TND340/D AMIS-49200 Fieldbus MAU Reference Board Physical Layer Conformance Testing FF−830 Test Results http://onsemi.com TECHNICAL NOTE Scope Test Equipment Used: Tektronix THS730A 2-channel Isolated Oscilloscope KEPCO − Variable Power Supply, all tests run at 24 V unless otherwise stated Discrete Board for Non-Fieldbus Power Supply with Two Terminators L = 5 mH, 18 AWG, 1.3 W Air Core Inductor (Jantzen) RL = 50 W 1% Two Terminators Each Consisting of: R = 50 W 1 W (Qty = 2) C = 2 mF 400 V Crosscap (Qty = 2) (Jantzen) Fieldbus Message Source Device HP33120A – Arbitrary Waveform Generator Waveform Generation Interface – a custom Fieldbus physical interface circuit card functions as the interface between the arbitrary waveform generator and the Fieldbus test network This document contains the relevant results of the FOUNDATION Fieldbus Physical Layer Conformance testing performed on the AMIS−49200 Fieldbus MAU Reference Board (Rev 1.0). For a detailed explanation of each test describing its purpose and set-up refer to FF−830. Definitions, Acronyms and Abbreviations DUT FIC ICS MAU MDS PN PR − Device Under Test − Field Interface Card − Implementation Conformance Statement − Medium Attachment Unit − Medium Dependent Sublayer − Probe Node − Probe Response Device Set-up All tests were run at room temperature. Device: AMIS−49200 FF Reference Board NOTES: The FF−830 specification (from Fieldbus Foundation) is not available from ON Semiconductor to customers. Please contact the Fieldbus Foundation at www.fieldbus.org to obtain the latest test specifications. Custom testing services are not provided by ON Semiconductor. Semiconductor Components Industries, LLC, 2013 July, 2013 − Rev. 3 1 Publication Order Number: TND340/D TND340/D TEST SUMMARY Table 1. TEST SUMMARY Test ID # Test Test Notes See Annex E of FF−830 Test Status 1.1 Valid ID of DUT (Note 1) 1.2 Static Conformance Review (Note 1) 1.3 ICS Self-consistency (Note 1) 1.4 Consistency between DUT and ICS (Note 1) 2.1 Signal and Power Connections (Note 1) 2.2 Receive Signal Polarity (Note 1) 2.3 Transmitted Signal Polarity (Note 1) 3.1 Output Amplitude 3.2 Output Amplitude with One Terminator 3.3 Signal Bias Pass 3.4 Output Signal Distortion Pass 4.1 Bit Rate (Note 1) 4.2 Bit Time (Note 1) 4.3 Rise and Fall Times Pass 4.4 Slew Rate Pass 4.5 Jitter (Note 1) 4.6 Transmit Enable Time (Note 1) 4.7 Quiescent DVC Output (Note 1) 5.1 Maximum Rate of Current Change (Note 1) 5.2 Maximum Current (Note 1) 6.1 Receiver Sensitivity Pass 6.2 Receiver Noise Rejection Pass 7.1 Operating Voltage (Note 1) 7.2 Withstand Voltage (Note 1) 7.3 Ripple Sensitivity (Note 1) 8.1 Common Mode Broadband Interference (Note 1) 8.2 Common Mode Power Frequency (Note 1) 9.1 Input Impedance 9.2 Unbalanced Capacitance Pass (Note 1) Pass (Note 1) 1. Accuracy of test requires entire node electronics to be present, including the host microprocessor and associated memory, Fieldbus link controller and associated support circuitry. Test is to be performed by customer. Test results for room temperature on tests run indicate the physical layer DOES conform to all specifications put forth by the Fieldbus Foundation. http://onsemi.com 2 TND340/D TEST RESULTS Test Group 1 – Static Conformance Review These tests are not applicable. Tests to be performed by customer. Test Group 2 – Basic Interconnection Tests These tests are not applicable. Tests to be performed by customer. Test Group 3 – Transmit Levels Test ID’s: 3.1 Output Amplitude, 3.3 Signal Bias, and 3.4 Output Signal Distortion Test Results: PASS Tests were