MICROCHIP MCP1726T

MCP1726
1A, Low Voltage, Low Quiescent Current LDO Regulator
Features
Description
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The MCP1726 is a 1A Low Dropout (LDO) linear
regulator that provides high current and low output
voltages in a very small package. The MCP1726
comes in a fixed (or adjustable) output voltage version,
with an output voltage range of 0.8V to 5.0V. The 1A
output current capability, combined with the low output
voltage capability, make the MCP1726 a good choice
for new sub-1.8V output voltage LDO applications that
have high current demands.
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1A Output Current Capability
Input Operating Voltage Range: 2.3V to 6.0V
Adjustable Output Voltage Range: 0.8V to 5.0V
Standard Fixed Output Voltages:
- 0.8V, 1.2V, 1.8V, 2.5V, 3.3V, 5.0V
Low Dropout Voltage: 220 mV Typical at 1A
Typical Output Voltage Tolerance: 0.4%
Stable with 1.0 µF Ceramic Output Capacitor
Fast response to Load Transients
Low Supply Current: 140 µA (typ)
Low Shutdown Supply Current: 0.1 µA (typ)
Adjustable Delay on Power Good Output
Short Circuit Current Limiting and
Overtemperature Protection
3X3 DFN-8 and SOIC-8 Package Options
Applications
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High-Speed Driver Chipset Power
Networking Backplane Cards
Notebook Computers
Network Interface Cards
Palmtop Computers
2.5V to 1.XV Regulators
The MCP1726 is stable using ceramic output
capacitors that inherently provide lower output noise
and reduce the size and cost of the entire regulator
solution. Only 1 µF of output capacitance is needed to
stabilize the LDO.
Using CMOS construction, the quiescent current
consumed by the MCP1726 is typically less than
140 µA over the entire input voltage range, making it
attractive for portable computing applications that
demand high output current. When shut down, the
quiescent current is reduced to less than 0.1 µA.
The scaled-down output voltage is internally monitored
and a power good (PWRGD) output is provided when
the output is within 92% of regulation (typical). An
external capacitor can be used on the CDELAY pin to
adjust the delay from 1 ms to 300 ms.
The overtemperature and short circuit current-limiting
provide additional protection for the LDO during system
fault conditions.
Package Types
Adjustable (SOIC-8)
VIN 1
VIN 2
SHDN 3
GND 4
Fixed (SOIC-8)
8 VOUT
VIN 1
VIN 2
7 ADJ
6 CDELAY
SHDN 3
5 PWRGD
GND 4
8 VOUT
7 VOUT
6 CDELAY
5 PWRGD
Adjustable (3X3 DFN)
VIN 1
8
VOUT
VIN 1
8
VOUT
VIN 2
7
ADJ
VIN 2
7
VOUT
SHDN 3
6
CDELAY
SHDN 3
6
CDELAY
GND 4
5
PWRGD
GND 4
© 2005 Microchip Technology Inc.
Fixed (3X3 DFN)
5
PWRGD
DS21936B-page 1
MCP1726
Typical Application
MCP1726 Fixed Output Voltage
VIN = 2.3V to 2.8V
C1
4.7 µF
1
VIN
VOUT 8
2
VIN
VOUT 7
3
SHDN CDELAY 6
4
GND PWRGD 5
VOUT = 1.8V @ 1A
C2
1 µF
C3
1000 pF
On
R1
100 kΩ
Off
PWRGD
MCP1726 Adjustable Output Voltage
VIN = 2.3V to 2.8V
C1
4.7 µF
1
VIN
VOUT 8
2
VIN
ADJ 7
3
SHDN CDELAY 6
4
GND
VOUT = 1.2V @ 1A
R1
40 kΩ
R3
100 kΩ
PWRGD 5
On
Off
C2
1 µF
C3
1000 pF
R2
20 kΩ
PWRGD
DS21936B-page 2
© 2005 Microchip Technology Inc.
MCP1726
Functional Block Diagram
PMOS
VIN
VOUT
Undervoltage
Lock Out
(UVLO)
ISNS
Cf
Rf
SHDN
ADJ
Overtemperature
Sensing
+
Driver w/limit
and SHDN
EA
–
SHDN
VREF
V IN
SHDN
Reference
Soft-Start
Comp
TDELAY
PWRGD
GND
92% of VREF
© 2005 Microchip Technology Inc.
CDELAY
DS21936B-page 3
MCP1726
1.0
ELECTRICAL
CHARACTERISTICS
† Notice: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Absolute Maximum Ratings †
VIN ....................................................................................6.5V
Maximum Voltage on Any Pin .. (GND – 0.3V) to (VDD + 0.3)V
Maximum Junction Temperature, TJ ........................... +150°C
Maximum Power Dissipation ......... Internally-Limited (Note 6)
Storage temperature .....................................-65°C to +150°C
DC CHARACTERISTICS
Electrical Specifications: Unless otherwise noted, VIN = (VR + 0.5V) or 2.3V, whichever is greater, IOUT = 1 mA,
CIN = COUT = 4.7 µF (X7R Ceramic), TA = +25°C.
Boldface type applies for junction temperatures, TJ (Note 7) of -40°C to +125°C
Parameters
Sym
Min
Input Operating Voltage
VIN
2.3
Input Quiescent Current
Iq
—
Input Quiescent Current for
SHDN Mode
ISHDN
Maximum Output Current
Max
Units
6.0
V
Note 1
140
220
µA
IL = 0 mA, VIN = VR +0.5V,
VOUT = 0.8V to 5.0V
—
0.1
3
µA
SHDN = GND
IOUT
1
—
—
A
VIN = 2.3V to 6.0V (Note 1)
Line Regulation
ΔVOUT/
(VOUT x ΔVIN)
—
0.05
0.3
%/V
Load Regulation
ΔVOUT/VOUT
-1.5
±0.5
1.5
%
IOUT = 1 mA to 1A,
VIN = (VR + 0.6)V (Note 4)
IOUT_SC
—
1.7
—
A
VIN = (VR + 0.5)V,
RLOAD < 0.1Ω, Peak Current
Adjust Pin Reference Voltage
VADJ
0.402
0.410
0.418
V
VIN = 2.3V to VIN = 6.0V,
IOUT = 1 mA
Adjust Pin Leakage Current
IADJ
-10
±0.01
+10
nA
VIN = 6.0V,
VADJ = 0V to 6V
TCVOUT
—
40
—
Output Short Circuit Current
Typ
Conditions
(VR + 0.5)V ≤ VIN ≤ 6V
Adjust Pin Characteristics
Adjust Temperature Coefficient
Note 1:
2:
3:
4:
5:
6:
7:
ppm/°C Note 3
The minimum VIN must meet two conditions: VIN ≥ 2.3V and VIN ≥ (VR + 2.5%) + VDROPOUT.
VR is the nominal regulator output voltage for the fixed cases. VR = 1.2V, 1.8V, etc. VR is the desired set
point output voltage for the adjustable cases. VR = VADJ * ((R1/R2)+1). Figure 4-1.
TCVOUT = (VOUT-HIGH – VOUT-LOW) *106 / (VR * ΔTemperature). VOUT-HIGH is the highest voltage measured
over the temperature range. VOUT-LOW is the lowest voltage measured over the temperature range.
Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Load
regulation is tested over a load range from 1 mA to the maximum specified output current.
Dropout voltage is defined as the input-to-output voltage differential at which the output voltage drops 2%
below its nominal value that was measured with an input voltage of VIN = VR + 0.5V.
The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air. (i.e., TA, TJ, θJA). Exceeding the maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum 150°C rating. Sustained junction temperatures above 125°C can impact device reliability.
The junction temperature is approximated by soaking the device under test at an ambient temperature
equal to the desired junction temperature. The test time is small enough such that the rise in the junction
temperature over the ambient temperature is not significant.
