Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 1 of 22
LABORATORY LOCATION:
AGILENT TECHNOLOGIES MICROWAVE
PRODUCTS (M) SDN. BHD.
BAYAN LEPAS FREE INDUSTRIAL ZONE
11900 PENANG, MALAYSIA
(PERMANENT LABORATORY)
This laboratory accredited under Skim Akreditasi Makmal Malaysia (SAMM) meets the
requirements of MS ISO/IEC 17025:2005 ‘General requirements for competence of testing
and calibration laboratories’. This Malaysian Standards is identical with ISO/IEC 17025:2005
published by the International Organization for Standardization (ISO).
* The expanded uncertainties are based on an estimated confidence probability of not
less than 95% and have a coverage factor of k=2 unless stated otherwise.
[1]
Documented calibration procedure number
Linear voltage reflection and transmission coefficient measurement
[3]
The CMC is expressed as ± (of indication in nV/V + floor value in nV)
[4]
iPIMMS is an internet-enabled impedance measurement service supplied and maintained
by UK’s National Physical Laboratory.
[5]
The %/% in CMC expresses the uncertainty of measured value (reading in %).
[6]
The CMC is expressed as uncertainty (%/%) of indication (%) + floor value in %.
[2]
FIELD OF CALIBRATION:
ELECTRICAL – RF/Microwave (50 Ω System)
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Remarks
Power Sources
Fitted with female Type-N
connectors
1 mW at 50 MHz
2.2 µW
1 mW 50 MHz
Reference Source
Calibration
1.01 kHz to 1 MHz
0 dB to 40 dB
40 dB to 80 dB
80 dB to 110 dB
0.009 dB
0.022 dB
0.033 dB
1 MHz to 80 MHz
0 dB to 40 dB
40 dB to 80 dB
80 dB to 110 dB
0.005 dB
0.010 dB
0.030 dB
Passive Devices Scalar
Attenuation, Measure
1 kHz
intermediate
frequency
substitution
method
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 2 of 22
FIELD OF CALIBRATION:
ELECTRICAL – RF/Microwave (50 Ω System)
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Passive Devices Scalar
Attenuation, Measure
(Continues)
Passive Devices
Scattering Parameter:
Reflection (Linear)
coefficient
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
80 MHz to 6 GHz
0 dB to 40 dB
40 dB to 80 dB
80 dB to 110 dB
0.010 dB
0.021 dB
0.032 dB
10 kHz to 300 kHz
0 to 0.1
0.1 to 0.5
0.5 to 1.0
0.0022
0.0028
0.0055
300 kHz to 6 GHz
0 to 0.1
0.1 to 0.5
0.5 to 1.0
0.0018
0.0024
0.0052
45 MHz to 18 GHz
0 to 0.1
0.1 to 0.5
0.5 to 1.0
0.0041
0.0041
0.0045
18 GHz to 26.5 GHz
0 to 0.1
0.1 to 0.5
0.5 to 1.0
0.0065
0.0065
0.0098
26.5 GHz to 50 GHz
0 to 0.1
0.1 to 0.5
0.5 to 1.0
0.0132
0.0132
0.015
Remarks
1 kHz
intermediate
frequency
substitution
method
Measure using
HP8753ES,
[2]
85054B
Measure using
HP8510C,
85054B
Measure using
HP8510C,
85052B or
85056A
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 3 of 22
FIELD OF CALIBRATION:
ELECTRICAL – RF/Microwave (50 Ω System)
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Passive Devices
Scattering Parameter:
Transmission coefficient