set-up per diagram in “Test Group 3” of FF−830. Figure 1. Power Supply = 24 V Table 2. TEST CASE 3.1 Test Case 3.1 Output Amplitude Clause 223.1a Power Supply = 24 V Step Measured or Calculated Data (mV) Action-Behavior 3.1.2 Transmit PN and Capture DUT Response 3.1.3 Measure Maximum Positive Peak Level of Response Waveform 380 Measure Minimum Positive Trough Level of Response Waveform 372 Calculate Positive Mid-voltage (‘mid-voltage peak to trough’) 376 Measure Maximum Negative Peak Level of Response Waveform −408 Measure Minimum Negative Trough Level of Response Waveform −392 Calculate Negative Mid-voltage (‘mid-voltage peak to trough’) −400 Calculate Output Amplitude from Negative to Positive Mid-voltage 776 3.1.4 3.1.5 If Amplitude is between 0.75 V and 1.0 V Peak-to-peak Pass, otherwise Fail 3.3.5 Calculate | Positive Mid-voltage | – | Negative Mid-voltage | Pass 24 If Absolute Difference Does Not Exceed 50mV Peak Pass, otherwise Fail Calculate 10% of Peak-to-peak Verdict Pass 77.6 Calculate 10% Point −322.4 Calculate 90% Point 298.4 Set Cursors to 10% and 90% Points on the Waveform for Reference 3.4.3 Check Each Response Waveform Rise from 10−90% Peak-to-peak If No Negative Going Transitions in 10−90% pk-pk Range Pass, otherwise Fail 3.4.4 Check Each Response Waveform Fall from 90−10% Peak-to-peak If No Positive Going Transitions in 90−10% pk-pk Range Pass, otherwise Fail 3.4.5 Pass Check Each Response Waveform Region above 90% Peak-to-peak If No Variation 10% pk-pk Including All Distortions Pass, otherwise Fail 3.4.6 Pass Pass Check Each Response Waveform Region below 10% Peak-to-peak If No Variation 10% pk-pk Test Including All Distortions Pass, otherwise Fail http://onsemi.com 3 Pass TND340/D Test ID: 3.2 Output Amplitude One Trunk Terminator Removed This test is not applicable. Test to be performed by customer. 10 % point = negative mid-voltage + 10% of peak-to-peak = = −400 mV + 77.6 mV = −322.4 mV 90 % point = positive mid-voltage – 10% of peak-to-peak = = 376 mV – 77.6 mV = 298.4 mV Test Group 4 – Transmit Timing and Quiescent Output Test ID’s: 4.1 Bit Rate, 4.2 Bit Time These tests are not applicable. Tests to be performed by customer. Test ID’s: 4.3 Rise and Fall Times, 4.4 Slew Rate Test Results: PASS 1. Test ID 4.3 Rise and Fall Times: Positive mid−voltage + Positive Peak * Positive Trough ) 2 ) Positive Trough Positive mid−voltage + 380 mV * 372 mV ) 372 mV + 2 Figure 2. Fall Time 6.184 ms + 376 mV Negative mid−voltage + Negative Peak * Negative Trough ) 2 ) Negative Trough Negative mid−voltage + * 408 mV * (* 392 mV) * 392 mV + 2 + * 400 mV Peak-to-peak voltage = |Positive mid-voltage| + + |Negative mid-voltage| Peak-to-peak voltage = |376 mV| + |−400 mV| = 776 mV 10 % of peak-to-peak = 0.1 776 mV = 77.6 mV Figure 3. Rise Time 6.824 ms Table 3. TEST CASE 4.3 Test Case 4.3 Rise and Fall Times Clause 22.3.3a Step Action-Behavior Verdict 4.3.1 Set-up for Group 4 with Supply Set for 24 V 0.1 V D.C. at DUT 4.3.2 Transmit PN and Capture DUT Response (or Use Response from 4.2) 4.3.3 Measure Sample Response Waveform Fall from 90−10% Peak (it is Suggested to Use the Bit Cycle Selected for Test Case 4.2) Pass If Time Does Not Exceed 8 ms for 90−10% Peak-to-peak Pass, otherwise Fail 4.3.4 Measure Sample Response Waveform Rise from 90−10% Peak Pass If Time Does Not Exceed 8 ms for 10−90% Peak-to-peak Pass, otherwise Fail 2. Test ID 4.4 Slew Rate: Slew Rate + Volts ; Time Requirement : 0.2 V Volts x Time 1 mS 90% * 10% Range ; 0.165 VńmS http://onsemi.com 4 10% * 90% Range 0.150 VńmS TND340/D Table 4. TEST