Reliability Report 2014 (January 2011- December 2013), Power Semiconductor Devices

Efficiency Through Technology
RELIABILITY REPORT
2014
Power Semiconductor Devices
January 2011 - December 2013
IXYS Corporation
1590 Buckeye Dr.
Milpitas CA 95035-7418
USA
Published April 2014
Q11 - A. Schlamp
IXYS Semiconductor GmbH
Edisonstrasse 15
D-68623 Lampertheim
Germany
Humidity Test
QUALITY AND RELIABILITY
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
IXYS is committed to setting a new standard for
excellence in Power Semiconductors. Reflecting our
dedication to industry leadership in the manufacture of
medium to high power devices, reliability has
assumed a primary position in raw material selection,
design, and process technology.
Reliability utilizes information derived from applied
research, engineering design, analysis of field
applications and accelerated stress testing and
integrates this knowledge to optimize device design
and manufacturing processes.
All areas that impact reliability have received
considerable attention in order to achieve our goal to
be the # 1 Reliability Supplier of Power
Semiconductor products. We believe IXYS products
should be the most reliable components in your
system.
We have committed significant resources to
continuously improve and optimize our device design,
wafer fab processes, assembly processes and test
capabilities. As a result of this investment, IXYS has
realized a dramatic improvement in reliability
performance on all standardized tests throughout the
product line.
Excellence in product reliability is “built-in”, not testedin. Moreover, it requires a total systems approach,
involving all parties: from design to raw materials to
manufacturing.
In addition to qualifying new products released to the
market, life and environmental tests are periodically
performed on standard products to maintain feedback
on assembly and fabrication performance to assure
product reliability. Further information on reliability of
power devices is provided on www.ixys.com.
Power Cycle (PC)
Failure Modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling can
cause
thermal
and
electrical
performance
degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS,
ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM,
VRRM.
Steady State Temperature Humidity Bias
Life Test (H³TRB)
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
High Accelerated Stress Test (HAST)
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
TERMS IN TABLES
SUMMARY TABLES 1 AND 2:
AF: acceleration factor
RELIABILITY TESTS
High Temperature Reverse Bias (HTRB)
Failure Modes: Gradual degradation of break-down
characteristics due to presence of foreign materials
and polar/ionic contaminants disturbing the electric
field termination structure.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, VTH.
AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k }
(1)
Ea: activation energy; @ HTRB Ea = 1.0 eV
@ HTGB Ea = 0.4 eV
-5
k: Boltzmann’s constant 8.6·10 eV/K
T1: abs. application junction temperature (273+Tj) K
T2: abs. test junction temperature (273+Tj) K
High Temperature Gate Bias (HTGB)
UCL: upper confidence limit (60%)
Total Failures @ 60% UCL:
Failure Modes: Rupture of the gate oxide due to
localized thickness variations, structural anomalies,
particulates in the oxide, channel inversion due to
presence of mobile ions in the gate oxide.
Sensitive Parameters: IGSS, IGES,VTH, IDSS, ICES.
N = r + dr
(2)
r: number of failed devices
dr: additional term, depending on both r and UCL
MTTF: Mean Time To Failures = 1/Failure Rate
9
FIT: 1 FIT = 1 failure / 10 hrs
Temperature Cycle (TC)
TABLES 3:
∆T: max Tj - min Tj during Test
Failure modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling,
causing thermal and electrical performance degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF.
DEFINITION OF FAILURE
Failure criteria are defined according to IEC 60747
standard series
2
Summary of Tables 1A - 1H: HTRB
Table 1A
Table 1B
Table 1C
Table 1D
Table 1E
Table 1F
Table 1G
Table 1H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
131
8
243
7539
1
1,00
8440
505
10
108
0
0,92
20354
1219
17
170
0
0,92
11477
687
16
180
0
0,92
7536
451
24
380
0
0,92
13173
789
17
340
0
0,92
913
55
31
627
0
0,92
27512
1647
5
100
0
0,92
7621580
870
14530
109000
14
226
45200
6
94
80160
10
166
122080
15
253
69840
9
145
1007150
125
2087
33440
4
69
Table 3G
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Summary of Table 2A - 2B: HTGB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Table 2A
Table 2B
MOSFET/IGBT
MOSFET/IGBT
discrete device
Module
128
41
235
7437
0
0,92
17747
5725
16
160
0
0,92
7165320
889
2756
51840
6
20
Summary of Tables 3A - 3G: Power Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
IXYS Semiconductor GmbH
Table 3A
Table 3B
Table 3C
Table3D
Table 3E
Table 3F
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
256
6504
0
88302000
3
40
0
1000000
9
90
0
1800000
6
60
0
210000
12
240
0
480000
17
280
0
610000
3
19
350
1
790000
Summary of Tables 4A - 4H: Temperature Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 4A
Table 4B
Table 4C**
Table4D
Table 4E
Table 4F
Table 4G
Table 4H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
294
8510
0
7643800
15
170
0
10350
13
125
0
6250
18
220
0
12300
30
570
0
29100
14
280
0
15000
37
729
0
43030
4
80
0
4000
** Max. storage temperature specified = 125°C. For accelleration temperature cycling conditions Tmax = 150°C applied
Summary of Tables 5A - 5H: Humidity Test
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
Table 5A
Table 5B
Table 5C
Table5D
Table 5E
Table 5F
Table 5G
Table 5H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
102
3420
0
426688
9
89
0
56552
3
25
0
8360
7
70
0
35520
4
80
0
5760
7
160
0
66720
4
80
0
3840
Summary of Tables 6A: H³TRB
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
IXYS Semiconductor GmbH
12
240
0
17760
Summary of Tables 7A: HAST
Table 6A
Table 6B
Table 6C
Table 6G
Table 7A
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Thyr./Diode
MOSFET/IGBT
discrete device
Module
Module
discrete device
4
194
0
194000
2
20
0
20000
1
10
0
10000
2
87
0
87000
4
discrete device
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
217
6735
0
646560
HTRB (Tables 1A .. 1H)
TABLE 1A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM160-0055P3 SL
4272
2 GWM160-0055X2 SL
3580
3 IXA12IF1200TC
3543
4 IXA20IF1200HB
3927
5 IXA20PG1200DHG LA
4228
6 IXA20PG1200DHG LB
3581
7 IXA20PT1200LB
4363
8 IXA20PT1200LB
4363
9 IXA27IF1200HJ
3376
10 IXA4IF1200UC
3116
11 IXBF55N300
TP1243
12 IXBH16N170A
TP1221
13 IXBH40N160
3496
14 IXBH40N160
3795
15 IXBH9N160G
3075
16 IXBT24N170
TP1202
17 IXBX64N250
TP0952
18 IXBX64N250
TP1130
19 IXBX75N170
TP1031
20 IXCH36N250
TP1139
21 IXD50IF600HB
3868
22 IXDH20N120
3356
23 IXDH30N120D1
4058
24 IXDH35N60BD1
3229
25 IXDN55N120D1
4404
26 IXER35N120D1
3607
27 IXFA4N100Q
TS1108
28 IXFB100N50P
TP1110
29 IXFB100N50Q3
SP1106
30 IXFB110N60P3
SP1110
31 IXFB132N50P3
SP1110
32 IXFB210N30P3
SP1224
33 IXFB38N100Q2
TP1115
34 IXFB44N100Q3
SP1106
35 IXFB62N80Q3
SP1118
36 IXFB82N60Q3
SP1118
37 IXFD64N50P
3195
38 IXFH100N25P
SS1049
39 IXFH120N25T
SS1115
40 IXFH120N25T
SP1141
41 IXFH12N100F
SS1104
42 IXFH12N100F
SS1052
43 IXFH12N100F
SS1052
44 IXFH12N80P
SS1051
45 IXFH150N17T2
SS1341
46 IXFH150N20T
SP1147
47 IXFH15N100P
TP1202
48 IXFH15N100Q3
SP1121
49 IXFH15N60
SS1104
50 IXFH160N15T2
SS1319
51 IXFH16N50P3
SP1207
52 IXFH16N60P3
SS1142
IXYS Semiconductor GmbH
Voltage
[V]
44
44
960
960
960
960
840
960
960
960
2400
960
1280
1260
1280
960
960
960
960
960
520
960
960
480
960
960
800
400
400
480
400
240
800
800
640
480
400
200
200
200
800
800
800
640
136
160
800
800
480
120
400
480
Temp.
[°C]
125
150
125
125
125
125
125
125
125
150
90
125
125
125
125
125
85
125
125
90
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
168
168
168
1000
1000
1000
1000
1000
1000
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
20
77
20
20
20
20
20
20
20
20
30
30
20
20
20
30
30
30
30
30
20
20
20
20
10
20
30
30
30
30
30
30
30
30
30
30
72
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
5
Failures
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
3360
77000
20000
3360
20000
20000
20000
20000
20000
20000
30000
30000
3360
3360
3360
30000
30000
30000
30000
30000
20000
3360
3360
3360
1680
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
72000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
I_CES increased
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
53 IXFH18N100Q3
SP1136
800
54 IXFH18N90P
TP1202
720
55 IXFH20N50P3
SP1141
400
56 IXFH20N80P
SS1121
640
57 IXFH22N60P3
SS1108
480
58 IXFH22N60P3
SP1318
400
59 IXFH26N50
TS1331
500
60 IXFH26N50P3
SS1206
400
61 IXFH26N50P3
TP1325
400
62 IXFH26N50Q
TS1343
500
63 IXFH28N60P3
SS1105
480
64 IXFH30N50Q3
SS1117
400
65 IXFH40N30Q
SS1020
240
66 IXFH42N60P3
SP1110
480
67 IXFH44N50Q3
SP1133
400
68 IXFH50N30Q3
SP1117
240
69 IXFH50N60P3
SP1109
480
70 IXFH50N60P3
SP1201
480
71 IXFH60N50P3
SP1109
400
72 IXFH60N50P3
TP1326
400
73 IXFH70N20Q3
SS1117
160
74 IXFH70N30Q3
SP1133
240
75 IXFH7N100P
TP1143
800
76 IXFH88N30P
TP1237
240
77 IXFH94N30T
SS1115
240
78 IXFH94N30T
SP1141
240
79 IXFK120N25P
TP1239
200
80 IXFK140N30P
TP1242
240
81 IXFK230N20T
SP1106
160
82 IXFK230N20T
SP1106
160
83 IXFK26N120P
TP1102
960
84 IXFK38N80Q2
TP1105
640
85 IXFK420N10T
SP1046
80
86 IXFK420N10T
SP1347
100
87 IXFK44N80P
TP1219
640
88 IXFK64N50P
TP1242
400
89 IXFK80N60P3
SP1150
480
90 IXFK90N50P2
TP1333
400
91 IXFK90N50P2
TP1337
500
92 IXFK94N50P2
SP1051
400
93 IXFK94N50P2
SP1111
400
94 IXFK94N50P2
SF1211
480
95 IXFN100N25
SS1309
200
96 IXFN150N15
SS1309
120
97 IXFN170N30P
SP1045
240
98 IXFN32N120P
TP1230
960
99 IXFN38N100P
TP1230
800
100 IXFN44N60
SP1103
480
101 IXFN90N30
TS1309
240
102 IXFP110N15T2
SS1332
120