DS21936B-page 4
© 2005 Microchip Technology Inc.
MCP1726
DC CHARACTERISTICS (Continued)
Electrical Specifications: Unless otherwise noted, VIN = (VR + 0.5V) or 2.3V, whichever is greater, IOUT = 1 mA,
CIN = COUT = 4.7 µF (X7R Ceramic), TA = +25°C.
Boldface type applies for junction temperatures, TJ (Note 7) of -40°C to +125°C
Parameters
Sym
Min
Typ
Max
Units
VOUT
VR 2.5%
VR
±0.5%
VR +
2.5%
V
VIN-VOUT
—
220
500
mV
VPWRGD_VIN
1.0
—
6.0
V
1.2
—
6.0
Conditions
Fixed-Output Characteristics
Voltage Regulation
Note 2
Dropout Characteristics
Dropout Voltage
IOUT = 1A, VIN(MIN) = 2.3V
(Note 5)
Power Good Characteristics
Input Voltage Operating Range
for Valid PWRGD
TA = +25°C
TA = -40°C to +125°C
ISINK = 100 µA
PWRGD Threshold Voltage
(Referenced to VOUT)
PWRGD_THF
PWRGD_THR
88
92
96
%
VOUT < 2.5V, Falling Edge
89
92
95
%
VOUT > 2.5V, Falling Edge
89
94
98
%
VOUT < 2.5V, Rising Edge
90
93
96
%
VOUT > 2.5V, Rising Edge
0.2
0.4
V
IPWRGD SINK = 1.2 mA
PWRGD Output Voltage Low
VPWRGD_L
—
PWRGD Leakage
PWRGD_LK
—
0.1
—
µA
VPWRGD = VIN = 6.0V
TPG
—
200
—
µs
CDELAY = OPEN
10
30
55
ms
CDELAY = 0.01 µF
—
300
—
ms
CDELAY = 0.1 µF
TVDET-PWRGD
—
170
—
µs
VSHDN-HIGH
45
PWRGD Time Delay
Detect Threshold to PWRGD
Active Time Delay
Shutdown Input
Logic-High Input
Logic-Low Input
SHDN Input Leakage Current
Note 1:
2:
3:
4:
5:
6:
7:
VSHDN-Low
SHDNILK
-0.1
±0.001
%VIN
VIN = 2.3V to 6.0V
15
%VIN
VIN = 2.3V to 6.0V
+0.1
µA
VIN = 6V, SHDN =VIN,
SHDN = GND
The minimum VIN must meet two conditions: VIN ≥ 2.3V and VIN ≥ (VR + 2.5%) + VDROPOUT.
VR is the nominal regulator output voltage for the fixed cases. VR = 1.2V, 1.8V, etc. VR is the desired set
point output voltage for the adjustable cases. VR = VADJ * ((R1/R2)+1). Figure 4-1.
TCVOUT = (VOUT-HIGH – VOUT-LOW) *106 / (VR * ΔTemperature). VOUT-HIGH is the highest voltage measured
over the temperature range. VOUT-LOW is the lowest voltage measured over the temperature range.
Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Load
regulation is tested over a load range from 1 mA to the maximum specified output current.
Dropout voltage is defined as the input-to-output voltage differential at which the output voltage drops 2%
below its nominal value that was measured with an input voltage of VIN = VR + 0.5V.
The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air. (i.e., TA, TJ, θJA). Exceeding the maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum 150°C rating. Sustained junction temperatures above 125°C can impact device reliability.
The junction temperature is approximated by soaking the device under test at an ambient temperature
equal to the desired junction temperature. The test time is small enough such that the rise in the junction
temperature over the ambient temperature is not significant.
© 2005 Microchip Technology Inc.
DS21936B-page 5
MCP1726
DC CHARACTERISTICS (Continued)
Electrical Specifications: Unless otherwise noted, VIN = (VR + 0.5V) or 2.3V, whichever is greater, IOUT = 1 mA,
CIN = COUT = 4.7 µF (X7R Ceramic), TA = +25°C.
Boldface type applies for junction temperatures, TJ (Note 7) of -40°C to +125°C
Parameters
Sym
Min
Typ
Max
Units
Conditions
AC Performance
TOR
Output Delay From SHDN
100
µs
SHDN = GND to VIN
VOUT = GND to 95% VR
eN
—
2.0
—
Power Supply Ripple Rejection
Ratio
PSRR
—
54
—
dB
f = 100 Hz, COUT = 10 µF,
IOUT = 100 mA,
VINAC = 30 mV pk-pk,
CIN = 0 µF
Thermal Shutdown Temperature
TSD
—
150
—
°C
IOUT = 100 µA, VOUT =
1.8V, VIN = 2.8V
ΔTSD
—
10
—
°C
IOUT = 100 µA, VOUT =
1.8V, VIN = 2.8V
Output Noise
Thermal Shutdown Hysteresis
Note 1:
2:
3:
4:
5:
6:
7:
µV/√Hz IOUT = 200 mA, f = 1 kHz,
COUT = 1 µF (X7R
Ceramic), VOUT = 2.5V
The minimum VIN must meet two conditions: VIN ≥ 2.3V and VIN ≥ (VR + 2.5%) + VDROPOUT.
VR is the nominal regulator output voltage for the fixed cases. VR = 1.2V, 1.8V, etc. VR is the desired set
point output voltage for the adjustable cases. VR = VADJ * ((R1/R2)+1). Figure 4-1.
TCVOUT = (VOUT-HIGH – VOUT-LOW) *106 / (VR * ΔTemperature). VOUT-HIGH is the highest voltage measured
over the temperature range. VOUT-LOW is the lowest voltage measured over the temperature range.
Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Load
regulation is tested over a load range from 1 mA to the maximum specified output current.
Dropout voltage is defined as the input-to-output voltage differential at which the output voltage drops 2%
below its nominal value that was measured with an input voltage of VIN = VR + 0.5V.
The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air. (i.e., TA, TJ, θJA). Exceeding the maximum allowable power dissipation will cause the device operating junction temperature to exceed the maximum 150°C rating. Sustained junction temperatures above 125°C can impact device reliability.
The junction temperature is approximated by soaking the device under test at an ambient temperature
equal to the desired junction temperature. The test time is small enough such that the rise in the junction
temperature over the ambient temperature is not significant.
TEMPERATURE SPECIFICATIONS
Electrical Specifications: Unless otherwise indicated, all limits apply for VIN = 2.3V to 6.0V.
Parameters
Sym
Min
Typ
Max
Units
Conditions
Operating Junction Temperature Range
TJ
-40
—
+125
°C
Steady State
Maximum Junction Temperature
TJ
—
—
+150
°C
Transient
Storage Temperature Range
TA
-65
—
+150
°C
Thermal Resistance, 8LD 3 x 3 DFN
θJA
—
41
—
°C/W
4-Layer JC51-7
Standard Board with
vias
Thermal Resistance, 8LD SOIC
θJA
—
150
—
°C/W
4-Layer JC51-7
Standard Board
Temperature Ranges
Thermal Package Resistances
DS21936B-page 6
© 2005 Microchip Technology Inc.
MCP1726
2.0
TYPICAL PERFORMANCE CURVES
Note:
The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein
are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified
operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
NOTE: Unless otherwise indicated, VIN = VOUT + 0.5V, IOUT = 1 mA and TA = +25°C.
0.05
VR = 1.2V (Adj.)
IOUT = 0 mA
170
Line Regulation (%/V)
160
+125°C
150
140
+25°C
130
120
-40ºC
110
VR = 1.2V (Adj.)
VIN = 2.3V to 6.0V
0.04
IOUT = 1A
0.03
0.02
IOUT = 500 mA
0.01
0
IOUT = 1 mA
-0.01
IOUT = 100 mA
Input Voltage (V)
125
FIGURE 2-4:
Line Regulation vs.
