REFERENCE REFERENCE 28-76 page 2 of 14 Clsf. Standard Doc. PLASTIC Product Specifications FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code 7. DIMENSIONS As specified in the individual drawing. 8. APPEARANCE Plating of outer electrode shall be proper enough to be soldered. 9. CHARACTER No. Item Performance Between terminals: Nothing abnormal shall be found, when applied voltage of 150% of the rated voltage for 1 minute. (Pass the resistance of 2kΩ or more at the electrical charge and discharge so that current must not exceed 1A.) Between terminals : 3000MΩ or more (C: 0.33 µF or less) 1000Ω• F or more (C: more than 0.33 µF) When the reading of measuring instrument becomes steady at a value after applying a voltage of 100VDC ± 5.0VDC for 1 minute ± 5 seconds, at 20°C ± 2°C. 1-18 G 2/15 P Testing method JIS C 5102-1994 7.1 IEC 384-1-1982 4.6 1. Withstand voltage 2. Insulation Resistance 3. Capacitance Within a range of specified value. (Measured at a frequency of 1kHz ± 0.2kHz, at 20°C ± 2°C and a voltage of 5V or less.) JIS C 5102-1994 7.8 IEC 384-1-1982 4. Dissipation Factor 1.0% or less (Measured at a frequency of 1kHz ± 0.2kHz, at 20°C ± 2°C and a voltage of 5V or less.) JIS C 5102-1994 7.9 IEC 4.8 5. Connection The connection of the element shall not open even instantaneously when applied a voltage of 100mV peak or less and applied light force. JIS C 5102-1994 7.10 IEC 384-1-1982 6. 7. Vibration proof Soldering Property The capacitor shall be mounted on the PC board, and the following vibration shall be applied to the capacitor. Range of vibration frequency 10Hz to 55Hz total amplitude 1.5mm, rate of frequency vibration to be such as to vary from 10Hz to 55Hz and return to 10Hz in about 1 minute and thus repeated. Thus shall be conducted for 2hours each (total 6hours) in 3 mutually perpendicular directions. The connection shall not get short-circuit or open when examined the connection of the element in compliance with the previous item (connection of element) during the last 30 minutes of the test. The terminal shall be immersed in methanol solution of resin (about 25%) and the terminal shall be immersed in the solder bath at a temperature of 255°C ± 2°C for 2.5seconds± 0.5seconds. After test immersion, the solder shall be sticked to more than 90% in the surface of the electrodes. Film Capacitor Division Capacitor Business Division Panasonic Corporation JIS C 5102-1994 7.6 IEC 384-1-1982 4.5 JIS C 5102-1994 8.2.3.(A) IEC 384-1-1982 4.17 JIS C 5102-1994 8.4 IEC 384-1-1982 4.15 REFERENCE 28-76 page 3 of 14 Clsf. Standard Doc. Product Specifications No. PLASTIC FILM CHIP CAPACITOR TYPE ECWU1 (C) Item No. Revision Code Performance 1-18 G 3/15 Testing method The capacitor under test shall be put in the testing oven and kept at condition of the temperature at + 40°C ± 2°C and the humidity at 90% to 95% for 500hours +24/ –0 hours and then shall be let alone at ordinary condition for 1.5hours ± 0.5 hours. After the test, the capacitor shall be satisfied with the following performance. 8. Moisture Resistance Appearance : No remarkable change. Withstand voltage : Between terminals Nothing abnormal shall be found, when applied a voltage of 130% of the rated voltage for 1 minute. (The capacitor shall be applied the voltage through 2kΩ or more when charge or discharge.) Insulation resistance : Between terminals 100MΩ or more (C: 0.33 µF or less) 30Ω • F or more (C: more than 0.33 µF) Change rate of capacitance : Within +8/ –5% of the value before the test. Dissipation factor : 1.5% or less (at 1kHz) JIS C 5102-1994 9.5 IEC 384-1-1982 4.22 The capacitor under test shall be applied the rated voltage continuously for 500hours +24/–0 hours in the testing oven and kept at condition of the temperature at +40°C ± 2°C and the humidity at 90% to 95% and then shall be let alone at ordinary condition for 1.5hours ± 0.5 hours. After the test, the capacitor shall be satisfied with the following performance. 