103 IXFP14N60P3
SS1144
480
104 IXFP170N075T2
US1310
60
105 IXFP180N10T2
SS1305
80
106 IXFP22N60P3
TS1324
480
107 IXFP230N075T2
US1309
60
108 IXFP4N60P3
SS1143
480
109 IXFP5N50P3
SS1206
400
110 IXFP7N60P3
SS1143
480
111 IXFQ94N30P3
SS1321
240
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
77
30
30
30
30
30
30
23
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
22
30
30
30
77
77
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
6
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
112 IXFR32N100Q3
SP1133
800
113 IXFR66N50Q2
TP1122
400
114 IXFT14N80P
SP0731
640
115 IXFT20N100P
TP1147
800
116 IXFX20N120P
TS1337
960
117 IXFX24N100Q3
SP1137
800
118 IXFX26N120P
TP1102
960
119 IXFX32N100Q3
TP1229
800
120 IXFX32N80Q3
SS1122
640
121 IXFX32N90P
TS1122
720
122 IXFX44N80Q3
SP1123
640
123 IXFX44N80Q3
TP1226
640
124 IXFX48N60Q3
SS1118
480
125 IXFX64N50P
2924
200
126 IXFX64N50Q3
SP1118
400
127 IXFX64N60P3
SP1110
480
128 IXFX64N60Q3
SS1118
480
129 IXFX78N50P3
SP1109
400
130 IXFX80N50Q3
SP1106
400
131 IXFX80N60P3
SP1109
480
132 IXFX98N50P3
SP1110
400
133 IXGA20N250HV
TS1222
960
134 IXGA24N170A
TS1215
960
135 IXGH100N30C3
SS1250
240
136 IXGH24N170A
TP0917
960
137 IXGH2N250
TP1010
960
138 IXGH32N60B
TP1205
480
139 IXGH40N120B2D1
TP0940
960
140 IXGH48N60C3D1
TP1148
480
141 IXGH50N60C4
SP1133
480
142 IXGK120N120B3
TP1143
960
143 IXGK120N60B3
SP1146
480
144 IXGK75N250
TP1110
960
145 IXGK75N250
TP1047
960
146 IXGT32N120A3
TP1121
960
147 IXKH70N60C5
3639
480
148 IXKR40N60C
3077
480
149 IXSH45N120
TP1204
960
150 IXSN55N120AU1
TP1017
960
151 IXTA1N100
TS1047
800
152 IXTA3N120
TS1115
960
153 IXTA62N15P
SS1047
120
154 IXTA80N10T
SS1150
80
155 IXTF02N450
TP1329
3000
156 IXTH12N140
TP1119
960
157 IXTH12N150
TP1206
960
158 IXTH140P10T
SP1130
-80
159 IXTH16P60P
TS1316
-480
160 IXTH1N200P3
TP1338
960
161 IXTH1N80P
TP0905
640
162 IXTH200N10T
SP1319
80
163 IXTH20N65X
SS1344
520
164 IXTH20P50P
TP1309
-400
165 IXTH3N120
TS1136
960
166 IXTH48P20P
SS1050
-160
167 IXTH48P20P
SS1105
-160
168 IXTH48P20P
SP1049
-160
169 IXTH4N150
TS1151
960
170 IXTH4N150
TP1149
960
171 IXTH68P20T
SP1130
-160
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
85
125
125
125
125
125
125
85
90
125
125
125
125
125
125
125
125
125
90
85
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
80
30
30
30
30
30
30
30
10
30
30
30
30
30
30
30
30
30
30
30
77
30
20
20
30
30
30
30
30
77
22
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
7
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
80000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
172 IXTH6N100D2
TP1202
800
173 IXTH6N150
TP1201
960
174 IXTH76P10T
SS1052
-80
175 IXTH96P085T
SS1302
-68
176 IXTK550N055T2
SP1239
44
177 IXTK550N055T2
UP1242
44
178 IXTK550N055T2
UP1250
44
179 IXTK550N055T2
UP1251
44
180 IXTL2N450
TP1239
3000
181 IXTM21N50
SP1023
400
182 IXTP02N120P
TS1307
960
183 IXTP100N04T2
SS1341
40
184 IXTP102N15T
K834
120
185 IXTP110N055T2
SS1332
55
186 IXTP120P065T
SS1013
-52
187 IXTP130N10T
SS1318
80
188 IXTP1N80P
SS0908
640
189 IXTP200N055T2
US1310
44
190 IXTP20N65X
HS1332
520
191 IXTP220N04T2
SS1051
32
192 IXTP260N055T2
SS1338
55
193 IXTP2N100P
TS1332
800
194 IXTP32N20T
SS1051
160
195 IXTP3N50P
SS1048
400
196 IXTP450P2
SS1047
400
197 IXTP460P2
TS1332
400
198 IXTP76P10T
TS1332
-80
199 IXTP80N10T
SS1150
80
200 IXTP80N10T
SS1318
80
201 IXTP80N12T2
SS1043
96
202 IXTP8N50P
SS1050
400
203 IXTQ110N10P
SS1045
80
204 IXTQ170N10P
SS1041
80
205 IXTQ200N10T
SS1125
80
206 IXTQ200N10T
SS1125
80
207 IXTQ22N60P
SK1040
480
208 IXTQ22N60P
SS1104
480
209 IXTQ36N30P
SS1029
240
210 IXTQ460P2
SS1236
400
211 IXTR170P10P
SP1106
-80
212 IXTT140P10T
SP1142
-80
213 IXTT60N20L2
TP1005
160
214 IXTT6N150
TP1203
960
215 IXTT80N20L
TP1046
160
216 IXTV03N400S
TP1134
960
217 IXTX120P20T
SP1133
-160
218 IXTX200N10L2
TP1137
80
219 IXTX20N140
TP1126
960
220 IXTX210P10T
SP1130
-80
221 IXXH100N60C3
TP1101
480
222 IXXH50N60B3
SS1105
480
223 IXXH50N60B3D1
TP1150
480
224 IXXH50N60C3
SS1105
480
225 IXXH60N65B4
SP1235
520
226 IXXH60N65C4
SP1236
520
227 IXXH80N65B4H1
SP1319
520
228 IXYH24N90C3
TS1144
720
229 IXYH30N120C3
TP1137
960
230 IXYH40N120C3
TP1137
960
231 IXYH40N90C3
TS1205
720
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
90
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
8
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
232 IXYH50N120C3
TP1137
960
233 IXYH60N90C3
SS1205
720
234 IXYH75N65C3
TS1341
650
235 IXYH80N90C3
TP1205
720
236 IXYH82N120C3
TP1115
960
237 IXYN100N65C3H1
TS1346
650
238 IXYP10N65C3
TS1319
520
239 IXYP8N90C3
TS1144
720
240 IXYT20N120C3D1HV
TS1247
960
241 IXYX100N120C3
TP1137
960
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
Failures
TABLE 1B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MID200-12A4
3326
2 MIXA100W1200TEH
3248
3 MIXA40WB1200TED
4543
4 MIXA50WB600TED
4090
5 MIXA81WB1200TEH
4012
6 MIXD80PM650TMI
4249
7 MUBW50-06A7
3128
8 VKM60-01P1
4029
9 VMM300-03FP
4201
10 VMM90-09F
3214
Voltage
[V]
960
960
960
520
1120
520
1120
80
240
720
Temp.
[°C]
125
125
125
150
125
125
125
125
125
125
Time
[hrs]
168
1000
1000
1000
1000
1000
1000
168
168
168
Sample
Size
20
10
10
10
10
10
8
10
10
10
Failures
TABLE 1C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC21-16
3584
2 MCC26-16
3854
3 MCC26-16io1B
4169
4 MCC312
4064
5 MCC312-16
3511
6 MCC312-16io1
3099
7 MCC44-16
3969
8 MCC56-16io1
3127
9 MCC56-16io1
3733
10 MCC56-18
3129
11 MCC95-14io1B
4075
12 MCC95-16io1B
3276
13 MCO150-16io1
3339
14 MDD172
3465
15 MDD172-12
3331
16 MDD312-16N1
3301
17 MDD95-22
4395
Voltage
[V]
1120
1120
1120
1120
1120
1120
1120
1120
1120
1260
980
1120
1120
1260
1260
1120
1540
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
168
168
168
168
168
168
1000
168
168
168
1000
168
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
IXYS Semiconductor GmbH
9
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
Device Hours
[hrs]
3360
10000
10000
10000
10000
10000
8000
1680
1680
1680
Remark
Device Hours
[hrs]
1680
1680
1680
1680
1680
1680
1680
1680
1680
10000
1680
1680
1680
10000
1680
1680
1680
Remark
TABLE 1D: Controller/Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MMO90-14io6
3604
2 VBO21-12NO7
3587
3 VUB145-16NOXT
4154
4 VUB145-16NOXT
4154
5 VUC36-16go2
3320
6 VUC36-16go2
3320
7 VUI72NOXT
3955
8 VUI72NOXT
3955
9 VUO155-16
3101
10 VUO34-18NO1
4362
11 VUO36-16NO8
3806
12 VUO52
3118
13 VUO52-16
3887
14 VUO52-16
3887
15 VUO52-16NO1
3655
16 VUO82-16NO7
3087
Voltage
[V]
980
840
960
1120
1120
1120
1120
960
1120
1260
1120
1400
1120
1120
1120
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
1000
1000
168
168
168
168
168
168
168
1000
1000
1000
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
20
10
20
10
10
10
10
Failures
Voltage
[V]
480
480
160
240
960
960
960
160
480
480
960
480
800
480
480
960
960
960
480
480
480
480
960
480
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
168
168
1000
168
1000
168
168
168
168
168
168
168
168
168
168
168
168
168
168
168
168
168
Sample
Size
20
20
20
20
20
20
10
10
10
10
10
10
20
20
20
20
20
10
10
20
20
20
10
10
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1680
1680
10000
10000
1680
1680
1680
1680
1680
3360
1680
20000
10000
10000
1680
1680
Remark
Device Hours
[hrs]
20000
20000
3360
3360
20000
3360
10000
1680
1680
1680
1680
1680
3360
3360
3360
3360
3360
1680
1680
3360
3360
3360
1680
1680
Remark
TABLE 1E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
DHG30IM600PC
DHG60I600HA
DPG30C200HB
DPG80C300HB
DSEC120-12AK
DSEC60-12A
DSEI2x101-12A
DSEI2x121-02A
DSEI2x31-06C
DSEI2x31-06P
DSEI2x61-12B
DSEI2x61-12B
DSEI30-10A
DSEI60-06A
DSEP15-06B
DSEP15-12CR
DSEP29-12A
DSEP2x31-12A
DSEP2x61-06A
DSEP30-06BR
DSEP60-06A
DSEP75-06AR
MEE250-12DA
MEK95-06DA
IXYS Semiconductor GmbH
Date Code
or
Test #
3393
4513
3925
3796
4438
4456
3325
4063
3738
3461
4146
4317
3069
4037
4328
4034
3183
3226
3954
3715
3595
3343
3644
3212
10
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
TABLE 1F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
DSA20C100PN
DSA20C150PB
DSA30C45PB
DSA50C100QB
DSA70C150HB
DSA90C200HR
DSB80C45HB
DSSK60-002A
DSSK60-0045A
DSSK60-015A
DSSK80-0025B
DSSK80-0025B
DSSK80-003B
DSSK80-0045B
DSSK80-006B
DSSK80-006BR
DSSS35-008AR
Date Code
or
Test #
3801
4209
4295
3451
3350
3794
4036
4494
3608
3181
3199
3699
3072
4101
4130
3928
3446
TABLE 1G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 CLA50E1200HB
4140
2 CLB30I1200HB
4104
3 CLF20E1200PB
4038
4 CMA50E1600TZ
4331
5 CS19-12ho1
3736
6 CS22-12io1M
3187
7 CS30-12io1
3344
8 CS35-14io4
3090
9 CS45-16io1
3180
10 CS45-16io1R
4459
11 CSM401B
3377
12 CSM401B
3377
13 CSM410LB
4152
14 DLA100B1200LB
4351
15 DMA10I1600PA
3799
16 DMA10I1600PA
4324
17 DS2-08A
4015
18 DSA1-16D
4440
19 DSA17-18A
3856
20 DSA9-18
3337
21 DSA9-18F
4292
22 DSAI35-16A
3708
23 DSDI60-14A
3929
24 DSI30-12A
3610
25 DSI45-16A
3443
26 DSI45-16AR
4161
27 DSP109-3300V
4305
28 DSP109-3300V
4305
29 DSP109-3300V
4305
30 DSP25-16AR
4320
31 DSP45-16A
3068
Voltage
[V]
100
120
45
100
150
200
36
200
45
150
20
20
24
36
48
48
80
Temp.
[°C]
125
125
125
125
125
125
100
125
125
125
100
100
100
100
100
100
125
Time
[hrs]
168
1000
168
168
168
168
1000
168
168
168
1000
1000
1000
1000
1000
1000
168
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
Failures
Voltage
[V]
840
840
840
1120
840
840
840
980
1120
1120
2000
2000
1680
960
1120
1120
560
1120
1260
1260
1260
1120
1120
840
1120
1120
2310
2310
2640
1120
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
60
80
125
150
150
150
150
150
150
150
150
150
125
150
150
150
125
150
150
150
150
Time
[hrs]
168
1000
168
1000
168
168
168
168
168
168
350
650
1000
1000
168
168
168
1000
168
168
168
168
168
168
168
168
168
168
1000
168
168
Sample
Size
20
20
20
20
20
20
20
10
20
20
10
10
20
77
20
20
10
40
20
10
10
10
20
20
20
20
20
20
20
20
20
Failures
Voltage
[V]
480
640
640
720
800
Temp.