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
10 kHz to 30 kHz
0 dB to 10 dB
10 dB to 20 dB
20 dB to 30 dB
0.062 dB
0.072 dB
0.13 dB
30 kHz to 6 GHz
0 dB to 10 dB
10 dB to 20 dB
20 dB to 30 dB
30 dB to 40 dB
40 dB to 50 dB
50 dB to 60 dB
60 dB to 70 dB
70 dB to 80 dB
0.057dB
0.060dB
0.061dB
0.073 dB
0.090 dB
0.098 dB
0.15 dB
0.38 dB
45 MHz to 18 GHz
0 dB to 10dB
10 dB to 20 dB
20 dB to 30 dB
30 dB to 40 dB
40 dB to 50 dB
50 dB to 60 dB
60 dB to 70 dB
70 dB to 80 dB
0.020 dB
0.021 dB
0.026 dB
0.049 dB
0.058 dB
0.074 dB
0.15 dB
0.43 dB
18 GHz to 26.5 GHz
0 dB to 10 dB
10 dB to 20 dB
20 dB to 30 dB
30 dB to 40 dB
40 dB to 50 dB
50 dB to 60 dB
60 dB to 70 dB
70 dB to 80 dB
0.049 dB
0.050 dB
0.051 dB
0.052 dB
0.059 dB
0.11 dB
0.28 dB
0.85 dB
Remarks
Measure using
HP8753ES,
85054B
Measure using
HP8510C,
85054B
Measure using
HP8510C,
85052B or
85056A
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 4 of 22
FIELD OF CALIBRATION:
ELECTRICAL – RF/Microwave (50 Ω System)
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Passive Devices
Scattering Parameter:
Transmission coefficient
(Continue)
Range
26.5 GHz to 50 GHz
0 dB to 10 dB
10 dB to 20 dB
20 dB to 30 dB
30 dB to 40 dB
40 dB to 50 dB
50 dB to 60 dB
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Remarks
0.12 dB
0.12 dB
0.12 dB
0.15 dB
0.27 dB
0.75 dB
Power Sensor,
Calibration Factors
Reference to
1 mW at 50 MHz
100 pW to 1 µW
10 MHz to 50 MHz
50 MHz to 18 GHz
18 GHz to 26.5 GHz
26.5 GHz to 50 GHz
0.35 %
0.35 %
1.3 %
1.3 %
1 µW to 100 µW
9 kHz to 100 kHz
100 kHz to 10 MHz
10 MHz to 50 MHz
50 MHz to 4.2 GHz
4.2 GHz to 18 GHz
18 GHz to 26.5 GHz
26.5 GHz to 50 GHz
0.40 %
0.30 %
0.30 %
0.30 %
0.32 %
1.0 %
1.3 %
100 µW to 10 mW
9 kHz to 100 kHz
100 kHz to 10 MHz
10 MHz to 50 MHz
50 MHz to 4.2 GHz
4.2 GHz to 18 GHz
18 GHz to 26.5 GHz
26.5 GHz to 50 GHz
0.40 %
0.30 %
0.30 %
0.30 %
0.32 %
1.0 %
1.3 %
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 5 of 22
FIELD OF CALIBRATION:
ELECTRICAL – RF/Microwave (50 Ω System)
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Power Sensor,
Calibration Factors
(continue)
75 Ω System
Frequency Sources
Signatories:
1.
2.
3.
4.
Yong En Haur
Tan Ming Hui
Kee Kah Ghim
Cheong Chee Seng
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
10 mW to 100 mW
9 kHz to 100 kHz
100 kHz to 10 MHz
10 MHz to 50 MHz
50 MHz to 4.2 GHz
4.2 GHz to 18 GHz
18 GHz to 26.5 GHz
26.5 GHz to 50 GHz
0.40 %
0.30 %
0.30 %
0.30 %
0.32 %
1.0 %
1.3 %
100 mW to 3 W
100 kHz to 10 MHz
10 MHz to 4.2 GHz
4.2 GHz to 18 GHz
0.30 %
0.30 %
0.33 %
1 µW to 100 mW
100 kHz to 2 GHz
0.97 %
10 MHz
-11
1.3 × 10
Hz/Hz
Remarks
Measure using
HP5071A,
53132A
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 6 of 22
FIELD OF CALIBRATION:
ELECTRICAL – RF/Microwave (50 Ω System)
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement Parameter
Scattering Parameter:
Reflection
Coefficient, Γ
Range
Calibration and
Measurement
Capability
expressed as an
uncertainty (±)*
Measure using
[4]
iPIMMS
-1 ≤ Re{ Γ } ≤ 1
-1 ≤ Im{ Γ } ≤ 1
constrained by:
0≤ | Γ | ≤ 1
Passive Devices fitted with
Type-N connectors
45 MHz to 18 GHz
Passive Devices fitted 3.5
mm connectors
45 MHz to 33 GHz
Scattering Parameter:
Transmission Coefficient, T
-1 ≤ Re{ Τ } ≤ 1
-1 ≤ Im{ Τ } ≤ 1
constrained by:
0 ≤ |Τ| ≤1
Passive Devices fitted with
Type-N connectors
45 MHz to 18 GHz
0 dB to 10 dB
10 dB to 20 dB
20 dB to 30 dB
30 dB to 40 dB
40 dB to 50 dB
50 dB to 60 dB
60 dB to 70 dB
70 dB to 80 dB
80 dB to 90 dB
90 dB to 100 dB
Remarks
0.0030
[2]
0.0040
Measure using
[4]
iPIMMS
0.0002 dB
0.0088 dB
0.018 dB
0.027 dB
0.037 dB
0.056 dB
0.12 dB
0.34 dB
1.0 dB
2.9 dB
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 7 of 22
FIELD OF CALIBRATION:
ELECTRICAL – RF/Microwave (50 Ω System)
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement Parameter
Range
Calibration and
Measurement
Capability
expressed as an
uncertainty (±)*
Scattering Parameter:
Transmission
Coefficient, T
(continue)
Passive Devices fitted
3.5 mm connectors
Signatory:
1.
2.
Yong En Haur
Tan Ming Hui
45 MHz to 33 GHz
0 dB to 10 dB
10 dB to 20 dB
20 dB to 30 dB
30 dB to 40 dB
40 dB to 50 dB
50 dB to 60 dB
60 dB to 70 dB
70 dB to 80 dB
80 dB to 90 dB
90 dB to 100 dB
0.0002 dB
0.0088 dB
0.018 dB
0.027 dB
0.037 dB
0.056 dB
0.12 dB
0.34 dB
1.0 dB
2.9 dB
Remarks
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 8 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Remarks
1 nW to 100 mW
9 kHz to 6 GHz
28mW/W
Agilent E9304A
10 nW to 1 W
9 kHz to 18 GHz
29 mW/W
Agilent E9304A H19
10 nW to 1 W
9 kHz to 24 GHz
41 mW/W
Agilent E9304A H25
1 µW to 100 mW
50 MHz to 50 GHz
17 mW/W
Agilent 8487A
1 fW to 3.16 µW
9 kHz to 50 GHz
23 mW/W
Agilent E9304A
Agilent 8487A
Agilent E4448A
Signal Sources Absolute RF Power in
Coaxial
Signal Sources Harmonic Content
Signal Sources - Pulse
Time Parameters
Rise/Fall Time
Fundamental Frequency
1 MHz to 25 GHz
0 to 10 dBm
Harmonic Frequency
2 MHz to 50 GHz
-110 dBm to 0 dBm
0 to 10 dBm
10 MHz to 50 GHz
Agilent E4448A
0.51 dB
86 ps
Agilent 86100C
Agilent 86117A
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 9 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Remarks
Signal Sources –
Modulation
Frequency Modulation
Peak Frequency
Deviation
-18 to 30 dBm
fc: 250 kHz to 10 MHz
fm: 20 Hz to 10 kHz
∆f: 200 Hz to 40 kHz
β> 0.2
0.015 Hz/Hz
fc: 250 kHz to 10 MHz
fm: 20 Hz to 10 kHz
∆f: 200 Hz to 40 kHz
β> 1.2
0.010 Hz/Hz
fc: 10 MHz to 6.6 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 0.2
0.015 Hz/Hz
fc: 10 MHz to 6.6 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 0.45
0.010 Hz/Hz
fc: 6.6 GHz to 13.2 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 0.2
0.025 Hz/Hz
fc: 6.6 GHz to 13.2 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 8
