ISO/IEC 17025:2005 – Techmaster Electronics, Fremont, Ca.

CERTIFICATE OF ACCREDITATION
ANSI-ASQ National Accreditation Board
500 Montgomery Street, Suite 625, Alexandria, VA 22314, 877-344-3044
This is to certify that
Techmaster Electronics, Inc.
46782 Lakeview Blvd.
Fremont, CA 94538
has been assessed by ANAB
and meets the requirements of international standard
ISO/IEC 17025:2005
and national standard
ANSI/NCSL Z540-1-1994
while demonstrating technical competence in the field(s) of
CALIBRATION
Refer to the accompanying Scope(s) of Accreditation for information regarding the types
of calibrations and/or tests to which this accreditation applies.
AC-1821
Certificate Number
ANAB Approval
Valid to: 11/13/2017
Version No. 001
Issued: 11/13/2015
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005. This
accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality
management system (refer to joint ISO-ILAC-IAF Communiqué dated January 2009).
SCOPE OF ACCREDITATION TO
ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994
Techmaster Electronics, Inc.
46782 Lakeview Blvd. Fremont CA 94538
Robert Tyler
[email protected]
760-536-0227, ext.12
www.techmastertest.com
CALIBRATION
Valid to: November 13, 2017
Certificate Number: AC-1821
I. Electromagnetic - DC/Low Frequency
PARAMETER/
EQUIPMENT
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
DC Voltage – Source3
(0 to 220) mV
220 mV to 2.2 V
(2.2 to 11) V
(11 to 22) V
(22 to 220) V
(220 to 1 100) V
8 µV/V + 0.6 µV
7 µV/V + 1 µV
7 µV/V + 3.5 µV
7 µV/V + 6.5 µV
8 µV/V + 80 µV
9 µV/V + 0.50 mV
(0 to 100) mV
100 mV to 1 V
(1 to 10) V
(10 to 100) V
(100 to 1 000) V
7.2 µV/V + 0.55 µV
7 µV/V + 0.42 µV
6.9 µV/V + 0.86 µV
9.2 µV/V + 38 µV
9.3 µV/V + 0.13 mV
Up to 15 kV
2 mV/V
DC Voltage - Measure3
Version 001
Issued: 11/13/2015
REFERENCE
STANDARD OR
EQUIPMENT
Fluke 5700A/03
Agilent 3458A Opt 002
Ross Engineering
VD-15,
Agilent 3458A Opt 002
Page 1 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
METHOD(S)
DOD Midas,
OEM, and GIDEP
Sourced Procedures
PARAMETER/
EQUIPMENT
AC Voltage - Source3
Version 001
RANGE
(0 to 2.2) mV
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(300 to 500) kHz
500 kHz to 1 MHz
(2.2 to 22) mV
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(300 to 500) kHz
500 kHz to 1 MHz
(22 to 220) mV
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(300 to 500) kHz
500 kHz to 1 MHz
220 mV to 2.2 V
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(300 to 500) kHz
500 kHz to 1 MHz
(2.2 to 22) V
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(300 to 500) kHz
500 kHz to 1 MHz
Issued: 11/13/2015
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
Fluke 5700A/03
DOD Midas,
OEM, and GIDEP
Sourced Procedures
0.55 mV/V + 4.5 µV
0.21 mV/V + 4.5 µV
0.11 mV/V + 4.5 µV