[°C]
125
125
125
125
125
Time
[hrs]
168
168
1000
168
168
Sample
Size
20
20
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
3360
20000
3360
3360
3360
3360
20000
3360
3360
3360
20000
20000
20000
20000
20000
20000
3360
Remark
Device Hours
[hrs]
3360
20000
3360
20000
3360
3360
3360
1680
3360
3360
3500
6500
20000
77000
3360
3360
1680
40000
3360
1680
1680
1680
3360
3360
3360
3360
3360
3360
20000
3360
3360
Remark
Device Hours
[hrs]
3360
3360
20000
3360
3360
Remark
TABLE 1H: Breakover Diode
#
Part Number
1
2
3
4
5
IXBOD1-06
IXBOD1-08
IXBOD1-08
IXBOD1-09
IXBOD1-10
IXYS Semiconductor GmbH
Date Code
or
Test #
3458
3079
4212
4041
3721
11
0
0
0
0
0
HTGB (Tables 2A .. 2B)
TABLE 2A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1
GWM160-0055X2 SL
3580
2
IXA20PG1200DHG LB
3581
3
IXA20PT1200LB
4363
4
IXA40PG1200DHGLA
3211
5
IXBF55N300
TP1243
6
IXBH16N170A
TP1221
7
IXBT24N170
TP1202
8
IXBX64N250
TP0952
9
IXBX64N250
TP1130
10 IXBX75N170
TP1031
11 IXCH36N250
TP1139
12 IXD50IF600HB
3868
13 IXDN75N120
3952
14 IXER35N120D1
3802
15 IXFA4N100Q
TS1108
16 IXFB100N50P
TP1110
17 IXFB100N50Q3
SP1106
18 IXFB110N60P3
SP1110
19 IXFB132N50P3
SP1110
20 IXFB210N30P3
SP1224
21 IXFB38N100Q2
TP1115
22 IXFB44N100Q3
SP1106
23 IXFB62N80Q3
SP1118
24 IXFB82N60Q3
SP1118
25 IXFD64N50P
3195
26 IXFH100N25P
SS1049
27 IXFH120N25T
SS1115
28 IXFH120N25T
SP1141
29 IXFH12N100F
SS1104
30 IXFH12N100F
SS1052
31 IXFH12N100F
SS1052
32 IXFH12N80P
SS1051
33 IXFH12N90
TS1344
34 IXFH150N17T2
SS1341
35 IXFH150N20T
SP1147
36 IXFH15N100P
TP1202
37 IXFH15N100Q3
SP1121
38 IXFH15N60
SS1104
39 IXFH160N15T2
SS1319
40 IXFH16N50P3
SP1207
41 IXFH16N60P3
SS1142
42 IXFH18N100Q3
SP1136
43 IXFH18N90P
TP1202
44 IXFH20N50P3
SP1141
45 IXFH20N80P
SS1121
46 IXFH22N60P3
SS1108
47 IXFH22N60P3
SP1318
48 IXFH26N50
TS1331
49 IXFH26N50P3
SS1206
50 IXFH26N50P3
TP1325
51 IXFH26N50Q
TS1343
52 IXFH28N60P3
SS1105
53 IXFH30N50Q3
SS1117
54 IXFH40N30Q
SS1020
55 IXFH42N60P3
SP1110
56 IXFH44N50Q3
SP1133
57 IXFH50N30Q3
SP1117
58 IXFH50N60P3
SP1109
59 IXFH50N60P3
SP1201
60 IXFH60N50P3
SP1109
IXYS Semiconductor GmbH
Voltage
[V]
15
16
16
16
25
20
20
16
16
16
20
16
16
16
16
24
24
24
24
16
16
24
24
24
30
16
16
16
16
16
16
16
20
20
16
24
24
16
16
24
24
24
16
16
24
24
30
20
24
30
20
24
16
16
24
24
16
24
16
24
Temp.
[°C]
150
150
150
150
125
125
125
85
125
125
125
150
150
150
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
100
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
77
20
20
20
30
30
30
30
30
30
30
20
20
20
30
30
30
30
30
30
30
30
30
30
72
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
23
30
30
30
30
30
30
30
30
30
30
12
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
77000
2000
20000
20000
30000
30000
30000
30000
30000
30000
30000
20000
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
72000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
61 IXFH60N50P3
TP1326
30
62 IXFH70N20Q3
SS1117
16
63 IXFH70N30Q3
SP1133
24
64 IXFH7N100P
TP1143
24
65 IXFH88N30P
TP1237
16
66 IXFH94N30T
SS1115
16
67 IXFH94N30T
SP1141
16
68 IXFK120N25P
TP1239
16
69 IXFK140N30P
TP1242
16
70 IXFK230N20T
SP1106
16
71 IXFK230N20T
SP1106
16
72 IXFK26N120P
TP1102
16
73 IXFK38N80Q2
TP1105
24
74 IXFK420N10T
SP1046
16
75 IXFK420N10T
SP1347
20
76 IXFK44N80P
TP1219
24
77 IXFK64N50P
TP1242
30
78 IXFK80N60P3
SP1150
24
79 IXFK90N50P2
TP1333
30
80 IXFK90N50P2
TP1337
20
81 IXFK94N50P2
SP1051
16
82 IXFK94N50P2
SP1111
30
83 IXFK94N50P2
SF1211
24
84 IXFN100N25
SS1309
16
85 IXFN150N15
SS1309
16
86 IXFN170N30P
SP1045
16
87 IXFN32N120P
TP1230
24
88 IXFN38N100P
TP1230
24
89 IXFN44N60
SP1103
16
90 IXFN90N30
TS1309
16
91 IXFP110N15T2
SS1332
20
92 IXFP14N60P3
SS1144
24
93 IXFP170N075T2
US1310
16
94 IXFP180N10T2
SS1305
16
95 IXFP22N60P3
TS1324
16
96 IXFP230N075T2
US1309
16
97 IXFP4N60P3
SS1143
24
98 IXFP5N50P3
SS1206
24
99 IXFP7N60P3
SS1143
24
100 IXFQ94N30P3
SS1321
20
101 IXFR32N100Q3
SP1133
16
102 IXFR66N50Q2
TP1122
24
103 IXFT14N80P
SP0731
16
104 IXFT20N100P
TP1147
16
105 IXFX20N120P
TS1337
30
106 IXFX24N100Q3
SP1137
24
107 IXFX26N120P
TP1102
16
108 IXFX32N100Q3
TP1229
24
109 IXFX32N80Q3
SS1122
24
110 IXFX32N90P
TS1122
24
111 IXFX44N80Q3
SP1123
24
112 IXFX44N80Q3
TP1226
30
113 IXFX48N60Q3
SS1118
24
114 IXFX64N50P
2924
20
115 IXFX64N50Q3
SP1118
24
116 IXFX64N60P3
SP1110
24
117 IXFX64N60P3
TS1337
20
118 IXFX64N60Q3
SS1118
24
119 IXFX78N50P3
SP1109
24
120 IXFX78N50P3
TS1337
20
121 IXFX80N50Q3
SP1106
24
122 IXFX80N60P3
SP1109
24
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
77
30
30
30
30
30
30
30
22
30
30
30
77
77
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
80
30
30
30
30
30
30
30
30
13
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
80000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
123 IXFX98N50P3
SP1110
24
124 IXGA20N250HV
TS1222
16
125 IXGH100N30C3
SS1250
16
126 IXGH24N170A
TP0917
16
127 IXGH2N250
TP1010
16
128 IXGH32N60B
TP1205
16
129 IXGH40N120B2D1
TP0940
16
130 IXGH48N60C3D1
TP1148
16
131 IXGH50N60C4
SS1052
16
132 IXGH50N60C4
SP1133
16
133 IXGK120N120B3
TP1143
16
134 IXGK120N60B3
SP1146
16
135 IXGK75N250
TP1110
16
136 IXGK75N250
TP1047
16
137 IXGT32N120A3
TP1121
16
138 IXKH35N60C5
4159
16
139 IXKH70N60C5
3359
16
140 IXKN40N60C
4453
16
141 IXKN75N60C
3094
16
142 IXKR40N60C
3360
16
143 IXKR40N60C
4031
16
144 IXSH45N120
TP1204
16
145 IXSN55N120AU1
TP1017
16
146 IXTA1N100
TS1047
16
147 IXTA3N120
TS1115
16
148 IXTA62N15P
SS1047
16
149 IXTA80N10T
SS1150
20
150 IXTH12N140
TP1119
16
151 IXTH12N150
TP1206
24
152 IXTH140P10T
SP1130
-12
153 IXTH16P60P
TS1316
16
154 IXTH1N200P3
TP1338
20
155 IXTH1N80P
TP0905
16
156 IXTH200N10T
SP1319
30
157 IXTH20N65X
SS1344
30
158 IXTH20P50P
TP1309
16
159 IXTH3N120
TS1136
20
160 IXTH48P20P
SS1050
-16
161 IXTH48P20P
SS1105
-16
162 IXTH48P20P
SP1049
-16
163 IXTH4N150
TS1151
24
164 IXTH4N150
TP1149
24
165 IXTH68P20T
SP1130
-12
166 IXTH6N100D2
TP1202
16
167 IXTH6N150
TP1201
16
168 IXTH76P10T
SS1052
-16
169 IXTH96P085T
SS1302
16
170 IXTK550N055T2
SP1239
16
171 IXTK550N055T2
UP1250
16
172 IXTK550N055T2
UP1251
16
173 IXTL2N450
TP1239
16
174 IXTM21N50
SP1023
16
175 IXTP02N120P
TS1307
20
176 IXTP100N04T2
SS1341
20
177 IXTP102N15T
K834
16
178 IXTP110N055T2
SS1332
20
179 IXTP120P065T
SS1013
-16
180 IXTP130N10T
SS1318
16
181 IXTP1N80P
SS0908
16
182 IXTP200N055T2
US1310
16
183 IXTP20N65X
HS1332
20
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
85
125
150
150
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
10
30
30
30
30
30
30
30
30
30
30
30
77
30
20
20
20
20
20
20
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
14
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
3360
3360
3360
3360
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
184 IXTP220N04T2
SS1051
16
185 IXTP260N055T2
SS1338
20
186 IXTP2N100P
TS1332
20
187 IXTP32N20T
SS1051
16
188 IXTP3N50P
SS1048
16
189 IXTP450P2
SS1047
16
190 IXTP460P2
TS1332
30
191 IXTP76P10T
TS1332
15
192 IXTP80N10T
SS1150
16
193 IXTP80N10T
SS1318
16
194 IXTP80N12T2
SS1043
16
195 IXTP8N50P
SS1050
16
196 IXTQ110N10P
SS1045
16
197 IXTQ170N10P
SS1041
16
198 IXTQ200N10T
SS1125
24
199 IXTQ200N10T
SS1125
24
200 IXTQ22N60P
SK1040
16
201 IXTQ22N60P
ss1104
16
202 IXTQ36N30P
SS1029
16
203 IXTQ460P2
SS1236
24
204 IXTR170P10P
SP1106
-16
205 IXTT140P10T
SP1142
-12
206 IXTT16N20D2
TP1019
16
207 IXTT60N20L2
TP1005
16
208 IXTT6N150
TP1203
20
209 IXTT80N20L
TP1046
16
210 IXTV03N400S
TP1134
16
211 IXTX120P20T
SP1133
-12
212 IXTX200N10L2
TP1137
16
213 IXTX20N140
TP1126
24
214 IXTX210P10T
SP1130
-12
215 IXXH100N60C3
TP1101
16
216 IXXH50N60B3
SS1105
16
217 IXXH50N60B3D1
TP1150
20
218 IXXH50N60C3
SS1105
16
219 IXXH60N65B4
SP1235
16
220 IXXH60N65C4
SP1236
16
221 IXXH80N65B4H1
SP1319
16
222 IXYH24N90C3
TS1144
16
223 IXYH30N120C3
TP1137
16
224 IXYH40N120C3
TP1137
16
225 IXYH40N90C3
TS1205
16
226 IXYH50N120C3
TP1137
16
227 IXYH60N90C3
SS1205
16
228 IXYH75N65C3
TS1341
20
229 IXYH80N90C3
TP1205
16
230 IXYH82N120C3
TP1115
16
231 IXYN100N65C3H1
TS1346
20
232 IXYP8N90C3
TS1144
16
233 IXYT20N120C3D1HV
TS1247
16
234 IXYX100N120C3
TP1137
16
235 MKE38P600LB
4179
16
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
15
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
1680
Remark
TABLE 2B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MDI75-12A3
3936
2 MID200-12A4
3328
3 MIXA20W1200MC
3089
4 MIXA30WB1200TED
3945
5 MIXA60HU1200VA
3920
6 MIXA81WB1200TEH
4012
7 MUBW35-06A6K
3826
8 MWI100-12E8
3677
9 MWI35-12A7
4019
10 VKM60-01P1
3588
11 VMM90-09F
3217
12 VUB145-16NOXT
3281
13 VUB145-16NOXT
4154
14 VUB160-16NO2
4018
15 VUM33-06PH
3302
16 VVZB170-16IOXT
3282
IXYS Semiconductor GmbH
Voltage
[V]
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
168
1000
1000
168
168
168
168
168
168
1000
168
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
16
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1680
1680
1680
1680
10000
10000
1680
1680
1680
1680
1680
1680
10000
1680
1680
1680
Remark
POWER CYCLE (Tables 3A .. 3G)
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
1 GWM160-0055X2 SL
3580
125
2 IXA12IF1200TC
3543
125
3 IXA20PG1200DHG LA
4228
125
4 IXA20PG1200DHG LB
3581
125
5 IXA20PG1200DHGLA
3211
125
6 IXBF55N300
TP1243
7 IXBH16N170A
TP1221
8 IXBH40N160
3243
125
9 IXBH5N160G
4139
125
10 IXBH9N160G
3357
125
11 IXBT24N170
TP1202
12 IXBX64N250
TP0952
