MX25L8073E MX25L8073E HIGH PERFORMANCE SERIAL FLASH SPECIFICATION P/N: PM1911 1 REV. 1.0, JAN. 18, 2013 MX25L8073E Contents 1. FEATURES......................................................................................................................................................... 4 2. GENERAL DESCRIPTION................................................................................................................................ 6 Table 1. Additional Feature......................................................................................................................6 3. PIN CONFIGURATION....................................................................................................................................... 7 4. PIN DESCRIPTION............................................................................................................................................. 7 5. BLOCK DIAGRAM.............................................................................................................................................. 8 6. DATA PROTECTION........................................................................................................................................... 9 Table 2. Protected Area Sizes...............................................................................................................10 Table 3. 4K-bit Secured OTP Definition................................................................................................10 7. MEMORY ORGANIZATION...............................................................................................................................11 Table 4. Memory Organization.............................................................................................................. 11 8. DEVICE OPERATION....................................................................................................................................... 12 9. COMMAND DESCRIPTION.............................................................................................................................. 13 Table 5. Command Sets........................................................................................................................13 9-1. Write Enable (WREN)...........................................................................................................................15 9-2. Write Disable (WRDI)............................................................................................................................16 9-3. Read Identification (RDID)....................................................................................................................17 9-4. Read Status Register (RDSR)..............................................................................................................18 9-5. Write Status Register (WRSR)..............................................................................................................20 Table 6. Protection Modes.....................................................................................................................21 9-6. Read Data Bytes (READ).....................................................................................................................23 9-7. Read Data Bytes at Higher Speed (FAST_READ)...............................................................................24 9-8. Dual Read Mode (DREAD)...................................................................................................................25 9-9. 2 x I/O Read Mode (2READ)................................................................................................................26 9-10. Quad Read Mode (QREAD).................................................................................................................27 9-11. 4 x I/O Read Mode (4READ)................................................................................................................28 9-12. Performance Enhance Mode................................................................................................................29 9-13. Performance Enhance Mode Reset (FFh)............................................................................................31 9-14. Sector Erase (SE).................................................................................................................................32 9-15. Block Erase (BE)..................................................................................................................................33 9-16. Chip Erase (CE)....................................................................................................................................34 9-17. Page Program (PP)..............................................................................................................................35 9-18. 4 x I/O Page Program (4PP).................................................................................................................36 9-19. Deep Power-down (DP)........................................................................................................................37 9-20. Release from Deep Power-down (RDP), Read Electronic Signature (RES)........................................38 9-21. Read Electronic Manufacturer ID & Device ID (REMS), (REMS2), (REMS4)......................................40 9-22. ID Read.................................................................................................................................................41 Table 7. ID Definitions ..........................................................................................................................41 9-23. Enter Secured OTP (ENSO).................................................................................................................41 9-24. Exit Secured OTP (EXSO)....................................................................................................................41 9-25. Read Security Register (RDSCUR)......................................................................................................42 Table 8. Security Register Definition.....................................................................................................42 9-26. Write Security Register (WRSCUR)......................................................................................................43 9-27. Read SFDP Mode (RDSFDP)...............................................................................................................44 Table 9. Signature and Parameter Identification Data Values ..............................................................45 P/N: PM1911 2 REV. 1.0, JAN. 18, 2013 MX25L8073E Table 10. Parameter Table (0): JEDEC Flash Parameter Tables..........................................................46 Table 11. Parameter Table (1): Macronix Flash Parameter Tables........................................................48 10. POWER-ON STATE........................................................................................................................................ 50 11. ELECTRICAL SPECIFICATIONS................................................................................................................... 51 11-1. Absolute Maximum Ratings..................................................................................................................51 11-2.Capacitance..........................................................................................................................................51 Table 12. DC Characteristics.................................................................................................................53 Table 13. AC Characteristics.................................................................................................................54 12. TIMING ANALYSIS......................................................................................................................................... 55 Table 14. Power-Up Timing ..................................................................................................................56 12-1. Initial Delivery State..............................................................................................................................56 13. OPERATING CONDITIONS............................................................................................................................ 57 14. ERASE AND PROGRAMMING PERFORMANCE......................................................................................... 59 15. DATA RETENTION......................................................................................................................................... 59 16. LATCH-UP CHARACTERISTICS................................................................................................................... 59 17. ORDERING INFORMATION........................................................................................................................... 60 18. PART NAME DESCRIPTION.......................................................................................................................... 61 19. REVISION HISTORY ...................................................................................................................................... 63 P/N: PM1911 3 REV. 1.0, JAN. 18, 2013 MX25L8073E 8M-BIT [x 1/x 2/x 4] CMOS MXSMIO® (SERIAL MULTI I/O) FLASH MEMORY 1. FEATURES GENERAL • Serial Peripheral Interface compatible -- Mode 0 and Mode 3 • 8M:8,388,608 x 1 bit structure or 4,194,304 x 2 bits (two I/O read mode) structure or 2,097,152 x 4 bits (four I/O read mode) structure • 256 Equal Sectors with 4K byte each - Any Sector can be erased individually • 16 Equal Blocks with 64K byte each - Any Block can be erased individually • Single Power Supply Operation - 2.7 to 3.6 volt for read, erase, and program operations • Latch-up protected to 100mA from -1V to Vcc +1V • Permanent fixed QE bit, QE =1 and 4 I/O mode is enabled PERFORMANCE • High Performance VCC = 2.7~3.6V - Normal read - 50MHz - Fast read - 1 I/O: 108MHz with 8 dummy cycles - 2 I/O: 80MHz (2.7V~3.6V) ; 104MHz (3.0V~3.6V) with 4 dummy cycles - 4 I/O: 108MHz with 6 dummy cycles - Fast program time: 0.7ms(typ.) and 3ms(max.)