0.37 mV/V + 4.5 µV
0.85 mV/V + 7 µV
1.1 mV/V + 13 µV
1.7 mV/V + 25 µV
3.4 mV/V + 25 µV
0.55 mV/V + 5 µV
0.21 mV/V + 5 µV
0.11 mV/V + 5 µV
0.37 mV/V + 5 µV
0.85 mV/V + 7 µV
1.1 mV/V + 12 µV
1.7 mV/V + 25 µV
3.4 mV/V + 25 µV
0.55 mV/V + 13 µV
0.21 mV/V + 8 µV
0.11 mV/V + 8 µV
0.32 mV/V + 8 µV
0.85 mV/V + 25 µV
1.1 mV/V + 25 µV
1.7 mV/V + 35 µV
3.4 mV/V + 80 µV
0.50 mV/V + 80 µV
0.16 mV/V + 25 µV
75 µV/V + 6 µV
0.12 mV/V + 16 µV
0.25 mV/V + 70 µV
0.43 mV/V + 0.13 mV
1.1 mV/V + 0.35 mV
2.2 mV/V + 0.85 mV
0.50 mV/V + 0.80 mV
0.16 mV/V + 0.25 mV
75 µV/V + 60 µV
0.12 mV/V + 0.16 mV
0.25 mV/V + 0.35 mV
0.50 mV/V + 1.5 mV
1.3 mV/V + 4.3 mV
2.7 mV/V + 8.5 mV
Page 2 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
PARAMETER/
EQUIPMENT
AC Voltage - Source3
AC Voltage - Source3
Wide Band
Absolute Level Output
AC Voltage - Source3
Wide Band
Flatness relative to 1 kHz
DC Current - Source3
RANGE
(22 to 220) V
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(300 to 500) kHz
500 kHz to 1 MHz
220 V to 1 100 V
(15 to 50) Hz
50 Hz to 1 kHz
30 Hz to 500 kHz
(0 to 1.1) mV
(1.1 to 3) mV
(3 to 11) mV
(11 to 33) mV
(33 to 110) mV
(110 to 330) mV
330 mV to 1.1 V
(1.1 to 3.5) V
0.50 mV/V + 8 mV
0.16 mV/V + 2.5 mV
80 µV/V + 0.8 mV
0.22 mV/V + 3.5 mV
0.50 mV/V + 8 mV
1.5 mV/V + 90 mV
4.7 mV/V + 90 mV
12 mV/V + 0.19 V
8 mV/V + 2 µV
7 mV/V + 3 µV
7 mV/V + 8 µV
6 mV/V + 16 µV
6 mV/V + 40 µV
5 mV/V + 0.10 mV
5 mV/V + 0.40 mV
4 mV/V + 0.50 mV
3 mV/V
1 mV/V
1 mV/V
1 mV/V
1 mV/V
1 mV/V
1 mV/V + 3 µV
2 mV/V + 3 µV
4 mV/V + 3 µV
10 mV/V + 3 µV
(0 to 220) μA
220 μA to 2.2 mA
(2.2 to 22) mA
(22 to 220) mA
220 mA to 2.2 A
(0 to 11) A
(11 to 20.5) A
50 µA/A + 8 nA
50 µA/A + 8 nA
50 µA/A + 80 nA
60 µA/A + 0.8 µA
80 µA/A + 25 µA
0.50 mA/A + 0.50 mA
1 mA/A + 0.75 mA
Issued: 11/13/2015
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
Fluke 5700A/03
0.40 mV/V + 16 mV
80 µV/V + 3.5 mV
(10 to 30) Hz
(30 to 120) Hz
120 Hz to 1.2 kHz
(1.2 to 12) kHz
(12 to 120) kHz
120 kHz to 1.2 MHz
(1.2 to 2) MHz
(2 to 10) MHz
(10 to 20) MHz
(20 to 30) MHz
(0 to 220) A
Version 001
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
0.50 A
Fluke 5700A/03
Wide Band
Function
DOD Midas,
OEM and GIDEP
Sourced Procedures
Fluke 5700A/03
Wide Band
Function
Fluke 5700A/03
Fluke 5520A
HP 6671A,
L&N Current Shunt,
Agilent 3458A Opt 002
Page 3 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
Up to 100 nA
100 nA to 1 µA
(1 to 10) µA
(10 to 100) µA
100 µA to 1 mA
(1 to 10) mA
(1 to 10) A
22 µA/A + 93 pA
18 µA/A + 0.10 nA
28 µA/A + 0.14 nA
30 µA/A + 0.98 nA
30 µA/A + 6.5 nA
30 µA/A + 63 nA
1.5 mA/A + 0.80 mA
Agilent 3458A Opt 002
0.40 A
0.60 A
L&N 4361,
Agilent 3458A Opt 002
Agilent 3458A Opt 002
PARAMETER/
EQUIPMENT
DC Current - Measure3
AC Voltage - Measure3
Version 001
(10 to 100) A