13 IXBX64N250
TP1130
14 IXBX75N170
TP1031
15 IXD50IF600HB
3868
125
16 IXDH20N120D1
3591
125
17 IXFA4N100Q
TS1108
18 IXFB100N50P
TP1110
19 IXFB100N50Q3
SP1106
20 IXFB110N60P3
SP1110
21 IXFB120N50P2
SP1015
22 IXFB132N50P3
SP1110
23 IXFB170N30P
SP0842
24 IXFB210N30P3
SP1224
25 IXFB38N100Q2
TP1115
26 IXFB44N100P
TP0930
27 IXFB44N100Q3
SP1106
28 IXFB60N80PK
TS1349
29 IXFB62N80Q3
SP1118
30 IXFB82N60P
SP0851
31 IXFB82N60Q3
SP1118
32 IXFH100N25P
SS1049
33 IXFH120N25T
SS1115
34 IXFH120N25T
SP1141
35 IXFH12N100F
SS1052
36 IXFH12N90
SS0911
37 IXFH150N17T2
SS1341
38 IXFH150N20T
SP1147
39 IXFH15N100P
TP1202
40 IXFH15N100Q3
SP1121
41 IXFH160N15T2
SS1319
42 IXFH16N50P3
SP1207
43 IXFH16N60P3
SS1142
44 IXFH18N100Q3
SP11136
45 IXFH18N90P
TP1202
46 IXFH20N50P3
SP1141
IXYS Semiconductor GmbH
∆Τ
[K]
100
80
80
80
80
100
100
80
80
80
100
100
100
100
80
80
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
6000
4000
80000
80000
8000
15000
15000
2000
2000
2000
15000
10000
10000
10000
4000
2000
10000
15000
15000
10000
15000
15000
10000
15000
15000
15000
10000
15000
15000
15000
15000
15000
10000
10000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
Sample
Size
77
20
20
20
10
24
24
20
20
20
24
24
24
24
20
20
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
77
24
24
24
24
24
24
24
24
24
24
77
24
16
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
462000
80000
1600000
1600000
80000
360000
360000
40000
40000
40000
360000
240000
240000
240000
80000
40000
240000
360000
360000
240000
360000
360000
240000
360000
360000
360000
240000
360000
360000
360000
360000
360000
240000
770000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
1155000
360000
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
47 IXFH20N80P
SS1121
48 IXFH22N60P3
SS1108
49 IXFH22N60P3
SP1318
50 IXFH26N50P
K0843
51 IXFH26N50P3
SS1206
52 IXFH26N50P3
TP1325
53 IXFH28N60P3
SS1115
54 IXFH30N50P
SA0915
55 IXFH30N50Q3
SS1117
56 IXFH40N30Q
SS1020
57 IXFH40N30Q
TP0916
58 IXFH42N60P3
SP1110
59 IXFH44N50P
SA0915
60 IXFH44N50Q3
SP1133
61 IXFH50N30Q3
SP1117
62 IXFH50N60P3
SP1109
63 IXFH50N60P3
SP1201
64 IXFH52N50P2
SP1010
65 IXFH60N50P3
SP1109
66 IXFH60N50P3
TP1326
67 IXFH6N120P
TP0937
68 IXFH70N15
SP0850
69 IXFH70N20Q3
SS1117
70 IXFH70N30Q3
SP1133
71 IXFH74N20P
SS1039
72 IXFH7N100P
TP1143
73 IXFH88N30P
TP1237
74 IXFH94N30T
SS1115
75 IXFH94N30T
SP1141
76 IXFK120N25P
TP1239
77 IXFK140N30P
TP1242
78 IXFK160N30T
SP1120
79 IXFK230N20T
SP1106
80 IXFK230N20T
SP1116
81 IXFK26N120P
TP1102
82 IXFK38N80Q2
TP1105
83 IXFK420N10T
SP1046
84 IXFK420N10T
SP1347
85 IXFK44N80P
TP1219
86 IXFK64N50P
TP1242
87 IXFK90N50P2
TP1333
88 IXFK90N50P2
TP1337
89 IXFK94N50P2
SP1051
IXYS Semiconductor GmbH
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
10000
15000
15000
15000
15000
15000
10000
15000
15000
10000
10000
10000
15000
15000
10000
10000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
10000
15000
15000
15000
10000
15000
10000
10000
10000
15000
15000
15000
15000
15000
10000
Sample
Size
24
24
24
24
24
23
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
77
24
24
24
24
24
24
24
24
24
24
24
77
77
24
17
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
240000
360000
360000
360000
360000
345000
240000
360000
360000
240000
240000
240000
360000
360000
240000
240000
360000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
240000
770000
360000
360000
360000
240000
360000
240000
240000
240000
360000
360000
360000
1155000
1155000
240000
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
90 IXFK94N50P2
SP1111
91 IXFK94N50P2
SF1211
92 IXFN120N20
SS1301
93 IXFN32N120P
TP1230
94 IXFN38N100P
TP1230
95 IXFN82N60P
SS1301
96 IXFN90N30
TS1309
97 IXFP110N15T2
SS1332
98 IXFP14N60P3
SS1144
99 IXFP170N075T2
US1310
100 IXFP180N10T2
SS1305
101 IXFP22N60P3
TS1324
102 IXFP230N075T2
US1309
103 IXFP4N60P3
SS1143
104 IXFP5N50P3
SS1206
105 IXFP76N15T2
SS0920
106 IXFP7N60P3
SS1143
107 IXFQ94N30P3
SS1321
108 IXFR32N100Q3
SP1133
109 IXFR66N50Q2
TP1122
110 IXFT14N80P
SP0731
111 IXFT20N100P
TP1147
112 IXFX160N30T
SP0917
113 IXFX180N25T
SS0908
114 IXFX20N120P
TS1337
115 IXFX24N100Q3
SP1137
116 IXFX260N17T
SS0912
117 IXFX26N120P
TP1102
118 IXFX320N17T2
SP0931
119 IXFX32N100Q3
TP1229
120 IXFX32N80Q3
SS1122
121 IXFX32N90P
TS1122
122 IXFX44N80P
TS1332
123 IXFX44N80Q3
SP1123
124 IXFX44N80Q3
TP1226
125 IXFX48N50Q
SF0938
126 IXFX48N60Q3
SS1118
127 IXFX64N50Q3
SP1118
128 IXFX64N60P
TP1331
129 IXFX64N60P3
SP1110
130 IXFX64N60P3
SS1332
131 IXFX64N60P3
SS1332
132 IXFX64N60P3
SS1332
IXYS Semiconductor GmbH
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
15000
15000
15000
10000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
10000
15000
10000
15000
10000
10000
15000
15000
15000
15000
Sample
Size
77
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
23
24
24
24
15
24
24
24
24
24
15
24
15
15
15
18
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1155000
360000
360000
240000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
240000
360000
240000
360000
360000
360000
360000
360000
360000
345000
360000
360000
360000
150000
240000
360000
240000
360000
240000
150000
360000
225000
225000
225000
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
133 IXFX64N60P3
SS1335
134 IXFX64N60P3
SS1335
135 IXFX64N60P3
SS1335
136 IXFX64N60P3
SS1335
137 IXFX64N60P3
TS1337
138 IXFX64N60P3
SS1335
139 IXFX64N60Q3
SS1118
140 IXFX73N30Q
SF0938
141 IXFX78N50P3
SP1109
142 IXFX78N50P3
TS1337
143 IXFX80N50Q3
SP1106
144 IXFX80N60P3
SP1109
145 IXFX90N20Q
TP0849
146 IXFX98N50P3
SP1110
147 IXGA20N250HV
TS1222
148 IXGA24N170A
TS1215
149 IXGF25N250
TP1206
150 IXGH100N30C3
SS1250
151 IXGH2N250
TP1010
152 IXGH30N120B3
SS0920
153 IXGH30N60C3D1
SK0840
154 IXGH32N60B
TP1205
155 IXGH40N120B2D1
TP0940
156 IXGH40N120C3D1
TK0840
157 IXGH40N60A
TP1304
158 IXGH48N60C3D1
TP1148
159 IXGH50N60C4
SP1133
160 IXGH60N60C3D1
SS0931
161 IXGK120N120B3
TP1143
162 IXGK120N60B3
SP1146
163 IXGK75N250
TP1046
164 IXGP20N120A3
TS0905
165 IXGR72N60C3D1
SP0952
166 IXGT32N120A3
TP1121
167 IXKH35N60C5
3160
125
168 IXKR47N60C5
3188
145
169 IXSH45N120
TP1204
170 IXTA02N250
TS1222
171 IXTA3N120
TS1115
172 IXTA76P10T
SS1303
173 IXTA80N10T
SS1150
174 IXTA96P085T
SS1223
175 IXTA96P085T
SS1223
IXYS Semiconductor GmbH
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
80
100
100
100
100
100
100
100
100
Number
of
Cycles
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
10000
10000
15000
15000
10000
15000
15000
15000
10000
15000
15000
15000
10000
15000
15000
10000
2000
2000
15000
15000
10000
10000
10000
10000
10000
Sample
Size
24
24
24
24
24
15
24
24
24
24
24
24
24
24
24
24
17
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
20
20
24
24
24
24
77
24
24
19
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
360000
360000
360000
360000
360000
225000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
170000
360000
240000
240000
360000
360000
240000
360000
360000
360000
240000
360000
360000
360000
240000
360000
360000
240000
40000
40000
360000
360000
240000
240000
770000
240000
240000
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
176 IXTA96P085T
SS1223
177 IXTH12N140
TP1119
178 IXTH12N150
TP1206
179 IXTH140P10T
SP1130
180 IXTH16P60P
TS1316
181 IXTH1N200P3
TP1338
182 IXTH200N10T
SP1319
183 IXTH20N65X
SS1344
184 IXTH20P50P
TP1309
185 IXTH250N075T
SP0801
186 IXTH360N055T2
SP0926
187 IXTH3N120
TS1136
188 IXTH48P20P
SS1050
189 IXTH4N150
TS1151
190 IXTH4N150
TP1149
191 IXTH50P10
SS1033
192 IXTH68P20T
SP1130
193 IXTH6N150
TP1201
194 IXTH76P10T
SS1052
195 IXTH96P085T
SP0926
196 IXTH96P085T
SS1302
197 IXTK550N055T2
UP1242
198 IXTM21N50
SP1023
199 IXTP02N120P
TS1307
200 IXTP100N04T2
SS1341
201 IXTP102N15T
K834
202 IXTP10P15T
SS1038
203 IXTP120P065T
SS1013
204 IXTP130N10T
SS1318
205 IXTP15P15T
SS1036
206 IXTP1N80P
SS0908
207 IXTP200N055T2
US1310
208 IXTP20N65X
HS1332
209 IXTP220N04T2
SS1328
210 IXTP22N50PM
SS0924
211 IXTP260N055T2
SS1338
212 IXTP26P10T
SS1040
213 IXTP3N50P
S1048
214 IXTP460P2
TS1332
215 IXTP48P05T
SS1040
216 IXTP76P10T
TS1332
217 IXTP80N10T
SS1150
218 IXTP80N10T
SS1318
IXYS Semiconductor GmbH
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
10000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
10000
10000
15000
15000
10000
10000
15000
10000
10000
15000
15000
10000
15000
15000
15000
10000
10000
15000
15000
10000
15000
15000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
Sample
Size
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
240000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
240000
240000
360000
360000
240000
240000
360000
240000
240000
360000
360000
240000
360000
360000
360000
240000
240000
360000
360000
240000
360000
360000
360000
360000
360000
240000
360000
360000
360000
360000
360000
360000
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
219 IXTP80N12T2
SS1043
220 IXTQ130N15T
SS0920
221 IXTQ200N10T
SS1125
222 IXTQ200N10T
SS1125
223 IXTQ22N60P
SK1040
224 IXTQ450P2
SS1225
225 IXTQ460P2
SS1236
226 IXTQ88N28T
SK0842
227 IXTR170P10P
SP1106
228 IXTT140P10T
SP1142
229 IXTT16N20D2
TP1019
230 IXTT60N20L2
TP1005
231 IXTT6N150
TP1203
232 IXTT80N20L
TP1046
233 IXTX20N140
TP1126
234 IXTX210P10T
SP1130
235 IXTX24N100
SP0837
236 IXTX600N04T2
SP0945
237 IXTX8N150L
TP0912
238 IXXH100N60C3
TP1101
239 IXXH50N60B3
SS1105