/page (256-byte per page) - Byte program time: 9us (typical) - Fast erase time: 60ms (typ.)/sector (4K-byte per sector) ; 0.4s(typ.) /block (64K-byte per block); 3s(typ.) /chip • Low Power Consumption - Low active read current: 25mA(max.) at 108MHz, and 10mA(max.) at 50MHz - Low active programming current: 20mA (max.) - Low active erase current: 20mA (max.) - Low standby current: 20uA (typ.) ; 50uA (max.) - Deep power-down current: 3uA (typ.) ; 20uA (max.) • Minimum 100,000 erase/program cycles • 20 years data retention P/N: PM1911 4 REV. 1.0, JAN. 18, 2013 MX25L8073E SOFTWARE FEATURES • Input Data Format - 1-byte Command code • Advanced Security Features - Block lock protection The BP0-BP3 status bit defines the size of the area to be software protection against program and erase instructions - Additional 4K-bit secured OTP for unique identifier • Auto Erase and Auto Program Algorithm - Automatically erases and verifies data at selected sector - Automatically programs and verifies data at selected page by an internal algorithm that automatically times the program pulse widths (Any page to be programed should have page in the erased state first) • Status Register Feature • Electronic Identification - JEDEC 1-byte manufacturer ID and 2-byte device ID - RES command for 1-byte Device ID - All REMS,REMS2 and REMS4 commands for 1-byte manufacturer ID and 1-byte device ID • Support Serial Flash Discoverable Parameters (SFDP) mode HARDWARE FEATURES • SCLK Input - Serial clock input • SI/SIO0 - Serial Data Input or Serial Data Input/Output for 2 x I/O read mode and 4 x I/O read mode • SO/SIO1 - Serial Data Output or Serial Data Input/Output for 2 x I/O read mode and 4 x I/O read mode • SIO2 - Serial data Input/Output for 4 x I/O read mode • SIO3 - Serial data Input/Output for 4 x I/O read mode • PACKAGE - 8-pin SOP (200mil) - All devices are RoHS Compliant P/N: PM1911 5 REV. 1.0, JAN. 18, 2013 MX25L8073E 2. GENERAL DESCRIPTION The MX25L8073E are 8,388,608 bit serial Flash memory, which is configured as 1,048,576 x 8 internally. When it is in two or four I/O read mode, the structure becomes 4,194,304 bits x 2 or 2,097,152 bits x 4. The MX25L8073E feature a serial peripheral interface and software protocol allowing operation on a simple 3-wire bus. The three bus signals are a clock input (SCLK), a serial data input (SI), and a serial data output (SO). Serial access to the device is enabled by CS# input. When it is in two I/O read mode, the SI pin and SO pin become SIO0 pin and SIO1 pin for address/dummy bits input and data output. When it is in four I/O read mode, the SI pin, SO pin become SIO0 pin and SIO1 pin, SIO2 pin and SIO3 pin for address/dummy bits input and data Input/Output. The MX25L8073E provides sequential read operation on whole chip. After program/erase command is issued, auto program/erase algorithms which program/erase and verify the specified page or sector/block locations will be executed. Program command is executed on byte basis, or page (256 bytes) basis, and erase command is executes on sector (4K-byte), or block (64K-byte), or whole chip basis. To provide user with ease of interface, a status register is included to indicate the status of the chip. The status read command can be issued to detect completion status of a program or erase operation via WIP bit. Secured OTP and Block Protection, please see security feature and write status register section for more details. When the device is not in operation and CS# is high, it is put in standby mode and draws less than 100uA DC current. The MX25L8073E utilizes Macronix's proprietary memory cell, which reliably stores memory contents even after 100,000 program and erase cycles. Table 1. Additional Feature Additional Features Part Name MX25L8073E P/N: PM1911 Protection and Security Read Performance Flexible Block Protection (BP0-BP3) 4K-bit secured OTP 2 I/O Read 4 I/O Read V V V V Identifier RES REMS REMS2 REMS4 RDID (command: (command: (command: (command: (command: AB hex) 90 hex) EF hex) DF hex) 9F hex) 13 (hex) 6 C2 13 (hex) C2 13 (hex) C2 13 (hex) (if ADD=0) (if ADD=0) (if ADD=0) C2 20 14 (hex) REV. 1.0, JAN. 18, 2013 MX25L8073E 3. PIN CONFIGURATION 4. PIN DESCRIPTION 8-PIN SOP (200mil) CS# SO/SIO1 SIO2 GND 1 2 3 4 SYMBOL CS# 8 7 6 5 VCC SIO3 SCLK SI/SIO0 SI/SIO0 SO/SIO1 SCLK SIO2 SIO3 VCC GND P/N: PM1911 7 DESCRIPTION Chip Select Serial Data Input (for 1 x I/O) / Serial Data Input & Output (for or 4xI/O read mode) Serial Data Output (for 1 x I/O) Serial Data Input & Output (for or 4xI/O read mode) Clock Input Serial Data Input & Output (for read mode) Serial Data Input & Output (for read mode) + 3.3V Power Supply Ground 2xI/O 2xI/O 4xI/O 4xI/O REV. 1.0, JAN. 18, 2013 MX25L8073E 5. BLOCK DIAGRAM X-Decoder Address Generator Memory Array Page Buffer SI/SIO0 Data Register Y-Decoder SRAM Buffer CS# SIO2 SIO3 SCLK Mode Logic State Machine HV Generator Clock Generator Output Buffer SO/SIO1 P/N: PM1911 Sense Amplifier 8 REV. 1.0, JAN. 18, 2013 MX25L8073E 6. DATA PROTECTION During power transition, there may be some false system level signals which result in inadvertent erasure or programming. The device is designed to protect itself from these accidental write cycles. The state machine will be reset as standby mode automatically during power up. In addition, the control register architecture of the device constrains that the memory contents can only be changed after specific command sequences have completed successfully. In the following, there are several features to protect the system from the accidental write cycles during VCC powerup and power-down or from system noise. • Valid command length checking: The command length will be checked whether it is at byte base and completed on byte boundary. • Write Enable (WREN) command: WREN command is required to set the Write Enable Latch bit (WEL) before other command to change data. The WEL bit will return to reset stage under following situation: - Power-up - Write Disable (WRDI) command completion - Write Status Register (WRSR) command completion - Page Program (PP) command completion - Page Program (4PP) command completion - Sector Erase (SE) command completion - Block Erase (BE) command completion - Chip Erase (CE) command completion • Deep Power Down Mode: By entering deep power down mode, the flash device also is under protected from writing all commands except Release from deep power down mode command (RDP) and Read Electronic Signature command (RES). • Advanced Security Features: there are some protection and security features which protect content from inadvertent write and hostile access. I. Block lock protection - The Software Protected Mode (SPM) use (BP3, BP2, BP1, BP0) bits to allow part of memory to be protected as read only. The protected area definition is shown as table of "Protected Area Sizes", the protected areas are more flexible which may protect various area by setting value of BP0-BP3 bits. Please refer to table of "protected area sizes". P/N: PM1911 9 REV. 1.0, JAN. 18, 2013 MX25L8073E Table 2. Protected Area Sizes Status bit BP3 BP2 BP1 0 0 0 0 0 0 0 0 1 0 0 1 0 1 0 0 1 0 0 1 1 0 1 1 1 0 0 1 0 0 1 0 1 1 0 1 1 1 0 1 1 0 1 1 1 1 1 1 BP0 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 Protect Level 8Mb 0 (none) 1 (1block, 1/16 area, block#15) 2 (2blocks, 1/8 area, block#14-15) 3 (4blocks, 1/4 area, block#12-15) 4 (8blocks, 1/2 area, block#8-15) 5 (16blocks, all) 6 (16blocks, all) 7 (16blocks, all) 8 (16blocks, all) 9 (16blocks, all) 10 (16blocks, all) 11 (8blocks, 1/2 area, block#0-7) 12 (12blocks, 3/4 area, block#0-11) 13 (14blocks, 7/8 area, block#0-13) 14 (15block, 15/16 area, block#0-14) 15 (16blocks, all) II. Additional 4K-bit secured OTP for unique identifier: to provide 4K-bit One-Time Program area for setting device unique serial number - Which may be set by factory or system maker. Please refer to Table 3. 4K-bit Secured OTP Definition. - Security register bit 0 indicates whether the chip is locked by factory or not. - To program the 4K-bit secured OTP by entering 4K-bit secured OTP mode (with ENSO command), and going through normal program procedure, and then exiting 4K-bit secured OTP mode by writing EXSO command. - Customer may lock-down the customer lockable secured OTP by writing WRSCUR(write security register) command to set customer lock-down bit1 as "1". Please refer to table of "Security Register Definition" for security register bit definition and table of "4K-bit Secured OTP Definition" for address range definition. - Note: Once lock-down whatever by factory or customer, it cannot be changed any more. While in 4K-bit Secured OTP mode, array access is not allowed. Table 3. 4K-bit Secured OTP Definition Address range Size Standard Factory Lock xxx000~xxx00F 128-bit ESN (electrical serial number) xxx010~xxx1FF 3968-bit N/A P/N: PM1911 10 Customer Lock Determined by customer REV. 1.0, JAN. 18, 2013 MX25L8073E 7. MEMORY ORGANIZATION Table 4. Memory Organization Block 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 P/N: PM1911 Sector 255 : 240 239 : 224 223 : 208 207 : 192 191 : 176 175 : 160 159 : 144 143 : 128 127 : 112 111 : 96 95 : 80 79 : 64 63 : 48 47 : 32 31 : 16 15 : 2 1 0 Address Range 0FF000h 0FFFFFh : : 0F0000h 0F0FFFh 0EF000h 0EFFFFh : : 0E0000h 0E0FFFh 0DF000h 0DFFFFh : : 0D0000h 0D0FFFh 0CF000h 0CFFFFh : : 0C0000h 0C0FFFh 0BF000h 0BFFFFh : : 0B0000h 0B0FFFh 0AF000h 0AFFFFh : : 0A0000h 0A0FFFh 09F000h 09FFFFh : : 090000h 090FFFh 08F000h 08FFFFh : : 080000h 080FFFh 07F000h 07FFFFh : : 070000h 070FFFh 06F000h 06FFFFh : : 060000h 060FFFh 05F000h 05FFFFh : : 050000h 050FFFh 04F000h 04FFFFh : : 040000h 040FFFh 03F000h 03FFFFh : : 030000h 030FFFh 02F000h 02FFFFh : : 020000h 020FFFh 01F000h 01FFFFh : : 010000h 010FFFh 00F000h 00FFFFh : : 002000h 002FFFh 001000h 001FFFh 000000h 000FFFh 11 REV. 1.0, JAN. 18, 2013 MX25L8073E 8. DEVICE OPERATION 1. Before a command is issued, status register should be checked to ensure device is ready for the intended operation. 2. When incorrect command is inputted to this LSI, this LSI becomes standby mode and keeps the standby mode until next CS# falling edge. In standby mode, SO pin of this LSI should be High-Z. 3. When correct command is inputted to this LSI, this LSI becomes active mode and keeps the active mode until next CS# rising edge. 4. For standard single data rate serial mode, input data is latched on the rising edge of Serial Clock(SCLK) and data shifts out on the falling edge of SCLK. The difference of Serial mode 0 and mode 3 is shown as "Figure 1. Serial Modes Supported (for Normal Serial mode)" . 