(100 to 300) A
(0 to 10) mV
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
10 mV to 10 V
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
300 kHz to 1 MHz
(1 to 2) MHz
(10 to 100) V
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
300 kHz to 1 MHz
100 V to 1 kV
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(2 to 10.6) kV
60 Hz
Issued: 11/13/2015
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
Fluke 8846A
0.36 mV/V + 3.6 µV
0.23 V/V + 1.4 µV
0.32 mV/V + 1.7 µV
1.2 mV/V + 1.6 µV
5.7 mV/V + 2 µV
46 mV/V + 2.6 µV
72 µV/V + 0.85 mV
84 µV/V + 0.26 mV
0.17 mV/V + 0.26 mV
0.35 mV/V + 0.25 mV
0.93 mV/V + 0.27 mV
3.5 mV/V + 1.2 mV
12 mV/V + 1.2 mV
18 mV/V + 1.2 mV
DOD Midas,
OEM and GIDEP
Sourced Procedures
0.24 mV/V + 4.7 mV
0.15 mV/V + 16 mV
0.15 mV/V + 17 mV
0.36 mV/V + 8.6 mV
1.4 mV/V + 3.9 mV
4.8 mV/V + 12 mV
18 mV/V + 12 mV
0.46 mV/V + 50 mV
0.46 mV/V + 28 mV
0.69 mV/V + 29 mV
1.5 mV/V + 24 mV
3.6 mV/V + 24 mV
10 mV/V
Ross Engineering VD-15
Agilent 3458A Opt 002
Page 4 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
PARAMETER/
EQUIPMENT
AC Current - Source3
Version 001
RANGE
(0 to 220) µA
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
220 µA to 2.2 mA
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
(2.2 to 22) mA
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
(22 to 220) mA
(10 to 20) Hz
(20 to 40) Hz
40 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
220 mA to 2.2 A
20 Hz to 1kHz
(1 to 5) kHz
(5 to10) kHz
(20 to 1 000) A
(45 to 65) Hz
(65 to 440) Hz
Issued: 11/13/2015
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
Fluke 5700A
0.70 mA/A + 2.5 nA
0.35 mA/A + 20 nA
0.14 mA/A + 16 nA
0.60 mA/A + 40 nA
1.6 mA/A + 80 nA
0.70 mA/A + 40 nA
0.35 mA/A + 35 nA
0.14 mA/A + 35 nA
0.60 mA/A + 0.40 µA
1.6 mA/A + 0.80 µA
0.70 mA/A + 0.40 µA
0.35 mA/A + 0.35 µA
0.14 mA/A + 0.35 µA
0.60 mA/A + 4 µA
1.6 mA/A + 8 µA
DOD Midas,
OEM and GIDEP
Sourced Procedures
0.70 mA/A + 4 µA
0.35 mA/A + 3.5 µA
0.14 mA/A + 3.5 µA
0.60 mA/A + 40 µA
1.6 mA/A + 80 µA
0.66 mA/A + 0.17 mA
0.95 mA/A + 0.38 mA
3.6 mA/A + 0.75 mA
96 mA
43 mA
Page 5 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
Fluke 5520A
with Fluke Coil
PARAMETER/
EQUIPMENT
AC Current - Measure3
Resistance - Source3
Version 001
RANGE
(0 to 100) µA
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
100 µA to 100 mA
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
100 mA to 1 A
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
10A
(3 to 5) Hz
(5 to 10) Hz
10 Hz to 5 kHz
(5 to 10) kHz
100A
(50 to 60) Hz
300A
(50 to 60) Hz
(0 to 11) Ω
(11 to 33) Ω
(33 to 110) Ω
(110 to 330) Ω
330 Ω to 1.1 kΩ
(1.1 to 3.3) kΩ
(3.3 to 11) kΩ
(11 to 33) kΩ
(33 to 110) kΩ
(110 to 330) kΩ
330 kΩ to 1.1 MΩ
(1.1 to 3.3) MΩ
(3.3 to 11) MΩ
(11 to 33) MΩ