Temperature (1.2V Adjustable).
300
0.70
VR = 1.2V (Adj.)
280
VR = 5.0V
Load Regulation (%)
260
240
220
VIN = 3.3V
200
VIN = 2.5V
180
160
140
120
0.60
0.50
VR = 3.3V
VR = 1.8V
0.40
VR = 0.8V
0.30
0.20
VIN = VR + 0.6V (or 2.3V)
IOUT = 1 mA to 1A
VIN = 3.3V
VIN = 2.5V
120
95
80
125
VIN = 5.0V
130
125
Adjust Pin Voltage (mV)
140
110
FIGURE 2-5:
Temperature.
411.00
VR = 1.2V (Adj.)
IOUT = 0 mA
150
65
Temperature (°C)
FIGURE 2-2:
Ground Current vs. Load
Current (1.2V Adjustable).
160
110
Load Current (mA)
50
1000
35
800
20
600
5
400
-10
200
-40
0.10
0
-25
110
100
Load Regulation vs.
IOUT = 1 mA
410.50
410.00
VIN = 6.0V
VIN = 2.3V
409.50
409.00
Temperature (°C)
FIGURE 2-3:
Quiescent Current vs.
Junction Temperature (1.2V Adjustable).
© 2005 Microchip Technology Inc.
95
80
65
50
35
20
-10
-25
-40
125
95
110
80
65
50
35
20
5
-10
-25
-40
408.50
5
Ground Current (µA)
95
Temperature (°C)
FIGURE 2-1:
Quiescent Current vs. Input
Voltage (1.2V Adjustable).
Quiescent Current (µA)
110
5.8
80
5.3
65
4.8
50
4.3
35
3.8
20
3.3
-10
2.8
-40
2.3
5
-0.02
100
-25
Quiescent Current (µA)
180
Temperature (°C)
FIGURE 2-6:
Temperature.
Adjust Pin Voltage vs.
DS21936B-page 7
MCP1726
250
225
200
175
150
125
100
75
50
25
0
180
Adjustable Version
Quiescent Current (µA)
VOUT = 5.0V
VOUT = 2.5V
VOUT = 0.8V
IOUT = 0 mA
170
+125°C
160
150
+90°C
140
+25°C
130
120
-40°C
110
FIGURE 2-7:
Dropout Voltage vs. Output
Current (Adjustable Version).
Quiescent Current (µA)
Dropout Voltage (mV)
250
240
VOUT = 5.0V
230
VOUT = 3.3V
220
VOUT =2.5V
210
200
500
300
+25°C
200
100
-40°C
2.3 2.6 2.9 3.2 3.5 3.8 4.1 4.4 4.7 5.0 5.3 5.6 5.9
FIGURE 2-11:
Quiescent Current vs. Input
Voltage (3.3V Fixed).
32
Ground Current (µA)
VIN =2.3V
VIN =3.0V
28
VIN =5.5V
24
22
CDELAY = 10 nF
125
110
95
80
65
50
35
20
5
-10
-25
20
-40
Power Good Time Delay (ms)
5.9
+125°C
400
Input Voltage (V)
FIGURE 2-8:
Dropout Voltage vs.
Temperature (Adjustable Version).
340
320
300
280
260
240
220
200
180
160
140
120
VIN = 2.3V for 0.8V device
VOUT =3.3V
VOUT =0.8V
0
FIGURE 2-9:
Power Good (PWRGD)
Time Delay vs. Temperature.
200
400
600
800
1000
Load Current (mA)
Temperature (°C)
DS21936B-page 8
5.6
600
Temperature (°C)
26
5.3
VOUT =3.3V
IOUT = 0 mA
700
0
125
110
95
80
65
50
35
5
20
-10
-25
-40
190
30
5.0
FIGURE 2-10:
Quiescent Current vs. Input
Voltage (0.8V Fixed).
800
Adjustable Version
IOUT = 1A
260
4.7
Input Voltage (V)
Output Current (mA)
270
4.4
1000
4.1
800
3.8
600
3.5
400
3.2
200
2.9
0
2.6
100
2.3
Dropout Voltage (mV)
NOTE: Unless otherwise indicated, VIN = VOUT + 0.5V, IOUT = 1 mA and TA = +25°C.
FIGURE 2-12:
Current.
Ground Current vs. Load
© 2005 Microchip Technology Inc.
MCP1726
NOTE: Unless otherwise indicated, VIN = VOUT + 0.5V, IOUT = 1 mA and TA = +25°C.
0.025
0
IOUT =1 mA
-0.005
VOUT =0.8V
VOUT =1.2V
Temperature (°C)
FIGURE 2-15:
Line Regulation vs.
Temperature (0.8V Fixed)
125
110
95
80
65
125
110
95
80
65
125
95
Temperature (°C)
110
80
65
50
35
20
5
-10
-25
-40
-0.025
IOUT = 1 mA to 1000 mA
VIN = VOUT + 0.6V
50
VOUT = 0.8V
35
IOUT =100 mA
-0.02
VOUT =2.5V
20
-0.01
VOUT =3.3V
VOUT =5.0V
5
IOUT =10 mA
-10
IOUT =500 mA
-0.005
-25
0.005
-0.20
-0.25
-0.30
-0.35
-0.40
-0.45
-0.50
-0.55
-0.60
-0.65
-0.70
-40
Load Regulation (%)
Line Regulation (%/V)
IOUT =1.0A
© 2005 Microchip Technology Inc.
50
FIGURE 2-17:
Load Regulation vs.
Temperature (VOUT < 2.5V Fixed).
ISHDN vs. Temperature.
-0.015
35
Temperature (°C)
0.015
0
20
5
IOUT = 1 mA to 1000 mA
VIN = 2.3V
-40
125
95
110
80
65
50
35
20
5
-10
-25
VIN =2.3V
VOUT =1.8V
-10
VIN =3.3V
0.60
0.55
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
-25
VIN =6.0V
0.01
125
FIGURE 2-16:
Line Regulation vs.
Temperature (3.3V Fixed).
Quiescent Current vs.
FIGURE 2-14:
95
Temperature (°C)
Load Regulation (%)
100
90
80
70
60
50
40
30
20
10
0
-40
ISHDN (nA)
FIGURE 2-13:
Temperature.
110
-40
Temperature (°C)
80
-0.01
125
95
110
80
65
50
35
20
5
-10
-25
-40
100
0.005
65
110
IOUT =100 mA
50
VOUT =0.8V
120
0.01
35
130
IOUT =500 mA
5
140
IOUT =1A
0.015
20
VOUT =3.3V
-10
150
VOUT = 3.3V
0.02
-25
IOUT = 0 mA
VIN = 2.3V for 0.8V Device
160
Line Regulation (%/V)
Quiescent Current (µA)
170
Temperature (°C)
FIGURE 2-18:
Load Regulation vs.
Temperature (VOUT ≥ 2.5V Fixed).
DS21936B-page 9
MCP1726
10
250
225
200
175
150
125
100
75
50
25
0
VOUT =2.5V (Adj)
IOUT = 200 mA
Noise (µV—Hz)
Dropout Voltage (mV)
NOTE: Unless otherwise indicated, VIN = VOUT + 0.5V, IOUT = 1 mA and TA = +25°C.
VOUT =5.0V
VOUT =2.5V
1
VOUT =0.8V (Fixed)
IOUT = 100 mA
0.1
COUT =1 µF
CIN = 10 µF
0
200
400
600
800
0.01
0.01
1000
0.1
Load Current (mA)
Dropout Voltage vs. Load
80
1000
PSRR (dB)
60
VOUT =5.0V
VOUT =3.3V
50
40
30
20
COUT =10 µF
CIN = 0 µF
IOUT = 100 mA
0
0.01
125
110
95
80
65
50
35
5
10
20
-25
VOUT =2.5V
0.1
Temperature (°C)
FIGURE 2-20:
Temperature.