5.For the following instructions: RDID, RDSR, RDSCUR, READ, FAST_READ, RDSFDP, 2READ, DREAD, 4READ, QREAD, RES, REMS, REMS2 and REMS4 the shifted-in instruction sequence is followed by a dataout sequence. After any bit of data being shifted out, the CS# can be high. For the following instructions: WREN, WRDI, WRSR, SE, BE, CE, PP, 4PP, CP, RDP, DP, ENSO, EXSO, and WRSCUR, the CS# must go high exactly at the byte boundary; otherwise, the instruction will be rejected and not executed. 6. During the progress of Write Status Register, Program, Erase operation, to access the memory array is neglected and not affect the current operation of Write Status Register, Program, Erase. Figure 1. Serial Modes Supported (for Normal Serial mode) CPOL CPHA shift in (Serial mode 0) 0 0 SCLK (Serial mode 3) 1 1 SCLK SI shift out MSB SO MSB Note: CPOL indicates clock polarity of Serial master, -CPOL=1 for SCLK high while idle, -CPOL=0 for SCLK low while not transmitting. CPHA indicates clock phase. The combination of CPOL bit and CPHA bit decides which Serial mode is supported. P/N: PM1911 12 REV. 1.0, JAN. 18, 2013 MX25L8073E 9. COMMAND DESCRIPTION Table 5. Command Sets Read Commands Command (byte) READ (read data) 1st byte 03 (hex) AD1 (A23-A16) AD2 (A15-A8) AD3 (A7-A0) 2nd byte 3rd byte 4th byte 5th byte Action P/N: PM1911 n bytes read out until CS# goes high DREAD QREAD FAST READ RDSFDP 2READ (2 x I/O 4READ (4 x I/O (1I / 2O read (1I / 4O read (fast read data) (Read SFDP) read command) read command) command) command) 0B (hex) 5A (hex) BB (hex) 3B (hex) EB (hex) 6B (hex) AD1 AD1 ADD AD1 ADD & Dummy AD1 AD2 AD2 ADD & Dummy AD2 Dummy AD2 AD3 AD3 Dummy n bytes read out until CS# goes high Dummy Read SFDP mode AD3 n bytes read out by 2 x I/O until CS# goes high 13 Dummy AD3 n bytes read out by 4 x I/O until CS# goes high Dummy REV. 1.0, JAN. 18, 2013 MX25L8073E Other Commands Command (byte) WREN (write enable) WRDI (write disable) 1st byte 06 (hex) 04 (hex) RDID RDSR (read WRSR (write 4PP (quad (read identificstatus register) status register) page program) ation) 9F (hex) 05 (hex) 2nd byte 01 (hex) 38 (hex) 20 (hex) Values AD1 AD1 3rd byte AD2 4th byte Action SE (sector erase) sets the (WEL) resets the outputs JEDEC to read out the to write new write enable (WEL) write ID: 1-byte values of the values of the latch bit enable latch bit Manufact-urer status register status register ID & 2-byte Device ID AD3 quad input to to erase the program the selected sector selected page Command (byte) BE (block erase) CE (chip erase) PP (page program) DP (Deep power down) RDP (Release from deep power down) RES (read electronic ID) 1st byte D8 (hex) 60 or C7 (hex) 02 (hex) B9 (hex) AB (hex) AB (hex) FFh (hex) 2nd byte AD1 AD1 x x 3rd byte AD2 AD2 x x x to read out 1-byte Device ID x All these commands FFh, 00h, AAh or 55h will escape the performance enhance mode 4th byte AD3 AD3 to erase the to erase whole to program the selected block chip selected page enters deep power down mode release from deep power down mode REMS4 (read ID for 4x I/O mode) ENSO (enter secured OTP) EXSO (exit secured OTP) RDSCUR (read security register) WRSCUR (write security register) DF (hex) B1 (hex) C1 (hex) 2B (hex) 2F (hex) Action REMS (read REMS2 (read Command electronic ID for 2x I/O (byte) manufacturer & mode) device ID) 1st byte 90 (hex) EF (hex) 2nd byte x X x 3rd byte x X x 4th byte Action Release Read Enhanced ADD (Note3) ADD (Note3) ADD (Note3) output the output the output the to enter the to exit the 512- to read value of to set the lockManufacturer Manufacturer Manufacturer 512-bit secured bit secured security register down bit as ID & Device ID ID & Device ID ID & Device ID OTP mode OTP mode "1" (once lockdown, cannot be update) Note 3: ADD=00H will output the manufacturer ID first and ADD=01H will output device ID first. Note 4: It is not recommended to adopt any other code not in the command definition table, which will potentially enter the hidden mode. P/N: PM1911 14 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-1. Write Enable (WREN) The Write Enable (WREN) instruction is for setting Write Enable Latch (WEL) bit. For those instructions like PP, 4PP, SE, BE, CE, and WRSR, which are intended to change the device content, should be set every time after the WREN instruction setting the WEL bit. The sequence of issuing WREN instruction is: CS# goes low→ sending WREN instruction code→ CS# goes high. The SIO[3:1] are don't care in this mode. Figure 2. Write Enable (WREN) Sequence (Command 06) CS# 0 1 2 3 4 5 6 7 SCLK Command SI SO P/N: PM1911 06 High-Z 15 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-2. Write Disable (WRDI) The Write Disable (WRDI) instruction is for resetting Write Enable Latch (WEL) bit. The sequence of issuing WRDI instruction is: CS# goes low→ sending WRDI instruction code→ CS# goes high. The WEL bit is reset by following situations: - Power-up - Write Disable (WRDI) instruction completion - Write Status Register (WRSR) instruction completion - Page Program (PP, 4PP) instruction completion - Sector Erase (SE) instruction completion - Block Erase (BE) instruction completion - Chip Erase (CE) instruction completion Figure 3. Write Disable (WRDI) Sequence (Command 04) CS# 0 1 2 3 4 5 6 7 SCLK Command SI SO P/N: PM1911 04 High-Z 16 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-3. Read Identification (RDID) The RDID instruction is for reading the Manufacturer ID of 1-byte and followed by Device ID of 2-byte. The MXIC Manufacturer ID is C2(hex), the memory type ID is as the first-byte Device ID, and the individual Device ID of second-byte ID are listed as table of "Table 7. ID Definitions". The sequence of issuing RDID instruction is: CS# goes low→ sending RDID instruction code → 24-bits ID data out on SO→ to end RDID operation can use CS# to high at any time during data out. While Program/Erase operation is in progress, it will not decode the RDID instruction, so there's no effect on the cycle of program/erase operation which is currently in progress. When CS# goes high, the device is at standby stage. Figure 4. Read Identification (RDID) Sequence (Command 9F) CS# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 28 29 30 31 SCLK Command SI 9F Manufacturer Identification SO High-Z 7 6 5 3 MSB P/N: PM1911 2 1 Device Identification 0 15 14 13 3 2 1 0 MSB 17 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-4. Read Status Register (RDSR) The RDSR instruction is for reading Status Register. The Read Status Register can be read at any time (even in program/erase/write status register condition) and continuously. It is recommended to check the Write in Progress (WIP) bit before sending a new instruction when a program, erase, or write status register operation is in progress. The sequence of issuing RDSR instruction is: CS# goes low→ sending RDSR instruction code→ Status Register data out on SO. Figure 5. Read Status Register (RDSR) Sequence (Command 05) CS# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 SCLK command 05 SI SO High-Z Status Register Out 7 6 5 4 2 1 0 7 6 5 4 3 2 1 0 7 MSB MSB P/N: PM1911 3 Status Register Out 18 REV. 1.0, JAN. 18, 2013 MX25L8073E The definition of the status register bits is as below: WIP bit. The Write in Progress (WIP) bit, a volatile bit, indicates whether the device is busy in program/erase/write status register progress. When WIP bit sets to 1, which means the device is busy in program/erase/write status register progress. When WIP bit sets to 0, which means the device is not in progress of program/erase/write status register cycle. WEL bit. The Write Enable Latch (WEL) bit, a volatile bit, indicates whether the device is set to internal write enable latch. When WEL bit sets to "1", which means the internal write enable latch is set, the device can accept program/ erase/write status register instruction. When WEL bit sets to 0, which means no internal write enable latch; the device will not accept program/erase/write status register instruction. The program/erase command will be ignored and will reset WEL bit if it is applied to a protected memory area. To ensure both WIP bit & WEL bit are both set to 0 and available for next program/erase/operations, WIP bit needs to be confirm to be 0 before polling WEL bit. After WIP bit confirmed, WEL bit needs to be confirm to be 0. BP3, BP2, BP1, BP0 bits. The Block Protect (BP3, BP2, BP1, BP0) bits, non-volatile bits, indicate the protected area (as defined in "Table 2. Protected Area Sizes") of the device to against the program/erase instruction without hardware protection mode being set. To write the Block Protect (BP3, BP2, BP1, BP0) bits requires the Write Status Register (WRSR) instruction to be executed. Those bits define the protected area of the memory to against Page Program (PP), Sector Erase (SE), Block Erase (BE) and Chip Erase (CE) instructions (only if all Block Protect bits set to 0, the CE instruction can be executed). The BP3, BP2, BP1, BP0 bits are "0" as default. Which is un-protected. QE bit. The Quad Enable (QE) bit, a non-volatile bit which is permanently set to "1". The flash always performs Quad I/O mode. SRWD bit. The Status Register Write Disable (SRWD) bit, non-volatile bit, default value is "0". Status Register bit7 bit6 SRWD (status register write protect) QE (Quad Enable) 1=status register write disable 1= Quad 0=status Enable register write enable Non-volatile bit bit5 BP3 (level of protected block) bit4 BP2 (level of protected block) bit3 BP1 (level of protected block) bit2 BP0 (level of protected block) (Note) (Note) (Note) (Note) Non-volatile bit Non-volatile bit Non-volatile bit Non-volatile bit bit1 bit0 WEL WIP (write enable (write in latch) progress bit) 1=write 1=write enable operation 0=not write 0=not in write enable operation volatile bit volatile bit Note: See the "Table 2. Protected Area Sizes". P/N: PM1911 19 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-5. Write Status Register (WRSR) The WRSR instruction is for changing the values of Status Register Bits and Configuration Register Bits. Before sending WRSR instruction, the Write