PD - 95456 IRLIZ44NPbF Logic-Level Gate Drive l Advanced Process Technology l Isolated Package l High Voltage Isolation = 2.5KVRMS l Sink to Lead Creepage Dist. = 4.8mm l Fully Avalanche Rated l Lead-Free Description HEXFET® Power MOSFET l D VDSS = 55V RDS(on) = 0.022Ω G ID = 30A S Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-220 Fullpak eliminates the need for additional insulating hardware in commercial-industrial applications. The moulding compound used provides a high isolation capability and a low thermal resistance between the tab and external heatsink. This isolation is equivalent to using a 100 micron mica barrier with standard TO-220 product. The Fullpak is mounted to a heatsink using a single clip or by a single screw fixing. TO-220 FULLPAK Absolute Maximum Ratings ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C V GS EAS IAR EAR dv/dt TJ TSTG Parameter Max. Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 screw 30 22 160 45 0.3 ± 16 210 25 4.5 5.0 -55 to + 175 Units A W W/°C V mJ A mJ V/ns 300 (1.6mm from case ) 10 lbfin (1.1Nm) °C Thermal Resistance Parameter RθJC RθJA Junction-to-Case Junction-to-Ambient Typ. Max. Units 3.3 65 °C/W 6/23/04 IRLIZ44NPbF Electrical Characteristics @ TJ = 25°C (unless otherwise specified) ∆V(BR)DSS/∆TJ Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) gfs Gate Threshold Voltage Forward Transconductance IDSS Drain-to-Source Leakage Current V(BR)DSS Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time LD Internal Drain Inductance LS Internal Source Inductance Ciss Coss Crss C Input Capacitance Output Capacitance Reverse Transfer Capacitance Drain to Sink Capacitance IGSS Min. 55 1.0 21 Typ. 0.070 11 84 26 15 Max. Units Conditions V VGS = 0V, ID = 250µA V/°C Reference to 25°C, ID = 1mA 0.022 VGS = 10V, ID = 17A 0.025 Ω VGS = 5.0V, ID = 17A 0.035 VGS = 4.0V, ID = 14A 2.0 V VDS = VGS , ID = 250µA S VDS = 25V, ID = 25A 25 VDS = 55V, V GS = 0V µA 250 VDS = 44V, V GS = 0V, TJ = 150°C 100 VGS = 16V nA -100 VGS = -16V 48 ID = 25A 8.6 nC VDS = 44V 25 VGS = 5.0V, See Fig. 6 and 13 VDD = 28V ID = 25A ns RG = 3.4Ω, VGS = 5.0V RD = 1.1Ω, See Fig. 10 Between lead, 4.5 6mm (0.25in.) nH G from package 7.5 and center of die contact 1700 VGS = 0V 400 VDS = 25V pF 150 = 1.0MHz, See Fig. 5 12 = 1.0MHz Source-Drain Ratings and Characteristics IS I SM VSD t rr Q rr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) VDD = 15V, starting TJ = 25°C, L = 470µH RG = 25Ω, IAS = 25A. (See Figure 12) ISD ≤ 25A, di/dt ≤ 270A/µs, VDD ≤ V(BR)DSS, T J ≤ 175°C Min. Typ. Max. Units Conditions D MOSFET symbol 30 showing the A G integral reverse 160 p-n junction diode. S 1.3 V TJ = 25°C, IS = 17A, VGS = 0V 80 120 ns TJ = 25°C, IF = 25A 210 320 µC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Pulse width ≤ 300µs; duty cycle ≤ 2%. t=60s, =60Hz Uses IRLZ44N data and test conditions D S IRLIZ44NPbF 1000 1000 VGS 15V 12V 10V 8.0V 6.0V 4.0V 3.0V BOTTOM 2.5V 100 10 2.5V 20µs PULSE WIDTH T J = 25°C 1 0.1 1 10 A 10 3.0 R DS(on) , Drain-to-Source On Resistance (Normalized) TJ = 25°C 100 TJ = 175°C 10 V DS= 25V 20µs PULSE WIDTH 3.0 4.0 5.0 6.0 7.0 8.0 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics 20µs PULSE WIDTH T J = 175°C 1 10 A 100 Fig 2. Typical Output Characteristics 1000 1 2.5V VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics I D , Drain-to-Source Current (A) 100 1 0.1 100 VDS , Drain-to-Source Voltage (V) 2.0 VGS 15V 12V 10V 8.0V 6.0V 4.0V 3.0V BOTTOM 2.5V TOP ID , Drain-to-Source Current (A) ID , Drain-to-Source Current (A) TOP 9.0 A I D = 41A 2.5 2.0 1.5 1.0 0.5 VGS = 10V 0.0 -60 -40 -20 0 20 40 60 A 80 100 120 140 160 180 TJ , Junction Temperature (°C) Fig 4. Normalized On-Resistance Vs. Temperature IRLIZ44NPbF 2800 15 2400 VGS , Gate-to-Source Voltage (V) V GS = 0V, f = 1MHz C iss = Cgs + C gd , Cds SHORTED C rss = C gd Ciss C oss = Cds + C gd C, Capacitance (pF) 2000 1600 Coss 1200 800 Crss 400 0 1 10 100 I D = 25A V DS = 44V V DS = 28V 12 9 6 3 FOR TEST CIRCUIT SEE FIGURE 13 0 A 0 VDS , Drain-to-Source Voltage (V) 20 30 40 50 60 70 A Q G , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 1000 OPERATION IN THIS AREA LIMITED BY R DS(on) I D , Drain Current (A) ISD , Reverse Drain Current (A) 10 100 TJ = 175°C TJ = 25°C VGS = 0V 10 0.4 0.8 1.2 1.6 2.0 VSD , Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage A 2.4 100 10µs 100µs 10 1ms TC = 25°C TJ = 175°C Single Pulse 1 1 10ms 10 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area A 100 IRLIZ44NPbF 35 RD V DS ID , Drain Current (A) 30 VGS D.U.T. RG 25 20 + -VDD 5.0V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 15 Fig 10a. Switching Time Test Circuit 10 VDS 5 90% 0 25 50 75 100 125 150 TC , Case Temperature ( ° C) 175 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 D = 0.50 1 0.20 0.10 0.05 0.1 0.01 0.00001 0.02 0.01 PDM t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 10 L VDS D.U.T. RG + V - DD IAS 5.0 V tp 0.01Ω Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS EAS , Single Pulse Avalanche Energy (mJ) IRLIZ44NPbF 500 TOP BOTTOM 400 ID 10A 17A 25A 300 200 100 0 VDD = 25V 25 50 75 100 125 150 Starting TJ , Junction Temperature (°C) tp VDD Fig 12c. Maximum Avalanche Energy Vs. Drain Current VDS IAS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .2µF .3µF 5.0 V QGS D.U.T. QGD + V - DS VGS VG 3mA Charge Fig 13a. Basic Gate Charge Waveform IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit A 175 IRLIZ44NPbF Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + RG • • • • Driver Gate Drive Period P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test D= - VDD P.W. Period VGS=10V D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS ISD * IRLIZ44NPbF TO-220 Full-Pak Package Outline Dimensions are shown in millimeters (inches) TO-220 Full-Pak Part Marking Information E X AM P L E : T H IS IS AN IR F I8 4 0 G W IT H AS S E M B L Y L OT CODE 3 432 AS S E M B L E D O N W W 2 4 1 9 9 9 IN T H E AS S E M B L Y L IN E "K " Note: "P" in assembly line position indicates "Lead-Free" IN T E R N AT IO N AL R E CT IF IE R L OGO AS S E M B L Y L OT CODE P AR T N U M B E R IR F I8 40 G 924 K 34 32 D AT E C O D E Y E AR 9 = 1 9 9 9 WE E K 24 L IN E K Data and specifications subject to change without notice. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.06/04 Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/