Dropout Voltage vs.
1
10
100
1000
Frequency (kHz)
FIGURE 2-23:
Power Supply Ripple
Rejection (PSRR) vs. Frequency (VOUT = 1.2V
Adj.).
1.7
90
1.6
80
VOUT = 1.2V
VIN = 2.5V
70
1.5
PSRR (dB)
Short Circuit Current (A)
100
VOUT = 1.2V
VIN = 2.5V
70
250
240
230
220
210
200
190
180
1.4
1.3
1.2
60
50
40
30
20
1.1
10
FIGURE 2-22:
Output Noise Voltage
Density vs. Frequency.
IOUT = 1A
-10
270
260
-40
Dropout Voltage (mV)
FIGURE 2-19:
Current.
1
Frequency (kHz)
VOUT =1.2V (Fixed)
1.0
2.3 2.6 2.9 3.2 3.5 3.8 4.1 4.4 4.7 5.0 5.3 5.6 5.9
Input Voltage (V)
FIGURE 2-21:
Input Voltage.
DS21936B-page 10
Short Circuit Current vs.
10
COUT =22 µF
CIN = 0 µF
IOUT = 100 mA
0
0.01
0.1
1
10
100
1000
Frequency (kHz)
FIGURE 2-24:
Power Supply Ripple
Rejection (PSRR) vs. Frequency (VOUT = 1.2V
Adj.).
© 2005 Microchip Technology Inc.
MCP1726
NOTE: Unless otherwise indicated, VIN = VOUT + 0.5V, IOUT = 1 mA and TA = +25°C.
80
VOUT = 2.5V
VIN = 3.3V
70
PSRR (dB)
60
VOUT
50
40
PWRGD
30
20
10
COUT =10 µF
CIN = 0 µF
IOUT = 100 mA
0
0.01
0.1
SHDN
1
10
100
1000
Frequency (kHz)
FIGURE 2-25:
Power Supply Ripple
Rejection (PSRR) vs. Frequency (VOUT = 2.5V
Fixed).
80
2.5V (Adj.) Startup from
VOUT = 2.5V
VIN = 3.3V
70
60
PSRR (dB)
FIGURE 2-28:
Shutdown.
VOUT
50
40
PWRGD
30
20
10
COUT =22 µF
CIN = 0 µF
IOUT = 100 mA
0
0.01
0.1
VIN
1
10
100
1000
Frequency (kHz)
FIGURE 2-26:
Power Supply Ripple
Rejection (PSRR) vs. Frequency (VOUT = 2.5V
Fixed).
FIGURE 2-29:
Power Good (PWRGD)
Timing with CBYPASS of 1000 pF.
VOUT
VOUT
PWRGD
VIN
VIN
FIGURE 2-27:
PWRGD
2.5V (Adj.) Startup from VIN.
© 2005 Microchip Technology Inc.
FIGURE 2-30:
Power Good (PWRGD)
Timing with CBYPASS of 0.01 µF.
DS21936B-page 11
MCP1726
NOTE: Unless otherwise indicated, VIN = VOUT + 0.5V, IOUT = 1 mA and TA = +25°C.
3.3V
VIN
2.3V
VOUT
CIN = 47 µF
COUT = 10 µF
VOUT
CIN = 1 µF
IOUT
VIN
COUT = 10 µF
IOUT = 100 mA
FIGURE 2-31:
(1.2V Fixed).
Dynamic Line Response
4.5V
3.5V
VIN
FIGURE 2-33:
Dynamic Load Response
(2.5V Fixed, 10 mA to 1000 mA).
VOUT
CIN = 47 µF
COUT = 10 µF
VOUT
CIN = 1 µF
IOUT
VIN
COUT = 10 µF
IOUT = 100 mA
FIGURE 2-32:
(2.5V Fixed).
DS21936B-page 12
Dynamic Line Response
FIGURE 2-34:
Dynamic Load Response
(2.5V Fixed, 100 mA to 1000 mA).
© 2005 Microchip Technology Inc.
MCP1726
3.0
PIN DESCRIPTION
The descriptions of the pins are listed in Table 3-1.
TABLE 3-1:
PIN FUNCTION TABLE
Pin No.
Fixed Output
Pin No.
Adjustable
Output
Name
1
1
VIN
Input Voltage Supply
2
2
VIN
Input Voltage Supply
3
3
SHDN
4
4
GND
5
5
PWRGD
Power Good Output
6
6
CDELAY
Power Good Delay Set-Point Input
—
7
ADJ
Output Voltage Sense Input (adjustable version)
7
—
VOUT
Regulated Output Voltage
8
8
VOUT
Regulated Output Voltage
Exposed Pad
Exposed Pad
EP
3.1
Input Voltage Supply (VIN)
Connect the unregulated or regulated input voltage
source to VIN. If the input voltage source is located
several inches away from the LDO, or the input source
is a battery, it is recommended that an input capacitor
be used. A typical input capacitance value of 1 µF to
10 µF should be sufficient for most applications.
3.2
Shutdown Control Input (SHDN)
The SHDN input is used to turn the LDO output voltage
on and off. When the SHDN input is at a logic-high
level, the LDO output voltage is enabled. When the
SHDN input is pulled to a logic-low level, the LDO
output voltage is disabled. When the SHDN input is
pulled low, the PWRGD output also goes low and the
LDO enters a low quiescent current shutdown state
where the typical quiescent current is 0.1 µA.
3.3
Ground (GND)
Description
Shutdown Control Input (active-low)
Ground
Exposed Pad of the DFN Package
3.5
Power Good Delay Set-Point Input
(CDELAY)
The CDELAY input sets the power-up delay time for the
PWRGD output. By connecting an external capacitor
from the CDELAY pin to ground, the delay times for the
PWRGD output can be adjusted from 200 µs (no
capacitance) to 300 ms (0.1 µF capacitor). This allows
for the optimal setting of the system reset time.
3.6
Output Voltage Sense Input (ADJ)
The output voltage adjust pin (ADJ) for the adjustable
output voltage version of the MCP1726 allows the user
to set the output voltage of the LDO by using two
external resistors. The adjust pin voltage is 0.41V
(typical).
3.7
Regulated Output Voltage (VOUT)
Connect the GND pin of the LDO to a quiet circuit
ground. This will help the LDO power supply rejection
ratio and noise performance. The ground pin of the
LDO only conducts the quiescent current of the LDO
(typically 140 µA), so a heavy trace is not required.
The VOUT pin(s) is the regulated output voltage of the
LDO. A minimum output capacitance of 1.0 µF is
required for LDO stability. The MCP1726 is stable with
ceramic, tantalum and aluminum-electrolytic capacitors. See Section 4.3 “Output Capacitor” for output
capacitor selection guidance.
3.4
3.8
Power Good Output (PWRGD)
The PWRGD output is an open-drain output used to
indicate when the LDO output voltage is within 92%
(typically) of its nominal regulation value. The PWRGD
output has a typical hysteresis value of 2% for the
adjustable voltage version and for voltage outputs less
than 2.5V. For fixed output voltage versions greater
than 2.5V, the hysteresis is 0.7%. The PWRGD output
is delayed on power-up by 200 µs (typical, no capacitance on CDELAY pin). This delay time is controlled by
the CDELAY pin.
© 2005 Microchip Technology Inc.
Exposed Pad (EP)
The 3X3 DFN package has an exposed pad on the bottom of the package. This pad should be soldered to the
Printed Circuit Board (PCB) to aid in the removal of
heat from the package during operation. The exposed
pad is at the ground potential of the LDO.
DS21936B-page 13
MCP1726
4.0
DEVICE OVERVIEW
4.2
The MCP1726 is a high output current, Low Dropout
(LDO) voltage regulator with an adjustable delay
power-good output and shutdown control input. The
low dropout voltage of 220 mV at 1A of current makes
it ideal for battery-powered applications. Unlike other
high output current LDOs, the MCP1726 only draws
220 µA of quiescent current at full load.