Enable (WREN) instruction must be decoded and executed to set the Write Enable Latch (WEL) bit in advance. The WRSR instruction can change the value of Block Protect (BP3, BP2, BP1, BP0) bits to define the protected area of memory (as shown in "Table 2. Protected Area Sizes"). The WRSR can reset the Status Register Write Disable (SRWD) bit, but has no effect on bit1 (WEL) and bit0 (WIP) of the status register. The sequence of issuing WRSR instruction is: CS# goes low→ sending WRSR instruction code→ Status Register data on SI→ CS# goes high. Figure 6. Write Status Register (WRSR) Sequence (Command 01) CS# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 SCLK command SI SO P/N: PM1911 Status Register In 01 7 6 5 4 3 2 1 0 MSB High-Z 20 REV. 1.0, JAN. 18, 2013 MX25L8073E The CS# must go high exactly at the byte boundary; otherwise, the instruction will be rejected and not executed. The self-timed Write Status Register cycle time (tW) is initiated as soon as Chip Select (CS#) goes high. The Write in Progress (WIP) bit still can be checked out during the Write Status Register cycle is in progress. The WIP sets 1 during the tW timing, and sets 0 when Write Status Register Cycle is completed, and the Write Enable Latch (WEL) bit is reset. Table 6. Protection Modes Mode Software protection mode (SPM) Status register condition SRWD bit status Memory Status register can be written in (WEL bit is set to "1") and the SRWD, BP0-BP3 bits can be changed SRWD bit=0 The protected area cannot be programmed or erased. Note: As defined by the values in the Block Protect (BP3, BP2, BP1, BP0) bits of the Status Register, as shown in "Table 2. Protected Area Sizes". Software Protected Mode (SPM): - When SRWD bit=0, the WREN instruction may set the WEL bit and can change the values of SRWD, BP3, BP2, BP1, BP0. The protected area, which is defined by BP3, BP2, BP1, BP0, is at software protected mode (SPM). P/N: PM1911 21 REV. 1.0, JAN. 18, 2013 MX25L8073E Figure 7. WRSR flow start WREN command RDSR command WEL=1? No Yes WRSR command Write status register data RDSR command WIP=0? No Yes RDSR command Read WEL=0, BP[3:0], QE, and SRWD data Verify OK? No Yes WRSR successfully P/N: PM1911 WRSR fail 22 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-6. Read Data Bytes (READ) The read instruction is for reading data out. The address is latched on rising edge of SCLK, and data shifts out on the falling edge of SCLK at a maximum frequency fR. The first address byte can be at any location. The address is automatically increased to the next higher address after each byte data is shifted out, so the whole memory can be read out at a single READ instruction. The address counter rolls over to 0 when the highest address has been reached. The sequence of issuing READ instruction is: CS# goes low→ sending READ instruction code→3-byte address on SI →data out on SO→ to end READ operation can use CS# to high at any time during data out. Figure 8. Read Data Bytes (READ) Sequence (Command 03) CS# 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39 SCLK command SI 03 24-Bit Address 23 22 21 3 2 1 0 MSB SO Data Out 1 High-Z 7 6 5 4 3 2 Data Out 2 1 0 7 MSB P/N: PM1911 23 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-7. Read Data Bytes at Higher Speed (FAST_READ) The FAST_READ instruction is for quickly reading data out. The address is latched on rising edge of SCLK, and data of each bit shifts out on the falling edge of SCLK at a maximum frequency fC. The first address byte can be at any location. The address is automatically increased to the next higher address after each byte data is shifted out, so the whole memory can be read out at a single FAST_READ instruction. The address counter rolls over to 0 when the highest address has been reached. The sequence of issuing FAST_READ instruction is: CS# goes low→ sending FAST_READ instruction code→ 3-byte address on SI→1-dummy byte (default) address on SI→ data out on SO→ to end FAST_READ operation can use CS# to high at any time during data out. While Program/Erase/Write Status Register cycle is in progress, FAST_READ instruction is rejected without any impact on the Program/Erase/Write Status Register current cycle. Figure 9. Read at Higher Speed (FAST_READ) Sequence (Command 0B) CS# 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 SCLK Command SI SO 24 BIT ADDRESS 23 22 21 0Bh 3 2 1 0 High-Z CS# 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 SCLK Dummy Cycle SI 7 6 5 4 3 2 1 0 DATA OUT 2 DATA OUT 1 SO 7 6 5 3 2 1 0 7 MSB MSB P/N: PM1911 4 24 6 5 4 3 2 1 0 7 MSB REV. 1.0, JAN. 18, 2013 MX25L8073E 9-8. Dual Read Mode (DREAD) The DREAD instruction enable double throughput of Serial Flash in read mode. The address is latched on rising edge of SCLK, and data of every two bits (interleave on 2 I/O pins) shift out on the falling edge of SCLK at a maximum frequency fT. The first address byte can be at any location. The address is automatically increased to the next higher address after each byte data is shifted out, so the whole memory can be read out at a single DREAD instruction. The address counter rolls over to 0 when the highest address has been reached. Once writing DREAD instruction, the following data out will perform as 2-bit instead of previous 1-bit. The sequence of issuing DREAD instruction is: CS# goes low → sending DREAD instruction → 3-byte address on SI → 8-bit dummy cycle → data out interleave on SO1 & SO0 → to end DREAD operation can use CS# to high at any time during data out. While Program/Erase/Write Status Register cycle is in progress, DREAD instruction is rejected without any impact on the Program/Erase/Write Status Register current cycle. Figure 10. Dual Read Mode Sequence (Command 3B) CS# 0 1 2 3 4 5 6 7 8 … Command SI/SIO0 SO/SIO1 P/N: PM1911 30 31 32 9 SCLK 3B … 24 ADD Cycle A23 A22 … High Impedance 39 40 41 42 43 44 45 A1 A0 8 dummy cycle Data Out 1 Data Out 2 D6 D4 D2 D0 D6 D4 D7 D5 D3 D1 D7 D5 25 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-9. 2 x I/O Read Mode (2READ) The 2READ instruction enables Double Transfer Rate of Serial Flash in read mode. The address is latched on rising edge of SCLK, and data of every two bits (interleave on 2 I/O pins) shift out on the falling edge of SCLK at a maximum frequency fT. The first address byte can be at any location. The address is automatically increased to the next higher address after each byte data is shifted out, so the whole memory can be read out at a single 2READ instruction. The address counter rolls over to 0 when the highest address has been reached. Once writing 2READ instruction, the following address/dummy/data out will perform as 2-bit instead of previous 1-bit. The sequence of issuing 2READ instruction is: CS# goes low→ sending 2READ instruction→ 24-bit address interleave on SIO1 & SIO0→ 4-bit dummy cycles on SIO1 & SIO0→ data out interleave on SIO1 & SIO0→ to end 2READ operation can use CS# to high at any time during data out. While Program/Erase/Write Status Register cycle is in progress, 2READ instruction is rejected without any impact on the Program/Erase/Write Status Register current cycle. Figure 11. 2 x I/O Read Mode Sequence (Command BB) CS# 0 1 2 3 4 5 6 7 8 18 19 20 21 22 23 24 25 26 27 9 10 11 SCLK 8 Bit Instruction SI/SIO0 SO/SIO1 BB(hex) High Impedance 12 BIT Address 4 dummy cycle Data Output address bit22, bit20, bit18...bit0 P2 P0 data bit6, bit4, bit2...bit0, bit6, bit4.... address bit23, bit21, bit19...bit1 P3 P1 data bit7, bit5, bit3...bit1, bit7, bit5.... Note: SI/SIO0 or SO/SIO1 should be kept "0h" or "Fh" in the first two dummy cycles. In other words, P2=P0 or P3=P1 is necessary. P/N: PM1911 26 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-10. Quad Read Mode (QREAD) The QREAD instruction enable quad throughput of Serial Flash in read mode. The address is latched on rising edge of SCLK, and data of every four bits (interleave on 4 I/O pins) shift out on the falling edge of SCLK at a maximum frequency fQ. The first address byte can be at any location. The address is automatically increased to the next higher address after each byte data is shifted out, so the whole memory can be read out at a single QREAD instruction. The address counter rolls over to 0 when the highest address has been reached. Once writing QREAD instruction, the following data out will perform as 4-bit instead of previous 1-bit. The sequence of issuing QREAD instruction is: CS# goes low→ sending QREAD instruction → 3-byte address on SI → 8-bit dummy cycle → data out interleave on SO3, SO2, SO1 & SO0→ to end QREAD operation can use CS# to high at any time during data out. While Program/Erase/Write Status Register cycle is in progress, QREAD instruction is rejected without any impact on the Program/Erase/Write Status Register current cycle. Figure 12. Quad Read Mode Sequence (Command 6B) CS# 0 1 2 3 4 5 6 7 8 SCLK … Command SI/SO0 SO/SO1 SO2 SO3 P/N: PM1911 29 30 31 32 33 9 6B … 24 ADD Cycles A23 A22 High Impedance … 38 39 40 41 42 A2 A1 A0 8 dummy cycles Data Data Out 1 Out 2 Data Out 3 D4 D0 D4 D0 D4 D5 D1 D5 D1 D5 High Impedance D6 D2 D6 D2 D6 High Impedance D7 D3 D7 D3 D7 27 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-11. 4 x I/O Read Mode (4READ) The 4READ instruction enables quad throughput of Serial Flash in read mode. The address is latched on rising edge of SCLK, and data of every four bits (interleave on 4 I/O pins) shift out on the falling edge of SCLK at a maximum frequency fQ. The first address byte can be at any location. The address is automatically increased to the next higher address after each byte data is shifted out, so the whole memory can be read out at a single 4READ instruction. The address counter rolls over to 0 when the highest address has been reached. Once writing 4READ instruction, the following address/dummy/data out will perform as 4-bit instead of previous 1-bit. The sequence of issuing 4READ instruction is: CS# goes low→ sending 4READ instruction→ 24-bit address interleave on SIO3, SIO2, SIO1 & SIO0→ 2+4 dummy cycles→ data out interleave on SIO3, SIO2, SIO1 & SIO0→ to end 4READ operation can use CS# to high at any time during data out. Figure 13. 