0.010 Hz/Hz
fc: 13.2 GHz to 31.15 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 0.2
0.038 Hz/Hz
Agilent E4448A
fc = Carrier Frequency
fm = Modulation Rate
∆f=Peak Deviation
β = ∆f / fm
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 10 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Signal Sources –
Modulation
Frequency Modulation
Peak Frequency
Deviation
(continue)
Range
fc: 13.2 GHz to 31.15 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 16
0.010 Hz/Hz
fc: 31.15 GHz to 50 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 0.2
0.085 Hz/Hz
fc: 31.15 GHz to 50 GHz
fm: 50 Hz to 200 kHz
∆f: 250 Hz to 400 kHz
β> 32
Amplitude Modulation
Depth
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Remarks
0.010 Hz/Hz
-18 to 30 dBm
fm: 50 Hz to 100 kHz
[5]
fc: 100 kHz to 10 MHz
Depth: 5 % to 99 %
0.0075 %/%
fc: 10 MHz to 3 GHz
Depth: 20 % to 99 %
0.005 %/%
fc: 10 MHz to 3 GHz
Depth: 5 % to 20 %
0.025 %/%
fc: 3 GHz to 26.5 GHz
Depth: 20 % to 99 %
0.015 %/%
fc: 3 GHz to 26.5 GHz
Depth: 5 % to 20 %
0.045 %/%
fc: 26.5 GHz to 31.15 GHz
Depth: 20 % to 99 %
0.019 %/%
[5]
[5]
[5]
[5]
[5]
Agilent E4448A
fc = Carrier Frequency
fm = Modulation Rate
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 11 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Amplitude Modulation
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
[5]
fc: 26.5 GHz to 31.15 GHz
Depth: 5 % to 20 %
0.068 %/%
fc: 31.15 GHz to 50 GHz
Depth: 5 % to 20 %
0.06 %/%
fc: 31.15 GHz to 50 GHz
Depth: 5 % to 20 %
0.26 %/%
(continue)
Phase Modulation
Peak phase deviation
Remarks
Agilent E4448A
fc = Carrier Frequency
fm = Modulation Rate
[5]
[5]
-18 to 30 dBm
fc: 100 kHz to 6.6 GHz
∆Φ > 0.7 rad
0.01 rad/rad
fc: 100 kHz to 6.6 GHz
∆Φ > 0.3 rad
0.03 rad/rad
fc: 6.6 GHz to 13.2 GHz
∆Φ > 2.0 rad
0.01 rad/rad
fc: 6.6 GHz to 13.2 GHz
∆Φ > 0.6 rad
0.03 rad/rad
fc: 13.2 GHz to 26.5 GHz
∆Φ > 4.0 rad
0.01 rad/rad
fc: 13.2 GHz to 26.5 GHz
∆Φ > 1.2 rad
0.03 rad/rad
fc: 26.5 GHz to 31.15 GHz
∆Φ > 4.0 rad
0.01 rad/rad
fc: 26.5 GHz to 31.15 GHz
∆Φ > 1.3 rad
0.03 rad/rad
fc: 31.15 GHz to 50 GHz
∆Φ > 8 rad
0.01 rad/rad
fc: 31.15 GHz to 50 GHz
∆Φ > 2.4 rad
0.03 rad/rad
Agilent PSA E4448A
fc = Carrier Frequency
∆Φ = Phase Deviation
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 12 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Modulation Rate
Amplitude Modulation
Rate
Frequency Modulation
Rate
Phase Modulation Rate
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
100 kHz ≤ fc< 50 GHz
Remarks
Agilent E4448A
β = ∆f / fm
fm = Modulation Rate
Depth ≥ 20%
fm ≤ 100 kHz
0.062 Hz
β ≥ 0.01
fm ≤ 200 kHz
0.062 Hz
β ≥ 0.01
fm ≤ 20 kHz
0.062 Hz
Signal Sources Modulation Distortion
0.01% to 100%
Amplitude Modulation
Distortion
fm: 20 Hz to 1 kHz
fc: 0.1 to 10 MHz
Depth: > 1 %
Depth: > 3 %
0.0012 %/% + 0.8 %
[6]
0.0012 %/% + 0.3 %
fm: 20 Hz to 1 kHz