(33 to 110) MΩ
(110 to 330) MΩ
(330 to 1 100) MΩ
Issued: 11/13/2015
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
Agilent 3458A Opt 002
4 mA/A + 30 nA
1.5 mA/A + 30 nA
0.60 mA/A + 30 nA
0.60 mA/A + 30 nA
4 mA/A + 20 µA
1.5 mA/A + 20 µA
0.60 mA/A + 20 µA
0.30 mA/A + 20 µA
4 mA/A + 0.20 mA
1.6 mA/A + 0.20 mA
0.80 mA/A + 0.20 mA
1 mA/A + 0.20 mA
Fluke 8846A
20 mA/A + 6 mA
11 mA/A + 6 mA
1.5 mA/A + 6 mA
3.5 mA/A + 70 mA
0.60 A
0.80 A
5.7 µΩ/Ω + 1.1 mΩ
35 µΩ/Ω + 1.8 mΩ
29 µΩ/Ω + 0.57 Ω
33 µΩ/Ω + 2.4 mΩ
30 µΩ/Ω + 4.3 mΩ
33 µΩ/Ω + 27 mΩ
4.5 µΩ/Ω + 1.7 Ω
34 µΩ/Ω + 0.23 Ω
33 µΩ/Ω + 0.33 Ω
35 µΩ/Ω + 4 Ω
37 µΩ/Ω + 2.4 Ω
71 µΩ/Ω + 36 Ω
0.15 mΩ/Ω + 67 Ω
0.39 mΩ/Ω + 3 kΩ
0.58 mΩ/Ω + 4.8 kΩ
3.5 mΩ/Ω + 0.12 MΩ
18 mA/A + 0.59 MΩ
Leeds & Northrup
4361 w/3458A
Leeds & Northrup
4363 w/3458A
Fluke 5520A
Page 6 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
DOD Midas,
OEM and GIDEP
Sourced Procedures
PARAMETER/
EQUIPMENT
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
Resistance - Source3
Fixed Points
1Ω
1.9 Ω
10 Ω
19 Ω
100 Ω
190 Ω
1 kΩ
1.9 kΩ
10 kΩ
19 kΩ
100 kΩ
190 kΩ
1 MΩ
1.9 MΩ
10 MΩ
19 MΩ
100 MΩ
0.12 mΩ
0.22 mΩ
0.28 mΩ
0.58 mΩ
1.3 mΩ
2.4 mΩ
10 mΩ
20 mΩ
90 mΩ
0.19 Ω
1.3 Ω
2.5 Ω
24 Ω
47 Ω
0.47 kΩ
1.3 kΩ
12 kΩ
Fluke 5700A/003
10 Ω
100 Ω
1 kΩ
10 kΩ
100 kΩ
1 MΩ
10 MΩ
100 MΩ
1 GΩ
22 µΩ/Ω + 62 µΩ
18 µΩ/Ω + 0.61 mΩ
16 µΩ/Ω + 0.73 mΩ
15 µΩ/Ω + 13 mΩ
15 µΩ/Ω + 67 mΩ
21 µΩ/Ω + 2.7 Ω
46 µΩ/Ω + 0.39 kΩ
0.56 mΩ/Ω + 1.2 kΩ
6 mΩ/Ω + 12 kΩ
Agilent 3458A Opt 002
Resistance - Measure3
Fixed Points
(4 WIRE)
Fluke 5520A
Capacitance - Source3
190 pF to 1.1 nF
(1.1 to 11) nF
(11 to 110) nF
(110 to 330) nF
330 nF to 1.1 µF
(1.1 to 3.3) µF
(3.3 to 11) µF
(11 to 33) µF
(33 to 110) µF
(110 to 330) µF
330 µF to 1.1 mF
10 Hz to 10 kHz
10 Hz to 3 kHz
10 Hz to 1 kHz
10 Hz to 1 kHz
(10 to 600) Hz
(10 to 300) Hz
(10 to 150) Hz
(10 to 120) Hz
(10 to 80) Hz
(0 to 50) Hz
(0 to 20) Hz
5 mF/F + 12 pF
5.8 mF/F + 12 pF
2.9 mF/F + 0.12 nF
2.9 mF/F + 0.35 nF
3 mF/F + 1.2 nF
4.1 mF/F + 3.5 nF
4.1 mF/F + 11 nF
4.7 mF/F + 35 nF
5.9 mF/F + 0.11 µF
8.1 mF/F + 0.35 µF
12 mF/F + 0.27 µF
1 pF
10 pF
100 pF
1 nF
1 kHz
1 kHz
1 kHz
1 kHz
1.2 fF
12 fF
0.12 pF
1.2 pF
Version 001
REFERENCE
STANDARD OR
EQUIPMENT
Issued: 11/13/2015
Agilent 16380C
Page 7 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
METHOD(S)
DOD Midas,
OEM and GIDEP
Sourced Procedures
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
(-200 to -50) °C
(-50 to 1 372) °C
0.56 °C (1 °F)
0.28 °C (0.5 °F)
(-200 to -50) °C
(-50 to 400) °C
0.56 °C (1 °F)
0.28 °C (0.5 °F)
Type J
(-210 to -50) °C
(-50 to 760) °C
0.56 °C (1 °F)
0.28 °C (0.5 °F)
Type E
(-230 to -50) °C
(-50 to 1 000) °C
0.56 °C (1 °F)
0.28 °C (0.5 °F)
Type R
Oscilloscopes Square Wave Signal
10 Hz to 10 kHz
50 Ω
1MΩ
DC Signal
Into 50Ω
Into 1MΩ
(0 to 1 768) °C