240 IXXH50N60B3D1
TP1150
241 IXXH50N60C3
SS1105
242 IXXH60N65B4
SP1235
243 IXXH60N65C4
SP1236
244 IXXH80N65B4H1
SP1319
245 IXYH24N90C3
TS1144
246 IXYH30N120C3
TP1137
247 IXYH40N120C3
TP1137
248 IXYH40N90C3
TS1205
249 IXYH50N120C3
TP1137
250 IXYH60N90C3
SS1205
251 IXYH75N65C3
TS1341
252 IXYH80N90C3
TP1205
253 IXYH82N120C3
TP1115
254 IXYP8N90C3
TS1144
255 IXYT20N120C3D1HV
TS1247
256 IXYX100N120C3
TP1137
IXYS Semiconductor GmbH
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
15000
15000
15000
15000
10000
15000
15000
15000
10000
10000
10000
10000
15000
10000
10000
15000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
Sample
Size
24
24
24
24
24
24
24
24
24
77
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
21
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
360000
360000
360000
360000
240000
360000
360000
360000
240000
770000
240000
240000
360000
240000
240000
360000
360000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
Remark
TABLE 3B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MIX300/450
3751
2 MIXA60HU1200VA
3920
3 MKI75-06A7T
3740
Tj(max)
[°C]
125
125
125
∆Τ
[K]
80
80
80
Number
of
Cycles
70000
10000
10000
Sample
Size
10
20
10
Failures
Device Cycles
0
0
0
700000
200000
100000
TABLE 3C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCMA110P1600TA
3996
2 MCMA35P1400TA
3995
3 MCMA50P1600TA
4098
4 MCMA65P1600TA
3998
5 MCMA85P1600TA
3979
6 MDD172-16
3202
7 MDD26-16
3205
8 MDD95-16
3330
9 MDMA85P1600TG
3980
Tj(max)
[°C]
125
125
125
125
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
80
80
80
80
Number
of
Cycles
20000
20000
20000
20000
50000
10000
10000
10000
20000
Sample
Size
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
200000
200000
200000
200000
500000
100000
100000
100000
200000
TABLE 3D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 VUO190-12NO7
3590
2 VUO52-16NO1
3234
3 VUO52-16NO1
3656
4 VUO82-16NO7
3463
5 VUO82-16NO7
4028
6 VVZ40-14
3103
Tj(max)
[°C]
125
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
80
Number
of
Cycles
2000
5000
5000
2000
2000
5000
Sample
Size
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
20000
50000
50000
20000
20000
50000
Tj(max)
[°C]
145
145
145
125
125
125
145
145
145
145
145
125
125
145
145
145
145
145
145
∆Τ
[K]
100
100
100
80
80
80
100
100
100
100
100
80
80
100
100
100
100
100
100
Number
of
Cycles
2000
2000
2000
5000
2000
500
2000
2000
2000
2000
2000
5000
5000
2000
2000
2000
2000
2000
2000
Sample
Size
20
20
20
20
10
20
20
20
20
20
20
10
10
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
40000
40000
40000
100000
20000
10000
40000
40000
40000
40000
40000
50000
50000
40000
40000
40000
40000
40000
40000
Remark
Remark
Remark
TABLE 3E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
DPG15I300PA
DPG80C300HB
DSEC60-06A
DSEi 2x101-06A
DSEI2x121-02A
DSEI2x61-10B
DSEI60-06A
DSEK60-02A
DSEP15-12CR
DSEP15-12CR
DSEP29-06B
DSEP2x31-03A
DSEP2x61-06A
DSEP30-06BR
DSEP30-12A
DSEP60-06A
DSEP60-12A
DSEP60-12AR
DSEP60-12AR
IXYS Semiconductor GmbH
Date Code
or
Test #
3354
4132
3924
4148
3093
3815
3719
3448
3606
4128
4059
4413
3603
4460
3789
3071
3179
3444
3792
22
Remark
I_R increased
TABLE 3F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
DSA30C200PB
DSA50C150HB
DSA90C200HB
DSSK30-018A
DSSK40-0015B
DSSK40-008B
DSSK50-01A
DSSK60-0045B
DSSK60-02AR
DSSK70-0015B
DSSK70-008A
DSSS35-008AR
Date Code
or
Test #
4046
4129
3716
3074
3926
3450
3349
3592
4033
3812
4323
3714
Tj(max)
[°C]
145
145
145
145
125
145
145
145
145
145
145
145
TABLE 3G: Thyristor/Diode single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
1 CMA30E1600PB
4050
125
2 CMA30E1600PB
3658
125
3 CS35-14io4
3090
125
4 CS45-12io1
3162
125
5 CSM410LB
4152
145
6 DSA1-18D
3200
7 DSA17-18A
3857
8 DSA30I150PA
3185
145
9 DSA9-18F
4294
10 DSA9-18F
3338
11 DSAI35-16A
3710
145
12 DSI2x55-16A
3340
125
13 DSI30-12A
3490
145
14 DSI45-12A
3227
145
15 DSI45-16A
3810
145
16 DSI45-16AR
3348
145
17 DSP25-12A
3355
145
IXYS Semiconductor GmbH
∆Τ
[K]
100
100
100
100
80
100
100
100
100
100
100
100
∆Τ
[K]
80
80
80
80
100
100
100
80
100
100
100
100
100
Number
of
Cycles
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
Number
of
Cycles
2000
2000
2000
2000
4000
2000
2000
2000
2000
2000
2000
5000
2000
2000
2000
2000
2000
Sample
Size
20
20
10
20
10
20
10
20
20
10
10
10
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40000
40000
20000
40000
40000
40000
20000
40000
40000
20000
20000
50000
40000
40000
40000
40000
40000
23
Remark
Remark
10min. On/ 10min. Off
10min. On/ 10min. Off
∆Τc=90Κ
∆Τc=90Κ
TEMPERATURE CYCLE (Tables 4A .. 4H)
TABLE 4A: MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
1 GWM160-0055X2 SL
3580
-40
2 IXA20I200PB
4093
-55
3 IXA20PG1200DHG LB
3581
-40
4 IXA20PT1200LB
4363
-55
5 IXA20SV1200DHGLA
3211
-40
6 IXA27IF1200HJ
3376
-55
7 IXA40PG1200DHGLA
3211
-40
8 IXA55I1200HJ
3743
-55
9 IXA60IF1200NA
3833
-40
10 IXBH15N160
3946
-55
11 IXBH16N170A
TP1221
-55
12 IXBH40N160
3497
-55
13 IXBH40N160
4403
-55
14 IXBH40N160
3242
-55
15 IXBH5N160G
4457
-55
16 IXBH5N160G
3076
-55
17 IXBH9N160G
3712
-55
18 IXBT24N170
TP1202
-55
19 IXBX64N250
TP1130
-55
20 IXBX75N170
TP1031
-55
21 IXCH36N250
TP1139
-55
22 IXD50IF600HB
3868
-55
23 IXDD404SIA
SA1208
-55
24 IXDH30N120D1
3797
-40
25 IXDH30N120D1
3640
-55
26 IXFA180N10T2
SS1229
-55
27 IXFA4N100Q
TS1108
-55
28 IXFA7N60P3
SS1244
-55
29 IXFB100N50P
TP1110
-55
30 IXFB100N50Q3
SP1106
-55
31 IXFB110N60P3
SP1110
-55
32 IXFB110N60P3
SP1201
-55
33 IXFB132N50P3
SP1110
-55
34 IXFB210N30P3
SP1224
-55
35 IXFB38N100Q2
TP1115
-55
36 IXFB44N100Q3
SP1106
-55
37 IXFB60N80PK
TS1349
-55
38 IXFB62N80Q3
SP1118
-55
39 IXFB62N80Q3K
TS1349
-55
40 IXFB82N60Q3
SP1118
-55
41 IXFD64N50P
3195
-40
42 IXFD64N50P
4049
-55
43 IXFH100N25P
SS1049
-55
44 IXFH120N25T
SS1115
-55
45 IXFH120N25T
SP1141
-55
46 IXFH12N100F
SS1052
-55
47 IXFH12N80P
SS1051
-55
48 IXFH150N17T2
SS1341
-55
49 IXFH150N20T
SP1147
-55
50 IXFH15N100P
TP1202
-55
51 IXFH15N100Q3
SP1121
-55
52 IXFH15N60
SS1104
-55
53 IXFH160N15T2
SS1319
-55
54 IXFH16N50P3
SP1207
-55
55 IXFH16N60P3
SS1142
-55
56 IXFH18N100Q3
SP1136
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
125
125
125
125
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
150
125
150
125
150
150
125
125
125
125
125
150
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
50
1000
100
1000
100
1000
100
50
50
1000
50
50
50
50
50
50
1000
100
1000
1000
100
1000
50
50
250
1000
1000
1000
1000
500
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
77
20
20
20
10
20
10
20
20
20
30
20
20
20
20
20
20
30
30
30
30
20
77
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
80
12
30
30
77
30
30
30
30
30
30
30
30
30
30
30
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
77000
1000
20000
2000
10000
2000
10000
2000
1000
1000
30000
1000
1000
1000
1000
1000
1000
30000
3000
30000
30000
2000
77000
1000
1000
7500
30000
30000
30000
30000
15000
30000
30000
30000
30000
30000
30000
30000
30000
30000
80000
12000
30000
30000
77000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
57 IXFH18N90P
TP1202
-55
58 IXFH20N50P3
SP1141
-55
59 IXFH20N80P
SS1121
-55
60 IXFH22N60P3
SS1108
-55
61 IXFH22N60P3
SP1318
-55
62 IXFH26N50
TS1331
-55
63 IXFH26N50P3
SS1206
-55
64 IXFH26N50P3
TP1325
-55
65 IXFH26N50Q
TS1343
-55
66 IXFH28N60P3
SS1115
-55
67 IXFH30N50Q3
SS1117
-55
68 IXFH40N30Q
SS1020
-55
69 IXFH42N60P3
SP1110
-55
70 IXFH44N50Q3
SP1133
-55
71 IXFH50N30Q3
SP1117
-55
72 IXFH50N60P3
SP1109
-55
73 IXFH50N60P3
SP1201
-55
74 IXFH60N50P3
SP1109
-55
75 IXFH60N50P3
TP1326
-55
76 IXFH70N20Q3
SS1117
-55
77 IXFH70N30Q3
SP1133
-55
78 IXFH75N10
SS1219
-55
79 IXFH7N100P
TP1143
-55
80 IXFH88N30P
TP1237
-55
81 IXFH94N30T
SS1115
-55
82 IXFH94N30T
SP1141
-55
83 IXFJ22N60P3
SS1205
-55
84 IXFK120N25P
TP1239
-55
85 IXFK140N30P
TP1242
-55
86 IXFK230N20T
SP1106
-55
87 IXFK230N20T
SP1116
-55
88 IXFK26N120P
TP1102
-55
89 IXFK38N80Q2
TP1105
-55
90 IXFK420N10T
SP1046
-55
91 IXFK44N80P
TP1219
-55
92 IXFK64N50P
TP1242
-55
93 IXFK80N60P3
SP1150
-55
94 IXFK90N50P2
TP1333
-55
95 IXFK90N50P2
TP1337
-55
96 IXFK94N50P2
SP1051
-55
97 IXFK94N50P2
SP1111
-55
98 IXFK94N50P2
SF1211
-55
99 IXFN100N25
SS1309
-55
100 IXFN120N20
SP1211
-55
101 IXFN120N20
SS1301
-55
102 IXFN150N15
SS1309
-55
103 IXFN170N30P
SP1045
-55
104 IXFN180N15P
SP1210
-55
105 IXFN200N10P
SP1212
-55
106 IXFN32N120P
TP1230
-55
107 IXFN32N120P-BN
SP1217
-55
108 IXFN340N07
SF1105
-55
109 IXFN340N07
SP1213
-55
110 IXFN34N100
SP1111
-55
111 IXFN34N80
SF1105
-55
112 IXFN38N100P
SP1204
-55
113 IXFN38N100P
TP1230
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
150
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
100
250
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
500
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
77
30
30
30
30
30
30
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
25
30
30
77
77
30
77
30
30
10
30
30
30
10
10
30
10
30
10
10
30
10
30
25
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
77000
30000
30000
30000
30000
30000
30000
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
30000
30000
30000
30000
30000
30000
3000
7500
25000
30000
30000
77000
77000
30000
77000
30000
30000
10000
30000
30000
15000
10000
10000
30000
10000
30000
10000
10000
30000
10000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