fc: 10 MHz to 26.5 GHz
Depth: > 1 %
Depth: > 3 %
0.0012 %/% + 1.0 %
[6]
0.0012 %/% + 0.4 %
fm: 20 Hz to 1 kHz
fc: 26.5 to 50 GHz
Depth: > 1 %
Depth: > 3 %
Depth: > 5 %
0.0012 %/% + 6.2 %
0.0012 %/% + 2.0 %[6]
[6]
0.0012 %/% + 1.5 %
[6]
[6]
[6]
Agilent E4448A
fc =Carrier Frequency
fm = Modulation Rate
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 13 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Signal Sources Modulation Distortion
(continue)
Phase Modulation
Distortion
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
fc: 1 MHz to 6.6 GHz
fm: 20 Hz to 500 Hz
∆Φ > 0.8 rad
∆Φ ≥ 2.5 rad
0.0012 %/% + 0.3 %
[6]
0.0012 %/% + 0.1 %
fc: 1 MHz to 6.6 GHz
fm: 500 Hz to 1 kHz
∆Φ> 0.4 rad
∆Φ ≥ 1.0 rad
0.0012 %/% + 0.3 %
0.0012 %/% + 0.1 %[6]
fc: 6.6 GHz to 13.2 GHz
fm: 20 Hz to 500 Hz
∆Φ > 1.8 rad
∆Φ ≥ 5.5 rad
0.0012 %/% + 0.3 %[6]
[6]
0.0012 %/% + 0.1 %
fc: 6.6 GHz to 13.2 GHz
fm: 500 Hz to 1 kHz
∆Φ > 0.8 rad
∆Φ ≥ 2.5 rad
0.0012 %/% + 0.3 %
[6]
0.0012 %/% + 0.1 %
fc: 13.2 GHz to 31.15 GHz
fm: 20 Hz to 500 Hz
∆Φ > 3.5 rad
∆Φ ≥ 10.0 rad
0.0012 %/% + 0.3 %
[6]
0.0012 %/% + 0.1 %
fc: 13.2 GHz to 31.15 GHz
fm: 500 Hz to 1 kHz
∆Φ > 1.2 rad
∆Φ ≥ 4.0 rad
0.0012 %/% + 0.3 %
0.0012 %/% + 0.1 %[6]
fc: 31.15 GHz to 50 GHz
fm: 20 Hz to 500 Hz
∆Φ > 7.5 rad
∆Φ ≥ 19.0 rad
0.0012 %/% + 0.3 %[6]
[6]
0.0012 %/% + 0.1 %
fc: 31.15 GHz to 50 GHz
fm: 500 Hz to 1 kHz
∆Φ > 3.0 rad
∆Φ ≥ 8.0 rad
0.0012 %/% + 0.3 %
[6]
0.0012 %/% + 0.1 %
[6]
[6]
[6]
[6]
[6]
[6]
Remarks
Agilent E4448A
fc =Carrier Frequency
fm = Modulation Rate
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 14 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Signal Sources Modulation Distortion
(continue)
Frequency Modulation
Distortion
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
fc: 1 MHz to 6.6 GHz
fm: 20 Hz to 1 kHz
∆f: 500 Hz to 2 kHz
∆f ≥ 2.0 kHz
0.0012 %/% + 0.3 %
[6]
0.0012 %/% + 0.1 %
fc: 6.6 GHz to 13.2 GHz
fm: 20 Hz to 1 kHz
∆f> 2.3 kHz
∆f ≥ 4.5 kHz
0.0012 %/% + 0.3 %
0.0012 %/% + 0.1 %[6]
fc: 13.2 GHz to 31.15 GHz
fm: 20 Hz to 1 kHz
∆f> 2.7 kHz
∆f ≥ 6.0 kHz
0.0012 %/% + 0.3 %[6]
[6]
0.0012 %/% + 0.1 %
fc: 31.15 GHz to 50 GHz
fm: 20 Hz to 1 kHz
∆f> 4.0 kHz
∆f ≥ 12.0 kHz
0.0012 %/% + 0.3 %
[6]
0.0012 %/% + 0.1 %
[6]
[6]
[6]
Remarks
Agilent E4448A
fc =Carrier Frequency
fm = Modulation Rate
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 15 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Sources
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Agilent 89441A vector
signal analyzer
Signal Sources -Digital
Modulation
Carrier: 2 MHz to 2.65
GHz
Error Vector Magnitude
for Modulation Types:
MSK, GMSK, BPSK,
DQPSK, π/4DQPSK,
8PSK, 16QAM and
32QAM, QPSK
Phase Error for
Modulation Types:
MSK, GMSK, BPSK,
DQPSK, n/4DQPSK,
8PSK, 16QAM and
32QAM, QPSK
Error Vector Magnitude
for FSK Modulation
Signal Sources -Phase
Noise
Signal Sources –
Frequency
Signatories:
1.