4.1
LDO Output Voltage
The MCP1726 LDO is available with either a fixed
output voltage or an adjustable output voltage. The
output voltage range is 0.8V to 5.5V for both versions.
4.1.1
ADJUST INPUT
The adjustable version of the MCP1726 uses the ADJ
pin (pin 7) to get the output voltage feedback for output
voltage regulation. This allows the user to set the output voltage of the device with two external resistors.
The nominal voltage for ADJ is 0.41V.
Figure 4-1 shows the adjustable version of the
MCP1726. Resistors R1 and R2 form the resistor
divider network necessary to set the output voltage.
With this configuration, the equation for setting VOUT is:
VOUT = LDO Output Voltage
VADJ = ADJ Pin Voltage (typically 0.41V)
MCP1726-ADJ
C1
4.7 µF
1 VIN
VOUT 8
2 VIN
ADJ 7
VOUT
R1
3 SHDN CDELAY 6
On
4 GND
Off
The MCP1726 also incorporates an output current limit.
If the output voltage falls below 0.7V due to an overload
condition (usually represents a shorted load condition),
the output current is limited to 1.7A (typical). If the overload condition is a soft overload, the MCP1726 will supply higher load currents of up to 3A. The MCP1726
should not be operated in this condition continuously as
it may result in failure of the device. However, this does
allow for device usage in applications that have higher
pulsed load currents having an average output current
value of 1A or less.
Output overload conditions may also result in an overtemperature shutdown of the device. If the junction
temperature rises above 150°C, the LDO will shut
down the output voltage. See Section 4.9 “Overtemperature Protection” for more information on
overtemperature shutdown.
C2
1 µF
PWRGD 5
C3
1000 pF
Output Capacitor
The MCP1726 requires a minimum output capacitance
of 1 µF for output voltage stability. Ceramic capacitors
are recommended because of their size, cost and
environmental robustness qualities.
R1 + R 2
V OUT = V ADJ ⎛ ------------------⎞
⎝ R2 ⎠
VIN
The MCP1726 LDO is tested and ensured to supply a
minimum of 1A of output current. The MCP1726 has no
minimum output load, so the output load current can go
to 0 mA and the LDO will continue to regulate the
output voltage to within tolerance.
4.3
EQUATION 4-1:
Output Current and Current
Limiting
R2
FIGURE 4-1:
Typical adjustable output
voltage application circuit.
Aluminum-electrolytic and tantalum capacitors can be
used on the LDO output as well. The Equivalent Series
Resistance (ESR) of the electrolytic output capacitor
must be no greater than 2 ohms. The output capacitor
should be located as close to the LDO output as is
practical. Ceramic materials X7R and X5R have low
temperature coefficients and are well within the acceptable ESR range required. A typical 1 µF X7R 0805
capacitor has an ESR of 50 milli-ohms.
Larger LDO output capacitors can be used with the
MCP1726 to improve dynamic performance and power
supply ripple rejection performance. A maximum of
22 µF
is
recommended.
Aluminum-electrolytic
capacitors are not recommended for low-temperature
applications of < -25°C.
The allowable resistance value range for resistor R2 is
from 10 kΩ to 200 kΩ. Solving the equation for R1
yields the following equation:
EQUATION 4-2:
V OUT – V ADJ
R1 = R2 ⎛ --------------------------------⎞
⎝
⎠
V ADJ
VOUT = LDO Output Voltage
VADJ = ADJ Pin Voltage (typically 0.41V)
DS21936B-page 14
© 2005 Microchip Technology Inc.
MCP1726
4.4
Input Capacitor
Low input source impedance is necessary for the LDO
output to operate properly. When operating from
batteries, or in applications with long lead length
(> 10 inches) between the input source and the LDO,
some input capacitance is recommended. A minimum
of 1.0 µF to 4.7 µF is recommended for most applications.
For applications that have output step load
requirements, the input capacitance of the LDO is very
important. The input capacitance provides the LDO
with a good local low-impedance source to pull the
transient currents from in order to respond quickly to
the output load step. For good step response performance, the input capacitor should be of equivalent (or
higher) value than the output capacitor. The capacitor
should be placed as close to the input of the LDO as is
practical. Larger input capacitors will also help reduce
any high-frequency noise on the input and output of the
LDO and reduce the effects of any inductance that
exists between the input source voltage and the input
capacitance of the LDO.
4.5
Power Good Output (PWRGD)
The PWRGD output is used to indicate when the output
voltage of the LDO is within 92% (typical value, see the
Electrical Characteristics table for Min/Max specs) of its
nominal regulation value.
As the output voltage of the LDO rises, the PWRGD
output will be held low until the output voltage has
exceeded the power good threshold plus the hysteresis
value. Once this threshold has been exceeded, the
power good time delay is started (shown as TPG in the
Electrical Characteristics table). The power good time
delay is adjustable via the CDELAY pin of the LDO (see
Section 4.6 “CDELAY Input”). By placing a capacitor
from the CDELAY pin to ground, the power good time
delay can be adjusted from 200 µs (no capacitance) to
300 ms (0.1 µF capacitor). After the time delay period,
the PWRGD output will go high, indicating that the output voltage is stable and within regulation limits.
If the output voltage of the LDO falls below the power
good threshold, the power good output will transition
low. The power good circuitry has a 170 µs delay when
detecting a falling output voltage, which helps to
increase noise immunity of the power good output and
avoid false triggering of the power good output during
fast output transients. See Figure 4-2 for power good
timing characteristics.
When the LDO is put into Shutdown mode using the
SHDN input, the power good output is pulled low
immediately, indicating that the output voltage will be
out of regulation. The timing diagram for the power
good output when using the shutdown input is shown in
Figure 4-3.
© 2005 Microchip Technology Inc.
The power good output is an open-drain output that can
be pulled up to any voltage that is equal to or less than
the LDO input voltage. This output is capable of sinking
1.2 mA (VPWRGD < 0.4V maximum).
VPWRGD_TH
VOUT
TPG
VOH
TVDET_PWRGD
PWRGD
VOL
FIGURE 4-2:
VIN
Power Good Timing.
TOR
30 ms
70 ms
TPG
SHDN
VOUT
PWRGD
FIGURE 4-3:
Shutdown.
4.6
Power Good Timing from
CDELAY Input
The CDELAY input is used to provide the power-up
delay timing for the power good output, as discussed in
the previous section. By adding a capacitor from the
CDELAY pin to ground, the PWRGD power-up time
delay can be adjusted from 200 µs (no capacitance on
CDELAY) to 300 ms (0.1 µF of capacitance on CDELAY).
See the Electrical Characteristics table for CDELAY
timing tolerances.
DS21936B-page 15
MCP1726
Once the power good threshold (rising) has been
reached, the CDELAY pin charges the external capacitor
to 1.5V (typical, this level can vary between 1.4V and
1.75V across the input voltage range of the part). The
PWRGD output will transition high when the CDELAY
pin voltage has charged to 0.42V. If the output falls
below the power good threshold limit during the
charging time between 0.0V and 0.42V on the CDELAY
pin, the CDELAY pin voltage will be pulled to ground,
thus resetting the timer. The CDELAY pin will be held low
until the output voltage of the LDO has once again risen
above the power good rising threshold. A timing
diagram showing CDELAY, PWRGD and VOUT is shown
in Figure 4-4.
(turn-on) to the LDO output being in regulation is
typically 100 µs. See Figure 4-5 for a timing diagram of
the SHDN input.
TOR
400 ns (typ)
30 µs
70 µs
SHDN
VOUT
VOUT
FIGURE 4-5:
Diagram.