114 IXFN44N100Q3
SP1207
-55
115 IXFN44N60
SP1103
-55
116 IXFN44N80
SP1212
-55
117 IXFN44N80
SP1212
-55
118 IXFN48N50
TP1212
-55
119 IXFN64N50P
SP1208
-55
120 IXFN64N50P
TS1347
-55
121 IXFN64N60P
SP1206
-55
122 IXFN80N50P
SP1212
-55
123 IXFN82N60P
SS1301
-55
124 IXFN90N30
SF1105
-55
125 IXFN90N30
TS1309
-55
126 IXFP110N15T2
SS1332
-55
127 IXFP14N60P3
SS1144
-55
128 IXFP170N075T2
US1309
-55
129 IXFP180N10T2
SS1305
-55
130 IXFP22N60P3
TS1324
-55
131 IXFP230N075T2
US1309
-55
132 IXFP4N60P3
SS1143
-55
133 IXFP5N50P3
SS1206
-55
134 IXFP7N60P3
SS1143
-55
135 IXFQ94N30P3
SS1321
-55
136 IXFR32N100Q3
SP1133
-55
137 IXFR66N50Q2
TP1122
-55
138 IXFT14N80P
SP0731
-55
139 IXFT20N100P
TP1147
-55
140 IXFX20N120P
TS1337
-55
141 IXFX210N17T
SS0912
-55
142 IXFX24N100Q3
SP1137
-55
143 IXFX26N120P
TP1102
-55
144 IXFX32N100Q3
TP1229
-55
145 IXFX32N80Q3
SS1122
-55
146 IXFX44N80P
TS1332
-55
147 IXFX44N80Q3
SP1123
-55
148 IXFX44N80Q3
TP1226
-55
149 IXFX48N60Q3
SS1118
-55
150 IXFX64N50Q3
SP1118
-55
151 IXFX64N60P
TP1331
-55
152 IXFX64N60P3
SP1110
-55
153 IXFX64N60P3
SS1332
-55
154 IXFX64N60P3
SS1332
-55
155 IXFX64N60P3
SS1332
-55
156 IXFX64N60P3
TS1337
-55
157 IXFX64N60P3
SS1335
-55
158 IXFX64N60P3
SS1335
-55
159 IXFX64N60P3
SS1335
-55
160 IXFX64N60P3
SS1335
-55
161 IXFX64N60P3
SS1335
-55
162 IXFX64N60Q3
SS1118
-55
163 IXFX78N50P3
SS1108
-55
164 IXFX78N50P3
SP1109
-55
165 IXFX78N50P3
TS1337
-55
166 IXFX80N50Q3
SP1106
-55
167 IXFX80N60P3
SP1109
-55
168 IXFX98N50P3
SP1110
-55
169 IXGA20N100
TS1235
-55
170 IXGA20N250HV
TS1222
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
150
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
500
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
10
30
10
30
10
10
30
10
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
18
30
30
10
30
30
30
30
15
30
30
30
30
15
30
15
15
15
30
15
15
15
15
15
30
30
30
30
30
30
30
30
20
26
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
10000
30000
10000
30000
10000
10000
30000
10000
10000
30000
30000
30000
15000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
18000
30000
30000
10000
30000
30000
30000
30000
15000
30000
30000
30000
30000
15000
30000
15000
15000
15000
30000
15000
15000
15000
15000
15000
30000
30000
30000
30000
30000
30000
30000
30000
20000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
171 IXGA24N170A
TS1215
-55
172 IXGF25N250
TP1206
-40
173 IXGH100N30C3
SS1250
-55
174 IXGH24N170A
TP0917
-55
175 IXGH2N250
TP1010
-55
176 IXGH40N120B2D1
TP0940
-55
177 IXGH40N60A
TP1304
-55
178 IXGH48N60C3D1
TP1148
-55
179 IXGH50N60C4
SS1052
-55
180 IXGH50N60C4
SP1133
-55
181 IXGK120N120B3
TP1143
-55
182 IXGK120N60B3
SP1146
-55
183 IXGK75N250
TP1110
-55
184 IXGK75N250
TP1047
-55
185 IXGT32N120A3
TP1121
-55
186 IXKH30N60C5
4022
-55
187 IXKH35N60C5
4158
-55
188 IXKH70N60C5
3358
-55
189 IXKP24N60C5M
4319
-55
190 IXKR40N60C
3713
-40
191 IXSH45N120
TP1204
-55
192 IXSN35N120AU1
TP1208
-55
193 IXSN55N120AU1
TP1017
-55
194 IXTA05N100
TS1236
-55
195 IXTA06N120P
TS1247
-55
196 IXTA1N100
TS1047
-55
197 IXTA200N055T2
SS1223
-55
198 IXTA2R4N120P
TS1226
-55
199 IXTA36N30P
SS1241
-55
200 IXTA3N120
TS1115
-55
201 IXTA3N120
TS1234
-55
202 IXTA3N120
TS1234
-55
203 IXTA50N28T
SS1216
-55
204 IXTA62N15P
SS1047
-55
205 IXTA80N10T
SS1150
-55
206 IXTH12N140
TP1119
-55
207 IXTH140P10T
SP1130
-55
208 IXTH16P60P
TS1316
-55
209 IXTH1N200P3
TP1338
-55
210 IXTH1N80P
TP0905
-55
211 IXTH200N10T
SP1319
-55
212 IXTH20N65X
SS1344
-55
213 IXTH20P50P
TP1309
-55
214 IXTH3N120
TS1136
-55
215 IXTH40N30
SS1248
-55
216 IXTH48P20P
SS1050
-55
217 IXTH48P20P
SS1105
-55
218 IXTH48P20P
SP1049
-55
219 IXTH4N150
TS1151
-55
220 IXTH4N150
TP1149
-55
221 IXTH68P20T
SP1130
-55
222 IXTH6N100D2
TP1202
-55
223 IXTH6N150
TP1201
-55
224 IXTH76P10T
SS1052
-55
225 IXTH96P085T
SS1302
-55
226 IXTK550N055T2
UP1242
-55
227 IXTL2N450
TP1239
-40
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
1000
250
1000
250
1000
1000
1000
500
1000
1000
1000
1000
1000
1000
100
50
50
50
50
1000
1000
100
1000
1000
1000
1000
1000
1000
1000
20
20
250
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
20
30
10
30
30
30
30
30
30
30
30
30
77
30
20
20
20
20
20
30
10
30
30
30
30
30
30
30
30
15
50
30
30
77
30
30
30
30
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
27
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
20000
7500
10000
7500
30000
30000
30000
15000
30000
30000
30000
30000
77000
30000
2000
1000
1000
1000
1000
30000
10000
3000
30000
30000
30000
30000
30000
30000
30000
300
1000
7500
30000
77000
30000
30000
30000
30000
10000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
228 IXTM21N50
SP1023
-55
229 IXTN210P10T
SP1215
-55
230 IXTN21N100
SF1105
-55
231 IXTN40P50P
SP1212
-55
232 IXTP02N120P
TS1307
-55
233 IXTP05N100M
TS1245
-55
234 IXTP100N04T2
SS1341
-55
235 IXTP102N15T
K834
-55
236 IXTP110N055T2
SS1332
-55
237 IXTP120P065T
SS1013
-55
238 IXTP130N10T
SS1318
-55
239 IXTP1N80P
SS0908
-55
240 IXTP200N055T2
US1310
-55
241 IXTP20N65X
HS1332
-55
242 IXTP220N04T2
SS1051
-55
243 IXTP220N04T2
SS1328
-55
244 IXTP260N055T2
SS1338
-55
245 IXTP2N100P
TS1332
-55
246 IXTP32N20T
SS1051
-55
247 IXTP3N50P
SS1048
-55
248 IXTP450P2
SS1047
-55
249 IXTP460P2
TS1332
-55
250 IXTP76P10T
TS1332
-55
251 IXTP80N10T
SS1150
-55
252 IXTP80N10T
SS1318
-55
253 IXTP80N12T2
SS1043
-55
254 IXTP8N50P
SS1050
-55
255 IXTQ110N10P
SS1045
-55
256 IXTQ170N10P
SS1041
-55
257 IXTQ200N10T
SS1125
-55
258 IXTQ200N10T
SS1125
-55
259 IXTQ22N60P
SS1104
-55
260 IXTQ36N30P
SS1029
-55
261 IXTQ460P2
SS1236
-55
262 IXTR170P10P
SP1106
-55
263 IXTT12N150
TP1206
-55
264 IXTT140P10T
SP1142
-55
265 IXTT16N20D2
TP1019
-55
266 IXTT60N20L2
TP1005
-55
267 IXTT6N150
TP1203
-55
268 IXTT80N20L
TP1046
-55
269 IXTV03N400S
TP1134
-55
270 IXTX120P20T
SP1133
-55
271 IXTX200N10L2
TP1137
-55
272 IXTX20N140
TP1126
-55
273 IXTX210P10T
SP1130
-55
274 IXTY01N100D
TS1014
-55
275 IXXH100N60C3
TP1101
-55
276 IXXH50N60B3
SS1105
-55
277 IXXH50N60B3D1
TP1150
-55
278 IXXH50N60C3
SS1105
-55
279 IXXH60N65B4
SP1235
-55
280 IXXH60N65C4
SP1236
-55
281 IXXH80N65B4H1
SP1319
-55
282 IXYH24N90C3
TS1144
-55
283 IXYH30N120C3
TP1137
-55
284 IXYH40N120C3
TP1137
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
150
125
150
125
150
125
125
125
125
125
125
125
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
500
500
1000
1000
1000
1000
250
1000
100
100
1000
1000
1000
250
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
250
250
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
10
30
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
16
30
30
77
30
30
30
30
30
30
30
30
27
30
30
30
30
30
30
30
30
30
30
30
28
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
10000
30000
10000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
15000
15000
30000
30000
30000
30000
7500
30000
3000
3000
30000
30000
16000
7500
30000
77000
30000
30000
30000
30000
30000
30000
30000
30000
27000
30000
7500
7500
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
285 IXYH40N90C3
TS1205
-55
286 IXYH50N120C3
TP1137
-55
287 IXYH60N90C3
SS1205
-55
288 IXYH75N65C3
TS1341
-55
289 IXYH80N90C3
TP1205
-55
290 IXYH82N120C3
TP1115
-55
291 IXYP8N90C3
TS1144
-55
292 IXYT20N120C3D1HV
TS1247
-55
293 IXYX100N120C3
TP1137
-55
294 MMIX1N64N300
TP1137
-40
High
Temp.
[°C]
125
125
125
150
125
125
125
125
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
30000
30000
30000
30000
30000
30000
30000
30000
30000
10000
TABLE 4B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MID 550-12 A4
4203
2 MID75-12A3
3832
3 MIXA20W1200TML
3207
4 MIXA30WB1200TED
3804
5 MIXA40WB1200TED
4543
6 MIXA40WB1200TED
4543
7 MIXA81WB1200TEH
4012
8 MIXD80PM650TMI
4249
9 MKI75-12E8
3599
10 MUBW15-12A7
3146
11 MUBW35-06A6K
3827
12 MUBW50-17T8
3784
13 VKM60-01P1
4030
14 VMM90-09F
3215
15 VMM90-09P
4405
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
50
50
100
100
100
100
50
50
25
50
10
50
100
Sample
Size
10
20
20
10
10
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
500
1000
1000
500
1000
1000
1000
1000
500
500
250
500
100
500
1000
TABLE 4C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC225-14
3102
2 MCC26-14
3104
3 MCC312-16
3470
4 MCC312-16io1
4065
5 MCC56-16io1B
3275
6 MCC56-16iob
4097
7 MCC95-16
3510
8 MCD225-14
4417
9 MCD95-16io1
3943
10 MDD175-28N1
3622
11 MDD312-16N1
3274
12 MDD95
4115
13 MDD95-22N1B
3600
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
50
50
50
50
50
50
50
50
50
50
50
Sample
Size
10
10
10
10
10
10
10
9
10
6
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
500
500
500
500
500
500
500
450
500
300
500
500
500
IXYS Semiconductor GmbH
29
Remark
Remark
Remark
TABLE 4D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MMO62-16io6
3223
2 VBO21-12NO7
3586
3 VHF36-12io5
3645
4 VUB116-16NOXT
4174
5 VUB120-16NOXT
3297
6 VUB72-16
3086
7 VUO36-12NO8
3807
8 VUO52
3118
9 VUO52
3846
10 VUO52-16
3887
11 VUO52-16
3887
12 VUO52-16
4534
13 VUO52-16NO1
3732
14 VUO80-16
3944
15 VVY50-16
3235
16 VVY50-16io1
4116
17 VVZ40-14
4425
18 VVZB120-14io2
3769
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
20
10
25
50
100
25
10
150
50
50
50
25
50
20
50
25
25
25
Sample
Size
20
10
10
10
10
10
10
40
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
400
100
250
500
1000
250
100
6000
500
500
500
250
500
200
500
250
250
250
Low
Temp.