9. Moisture Resistant Loading Appearance : No remarkable change. Withstand voltage : Between terminals Nothing abnormal shall be found, when applied a voltage of 130% of the rated voltage for 1 minutes. (The capacitor shall be applied the voltage through 2kΩ or more when charge or discharge.) Insulation resistance : Between terminals 100MΩ or more (C: 0.33 µF or less) 30Ω • F or more (C: more than 0.33 µF) Change rate of capacitance : Within +8/ –5% of the value before the test. Dissipation factor : 1.5% or less (at 1kHz) Film Capacitor Division Capacitor Business Division Panasonic Corporation JIS C 5102-1994 9.9 P REFERENCE 28-76 page 4 of 14 Clsf. Standard Doc. Product Specifications PLASTIC No. Item 10. High Temperature loading 11. Heat Resistance 12. Cold Resistance FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code Performance The capacitor under test shall be applied the voltage of 125% of decrease rated voltage (Fig.1) through a series-connected resister of from 20Ω to 1000Ω per 1V, continuously for 1000hours +48/ –0 hours in the testing oven and kept at condition of the temperature at +125°C ± 2°C and then shall be let alone at ordinary condition for 1.5hours± 0.5 hours. After the test, the capacitor shall be satisfied with the following performance. Appearance : No remarkable change. Insulation resistance : Between terminals 1000MΩ or more (C: 0.33 µF or less) 330Ω • F or more (C: more than 0.33 µF) Change rate of capacitance : Within +1/ –6% of the value before the test. Dissipation factor : 1.1% or less (at 1kHz) Insulation resistance at +125°C ± 2°C after 2hours +1/–0 hours. Insulation resistance : Between terminals 90MΩ or more (C: 0.33 µF or less) 30Ω • F or more (C: more than 0.33 µF) Change rate of capacitance at +85°C ± 2°C after 2hours +1/ –0 hours. Within +3/–4% of the value before the test. Change rate of capacitance at –55°C± 2°C after 2hours +1/ –0 hours. Within +1/ –3% of the value before the test. Film Capacitor Division Capacitor Business Division Panasonic Corporation 1-18 G 4/15 P Testing method JIS C 5102-1994 9.10 JIS C 5102-1994 9.2 IEC 384-1-1982 4.21.2 JIS C 5102-1994 9.1 IEC 384-1-1982 4.21.4 REFERENCE 28-76 page 5 of 14 Clsf. Standard Doc. PLASTIC Product Specifications No. FILM CHIP CAPACITOR TYPE ECWU1 (C) Item No. Revision Code Performance 1. Reflow method Test condition of the reflow oven shall be adjusted that maximum temperature of the capacitor surface shall be 240°C ±3°C. (See Fig. 2.) After the test, the capacitor shall be let alone at ordinary temperature and humidity for 1hour ± 0.5 hours. After this, the capacitor shall be satisfied with the following performance. 13. Soldering Heat Resistance 2. Soldering iron method The soldering iron of a 30-watt shall be used and the temperature of the soldering iron shall be adjusted at 250°C ± 10°C. The soldering iron together with a solder wire of 1mm diameter shall be put to each outer electrode of the capacitor for 3.5seconds ± 0.5seconds. After this, the capacitor shall be satisfied with the following performance. Appearance : No remarkable change. Withstand voltage : Between terminals Nothing abnormal shall be found, when applied a voltage of 150% of the rated voltage for 1 minute. (The capacitor shall be applied the voltage through 2kΩ or more when charge or discharge.) Insulation resistance : Between terminals 1000MΩ or more (C: 0.33 µF or less) 330Ω • F or more (C: more than 0.33 µF) Change rate of capacitance : Within ±5% of the value before the test. Dissipation factor : 1.1% or less (at 1kHz) Film Capacitor Division Capacitor Business Division Panasonic Corporation 1-18 G 5/15 Testing method P REFERENCE 28-76 page 6 of 14 Clsf. Standard Doc. PLASTIC Product Specifications No. 14. FILM CHIP CAPACITOR TYPE ECWU1 (C) Item No. Revision Code Performance The capacitor under the test shall be kept in the testing oven and kept at condition of the temperature of –55°C ± 3°C for 30minutes ± 3minutes. After this, the capacitor shall be let alone at the ordinary temperature for 3 minutes or less. After