0.95 °C (1.8 °F)
1 mV to 6.6 V p-p
1 mV to 130 V p-p
2.5 mV/V + 40 µV
0.50 mV/V + 5 µV
1 mV to 6.6 V p-p
1 mV to 130 V p-p
2.5mV/V + 40 µV
0.50 mV/V + 5 µV
Absolute Amplitude
50 kHz Reference
50 kHz to 100 MHz
(100 to 300) MHz
(300 to 500) MHz
(500 to 600) MHz
20 mV/V + 0.30 mV
35 mV/V + 0.30 mV
40 mV/V + 0.30 mV
55 mV/V + 0.30 mV
60 mV/V + 0.30 mV
Flatness referenced to
50 kHz reference
10 MHz Reference
600 MHz to 1.6 GHz
(1.6 to 2.1) GHz
20 mV/V + 0.30 mV
70 mV/V + 0.30 mV
80 mV/V + 0.30 mV
Time Markers
(5-2-1 sequence)
into a 50 Ω load
50 kHz to 100 MHz
(100 to 300) MHz
(300 to 500) MHz
(500 to 600) MHz
600 MHz to 1.6 GHz
(1.6 to 2.1) GHz
15 mV/V + 0.10 mV
20 mV/V + 0.10 mV
35 mV/V + 0.10 mV
40 mV/V + 0.10 mV
50 mV/V + 0.10 mV
60 mV/V + 0.10 mV
Fast Edge Mode
5 s to 50 ms
20 ms to 500 ps
2.5 µs/s + 5 µHz
0.33 µs/s
(1 to 100) kHz
< 0.15 ns/s +/- 25 ps
PARAMETER/
EQUIPMENT
Electrical Simulation
of Thermocouple
Indicating Devices –
Source and Measure3
Type K
Type T
Leveled Sine Wave
REFERENCE
STANDARD OR
EQUIPMENT
Fluke 5520A
Version 001
Issued: 11/13/2015
DOD Midas,
OEM and GIDEP
Sourced Procedures
Fluke 5820A
++
DOD Midas,
OEM and GIDEP
Sourced Procedures
+
2.1 GHz option
Programmable
Rise Time
METHOD(S)
Page 8 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
II. Electromagnetic - RF/Microwave
PARAMETER/
EQUIPMENT
RF Tuned Power Measure
100 kHz to 26.5 GHz
100 kHz to 3 GHz
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
0 dB
-10 dB
-20 dB
-30 dB
-40 dB
-50 dB
-60 dB
-70 dB
-80 dB
-90 dB
-100 dB
0.01 dB
0.02 dB
0.03 dB
0.04 dB
0.05 dB
0.05 dB
0.07 dB
0.08 dB
0.10 dB
0.10 dB
0.11 dB
-110 dB
-120 dB
-130 dB
0.11 dB
0.22 dB
0.56 dB
REFERENCE
STANDARD OR
EQUIPMENT
Agilent E4440A
Option 233
Digital Modulation Measure
Carrier Frequency
2 MHz to 2.65 GHz
HP 89441A
Option AYA
DOD Midas,
OEM and GIDEP
Sourced Procedures
Error Vector Magnitude
for Modulation Types:
MSK, GMSK, BPSK,
DQPSK, Π/4DQPSK,
8PSK, 16QAM, 32
QAM and QPSK
(1 to 100) kHz
100 kHz to 1 MHz
1 MHz to 2.65 GHz
0.3 %
0.5 %
1.0 %
Phase Error for
Modulation Types:
MSK, GMSK, BPSK,
DQPSK, Π/4DQPSK,
8PSK, 16QAM, 32
QAM and QPSK
(1 to 100) kHz
(0.1 to 1) MHz
1 MHz to 2.65 GHz
0.17 °
0.34 °
0.57 °
Error Vector Magnitude
for FSK Modulation
Modulation Frequency
3.2 kHz
1.152 kHz
0.3 %
1.0 %
DC to 100 kHz
0.46 dB
Amplitude Modulation –
Source
Rate:
10 MHz to 50 GHz
0 % to 100 %
Version 001
METHOD(S)
Issued: 11/13/2015
Agilent 83650B
Page 9 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
100 kHz to 10 MHz
0.75 % rdg. + 0.01 %
10 MHz to 3 GHz
0.5 % rdg. + 0.01 %
2.5 % rdg. + 0.01 %
PARAMETER/
EQUIPMENT
Amplitude Modulation Measure
Rate: 50 Hz to 10 kHz,
5 % to 99 %
50 Hz to 100 kHz,
20 % to 99 %
5 % to 20 %
50 Hz to 100 kHz,
20 % to 99 %
5 % to 20 %
Frequency Modulation Measure