2.
Yong En Haur
Liew Tye Leong
Remarks
Mod Frequency Span:
(1 to 100) kHz
(0.1 to 1) MHz
1 MHz to 2.65 GHz
0.31 % rms
0.51 % rms
1.1 % rms
(1 to 100) kHz
(0.1 to 1) MHz
1 MHz to 2.65 GHz
0.18 ° rms
0.35 ° rms
0.58 ° rms
Mod Frequency:
3.2 kHz
1.152 kHz
0.51 % rms
1.60 % rms
Power level:
0 dBm to 15 dBm
fc: 50 kHz to 1600 MHz
f offset: 0.1 Hz to 1 MHz
2.4 dBc/Hz
Power level:
0 dBm to 15 dBm
fc: 1.2 to 26.5 GHz
f offset: 0.1 Hz to 1 MHz
2.4 dBc/Hz
100 MHz to 45 GHz
Agilent N5500A
-12
9.6 × 10
Hz/Hz
Agilent E4448A
HP 5071A
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 16 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Analyzers
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Range
Calibration and
Measurement
Capability
expressed as an
uncertainty (±)*
Signal Analyzers –
Absolute RF Power in
Coaxial Line
Remarks
Signal Source E8257D,
Power Splitters,
Power Meters
Power Sensors
100 pW to 10 µW
10 MHz to 18 GHz
22 mW/W
Power Sensor 8481D
1 µW to 1 mW
100 kHz to 4.2 GHz
13 mW/W
Power Sensor 8482A
1 µW to 1 mW
10 MHz to 18 GHz
13 mW/W
Power Sensor 8481A
1 µW to 1 mW
50 MHz 26.5 Hz
18 mW/W
Power Sensor 8485A
100 pW to 10 µW
50 MHz 26.5 Hz
40 mW/W
Power Sensor 8485D
1 µW to 1 mW
50 MHz 50 GHz
18 mW/W
Power Sensor 8487A
100 pW to 10 µW
50 MHz 50 GHz
39 mW/W
Power Sensor 8487D
1 µW to 1 mW
100 kHz to 3 GHz
(75 Ω system)
16 mW/W
Power Sensor 8483A
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 17 of 22
ELECTRICAL – RF & Microwave (50 Ω System) for
Signal Analyzers
FIELD OF CALIBRATION:
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement
Parameter
Signal Analyzers –
Relative RF Power
in Coaxial Line
Signal Analyzers,
Frequency Counters –
Frequency
Signal Analyzers –
Phase Noise
Range
Calibration and
Measurement
Capability
expressed as an
uncertainty (±)*
0 dB to 70 dB
70 dB to 110 dB
Max power level: 10 dBm
50 MHz to 2 GHz
0.013 dB
0.040 dB
Signal Source E8257D,
Step Attenuators
100 MHz to 50 GHz
1.4 × 10-11 Hz/Hz
Signal Source E8257D,
Frequency Standard
5071A
Carrier frequency: 1 GHz
0.36 dB
Offset frequency:
100 Hz to 10 MHz
Signatories:
1.
2.
