View the Part Number Specific Data Sheet for full specifications

ECLIPTEK
PART NUMBER DATA SHEET
CORPORATION
EC3700TTS-33.000M
REGULATORY COMPLIANCE
R
(Data Sheet downloaded on Jun 28, 2016)
2011/65 +
2015/863
168 SVHC
ITEM DESCRIPTION
Quartz Crystal Clock Oscillators XO (SPXO) LVCMOS (CMOS) 2.5Vdc 4 Pad 3.2mm x 5.0mm Ceramic Surface Mount (SMD)
33.000MHz ±100ppm -10°C to +70°C
ELECTRICAL SPECIFICATIONS
Nominal Frequency
33.000MHz
Frequency Tolerance/Stability
±100ppm Maximum (Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability over the Operating
Temperature Range, Supply Voltage Change, Ouput Load Change, First Year Aging at 25°C, Shock, and Vibration)
Operating Temperature Range
-10°C to +70°C
Supply Voltage
2.5Vdc ±5%
Input Current
5mA Maximum
Output Voltage Logic High (Voh)
90% of Vdd Minimum (IOH = -4mA)
Output Voltage Logic Low (Vol)
10% of Vdd Maximum (IOL = +4mA)
Rise/Fall Time
6nSec Maximum (Measured at 20% to 80% of waveform)
Duty Cycle
50 ±5(%) (Measured at 50% of waveform)
Load Drive Capability
15pF Maximum
Output Logic Type
CMOS
Pin 1 Connection
Tri-State (High Impedance)
Tri-State Input Voltage (Vih and Vil)
90% of Vdd Minimum or No Connect to Enable Output, 10% of Vdd Maximum to Disable Output (High Impedance)
Standby Current
10µA Maximum (Disabled Output: High Impedance)
RMS Phase Jitter
1pSec Maximum (12kHz to 20MHz offset frequency)
Start Up Time
10mSec Maximum
Storage Temperature Range
-55°C to +125°C
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
ESD Susceptibility
MIL-STD-883, Method 3015, Class 1, HBM: 1500V
Fine Leak Test
MIL-STD-883, Method 1014, Condition A
Flammability
UL94-V0
Gross Leak Test
MIL-STD-883, Method 1014, Condition C
Mechanical Shock
MIL-STD-883, Method 2002, Condition B
Moisture Resistance
MIL-STD-883, Method 1004
Moisture Sensitivity
J-STD-020, MSL 1
Resistance to Soldering Heat
MIL-STD-202, Method 210, Condition K
Resistance to Solvents
MIL-STD-202, Method 215
Solderability
MIL-STD-883, Method 2003
Temperature Cycling
MIL-STD-883, Method 1010, Condition B
Vibration
MIL-STD-883, Method 2007, Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Revision I 03/12/2015 | Page 1 of 4
Ecliptek Corporation 3545 Cadillac Ave., Costa Mesa, CA 92626
1-800-ECLIPTEK or 714.433.1200
ECLIPTEK
PART NUMBER DATA SHEET
R
CORPORATION
EC3700TTS-33.000M
MECHANICAL DIMENSIONS (all dimensions in millimeters)
3.20
±0.20
1.00 ±0.20 (x4)
MARKING
ORIENTATION
5.00
±0.20
1.3
MAX
2
3
1.20 ±0.20
CONNECTION
1
Tri-State
2
Ground
3
Output
4
Supply Voltage
LINE MARKING
2.54
±0.15
1
PIN
4
1
E33.000
E=Ecliptek Designator
2
XXXXX
XXXXX=Ecliptek
Manufacturing Identifier
1.20
±0.20 (x4)
Suggested Solder Pad Layout
All Dimensions in Millimeters
1.20 (X4)
1.40 (X4)
Solder Land
(X4)
1.14
1.00
All Tolerances are ±0.1
www.ecliptek.com | Specification Subject to Change Without Notice | Revision I 03/12/2015 | Page 2 of 4
Ecliptek Corporation 3545 Cadillac Ave., Costa Mesa, CA 92626
1-800-ECLIPTEK or 714.433.1200
ECLIPTEK
PART NUMBER DATA SHEET
R
CORPORATION
EC3700TTS-33.000M
CLOCK OUTPUT
TRI-STATE INPUT
OUTPUT WAVEFORM & TIMING DIAGRAM
VIH
VIL
VOH
80% of Waveform
OUTPUT DISABLE
(HIGH IMPEDANCE
STATE)
50% of Waveform
20% of Waveform
VOL
tPLZ
Fall
Time
Rise
Time
tPZL
TW
T
Duty Cycle (%) = TW/T x 100
www.ecliptek.com | Specification Subject to Change Without Notice | Revision I 03/12/2015 | Page 3 of 4
Ecliptek Corporation 3545 Cadillac Ave., Costa Mesa, CA 92626
1-800-ECLIPTEK or 714.433.1200
ECLIPTEK
PART NUMBER DATA SHEET
R
CORPORATION
EC3700TTS-33.000M
Test Circuit for CMOS Output
Frequency
Counter
Oscilloscope
+
+
Power
Supply
_
Current
Meter
_
Supply
Voltage
(VDD)
Probe
(Note 2)
Output
+
Voltage
Meter
_
0.01µF
(Note 1)
0.1µF
(Note 1)
Ground
CL
(Note 3)
No Connect
or Tri-State
Note 1: An external 0.1µF low frequency tantalum bypass capacitor in parallel with a 0.01µF high frequency
ceramic bypass capacitor close to the package ground and VDD pin is required.
Note 2: A low capacitance (<12pF), 10X attenuation factor, high impedance (>10Mohms), and high bandwidth
(>300MHz) passive probe is recommended.
Note 3: Capacitance value CL includes sum of all probe and fixture capacitance.
www.ecliptek.com | Specification Subject to Change Without Notice | Revision I 03/12/2015 | Page 4 of 4
Ecliptek Corporation 3545 Cadillac Ave., Costa Mesa, CA 92626
1-800-ECLIPTEK or 714.433.1200