MCP1755/1755S 300 mA, 16V, High-Performance LDO Features: Description: • • • • • • The MCP1755/1755S is a family of CMOS low-dropout (LDO) voltage regulators that can deliver up to 300 mA of current while consuming only 68.0 µA of quiescent current (typical). The input operating range is specified from 3.6V to 16.0V, making it an ideal choice for four to six primary cell battery-powered applications, 12V mobile applications and one to three cell Li-Ionpowered applications. • • • • • • • • High PSRR: >70 dB @ 1 kHz, typical 68.0 µA Typical Quiescent Current Input Operating Voltage Range: 3.6V to 16.0V 300 mA Output Current for all Output Voltages Low Dropout Voltage, 300 mV typical @ 300 mA Standard Output Voltage Options (1.8V, 2.5V, 2.8V, 3.0V, 3.3V, 4.0V, 5.0V) Output Voltage Range 1.8V to 5.5V in 0.1V Increments (tighter increments are also possible per design) Output Voltage Tolerances of ±2.0% over entire Temperature Range Stable with Minimum 1.0 µF Output Capacitance Power Good Output Shutdown Input True Current Foldback Protection Short-Circuit Protection Overtemperature Protection Applications: • • • • • • • • • • • Battery-powered Devices Battery-powered Alarm Circuits Smoke Detectors CO2 Detectors Pagers and Cellular Phones Smart Battery Packs Portable Digital Assistant (PDA) Digital Cameras Microcontroller Power Consumer Products Battery-powered Data Loggers The MCP1755/1755S is capable of delivering 300 mA with only 300 mV (typical) of input-to-output voltage differential. The output voltage tolerance of the MCP1755 is typically +0.85% at +25°C and ±2.0% maximum over the operating junction temperature range of -40°C to +125°C. Line regulation is ±0.01% typical at +25°C. Output voltages available for the MCP1755/1755S range from 1.8V to 5.5V. The LDO output is stable when using only 1 µF of output capacitance. Ceramic, tantalum or aluminum electrolytic capacitors may all be used for input and output. Overcurrent limit and overtemperature shutdown provide a robust solution for any application. The MCP1755/1755S family has a true current foldback feature. When the load impedance decreases beyond the MCP1755/1755S load rating, the output current and voltage will gracefully foldback towards 30 mA at about 0V output. When the load impedance increases and returns to the rated load, the MCP1755/1755S will follow the same foldback curve as the device comes out of current foldback. Package options for the MCP1755 include the SOT-23-5, SOT-223-5 and 8-lead 2 x 3 DFN. Package options for the MCP1755S device include the SOT-223-3 and 8-lead 2 x 3 DFN. Related Literature: • AN765, “Using Microchip’s Micropower LDOs” (DS00765), Microchip Technology Inc., 2007 • AN766, “Pin-Compatible CMOS Upgrades to BiPolar LDOs” (DS00766), Microchip Technology Inc., 2003 • AN792, “A Method to Determine How Much Power a SOT-23 Can Dissipate in an Application” (DS00792), Microchip Technology Inc., 2001 2012 Microchip Technology Inc. DS25160A-page 1 MCP1755/1755S Package Types – MCP1755 SOT23-5 VOUT PWRGD SOT-223-5 5 4 EP-6 1 2 1 3 2 3 2 x 3 DFN* VOUT 1 PWRGD 2 NC 3 GND 4 4 5 SHDN 5 SHDN VIN GND VOUT PWRGD VIN GND SHDN EP 9 8 VIN 7 NC 6 NC * Includes Exposed Thermal Pad (EP); see Table 3-1 Package Types – MCP1755S SOT-223-3 2 x 3 DFN* VOUT 1 NC 2 NC 3 EP-4 GND 4 DS25160A-page 2 1 2 VIN GND EP 9 8 VIN 7 NC 6 NC 5 NC 3 VOUT * Includes Exposed Thermal Pad (EP); see Table 3-2 2012 Microchip Technology Inc. MCP1755/1755S Functional Block Diagrams MCP1755S VOUT VIN Error Amplifier +VIN Voltage Reference + Over Current Over Temperature GND MCP1755 PMOS VIN VOUT Undervoltage Lock Out (UVLO) Sense ISNS Cf Rf SHDN Overtemperature Sensing + Driver w/limit and SHDN EA – SHDN VREF V IN SHDN Reference Soft-Start Comp TDELAY PWRGD GND 92% of VREF 2012 Microchip Technology Inc. DS25160A-page 3 MCP1755/1755S Typical Application Circuits + CIN 1 µF Ceramic VIN 12V MCP1755S VOUT GND VOUT 5.0V COUT 1 µF Ceramic DS25160A-page 4 IOUT 30 mA 2012 Microchip Technology Inc. MCP1755/1755S 1.0 ELECTRICAL CHARACTERISTICS Absolute Maximum Ratings † Input Voltage, VIN .........................................................+17.6V VIN, PWRGD, SHDN................. (GND – 0.3V) to (VIN + 0.3V) VOUT................................................. (GND – 0.3V) to (+5.5V) Internal Power Dissipation ............ Internally-Limited (Note 6) Output Short Circuit Current ................................. Continuous Storage temperature .....................................-55°C to +150°C Maximum Junction Temperature ....................+165°C(Note 7) Operating Junction Temperature...................-40°C to +150°C ESD protection on all pins kV HBM and 400V MM † Notice: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. AC/DC CHARACTERISTICS Electrical Specifications: Unless otherwise specified, all limits are established for VIN = VR + 1V, Note 1, ILOAD = 1 mA, COUT = 1 µF (X7R), CIN = 1 µF (X7R), TA = +25°C, tr(VIN) = 0.5 V/µs, SHDN = VIN, PWRGD = 10K to VOUT. Boldface type applies for junction temperatures, TJ (Note 7) of -40°C to +125°C. Parameters Sym. Min. Typ. Max. Units Conditions VIN 3.6 — 16.0 V VOUT-RANGE 1.8 — 5.5 V Input Quiescent Current Iq — 68 100 µA IL = 0 mA Input Quiescent Current for SHDN mode ISHDN — 0.1 4 µA SHDN = GND ILOAD = 300 mA Input/Output Characteristics Input Operating Voltage Output Voltage Operating Range IGND — 300 400 µA Maximum Output Current IOUT_mA 300 — — mA Output Soft Current Limit SCL — 450 — mA VOUT 0.1V, VIN = VIN(MIN), Current measured 10 ms after the load is applied Output Pulse Current Limit PCL — 350 — mA Pulse Duration < 100 ms, Duty Cycle < 50%, VOUT 0.1V, Note 6 Output Short Circuit Foldback Current IOUT_SC — 30 — mA VIN = VIN(MIN), VOUT = GND Output Voltage Overshoot on Start-up VOVER — 0.5 — %VOUT Ground Current Note 1: 2: 3: 4: 5: 6: 7: 8: VIN = 0 to 16V, ILOAD = 300 mA The minimum VIN must meet two conditions: VIN 3.6V and VIN VR + VDROPOUT(MAX). VR is the nominal regulator output voltage when the input voltage VIN = VRated + VDROPOUT(MAX) or VIN = 3.6V (whichever is greater); IOUT = 1 mA. TCVOUT = (VOUT-HIGH – VOUT-LOW) x 106/(VR x Temperature), VOUT-HIGH = highest voltage measured over the temperature range. VOUT-LOW = lowest voltage measured over the temperature range. Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Changes in output voltage due to heating effects are determined using thermal regulation specification TCVOUT. Dropout voltage is defined as the input to output differential at which the output voltage drops 2% below the output voltage value that was measured with an applied input voltage of VIN = VR + 1V or VIN = 3.6V (whichever is greater). The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction temperature and the thermal resistance from junction to air (i.e., TA, TJ, JA). Exceeding the maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum +150°C rating. Sustained junction temperatures above +150°C can impact the device reliability. The junction temperature is approximated by soaking the device under test at an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in the junction temperature over the ambient temperature is not significant. See Section 4.6 “Shutdown Input (SHDN)” and Figure 2-34. 2012 Microchip Technology Inc. DS25160A-page 5 MCP1755/1755S AC/DC CHARACTERISTICS (CONTINUED) Electrical Specifications: Unless otherwise specified, all limits are established for VIN = VR + 1V, Note 1, ILOAD = 1 mA, COUT = 1 µF (X7R), CIN = 1 µF (X7R), TA = +25°C, tr(VIN) = 0.5 V/µs, SHDN = VIN, PWRGD = 10K to VOUT. Boldface type applies for junction temperatures, TJ (Note 7) of -40°C to +125°C. Parameters Sym. Min. Output Voltage Regulation VOUT VR – 2.0% TCVOUT — 35 Line Regulation VOUT/ (VOUT x VIN) -0.05 ±0.01 +0.05 Load Regulation VOUT/VOUT -0.5 ±0.1 +0.5 % VDROPOUT — 300 500 mV IL = 300 mA IDO — 75 120 µA VIN = 0.95VR, IOUT = 0 mA VOUT Temperature Coefficient Dropout Voltage (Note 5) Dropout Current Typ. Max. VR +0.85% VR +2.0 % Units V Conditions Note 2 ppm/°C Note 3 VR + 1V VIN 16V %/V IL = 1.0 mA to 300 mA, Note 4 Undervoltage Lockout Undervoltage Lockout UVLO — 3.0 — V Rising VIN Undervoltage Lockout Hysterisis UVLOHYS — 300 — mV Falling VIN Logic High Input VSHDN-HIGH 2.4 — VIN(MAX) V Logic Low Input VSHDN-LOW 0.0 — 0.8 V SHDNILK — 0.02 0.2 µA SHDN = 16V PWRGD Input Voltage Operating Range VPWRGD_VIN 1.7 — VIN V ISINK = 1 mA PWRGD Threshold Voltage (Referenced to VOUT) VPWRGD_TH 90 92 94 %VOUT Falling Edge of VOUT PWRGD Threshold Hysteresis VPWRGD_HYS — 2.0 — %VOUT Rising Edge of VOUT PWRGD Output Voltage Low VPWRGD_L — 0.2 0.45 V PWRGD Output Sink Current IPWRGD_L 5.0 — — mA Shutdown Input Shutdown Input Leakage Current Power Good Output Note 1: 2: 3: 4: 5: 6: 7: 8: IPWRGD_SINK = 5.0 mA, VOUT = 0V VPWRGD 0.45V The minimum VIN must meet two conditions: VIN 3.6V and VIN VR + VDROPOUT(MAX). VR is the nominal regulator output voltage when the input voltage VIN = VRated + VDROPOUT(MAX) or VIN = 3.6V (whichever is greater); IOUT = 1 mA. TCVOUT = (VOUT-HIGH – VOUT-LOW) x 106/(VR x Temperature), VOUT-HIGH = highest voltage measured over the temperature range. VOUT-LOW = lowest voltage measured over the temperature range. Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Changes in output voltage due to heating effects are determined using thermal regulation specification TCVOUT. Dropout voltage is defined as the input to output differential at which the output voltage drops 2% below the output voltage value that was measured with an applied input voltage of VIN = VR + 1V or VIN = 3.6V (whichever is greater). The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction temperature and the thermal resistance from junction to air (i.e., TA, TJ, JA). Exceeding the maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum +150°C rating. Sustained junction temperatures above +150°C can impact the device reliability. The junction temperature is approximated by soaking the device under test at an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in the junction temperature over the ambient temperature is not significant. See Section 4.6 “Shutdown Input (SHDN)” and Figure 2-34. DS25160A-page 6 2012 Microchip Technology Inc. MCP1755/1755S AC/DC CHARACTERISTICS (CONTINUED) Electrical Specifications: Unless otherwise specified, all limits are established for VIN = VR + 1V, Note 1, ILOAD = 1 mA, COUT = 1 µF (X7R), CIN = 1 µF (X7R), TA = +25°C, tr(VIN) = 0.5 V/µs, SHDN = VIN, PWRGD = 10K to VOUT. Boldface type applies for junction temperatures, TJ (Note 7) of -40°C to +125°C. Parameters Sym. Min. Typ. Max. Units Conditions PWRGD Leakage Current IPWRGD_LK — 50 200 nA VPWRGD Pullup = 10 k to VIN VIN = 16V PWRGD Time Delay TPG — 100 — µs Rising Edge of VOUT Detect Threshold to PWRGD Active Time Delay TVDET_PWRGD — 200 — µs Falling Edge of VOUT after Transition from VOUT = VPRWRGD_TH + 50 mV to VPWRGD_TH – 50 mV, RPULLUP = 10 k to VIN TDELAY — 200 — µs VIN = 0V to 16V, VOUT = 90% VR, tr(VIN) = 5 V/µs, Output Delay From VIN to VOUT > 0.1V TDELAY_START — 80 — µs VIN = 0V to 16V, VOUT 0.1V, tr(VIN) = 5 V/µs, Output Delay From SHDN (Note 8) TDELAY_SHDN — 235 — µs VIN = 6V, VOUT = 90% VR, VR=5V,SHDN = GND to VIN — 940 — µs VIN = 7V, VOUT = 90% VR, VR=5V, SHDN = GND to VIN — 210 — µs VIN = 16V,VOUT = 90% VR, VR=5V, SHDN = GND to VIN AC Performance Output Delay from VIN to VOUT = 90% VREG Output Noise eN — 0.3 — PSRR — 80 — dB VR = 5V, f = 1 kHz, IL = 100 mA, VINAC = 1VPK-PK, CIN = 0 µF, VIN VR + 1.5V 3.6V Thermal Shutdown Temperature TSD — 150 — °C Note 6 Thermal Shutdown Hysteresis TSD — 10 — °C Power Supply Ripple Rejection Ratio Note 1: 2: 3: 4: 5: 6: 7: 8: µV/(Hz) IL = 50 mA, f = 1 kHz, The minimum VIN must meet two conditions: VIN 3.6V and VIN VR + VDROPOUT(MAX). VR is the nominal regulator output voltage when the input voltage VIN = VRated + VDROPOUT(MAX) or VIN = 3.6V (whichever is greater); IOUT = 1 mA. TCVOUT = (VOUT-HIGH – VOUT-LOW) x 106/(VR x Temperature), VOUT-HIGH = highest voltage measured over the temperature range. VOUT-LOW = lowest voltage measured over the temperature range. Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Changes in output voltage due to heating effects are determined using thermal regulation specification TCVOUT. Dropout voltage is defined as the input to output differential at which the output voltage drops 2% below the output voltage value that was measured with an applied input voltage of VIN = VR + 1V or VIN = 3.6V (whichever is greater). The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction temperature and the thermal resistance from junction to air (i.e., TA, TJ, JA). Exceeding the maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum +150°C rating. Sustained junction temperatures above +150°C can impact the device reliability. The junction temperature is approximated by soaking the device under test at an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in the junction temperature over the ambient temperature is not significant. See Section 4.6 “Shutdown Input (SHDN)” and Figure 2-34. 2012 Microchip Technology Inc. DS25160A-page 7 MCP1755/1755S TEMPERATURE SPECIFICATIONS (Note 1) Parameters Sym. Min. Typ. Max. Units TA -40 — +125 °C Operating Temperature Range TJ -40 — +150 °C Storage Temperature Range TA -55 — +150 °C JA — 62 — JC — 15 — JA — 62 — JC — 15 — JA — 256 — JC — 81 — JA — 70 — JC — 13.4 — Conditions Temperature Ranges Specified Temperature Range Thermal Package Resistance Thermal Resistance, SOT-223-3 Thermal Resistance, SOT-223-5 Thermal Resistance, SOT-23-5 Thermal Resistance, 2 x 3 DFN-8 °C/W °C/W °C/W °C/W Note 1: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction temperature and the thermal resistance from junction to air (i.e., TA, TJ, JA). Exceeding the maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum +150°C rating. Sustained junction temperatures above +150°C can impact the device reliability. DS25160A-page 8 2012 Microchip Technology Inc. MCP1755/1755S 2.0 TYPICAL PERFORMANCE CURVES Note: The graphs and tables provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range. Note 1: Unless otherwise indicated VR = 3.3V, COUT = 1 µF Ceramic (X7R), CIN = 1 µF Ceramic (X7R), IL = 1 mA, TA = +25°C, VIN = VR + 1V or VIN = 3.6V (whichever is greater), SHDN = VIN, package = SOT-223. Junction Temperature (TJ) is approximated by soaking the device under test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the rise in junction temperature over the ambient temperature is not significant. 350 100 90 80 70 60 50 40 30 20 10 0 +130°C 0°C +25°C Grou und Current (µA) Quies scent Current (µA) 2: +90°C -45°C VOUT = 1.8V IOUT = 0 µA 2 4 6 8 10 Input Voltage (V) FIGURE 2-1: Input Voltage. VOUT = 5.0V VOUT = 3.3V 200 VOUT = 1.8V 150 100 50 12 14 16 Quiescent Current vs. 0 50 100 150 200 Load Current (mA) FIGURE 2-4: Current. 250 300 Ground Current vs. Load 90 90 +130°C 80 Quiescent Current (µA) Quies scent Current (µA) 250 0 0 70 60 50 -45°C 40 0°C +25°C +90°C 30 20 VOUT = 3.3V IOUT = 0 µA 10 VOUT = 5.0V 80 VOUT = 1.8V 70 60 50 VOUT = 3.3V 40 30 20 10 0 0 0 2 4 FIGURE 2-2: Input Voltage. 6 8 10 Input Voltage (V) 12 14 -40 -25 -10 16 Quiescent Current vs. 2.5 +130°C 80 Output Voltage (V) 70 60 50 -45°C 40 0°C 5 20 35 50 65 80 95 110 125 Junction Temperature (°C) FIGURE 2-5: Quiescent Current vs. Junction Temperature. 90 Quies scent Current (µA) 300 +25°C +90°C 30 20 VOUT = 5.0V IOUT = 0 µA 10 0 2.0 1.5 -45°C 0°C +25°C +90°C +130°C +130 C 1.0 0.5 VOUT = 1.8V IOUT = 1 mA 0.0 0 2 FIGURE 2-3: Input Voltage. 4 6 8 10 Input Voltage (V) 12 14 Quiescent Current vs. 2012 Microchip Technology Inc. 16 0 2 FIGURE 2-6: Voltage. 4 6 8 10 Input Voltage (V) 12 14 16 Output Voltage vs. Input DS25160A-page 9 MCP1755/1755S Note 1: Unless otherwise indicated VR = 3.3V, COUT = 1 µF Ceramic (X7R), CIN = 1 µF Ceramic (X7R), IL = 1 mA, TA = +25°C, VIN = VR + 1V or VIN = 3.6V (whichever is greater), SHDN = VIN, package = SOT-223 3.330 Outtput Voltage (V) 3.0 Ou utput Voltage (V) 3.5 -45°C 0°C +25°C +90°C +130°C 2.5 2.0 1.5 10 1.0 +130°C 3.320 VOUT = 3.3V IOUT = 1 mA 0.0 0 3.310 0°C 3.300 -45°C 3.290 2 4 6 8 10 12 14 VOUT = 3.3V VIN = 4.3V 3.270 0 16 50 FIGURE 2-7: Voltage. Output Voltage vs. Input FIGURE 2-10: Current. 5.02 5 5.01 Outtput Voltage (V) 6 -45°C 0°C +25°C +90°C +130°C 4 3 2 1 4 6 8 10 12 14 +25°C 250 300 Output Voltage vs. Load +90°C 5.00 +130°C 0°C 4.99 4.98 -45°C 4 97 4.97 VOUT = 5.0V VIN = 6.0V 0 16 50 100 150 200 250 300 Load Current (mA) Input Voltage (V) FIGURE 2-8: Voltage. 200 4.95 0 2 150 4.96 VOUT = 5.0V IOUT = 1 mA 0 100 Load Current (mA) Input Voltage (V) Outtput Voltage (V) +25°C 3.280 0.5 Output Voltage vs. Input FIGURE 2-11: Current. 1.830 Output Voltage vs. Load 0.6 +130°C +90°C VOUT = 3.3V +25°C 1.820 Drop pout Voltage (V) Ou utput Voltage (V) +90°C 1.810 -45°C 0°C 1.800 1.790 VOUT = 1.8V VIN = 3.6V 50 FIGURE 2-9: Current. DS25160A-page 10 100 150 200 Load Current (mA) 250 0.4 +25°C 0.3 +90°C +130°C 0.2 0°C 0.1 -45°C 0 1.780 0 0.5 300 Output Voltage vs. Load 0 50 FIGURE 2-12: Current. 100 150 200 Load Current (mA) 250 300 Dropout Voltage vs. Load 2012 Microchip Technology Inc. MCP1755/1755S 0.50 0.45 0.40 0.35 0.30 0.25 0.20 0.15 0.10 0.05 0.00 VOUT = 5.0V Output Current (A) Drop pout Voltage (V) Note 1: Unless otherwise indicated VR = 3.3V, COUT = 1 µF Ceramic (X7R), CIN = 1 µF Ceramic (X7R), IL = 1 mA, TA = +25°C, VIN = VR + 1V or VIN = 3.6V (whichever is greater), SHDN = VIN, package = SOT-223 +25°C +90°C +130°C 0°C -45°C 0 50 100 150 200 250 300 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 VOUT = 3.3V Hard Short Circuit ROUT < 0.1: -40 C +125 C +25 C 2 4 6 Load Current (mA) FIGURE 2-13: Current. Dropout Voltage vs. Load 8 10 12 14 16 Input Voltage (V) FIGURE 2-16: Input Voltage. Short Circuit Current vs. 0.7 5.3V VIN 4.3V VOUT (AC coupled, 20 mV/Div) VOUT = 3.3V 0.6 Outp put Current (A) VOUT=3.3V VIN=4.3V to 5.3V IOUT=10 mA Soft Short Circuit ROUT = 5.5: 0.5 0.4 +125°C 0.3 -40°C +25°C 0.2 0.1 0 Time=10 µs/Div 2 FIGURE 2-14: Dynamic Line Response. 4 6 FIGURE 2-17: Input Voltage. 8 10 12 Input Voltage (V) 14 16 Short Circuit Current vs. 0.40 5.3V VIN 4.3V VOUT (AC coupled, 20 mv/Div) 0.30 VIN = 12V 0.25 VIN = 10V 0.20 0.15 VIN = 6V VIN = 4.3V 0.10 VIN = 3.6V 0.05 0.00 -0.05 Time=10 µs/Div VIN = 16V 0.35 Load d Regulation (%) VOUT=3.3V VIN=4.3V to 5.3V IOUT=100 mA VOUT = 1.8V IOUT = 1 mA to 300 mA -40 -25 -10 5 20 35 50 65 80 95 110 125 Temperature (ºC) FIGURE 2-15: Dynamic Line Response. 