Yong En Haur
Liew Tye Leong
Remarks
Signal Source 500-13438
Source phase noise:
-107 to -167 dBc/Hz
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 18 of 22
FIELD OF CALIBRATION:
ELECTRICAL – DC & Low Frequency
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement Parameter
DC Sources,
DC Voltmeters
DC Resistance Sources
Specific Values
Range
150 µV to 10 V
0.1 Ω
0.48 Ω
1Ω
4.8 Ω
10 Ω
65 Ω
100 Ω
1 kΩ
10 kΩ
100 kΩ
1 MΩ
10 MΩ
100 MΩ
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
5 nV/V + 100 nV
0.13 µΩ
0.61 µΩ
1.3 µΩ
6.7 µΩ
13 µΩ
87 µΩ
0.13 mΩ
1.3 mΩ
13 mΩ
0.13 Ω
1.6 Ω
21 Ω
0.23 kΩ
[3]
Remarks
[1]
JVS.ZS.N803
Measure using
resistance standards
and bridge
[1]
LNRES.MX.N528
DC Voltage Sources
0 mV to 100 mV
100 mV to 1 V
1 V to 10 V
10 V to 100 V
100 V to 1000 V
0.21 µV
0.74 µV
7.4 µV
74 µV
1.2 mV
Measure using Fluke
732B, voltmeter, voltage
divider
[1]
5720CAL.MX.N626
DC Current Sources
0 µA to 100 µA
100 µA to 300 µA
300 µA to 1 mA
1 mA to 3 mA
3 mA to 10 mA
10 mA to 30 mA
30 mA to 100 mA
100 mA to 300 mA
300 mA to 1 A
0.38 nA
0.82 nA
3.5 nA
7.4 nA
36 nA
77 nA
0.58 µA
0.97 µA
5.9 µA
Measure using
resistance standards
and voltmeter
5720CAL.MX.N626[1]
AC Voltage Sources
Specific Values
1 mV to 1000 V
(See Matrix A)
(See Matrix A)
Measure using
Fluke 5790A
[1]
5720CAL.MX.N626
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 19 of 22
FIELD OF CALIBRATION:
ELECTRICAL – DC & Low Frequency
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement Parameter
AC Current Sources
Specific Values
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
10 µA to 1 A
(See Matrix B)
(See Matrix B)
Remarks
Measure using
Fluke 5790A with ac
current shunts
[1]
5720CAL.MX.N626
Matrix A
AC Voltage Sources
Specific
Values
1 mV
10 mV
100 mV
1V
3V
10 V
0.01
3.0 µV
17 µV
140 µV
1.4 mV
0.02
2.2 µV
7.8 µV
48 µV
0.52 mV
0.04
1.7 µV
5.4 µV
25 µV
0.31 mV
1
1.4 µV
1.8 µV
4.9 µV
21 µV
85 µV
0.24 mV
100 V
300 V
500 V
700 V
1000 V
14 mV
-
5.2 mV
-
3.1 mV
34 mV
2.9 mV
39 mV
Frequency (kHz)
10
20
50
1.4 µV
2.1 µV
2.7 µV
3.7 µV
4.5 µV
18 µV
21 µV
53 µV
64 µV
0.55 mV 0.70 mV
-
6.4 mV
28 mV
94 mV
8.0 mV
180 mV
240 mV
-
100
4.7 µV
8.9 µV
28 µV
130 µV
1.5 mV
300
7.5 µV
13 µV
45 µV
200 µV
2.9 mV
500
9.0µV
22 µV
110 µV
610 µV
8.3 mV
1000
9.0µV
22 µV
110 µV
620 µV
8.3 mV
18 mV
180 mV
-
-
-
-
Matrix B
AC Current Sources
Specific
Values
10 µA
100 µA
1 mA
10 mA
100 mA
1A
0.01
3.0 nA
19 nA
180 nA
1.8 µA
18 µA
190 µA
Signatory:
1.