4 x I/O Read Mode Sequence (Command EB) CS# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 n SCLK 8 Bit Instruction SI/SIO0 SO/SIO1 SIO2 SIO3 6 Address cycles Performance enhance indicator (Note) 4 dummy cycles Data Output address bit20, bit16..bit0 P4 P0 data bit4, bit0, bit4.... High Impedance address bit21, bit17..bit1 P5 P1 data bit5 bit1, bit5.... High Impedance address bit22, bit18..bit2 P6 P2 data bit6 bit2, bit6.... High Impedance address bit23, bit19..bit3 P7 P3 data bit7 bit3, bit7.... EB(hex) Note: 1. Hi-impedance is inhibited for the two clock cycles. 2. P7≠P3, P6≠P2, P5≠P1 & P4≠P0 (Toggling) is inhibited. P/N: PM1911 28 REV. 1.0, JAN. 18, 2013 MX25L8073E Another sequence of issuing 4READ instruction especially useful in random access is : CS# goes low→ sending 4READ instruction→ 3-bytes address interleave on SIO3, SIO2, SIO1 & SIO0 →performance enhance toggling bit P[7:0]→ 4 dummy cycles→ data out until CS# goes high → CS# goes low (reduce 4 Read instruction) → 24-bit random access address (Please refer to "Figure 14. 4 x I/O Read enhance performance Mode Sequence (Command EB)" ). In the performance-enhancing mode (Notes of "Figure 14. 4 x I/O Read enhance performance Mode Sequence (Command EB)"), P[7:4] must be toggling with P[3:0]; likewise P[7:0]=A5h, 5Ah, F0h or 0Fh can make this mode continue and reduce the next 4READ instruction. Once P[7:4] is no longer toggling with P[3:0]; likewise P[7:0]=FFh, 00h, AAh or 55h. These commands will reset the performance enhance mode. And afterwards CS# is raised and then lowered, the system then will return to normal operation. While Program/Erase/Write Status Register cycle is in progress, 4READ instruction is rejected without any impact on the Program/Erase/Write Status Register current cycle. 9-12. Performance Enhance Mode The device could waive the command cycle bits if the two cycle bits after address cycle toggles. Please be noticed that “EBh” commands support enhance mode. The performance enhance mode is not supported in dual I/O mode. After entering enhance mode, following CSB go high, the device will stay in the read mode and treat CSB go low of the first clock as address instead of command cycle. To exit enhance mode, a new fast read command whose first two dummy cycles is not toggle then exit. Or issue ”FFh” command to exit enhance mode. P/N: PM1911 29 REV. 1.0, JAN. 18, 2013 MX25L8073E Figure 14. 4 x I/O Read enhance performance Mode Sequence (Command EB) CS# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 n SCLK 8 Bit Instruction SIO2 SIO3 Performance enhance indicator (Note) 4 dummy cycles Data Output address bit20, bit16..bit0 P4 P0 data bit4, bit0, bit4.... High Impedance address bit21, bit17..bit1 P5 P1 data bit5 bit1, bit5.... High Impedance address bit22, bit18..bit2 P6 P2 data bit6 bit2, bit6.... High Impedance address bit23, bit19..bit3 P7 P3 data bit7 bit3, bit7.... EB(hex) SI/SIO0 SO/SIO1 6 Address cycles CS# n+1 ........... n+7 ...... n+9 ........... n+13 ........... SCLK 6 Address cycles Performance enhance indicator (Note) 4 dummy cycles Data Output SI/SIO0 address bit20, bit16..bit0 P4 P0 data bit4, bit0, bit4.... SO/SIO1 address bit21, bit17..bit1 P5 P1 data bit5 bit1, bit5.... SIO2 address bit22, bit18..bit2 P6 P2 data bit6 bit2, bit6.... SIO3 address bit23, bit19..bit3 P7 P3 data bit7 bit3, bit7.... Note: Performance enhance mode, if P7=P3 & P6=P2 & P5=P1 & P4=P0 (Toggling), ex: A5, 5A, 0F Note: Reset the performance enhance mode, if P7=P3 or P6=P2 or P5=P1 or P4=P0, ex: AA, 00, FF 1. Performance enhance mode, if P7≠P3 & P6≠P2 & P5≠P1 & P4≠P0 (Toggling), ex: A5, 5A, 0F, if not using performance enhance recommend to keep 1 or 0 in performance enhance indicator. Reset the performance enhance mode, if P7=P3 or P6=P2 or P5=P1 or P4=P0, ex: AA, 00, FF P/N: PM1911 30 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-13. Performance Enhance Mode Reset (FFh) To conduct the Performance Enhance Mode Reset operation, FFh command code, 8 clocks, should be issued in 1I/ O sequence. If the system controller is being Reset during operation, the flash device will return to the standard operation. Upon Reset of main chip, Instruction would be issued from the system. Instructions like Read ID (9Fh) or Fast Read (0Bh) would be issued. The SIO[3:1] are don't care when during this mode. Figure 15. Performance Enhance Mode Reset for Fast Read Quad I/O Mode Bit Reset for Quad I/O CS# Mode 3 SCLK P/N: PM1911 0 1 2 3 4 5 6 Mode 0 7 Mode 3 Mode 0 IO0 FFh IO1 Don’t Care IO2 Don’t Care IO3 Don’t Care 31 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-14. Sector Erase (SE) The Sector Erase (SE) instruction is for erasing the data of the chosen sector to be "1". The instruction is used for any 4K-byte sector. A Write Enable (WREN) instruction must execute to set the Write Enable Latch (WEL) bit before sending the Sector Erase (SE). Any address of the sector (see "Table 4. Memory Organization" ) is a valid address for Sector Erase (SE) instruction. The CS# must go high exactly at the byte boundary (the latest eighth of address byte has been latched-in); otherwise, the instruction will be rejected and not executed. The sequence of issuing SE instruction is: CS# goes low → sending SE instruction code→ 3-byte address on SI →CS# goes high. The SIO[3:1] are don't care when during this mode. The self-timed Sector Erase Cycle time (tSE) is initiated as soon as Chip Select (CS#) goes high. The Write in Progress (WIP) bit still can be checked out during the Sector Erase cycle is in progress. The WIP sets 1 during the tSE timing, and sets 0 when Sector Erase Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If the page is protected by BP3, BP2, BP1, BP0 bits, the Sector Erase (SE) instruction will not be executed on the page. Figure 16. Sector Erase (SE) Sequence (Command 20) CS# 0 1 2 3 4 5 6 7 8 9 29 30 31 SCLK 24 Bit Address Command SI 7 20 6 2 1 0 MSB P/N: PM1911 32 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-15. Block Erase (BE) The Block Erase (BE) instruction is for erasing the data of the chosen block to be "1". The instruction is used for 64K-byte block erase operation. A Write Enable (WREN) instruction must execute to set the Write Enable Latch (WEL) bit before sending the Block Erase (BE). Any address of the block (see "Table 4. Memory Organization" ) is a valid address for Block Erase (BE) instruction. The CS# must go high exactly at the byte boundary (the latest eighth of address byte has been latched-in); otherwise, the instruction will be rejected and not executed. The sequence of issuing BE instruction is: CS# goes low → sending BE instruction code → 3-byte address on SI → CS# goes high. The SIO[3:1] are don't care when during this mode. The self-timed Block Erase Cycle time (tBE) is initiated as soon as Chip Select (CS#) goes high. The Write in Progress (WIP) bit still can be checked out during the Sector Erase cycle is in progress. The WIP sets 1 during the tBE timing, and sets 0 when Sector Erase Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If the page is protected by BP3, BP2, BP1, BP0 bits, the Block Erase (BE) instruction will not be executed on the page. Figure 17. Block Erase (BE) Sequence (Command D8) CS# 0 1 2 3 4 5 6 7 8 9 29 30 31 SCLK Command SI 24 Bit Address 23 22 D8 2 1 0 MSB P/N: PM1911 33 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-16. Chip Erase (CE) The Chip Erase (CE) instruction is for erasing the data of the whole chip to be "1". A Write Enable (WREN) instruction must execute to set the Write Enable Latch (WEL) bit before sending the Chip Erase (CE). The CS# must go high exactly at the byte boundary; otherwise, the instruction will be rejected and not executed. The sequence of issuing CE instruction is: CS# goes low → sending CE instruction code → CS# goes high. The SIO[3:1] are don't care when during this mode. The self-timed Chip Erase Cycle time (tCE) is initiated as soon as Chip Select (CS#) goes high. The Write in Progress (WIP) bit still can be checked out during the Chip Erase cycle is in progress. The WIP sets 1 during the tCE timing, and sets 0 when Chip Erase Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If the chip is protected, the Chip Erase (CE) instruction will not be executed, but WEL will be reset. Figure 18. Chip Erase (CE) Sequence (Command 60 or C7) CS# 0 1 2 3 4 5 6 7 SCLK Command SI P/N: PM1911 60 or C7 34 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-17. Page Program (PP) The Page Program (PP) instruction is for programming the memory to be "0". A Write Enable (WREN) instruction must execute to set the Write Enable Latch (WEL) bit before sending the Page Program (PP). The device programs only the last 256 data bytes sent to the device. The last address byte (the 8 least significant address bits, A7-A0) should be set to 0 for 256 bytes page program. If A7-A0 are not all zero, transmitted data that exceed page length are programmed from the starting address (24-bit address that last 8 bit are all 0) of currently selected page. If the data bytes sent to the device exceeds 256, the last 256 data byte is programmed at the request page and previous data will be disregarded. If the data bytes sent to the device has not exceeded 256, the data will be programmed at the request address of the page. There will be no effort on the other data bytes of the same page. The sequence of issuing PP instruction is: CS# goes low→ sending PP instruction code→ 3-byte address on SI→ at least 1-byte on data on SI→ CS# goes high. The CS# must be kept to low during the whole Page Program cycle; The CS# must go high exactly at the byte boundary (the latest eighth bit of data being latched in), otherwise, the instruction will be rejected and will not be executed. The self-timed Page Program Cycle time (tPP) is initiated as soon as Chip Select (CS#) goes high. The Write in Progress (WIP) bit still can be checked out during the Page Program cycle is in progress. The WIP sets 1 during the tPP timing, and sets 0 when Page Program Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If the page is protected by BP3~0, the array data will be protected (no change) and the WEL bit will still be reset. The SIO[3:1] are don't care when during this mode. Figure 19. Page Program (PP) Sequence (Command 02) CS# 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39 SCLK 1 0 7 6 5 3 2 1 0 2079 2 2078 3 2077 23 22 21 02 SI Data Byte 1 2076 24-Bit Address 2075 Command 4 1 0 MSB MSB 2074 2073 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 2072 CS# SCLK Data Byte 2 SI 7 6 MSB P/N: PM1911 5 4 3 2 Data Byte 3 1 0 7 6 5 MSB 4 3 2 Data Byte 256 1 0 7 6 5 4 3 2 MSB 35 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-18. 