2012 Microchip Technology Inc. FIGURE 2-18: Temperature. Load Regulation vs. DS25160A-page 11 MCP1755/1755S 0.030 0.40 0.35 0.30 0.25 0.20 0.15 0.10 0 05 0.05 0.00 -0.05 -0.10 VOUT = 3.3V VIN = 16V VIN = 12V VIN = 10V VIN = 6V VIN = 4.3V VOUT = 3.3V IOUT = 1 mA to 300 mA -40 -25 -10 5 Line Regulation (%/V) Load d Regulation (%) Note 1: Unless otherwise indicated VR = 3.3V, COUT = 1 µF Ceramic (X7R), CIN = 1 µF Ceramic (X7R), IL = 1 mA, TA = +25°C, VIN = VR + 1V or VIN = 3.6V (whichever is greater), SHDN = VIN, package = SOT-223 0.025 300 mA 0.020 150 mA 50 mA 0 mA 0.010 0 005 0.005 0.000 10 mA -0.005 -40 -25 -10 5 20 35 50 65 80 95 110 125 Temperature (°C) FIGURE 2-19: Temperature. FIGURE 2-22: Temperature. 0.35 VIN = 12V 0.15 VIN = 10V 0.05 VIN = 6V 0.00 VOUT = 5.0V IOUT = 1 mA to 300 mA -0.05 Line Regulation (%/V) Load Regulation (%) VOUT = 5.0V 0.20 0.10 Line Regulation vs. 0.03 VIN = 16V 0.25 0.03 0.02 300 mA 150 mA 0.02 100 mA 50 mA 0.01 10 mA 0.01 0.00 0 mA -0.10 -0.01 -40 -25 -10 5 20 35 50 65 80 95 110 125 -40 -25 -10 5 Temperature ( C) FIGURE 2-20: Temperature. Load Regulation vs. 0.040 FIGURE 2-23: Temperature. VOUT = 1.8V 300 mA -20 0.035 -40 150 mA 0.025 100 mA 0.020 50 mA 0 mA 0.015 0.010 Line Regulation vs. 0.000 -40 -25 -10 5 20 35 50 65 80 95 110 125 Temperature (°C) FIGURE 2-21: Temperature. DS25160A-page 12 VOUT = 1.8V VIN = 4.1V VINAC = 1Vpk-pk CIN = 0 µF -60 Line Regulation vs. IOUT = 300 mA -80 100 -100 -120 10 mA 0.005 PSRR (dB) 0.030 20 35 50 65 80 95 110 125 Temperature ( C) 0 0.045 Line Regulation (%/V) 20 35 50 65 80 95 110 125 Temperature (°C) Load Regulation vs. 0.30 100 mA 0.015 -140 0.01 IOUT = 10 mA 0.1 1 Frequency (kHz) 10 100 FIGURE 2-24: Power Supply Ripple Rejection vs. Frequency. 2012 Microchip Technology Inc. MCP1755/1755S PSRR (dB) Note 1: Unless otherwise indicated VR = 3.3V, COUT = 1 µF Ceramic (X7R), CIN = 1 µF Ceramic (X7R), IL = 1 mA, TA = +25°C, VIN = VR + 1V or VIN = 3.6V (whichever is greater), SHDN = VIN, package = SOT-223 0 VOUT = 5.0V -10 VIN = 6.5V V -20 INAC = 1Vpk-pk CIN = 0 µF -30 IOUT = 10 mA -40 -50 -60 IOUT = 300 mA 70 -70 -80 -90 -100 0.01 0.1 1 10 Frequency (kHz) SHDN 100 0.010 0.01 VOUT = 3.3V VIN = 4.3V 0.1 1 10 Frequency (kHz) 0V Time=80 µs/Div Ou utput Voltage (V) Outpu ut Noise (μV/Hz) VOUT = 5.0V 5 0V VIN = 6.0V Start-up from SHDN. 2.0 1.8 1.6 1.4 1.2 1.0 0.8 06 0.6 0.4 0.2 0.0 VIN = 3.6V VOUT = 1.8V Increasing Load Decreasing Load 0 100 0.1 1000 FIGURE 2-26: Output Noise vs. Frequency (3 lines, VR = 1.8V, 3.3V, 5.0V). ILOAD=1 mA PWRGD=10K to VOUT 3.3V 0V FIGURE 2-28: VOUT = 1.8V VIN = 3.6V 0.100 3.3V PWRGD CIN = 1 μF, COUT = 1 μF, IOUT = 50 mA 1.000 0V VOUT FIGURE 2-25: Power Supply Ripple Rejection vs. Frequency. 10.000 VOUT=3.3V VIN=4.3V 4.3V 0.2 0.3 0.4 0.5 Output Current (A) FIGURE 2-29: Foldback. Short Circuit Current 3.5 4.3V VIN 0V VOUT 3.3V 3.3V 0V PWRGD ILOAD=1 mA PWRGD=10K to VOUT 0V 3.0 Outtput Voltage (V) VOUT=3.3V VIN=0 to 4.3V 2.5 2.0 VIN = 4.3V VOUT = 3.3V 1.5 10 1.0 0.5 Increasing Load Decreasing Load 0.0 0 Time=80 µs/Div FIGURE 2-27: Start-up from VIN. 2012 Microchip Technology Inc. FIGURE 2-30: Foldback. 0.1 0.2 0.3 Output Current (A) 0.4 0.5 Short Circuit Current DS25160A-page 13 MCP1755/1755S Note 1: Unless otherwise indicated VR = 3.3V, COUT = 1 µF Ceramic (X7R), CIN = 1 µF Ceramic (X7R), IL = 1 mA, TA = +25°C, VIN = VR + 1V or VIN = 3.6V (whichever is greater), SHDN = VIN, package = SOT-223 5.0 Startup p Delay Time (µs) Ou utput Voltage (V) 6.0 4.0 VIN = 6.0V VOUT = 5.0V 3.0 2.0 1.0 Increasing Load Decreasing Load 0.0 0 0.1 FIGURE 2-31: Foldback. 0.2 0.3 Output Current (A) 0.4 0.5 Short Circuit Current 1000 900 800 700 600 500 400 300 200 100 0 VOUT = 5.0V +25 °C -20 °C +90 °C +125 °C 6 8 10 12 -40 °C 14 16 Input Voltage (V) FIGURE 2-34: to 90% VOUT. Start-up Delay From SHDN VOUT (AC coupled, 200 mV/Div) IOUT (200 mA/Div) VOUT=3.3V IOUT=100 µA to 300 mA Time=20 µs/Div FIGURE 2-32: Dynamic Load Response. VOUT (AC coupled, 200 mV/Div) IOUT (200 mA/Div) VOUT=3.3V IOUT=1 mA to 300 mA Time=20 µs/Div FIGURE 2-33: DS25160A-page 14 Dynamic Load Response. 2012 Microchip Technology Inc. MCP1755/1755S 3.0 PIN DESCRIPTIONS The descriptions of the pins are listed in Table 3-1 and Table 3-2. TABLE 3-1: MCP1755 PIN FUNCTION TABLE SOT-223-5 SOT-23-5 2 x 3 DFN Name 4 5 1 VOUT Function Regulated Voltage Output 5 4 2 PWRGD — — 3, 6, 7 NC Open Drain Power Good Output 3 2 4 GND Ground Terminal 1 3 5 SHDN Shutdown Input 2 1 8 VIN Unregulated Supply Voltage 6 — 9 EP Exposed Pad, Connected to GND No connection TABLE 3-2: MCP1755S PIN FUNCTION TABLE SOT-223-3 2 x 3 DFN Name 3 1 VOUT — 2, 3, 5, 6, 7 NC 2 4 GND 1 8 VIN Unregulated Supply Voltage 4 9 EP Exposed Pad, Connected to GND 3.1 Function Regulated Voltage Output No connection Ground Terminal Regulated Output Voltage (VOUT) Connect VOUT to the positive side of the load and the positive side of the output capacitor. The positive side of the output capacitor should be physically located as close to the LDO VOUT pin as is practical. The current flowing out of this pin is equal to the DC load current. 3.2 Power Good Output (PWRGD) The PWRGD output is an open-drain output used to indicate when the LDO output voltage is within 92% (typically) of its nominal regulation value. The PWRGD threshold has a typical hysteresis value of 2%. The PWRGD output is delayed by 100 µs (typical) from the time the LDO output is within 92% + 3% (maximum hysteresis) of the regulated output value on power-up. This delay time is internally fixed. The PWRGD pin may be pulled up to VIN or VOUT. Pulling up to VOUT conserves power when the device is in Shutdown (SHDN = 0V) mode. 2012 Microchip Technology Inc. 3.3 Ground Terminal (GND) Regulator ground. Tie GND to the negative side of the output capacitor and also to the negative side of the input capacitor. Only the LDO bias current flows out of this pin; there is no high current. The LDO output regulation is referenced to this pin. Minimize voltage drops between this pin and the negative side of the load. 3.4 Shutdown Input (SHDN) The SHDN input is used to turn the LDO output