Yong En Haur
0.02
2.4 nA
12 nA
110 nA
0.99 µA
9.9 µA
120 µA
Frequency (kHz)
0.05
1
1.9 nA
2.0 nA
9.7 nA
9.4 nA
86 nA
83 nA
0.81 µA
0.78 µA
8.1 µA
7.8 µA
97 µA
94 µA
5
2.0 nA
9.4 nA
83 nA
0.78 µA
7.8 µA
94 µA
10
2.0 nA
9.4 nA
83 nA
0.78 µA
7.8 µA
95 µA
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 20 of 22
FIELD OF CALIBRATION:
ELECTRICAL – DC & Low Frequency
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement Parameter
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Remarks
DC Voltage Meters
Specific Values
100 mV
1V
10 V
100 V
1000 V
0.15 µV
1.4 µV
3.7 µV
0.27 mV
5.9 mV
Generate using
Fluke 5720A with
Agilent 3458A
[1]
3458A.Z1.N01
Resistance Meters
Specific Values
1Ω
10 Ω
100 Ω
1 kΩ
10 kΩ
100 kΩ
1 MΩ
10 MΩ
100 MΩ
1 GΩ
4.4 µΩ
32 µΩ
0.15 mΩ
1.9 mΩ
13 mΩ
0.31 Ω
13 Ω
0.27 kΩ
7.8 kΩ
0.96 MΩ
Generate using
Fluke 5720A with
Agilent 3458A
[1]
3458A.Z1.N01
DC Current Meters
Specific Values
100 nA
1 µA
10 µA
100 µA
1 mA
10 mA
100 mA
1A
3.2 pA
24 pA
0.22 nA
1.1 nA
9.9 nA
0.11 µA
1.5 µA
52 µA
Generate using
Fluke 5720A with
Agilent 3458A
[1]
3458A.Z1.N01
AC Voltage Meters
Specific Values
10 mV to 1000 V
(See Matrix C)
(See Matrix C)
Generate using
Fluke 5720A, Agilent
3325B with Agilent
3458A
[1]
3458A.Z1.N01
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 21 of 22
FIELD OF CALIBRATION:
ELECTRICAL – DC & Low Frequency
SCOPE OF ACCREDITATION:
Instrument Calibrated/
Measurement Parameter
Range
Calibration and
Measurement
Capability expressed
as an uncertainty (±)*
Remarks
AC Current Meters
Specific Values
10 µA at 1 kHz
100 µA at 1 kHz
1 mA at 1 kHz
10 mA at 1 kHz
100 mA at 1 kHz
1A at 1 kHz
5.3 nA
13 nA
0.13 µA
1.3 µA
13 µA
0.24 mA
Generate using
Fluke 5720A with
Agilent 3458A
[1]
3458A.Z1.N01
Frequency Meters
Specific Values
1 Hz
10 MHz
60 µHz
70 Hz
Generate using
Agilent 3325B
[1]
3458A.Z1.N01
Matrix C
AC Voltage Meters
Specific
Values
10 mV
100 mV
1V
3V
10 V
100 V
700 V
Specific
Values
10 mV
100 mV
1V
3V
10 V
100 V
700 V
0.01
0.02
0.58 mV 0.46 mV
-
0.1
0.62 µV
5.9 µV
0.92 µV
0.35 mV
1.2 mV
15 mV
-
0.04
0.39 mV
-
0.3
1.5 µV
12 µV
0.18 mV
2.8 mV
-
Signatories:
1.
2.
Lau Chee Keong
Yong En Haur
0.2
0.41 mV
-
Frequency (kHz)
0.5
1
4
0.65 µV
5.6 µV
0.44 µV
0.41 mV 0.36 mV 0.36 mV
5.6 mV
33 mV
-
0.5
0.61 mV
8.2 mV
-
Frequency (MHz)
1
2
6.0 µV
75 µV
0.66 mV
16 mV
8.5 mV
-
8
0.36 mV
-
4
59 µV
0.54 mV
5.2 mV
16 mV
-
10
0.35 mV
-
20
0.61 µV
6.0 µV
0.38 µV
0.36 mV
9.2 mV
78 mV
8
1.1 mV
10 mV
30 mV
-
50
0.65 µV
0.37 mV
11 mV
-
10
1.3 mV
4.3 mV
39 mV
-
Issue date: 26 September 2012
Valid until: 12 June 2014
NO: SAMM 248
(Issue 3, 26 September 2012 replacement of
SAMM 248 dated 14 May 2012)
Page: 22 of 22
FIELD OF CALIBRATION
DIMENSIONAL
SCOPE OF ACCREDITATION:
Instrument
Calibrated/
Measurement
Parameter
Range
Calibration and
Measurement Capability
expressed as an
uncertainty (±)*
Remarks
Plain Plug Gages
0.5 mm to 12 mm
0.7 µm
Measure using
Supermicrometer with
laser interferometer
and master cylinder
gauge
Thread plug gages
Pitch Diameter
(metric threads, 0.2 – 6
mm pitch)
1.0 mm to 15 mm
2.0 µm
Measure using
Supermicrometer with
laser interferometer,
master cylinder gauge
and thread wire
gauge.
Signatories:
1.
2.
Khoo Teng Kok
Ng Wei Lih