VPWRGD_TH
1.5V (typ)
TPG
CDELAY
CDELAY Threshold (0.42V)
0V
PWRGD
FIGURE 4-4:
Diagram.
4.7
CDELAY and PWRGD Timing
Shutdown Input (SHDN)
The SHDN input is an active-low input signal that turns
the LDO on and off. The SHDN threshold is a percentage of the input voltage. The typical value of this
shutdown threshold is 30% of VIN, with minimum and
maximum limits over the entire operating temperature
range of 45% and 15%, respectively.
The SHDN input will ignore low-going pulses (pulses
meant to shut down the LDO) that are up to 400 ns in
pulse width. If the shutdown input is pulled low for more
than 400 ns, the LDO will enter Shutdown mode. This
small bit of filtering helps to reject any system noise
spikes on the shutdown input signal.
On the rising edge of the SHDN input, the shutdown circuitry has a 30 µs delay before allowing the LDO output
to turn on. This delay helps to reject any false turn-on
signals or noise on the SHDN input signal. After the
30 µs delay, the LDO output enters its soft-start period
as it rises from 0V to its final regulation value. If the
SHDN input signal is pulled low during the 30 µs delay
period, the timer will be reset and the delay time will
start over again on the next rising edge of the SHDN
input. The total time from the SHDN input going high
DS21936B-page 16
4.8
Shutdown Input Timing
Dropout Voltage and
Undervoltage Lockout
Dropout voltage is defined as the input-to-output
voltage differential at which the output voltage drops
2% below the nominal value that was measured with a
VR + 0.5V differential applied. The MCP1726 LDO has
a very low dropout voltage specification of 220 mV
(typical) at 1A of output current. See the Electrical
Characteristics table for maximum dropout voltage
specifications.
The MCP1726 LDO operates across an input voltage
range of 2.3V to 6.0V and incorporates input Undervoltage Lockout (UVLO) circuitry that keeps the LDO
output voltage off until the input voltage reaches a
minimum of 2.18V (typical) on the rising edge of the
input voltage. As the input voltage falls, the LDO output
will remain on until the input voltage level reaches
2.04V (typical).
Since the MCP1726 LDO undervoltage lockout activates at 2.04V as the input voltage is falling, the dropout voltage specification does not apply for output
voltages that are less than 1.9V.
For high-current applications, voltage drops across the
PCB traces must be taken into account. The trace
resistances can cause significant voltage drops
between the input voltage source and the LDO. For
applications with input voltages near 2.3V, these PCB
trace voltage drops can sometimes lower the input voltage enough to trigger a shutdown due to undervoltage
lockout.
© 2005 Microchip Technology Inc.
MCP1726
4.9
Overtemperature Protection
The MCP1726 LDO has temperature-sensing circuitry
to prevent the junction temperature from exceeding
approximately 150°C. If the LDO junction temperature
does reach 150°C, the LDO output will be turned off
until the junction temperature cools to approximately
140°C, at which point the LDO output will automatically
resume normal operation. If the internal power
dissipation continues to be excessive, the device will
again shut off. The junction temperature of the die is a
function of power dissipation, ambient temperature
and package thermal resistance. See Section 5.0
“Application Circuits/Issues” for more information
on LDO power dissipation and junction temperature.
© 2005 Microchip Technology Inc.
DS21936B-page 17
MCP1726
5.0
APPLICATION
CIRCUITS/ISSUES
5.1
Typical Application
In addition to the LDO pass element power dissipation,
there is power dissipation within the MCP1726 as a
result of quiescent or ground current. The power dissipation as a result of the ground current can be
calculated using the following equation:
The MCP1726 is used for applications that require high
LDO output current and a power good output.
EQUATION 5-2:
P I ( GND ) = VIN ( MAX ) × I VIN
MCP1726-2.5
VIN = 3.3V
VOUT = 2.5V @ 1A
C1
10 µF
1 VIN
VOUT 8
2 VIN
VOUT 7
3 SHDN CDELAY 6
R1
10kΩ
C2
10 µF
4 GND PWRGD 5
On
Off
C3
PI(GND) = Power dissipation due to the
quiescent current of the LDO
VIN(MAX) = Maximum input voltage
IVIN = Current flowing in the VIN pin with
no LDO output current (LDO
quiescent current)
1000 pF
PWRGD
FIGURE 5-1:
5.1.1
Typical Application Circuit.
APPLICATION CONDITIONS
Package Type = 3X3DFN8
Input Voltage Range = 3.3V ± 10%
VIN maximum = 3.63V
VIN minimum = 2.97V
VOUT typical = 2.5V
IOUT = 1.0A maximum
5.2
Power Calculations
5.2.1
POWER DISSIPATION
The internal power dissipation within the MCP1726 is a
function of input voltage, output voltage, output current
and quiescent current. The following equation can be
used to calculate the internal power dissipation for the
LDO.
EQUATION 5-1:
The total power dissipated within the MCP1726 is the
sum of the power dissipated in the LDO pass device
and the P(IGND) term. Because of the CMOS construction, the typical IGND for the MCP1726 is 140 µA.
Operating at a maximum of 3.63V results in a power
dissipation of 0.51 milli-Watts. For most applications,
this is small compared to the LDO pass device power
dissipation and can be neglected.
The maximum continuous operating junction temperature specified for the MCP1726 is +125°C. To estimate
the internal junction temperature of the MCP1726, the
total internal power dissipation is multiplied by the thermal resistance from junction to ambient (RθJA) of the
device. The thermal resistance from junction to ambient for the 3X3DFN package is estimated at 41° C/W.
EQUATION 5-3:
T J ( MAX ) = P TOTAL × Rθ JA + T AMAX
TJ(MAX) = Maximum continuous junction
temperature
PTOTAL = Total device power dissipation
RθJA = Thermal resistance from junction
to ambient
TAMAX = Maximum ambient temperature
P LDO = ( VIN ( MAX ) ) – V OUT ( MIN ) ) × I OUT ( MAX ) )
PLDO = LDO Pass device internal power
dissipation
VIN(MAX)= Maximum input voltage
VOUT(MIN) = LDO minimum output voltage
DS21936B-page 18
© 2005 Microchip Technology Inc.
MCP1726
The maximum power dissipation capability for a
package can be calculated given the junction-toambient thermal resistance and the maximum ambient
temperature for the application. The following equation
can be used to determine the package maximum internal power dissipation.
EQUATION 5-4:
P D ( MAX )
( T J ( MAX ) – T A ( MAX ) )
= --------------------------------------------------Rθ JA
5.3
Typical Application
Internal power dissipation, junction temperature rise,
junction temperature and maximum power dissipation
is calculated in the following example. The power dissipation as a result of ground current is small enough to
be neglected.
5.3.1
POWER DISSIPATION EXAMPLE
Package
Package Type = 3X3DFN
PD(MAX) = Maximum device power
dissipation
Input Voltage
TJ(MAX) = maximum continuous junction
temperature
LDO Output Voltage and Current
TA(MAX) = maximum ambient temperature
RθJA = Thermal resistance from junction
to ambient
VIN = 3.3V ± 10%
VOUT = 2.5V
IOUT = 1.0A
Maximum Ambient Temperature
TA(MAX) = 70°C
EQUATION 5-5:
T J ( RISE ) = P D ( MAX ) × Rθ JA
TJ(RISE) = Rise in device junction
temperature over the ambient
temperature
PD(MAX) = Maximum device power
dissipation
RθJA = Thermal resistance from junction
to ambient
EQUATION 5-6:
T J = T J ( RISE ) + T A
TJ = Junction temperature
TJ(RISE) = Rise in device junction
temperature over the ambient
temperature
TA = Ambient temperature
Internal Power Dissipation
PLDO(MAX) = (VIN(MAX) – VOUT(MIN)) x IOUT(MAX)
PLDO = (3.3V x 1.1) – (0.975 x 2.5V))
x 1.0A
PLDO = 1.192 Watts
Device Junction Temperature Rise
The internal junction temperature rise is a function of
internal power dissipation and the thermal resistance
from junction to ambient for the application. The thermal resistance from junction to ambient (RθJA) is
derived from an EIA/JEDEC standard for measuring
thermal resistance for small surface-mount packages.