Rate: 20 Hz to 10 kHz
(3 to 26.5) GHz
Dev: 200 Hz to 40 kHz pk
15 mHz/Hz + 1.5 Hz
10 mHz/Hz + 1.5 Hz
Rate: 50 Hz to 200 kHz
Dev:250 Hz to 400 kHz pk
10 MHz to 6.6 GHz
Beta > 0.2
Beta > 0.45
15 mHz/Hz + 1.5 Hz
10 mHz/Hz + 1.5 Hz
Rate: 50 Hz to 200 kHz
Dev:250 Hz to 400 kHz pk
(6.6 to 13.2) GHz
Beta > 0.2
Beta > 8
25 mHz/Hz + 3 Hz
10 mHz/Hz + 3 Hz
Rate: 50 Hz to 100 kHz
Dev:250 Hz to 400 kHz pk
(13.2 to 26.5) GHz
Beta > 0.2
Beta > 16
38 mHz/Hz + 6.0 Hz
10 mHz/Hz + 6.0 Hz
Frequency Modulation Source
1 kHz rate
Max. Dev. 2 MHz
Max. Dev. 1 MHz
Max. Dev. 2 MHz
Max. Dev. 4 MHz
Max. Dev. 8 MHz
Max. Dev. 16 MHz
Max. Dev. 32 MHz
Max. Dev. 64 MHz
250 kHz to 250 MHz
(250 to 500) MHz
500 MHz to 1 GHz
(1 to 2) GHz
(2 to 3.2) GHz
(3.2 to 10) GHz
(10 to 20) GHz
(20 to 40) GHz
Max Dev. 8 MHz
40 MHz to 50 GHz
Issued: 11/13/2015
METHOD(S)
Agilent N5531S
Option 233
1.5 % rdg. + 0.01 %
4.5 % rdg. + 0.01 %
250 kHz to 10 MHz
Beta > 0.2
Beta > 1.2
Version 001
REFERENCE
STANDARD OR
EQUIPMENT
Agilent N5531S
Option 233
35 mHz/Hz + 20 Hz
@ 1 kHz rate
Agilent E8257D
Option UNT
100 mHz/Hz
@ 1 MHz rate
Agilent 83650B
Page 10 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
DOD Midas,
OEM and GIDEP
Sourced Procedures
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
100 kHz to 6.6 GHz
(6.6 to 13.2) GHz
(13.2 to 26.5) GHz
10 mrad/rad + 0.0017 rad
10 mrad/rad + 0.0033 rad
10 mrad/rad + 0.0066 rad
PARAMETER/
EQUIPMENT
Phase Modulation Measure
>0.7 rad Dev.
>0.6 rad Dev.
>1.2 rad Dev.
Phase Modulation Source
250 kHz to 250 MHz
(250 MHz to 500 MHz
500 MHz to 1 GHz
(1 to 2) GHz
(2 to 3.2) GHz
(3.2 to 10) GHz
(10 to 20) GHz
(20 to 40) GHz
20 rad
10 rad
20 rad
40 rad
80 rad
160 rad
320 rad
640 rad
REFERENCE
STANDARD OR
EQUIPMENT
Agilent N5531S
Option 233
50 mrad/rad + 0.01 rad
Agilent E8257D
Option UNT
Distortion - Measure
Rate: 20 Hz to 250 kHz
(0.01 to 100) %
250 kHz to 26.5 GHz
+/- 1 dB
Agilent N5531S
20 Hz to 20 kHz
(20 to 100) kHz
+/- 1 dB
+/- 2 dB
Agilent 8903B
Power - Measure,
1 mW reference
50 MHz
1 mW Power Reference
0.3 % or 0.003 mW
Agilent 432A
Agilent 478A Opt H76
Agilent 3458A
100 kHz to 4.2 GHz
0.08 dB
Agilent E4419B
Agilent 8482A
10 MHz to 12.4 GHz
(12.4 to 18) GHz
0.08 dB
0.1 dB
50 MHz to 12.4 GHz
(12.4 to 26.5) GHz
0.1 dB
0.15 dB
(26.5 to 40) GHz
(40 to 50) GHz
0.16 dB
0.24 dB
Noise Figure - Source
15 dB ENR
10 MHz to 10 GHz
(10 to 26.5) GHz
0.14 dB
0.17 dB
Agilent 346C
Noise Figure - Measure
10 MHz to 10 GHz
(10 to 26.5) GHz
0.16 dB
0.18 dB
Agilent 346C,
Agilent E4440A Opt
219,
Agilent 8449B
Single Sideband Phase
Noise - Measure
1 MHz to 3 GHz
0.85 dB
Agilent E4440A Opt 226
Power Flatness
0 dBm or 1 mW
Version 001
Issued: 11/13/2015
METHOD(S)
Agilent E4419B
Agilent 8481A
Agilent E4419B
Agilent 8485A
Agilent E4419B
Agilent 8487A