4 x I/O Page Program (4PP) The Quad Page Program (4PP) instruction is for programming the memory to be "0". A Write Enable (WREN) instruction must execute to set the Write Enable Latch (WEL) bit. The Quad Page Programming takes four pins: SIO0, SIO1, SIO2, and SIO3, which can raise programmer performance and the effectiveness of application of lower clock less than f4PP. For system with faster clock, the Quad page program cannot provide more actual favors, because the required internal page program time is far more than the time data flows in. Therefore, we suggest that while executing this command (especially during sending data), user can slow the clock speed down to f4PP below. The other function descriptions are as same as standard page program. The sequence of issuing 4PP instruction is: CS# goes low→ sending 4PP instruction code→ 3-byte address on SIO[3:0]→ at least 1-byte on data on SIO[3:0]→ CS# goes high. If the page is protected by BP3~0, the array data will be protected (no change) and the WEL bit will still be reset. Figure 20. 4 x I/O Page Program (4PP) Sequence (Command 38) CS# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 SCLK Command 20 16 12 8 4 0 4 0 4 0 4 0 4 0 SO/SIO1 21 17 13 9 5 1 5 1 5 1 5 1 5 1 SIO2 22 18 14 10 6 2 6 2 6 2 6 2 6 2 SIO3 23 19 15 11 7 3 7 3 7 3 7 3 7 3 SI/SIO0 P/N: PM1911 Data Data Data Data Byte 1 Byte 2 Byte 3 Byte 4 6 Address cycle 38 36 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-19. Deep Power-down (DP) The Deep Power-down (DP) instruction is for setting the device on the minimizing the power consumption (to entering the Deep Power-down mode), the standby current is reduced from ISB1 to ISB2). The Deep Power-down mode requires the Deep Power-down (DP) instruction to enter, during the Deep Power-down mode, the device is not active and all Write/Program/Erase instructions are ignored. When CS# goes high, it's only in standby mode not deep power-down mode. It's different from Standby mode. The sequence of issuing DP instruction is: CS# goes low→ sending DP instruction code→ CS# goes high. The SIO[3:1] are don't care when during this mode. Once the DP instruction is set, all instructions will be ignored except the Release from Deep Power-down mode (RDP) and Read Electronic Signature (RES) instruction. (those instructions allow the ID being reading out). When Powerdown, the deep power-down mode automatically stops, and when power-up, the device automatically is in standby mode. For RDP instruction the CS# must go high exactly at the byte boundary (the latest eighth bit of instruction code has been latched-in); otherwise, the instruction will not be executed. As soon as Chip Select (CS#) goes high, a delay of tDP is required before entering the Deep Power-down mode and reducing the current to ISB2. Figure 21. Deep Power-down (DP) Sequence (Command B9) CS# 0 1 2 3 4 5 6 7 tDP SCLK Command SI B9 Stand-by Mode P/N: PM1911 37 Deep Power-down Mode REV. 1.0, JAN. 18, 2013 MX25L8073E 9-20. Release from Deep Power-down (RDP), Read Electronic Signature (RES) The Release from Deep Power-down (RDP) instruction is terminated by driving Chip Select (CS#) High. When Chip Select (CS#) is driven High, the device is put in the standby Power mode. If the device was not previously in the Deep Power-down mode, the transition to the standby Power mode is immediate. If the device was previously in the Deep Power-down mode, though, the transition to the standby Power mode is delayed by tRES2, and Chip Select (CS#) must remain High for at least tRES2(max), as specified in "Table 13. AC Characteristics". Once in the standby mode, the device waits to be selected, so that it can receive, decode and execute instructions. RES instruction is for reading out the old style of 8-bit Electronic Signature, whose values are shown as "Table 7. ID Definitions". This is not the same as RDID instruction. It is not recommended to use for new design. For new design, please use RDID instruction. Even in Deep power-down mode, the RDP and RES are also allowed to be executed, only except the device is in progress of program/erase/write cycles; there's no effect on the current program/erase/write cycles in progress. The SIO[3:1] are don't care when during this mode. The RES instruction is ended by CS# goes high after the ID been read out at least once. The ID outputs repeatedly if continuously send the additional clock cycles on SCLK while CS# is at low. If the device was not previously in Deep Power-down mode, the device transition to standby mode is immediate. If the device was previously in Deep Power-down mode, there's a delay of tRES2 to transit to standby mode, and CS# must remain to high at least tRES2(max). Once in the standby mode, the device waits to be selected, so it can receive, decode, and execute instruction. The RDP instruction is for releasing from Deep Power-down Mode. Figure 22. Release from Deep Power-down and Read Electronic Signature (RES) Sequence (Command AB) CS# 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 SCLK Command SI ABh tRES2 3 Dummy Bytes 23 22 21 3 2 1 0 MSB SO Electronic Signature Out High-Z 7 6 5 4 3 2 1 0 MSB Deep Power-down Mode P/N: PM1911 38 Stand-by Mode REV. 1.0, JAN. 18, 2013 MX25L8073E Figure 23. Release from Deep Power-down (RDP) Sequence (Command AB) CS# 0 1 2 3 4 5 6 tRES1 7 SCLK Command SI SO AB High-Z Deep Power-down Mode P/N: PM1911 39 Stand-by Mode REV. 1.0, JAN. 18, 2013 MX25L8073E 9-21. Read Electronic Manufacturer ID & Device ID (REMS), (REMS2), (REMS4) The REMS, REMS2, and REMS4 instruction provides both the JEDEC assigned Manufacturer ID and the specific Device ID. The instruction is initiated by driving the CS# pin low and shift the instruction code "90h", "DFh" or "EFh" followed by two dummy bytes and one byte address (A7~A0). After which, the Manufacturer ID for Macronix (C2h) and the Device ID are shifted out on the falling edge of SCLK with most significant bit (MSB) first as shown in the figure below. The Device ID values are listed in "Table 7. ID Definitions". If the one-byte address is initially set to 01h, then the Device ID will be read first and then followed by the Manufacturer ID. The Manufacturer and Device IDs can be read continuously, alternating from one to the other. The instruction is completed by driving CS# high. Figure 24. Read Electronic Manufacturer & Device ID (REMS) Sequence (Command 90 or EF or DF) CS# 0 1 2 3 4 5 6 7 8 9 10 SCLK Command SI SO 90 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 24 ADD Cycles A23 A22 A21 A3 A2 A1 A0 Manufacturer ID High-Z Device ID D7 D6 D5 D4 D3 D2 D1 D0 D7 D6 D5 D4 D3 D2 D1 D0 MSB MSB MSB Notes: 1. A0=0 will output the Manufacturer ID first and A0=1 will output Device ID first. A1~A23 are don't care. 2. Instruction is either 90(hex) or EF(hex) or DF(hex). P/N: PM1911 40 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-22. ID Read User can execute this ID Read instruction to identify the Device ID and Manufacturer ID. The sequence of issue ID instruction is CS# goes low→sending ID instruction→→Data out on SO→CS# goes high. Most significant bit (MSB) first. After the command cycle, the device will immediately output data on the falling edge of SCLK. The manufacturer ID, memory type, and device ID data byte will be output continuously, until the CS# goes high. Table 7. ID Definitions RDID Command manufacturer ID C2 memory type 20 electronic ID 13 device ID 13 RES Command REMS/REMS2/REMS4/ Command 9-23. manufacturer ID C2 memory density 14 Enter Secured OTP (ENSO) The ENSO instruction is for entering the additional 4K-bit secured OTP mode. The additional 4K-bit secured OTP is independent from main array, which may use to store unique serial number for system identifier. After entering the Secured OTP mode, and then follow standard read or program, procedure to read out the data or update data. The Secured OTP data cannot be updated again once it is lock-down. The sequence of issuing ENSO instruction is: CS# goes low→sending ENSO instruction to enter Secured OTP mode→ CS# goes high. Please note that WRSR/WRSCUR commands are not acceptable during the access of secure OTP region, once security OTP is lock down, only read related commands are valid. 9-24. Exit Secured OTP (EXSO) The EXSO instruction is for exiting the additional 4K-bit secured OTP mode. The sequence of issuing EXSO instruction is: CS# goes low→sending EXSO instruction to exit Secured OTP mode→CS# goes high. P/N: PM1911 41 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-25. Read Security Register (RDSCUR) The RDSCUR instruction is for reading the value of Security Register. The Read Security Register can be read at any time (even in program/erase/write status register/write security register condition) and continuously. The sequence of issuing RDSCUR instruction is : CS# goes low→ sending RDSCUR instruction → Security Register data out on SO→ CS# goes high. The SIO[3:1] are don't care when during this mode. Figure 25. Read Security Register (RDSCUR) Sequence (Command 2B) CS# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 SCLK command 2B SI Security Register Out High-Z SO 7 6 5 4 3 2 1 Security Register Out 0 7 6 5 4 3 2 1 0 7 MSB MSB The definition of the Security Register is as below: Secured OTP Indicator bit. The Secured OTP indicator bit shows the chip is locked by factory before ex- factory or not. When it is "0", it indicates non- factory lock; "1" indicates factory- lock. Lock-down Secured OTP (LDSO) bit. By writing WRSCUR instruction, the LDSO bit may be set to "1" for customer lock-down purpose. However, once the bit is set to "1" (lock-down), the LDSO bit and the 4K-bit Secured OTP area cannot be update any more. While it is in 4K-bit secured OTP mode, main array access is not allowed. Table 8. Security Register Definition bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0 x x x x x x LDSO (indicate if lock-down Secured OTP indicator bit 0 = non-factory lock 1 = factory lock non-volatile bit reserved reserved reserved reserved reserved reserved 0 = not lock-down 1 = lock-down (cannot program/erase OTP) volatile bit volatile bit volatile bit volatile bit volatile