voltage on and off. When the SHDN input is at a logic-high level, the LDO output voltage is enabled. When the SHDN input is pulled to a logic-low level, the LDO output voltage is disabled. When the SHDN input is pulled low, the PWRGD output also goes low and the LDO enters a low quiescent current shutdown state. DS25160A-page 15 MCP1755/1755S 3.5 Unregulated Input Voltage (VIN) Connect VIN to the input unregulated source voltage. Like all low dropout linear regulators, low source impedance is necessary for the stable operation of the LDO. The amount of capacitance required to ensure low source impedance will depend on the proximity of the input source capacitors or battery type. For most applications, 1 µF of capacitance will ensure stable operation of the LDO circuit. The input capacitor should have a capacitance value equal to or larger than the output capacitor for performance applications. The input capacitor will supply the load current during transients and improve performance. For applications that have load currents below 10 mA, the input capacitance requirement can be lowered. The type of capacitor used may be ceramic, tantalum or aluminum electrolytic. The low ESR characteristics of the ceramic will yield better noise and PSRR performance at high frequency. 3.6 Exposed Pad (EP) Some of the packages have an exposed metal pad on the bottom of the package. The exposed metal pad gives the device better thermal characteristics by providing a good thermal path to either the PCB or heatsink to remove heat from the device. The exposed pad of the package is internally connected to GND. DS25160A-page 16 2012 Microchip Technology Inc. MCP1755/1755S 4.0 DEVICE OVERVIEW 4.3 The MCP1755/1755S is a 300 mA output current, lowdropout (LDO) voltage regulator. The low-dropout voltage of 300 mV typical at 300 mA of current makes it ideal for battery-powered applications. The input voltage range is 3.6V to 16.0V. Unlike other high output current LDOs, the MCP1755/1755S typically draws only 300 µA of quiescent current for a 300 mA load. The MCP1755 adds a shutdown control input pin and a power good output pin. The output voltage options are fixed. 4.1 LDO Output Voltage The MCP1755 LDO has a fixed output voltage. The output voltage range is 1.8V to 5.5V. The MCP1755S LDO is available as a fixed voltage device. 4.2 Output Current and Current Limiting The MCP1755/1755S LDO is tested and ensured to supply a minimum of 300 mA of output current. The MCP1755/1755S has no minimum output load, so the output load current can go to 0 mA and the LDO will continue to regulate the output voltage to within tolerance. The MCP1755/1755S also incorporates a true output current foldback. If the output load presents an excessive load due to a low-impedance short circuit condition, the output current and voltage will fold back towards 30 mA and 0V, respectively. The output voltage and current will resume normal levels when the excessive load is removed. If the overload condition is a soft overload, the MCP1755/1755S will supply higher load currents of up to typically 350 mA. This allows for device usage in applications that have pulsed load currents having an average output current value of 300 mA or less. Output overload conditions may also result in an overtemperature shutdown of the device. If the junction temperature rises above +150°C (typical), the LDO will shut down the output. See Section 4.8, Overtemperature Protection for more information on overtemperature shutdown. Output Capacitor The MCP1755/1755S requires a minimum output capacitance of 1 µF for output voltage stability. Ceramic capacitors are recommended because of their size, cost and environmental robustness qualities. Aluminum-electrolytic and tantalum capacitors can be used on the LDO output as well. The Equivalent Series Resistance (ESR) of the electrolytic output capacitor should be no greater than 2 ohms. The output capacitor should be located as close to the LDO output as is practical. Ceramic materials X7R and X5R have low temperature coefficients and are well within the acceptable ESR range required. A typical 1 µF X7R 0805 capacitor has an ESR of 50 milli-ohms. Larger LDO output capacitors can be used with the MCP1755/1755S to improve dynamic performance and power supply ripple rejection performance. A maximum of 1000 µF is recommended. Aluminumelectrolytic capacitors are not recommended for low temperature applications of < -25°C. 4.4 Input Capacitor Low input source impedance is necessary for the LDO output to operate properly. When operating from batteries, or in applications with long lead length (> 10 inches) between the input source and the LDO, some input capacitance is recommended. A minimum of 1.0 µF to 4.7 µF is recommended for most applications. For applications that have output step load requirements, the input capacitance of the LDO is very important. The input capacitance provides the LDO with a good local low-impedance source to pull the transient currents from, in order to respond quickly to the output load step. For good step response performance, the input capacitor should be of equivalent or higher value than the output capacitor. The capacitor should be placed as close to the input of the LDO as is practical. Larger input capacitors will also help reduce any high-frequency noise on the input and output of the LDO and reduce the effects of any inductance that exists between the input source voltage and the input capacitance of the LDO. 6.0 Ou utput Voltage (V) 5.0 4.0 VIN = 6.0V VOUT = 5.0V 3.0 2.0 1.0 Increasing Load Decreasing Load 0.0 0 FIGURE 4-1: 0.1 0.2 0.3 Output Current (A) 0.4 0.5 Typical Current Foldback. 