Application Notes

AN11051
Pin FMEA for HEF4000 family
Rev. 2 — 15 July 2015
Application note
Document information
Info
Content
Keywords
FMEA, HEF4000, CMOS, wide operating supply range (3 V to 15 V)
Abstract
This application note provides a Failure Modes and Effects Analysis (FMEA) for
the device pins of the NXP Semiconductors’ HEF4000 family under typical failure
situations
AN11051
NXP Semiconductors
Pin FMEA for HEF4000 family
Revision history
Rev
Date
Description
v 1.0
20110428
initial version
v. 2.0
20150715
Table 4: Added pin VEE
Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
AN11051
Application note
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 15 July 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
2 of 6
AN11051
NXP Semiconductors
Pin FMEA for HEF4000 family
1. Introduction
Though the HEF4000 series is one of the oldest CMOS logic families around, it is still
frequently used in new designs because of its ease of design-in, wide operating supply
range (3 V to 15 V), excellent noise immunity, and low power consumption. All of the
standard functions are available, plus more specialized functions such as IEEE bus
interfaces and PLL frequency synthesizers.
2. Pin FMEA
This application note provides a Failure Modes and Effects Analysis (FMEA) for the
device pins of the NXP Semiconductor AUP family under typical failure situations such as
a short-circuit to VDD or VSS or to a neighboring pin, or if a pin is left open.
Some HEF4000 family devices have special functions, that can have different behaviors.
A failure is classified according to its effect on the HEF4000 device and the functionality of
the application; see Table 1.
Table 1.
Classification of failure effects
Class
Failure effect
A
damage to device
affects application functionality
B
no damage to device
may affect application functionality
C
no damage to device
no affect to application functionality
Table 2.
Pin
Class
Remarks
Input
B
normal operating condition, no damage, no leakage, may affect
functionality
Output
C
if output defined HIGH, no damage, no leakage, no output level change
Output
A
if output defined LOW, short-circuits and high currents can damage
device, output level changes
VSS
B
short-circuits and high currents can damage device, will affect
functionality
Table 3.
AN11051
Application note
FMEA matrix for pin short-circuit to VDD
FMEA matrix for pin short-circuit to VSS
Pin
Class
Remarks
Input
B
normal operating condition, no damage, no leakage, may affect
functionality
Output
C
if output defined LOW, no damage, no leakage, no output level change
Output
A
if output defined HIGH, short-circuits and high currents can damage
device, output level changes
VDD
B
no damage to device, will affect functionality
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 15 July 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
3 of 6
AN11051
NXP Semiconductors
Pin FMEA for HEF4000 family
Table 4.
FMEA matrix for pin left open
Pin
Class
Remarks
Input
B
undefined operating condition, no damage, increases leakage,
may affect functionality
Output
C
normal operating condition, no damage, no leakage
VSS; VEE
B
undefined operating condition, no damage, increases leakage,
will affect functionality
VDD
B
undefined operating condition, no damage, increases leakage (only for
I/O types), will affect functionality
Table 5.
FMEA matrix for pin short-circuits between neighboring pins
Pin
Class
Input to input
Remarks
C
if inputs have same voltage levels: no damage, no leakage
B
if inputs have different voltage levels: leakage increases, will
affect functionality
A
if input and output have different voltage levels, can cause
high current and can damage device, will affect functionality
C
if input and output have same voltage levels, no damage, no
leakage
Input to VSS
-
see Table 3
Input to VDD
-
see Table 2
Output to output
C
if outputs have same voltage levels, no damage, no leakage
A
if outputs have different voltage levels, can cause high
current and can damage device, will affect functionality
Input to output
Output to input
-
same effect as ‘input to output’ condition
Output to VSS
-
see Table 3
Output to VDD
-
see Table 2
VSS to VDD
-
not applicable, these pins are not neighbors
3. Abbreviations
Table 6.
AN11051
Application note
Abbreviations
Acronym
Description
CMOS
Complementary Metal-Oxide Semiconductor
FMEA
Failure Modes and Effects Analysis
PLL
Phase-Locked Loop
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 15 July 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
4 of 6
AN11051
NXP Semiconductors
Pin FMEA for HEF4000 family
4. Legal information
4.1
Definitions
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use of such information.
4.2
Disclaimers
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AN11051
Application note
design. It is customer’s sole responsibility to determine whether the NXP
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4.3
Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 15 July 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
5 of 6
AN11051
NXP Semiconductors
Pin FMEA for HEF4000 family
5. Contents
1
2
3
4
4.1
4.2
4.3
5
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pin FMEA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . .
Legal information. . . . . . . . . . . . . . . . . . . . . . . .
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3
3
4
5
5
5
5
6
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP Semiconductors N.V. 2015.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 15 July 2015
Document identifier: AN11051