this, the capacitor under the test shall be kept in the testing oven and kept at condition of the temperature of +125°C ± 3°C for 30minutes± 3minutes. Then the capacitor shall be let alone at the ordinary temperature for 3 minutes or less. This operation shall be counted as 1 cycle, and it shall be repeated for 5 cycles successively. After the test, the capacitor shall be let alone at the ordinary condition for 1.5hours ± 0.5hours, and shall be satisfied with the following performance. Temperature cycle 1-18 G 6/15 Testing method JIS C 5102-1994 9.3 Appearance : No remarkable change. Insulation resistance : Between terminals 1000MΩ or more (C: 0.33 µF or less) 330Ω• F or more (C: more than 0.33 µF) Change rate of capacitance : Within +1/ –5% of the value before the test. Dissipation factor : 1.1% or less (at 1kHz) Permissible current to pulse current. The pulse permissible current is generally obtained by the product of dV/dt (V/µs) value and capacitance (µF) . I =C • dV/dt However, number of repetitions is 10,000 cycles or less. Make sure the rms current is within the permissible value. (See Tab.1) 15. dV/dt 16. Robustness of capacitor body Insulation resistance : Between terminals 500MΩ or more (C: 0.33 µF or less) 150Ω• F or more (C: more than 0.33 µF) Change rate of capacitance : Within ±3% of the value before the test. Dissipation factor : 1.2% or less (at 1kHz) The equipment shall permit pressurizing. Apply a force to the center of specimen, using a pressurizing as shown in the drawing. The pressure shall be 5N ±0.5N, and the holding duration, 10seconds ±1 second. F Appearance : No remarkable change. Film Capacitor Division Capacitor Business Division Panasonic Corporation JIS C 5102-1994 8.11.1 JIS C 5102-1994 8.12 P REFERENCE 28-76 page 7 of 14 Clsf. Standard Doc. Product Specifications PLASTIC No. Item 17. Resistance of Board to bending 18. Adhesivenes FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code Performance Testing method The bending stroke shall be 1mm. Pressurizing shall be carried out at the rate of 1mm/s. After reaching the specified bending, keep it for 5seconds ±1second. After the test no breaking of the terminal shall be found. Mount the specimen to the testing wiring printed board. Examine, with a magnifier of magnification of 10, the appearance of specimen. As shown in below, apply the pressurizing jig to the center in the longitudinal direction of specimen. Apply a force to the pressurizing jig gradually in the horizontal direction with the testing printed wiring board. The pressure shall be 5N ±0.5N, and the holding duration, 10seconds ±1 second. After the test, use magnifier of magnification of 10, and check for cracks of soldering position. Appearance No remarkable change. Film Capacitor Division 1-18 G 7/15 F Capacitor Business Division Panasonic Corporation JIS C 5102-1994 8.12 JIS C 5102-1994 8.11.2 P REFERENCE 28-76 page 8 of 14 Clsf. Standard Doc. PLASTIC Product Specifications FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code 1-18 G 8/15 Fig.2 Standard surface temperature curve of the capacitor for reflow method Test condition Glass epoxy base board (0.8mm) Thermocouple(Φ0.1mm K-type) 50mm 115mm Temperature of element surface 250 Max.240°C 220°C or more Max.60s Temperature(°C) 200 150 100 50 Max.90s Min.40s 60 to 150s Max.25s Min.10s Max.40s 0 0 60 Film Capacitor Division 120 Time (s) 180 Capacitor Business Division Panasonic Corporation 240 P REFERENCE 28-76 page 9 of 14 Clsf. Standard Doc. Product Specifications PLASTIC FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code 1-18 G 9/15 P 10. ! Caution about safety in use I. Operating range (voltage, current, operating temperature) Use the capacitor within the specified limits listed below (a to d). Over rated conditions might cause deterioration, damage, smoke and fire. Do not use capacitor beyond range of the condition. a) Permissible voltage • Rated voltage of this product is 100VDC. Use the capacitor within DC rated voltage. • When used