2012 Microchip Technology Inc. DS25160A-page 17 MCP1755/1755S 4.5 Power Good Output (PWRGD) The open drain PWRGD output is used to indicate when the output voltage of the LDO is within 92% (typical value, see Section 1.0 “Electrical Characteristics” for Minimum and Maximum specifications) of its nominal regulation value. As the output voltage of the LDO rises, the open-drain PWRGD output will actively be held low until the output voltage has exceeded the power good threshold plus the hysteresis value. Once this threshold has been exceeded, the power good time delay is started (shown as TPG in the AC/DC Characteristics table). The power good time delay is fixed at 100 µs (typical). After the time delay period, the PWRGD open-drain output becomes inactive and may be pulled high by an external pullup resistor, indicating that the output voltage is stable and within regulation limits. The power good output is typically pulled up to VIN or VOUT. Pulling the signal up to VOUT conserves power during Shutdown mode. If the output voltage of the LDO falls below the power good threshold, the power good output will transition low. The power good circuitry has a 200 µs delay when detecting a falling output voltage, which helps to increase noise immunity of the power good output and avoid false triggering of the power good output during fast output transients. See Figure 4-2 for power good timing characteristics. When the LDO is put into Shutdown mode using the SHDN input, the power good output is pulled low immediately, indicating that the output voltage will be out of regulation. The timing diagram for the power good output when using the shutdown input is shown in Figure 4-3. The power good output is an open-drain output that can be pulled up to any voltage that is equal to or less than the LDO input voltage. This output is capable of sinking a minimum of 5 mA (VPWRGD < 0.45V). VPWRGD_TH VOUT TPG VOH TVDET_PWRGD PWRGD VIN TDELAY_SHDN SHDN TPG VOUT PWRGD CLOAD = 1.0 µF FIGURE 4-3: Shutdown. 4.6 Power Good Timing from Shutdown Input (SHDN) The SHDN input is an active-low input signal that turns the LDO on and off. The SHDN threshold is a fixed voltage level. The minimum value of this shutdown threshold required to turn the output ON is 2.4V. The maximum value required to turn the output OFF is 0.8V. The SHDN input will ignore low-going pulses (pulses meant to shut down the LDO) that are up to 400 ns in pulse width. If the shutdown input is pulled low for more than 400 ns, the LDO will enter Shutdown mode. This small bit of filtering helps to reject any system noise spikes on the shutdown input signal. On the rising edge of the SHDN input, the shutdown circuitry has a 135 µs delay before allowing the LDO output to turn on. This delay helps to reject any false turn-on signals or noise on the SHDN input signal. After the 135 µs delay, the LDO output enters its soft-start period as it rises from 0V to its final regulation value. If the SHDN input signal is pulled low during the 135 µs delay period, the timer will be reset and the delay time will start over again on the next rising edge of the SHDN input. The total time from the SHDN input going high (turn-on) to the LDO output being in regulation is typically 235 µs. See Figure 4-4 for a timing diagram of the SHDN input. VOL FIGURE 4-2: DS25160A-page 18 Power Good Timing. 2012 Microchip Technology Inc. MCP1755/1755S 4.8 TDELAY_SHDN 400 ns (typical) 135 µs SHDN VOUT CLOAD = 1.0 µF FIGURE 4-4: Diagram. 4.7 Overtemperature Protection The MCP1755/1755S LDO has temperature-sensing circuitry to prevent the junction temperature from exceeding approximately +150°C. If the LDO junction temperature does reach +150°C, the LDO output will be turned off until the junction temperature cools to approximately +140°C, at which point the LDO output will automatically resume normal operation. If the internal power dissipation continues to be excessive, the device will again shut off. The junction temperature of the die is a function of power dissipation, ambient temperature and package thermal resistance. See Section 5.0 “Application Circuits and Issues” for more information on LDO power dissipation and junction temperature. Shutdown Input Timing Dropout Voltage and Undervoltage Lockout Dropout voltage is defined as the input-to-output voltage differential at which the output voltage drops 2% below the nominal value that was measured with a VR + 1.0V differential applied. The MCP1755/1755S LDO has a very low dropout voltage specification of 300 mV (typical) at 300 mA of output current. See Section 1.0 “Electrical Characteristics” for maximum dropout voltage specifications. The MCP1755/1755S LDO operates across an input voltage range of 3.6V to 16.0V and incorporates input undervoltage lockout (UVLO) circuitry that keeps the LDO output voltage off until the input voltage reaches a minimum of 3.00V (typical) on the rising edge of the input voltage. As the input voltage falls, the LDO output will remain on until the input voltage level reaches 2.70V (typical). For high-current applications, voltage drops across the PCB traces must be taken into account. The trace resistances can cause significant voltage drops between the input voltage source and the LDO. For applications with input voltages near 3.0V, these PCB trace voltage drops can sometimes lower the input voltage enough to trigger a shutdown due to undervoltage lockout. 2012 Microchip Technology Inc. DS25160A-page 19 MCP1755/1755S NOTES: DS25160A-page 20 2012 Microchip Technology Inc. MCP1755/1755S 5.0 APPLICATION CIRCUITS AND ISSUES 5.1 Typical Application The MCP1755/1755S is most commonly used as a voltage regulator. The low quiescent current and low dropout voltage make it ideal for many battery-powered applications. GND VIN COUT 1 µF Ceramic FIGURE 5-1: 5.1.1 VIN 3.6V to 4.8V VOUT IOUT 50 mA CIN 1 µF Ceramic Typical Application Circuit. APPLICATION INPUT CONDITIONS Package Type = SOT-23 Input Voltage Range = 3.6V to 4.8V VIN maximum = 4.8V VOUT typical = 1.8V IOUT = 50 mA maximum 5.2 Power Calculations 5.2.1 EQUATION 5-2: T J MAX = P TOTAL R JA + T AMAX MCP1755S VOUT 1.8V The maximum continuous operating junction temperature specified for the MCP1755/1755S is +150°C. To estimate the internal junction temperature of the MCP1755/1755S, the total internal power dissipation is multiplied by the thermal resistance from junction to ambient (RJA). The thermal resistance from junction to ambient for the SOT-23 package is estimated at 336°C/W. POWER DISSIPATION The internal power dissipation of the MCP1755/1755S is a function of input voltage, output voltage and