The EIA/JEDEC specification is JESD51-7 “High
Effective Thermal Conductivity Test Board for Leaded
Surface-Mount Packages”. The standard describes the
test method and board specifications for measuring the
thermal resistance from junction to ambient. The actual
thermal resistance for a particular application can vary
depending on many factors such as copper area and
thickness. Refer to AN792, “A Method to Determine
How Much Power a SOT23 Can Dissipate in an Application” (DS00792), for more information regarding this
subject.
TJ(RISE) = PTOTAL x RθJA
TJRISE = 1.192 W x 41.0° C/W
TJRISE = 48.8°C
© 2005 Microchip Technology Inc.
DS21936B-page 19
MCP1726
Junction Temperature Estimate
To estimate the internal junction temperature, the
calculated temperature rise is added to the ambient or
offset temperature. For this example, the worst-case
junction temperature is estimated below:
TJ = TJRISE + TA(MAX)
TJ = 48.8°C + 70.0°C
TJ = 118.8°C
As you can see from the result, this application will be
operating very near the maximum operating junction
temperature of 125°C. The PCB layout for this application is very important as it has a significant impact on
the junction-to-ambient thermal resistance (RθJA) of
the 3X3 DFN package, which is very important in this
application.
Maximum Package Power Dissipation at
70°C Ambient Temperature
3X3DFN (41° C/W RθJA)
PD(MAX) = (125°C – 70°C) / 41° C/W
PD(MAX) = 1.34W
SOIC8 (150°C/Watt RθJA)
PD(MAX) = (125°C – 70°C)/ 150° C/W
PD(MAX) = 0.366W
From this table you can see the difference in maximum
allowable power dissipation between the 3X3 DFN
package and the 8-pin SOIC package. This difference
is due to the exposed metal tab on the bottom of the
DFN package. The exposed tab of the DFN package
provides a very good thermal path from the die of the
LDO to the PCB. The PCB then acts like a heatsink,
providing more area to distribute the heat generated by
the LDO.
DS21936B-page 20
© 2005 Microchip Technology Inc.
MCP1726
6.0
PACKAGING INFORMATION
6.1
Package Marking Information
8-Lead DFN (3X3)
XXXX
XYWW
NNN
8-Lead SOIC (150 mil)
XXXXXXXX
XXXXYYWW
NNN
Legend: XX...X
Y
YY
WW
NNN
e3
*
Note:
Example:
Voltage
Option
Code
0.8V
CAAA
1.2V
CAAB
1.8V
CAAC
2.5V
CAAD
3.3V
CAAE
5.0V
CAAF
Adj
AADJ
CAAA
E543
256
Example:
17260802E
3
SN e^^0543
256
Customer-specific information
Year code (last digit of calendar year)
Year code (last 2 digits of calendar year)
Week code (week of January 1 is week ‘01’)
Alphanumeric traceability code
Pb-free JEDEC designator for Matte Tin (Sn)
This package is Pb-free. The Pb-free JEDEC designator ( e3 )
can be found on the outer packaging for this package.
In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
© 2005 Microchip Technology Inc.
DS21936B-page 21
MCP1726
8-Lead Plastic Dual Flat No Lead Package (MF) 3x3x0.9 mm Body (DFN) – Saw Singulated
p
D
b
n
L
EXPOSED
METAL
PAD
E
PIN 1
ID INDEX
AREA
(NOTE 2)
E2
2
1
D2
BOTTOM VIEW
TOP VIEW
ALTERNATE EXPOSED
PAD CONFIGURATIONS
A1 A
A3
EXPOSED
TIE BAR
(NOTE 1)
Units
Dimension Limits
n
p
Number of Pins
Pitch
Overall Height
Standoff
Contact Thickness
Overall Length
Exposed Pad Width
Overall Width
Exposed Pad Length
Contact Width
Contact Length
(Note 3)
(Note 3)
A
A1
A3
E
E2
D
D2
b
L
MIN
INCHES
NOM
MAX
8
.031
.000
.055
.085
.009
.008
.026 BSC
.035
.001
.008 REF.
.118 BSC
.118 BSC
.012
.016
MILLIMETERS*
NOM
8
0.65 BSC
0.80
0.90
0.00
0.02
0.20 REF.
3.00 BSC
1.40
3.00 BSC
2.15
0.30
0.23
0.20
0.40
MIN
.039
.002
.069
.096
.015
.020
MAX
1.00
0.05
1.75
2.45
0.37
0.50
*Controlling Parameter
Notes:
1. Package may have one or more exposed tie bars at ends.
2. Pin 1 visual index feature may vary, but must be located within the hatched area.
3. Exposed pad dimensions vary with paddle size.
4. JEDEC equivalent: MO-229
Drawing No. C04-062
DS21936B-page 22
Revised 03/11/05
© 2005 Microchip Technology Inc.
MCP1726
8-Lead Plastic Small Outline (SN) – Narrow, 150 mil Body (SOIC)
E
E1
p
D
2
B
n
1
h
α
45°
c
A2
A
φ
β
L
Units
Dimension Limits
n
p
Number of Pins
Pitch
Overall Height
Molded Package Thickness
Standoff §
Overall Width
Molded Package Width
Overall Length
Chamfer Distance
Foot Length
Foot Angle
Lead Thickness
Lead Width
Mold Draft Angle Top
Mold Draft Angle Bottom
* Controlling Parameter
§ Significant Characteristic
A
A2
A1
E
E1
D
h
L
φ
c
B
α
β
MIN
.053
.052
.004
.228
.146
.189
.010
.019
0
.008
.013
0
0
A1
INCHES*
NOM
8
.050
.061
.056
.007
.237
.154
.193
.015
.025
4
.009
.017
12
12
MAX
.069
.061
.010
.244
.157
.197
.020
.030
8
.010
.020
15
15
MILLIMETERS
NOM
8
1.27
1.35
1.55
1.32
1.42
0.10
0.18
5.79
6.02
3.71
3.91
4.80
4.90
0.25
0.38
0.48
0.62
0
4
0.20
0.23
0.33
0.42
0
12
0
12
MIN
MAX
1.75
1.55
0.25
6.20
3.99
5.00
0.51
0.76
8
0.25
0.51
15
15
Notes:
Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed
.010” (0.254mm) per side.
JEDEC Equivalent: MS-012
Drawing No. C04-057
© 2005 Microchip Technology Inc.
DS21936B-page 23
MCP1726
NOTES:
DS21936B-page 24
© 2005 Microchip Technology Inc.
MCP1726
APPENDIX A:
REVISION HISTORY
Revision B (March 2005)
• Replaced 3x3 DFN package diagram.
• Emphasized (bolded) a few specifications of
Section 1.0 “Electrical Characteristics” in the
DC Characteristics table.
Revision A (February 2005)
Original Release of this Document.
© 2005 Microchip Technology Inc.
DS21936A-page 25
MCP1726
NOTES:
DS21936A-page 26
© 2005 Microchip Technology Inc.
MCP1726
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.
PART NO.
X
-XXX
Device
Tape &
Reel
Voltage
Output
X
X
Tolerance Temp.
Range
XX
Package
Examples:
a)
b)
c)
Device
MCP1726:1A, Low Quiescent Current LDO Regulator
Tape & Reel
T = Tape and Reel
Blank = Tube
Standard Output
Voltage *
080 = 0.80V
120 = 1.20V
180 = 1.80V
250 = 2.50V
330 = 3.30V
500 = 5.00V
ADJ = Adjustable Voltage Version
d)
e)
f)
g)
MCP1726-0802E/MF: 0.8V, 1A LDO,
8LD DFN Pkg.