Page 11 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
DOD Midas,
OEM and GIDEP
Sourced Procedures
PARAMETER/
EQUIPMENT
Transmission S12/S22 Measure Magnitude
Transmission S12/S22 Measure Phase
Transmission S12/S22 Measure Magnitude
Version 001
RANGE
45 MHz to 2 GHz
(0 to - 20) dB
(- 20 to - 30) dB
(- 30 to - 40) dB
(- 40 to - 50) dB
(- 50 to - 60) dB
(2 to 20) GHz
(0 to - 30) dB
(- 30 to - 40) dB
(- 40 to - 50) dB
(- 50 to - 60) dB
(20 to 40) GHz
(0 to - 30 dB
(- 30 to - 40 dB
(- 40 to - 50 dB
(- 50 to - 60 dB
(40 to 50) GHz
(0 to - 20) dB
(- 20 to - 30) dB
(- 30 to - 40) dB
(- 40 to - 50) dB
(- 50 to - 60) dB
45 MHz to 2 GHz
(0 to - 20) dB
(2 to 20) GHz
0 to - 20) dB
(20 to 40) GHz
(0 to - 20) dB
(40 to 50) GHz
(0 to - 20) dB
45 MHz to 2 GHz
(0 to - 25) dB
(- 25 to - 40) dB
(- 40 to - 55) dB
(- 55 to - 70) dB
(2 to 8) GHz
(0 to - 30) dB
(- 30 to - 50) dB
(- 50 to - 60) dB
(- 60 to - 70) dB
(8 to 20) GHz
(0 to - 30) dB
(- 30 to - 40) dB
(- 40 to - 50) dB
(- 50 to - 60) dB
(- 60 to - 70) dB
(20 to 26.5) GHz
(0 to - 20) dB
(- 20 to - 30) dB
(- 30 to - 40) dB
(- 40 to - 50) dB
(- 50 to - 60) dB
(- 60 to - 70) dB
Issued: 11/13/2015
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
0.03 dB
0.05 dB
0.15 dB
0.4 dB
1.5 dB
0.06 dB
0.08 dB
0.16 dB
0.35 dB
0.18 dB
0.34 dB
0.8 dB
2.5 dB
Agilent 8510/8517A,
Agilent 85056A
0.25 dB
0.4 dB
1.1 dB
4 dB
11 dB
0.15°
DOD Midas,
OEM and GIDEP
Sourced Procedures
0.4°
0.9°
1.2°
0.03 dB
0.05 dB
0.1 dB
0.4 dB
0.02 dB
0.04 dB
0.2 dB
0.7 dB
0.03 dB
0.06 dB
0.15 dB
0.6 dB
1.5 dB
Agilent 8510/8515A,
Agilent 85052D
0.04 dB
0.06 dB
0.2 dB
0.6 dB
2 dB
9 dB
Page 12 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
PARAMETER/
EQUIPMENT
Transmission S12/S22 Measure Phase
Reflection S11/S22 Measure Magnitude
RANGE
45 MHz to 2 GHz
(0 to - 20 dB
(2 to 8) GHz
(0 to - 20) dB
(8 to 20) GHz
(0 to - 20) dB
(20 to 26.5) GHz
(0 to - 20) dB
45 MHz to 2 GHz
(2 to 20) GHz
(20 to 40) GHz
(40 to 50) GHz
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
0.2 °
0.15 °
Agilent 8510/8515A
Agilent 85052D
0.18 °
0.25 °
0.02 dB
0.03 dB
0.04 dB
0.05 dB
Reflection S11/S22 Measure Phase
45 MHz to 50 GHz
16 °
Reflection S11/S22 Measure Magnitude
45 MHz to 2 GHz
(2 to 26.5) GHz
0.015 dB
0.01 dB
Agilent 8510/8517A
Agilent 85056A
DOD Midas,
OEM and GIDEP
Sourced Procedures
Agilent 8510/8515A
Agilent 85052D
Reflection S11/S22 Measure Phase
45 MHz to 26.5 GHz
4°
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
III. Time & Frequency
PARAMETER/
EQUIPMENT
1 μHz to 80 MHz
Frequency - Source3
5 x 10-125 x 10-12
5 x 10-12
REFERENCE
STANDARD OR
EQUIPMENT
Agilent 3325A
HP 33250A with
Agilent 58503B
58503B
Agilent E8257D with
Agilent E8257D
58503B
Agilent58503B
10 MHz to 26.5 GHz
5 x 10-12
(26.5 To 50) GHz
1 Hz
1 μHz to 225 MHz
5 x 10-12
Agilent 53132A
Agilent 58503B
10 Hz to 40 GHz
5 x 10-12
Agilent 53152A
Agilent 58503B
Agilent 83650L
Agilent 58503B
Frequency - Measure3
Version 001
Issued: 11/13/2015
METHOD(S)
Page 13 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
DOD Midas,
OEM and GIDEP
Sourced Procedures
IV. Thermodynamic
PARAMETER/
EQUIPMENT
Temperature - Measure
Relative Humidity Measure
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
(0 to 50) °C
0.25 °C
Hart Scientific
1620A with 2626-S
(-40 to 100) °F
(100 to 212) °F
(-40 to 100) °C
0.21 °F
0.25 °F
0.11°C
Oakton 340 with
S-08491-10
Surface Probe
(0 to 80) % RH
2 %RH
Vaisala
HMI41/HMP46
REFERENCE
STANDARD OR
EQUIPMENT
METHOD(S)
DOD Midas,
OEM and GIDEP
Sourced Procedures
V. Mechanical
PARAMETER/
EQUIPMENT
Scales
3
Balances 3
3
Torque - Source
Version 001
Issued: 11/13/2015
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
REFERENCE
STANDARD OR
EQUIPMENT
5 lb
10 lb
20 lb
50 lb
0.15 lb (0.02 g)
0.14 lb ( 0.031 g)
0.18 lb (0.05 g)
0.18 lb (0.51 g)
Troemner Weights
(5 to 50) lbs
Class F
100 g to 1 kg
0.00015 % of reading
10 mg
20 mg
100 mg
200 mg
500 mg
1g
2g
5g
10 g
20 g
50 g
100 g
0.21 mg
0.26 mg
0.43 mg
0.54 mg
0.72 mg
0.9 mg
1.1 mg
1.5 mg
2.0 mg
4.0 mg
10 mg
20 mg
Up to 50 ft/lb
(2 to 25) ft/lb
(0.6 % + 0.003) ft lb
(0.6 % + 0.003) ft lb
(2 to 25) in/lb
(0.5 % + 0.03) in lb
METHOD(S)
Troemner Weights
100 g to 1 kg
Generic Weight Set
10 mg to 100 g
Mountz LTT-2100
Mountz BMX25i with
Mountz LTT-2100
Page 14 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org
DOD Midas,
OEM and GIDEP
Sourced Procedures
VI. Dimensional
PARAMETER/
EQUIPMENT
RANGE
CALIBRATION &
MEASUREMENT
CAPABILITY
[EXPRESSED AS
UNCERTAINTY(±)]
Calipers 3 Inside Diameter
(Fixed Points)
1.0000 in
1.6000 in
820 µin + 21.1 µin/in
820 µin + 21.1 µin/in
Calipers 3 Outside Diameter
0.05000 in to 8.000 in
790 µin + 4.2 µin/in
REFERENCE
STANDARD OR
EQUIPMENT
Ringmaster Ring Gages
Mitutoyo
Gage Blocks
Micrometers 3Outside Diameter
0.05000 in to 8.000 in
METHOD(S)
DOD Midas,
OEM and GIDEP
Sourced Procedures
41 µin + 22.6 µin/in
Notes:
1.
2.
3.
4.
Calibration and Measurement Capabilities (Expanded Uncertainties) are based on approximately a 95% confidence interval, using a coverage of k=2.
This laboratory offers calibration services in-laboratory and on-site at customer-designated locations. Since on-site conditions are typically more variable
than those in the laboratory, larger measurement uncertainties are expected on-site than what is reported on the accredited scope.
These parameters are available for on-site calibration.
This scope is formatted as part of a single document including the Certificate of Accreditation No. AC-1821
Vice President
Version 001
Issued: 11/13/2015
Page 15 of 15
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org