS
VDD
90%
50%
10%
tWL
50%
10%
tTHL
tTLH
Figure 2. Switching Test Circuit and Waveforms
PULSE
GENERATOR
2
VDD
D
CL
Q1
SYNC
PULSE
GENERATOR
1
Q0
0V
tsu
CL
Q3
VDD
50%
CL
Q2
C
R
CLOCK
INPUT
th
CL
DATA
INPUT
VSS
50%
Figure 3. Setup and Hold Time Test Circuit and Waveforms
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5
VDD
0V
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6
DATA
IN
VSS
VDD
DATA INPUT BUFFER
DATA
IN
CLOCK
RESET
DATA TO
FIRST BIT
RESET
IN
VSS
VDD
RESET INPUT BUFFER
VSS
VDD
SINGLE BIT
RESET
TO 4 BITS
CLOCK
IN
TO D OF
NEXT BIT
VSS
VDD
CLOCK
TO 4 BITS
CLOCK INPUT BUFFER
Q
MC14015B
CIRCUIT SCHEMATICS
MC14015B
LOGIC DIAGRAMS
SINGLE BIT
Q
C
C
TO D OF
NEXT BIT
DATA
C
C
C
C
C
C
RESET
C
C
C
COMPLETE DEVICE
5
4
Q0
3
Q1
10
Q2
Q3
DATA INPUT BUFFER
D
D
7
C
CLOCK INPUT BUFFER
C
R
Q
D
Q
C
R
Q
D
Q
C
R
Q
D
Q
C
Q
R
Q
9
R
6
13
RESET INPUT BUFFER
12
Q0
11
Q1
2
Q2
Q3
DATA INPUT BUFFER
D
D
15
CLOCK INPUT BUFFER
C
C
R
Q
D
Q
C
R
Q
D
Q
C
R
Q
D
Q
C
Q
R
Q
1
VDD = PIN 16
VSS = PIN 8
R
14
RESET INPUT BUFFER
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7
MC14015B
PACKAGE DIMENSIONS
SOIC−16
D SUFFIX
PLASTIC SOIC PACKAGE
CASE 751B−05
ISSUE K
−A−
16
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR PROTRUSION
SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D
DIMENSION AT MAXIMUM MATERIAL CONDITION.
9
−B−
1
P
8 PL
0.25 (0.010)
8
M
B
S
G
R
K
F
X 45 _
C
−T−
SEATING
PLANE
J
M
D
DIM
A
B
C
D
F
G
J
K
M
P
R
MILLIMETERS
MIN
MAX
9.80
10.00
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0_
7_
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.386
0.393
0.150
0.157
0.054
0.068
0.014
0.019
0.016
0.049
0.050 BSC
0.008
0.009
0.004
0.009
0_
7_
0.229
0.244
0.010
0.019
16 PL
0.25 (0.010)
M
T B
S
A
S
SOLDERING FOOTPRINT
8X
6.40
16X
1
1.12
16
16X
0.58
1.27
PITCH
8
9
DIMENSIONS: MILLIMETERS
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MC14015B/D