MCP1726-1202E/SN: 1.20V, 1A LDO,
8LD SOIC Pkg.
MCP1726T-1802E/MF:Tape and Reel, 1.80V,
1A LDO, 8LD DFN Pkg.
MCP1726-2502E/SN: 2.50V, 1A LDO,
8LD SOIC Pkg.
MCP1726T-3302E/MF:Tape and Reel, 3.30V,
1A LDO, 8LD DFN Pkg.
MCP1726-5002E/SN: 5.00V, 1A LDO,
8LD SOIC Pkg.
MCP1726-ADJE/MF: Adjustable, , 1A LDO,
8LD DFN Pkg.
* Custom output voltages available upon request. Contact
your local Microchip sales office for more information.
Tolerance
2 = 2.0%
Temperature Range
E
Package *
SN = Plastic SOIC, (150 mil Body) 8-Lead
MF = Plastic Dual Flat No Lead, 3x3 mm Body (DFN),
8-Lead
*Both packages are Lead Free.
= -40°C to +125°C
© 2005 Microchip Technology Inc.
DS21936B-page 27
MCP1726
NOTES:
DS21936B-page 28
© 2005 Microchip Technology Inc.
Note the following details of the code protection feature on Microchip devices:
•
Microchip products meet the specification contained in their particular Microchip Data Sheet.
•
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
•
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
•
Microchip is willing to work with the customer who is concerned about the integrity of their code.
•
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Information contained in this publication regarding device
applications and the like is provided only for your convenience
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED,
WRITTEN OR ORAL, STATUTORY OR OTHERWISE,
RELATED TO THE INFORMATION, INCLUDING BUT NOT
LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE,
MERCHANTABILITY OR FITNESS FOR PURPOSE.
Microchip disclaims all liability arising from this information and
its use. Use of Microchip’s products as critical components in
life support systems is not authorized except with express
written approval by Microchip. No licenses are conveyed,
implicitly or otherwise, under any Microchip intellectual property
rights.
Trademarks
The Microchip name and logo, the Microchip logo, Accuron,
dsPIC, KEELOQ, microID, MPLAB, PIC, PICmicro, PICSTART,
PRO MATE, PowerSmart, rfPIC, and SmartShunt are
registered trademarks of Microchip Technology Incorporated
in the U.S.A. and other countries.
AmpLab, FilterLab, Migratable Memory, MXDEV, MXLAB,
PICMASTER, SEEVAL, SmartSensor and The Embedded
Control Solutions Company are registered trademarks of
Microchip Technology Incorporated in the U.S.A.
Analog-for-the-Digital Age, Application Maestro, dsPICDEM,
dsPICDEM.net, dsPICworks, ECAN, ECONOMONITOR,
FanSense, FlexROM, fuzzyLAB, In-Circuit Serial
Programming, ICSP, ICEPIC, MPASM, MPLIB, MPLINK,
MPSIM, PICkit, PICDEM, PICDEM.net, PICLAB, PICtail,
PowerCal, PowerInfo, PowerMate, PowerTool, rfLAB,
rfPICDEM, Select Mode, Smart Serial, SmartTel and Total
Endurance are trademarks of Microchip Technology
Incorporated in the U.S.A. and other countries.
SQTP is a service mark of Microchip Technology Incorporated
in the U.S.A.
All other trademarks mentioned herein are property of their
respective companies.
© 2005, Microchip Technology Incorporated, Printed in the
U.S.A., All Rights Reserved.
Printed on recycled paper.
Microchip received ISO/TS-16949:2002 quality system certification for
its worldwide headquarters, design and wafer fabrication facilities in
Chandler and Tempe, Arizona and Mountain View, California in
October 2003. The Company’s quality system processes and
procedures are for its PICmicro® 8-bit MCUs, KEELOQ® code hopping
devices, Serial EEPROMs, microperipherals, nonvolatile memory and
analog products. In addition, Microchip’s quality system for the design
and manufacture of development systems is ISO 9001:2000 certified.
© 2005 Microchip Technology Inc.
DS21936B-page 29
WORLDWIDE SALES AND SERVICE
AMERICAS
ASIA/PACIFIC
ASIA/PACIFIC
EUROPE
Corporate Office
2355 West Chandler Blvd.
Chandler, AZ 85224-6199
Tel: 480-792-7200
Fax: 480-792-7277
Technical Support:
http://support.microchip.com
Web Address:
www.microchip.com
Australia - Sydney
Tel: 61-2-9868-6733
Fax: 61-2-9868-6755
India - Bangalore
Tel: 91-80-2229-0061
Fax: 91-80-2229-0062
China - Beijing
Tel: 86-10-8528-2100
Fax: 86-10-8528-2104
India - New Delhi
Tel: 91-11-5160-8631
Fax: 91-11-5160-8632
Austria - Weis
Tel: 43-7242-2244-399
Fax: 43-7242-2244-393
Denmark - Ballerup
Tel: 45-4450-2828
Fax: 45-4485-2829
China - Chengdu
Tel: 86-28-8676-6200
Fax: 86-28-8676-6599
Japan - Kanagawa
Tel: 81-45-471- 6166
Fax: 81-45-471-6122
France - Massy
Tel: 33-1-69-53-63-20
Fax: 33-1-69-30-90-79
China - Fuzhou
Tel: 86-591-8750-3506
Fax: 86-591-8750-3521
Korea - Seoul
Tel: 82-2-554-7200
Fax: 82-2-558-5932 or
82-2-558-5934
Germany - Ismaning
Tel: 49-89-627-144-0
Fax: 49-89-627-144-44
Atlanta
Alpharetta, GA
Tel: 770-640-0034
Fax: 770-640-0307
Boston
Westborough, MA
Tel: 774-760-0087
Fax: 774-760-0088
Chicago
Itasca, IL
Tel: 630-285-0071
Fax: 630-285-0075
Dallas
Addison, TX
Tel: 972-818-7423
Fax: 972-818-2924
Detroit
Farmington Hills, MI
Tel: 248-538-2250
Fax: 248-538-2260
Kokomo
Kokomo, IN
Tel: 765-864-8360
Fax: 765-864-8387
China - Hong Kong SAR
Tel: 852-2401-1200
Fax: 852-2401-3431
China - Shanghai
Tel: 86-21-5407-5533
Fax: 86-21-5407-5066
China - Shenyang
Tel: 86-24-2334-2829
Fax: 86-24-2334-2393
China - Shenzhen
Tel: 86-755-8203-2660
Fax: 86-755-8203-1760
China - Shunde
Tel: 86-757-2839-5507
Fax: 86-757-2839-5571
Singapore
Tel: 65-6334-8870
Fax: 65-6334-8850
Taiwan - Kaohsiung
Tel: 886-7-536-4818
Fax: 886-7-536-4803
Taiwan - Taipei
Tel: 886-2-2500-6610
Fax: 886-2-2508-0102
Italy - Milan
Tel: 39-0331-742611
Fax: 39-0331-466781
Netherlands - Drunen
Tel: 31-416-690399
Fax: 31-416-690340
England - Berkshire
Tel: 44-118-921-5869
Fax: 44-118-921-5820
Taiwan - Hsinchu
Tel: 886-3-572-9526
Fax: 886-3-572-6459
China - Qingdao
Tel: 86-532-502-7355
Fax: 86-532-502-7205
Los Angeles
Mission Viejo, CA
Tel: 949-462-9523
Fax: 949-462-9608
San Jose
Mountain View, CA
Tel: 650-215-1444
Fax: 650-961-0286
Toronto
Mississauga, Ontario,
Canada
Tel: 905-673-0699
Fax: 905-673-6509
03/01/05
DS21936B-page 30
© 2005 Microchip Technology Inc.