output current. The power dissipation, as a result of the quiescent current draw, is so low, it is insignificant (68.0 µA x VIN). The following equation can be used to calculate the internal power dissipation of the LDO. EQUATION 5-1: PLDO = V IN MAX – V OUT MIN I OUT MAX PLDO = LDO Pass device internal power dissipation VIN(MAX) = Maximum input voltage VOUT(MIN) = LDO minimum output voltage TJ(MAX) = Maximum continuous junction temperature PTOTAL = Total device power dissipation RJA = Thermal resistance from junction to ambient TAMAX = Maximum ambient temperature The maximum power dissipation capability for a package can be calculated given the junction-toambient thermal resistance and the maximum ambient temperature for the application. The following equation can be used to determine the package maximum internal power dissipation. EQUATION 5-3: T J MAX – T A MAX PD MAX = --------------------------------------------------R JA PD(MAX) = Maximum device power dissipation TJ(MAX) = Maximum continuous junction temperature TA(MAX) = Maximum ambient temperature RJA = Thermal resistance from junction to ambient EQUATION 5-4: T J RISE = P D MAX R JA TJ(RISE) = Rise in device junction temperature over the ambient temperature PD(MAX) = Maximum device power dissipation RJA = Thermal resistance from junction to ambient EQUATION 5-5: T J = T J RISE + T A TJ = Junction temperature TJ(RISE) = Rise in device junction temperature over the ambient temperature TA = Ambient temperature 2012 Microchip Technology Inc. DS25160A-page 21 MCP1755/1755S 5.3 Voltage Regulator Internal power dissipation, junction temperature rise, junction temperature and maximum power dissipation are calculated in the following example. The power dissipation, as a result of ground current, is small enough to be neglected. EXAMPLE 5-1: POWER DISSIPATION 5.3.2 To estimate the internal junction temperature, the calculated temperature rise is added to the ambient or offset temperature. For this example, the worst-case junction temperature is estimated below. EXAMPLE 5-3: TJ = TJRISE + TA(MAX) TJ = 91.3°C Package Package Type = SOT-23 Input Voltage VIN = 3.6V to 4.8V LDO Output Voltages and Currents Maximum Package Power Dissipation Examples at +40°C Ambient Temperature SOT-23 (336.0°C/Watt = RJA) PD(MAX) = (125°C – 40°C)/336°C/W VOUT = 1.8V IOUT = 50 mA Maximum Ambient Temperature PD(MAX) = 253 mW SOT-89 (153.3°C/Watt = RJA) PD(MAX) = (125°C – 40°C)/153.3°C/W TA(MAX) = +40°C Internal Power Dissipation Internal Power dissipation is the product of the LDO output current times the voltage across the LDO (VIN to VOUT). PLDO(MAX) = (VIN(MAX) – VOUT(MIN)) x IOUT(MAX) PLDO = (4.8V – (0.97 x 1.8V)) x 50 mA PLDO = 152.7 mW 5.3.1 DEVICE JUNCTION TEMPERATURE RISE The internal junction temperature rise is a function of internal power dissipation and the thermal resistance from junction to ambient for the application. The thermal resistance from junction to ambient (RJA) is derived from an EIA/JEDEC standard for measuring thermal resistance for small surface mount packages. The EIA/ JEDEC specification is JESD51-7, “High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages”. The standard describes the test method and board specifications for measuring the thermal resistance from junction to ambient. The actual thermal resistance for a particular application can vary depending on many factors, such as copper area and thickness. Refer to AN792, “A Method to Determine How Much Power a SOT-23 Can Dissipate in an Application” (DS00792), for more information regarding this subject. JUNCTION TEMPERATURE ESTIMATE PD(MAX) = 554 mW 5.4 Voltage Reference The MCP1755/1755S can be used not only as a regulator, but also as a low quiescent current voltage reference. In many microcontroller applications, the initial accuracy of the reference can be calibrated using production test equipment or by using a ratio measurement. When the initial accuracy is calibrated, the thermal stability and line regulation tolerance are the only errors introduced by the MCP1755/1755S LDO. The low-cost, low quiescent current and small ceramic output capacitor are all advantages when using the MCP1755/1755S as a voltage reference. Ratio Metric Reference 68 µA Bias CIN 1 µF MCP1755S PIC® Microcontroller VIN VOUT GND VREF COUT 1 µF ADO AD1 Bridge Sensor FIGURE 5-2: Using the MCP1755/1755S as a Voltage Reference. EXAMPLE 5-2: TJ(RISE) = PTOTAL x RJA TJRISE = 152.7 mW x 336.0°C/Watt TJRISE = 51.3°C DS25160A-page 22 2012 Microchip Technology Inc. MCP1755/1755S 5.5 Pulsed Load Applications For some applications, there are pulsed load current events that may exceed the specified 300 mA maximum specification of the MCP1755/1755S. The internal current limit of the MCP1755/1755S will prevent high peak load demands from causing nonrecoverable damage. The 300 mA rating is a maximum average continuous rating. As long as the average current does not exceed 300 mA, higher pulsed load currents can be applied to the MCP1755/1755S. The typical foldback current limit for the MCP1755/1755S is 350 mA (TA = +25°C). 2012 Microchip Technology Inc. DS25160A-page 23 MCP1755/1755S NOTES: DS25160A-page 24 2012 Microchip Technology Inc. MCP1755/1755S 6.0 PACKAGING INFORMATION 6.1 Package Marking Information Example: 3-Lead SOT-223 (MCP1755S only) Part Number MCP1755S-1802E/DB First Line Code 1755S18 MCP1755ST-1802E/DB 1755S18 MCP1755S-3302E/DB 1755S33 MCP1755ST-3302E/DB 1755S33 MCP1755S-5002E/DB 1755S50 MCP1755ST-5002E/DB 1755S50 5-Lead SOT-223 (MCP1755 only) Example: Part Number First Line Code MCP1755T-1802E/DC 175518 MCP1755T-3302E/DC 175533 MCP1755T-5002E/DC 175550 Part Number e3 * Note: 175518 EDCY1240 256 Example: 5-Lead SOT-23 (MCP1755 only) Legend: XX...X Y YY WW NNN 1755S18 EDBY1240 256 Code MCP1755T-1802E/OT 2SNN MCP1755T-3302E/OT 3CNN MCP1755T-5002E/OT 3DNN 2S25 Customer-specific information Year code (last digit of calendar year) Year code (last 2 digits of calendar year) Week code (week of January 1 is week ‘01’) Alphanumeric traceability code Pb-free JEDEC designator for Matte Tin (Sn) This package is Pb-free. The Pb-free JEDEC designator ( e3) can be found on the outer packaging for this package. In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information. 2012 Microchip Technology Inc. DS25160A-page 25 MCP1755/1755S Package Marking Information (Continued) Example: 8-Lead DFN (2x3) Part Number DS25160A-page 26 First Line Code MCP1755-1802E/MC ALZ MCP1755T-1802E/MC ALZ MCP1755-3302E/MC AKA MCP1755T-3302E/MC AKA MCP1755-5002E/MC AKB MCP1755T-5002E/MC AKB MCP1755S-1802E/MC AMA MCP1755ST-1802E/MC AMA MCP1755S-3302E/MC AMB MCP1755ST-3302E/MC AMB MCP1755S-5002E/MC AMC MCP1755ST-5002E/MC AMC ALZ 240 256 2012 Microchip Technology Inc. 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MCP1755/1755S " ! )RUWKHPRVWFXUUHQWSDFNDJHGUDZLQJVSOHDVHVHHWKH0LFURFKLS3DFNDJLQJ6SHFLILFDWLRQORFDWHGDW KWWSZZZPLFURFKLSFRPSDFNDJLQJ b N E E1 3 2 1 e e1 D A2 A c φ A1 L L1 8QLWV 'LPHQVLRQ/LPLWV 1XPEHURI3LQV 0,//,0(7(56 0,1 120 0$; 1 /HDG3LWFK H %6& 2XWVLGH/HDG3LWFK H 2YHUDOO+HLJKW $ ± 0ROGHG3DFNDJH7KLFNQHVV $ ± 6WDQGRII $ ± 2YHUDOO:LGWK ( ± 0ROGHG3DFNDJH:LGWK ( ± 2YHUDOO/HQJWK ' ± %6& )RRW/HQJWK / ± )RRWSULQW / ± )RRW$QJOH ± /HDG7KLFNQHVV F ± /HDG:LGWK E ± ! 'LPHQVLRQV'DQG(GRQRWLQFOXGHPROGIODVKRUSURWUXVLRQV0ROGIODVKRUSURWUXVLRQVVKDOOQRWH[FHHGPPSHUVLGH 'LPHQVLRQLQJDQGWROHUDQFLQJSHU$60(<0 %6& %DVLF'LPHQVLRQ7KHRUHWLFDOO\H[DFWYDOXHVKRZQZLWKRXWWROHUDQFHV 0LFURFKLS 7HFKQRORJ\ 'UDZLQJ &% 2012 Microchip Technology Inc. DS25160A-page 31 MCP1755/1755S Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging DS25160A-page 32 2012 Microchip Technology Inc. MCP1755/1755S $ %& '*+#-2279:;% ! )RUWKHPRVWFXUUHQWSDFNDJHGUDZLQJVSOHDVHVHHWKH0LFURFKLS3DFNDJLQJ6SHFLILFDWLRQORFDWHGDW KWWSZZZPLFURFKLSFRPSDFNDJLQJ e D b N N L K E2 E EXPOSED PAD NOTE 1 NOTE 1 2 1 2 1 D2 BOTTOM VIEW TOP VIEW A A3 A1 NOTE 2 8QLWV 'LPHQVLRQ/LPLWV 1XPEHURI3LQV 0,//,0(7(56 0,1 1 120 0$; 3LWFK H 2YHUDOO+HLJKW $ 6WDQGRII $ &RQWDFW7KLFNQHVV $ 5() 2YHUDOO/HQJWK ' %6& 2YHUDOO:LGWK ( ([SRVHG3DG/HQJWK ' ± ([SRVHG3DG:LGWK ( ± E &RQWDFW/HQJWK / &RQWDFWWR([SRVHG3DG . ± ± &RQWDFW:LGWK %6& %6& ! 3LQYLVXDOLQGH[IHDWXUHPD\YDU\EXWPXVWEHORFDWHGZLWKLQWKHKDWFKHGDUHD 3DFNDJHPD\KDYHRQHRUPRUHH[SRVHGWLHEDUVDWHQGV 3DFNDJHLVVDZVLQJXODWHG 'LPHQVLRQLQJDQGWROHUDQFLQJSHU$60(<0 %6& %DVLF'LPHQVLRQ7KHRUHWLFDOO\H[DFWYDOXHVKRZQZLWKRXWWROHUDQFHV 5() 5HIHUHQFH'LPHQVLRQXVXDOO\ZLWKRXWWROHUDQFHIRULQIRUPDWLRQSXUSRVHVRQO\ 0LFURFKLS 7HFKQRORJ\ 'UDZLQJ && 2012 Microchip Technology Inc. DS25160A-page 33 MCP1755/1755S Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging DS25160A-page 34 2012 Microchip Technology Inc. MCP1755/1755S APPENDIX A: REVISION HISTORY Revision A (December 2012) • Original Release of this Document. 2012 Microchip Technology Inc. DS25160A-page 35 MCP1755/1755S NOTES: DS25160A-page 36 2012 Microchip Technology Inc. MCP1755/1755S PRODUCT IDENTIFICATION SYSTEM To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office. PART NO. Device XX X- Tape and Reel Device: X Output Feature Voltage Code MCP1755: MCP1755T: MCP1755S: MCP1755ST: X X/ XX Tolerance Temp. Package Range 300 mA, 16V, High-Performance LDO 300 mA, 16V, High-Performance LDO (Tape and Reel) 300 mA, 16V, High-Performance LDO 300 mA, 16V, High-Performance LDO (Tape and Reel) Tape and Reel: T = Tape and Reel Output Voltage*: 18 = 1.8V “Standard” 33 = 3.3V “Standard” 50 = 5.0V “Standard” *Contact factory for other voltage options Extra Feature Code: 0 = Fixed Tolerance: 2 = 2% (Standard) Temperature Range: E = -40°C to +125°C Package: DB DC OT MC Examples: a) MCP1755ST-1802E/DB: Tape and Reel, 1.8V Output Voltage, Fixed, 2% Tolerance, 3LD SOT-223 Package. b) MCP1755ST-3302E/DB: Tape and Reel, 3.3V Output Voltage, Fixed, 2% Tolerance, 3LD SOT-223 Package. c) MCP1755ST-5002E/DB: Tape and Reel, 5.0V Output Voltage, Fixed, 2% Tolerance, 3LD SOT-223 Package. a) MCP1755T-1802E/DC: Tape and Reel, 1.8V Output Voltage, Fixed, 2% Tolerance, 5LD SOT-223 Package b) MCP1755T-3302E/DC: Tape and Reel, 3.3V Output Voltage, Fixed, 2% Tolerance, 5LD SOT-223 Package c) MCP1755T-5002E/DC: Tape and Reel, 5.0V Output Voltage, Fixed, 2% Tolerance, 5LD SOT-223 Package a) MCP1755T-1802E/OT: b) MCP1755T-3302E/OT: = = = = Plastic Small Outline (SOT-223), 3-lead Plastic Small Outline (SOT-223), 5-lead Plastic Small Outline (SOT-23), 5-lead Plastic Dual Flat, No Lead (2x3 DFN), 8-lead c) MCP1755T-5002E/OT: Tape and Reel, 1.8V Output Voltage, Fixed, 2% Tolerance, 5LD SOT-23 Package Tape and Reel, 3.3V Output Voltage, Fixed, 2% Tolerance, 5LD SOT-23 Package Tape and Reel, 5.0V Output Voltage, Fixed, 2% Tolerance, 5LD SOT-23 Package a) MCP1755T-1802E/MC: Tape and Reel, 1.8V Output Voltage, Fixed, 2% Tolerance, 8LD 2x3 DFN Package b) MCP1755T-3302E/MC: Tape and Reel, 3.3V Output Voltage, Fixed, 2% Tolerance, 8LD 2x3 DFN Package c) MCP1755T-5002E/MC: Tape and Reel, 5.0V Output Voltage, Fixed, 2% Tolerance, 8LD 2x3 DFN Package a) MCP1755ST-1802E/MC: Tape and Reel, 1.8V Output Voltage, Fixed, 2% Tolerance, 8LD 2x3 DFN Package 2012 Microchip Technology Inc. DS25160A-page 37 MCP1755/1755S NOTES: DS25160A-page 38 2012 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, dsPIC, FlashFlex, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART, PIC32 logo, rfPIC, SST, SST Logo, SuperFlash and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor, MTP, SEEVAL and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries. Analog-for-the-Digital Age, Application Maestro, BodyCom, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP, Mindi, MiWi, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE, rfLAB, Select Mode, SQI, Serial Quad I/O, Total Endurance, TSHARC, UniWinDriver, WiperLock, ZENA and Z-Scale are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. GestIC and ULPP are registered trademarks of Microchip Technology Germany II GmbH & Co. & KG, a subsidiary of Microchip Technology Inc., in other countries. All other trademarks mentioned herein are property of their respective companies. © 2012, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. ISBN: 9781620768181 QUALITY MANAGEMENT SYSTEM CERTIFIED BY DNV == ISO/TS 16949 == 2012 Microchip Technology Inc. Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. 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