MC74HC367A Hex 3-State Noninverting Buffer with Separate 2-Bit and 4-Bit Sections High−Performance Silicon−Gate CMOS http://onsemi.com The MC74HC367A is identical in pinout to the LS367. The device inputs are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs. This device is arranged into 2−bit and 4−bit sections, each having its own active−low Output Enable. When either of the enables is high, the affected buffer outputs are placed into high−impedance states. The HC367A has noninverting outputs. 16 SOIC−16 D SUFFIX CASE 751B 16 1 Output Drive Capability: 15 LSTTL Loads Outputs Directly Interface to CMOS, NMOS, and TTL Operating Voltage Range: 2 to 6 V Low Input Current: 1 mA High Noise Immunity Characteristic of CMOS Devices These are Pb−Free Devices A0 2 3 4 5 HC367AG AWLYWW 1 16 Features • • • • • • MARKING DIAGRAMS TSSOP−16 DT SUFFIX CASE 948F 16 1 HC 367A ALYWG G 1 A = Assembly Location WL, L = Wafer Lot YY, Y = Year WW, W = Work Week G or G = Pb−Free Package (Note: Microdot may be in either location) Y0 PIN ASSIGNMENT A1 A2 A3 A4 A5 OUTPUT ENABLE 1 6 7 10 9 12 11 14 13 OUTPUT ENABLE 1 A0 Y1 Y2 Y3 Y4 Y5 15 3 14 A1 4 13 Y5 Y1 5 12 A4 A2 6 11 Y4 Y2 7 10 A3 GND 8 9 Y3 16 FUNCTION TABLE 1 OUTPUT ENABLE 2 15 2 Y0 VCC OUTPUT ENABLE 2 A5 1 Inputs PIN 16 = VCC PIN 8 = GND Enable 1, Enable 2 Figure 1. Logic Diagram L L H Output A Y L H X L H Z X = don’t care Z = high impedance ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 5 of this data sheet. © Semiconductor Components Industries, LLC, 2013 June, 2013 − Rev. 4 1 Publication Order Number: MC74HC367A/D MC74HC367A MAXIMUM RATINGS Symbol Parameter Value Unit −0.5 to +7.0 V DC Input Voltage (Referenced to GND) −0.5 to VCC + 0.5 V DC Output Voltage (Referenced to GND) −0.5 to VCC + 0.5 V VCC DC Supply Voltage (Referenced to GND) Vin Vout Iin DC Input Current, per Pin ±20 mA Iout DC Output Current, per Pin ±25 mA ICC DC Supply Current, VCC and GND Pins ±50 mA PD Power Dissipation in Still Air, 500 450 mW Tstg Storage Temperature −65 to + 150 °C SOIC Package TSSOP Package Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. RECOMMENDED OPERATING CONDITIONS Symbol VCC Vin, Vout Parameter DC Supply Voltage (Referenced to GND) DC Input Voltage, Output Voltage (Referenced to GND) TA Operating Temperature, All Package Types tr, tf Input Rise and Fall Time (Figure 2) VCC = 2.0 V VCC = 3.0 V VCC = 4.5 V VCC = 6.0 V Min Max Unit 2.0 6.0 V 0 VCC V −55 +125 °C 0 0 0 0 1000 600 500 400 ns http://onsemi.com 2 This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high−impedance circuit. For proper operation, Vin and Vout should be constrained to the range GND v (Vin or Vout) v VCC. Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open. MC74HC367A DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND) Guaranteed Limit Symbol Parameter Test Conditions VCC V − 55 to 25°C v 85°C v 125°C Unit VIH Minimum High−Level Input Voltage Vout = VCC − 0.1 V |Iout| v 20 mA 2.0 3.0 4.5 6.0 1.5 2.1 3.15 4.2 1.5 2.1 3.15 4.2 1.5 2.1 3.15 4.2 V VIL Maximum Low−Level Input Voltage Vout = 0.1 V |Iout| v 20 mA 2.0 3.0 4.5 6.0 0.50 0.90 1.35 1.80 0.50 0.90 1.35 1.80 0.50 0.90 1.35 1.80 V VOH Minimum High−Level Output Voltage Vin = VIH |Iout| v 20 mA 2.0 4.5 6.0 1.9 4.4 5.9 1.9 4.4 5.9 1.9 4.4 5.9 V 3.0 4.5 6.0 2.48 3.98 5.48 2.34 3.84 5.34 2.20 3.70 5.20 2.0 4.5 6.0 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 3.0 4.5 6.0 0.26 0.26 0.26 0.33 0.33 0.33 0.40 0.40 0.40 Vin = VIH VOL Maximum Low−Level Output Voltage |Iout| v 3.6 mA |Iout| v 6.0 mA |Iout| v 7.8 mA Vin = VIL |Iout| v 20 mA Vin = VIL |Iout| v 3.6 mA |Iout| v 6.0 mA |Iout| v 7.8 mA V Iin Maximum Input Leakage Current Vin = VCC or GND 6.0 ± 0.1 ± 1.0 ± 1.0 mA IOZ Maximum Three−State Leakage Current Output in High−Impedance State Vin = VIL or