CASE 4.4 Test Case 4.4 Slew Rate Clause 22.3.3b Step Action-Behavior Verdict 4.4.1 Set-up for Group 4 with Supply Set for 24 V 0.1 V D.C. at DUT 4.4.2 Transmit PN and Capture DUT Response (or Use Response from 4.3) 4.4.3 Measure Each Response Waveform Fall from 90−10% Peak-peak Calculate Maximum Slew Rate between Each Pair of Sample Points If Slew Rate 0.2 V per ms at any Point in Range 10% to 90% Pass, otherwise Fail Pass Measure Each Response Waveform Rise from 10−90% Peak-peak Calculate Maximum Slew Rate between Each Pair of Sample Points If Slew Rate 0.2 V per ms at any Point in Range 10% to 90% Pass, otherwise Fail Test ID’s: 4.5 Jitter, 4.6 Transmit Enable Time, 4.7 Quiescent Transmitter Output These tests are not applicable. Tests to be performed by customer. Pass Verified that Communication Remained Intact for Several Minutes and RXA Remains Active Test Group 5 – Special Tests for Bus-powered Devices These tests are not applicable. Tests to be performed by customer. Test Group 6 – Receive Characteristics Plus Transmit Disable Time Test ID’s 6.1 Receive Sensitivity, 6.2 Receiver Noise Rejection Test Results: PASS 1. Test ID 6.1 Receive Sensitivity: Trigger on the Response from DUT Established Communication with the Device Reduced the Amplitude of the Waveform Generator until it is at 155 mVpp Figure 4. Channel 1 is PN in at 155 mV, Channel 2 is RXA Going Active Table 5. TEST CASE 6.1 Test Case 6.1 Receiver Sensitivity Part of Clause 22.4.2 Step Action-Behavior 6.1.1 Set-up for Group 6, Supply Set for 24 V 0.1 V D.C. at DUT 6.1.2 Set Waveform Generator for 155 mV 5 mV pk-pk at DUT 6.1.3 Transmit PN, Capture Response from DUT and Examine Verdict PR Length Preamble Start Delimiter End Delimiter Frame Control If Valid PR as Defined for Test Group 2 Pass, otherwise Fail http://onsemi.com 5 Pass TND340/D 2. Test ID 6.2 Receiver Noise Rejection: Trigger on the RxA Pin Established Communication with the Device Reduced the Amplitude of the Waveform Generator until it is at 70 mVpp Verified that Communication Fails and RxA Remains Inactive Figure 5. Channel 1 is PN in at 70 mV Channel 2 is RXA Staying Active Table 6. TEST CASE 6.2 Test Case 6.2 Receiver Noise Rejection Part of Clause 22.4.2 Step Action-Behavior 6.2.1 Set-up for Group 6, Supply Set for 24 V 0.1 V D.C. at DUT 6.2.2 Set Waveform Generator for 70 mV 5 mV pk-pk at DUT 6.2.3 Transmit PN, Capture Response from DUT Verdict If No Response, neither Valid nor Invalid Waveform, Pass Test Group 7 – Network Power Distribution Pass Test Group 9 – Input Circuit Parameter Measurement These tests are not applicable. Tests to be performed by customer. Test ID 9.1 Input Impedance Test Results: PASS Set-up according to Annex B for Bus-powered Devices Spec. Impedance 3 kW DUT Results: Powered but Idle at 9 V Test Group 8 – Interference Sensitivity These tests are not applicable. Tests to be performed by customer. Table 7. RESULTS Supply (V) Frequency in (kHz) Vz (Vp-p) Rs (W) Vrs (mVp-p) Z = (Rs/Vrs) * Vz (W) 9 7.8 0.3535 100.4 0.733 48419 9 15.625 0.3542 100.4 0.766 46425 9 31.25 0.3533 100.4 1.707 20780 9 39 0.3537 100.4 2.151 16509 Test ID 9.2 Unbalanced Capacitance This test is not applicable. Test to be performed by customer. http://onsemi.com 6 TND340/D REFERENCES [1] FF−830 Fieldbus Foundation Specification 31.25 kbit/s Physical Layer Conformance Test – Rev. 1.50 FOUNDATION is a registered trademark of Semiconductor Components Industries, LLC (SCILLC). ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. 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