bit volatile bit non-volatile bit P/N: PM1911 42 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-26. Write Security Register (WRSCUR) The WRSCUR instruction is for changing the values of Security Register Bits. The WREN instruction is required before sending WRSCUR instruction. The WRSCUR instruction may change the values of bit1 (LDSO bit) for customer to lock-down the Secured OTP area. Once the LDSO bit is set to "1", the Secured OTP area cannot be updated any more. The sequence of issuing WRSCUR instruction is :CS# goes low→ sending WRSCUR instruction → CS# goes high. The SIO[3:1] are don't care when during this mode. The CS# must go high exactly at the boundary; otherwise, the instruction will be rejected and not executed. Figure 26. Write Security Register (WRSCUR) Sequence (Command 2F) CS# 0 1 2 3 4 5 6 7 SCLK Command SI SO P/N: PM1911 2F High-Z 43 REV. 1.0, JAN. 18, 2013 MX25L8073E 9-27. Read SFDP Mode (RDSFDP) The Serial Flash Discoverable Parameter (SFDP) standard provides a consistent method of describing the functional and feature capabilities of serial flash devices in a standard set of internal parameter tables. These parameter tables can be interrogated by host system software to enable adjustments needed to accommodate divergent features from multiple vendors. The concept is similar to the one found in the Introduction of JEDEC Standard, JESD68 on CFI. The sequence of issuing RDSFDP instruction is same as CS# goes low→send RDSFDP instruction (5Ah)→send 3 address bytes on SI pin→send 1 dummy byte on SI pin→read SFDP code on SO→to end RDSFDP operation can use CS# to high at any time during data out. SFDP is a JEDEC Standard. JESD216. Figure 27. Read Serial Flash Discoverable Parameter (RDSFDP) Sequence CS# 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 SCLK Command SI SO 24 BIT ADDRESS 23 22 21 5Ah 3 2 1 0 High-Z CS# 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 SCLK Dummy Cycle SI 7 6 5 4 3 2 1 0 DATA OUT 2 DATA OUT 1 SO 7 6 P/N: PM1911 5 4 3 2 1 0 7 MSB MSB 44 6 5 4 3 2 1 0 7 MSB REV. 1.0, JAN. 18, 2013 MX25L8073E Table 9. Signature and Parameter Identification Data Values Description SFDP Signature Comment Fixed: 50444653h Add (h) DW Add Data (h/b) (Byte) (Bit) (Note1) 00h 07:00 53h Data (h) 53h 01h 15:08 46h 46h 02h 23:16 44h 44h 03h 31:24 50h 50h SFDP Minor Revision Number Start from 00h 04h 07:00 00h 00h SFDP Major Revision Number Start from 01h This number is 0-based. Therefore, 0 indicates 1 parameter header. 05h 15:08 01h 01h 06h 23:16 01h 01h 07h 31:24 FFh FFh 00h: it indicates a JEDEC specified header. 08h 07:00 00h 00h Start from 00h 09h 15:08 00h 00h Start from 01h 0Ah 23:16 01h 01h How many DWORDs in the Parameter table 0Bh 31:24 09h 09h 0Ch 07:00 30h 30h 0Dh 15:08 00h 00h 0Eh 23:16 00h 00h 0Fh 31:24 FFh FFh it indicates Macronix manufacturer ID 10h 07:00 C2h C2h Start from 00h 11h 15:08 00h 00h Start from 01h 12h 23:16 01h 01h How many DWORDs in the Parameter table 13h 31:24 04h 04h 14h 07:00 60h 60h 15h 15:08 00h 00h 16h 23:16 00h 00h 17h 31:24 FFh FFh Number of Parameter Headers Unused ID number (JEDEC) Parameter Table Minor Revision Number Parameter Table Major Revision Number Parameter Table Length (in double word) Parameter Table Pointer (PTP) First address of JEDEC Flash Parameter table Unused ID number (Macronix manufacturer ID) Parameter Table Minor Revision Number Parameter Table Major Revision Number Parameter Table Length (in double word) Parameter Table Pointer (PTP) First address of Macronix Flash Parameter table Unused P/N: PM1911 45 REV. 1.0, JAN. 18, 2013 MX25L8073E Table 10. Parameter Table (0): JEDEC Flash Parameter Tables Description Comment Block/Sector Erase sizes 00: Reserved, 01: 4KB erase, 10: Reserved, 11: not suport 4KB erase Write Granularity 0: 1Byte, 1: 64Byte or larger 0: not required Write Enable Instruction Required for 1: required 00h to be written to the Writing to Volatile Status Registers status register Write Enable Opcode Select for Writing to Volatile Status Registers Unused Add (h) DW Add Data (h/b) (Byte) (Bit) (Note1) 31h (1-1-2) Fast Read (Note2) 0=not support 1=support Address Bytes Number used in addressing flash array 00: 3Byte only, 01: 3 or 4Byte, 10: 4Byte only, 11: Reserved 01b 02 1b 03 0b 30h 0: use 50h opcode, 1: use 06h opcode Note: If target flash status register is nonvolatile, then bits 3 and 4 must be set to 00b. Contains 111b and can never be changed 4KB Erase Opcode 01:00 Double Transfer Rate (DTR) Clocking 0=not support 1=support 32h Data (h) E5h 04 0b 07:05 111b 15:08 20h 16 1b 18:17 00b 19 0b 20 1b 20h F1h (1-2-2) Fast Read 0=not support 1=support (1-4-4) Fast Read 0=not support 1=support 21 1b (1-1-4) Fast Read 0=not support 1=support 22 1b 23 1b 33h 31:24 FFh 37h:34h 31:00 007F FFFFh Unused Unused Flash Memory Density (1-4-4) Fast Read Number of Wait states (Note3) (1-4-4) Fast Read Number of Mode Bits (Note4) 0 0000b: Wait states (Dummy Clocks) not support 000b: Mode Bits not support (1-4-4) Fast Read Opcode (1-1-4) Fast Read Number of Wait states (1-1-4) Fast Read Number of Mode Bits 39h 0 0000b: Wait states (Dummy Clocks) not support 000b: Mode Bits not support (1-1-4) Fast Read Opcode P/N: PM1911 38h 3Ah 3Bh 46 04:00 0 0100b 07:05 010b 15:08 EBh 20:16 0 1000b 23:21 000b 31:24 6Bh FFh 44h EBh 08h 6Bh REV. 1.0, JAN. 18, 2013 MX25L8073E Description (1-1-2) Fast Read Number of Wait states (1-1-2) Fast Read Number of Mode Bits Comment 0 0000b: Wait states (Dummy Clocks) not support 000b: Mode Bits not support (1-1-2) Fast Read Opcode (1-2-2) Fast Read Number of Wait states (1-2-2) Fast Read Number of Mode Bits 0 0000b: Wait states (Dummy Clocks) not support 3Eh 000b: Mode Bits not support 3Fh 0=not support 1=support Unused (4-4-4) Fast Read 3Ch 3Dh (1-2-2) Fast Read Opcode (2-2-2) Fast Read Add (h) DW Add Data (h/b) (Byte) (Bit) (Note1) 0=not support 1=support 40h Unused 04:00 0 1000b 07:05 000b 15:08 3Bh 20:16 0 0100b 23:21 000b 31:24 BBh 00 0b 03:01 111b 04 0b 07:05 111b Data (h) 08h 3Bh 04h BBh EEh Unused 43h:41h 31:08 FFh FFh Unused 45h:44h 15:00 FFh FFh 20:16 0 0000b 23:21 000b 47h 31:24 FFh FFh 49h:48h 15:00 FFh FFh 20:16 0 0000b 23:21 000b 4Bh 31:24 FFh FFh 4Ch 07:00 0Ch 0Ch 4Dh 15:08 20h 20h 4Eh 23:16 10h 10h 4Fh 31:24 D8h D8h 50h 07:00 00h 00h 51h 15:08 FFh FFh 52h 23:16 00h 00h 53h 31:24 FFh FFh (2-2-2) Fast Read Number of Wait states (2-2-2) Fast Read Number of Mode Bits 0 0000b: Wait states (Dummy Clocks) not support 000b: Mode Bits not support (2-2-2) Fast Read Opcode Unused (4-4-4) Fast Read Number of Wait states (4-4-4) Fast Read Number of Mode Bits 0 0000b: Wait states (Dummy Clocks) not support 000b: Mode Bits not support (4-4-4) Fast Read Opcode Sector Type 1 Size Sector/block size = 2^N bytes (Note5) 0x00b: this sector type doesn't exist Sector Type 1 erase Opcode Sector Type 2 Size Sector/block size = 2^N bytes 0x00b: this sector type doesn't exist Sector Type 2 erase Opcode Sector Type 3 Size Sector/block size = 2^N bytes 0x00b: this sector type doesn't exist Sector Type 3 erase Opcode Sector Type 4 Size Sector/block size = 2^N bytes 0x00b: this sector type doesn't exist Sector Type 4 erase Opcode P/N: PM1911 47 46h 4Ah 00h 00h REV. 1.0, JAN. 18, 2013 MX25L8073E Table 11. Parameter Table (1): Macronix Flash Parameter Tables Description Comment Add (h) DW Add Data (h/b) (Byte) (Bit) (Note1) Data (h) Vcc Supply Maximum Voltage 2000h=2.000V 2700h=2.700V 3600h=3.600V 61h:60h 07:00 15:08 00h 36h 00h 36h Vcc Supply Minimum Voltage 1650h=1.650V 2250h=2.250V 2350h=2.350V 2700h=2.700V 63h:62h 23:16 31:24 00h 27h 00h 27h H/W Reset# pin 0=not support 1=support 00 0b H/W Hold# pin 0=not support 1=support 01 0b Deep Power Down Mode 0=not support 1=support 02 1b S/W Reset 0=not support 1=support 03 0b S/W Reset Opcode Reset Enable (66h) should be issued before Reset Opcode 11:04 1111 1111b (FFh) Program Suspend/Resume 0=not support 1=support 12 0b Erase Suspend/Resume 0=not support 1=support 13 0b 14 1b 15 0b 66h 23:16 FFh FFh 67h 31:24 FFh FFh 65h:64h Unused Wrap-Around Read mode 0=not support 1=support Wrap-Around Read mode Opcode Wrap-Around Read data length 08h:support 8B wrap-around read 16h:8B&16B 32h:8B&16B&32B 64h:8B&16B&32B&64B Individual block lock 0=not support 1=support 00 0b Individual block lock bit (Volatile/Nonvolatile) 0=Volatile 1=Nonvolatile 01 1b 09:02 1111 1111b 10 1b 11 1b Individual block lock Opcode 4FF4h Individual block lock Volatile protect bit default protect status 0=protect 1=unprotect Secured OTP 0=not support 1=support Read Lock 0=not support 1=support 12 0b Permanent Lock 0=not support 1=support 13 0b Unused 15:14 11b Unused 31:16 FFh FFh 31:00 FFh FFh Unused P/N: PM1911 6Bh:68h 6Fh:6Ch 48 CFFEh REV. 1.0, JAN. 18, 2013 MX25L8073E Note 1:h/b is hexadecimal or binary. Note 2:(x-y-z) means I/O mode nomenclature used to indicate the number of active pins used for the opcode (x), address (y), and data (z). At the present time, the only valid Read SFDP instruction modes are: (1-1-1), (2-2-2), and (4-4-4) Note 3:Wait States is required dummy clock cycles after the address bits or optional mode bits. Note 4:Mode Bits is optional control bits that follow the address bits. These bits are driven by the system controller if they are specified. (eg,read performance enhance toggling bits) Note 5:4KB=2^0Ch,32KB=2^0Fh,64KB=2^10h Note 6:All unused and undefined area data is blank FFh. P/N: PM1911 49 REV. 1.0, JAN. 18, 2013 MX25L8073E 10. POWER-ON STATE The device is at below states when power-up: - Standby mode (please note it is not Deep Power-down mode) - Write Enable Latch (WEL) bit is reset The device must not be selected during power-up and power-down stage unless the VCC achieves below correct level: - VCC minimum at power-up stage and then after a delay of tVSL - GND at power-down Please note that a pull-up resistor on CS# may ensure a safe and proper power-up/down level. An internal Power-on Reset (POR) circuit may protect the device from data corruption and inadvertent data change during power up state. For further protection on the device, if the VCC does not reach the VCC minimum level, the correct operation is not guaranteed. The read, write, erase, and program command should be sent after the time delay: - tVSL after VCC reached VCC minimum level The device can accept read command after VCC reached VCC minimum and a time delay of tVSL. Note: - To stabilize the VCC level, the VCC rail decoupled by a suitable capacitor close to package pins is recommended. (generally around 0.1uF) P/N: PM1911 50 REV. 1.0, JAN. 18, 2013 MX25L8073E 11. ELECTRICAL SPECIFICATIONS 11-1. Absolute Maximum Ratings Rating Value Ambient Operating Temperature Industrial grade -40°C to 85°C Storage Temperature -65°C to 125°C Applied Input Voltage -0.5V to 4.6V Applied Output Voltage -0.5V to 4.6V VCC to Ground Potential -0.5V to 4.6V NOTICE: 1.Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is stress rating only and functional operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect reliability. 2.Specifications contained within the following tables are subject to change. 3.During voltage transitions, all pins may overshoot Vss to -2.0V and Vcc to +2.0V for periods up to 20ns, see the figures below. Figure 28. Maximum Negative Overshoot Waveform Figure 29. Maximum Positive Overshoot Waveform 20ns 20ns 20ns Vcc + 2.0V Vss Vcc Vss-2.0V 20ns 11-2. 20ns 20ns Capacitance TA = 25°C, f = 1.0 MHz Symbol Parameter CIN COUT P/N: PM1911 Min. Typ. Max. Unit Input Capacitance 6 pF VIN = 0V Output Capacitance 8 pF VOUT = 0V 51 Conditions REV. 1.0, JAN. 18, 2013 MX25L8073E Figure 30. Input Test Waveforms and Measurement Level Input timing reference level 0.8VCC 0.2VCC 0.7VCC 0.3VCC Output timing reference level AC Measurement Level 0.5VCC Note: Input pulse rise and fall time are <5ns Figure 31. Output Loading DEVICE UNDER TEST 2.7K ohm CL 6.2K ohm +3.3V DIODES=IN3064 OR EQUIVALENT CL=30/15pF Including jig capacitance P/N: PM1911 52 REV. 1.0, JAN. 18, 2013 MX25L8073E Table 12. DC Characteristics Temperature = -40°C to 85°C for Industrial grade SYMBOL PARAMETER NOTES MIN. TYP. MAX. UNITS TEST CONDITIONS ILI Input Load Current 1 ±2 uA VCC = VCC Max, VIN = VCC or GND ILO Output Leakage Current 1 ±2 uA VCC = VCC Max, VOUT = VCC or GND ISB1 VCC Standby Current 1 20 50 uA VIN = VCC or GND, CS# = VCC ISB2 Deep Power-down Current 3 20 uA 25 mA 15 mA fT=80MHz (2 x I/O read) SCLK=0.1VCC/0.9VCC, SO=Open 10 mA f=50MHz, SCLK=0.1VCC/0.9VCC, SO=Open 20 mA 20 mA 1 20 mA Erase in Progress, CS#=VCC 1 20 mA Erase in Progress, CS#=VCC -0.5 0.3VCC V 0.7VCC VCC+0.4 V 0.4 V IOL = 1.6mA V IOH = -100uA ICC1 VCC Read VIL VCC Program Current (PP) VCC Write Status Register (WRSR) Current VCC Sector Erase Current (SE) VCC Chip Erase Current (CE) Input Low Voltage VIH Input High Voltage VOL Output Low Voltage VOH Output High Voltage ICC2 ICC3 ICC4 ICC5 1 1 VCC-0.2 VIN = VCC or GND, CS# = VCC f=108MHz, fT=104MHz(VCC=3.0V~3.6V, 2 x I/O read) fQ=108MHz (4 x I/O read) SCLK=0.1VCC/0.9VCC, SO=Open Program in Progress, CS# = VCC Program status register in progress, CS#=VCC Notes : 1. Typical values at VCC = 3.3V, T = 25°C. These currents are valid for all product versions (package and speeds). 2. Typical value is calculated by simulation. 3. It is measured under checkboard pattern. P/N: PM1911 53 REV. 1.0, JAN. 18, 2013 MX25L8073E Table 13. AC Characteristics Temperature = -40°C to 85°C for Industrial grade Symbol fSCLK fRSCLK fTSCLK f4PP tCH(1) tCL(1) tCLCH(2) tCHCL(2) tSLCH tCHSL tDVCH tCHDX tCHSH tSHCH tSHSL(3) tSHQZ(2) tCLQV tCLQX tWHSL tSHWL tDP(2) tRES1(2) tRES2(2) tW tBP tPP tSE tBE tCE Alt. Parameter Clock Frequency for the following instructions: fC FAST_READ, RDSFDP, PP, SE, BE, CE, DP, RES, RDP, WREN, WRDI, RDID, RDSR, WRSR fR Clock Frequency for READ instructions Clock Frequency for 2READ/DREAD 2.7V-3.6V fT instructions 3.0V-3.6V fQ Clock Frequency for 4READ/QREAD instructions Clock Frequency for 4PP (Quad page program) Serial tCLH Clock High Time Normal Read 4PP Serial tCLL Clock Low Time Normal Read 4PP Clock Rise Time (3) (peak to peak) Clock Fall Time (3) (peak to peak) tCSS CS# Active Setup Time (relative to SCLK) CS# Not Active Hold Time (relative to SCLK) tDSU Data In Setup Time tDH Data In Hold Time CS# Active Hold Time (relative to SCLK) CS# Not Active Setup Time (relative to SCLK) Read tCSH CS# Deselect Time Write/Erase/Program 2.7V-3.6V tDIS Output Disable Time 3.0V-3.6V Loading: 30pF Clock Low to Output Valid tV Loading: 30pF/15pF Loading: 15pF tHO Output Hold Time Write Protect Setup Time Write Protect Hold Time CS# High to Deep Power-down Mode CS# High to Standby Mode without Electronic Signature Read CS# High to Standby Mode with Electronic Signature Read Write Status Register Cycle Time Byte-Program Page Program Cycle Time Sector Erase Cycle Time Block Erase Cycle Time Chip Erase Cycle Time Min. Typ. D.C. 4.5 9 14 4.5 9 14 0.1 0.1 3 3 2 2 3 3 15 50 Max. Unit 108 MHz 50 80 104 108 33 10 MHz MHz MHz MHz MHz ns ns ns ns ns ns V/ns V/ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns us 20 us 20 100 300 3 300 2.2 15 us ms us ms ms s s 9 9 9 8 0 20 100 40 9 0.7 60 0.4 3 Notes: 1. tCH + tCL must be greater than or equal to 1/ f (fC or fR). 2. Value guaranteed by characterization, not 100% tested in production. 3. tSHSL=15ns from read instruction, tSHSL=50ns from Write/Erase/Program instruction. 4. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1. 5. Test condition is shown as "Figure 30. Input Test Waveforms and Measurement Level" and "Figure 31. Output Loading". P/N: PM1911 54 REV. 1.0, JAN. 18, 2013 MX25L8073E 12. TIMING ANALYSIS Figure 32. Serial Input Timing tSHSL CS# tCHSL tSLCH tCHSH tSHCH SCLK tDVCH tCHCL tCHDX tCLCH LSB MSB SI High-Z SO Figure 33. Output Timing CS# tCH SCLK tCLQV tCLQX tCL tCLQV tSHQZ tCLQX LSB SO tQLQH tQHQL SI P/N: PM1911 ADDR.LSB IN 55 REV. 1.0, JAN. 18, 2013 MX25L8073E Figure 34. Power-Up Timing VCC VCC(max) Chip Selection is Not Allowed VCC(min) Device is fully accessible tVSL time Note: VCC (max.) is 3.6V and VCC (min.) is 2.7V. Table 14. Power-Up Timing Symbol tVSL(1) Parameter VCC(min) to CS# low Min. 300 Max. Unit us Note: The parameter is characterized only. 12-1. Initial Delivery State The device is delivered with the memory array erased: all bits are set to 1 (each byte contains FFh). The Status Register contains 00h (all Status Register bits are 0). P/N: PM1911 56 REV. 1.0, JAN. 18, 2013 MX25L8073E 13. OPERATING CONDITIONS At Device Power-Up and Power-Down AC timing illustrated in "Figure 35. AC Timing at Device Power-Up" and "Figure 36. Power-Down Sequence" are for the supply voltages and the control signals at device power-up and power-down. If the timing in the figures is ignored, the device will not operate correctly. During power-up and power-down, CS# needs to follow the voltage applied on VCC to keep the device not to be selected. The CS# can be driven low when VCC reach Vcc(min.) and wait a period of tVSL. Figure 35. AC Timing at Device Power-Up VCC VCC(min) GND tVR tSHSL CS# tSLCH tCHSL tSHCH tCHSH SCLK tDVCH tCHCL tCHDX LSB IN MSB IN SI High Impedance SO Symbol tVR tCLCH Parameter VCC Rise Time Notes 1 Min. 20 Max. 500000 Unit us/V Notes : 1.Sampled, not 100% tested. 2.For AC spec tCHSL, tSLCH, tDVCH, tCHDX, tSHSL, tCHSH, tSHCH, tCHCL, tCLCH in the figure, please refer to "Table 13. AC Characteristics". P/N: PM1911 57 REV. 1.0, JAN. 18, 2013 MX25L8073E Figure 36. Power-Down Sequence During power-down, CS# needs to follow the voltage drop on VCC to avoid mis-operation. VCC CS# SCLK P/N: PM1911 58 REV. 1.0, JAN. 18, 2013 MX25L8073E 14. ERASE AND PROGRAMMING PERFORMANCE Parameter Min. Typ. (1) Max. (2) Unit Write Status Register Cycle Time 40 100 ms Sector Erase Cycle Time 60 300 ms Block Erase Cycle Time 0.4 2.2 s Chip Erase Cycle Time 3 15 s Byte Program Time (via page program command) 9 300 us 0.7 3 ms Page Program Cycle Time Erase/Program Cycle 100,000 cycles Notes: 1. Typical program and erase time assumes the following conditions: 25°C, 3.3V, and checker board pattern. 2. Under worst conditions of 85°C and 2.7V. 3. System-level overhead is the time required to execute the first-bus-cycle sequence for the programming command. 15. DATA RETENTION Parameter Condition Min. Data retention 55˚C 20 Max. Unit years LATCH-UP CHARACTERISTICS 16. Input Voltage with respect to GND on all power pins, SI, CS# Input Voltage with respect to GND on SO Current Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at a time. P/N: PM1911 59 Min. -1.0V -1.0V -100mA Max. 2 VCCmax VCC + 1.0V +100mA REV. 1.0, JAN. 18, 2013 MX25L8073E 17. ORDERING INFORMATION PART NO. MX25L8073EM2I-10G P/N: PM1911 CLOCK (MHz) TEMPERATURE PACKAGE 108 -40°C~85°C 8-SOP (200mil) 60 Remark REV. 1.0, JAN. 18, 2013 MX25L8073E 18. PART NAME DESCRIPTION MX 25 L 8073E M2 I 10 G OPTION: G: RoHS Compliant SPEED: 10: 1 I/O 108MHz, 2 I/O 80MHz, 4 I/O 108MHz TEMPERATURE RANGE: I: Industrial (-40°C to 85°C) PACKAGE: M2: 200mil 8-SOP DENSITY & MODE: 8073E: 8Mb TYPE: L: 3V DEVICE: 25: Serial Flash P/N: PM1911 61 REV. 1.0, JAN. 18, 2013 MX25L8073E P/N: PM1911 62 REV. 1.0, JAN. 18, 2013 MX25L8073E 19. REVISION HISTORY Revision No.Description 0.00 1. Initial released 1.0 1. Removed Advanced Information status P/N: PM1911 63 Page Date All NOV/13/2012 P4JAN/18/2013 REV. 1.0, JAN. 18, 2013 MX25L8073E Except for customized products which have been expressly identified in the applicable agreement, Macronix's products are designed, developed, and/or manufactured for ordinary business, industrial, personal, and/or household applications only, and not for use in any applications which may, directly or indirectly, cause death, personal injury, or severe property damages. In the event Macronix products are used in contradicted to their target usage above, the buyer shall take any and all actions to ensure said Macronix's product qualified for its actual use in accordance with the applicable laws and regulations; and Macronix as well as it’s suppliers and/or distributors shall be released from any and all liability arisen therefrom. Copyright© Macronix International Co., Ltd. 2012. All rights reserved, including the trademarks and tradename thereof, such as Macronix, MXIC, MXIC Logo, MX Logo, Integrated Solutions Provider, NBit, Nbit, NBiit, Macronix NBit, eLiteFlash, HybridNVM, HybridFlash, XtraROM, Phines, KH Logo, BE-SONOS, KSMC, Kingtech, MXSMIO, Macronix vEE, Macronix MAP, Rich Audio, Rich Book, Rich TV, and FitCAM. The names and brands of third party referred thereto (if any) are for identification purposes only. For the contact and order information, please visit Macronix’s Web site at: http://www.macronix.com MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice. 64