VIH Vout = VCC or GND 6.0 ± 0.5 ± 5.0 ± 10 mA ICC Maximum Quiescent Supply Current (per Package) Vin = VCC or GND Iout = 0 mA 6.0 4 40 160 mA http://onsemi.com 3 MC74HC367A AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6 ns) Guaranteed Limit Parameter Symbol VCC V − 55 to 25°C v 85°C v 125°C Unit tPLH, tPHL Maximum Propagation Delay, Input A to Output Y (Figures 2 and 4) 2.0 3.0 4.5 6.0 120 60 24 20 150 75 30 26 180 90 36 31 ns tPLZ, tPHZ Maximum Propagation Delay, Output Enable to Output Y (Figures 3 and 5) 2.0 3.0 4.5 6.0 175 90 35 30 220 110 44 37 265 135 53 45 ns tPZL, tPZH Maximum Propagation Delay, Output Enable to Output Y (Figures 3 and 5) 2.0 3.0 4.5 6.0 190 95 38 32 240 120 48 21 285 150 57 48 ns tTLH, tTHL Maximum Output Transition Time, Any Output (Figures 2 and 4) 2.0 3.0 4.5 6.0 60 22 12 10 75 28 15 13 90 34 18 15 ns Cin Maximum Input Capacitance − 10 10 10 pF Cout Maximum Three−State Output Capacitance (Output in High−Impedance State) − 15 15 15 pF Typical @ 25°C, VCC = 5.0 V CPD 60 Power Dissipation Capacitance (Per Buffer) pF SWITCHING WAVEFORMS VCC tr tf OUTPUT ENABLE VCC 90% 50% 10% INPUT A tPLH GND tPZL GND tPHL OUTPUT Y 90% 50% 10% OUTPUT Y 50% tPHZ 50% Figure 2. Figure 3. http://onsemi.com 4 10% VOL 90% VOH HIGH IMPEDANCE tTHL tTLH HIGH IMPEDANCE 50% tPZH OUTPUT Y tPLZ MC74HC367A TEST CIRCUITS TEST POINT TEST POINT OUTPUT DEVICE UNDER TEST OUTPUT DEVICE UNDER TEST CL* *Includes all probe and jig capacitance 1 kW CL* CONNECT TO VCC WHEN TESTING tPLZ AND tPZL. CONNECT TO GND WHEN TESTING tPHZ AND tPZH. *Includes all probe and jig capacitance Figure 4. Figure 5. TO OTHER BUFFERS ONE OF 6 BUFFERS VCC Y A OUTPUT ENABLE Figure 6. Logic Detail ORDERING INFORMATION Package Shipping† MC74HC367ADG SOIC−16 (Pb−Free) 48 Units / Rail MC74HC367ADR2G SOIC−16 (Pb−Free) 2500 Tape & Reel MC74HC367ADTG TSSOP−16 (Pb−Free) 96 Units / Tube MC74HC367ADTR2G TSSOP−16 (Pb−Free) 2500 Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 5 MC74HC367A PACKAGE DIMENSIONS TSSOP−16 DT SUFFIX CASE 948F−01 ISSUE B 16X K REF 0.10 (0.004) 0.15 (0.006) T U T U M S V S K ÇÇÇ ÇÇÇ ÉÉÉ ÇÇÇ ÉÉÉ S K1 2X L/2 16 9 J1 B −U− L SECTION N−N J PIN 1 IDENT. N 8 1 0.25 (0.010) M 0.15 (0.006) T U S A −V− N F DETAIL E C 0.10 (0.004) −T− SEATING PLANE D H G DETAIL E NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A DOES NOT INCLUDE MOLD FLASH. PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE. 4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE. 5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY. 7. DIMENSION A AND B ARE TO BE DETERMINED AT DATUM PLANE −W−. MILLIMETERS INCHES DIM MIN MAX MIN MAX A 4.90 5.10 0.193 0.200 B 4.30 4.50 0.169 0.177 C −−− 1.20 −−− 0.047 D 0.05 0.15 0.002 0.006 F 0.50 0.75 0.020 0.030 G 0.65 BSC 0.026 BSC H 0.18 0.28 0.007 0.011 −W− J 0.09 0.20 0.004 0.008 J1 0.09 0.16 0.004 0.006 K 0.19 0.30 0.007 0.012 K1 0.19 0.25 0.007 0.010 L 6.40 BSC 0.252 BSC M 0_ 8_ 0_ 8_ SOLDERING FOOTPRINT* 7.06 1 0.65 PITCH 16X 0.36 16X 1.26 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 6 MC74HC367A PACKAGE DIMENSIONS SOIC−16 CASE 751B−05 ISSUE K −A− 16 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSIONS A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 9 −B− 1 P 8 PL 0.25 (0.010) 8 M B S DIM A B C D F G J K M P R G R K F X 45 _ C −T− SEATING PLANE J M D MILLIMETERS MIN MAX 9.80 10.00 3.80 4.00 1.35 1.75 0.35 0.49 0.40 1.25 1.27 BSC 0.19 0.25 0.10 0.25 0_ 7_ 5.80 6.20 0.25 0.50 INCHES MIN MAX 0.386 0.393 0.150 0.157 0.054 0.068 0.014 0.019 0.016 0.049 0.050 BSC 0.008 0.009 0.004 0.009 0_ 7_ 0.229 0.244 0.010 0.019 16 PL 0.25 (0.010) M T B S A S SOLDERING FOOTPRINT* 8X 6.40 16X 1 1.12 16 16X 0.58 1.27 PITCH 8 9 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). 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