[°C]
-40
-55
-55
-55
-55
-55
-55
-55
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-55
-55
-55
-40
-40
-55
-55
-55
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
50
50
50
50
50
50
50
50
100
20
20
10
50
50
50
50
20
50
50
50
20
20
50
50
100
50
50
50
50
Sample
Size
20
20
20
20
20
20
20
20
20
40
20
20
10
20
20
20
20
20
20
20
20
20
20
20
20
20
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
1000
1000
1000
1000
1000
1000
1000
1000
4000
400
400
100
1000
1000
1000
1000
400
1000
1000
1000
400
400
1000
1000
2000
500
500
500
500
Remark
TABLE 4E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
DH2x60-18A
DPG15I300PA
DPG30C300HB
DPG30C400HB
DPG60C200HB
DPG60C300HJ
DSEC16-06AC
DSEC60-06A
DSEI12-06A
DSEI12-12A
DSEI2x101-06A
DSEI2x101-12A
DSEI2x31-06P
DSEI2x61-12B
DSEI30-06A
DSEI30-10A
DSEI30-10A
DSEIP2x61-06A
DSEP15-12CR
DSEP15-12CR
DSEP29-12A
DSEP2x25-12C
DSEP2x31-03A
DSEP30-12AR
DSEP30-12AR
DSEP60-06AT
MEE250-12DA
MEK95-06DA €
MEO550-02DA
MEO550-02DA
IXYS Semiconductor GmbH
Date Code
or
Test #
3770
3353
4131
4044
3718
4125
3798
3449
3934
4545
4147
3711
3462
3456
4455
3070
4327
3602
3930
3096
3184
4045
4414
3345
3793
3764
4105
3213
4396
3967
30
Remark
TABLE 4F: Schottky Diode
Low
Temp.
[°C]
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
50
50
50
50
50
50
50
50
50
50
50
50
50
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
TABLE 4G: Thyristor/Diode single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
1 CLA50E1200HB
3346
-55
2 CLA60PD1200NA
4160
-40
3 CLF20E1200PB
4039
-55
4 CMA80E1600HB
3976
-55
5 CS19-12H01
3737
-40
6 CS19-12ho1
3119
-40
7 CS19-12ho1
3484
-40
8 CS20-22MO F1
4017
-55
9 CS22-08io1M
3800
-55
10 CS23-16
3336
-40
11 CS30-12io1
3300
-40
12 CS30-16io1
4318
-55
13 CS35-14io4
3090
-40
14 CS45-12io1
3098
-40
15 CSM400A
3333
-40
16 CSM410LB
4152
-55
17 DLA100B1200LB
4178
-55
18 DMA30E1800HA
3273
-55
19 DSA1-16D
4440
-40
20 DSA17-18A
3855
-40
21 DSA30I150PA
3182
-55
22 DSA35-18A
3442
-40
23 DSA75-16B
4506
-40
24 DSA75-16B
4505
-40
25 DSA75-18B
3923
-40
26 DSA9-12F
3178
-40
27 DSA9-18
4143
-40
28 DSA9-18F
4293
-40
29 DSAI17-16A
3641
-40
30 DSAI35-16A
3709
-40
31 DSDI60-18A
3228
-40
32 DSI2x55-12A
4316
-40
33 DSI2x55-16A
3341
-40
34 DSI30-08A
4501
-55
35 DSP26-16AT
3835
-40
36 DSP45-12A
4141
-55
37 DSP45-16A
3193
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
50
100
50
100
50
50
50
20
100
50
20
50
25
100
50
100
50
20
50
20
50
50
20
20
20
20
20
20
50
20
20
50
100
50
100
Sample
Size
20
20
20
40
20
20
20
20
20
10
20
20
10
20
10
20
20
20
40
10
20
10
20
20
10
10
10
10
10
10
20
20
19
20
20
20
80
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
1000
1000
4000
1000
2000
1000
1000
1000
200
2000
1000
200
1000
250
2000
1000
2000
2000
200
1000
200
1000
1000
200
200
200
200
200
200
1000
400
380
1000
2000
1000
8000
High
Temp.
[°C]
150
150
150
150
Number
of
Cycles
50
50
50
50
Sample
Size
20
20
20
20
Failures
Device Cycles
0
0
0
0
1000
1000
1000
1000
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
DSA20C150PB
DSA30C150HB
DSA70C100HB
DSA70C150HB
DSA90C200HB
DSA90C200HB
DSB30C30PB
DSB60C45HB
DSSK30-018A
DSSK60-02A
DSSK70-008A
DSSK80-006B
DSSS35-008AR
DSSS35-008AR
Date Code
or
Test #
4209
4322
3717
4035
4127
3347
3935
4493
3791
3452
3073
3609
4458
3445
Remark
Remark
TABLE 4H: Breakover Diode
#
Part Number
1
2
3
4
IXBOD1-06
IXBOD1-08
IXBOD1-09
IXBOD1-10
IXYS Semiconductor GmbH
Date Code
or
Test #
3459
3079
4042
3722
Low
Temp.
[°C]
-40
-40
-40
-40
31
Remark
HUMIDITY TEST (Tables 5A .. 5H)
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM160-0055 X2 SL
4542
2 GWM160-0055X2 S
3455
3 GWM160-0055X2 SL
3580
4 IXA12IF1200HB
4411
5 IXA12IF1200TC
3543
6 IXA20PG1200DHG LA
4228
7 IXA20PG1200DHG LB
3581
8 IXA20PT1200LB
4363
9 IXA55I1200HJ
3743
10 IXBF55N300
TP1243
11 IXBH16N170A
TP1221
12 IXBH40N160
3932
13 IXBT24N170
TP1202
14 IXD50IF600HB
3868
15 IXDH35N60BD1
3161
16 IXFB210N30P3
SP1224
17 IXFB60N80PK
TS1349
18 IXFB62N80Q3K
TS1349
19 IXFD64N50P
3195
20 IXFH120N25T
SP1141
21 IXFH150N17T2
SS1341
22 IXFH150N20T
SP1147
23 IXFH160N15T2
SS1319
24 IXFH16N50P3
SP1207
25 IXFH18N100Q3
SP1136
26 IXFH26N50
TS1331
27 IXFH26N50P3
SS1206
28 IXFH26N50Q
TS1343
29 IXFH70N30Q3
SP1133
30 IXFH75N10
SS1219
31 IXFH7N100P
TP1143
32 IXFH94N30T
SP1141
33 IXFJ75N10
TS1219
34 IXFK120N25P
TP1239
35 IXFK44N80P
TP1219
36 IXFK64N50P
TP1242
37 IXFK80N60P3
SP1150
38 IXFK90N50P2
TP1333
39 IXFK90N50P2
TP1337
40 IXFK94N50P2
SF1211
41 IXFK94N50P2
SP1111
42 IXFK98N50P3
SP1142
43 IXFN100N25
SS1309
44 IXFN120N20
SS1301
45 IXFN150N15
SS1309
46 IXFN64N50P
TS1347
47 IXFN82N60P
SS1301
48 IXFN90N30
TS1309
49 IXFP110N15T2
SS1332
50 IXFP180N10T2
SS1305
51 IXFP230N075T2
US1309
52 IXFP5N50P3
SS1206
53 IXFQ94N30P3
SS1321
54 IXFT20N100P
TP1147
55 IXFX20N120P
TS1337
56 IXFX44N80Q3
TP1226
57 IXFX64N60P3
TS1337
58 IXFX78N50P3
TS1337
IXYS Semiconductor GmbH
Temp.
[°C]
121
121
121
121
121
85
85
121
121
121
121
121
121
121
121
121
121
121
85
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
85
85
100
100
100
100
100
100
100
100
100
100
100
85
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
96
96
48
96
1000
1000
96
96
96
96
48
96
96
48
96
96
96
1000
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
20
77
77
20
20
20
20
20
20
30
30
20
30
20
20
30
30
30
72
77
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
77
77
77
30
77
25
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
32
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1920
7392
7392
960
1920
20000
20000
1920
1920
2880
2880
960
2880
1920
960
2880
2880
2880
72000
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
7392
7392
7392
2880
7392
2400
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
59 IXFX80N50Q3
SP1106
60 IXGH100N30C3
SS1250
61 IXGH40N120B2D1
TP0940
62 IXGH48N60C3D1
TP1148
63 IXGH50N60C4
SP1133
64 IXGK120N120B3
TP1143
65 IXTH16P60P
TS1316
66 IXTH1N200P3
TP1338
67 IXTH200N10T
SP1208
68 IXTH200N10T
SP1319
69 IXTH20N65X
SS1344
70 IXTH20P50P
TP1309
71 IXTH3N120
TS1136
72 IXTH4N150
TS1151
73 IXTH96P085T
SS1302
74 IXTK550N055T2
UP1242
75 IXTP100N04T2
SS1341
76 IXTP110N055T2
SS1332
77 IXTP130N10T
SS1318
78 IXTP200N055T2
US1310
79 IXTP200N055T2
US1310
80 IXTP20N65X
HS1332
81 IXTP260N055T2
SS1338
82 IXTP2N100P
TS1332
83 IXTP460P2
TS1332
84 IXTP76P10T
TS1332
85 IXTP80N10T
SS1150
86 IXTP80N10T
SS1318
87 IXTQ200N10T
SS1125
88 IXTQ200N10T
SS1125
89 IXTQ460P2
SS1236
90 IXTT12N150
TP1206
91 IXTT140P10T
SP1142
92 IXTT6N150
TP1203
93 IXTX120P20T
SP1133
94 IXXH50N60B3D1
TP1150
95 IXXH60N65B4
SP1235
96 IXXH60N65C4
SP1236
97 IXYH40N90C3
TS1205
98 IXYH60N90C3
SS1205
99 IXYH75N65C3
TS1341
100 IXYH80N90C3
TP1205
101 IXYN100N65C3H1
TS1346
102 IXYT20N120C3D1HV
TS1247
IXYS Semiconductor GmbH
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
33
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 5B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MIX300/450
3751
2 MIXA225PF1200TSF
3825
3 MIXA40WB1200TED
4543
4 MIXA40WB1200TED
4543
5 MIXA81WB1200TEH
4538
6 MIXD80PM650TMI
4249
7 MWI100-12E8
3676
8 VKM60-01P1
3589
9 VMM90-09F
3216
Temp.
[°C]
85
85
85
85
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
Time
[hrs]
1000
168
1000
1000
1000
1000
168
168
168
Sample
Size
10
9
10
10
10
10
10
10
10
Failures
TABLE 5C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC21-14io8
3885
2 MCD162
3465
3 MCD162-16
3471
Temp.
[°C]
85
85
85
Rel. H.
[%]
85
85
85
Time
[hrs]
168
1000
168
Sample
Size
10
5
10
Failures
TABLE 5D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MMO90-16
3813
2 VUB145-16NOXT
4154
3 VUE22-06NO7
4027
4 VUO52-16
3887
5 VUO52-16
3887
6 VVZB120-14io2
3902
7 VVZB135-16ioXT
4210
Temp.
[°C]
121
85
85
85
85
85
85
Rel. H.
[%]
100
85
85
85
85
85
85
Time
[hrs]
48
1000
168
1000
1000
168
168
Sample
Size
10
10
10
10
10
10
10
Failures
Date Code
or
Test #
3811
4513
3095
4545
3325
3222
3953
3097
4060
4032
4202
3963
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
85
85
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
85
85
Time
[hrs]
48
96
48
96
96
48
48
48
48
48
168
168
Sample
Size
20
20
20
40
20
20
20
20
20
20
10
10
Failures
Date Code
or
Test #
3192
4047
3790
3351
Temp.
[°C]
121
121
121
121
Rel. H.
[%]
100
100
100
100
Time
[hrs]
96
48
96
48
Sample
Size
20
20
20
20
Failures
TABLE 5G: Thyristor/Diode single device
Date Code
# Part Number
or
Temp.
Test #
[°C]
1 CMA80E1600HB
3976
85
2 CSM410LB
4152
121
3 DSDI60-16A
3342
121
4 DSI30-12A
3611
121
5 DSP109-3300V
4305
85
6 DSP26-16AT
3835
121
7 DSP45-16AR
3605
121
Rel. H.
[%]
85
100
100
100
85
100
100
Time
[hrs]
1000
96
48
48
1000
96
48
Sample
Size
40
20
20
20
20
20
20
Failures
Rel. H.