in AC applied circuit, less than 40Vrms should be applied. When used in a high frequency, less than 40Vrms should be applied and current applied should be less than the value of permissible current in Fig.3. • Use the peak of pulse voltage applied the capacitor within the DC rated voltage. b) Permissible current • The permissible current must be considered by dividing into pulse current (peak current) and continuous current (rms current). When using, therefore, make sure the both current are within the permissible values. In the case that a continuous current value is able not to be measured, use the capacitor within 7.5°C as the inherent temperature rise confirmed by the measuring method show in page 14. • Continuous current should be within specified figure in Fig.3. Contact us when the waveforms are totally different from the sine wave. • Pulse current should be within the figures calculated by Tab. 1. Use within 10000 cycles of pulse current. When pulse current applied more than 10000 cycles, please consult us before use. c) Operating temperature range • It must be noted, however the operating temperature range is the surface temperature of the capacitor, not the ambient temperature of the capacitor. • In actual use, make sure the sum of the ambient temperature + own temperature rise value (Within specified value), that is the capacitor surface temperature is within the rated operating temperature range. • If there is cooling plate of the other part of any resistance heated to high temperature near the capacitor, the capacitor may be locally heated by the radiation heat, exceeding the operating temperature range, and smoking or firing may be caused. Check the capacitor surface temperature at the heat source side. d) Protective means for safety should be provided in case the pulse and rms current may exceed the permissible values due to abnormal action of elsewhere in the circuit. Please consult in advance when capacitors are connected in parallel to supplement capacitance. Film Capacitor Division Capacitor Business Division Panasonic Corporation REFERENCE 28-76 page 10 of 14 Clsf. Standard Doc. PLASTIC Product Specifications FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code 1-18 G 10/15 P II. Recommendable land size For designing land size, refer to the following recommendable land size. unit: mm Size code Dimensions A B C E1, E2, E3a, E3 (4833) 2.6 6.6 3.0 D1, D3, D4 (6041) 3.8 7.8 3.8 Z (7150) 4.5 9.0 4.6 X (7755) 5.1 9.7 5.0 V (9863) 7.2 11.9 5.7 <Note> • A recommended solder paste thickness is between 0.10mm and 0.15mm. C A B III. Design of P. W. B. Do not use ceramic and metal board, because they have a large thermal expansion coefficient which is different from that of this capacitor, which are liable to cause a deterioration of thermal cycle endurance. IV. Soldering a) Soldering method This capacitor shall be used in reflow method only. Temperature of element surface(°C) b) Recommendable reflow soldering condition Temperature of element surface Recommendable reflow condition Soldering 300 (Max.235°C, Max. 5s) 250 200 150 220°C or more Pre-heating (150°C to 180°C) 20 to 30s 60 to 120s 100 50 Time (s) <Note> • The above figure is recommendable conditions. • Soldering frequency shall be maximum two times. Solder after capacitor body temperature returned for normal temperature soldering of a second time. • When further conditions except for the above, please obey the following conditions. Consult us before use when require further condition expect for the following. (Reflow) 240°C max. and 60 seconds max. at more than 220°C (temp. at cap. surface). • VPS’s heat effect to the capacitor is different in the reflow method, consult with our engineering section in advance when the capacitor is mounted in VPS. Film Capacitor Division Capacitor Business Division Panasonic Corporation REFERENCE 28-76 page 11 of 14 Clsf. Standard Doc. PLASTIC Product Specifications FILM CHIP CAPACITOR TYPE ECWU1 (C) No. 1-18 G 11/15 Revision Code c) Soldering conditions used in soldering iron Temperature Soldering time Other conditions 260°C maximum 4.0 seconds maximum Power of soldering iron:30W Pre-heating is not needed • In the case of sketch (a) Put a soldering iron to an electrode (for less than 4 sec) with solder like sketch (a) shows. *Put soldering iron lightly. *Soldering is allowed as one side by one side (without interval) or as both sides at the same time. • In the case of sketch (b) After a solder is melted on a soldering iron like sketch (b), put them to an electrode. (for less than 4sec) *Put soldering iron lightly. *Soldering is allowed as one side by one side (without interval) or as both sides at the same time. Sketch (b) Sketch (a) land land melting solder solder soldering iron soldering iron <Note> • Soldering frequency shall be maximum two times. Solder after capacitor body temperature returned for normal temperature soldering of a second time. • The above condition shall be applied also on re-working after reflow soldering. Readjust with once after reflow soldering. • When measuring temperature, it shall be operated with solder on soldering iron. • Please pay attention to the soldering iron not to touch a capacitor body(except electrode), especially not to touch cut edge side. • Consult with our engineering section in advance when require further conditions except for the above. d) Others • Solder a heat record of the case which soldering in others method with above-mentioned within b) and c) . • It is too much heat record that solders or solders removal this product or the other part which approaches this product using hot air – blow. Consult us before use. • Do not to use soldering this product by Light beam and laser beam. If used these method , consult us before use. • Consult us before use ,when soldering in other method. Film Capacitor Division Capacitor Business Division Panasonic Corporation P REFERENCE 28-76 page 12 of 14 Clsf. Standard Doc. Product Specifications PLASTIC FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code 1-18 G 12/15 V. Warning about solder paste • Solder paste shall be used which contains halogen with less than 0.1wt%.(In case of flow soldering, reflow soldering and using soldering iron.) VI. Cleaning a) Case of washfree Please use a recommended flux ,like low residue flux ULF-500VS or inactivated flux AM-173. b) Applicable solvent Type Alcohol Halogenated hydrocarbon Cleaner IPA(isopropyl alcohol) AK-225AES Manufacturer General industrial use Asahi Glass co.,Ltd. c) Cleaning method Item Conditions Immersion Vaporized cleaning Ultrasonic cleaning Temperature Room temperature Less than 50°C Less than 50°C Period Within 5minutes Within 5minutes Within 5minutes <Note> • When washing right after soldering, make sure the capacitor surface temperature is lower than 60°C. • It is necessary to remove cleaner from P.W.B. by drying thoroughly after cleaning. • Cleaner shall contain halogen with less than 0.1wt%, because in case of cleaning after mounting, halogen in flux will dissolve into cleaner. • Consult with our engineering section in advance when further information for cleaning solvent, conditions are required. VII. Storage and preservation • It must be noted that the solderability of the external electrode may deteriorated when stored in an atmosphere filled with moisture, dust, or a reactive oxidizing gas (hydrogen chloride, hydrogen sulfide, sulfuric acid) . • Avoid location with particularly high temperature and high humidity, and store in conditions not exceeding 35°C and 85%RH. Storage period limit is 6 months (use within 6 months). • Consult with our engineering section in advance when require further conditions except for the above. VIII. Operating environment • Consult us when used for a long period in humid environments, because characteristic deterioration as low insulation resistance and oxidized evaporated film may occur due to humidity absorbed with the passing of the time. • Avoid to use in a place of corrosive and oxidizing gas atmosphere (hydrogen chloride, hydrogen sulfide, sulfuric acid etc.) • Avoid use under the environment where water is generated to deteriorated the characteristic of the capacitor when the adhesion of water (drop of water etc.) is generated in the capacitor. • No dust should be permitted to remain on the surface of the product as this may cause electrical leakage. Film Capacitor Division Capacitor Business Division Panasonic Corporation P REFERENCE 28-76 page 13 of 14 Clsf. Standard Doc. Product Specifications PLASTIC FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code 1-18 G 13/15 P Capacitance change (%) IX. Capacitance change due to humidity absorption In environment with humidity change, capacitance of this capacitor changes (increases and decreases). Because capacitor absorbing and dis-absorbing due to humidity of environment. Consult with our engineering section detail of this capacitance change. [ For example : The data shown below is capacitance change from dry condition to 40°C, 95%RH condition.] 40°C • 95%RH About 8 % Dry condition Time → X. In case of using resin for fixing the chip parts In case of using resin for fixing the chip parts, inquiring in advance of our engineering section is recommended. XI. Resin coating When capacitors are coated or embedded with resin, inquiring of our engineering section is recommended. XII. Handling of a element When handle an element of the capacitor with tweezers, use tweezers made of resign and applied stress should be less than 5N. XIII. Stress, damage Please pay attention to the following points, when stress or damage is applied to the capacitor it may become the cause of malfunction. • Do not apply more than 5N as pull, stress and pressure etc. • Do not apply strong stress to cut edge side of the capacitor and not give the damage of scratch etc. XIV. Singular using This capacitor is generally surface mount device. Do not use singular using. 11. Life designed This product is designed as its life time is more than 10 year (actual working hours of capacitor are 50,000h) under the conditions that operating temperature is less than 85°C and applied voltage is than rated voltage. Film Capacitor Division Capacitor Business Division Panasonic Corporation REFERENCE 28-76 page 14 of 14 Clsf. Standard Doc. Product Specifications PLASTIC FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code Tab.1 Permissible pulse current (Max.10000cycles) Pulse current applied to this capacitor should be used within permissible pulse current (Max.10000cycles) shown in table. In case of pulse current is over the specified table, inquire of our engineering section. Item dV/dt(V/µs) ECWU1 123 to 823 (C) 320 ECWU1 104 to 154 (C) 210 ECWU1 184 to 334 (C) 120 ECWU1 394 to 474 (C) 100 ECWU1 564 to 105 (C) 70 Measuring method of inherent temperature rise As shown in the drawing, attach a thermocouple to the capacitor surface with adhesive, and measure the surface temperature and capacitor surface temperature while avoiding radiation heat from peripheral parts. At this time, use a thermocouple with small thermal capacity (Φ0.1 T wire), and to avoid heat release to the board, lift the parts to be measure from the board by using lead wire or the like, and install as shown in the drawing. To avoid effects of convention and wind, put the capacitor into the box or the like, and measure in wind-free condition. Thermocouple Land Solder-plated copper wireΦ0.8 Film Capacitor Division Temperature measurement instrument Capacitor Business Division Panasonic Corporation 1-18 G 14/15 P REFERENCE 28-76 page 15 of 14 Clsf. Standard Doc. Product Specifications Fig.3 PLASTIC Permissible Current Measuring condition FILM CHIP CAPACITOR TYPE ECWU1 (C) No. Revision Code 1-18 G 15/15 : Sine wave PERMISSIBLE CURRENT(Arms) 3.0 105 824 2.0 684 474 564 394 334 274 224 184 154 124 104 823 683 563 473 393 333 273 223 183 153 123 1.0 0 1 10 100 FREQUENCY(kHz) Film Capacitor Division Capacitor Business Division Panasonic Corporation 1000 P REFERENCE