[%]
100
100
100
100
Time
[hrs]
48
48
48
48
Sample
Size
20
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
10000
1512
10000
10000
10000
10000
1680
1680
1680
Remark
Device Hours
[hrs]
1680
5000
1680
Remark
Device Hours
[hrs]
480
10000
1680
10000
10000
1680
1680
Remark
Device Hours
[hrs]
960
1920
960
3840
1920
960
960
960
960
960
1680
1680
Remark
Device Hours
[hrs]
1920
960
1920
960
Remark
Device Hours
[hrs]
40000
1920
960
960
20000
1920
960
Remark
Device Hours
[hrs]
960
960
960
960
Remark
TABLE 5E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
DHG40C1200HB
DHG60I600HA
DSEC60-06B
DSEI12-12A
DSEI2x101-12A
DSEI2x101-12A
DSEI2x61-12B
DSEP15-12CR
DSEP29-06B
DSEP30-06BR
MEO450-12
MEO500-06DA
0
0
0
0
0
0
0
0
0
0
0
0
TABLE 5F: Schottky Diode
#
Part Number
1
2
3
4
DSA30C100PB
DSA30C200PB
DSSK60-02A
DSSK80-006B
0
0
0
0
0
0
0
0
0
0
0
TABLE 5H: Breakover diode
#
Part Number
1
2
3
4
IXBOD1-06
IXBOD1-08
IXBOD1-09
IXBOD1-10
IXYS Semiconductor GmbH
Date Code
or
Test #
3460
3079
4040
3723
Temp.
[°C]
121
121
121
121
34
0
0
0
0
H³TRB TEST (Table 6A
6C)
TABLE 6A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1 GWM160-0055X2 S
3455
44
2 GWM160-0055X2 SL
3580
44
3 IXA20PG1200DHG LB
3581
80
4 IXA20SV1200DHGLA
3211
80
Temp.
[°C]
85
85
85
85
Rel. H.
[%]
85
85
85
85
Time
[hrs]
1000
1000
1000
1000
Sample
Size
77
77
20
20
Failures
TABLE 6B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MIXA100W1200TEH
3248
2 MIXD50W650TED
4420
Voltage
[V]
100
100
Temp.
[°C]
85
85
Rel. H.
[%]
85
85
Time
[hrs]
1000
1000
Sample
Size
10
10
Failures
TABLE 6C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC255-16io1
4055
Voltage
[V]
100
Temp.
[°C]
85
Rel. H.
[%]
85
Time
[hrs]
1000
Sample
Size
10
Failures
TABLE 6G: Thyristor/Diode single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1 CSM401B
3377
100
2 DLA100B1200LB
4351
100
Temp.
[°C]
85
85
Rel. H.
[%]
85
85
Time
[hrs]
1000
1000
Sample
Size
10
77
Failures
TABLE 7A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1 IXBF12N300
TP1218
42
2 IXBF15N300C
TP1313
42
3 IXBF55N300
TP1243
42
4 IXBH16N170A
TP1221
42
5 IXBT24N170
TP1202
42
6 IXBX64N250
TP0952
42
7 IXBX64N250
TP1130
42
8 IXFA4N100Q
TS1108
42
9 IXFB100N50P
TP1110
42
10 IXFB100N50Q3
SP1106
42
11 IXFB110N60P3
SP1201
42
12 IXFB210N30P3
SP1224
42
13 IXFB38N100Q2
TP1115
42
14 IXFB40N110P
TP1026
42
15 IXFB44N100P
TP0930
42
16 IXFB44N100Q3
SP1106
42
17 IXFB60N80PK
TS1349
42
18 IXFB62N80Q3
SP1118
42
19 IXFB82N60Q3
SP1118
42
20 IXFH120N25T
SS1115
42
21 IXFH120N25T
SP1141
42
22 IXFH12N90
SS0911
42
23 IXFH12N90
TS1344
42
24 IXFH150N17T2
SS1341
42
25 IXFH150N20T
SP1147
42
26 IXFH15N100P
TP1202
42
27 IXFH15N100Q3
SP1121
42
28 IXFH160N15T2
SS1319
42
29 IXFH16N50P3
SP1207
42
30 IXFH16N60P3
SS1142
42
31 IXFH18N100Q3
SP1136
42
32 IXFH18N90P
TP1202
42
33 IXFH20N50P3
SP1141
42
34 IXFH22N60P3
SS1108
42
35 IXFH22N60P3
SS1143
42
36 IXFH22N60P3
TS1326
42
37 IXFH26N50
TS1331
42
38 IXFH26N50P
SK0843
42
39 IXFH26N50P3
SS1206
42
40 IXFH26N50Q
TS1343
42
41 IXFH28N60P3
SS1115
42
42 IXFH28N60P3
SS1144
42
43 IXFH30N50Q3
SS1117
42
44 IXFH40N30Q
TP0916
42
45 IXFH42N50P2
SP1009
42
46 IXFH44N50Q3
SP1133
42
47 IXFH50N30Q3
SP1117
42
48 IXFH50N60P3
SP1201
42
49 IXFH6N120P
TP0937
42
50 IXFH70N15
SP0850
42
51 IXFH70N20Q3
SS1117
42
52 IXFH70N30Q3
SP1133
42
53 IXFH75N10
SS1219
42
54 IXFH7N100P
TP1143
42
55 IXFH88N30P
TP1237
42
56 IXFH94N30T
SS1115
42
57 IXFH94N30T
SP1141
42
58 IXFK140N30P
TP1330
42
59 IXFK160N30T
SP1120
42
60 IXFK180N25T
SP1120
42
Temp.
[°C]
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
25
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
77000
77000
20000
20000
Remark
Device Hours
[hrs]
10000
10000
Remark
Device Hours
[hrs]
10000
Remark
Device Hours
[hrs]
10000
77000
Remark
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2400
2880
2880
Remark
TABLE 7A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
61 IXFK230N20T
SP1116
42
62 IXFK26N120P
TP1037
42
63 IXFK26N90
SP0936
42
64 IXFK32N80Q3
SP1119
42
65 IXFK32N90P
TP1123
42
66 IXFK38N80Q2
TP1105
42
67 IXFK420N10T
SP1217
42
68 IXFK420N10T
SP1347
42
69 IXFK64N50Q3
SP1121
42
70 IXFK64N60Q3
SP1119
42
71 IXFK80N60P3
SP1142
42
72 IXFK80N60P3
SP1142
42
73 IXFK80N60P3
SP1150
42
74 IXFK90N50P2
TP1330
42
75 IXFK90N50P2
TP1333
42
76 IXFK90N50P2
TP1137
42
77 IXFK94N50P2
SS1222
42
78 IXFK94N50P2
SS1222
42
79 IXFK94N50P2
SS1222
42
80 IXFK98N50P3
SP1142
42
81 IXFK98N50P3
SP1142
42
82 IXFN100N25
SS1309
42
83 IXFN120N20
SS1301
42
84 IXFN150N15
SS1309
42
85 IXFN210N30P3
SP1223
42
86 IXFN32N100Q3
SP1132
42
87 IXFN32N120P
TP1230
42
88 IXFN38N100P
TP1230
42
89 IXFN48N50Q
SP1304
42
90 IXFN48N60P
SS1333
42
91 IXFN48N60P
SS1333
42
92 IXFN64N50P
TS1333
42
93 IXFN64N50P
TS1333
42
94 IXFN64N50P
TS1347
42
95 IXFN80N50
SP1312
42
96 IXFN90N30
TS1309
42
97 IXFP110N15T2
SS1332
42
98 IXFP14N60P3
SS1144
42
99 IXFP170N075T2
US1310
42
100 IXFP180N10T2
SS1305
42
101 IXFP22N60P3
TS1324
42
102 IXFP230N075T2
SS1309
42
103 IXFP4N60P3
SS1143
42
104 IXFP5N50P3
SS1206
42
105 IXFP7N100P
SS0931
42
106 IXFP7N60P3
SS1143
42
107 IXFQ94N30P3
SS1321
42
108 IXFR32N100Q3
SP1133
42
109 IXFR64N50Q3
SP1123
42
110 IXFR66N50Q2
TP1122
42
111 IXFT14N80P
SP0731
42
112 IXFT18N90P
SP0837
42
113 IXFT20N100P
TP1147
42
114 IXFX120N27P3
SS1120
42
115 IXFX140N30P
TS1330
42
116 IXFX20N120P
TS1337
42
Temp.
[°C]
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
22
30
30
25
25
25
25
77
77
30
30
30
25
25
30
30
30
30
30
30
30
30
30
30
30
30
30
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2112
2880
2880
2400
2400
2400
2400
7392
7392
2880
2880
2880
2400
2400
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
960
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 7A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
117 IXFX24N100Q3
SP1137
42
118 IXFX32N100Q3
TP1229
42
119 IXFX32N80Q3
SS1122
42
120 IXFX44N80Q3
SP1123
42
121 IXFX48N50Q
SF0938
42
122 IXFX48N60Q3
SS1118
42
123 IXFX64N50P
SS0939
42
124 IXFX64N50Q3
SP1118
42
125 IXFX64N50Q3
SS1118
42
126 IXFX64N60P3
SS1335
42
127 IXFX64N60Q3
SS1118
42
128 IXFX78N50P3
TS1337
42
129 IXFX80N50Q3
SP1106
42
130 IXFX90N50P2
TP1330
42
131 IXGA20N250HV
TS1222
42
132 IXGA24N170A
TS1215
42
133 IXGF25N250
TP1206
42
134 IXGH2N250
TP1010
42
135 IXGH32N170
TP0907
42
136 IXGH40N120B2D1
TP0940
42
137 IXGH40N60A
TP1304
42
138 IXGH48N60C3D1
TP1148
42
139 IXGH50N60C4
SP1052
42
140 IXGH50N60C4
SP1133
42
141 IXGK120N120B3
TP1143
42
142 IXGK120N60B3
SP1146
42
143 IXGT32N120A3
TP1121
42
144 IXSH45N120
TP1204
42
145 IXTA02N250
TS1222
42
146 IXTA3N120
TS1115
42
147 IXTA80N10T
SS1150
42
148 IXTH140P10T
SP1130
-42
149 IXTH16P60P
TS1316
42
150 IXTH1N200P3
TP1338
42
151 IXTH1N80P
TP0905
42
152 IXTH200N10T
SP1208
42
153 IXTH200N10T
SP1319
42
154 IXTH20N65X
SS1344
42
155 IXTH20P50P
TP1309
42
156 IXTH3N120
TS1136
42
157 IXTH48P20P
SS1105
-42
158 IXTH48P20P
SS1040
-42
159 IXTH4N150
TS1151
42
160 IXTH4N150
TP1149
42
161 IXTH68P20T
SP1130
-42
162 IXTH6N150
TP1201
42
163 IXTH75N10
TP0848
42
164 IXTH96P085T
SP0926
-42
165 IXTH96P085T
SS1302
42
166 IXTK550N055T2
UP1242
42
167 IXTL2N450
TP1239
42
Temp.
[°C]
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
20
27
30
30
30
30
28
30
30
30
30
30
30
30
77
30
30
30
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
1920
2592
2880
2880
2880
2880
2688
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
960
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 7A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
168 IXTP02N120P
TS1307
42
169 IXTP100N04T2
SS1341
32
170 IXTP102N15T
K834
42
171 IXTP10P15T
SS1038
-42
172 IXTP110N055T2
SS1332
42
173 IXTP120P065T
SS1013
-42
174 IXTP130N10T
SS1318
42
175 IXTP15P15T
SS1036
-42
176 IXTP182N055T
SS1003
42
177 IXTP1N80P
SS0908
42
178 IXTP200N055T2
US1310
42
179 IXTP20N65X
HS1332
42
180 IXTP220N04T2
SS1051
42
181 IXTP220N04T2
SS0927
42
182 IXTP260N055T2
SS1338
42
183 IXTP26P10T
SS1040
-42
184 IXTP2N100
SS0914
42
185 IXTP2N100P
TS1332
42
186 IXTP3N50P
S1048
42
187 IXTP460P2
TS1332
42
188 IXTP48P05T
SS1040
-42
189 IXTP76P10T
TS1332
42
190 IXTP80N10T
SS1150
42
191 IXTP80N10T
SS1318
42
192 IXTP80N12T2
SS1043
42
193 IXTP8N50P
SS1050
42
194 IXTQ130N15T
SK0715
42
195 IXTT140P10T
SP1142
-42
196 IXTT16N20D2
TP1019
42
197 IXTT60N20L2
TP1005
42
198 IXTT6N150
TP1203
42
199 IXTV03N400S
TP1134
42
200 IXTX120P20T
SP1133
-42
201 IXTX210P10T
SP1130
-42
202 IXXH110N65C4
SS1302
42
203 IXXH50N60B3D1
TP1150
42
204 IXXH50N60C3
SS1105
42
205 IXXH60N65B4
SP1235
42
206 IXXH60N65C4
SP1236
42
207 IXXH80N65B4H1
SP1319
42
208 IXYH24N90C3
TS1144
42
209 IXYH30N120C3
TP1137
42
210 IXYH40N120C3
TP1137
42
211 IXYH40N90C3
TS1205
42
212 IXYH50N120C3
TP1137
42
213 IXYH60N90C3
SS1205
42
214 IXYH82N120C3
TP1115
42
215 IXYH82N120C3
TP1115
42
216 IXYP8N90C3
TS1144
42
217 IXYT20N120C3D1HV
TS1247
42
Temp.
[°C]
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
24
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2304
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark