Efficiency Through Technology RELIABILITY REPORT 2014 Power Semiconductor Devices January 2011 - December 2013 IXYS Corporation 1590 Buckeye Dr. Milpitas CA 95035-7418 USA Published April 2014 Q11 - A. Schlamp IXYS Semiconductor GmbH Edisonstrasse 15 D-68623 Lampertheim Germany Humidity Test QUALITY AND RELIABILITY Failure Modes: Degradation of electrical leakage characteristics due to moisture penetration into plastic packages. Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM, IDSS, ICES, IDRM, IRRM, IGSS, IGES, VTH. IXYS is committed to setting a new standard for excellence in Power Semiconductors. Reflecting our dedication to industry leadership in the manufacture of medium to high power devices, reliability has assumed a primary position in raw material selection, design, and process technology. Reliability utilizes information derived from applied research, engineering design, analysis of field applications and accelerated stress testing and integrates this knowledge to optimize device design and manufacturing processes. All areas that impact reliability have received considerable attention in order to achieve our goal to be the # 1 Reliability Supplier of Power Semiconductor products. We believe IXYS products should be the most reliable components in your system. We have committed significant resources to continuously improve and optimize our device design, wafer fab processes, assembly processes and test capabilities. As a result of this investment, IXYS has realized a dramatic improvement in reliability performance on all standardized tests throughout the product line. Excellence in product reliability is “built-in”, not testedin. Moreover, it requires a total systems approach, involving all parties: from design to raw materials to manufacturing. In addition to qualifying new products released to the market, life and environmental tests are periodically performed on standard products to maintain feedback on assembly and fabrication performance to assure product reliability. Further information on reliability of power devices is provided on www.ixys.com. Power Cycle (PC) Failure Modes: Thermal fatigue of silicon-metal and metal-metal interfaces due to heating and cooling can cause thermal and electrical performance degradation. Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS, ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM, VRRM. Steady State Temperature Humidity Bias Life Test (H³TRB) Failure Modes: Degradation of electrical leakage characteristics due to moisture penetration into plastic packages. Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM, IDSS, ICES, IDRM, IRRM, IGSS, IGES, VTH. High Accelerated Stress Test (HAST) Failure Modes: Degradation of electrical leakage characteristics due to moisture penetration into plastic packages. Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM, IDSS, ICES, IDRM, IRRM, IGSS, IGES, VTH. TERMS IN TABLES SUMMARY TABLES 1 AND 2: AF: acceleration factor RELIABILITY TESTS High Temperature Reverse Bias (HTRB) Failure Modes: Gradual degradation of break-down characteristics due to presence of foreign materials and polar/ionic contaminants disturbing the electric field termination structure. Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM, IDSS, ICES, IDRM, IRRM, VTH. AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k } (1) Ea: activation energy; @ HTRB Ea = 1.0 eV @ HTGB Ea = 0.4 eV -5 k: Boltzmann’s constant 8.6·10 eV/K T1: abs. application junction temperature (273+Tj) K T2: abs. test junction temperature (273+Tj) K High Temperature Gate Bias (HTGB) UCL: upper confidence limit (60%) Total Failures @ 60% UCL: Failure Modes: Rupture of the gate oxide due to localized thickness variations, structural anomalies, particulates in the oxide, channel inversion due to presence of mobile ions in the gate oxide. Sensitive Parameters: IGSS, IGES,VTH, IDSS, ICES. N = r + dr (2) r: number of failed devices dr: additional term, depending on both r and UCL MTTF: Mean Time To Failures = 1/Failure Rate 9 FIT: 1 FIT = 1 failure / 10 hrs Temperature Cycle (TC) TABLES 3: ∆T: max Tj - min Tj during Test Failure modes: Thermal fatigue of silicon-metal and metal-metal interfaces due to heating and cooling, causing thermal and electrical performance degradation. Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF. DEFINITION OF FAILURE Failure criteria are defined according to IEC 60747 standard series 2 Summary of Tables 1A - 1H: HTRB Table 1A Table 1B Table 1C Table 1D Table 1E Table 1F Table 1G Table 1H MOSFET/IGBT MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode Breakover discrete device Module Module Rec. Bridge Diode discrete device Diode 131 8 243 7539 1 1,00 8440 505 10 108 0 0,92 20354 1219 17 170 0 0,92 11477 687 16 180 0 0,92 7536 451 24 380 0 0,92 13173 789 17 340 0 0,92 913 55 31 627 0 0,92 27512 1647 5 100 0 0,92 7621580 870 14530 109000 14 226 45200 6 94 80160 10 166 122080 15 253 69840 9 145 1007150 125 2087 33440 4 69 Table 3G Failure Rate [FIT] 125°C, 60% UCL Failure Rate [FIT] 90°C, 60% UCL Total Lots Tested Total Devices Tested Total Actual Failures 60% UCL {eq. (2)} Total Equivalent Device Hours @ 125°C {AF eq. (1)} MTTF 125°C 60% UCL (Years) 90°C 60% UCL Summary of Table 2A - 2B: HTGB Failure Rate [FIT] 125°C, 60% UCL Failure Rate [FIT] 90°C, 60% UCL Total Lots Tested Total Devices Tested Total Actual Failures 60% UCL {eq. (2)} Total Equivalent Device Hours @ 125°C {AF eq. (1)} MTTF 125°C 60% UCL (Years) 90°C 60% UCL Table 2A Table 2B MOSFET/IGBT MOSFET/IGBT discrete device Module 128 41 235 7437 0 0,92 17747 5725 16 160 0 0,92 7165320 889 2756 51840 6 20 Summary of Tables 3A - 3G: Power Cycle Total Lots Tested Total Devices Tested Total Failures Total Device Cycles IXYS Semiconductor GmbH Table 3A Table 3B Table 3C Table3D Table 3E Table 3F MOSFET/IGBT MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode discrete device Module Module Rec. Bridge Diode discrete device 256 6504 0 88302000 3 40 0 1000000 9 90 0 1800000 6 60 0 210000 12 240 0 480000 17 280 0 610000 3 19 350 1 790000 Summary of Tables 4A - 4H: Temperature Cycle Total Lots Tested Total Devices Tested Total Failures Total Device Cycles Table 4A Table 4B Table 4C** Table4D Table 4E Table 4F Table 4G Table 4H MOSFET/IGBT MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode Breakover discrete device Module Module Rec. Bridge Diode discrete device Diode 294 8510 0 7643800 15 170 0 10350 13 125 0 6250 18 220 0 12300 30 570 0 29100 14 280 0 15000 37 729 0 43030 4 80 0 4000 ** Max. storage temperature specified = 125°C. For accelleration temperature cycling conditions Tmax = 150°C applied Summary of Tables 5A - 5H: Humidity Test Total Lots Tested Total Devices Tested Total Failures Total Device Hours Table 5A Table 5B Table 5C Table5D Table 5E Table 5F Table 5G Table 5H MOSFET/IGBT MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode Breakover discrete device Module Module Rec. Bridge Diode discrete device Diode 102 3420 0 426688 9 89 0 56552 3 25 0 8360 7 70 0 35520 4 80 0 5760 7 160 0 66720 4 80 0 3840 Summary of Tables 6A: H³TRB Total Lots Tested Total Devices Tested Total Failures Total Device Hours IXYS Semiconductor GmbH 12 240 0 17760 Summary of Tables 7A: HAST Table 6A Table 6B Table 6C Table 6G Table 7A MOSFET/IGBT MOSFET/IGBT Thyr./Diode Thyr./Diode MOSFET/IGBT discrete device Module Module discrete device 4 194 0 194000 2 20 0 20000 1 10 0 10000 2 87 0 87000 4 discrete device Total Lots Tested Total Devices Tested Total Failures Total Device Hours 217 6735 0 646560 HTRB (Tables 1A .. 1H) TABLE 1A: MOSFET/IGBT single device Date Code # Part Number or Test # 1 GWM160-0055P3 SL 4272 2 GWM160-0055X2 SL 3580 3 IXA12IF1200TC 3543 4 IXA20IF1200HB 3927 5 IXA20PG1200DHG LA 4228 6 IXA20PG1200DHG LB 3581 7 IXA20PT1200LB 4363 8 IXA20PT1200LB 4363 9 IXA27IF1200HJ 3376 10 IXA4IF1200UC 3116 11 IXBF55N300 TP1243 12 IXBH16N170A TP1221 13 IXBH40N160 3496 14 IXBH40N160 3795 15 IXBH9N160G 3075 16 IXBT24N170 TP1202 17 IXBX64N250 TP0952 18 IXBX64N250 TP1130 19 IXBX75N170 TP1031 20 IXCH36N250 TP1139 21 IXD50IF600HB 3868 22 IXDH20N120 3356 23 IXDH30N120D1 4058 24 IXDH35N60BD1 3229 25 IXDN55N120D1 4404 26 IXER35N120D1 3607 27 IXFA4N100Q TS1108 28 IXFB100N50P TP1110 29 IXFB100N50Q3 SP1106 30 IXFB110N60P3 SP1110 31 IXFB132N50P3 SP1110 32 IXFB210N30P3 SP1224 33 IXFB38N100Q2 TP1115 34 IXFB44N100Q3 SP1106 35 IXFB62N80Q3 SP1118 36 IXFB82N60Q3 SP1118 37 IXFD64N50P 3195 38 IXFH100N25P SS1049 39 IXFH120N25T SS1115 40 IXFH120N25T SP1141 41 IXFH12N100F SS1104 42 IXFH12N100F SS1052 43 IXFH12N100F SS1052 44 IXFH12N80P SS1051 45 IXFH150N17T2 SS1341 46 IXFH150N20T SP1147 47 IXFH15N100P TP1202 48 IXFH15N100Q3 SP1121 49 IXFH15N60 SS1104 50 IXFH160N15T2 SS1319 51 IXFH16N50P3 SP1207 52 IXFH16N60P3 SS1142 IXYS Semiconductor GmbH Voltage [V] 44 44 960 960 960 960 840 960 960 960 2400 960 1280 1260 1280 960 960 960 960 960 520 960 960 480 960 960 800 400 400 480 400 240 800 800 640 480 400 200 200 200 800 800 800 640 136 160 800 800 480 120 400 480 Temp. [°C] 125 150 125 125 125 125 125 125 125 150 90 125 125 125 125 125 85 125 125 90 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 168 1000 1000 168 1000 1000 1000 1000 1000 1000 1000 1000 168 168 168 1000 1000 1000 1000 1000 1000 168 168 168 168 168 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 20 77 20 20 20 20 20 20 20 20 30 30 20 20 20 30 30 30 30 30 20 20 20 20 10 20 30 30 30 30 30 30 30 30 30 30 72 30 30 77 30 30 30 30 30 30 30 30 30 30 30 30 5 Failures 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 3360 77000 20000 3360 20000 20000 20000 20000 20000 20000 30000 30000 3360 3360 3360 30000 30000 30000 30000 30000 20000 3360 3360 3360 1680 3360 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 72000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark I_CES increased TABLE 1A (cont'd): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 53 IXFH18N100Q3 SP1136 800 54 IXFH18N90P TP1202 720 55 IXFH20N50P3 SP1141 400 56 IXFH20N80P SS1121 640 57 IXFH22N60P3 SS1108 480 58 IXFH22N60P3 SP1318 400 59 IXFH26N50 TS1331 500 60 IXFH26N50P3 SS1206 400 61 IXFH26N50P3 TP1325 400 62 IXFH26N50Q TS1343 500 63 IXFH28N60P3 SS1105 480 64 IXFH30N50Q3 SS1117 400 65 IXFH40N30Q SS1020 240 66 IXFH42N60P3 SP1110 480 67 IXFH44N50Q3 SP1133 400 68 IXFH50N30Q3 SP1117 240 69 IXFH50N60P3 SP1109 480 70 IXFH50N60P3 SP1201 480 71 IXFH60N50P3 SP1109 400 72 IXFH60N50P3 TP1326 400 73 IXFH70N20Q3 SS1117 160 74 IXFH70N30Q3 SP1133 240 75 IXFH7N100P TP1143 800 76 IXFH88N30P TP1237 240 77 IXFH94N30T SS1115 240 78 IXFH94N30T SP1141 240 79 IXFK120N25P TP1239 200 80 IXFK140N30P TP1242 240 81 IXFK230N20T SP1106 160 82 IXFK230N20T SP1106 160 83 IXFK26N120P TP1102 960 84 IXFK38N80Q2 TP1105 640 85 IXFK420N10T SP1046 80 86 IXFK420N10T SP1347 100 87 IXFK44N80P TP1219 640 88 IXFK64N50P TP1242 400 89 IXFK80N60P3 SP1150 480 90 IXFK90N50P2 TP1333 400 91 IXFK90N50P2 TP1337 500 92 IXFK94N50P2 SP1051 400 93 IXFK94N50P2 SP1111 400 94 IXFK94N50P2 SF1211 480 95 IXFN100N25 SS1309 200 96 IXFN150N15 SS1309 120 97 IXFN170N30P SP1045 240 98 IXFN32N120P TP1230 960 99 IXFN38N100P TP1230 800 100 IXFN44N60 SP1103 480 101 IXFN90N30 TS1309 240 102 IXFP110N15T2 SS1332 120 103 IXFP14N60P3 SS1144 480 104 IXFP170N075T2 US1310 60 105 IXFP180N10T2 SS1305 80 106 IXFP22N60P3 TS1324 480 107 IXFP230N075T2 US1309 60 108 IXFP4N60P3 SS1143 480 109 IXFP5N50P3 SS1206 400 110 IXFP7N60P3 SS1143 480 111 IXFQ94N30P3 SS1321 240 IXYS Semiconductor GmbH Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 77 30 30 30 30 30 30 23 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 22 30 30 30 77 77 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 6 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 1A (cont'd): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 112 IXFR32N100Q3 SP1133 800 113 IXFR66N50Q2 TP1122 400 114 IXFT14N80P SP0731 640 115 IXFT20N100P TP1147 800 116 IXFX20N120P TS1337 960 117 IXFX24N100Q3 SP1137 800 118 IXFX26N120P TP1102 960 119 IXFX32N100Q3 TP1229 800 120 IXFX32N80Q3 SS1122 640 121 IXFX32N90P TS1122 720 122 IXFX44N80Q3 SP1123 640 123 IXFX44N80Q3 TP1226 640 124 IXFX48N60Q3 SS1118 480 125 IXFX64N50P 2924 200 126 IXFX64N50Q3 SP1118 400 127 IXFX64N60P3 SP1110 480 128 IXFX64N60Q3 SS1118 480 129 IXFX78N50P3 SP1109 400 130 IXFX80N50Q3 SP1106 400 131 IXFX80N60P3 SP1109 480 132 IXFX98N50P3 SP1110 400 133 IXGA20N250HV TS1222 960 134 IXGA24N170A TS1215 960 135 IXGH100N30C3 SS1250 240 136 IXGH24N170A TP0917 960 137 IXGH2N250 TP1010 960 138 IXGH32N60B TP1205 480 139 IXGH40N120B2D1 TP0940 960 140 IXGH48N60C3D1 TP1148 480 141 IXGH50N60C4 SP1133 480 142 IXGK120N120B3 TP1143 960 143 IXGK120N60B3 SP1146 480 144 IXGK75N250 TP1110 960 145 IXGK75N250 TP1047 960 146 IXGT32N120A3 TP1121 960 147 IXKH70N60C5 3639 480 148 IXKR40N60C 3077 480 149 IXSH45N120 TP1204 960 150 IXSN55N120AU1 TP1017 960 151 IXTA1N100 TS1047 800 152 IXTA3N120 TS1115 960 153 IXTA62N15P SS1047 120 154 IXTA80N10T SS1150 80 155 IXTF02N450 TP1329 3000 156 IXTH12N140 TP1119 960 157 IXTH12N150 TP1206 960 158 IXTH140P10T SP1130 -80 159 IXTH16P60P TS1316 -480 160 IXTH1N200P3 TP1338 960 161 IXTH1N80P TP0905 640 162 IXTH200N10T SP1319 80 163 IXTH20N65X SS1344 520 164 IXTH20P50P TP1309 -400 165 IXTH3N120 TS1136 960 166 IXTH48P20P SS1050 -160 167 IXTH48P20P SS1105 -160 168 IXTH48P20P SP1049 -160 169 IXTH4N150 TS1151 960 170 IXTH4N150 TP1149 960 171 IXTH68P20T SP1130 -160 IXYS Semiconductor GmbH Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 125 125 125 85 125 125 125 125 125 125 85 90 125 125 125 125 125 125 125 125 125 90 85 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 168 168 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 30 30 30 30 30 30 30 30 30 30 30 30 80 30 30 30 30 30 30 30 10 30 30 30 30 30 30 30 30 30 30 30 77 30 20 20 30 30 30 30 30 77 22 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 7 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 80000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 3360 3360 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 1A (cont'd): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 172 IXTH6N100D2 TP1202 800 173 IXTH6N150 TP1201 960 174 IXTH76P10T SS1052 -80 175 IXTH96P085T SS1302 -68 176 IXTK550N055T2 SP1239 44 177 IXTK550N055T2 UP1242 44 178 IXTK550N055T2 UP1250 44 179 IXTK550N055T2 UP1251 44 180 IXTL2N450 TP1239 3000 181 IXTM21N50 SP1023 400 182 IXTP02N120P TS1307 960 183 IXTP100N04T2 SS1341 40 184 IXTP102N15T K834 120 185 IXTP110N055T2 SS1332 55 186 IXTP120P065T SS1013 -52 187 IXTP130N10T SS1318 80 188 IXTP1N80P SS0908 640 189 IXTP200N055T2 US1310 44 190 IXTP20N65X HS1332 520 191 IXTP220N04T2 SS1051 32 192 IXTP260N055T2 SS1338 55 193 IXTP2N100P TS1332 800 194 IXTP32N20T SS1051 160 195 IXTP3N50P SS1048 400 196 IXTP450P2 SS1047 400 197 IXTP460P2 TS1332 400 198 IXTP76P10T TS1332 -80 199 IXTP80N10T SS1150 80 200 IXTP80N10T SS1318 80 201 IXTP80N12T2 SS1043 96 202 IXTP8N50P SS1050 400 203 IXTQ110N10P SS1045 80 204 IXTQ170N10P SS1041 80 205 IXTQ200N10T SS1125 80 206 IXTQ200N10T SS1125 80 207 IXTQ22N60P SK1040 480 208 IXTQ22N60P SS1104 480 209 IXTQ36N30P SS1029 240 210 IXTQ460P2 SS1236 400 211 IXTR170P10P SP1106 -80 212 IXTT140P10T SP1142 -80 213 IXTT60N20L2 TP1005 160 214 IXTT6N150 TP1203 960 215 IXTT80N20L TP1046 160 216 IXTV03N400S TP1134 960 217 IXTX120P20T SP1133 -160 218 IXTX200N10L2 TP1137 80 219 IXTX20N140 TP1126 960 220 IXTX210P10T SP1130 -80 221 IXXH100N60C3 TP1101 480 222 IXXH50N60B3 SS1105 480 223 IXXH50N60B3D1 TP1150 480 224 IXXH50N60C3 SS1105 480 225 IXXH60N65B4 SP1235 520 226 IXXH60N65C4 SP1236 520 227 IXXH80N65B4H1 SP1319 520 228 IXYH24N90C3 TS1144 720 229 IXYH30N120C3 TP1137 960 230 IXYH40N120C3 TP1137 960 231 IXYH40N90C3 TS1205 720 IXYS Semiconductor GmbH Temp. [°C] 125 125 125 125 125 125 125 125 90 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 8 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 1A (cont'd): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 232 IXYH50N120C3 TP1137 960 233 IXYH60N90C3 SS1205 720 234 IXYH75N65C3 TS1341 650 235 IXYH80N90C3 TP1205 720 236 IXYH82N120C3 TP1115 960 237 IXYN100N65C3H1 TS1346 650 238 IXYP10N65C3 TS1319 520 239 IXYP8N90C3 TS1144 720 240 IXYT20N120C3D1HV TS1247 960 241 IXYX100N120C3 TP1137 960 Temp. [°C] 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 30 30 30 30 30 30 30 30 30 Failures TABLE 1B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MID200-12A4 3326 2 MIXA100W1200TEH 3248 3 MIXA40WB1200TED 4543 4 MIXA50WB600TED 4090 5 MIXA81WB1200TEH 4012 6 MIXD80PM650TMI 4249 7 MUBW50-06A7 3128 8 VKM60-01P1 4029 9 VMM300-03FP 4201 10 VMM90-09F 3214 Voltage [V] 960 960 960 520 1120 520 1120 80 240 720 Temp. [°C] 125 125 125 150 125 125 125 125 125 125 Time [hrs] 168 1000 1000 1000 1000 1000 1000 168 168 168 Sample Size 20 10 10 10 10 10 8 10 10 10 Failures TABLE 1C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC21-16 3584 2 MCC26-16 3854 3 MCC26-16io1B 4169 4 MCC312 4064 5 MCC312-16 3511 6 MCC312-16io1 3099 7 MCC44-16 3969 8 MCC56-16io1 3127 9 MCC56-16io1 3733 10 MCC56-18 3129 11 MCC95-14io1B 4075 12 MCC95-16io1B 3276 13 MCO150-16io1 3339 14 MDD172 3465 15 MDD172-12 3331 16 MDD312-16N1 3301 17 MDD95-22 4395 Voltage [V] 1120 1120 1120 1120 1120 1120 1120 1120 1120 1260 980 1120 1120 1260 1260 1120 1540 Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 168 168 168 168 168 168 168 168 168 1000 168 168 168 1000 168 168 168 Sample Size 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 Failures IXYS Semiconductor GmbH 9 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark Device Hours [hrs] 3360 10000 10000 10000 10000 10000 8000 1680 1680 1680 Remark Device Hours [hrs] 1680 1680 1680 1680 1680 1680 1680 1680 1680 10000 1680 1680 1680 10000 1680 1680 1680 Remark TABLE 1D: Controller/Rectifier Bridge Date Code # Part Number or Test # 1 MMO90-14io6 3604 2 VBO21-12NO7 3587 3 VUB145-16NOXT 4154 4 VUB145-16NOXT 4154 5 VUC36-16go2 3320 6 VUC36-16go2 3320 7 VUI72NOXT 3955 8 VUI72NOXT 3955 9 VUO155-16 3101 10 VUO34-18NO1 4362 11 VUO36-16NO8 3806 12 VUO52 3118 13 VUO52-16 3887 14 VUO52-16 3887 15 VUO52-16NO1 3655 16 VUO82-16NO7 3087 Voltage [V] 980 840 960 1120 1120 1120 1120 960 1120 1260 1120 1400 1120 1120 1120 1120 Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 168 168 1000 1000 168 168 168 168 168 168 168 1000 1000 1000 168 168 Sample Size 10 10 10 10 10 10 10 10 10 20 10 20 10 10 10 10 Failures Voltage [V] 480 480 160 240 960 960 960 160 480 480 960 480 800 480 480 960 960 960 480 480 480 480 960 480 Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 168 168 1000 168 1000 168 168 168 168 168 168 168 168 168 168 168 168 168 168 168 168 168 Sample Size 20 20 20 20 20 20 10 10 10 10 10 10 20 20 20 20 20 10 10 20 20 20 10 10 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 1680 1680 10000 10000 1680 1680 1680 1680 1680 3360 1680 20000 10000 10000 1680 1680 Remark Device Hours [hrs] 20000 20000 3360 3360 20000 3360 10000 1680 1680 1680 1680 1680 3360 3360 3360 3360 3360 1680 1680 3360 3360 3360 1680 1680 Remark TABLE 1E: FRED # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 DHG30IM600PC DHG60I600HA DPG30C200HB DPG80C300HB DSEC120-12AK DSEC60-12A DSEI2x101-12A DSEI2x121-02A DSEI2x31-06C DSEI2x31-06P DSEI2x61-12B DSEI2x61-12B DSEI30-10A DSEI60-06A DSEP15-06B DSEP15-12CR DSEP29-12A DSEP2x31-12A DSEP2x61-06A DSEP30-06BR DSEP60-06A DSEP75-06AR MEE250-12DA MEK95-06DA IXYS Semiconductor GmbH Date Code or Test # 3393 4513 3925 3796 4438 4456 3325 4063 3738 3461 4146 4317 3069 4037 4328 4034 3183 3226 3954 3715 3595 3343 3644 3212 10 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 TABLE 1F: Schottky Diode # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 DSA20C100PN DSA20C150PB DSA30C45PB DSA50C100QB DSA70C150HB DSA90C200HR DSB80C45HB DSSK60-002A DSSK60-0045A DSSK60-015A DSSK80-0025B DSSK80-0025B DSSK80-003B DSSK80-0045B DSSK80-006B DSSK80-006BR DSSS35-008AR Date Code or Test # 3801 4209 4295 3451 3350 3794 4036 4494 3608 3181 3199 3699 3072 4101 4130 3928 3446 TABLE 1G: Thyristor/Diode single device Date Code # Part Number or Test # 1 CLA50E1200HB 4140 2 CLB30I1200HB 4104 3 CLF20E1200PB 4038 4 CMA50E1600TZ 4331 5 CS19-12ho1 3736 6 CS22-12io1M 3187 7 CS30-12io1 3344 8 CS35-14io4 3090 9 CS45-16io1 3180 10 CS45-16io1R 4459 11 CSM401B 3377 12 CSM401B 3377 13 CSM410LB 4152 14 DLA100B1200LB 4351 15 DMA10I1600PA 3799 16 DMA10I1600PA 4324 17 DS2-08A 4015 18 DSA1-16D 4440 19 DSA17-18A 3856 20 DSA9-18 3337 21 DSA9-18F 4292 22 DSAI35-16A 3708 23 DSDI60-14A 3929 24 DSI30-12A 3610 25 DSI45-16A 3443 26 DSI45-16AR 4161 27 DSP109-3300V 4305 28 DSP109-3300V 4305 29 DSP109-3300V 4305 30 DSP25-16AR 4320 31 DSP45-16A 3068 Voltage [V] 100 120 45 100 150 200 36 200 45 150 20 20 24 36 48 48 80 Temp. [°C] 125 125 125 125 125 125 100 125 125 125 100 100 100 100 100 100 125 Time [hrs] 168 1000 168 168 168 168 1000 168 168 168 1000 1000 1000 1000 1000 1000 168 Sample Size 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 Failures Voltage [V] 840 840 840 1120 840 840 840 980 1120 1120 2000 2000 1680 960 1120 1120 560 1120 1260 1260 1260 1120 1120 840 1120 1120 2310 2310 2640 1120 1120 Temp. [°C] 125 125 125 125 125 125 125 125 125 125 60 80 125 150 150 150 150 150 150 150 150 150 125 150 150 150 125 150 150 150 150 Time [hrs] 168 1000 168 1000 168 168 168 168 168 168 350 650 1000 1000 168 168 168 1000 168 168 168 168 168 168 168 168 168 168 1000 168 168 Sample Size 20 20 20 20 20 20 20 10 20 20 10 10 20 77 20 20 10 40 20 10 10 10 20 20 20 20 20 20 20 20 20 Failures Voltage [V] 480 640 640 720 800 Temp. [°C] 125 125 125 125 125 Time [hrs] 168 168 1000 168 168 Sample Size 20 20 20 20 20 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 3360 20000 3360 3360 3360 3360 20000 3360 3360 3360 20000 20000 20000 20000 20000 20000 3360 Remark Device Hours [hrs] 3360 20000 3360 20000 3360 3360 3360 1680 3360 3360 3500 6500 20000 77000 3360 3360 1680 40000 3360 1680 1680 1680 3360 3360 3360 3360 3360 3360 20000 3360 3360 Remark Device Hours [hrs] 3360 3360 20000 3360 3360 Remark TABLE 1H: Breakover Diode # Part Number 1 2 3 4 5 IXBOD1-06 IXBOD1-08 IXBOD1-08 IXBOD1-09 IXBOD1-10 IXYS Semiconductor GmbH Date Code or Test # 3458 3079 4212 4041 3721 11 0 0 0 0 0 HTGB (Tables 2A .. 2B) TABLE 2A: MOSFET/IGBT single device Date Code # Part Number or Test # 1 GWM160-0055X2 SL 3580 2 IXA20PG1200DHG LB 3581 3 IXA20PT1200LB 4363 4 IXA40PG1200DHGLA 3211 5 IXBF55N300 TP1243 6 IXBH16N170A TP1221 7 IXBT24N170 TP1202 8 IXBX64N250 TP0952 9 IXBX64N250 TP1130 10 IXBX75N170 TP1031 11 IXCH36N250 TP1139 12 IXD50IF600HB 3868 13 IXDN75N120 3952 14 IXER35N120D1 3802 15 IXFA4N100Q TS1108 16 IXFB100N50P TP1110 17 IXFB100N50Q3 SP1106 18 IXFB110N60P3 SP1110 19 IXFB132N50P3 SP1110 20 IXFB210N30P3 SP1224 21 IXFB38N100Q2 TP1115 22 IXFB44N100Q3 SP1106 23 IXFB62N80Q3 SP1118 24 IXFB82N60Q3 SP1118 25 IXFD64N50P 3195 26 IXFH100N25P SS1049 27 IXFH120N25T SS1115 28 IXFH120N25T SP1141 29 IXFH12N100F SS1104 30 IXFH12N100F SS1052 31 IXFH12N100F SS1052 32 IXFH12N80P SS1051 33 IXFH12N90 TS1344 34 IXFH150N17T2 SS1341 35 IXFH150N20T SP1147 36 IXFH15N100P TP1202 37 IXFH15N100Q3 SP1121 38 IXFH15N60 SS1104 39 IXFH160N15T2 SS1319 40 IXFH16N50P3 SP1207 41 IXFH16N60P3 SS1142 42 IXFH18N100Q3 SP1136 43 IXFH18N90P TP1202 44 IXFH20N50P3 SP1141 45 IXFH20N80P SS1121 46 IXFH22N60P3 SS1108 47 IXFH22N60P3 SP1318 48 IXFH26N50 TS1331 49 IXFH26N50P3 SS1206 50 IXFH26N50P3 TP1325 51 IXFH26N50Q TS1343 52 IXFH28N60P3 SS1105 53 IXFH30N50Q3 SS1117 54 IXFH40N30Q SS1020 55 IXFH42N60P3 SP1110 56 IXFH44N50Q3 SP1133 57 IXFH50N30Q3 SP1117 58 IXFH50N60P3 SP1109 59 IXFH50N60P3 SP1201 60 IXFH60N50P3 SP1109 IXYS Semiconductor GmbH Voltage [V] 15 16 16 16 25 20 20 16 16 16 20 16 16 16 16 24 24 24 24 16 16 24 24 24 30 16 16 16 16 16 16 16 20 20 16 24 24 16 16 24 24 24 16 16 24 24 30 20 24 30 20 24 16 16 24 24 16 24 16 24 Temp. [°C] 150 150 150 150 125 125 125 85 125 125 125 150 150 150 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 100 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 168 168 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 77 20 20 20 30 30 30 30 30 30 30 20 20 20 30 30 30 30 30 30 30 30 30 30 72 30 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 23 30 30 30 30 30 30 30 30 30 30 12 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 77000 2000 20000 20000 30000 30000 30000 30000 30000 30000 30000 20000 3360 3360 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 72000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 2A (cont`d): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 61 IXFH60N50P3 TP1326 30 62 IXFH70N20Q3 SS1117 16 63 IXFH70N30Q3 SP1133 24 64 IXFH7N100P TP1143 24 65 IXFH88N30P TP1237 16 66 IXFH94N30T SS1115 16 67 IXFH94N30T SP1141 16 68 IXFK120N25P TP1239 16 69 IXFK140N30P TP1242 16 70 IXFK230N20T SP1106 16 71 IXFK230N20T SP1106 16 72 IXFK26N120P TP1102 16 73 IXFK38N80Q2 TP1105 24 74 IXFK420N10T SP1046 16 75 IXFK420N10T SP1347 20 76 IXFK44N80P TP1219 24 77 IXFK64N50P TP1242 30 78 IXFK80N60P3 SP1150 24 79 IXFK90N50P2 TP1333 30 80 IXFK90N50P2 TP1337 20 81 IXFK94N50P2 SP1051 16 82 IXFK94N50P2 SP1111 30 83 IXFK94N50P2 SF1211 24 84 IXFN100N25 SS1309 16 85 IXFN150N15 SS1309 16 86 IXFN170N30P SP1045 16 87 IXFN32N120P TP1230 24 88 IXFN38N100P TP1230 24 89 IXFN44N60 SP1103 16 90 IXFN90N30 TS1309 16 91 IXFP110N15T2 SS1332 20 92 IXFP14N60P3 SS1144 24 93 IXFP170N075T2 US1310 16 94 IXFP180N10T2 SS1305 16 95 IXFP22N60P3 TS1324 16 96 IXFP230N075T2 US1309 16 97 IXFP4N60P3 SS1143 24 98 IXFP5N50P3 SS1206 24 99 IXFP7N60P3 SS1143 24 100 IXFQ94N30P3 SS1321 20 101 IXFR32N100Q3 SP1133 16 102 IXFR66N50Q2 TP1122 24 103 IXFT14N80P SP0731 16 104 IXFT20N100P TP1147 16 105 IXFX20N120P TS1337 30 106 IXFX24N100Q3 SP1137 24 107 IXFX26N120P TP1102 16 108 IXFX32N100Q3 TP1229 24 109 IXFX32N80Q3 SS1122 24 110 IXFX32N90P TS1122 24 111 IXFX44N80Q3 SP1123 24 112 IXFX44N80Q3 TP1226 30 113 IXFX48N60Q3 SS1118 24 114 IXFX64N50P 2924 20 115 IXFX64N50Q3 SP1118 24 116 IXFX64N60P3 SP1110 24 117 IXFX64N60P3 TS1337 20 118 IXFX64N60Q3 SS1118 24 119 IXFX78N50P3 SP1109 24 120 IXFX78N50P3 TS1337 20 121 IXFX80N50Q3 SP1106 24 122 IXFX80N60P3 SP1109 24 IXYS Semiconductor GmbH Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 30 30 30 30 30 77 30 30 30 30 30 30 30 22 30 30 30 77 77 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 80 30 30 30 30 30 30 30 30 13 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 80000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 2A (cont`d): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 123 IXFX98N50P3 SP1110 24 124 IXGA20N250HV TS1222 16 125 IXGH100N30C3 SS1250 16 126 IXGH24N170A TP0917 16 127 IXGH2N250 TP1010 16 128 IXGH32N60B TP1205 16 129 IXGH40N120B2D1 TP0940 16 130 IXGH48N60C3D1 TP1148 16 131 IXGH50N60C4 SS1052 16 132 IXGH50N60C4 SP1133 16 133 IXGK120N120B3 TP1143 16 134 IXGK120N60B3 SP1146 16 135 IXGK75N250 TP1110 16 136 IXGK75N250 TP1047 16 137 IXGT32N120A3 TP1121 16 138 IXKH35N60C5 4159 16 139 IXKH70N60C5 3359 16 140 IXKN40N60C 4453 16 141 IXKN75N60C 3094 16 142 IXKR40N60C 3360 16 143 IXKR40N60C 4031 16 144 IXSH45N120 TP1204 16 145 IXSN55N120AU1 TP1017 16 146 IXTA1N100 TS1047 16 147 IXTA3N120 TS1115 16 148 IXTA62N15P SS1047 16 149 IXTA80N10T SS1150 20 150 IXTH12N140 TP1119 16 151 IXTH12N150 TP1206 24 152 IXTH140P10T SP1130 -12 153 IXTH16P60P TS1316 16 154 IXTH1N200P3 TP1338 20 155 IXTH1N80P TP0905 16 156 IXTH200N10T SP1319 30 157 IXTH20N65X SS1344 30 158 IXTH20P50P TP1309 16 159 IXTH3N120 TS1136 20 160 IXTH48P20P SS1050 -16 161 IXTH48P20P SS1105 -16 162 IXTH48P20P SP1049 -16 163 IXTH4N150 TS1151 24 164 IXTH4N150 TP1149 24 165 IXTH68P20T SP1130 -12 166 IXTH6N100D2 TP1202 16 167 IXTH6N150 TP1201 16 168 IXTH76P10T SS1052 -16 169 IXTH96P085T SS1302 16 170 IXTK550N055T2 SP1239 16 171 IXTK550N055T2 UP1250 16 172 IXTK550N055T2 UP1251 16 173 IXTL2N450 TP1239 16 174 IXTM21N50 SP1023 16 175 IXTP02N120P TS1307 20 176 IXTP100N04T2 SS1341 20 177 IXTP102N15T K834 16 178 IXTP110N055T2 SS1332 20 179 IXTP120P065T SS1013 -16 180 IXTP130N10T SS1318 16 181 IXTP1N80P SS0908 16 182 IXTP200N055T2 US1310 16 183 IXTP20N65X HS1332 20 IXYS Semiconductor GmbH Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 85 125 150 150 150 150 150 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 168 168 168 168 168 168 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 10 30 30 30 30 30 30 30 30 30 30 30 77 30 20 20 20 20 20 20 30 30 30 30 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 14 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 3360 3360 3360 3360 3360 3360 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 2A (cont`d): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 184 IXTP220N04T2 SS1051 16 185 IXTP260N055T2 SS1338 20 186 IXTP2N100P TS1332 20 187 IXTP32N20T SS1051 16 188 IXTP3N50P SS1048 16 189 IXTP450P2 SS1047 16 190 IXTP460P2 TS1332 30 191 IXTP76P10T TS1332 15 192 IXTP80N10T SS1150 16 193 IXTP80N10T SS1318 16 194 IXTP80N12T2 SS1043 16 195 IXTP8N50P SS1050 16 196 IXTQ110N10P SS1045 16 197 IXTQ170N10P SS1041 16 198 IXTQ200N10T SS1125 24 199 IXTQ200N10T SS1125 24 200 IXTQ22N60P SK1040 16 201 IXTQ22N60P ss1104 16 202 IXTQ36N30P SS1029 16 203 IXTQ460P2 SS1236 24 204 IXTR170P10P SP1106 -16 205 IXTT140P10T SP1142 -12 206 IXTT16N20D2 TP1019 16 207 IXTT60N20L2 TP1005 16 208 IXTT6N150 TP1203 20 209 IXTT80N20L TP1046 16 210 IXTV03N400S TP1134 16 211 IXTX120P20T SP1133 -12 212 IXTX200N10L2 TP1137 16 213 IXTX20N140 TP1126 24 214 IXTX210P10T SP1130 -12 215 IXXH100N60C3 TP1101 16 216 IXXH50N60B3 SS1105 16 217 IXXH50N60B3D1 TP1150 20 218 IXXH50N60C3 SS1105 16 219 IXXH60N65B4 SP1235 16 220 IXXH60N65C4 SP1236 16 221 IXXH80N65B4H1 SP1319 16 222 IXYH24N90C3 TS1144 16 223 IXYH30N120C3 TP1137 16 224 IXYH40N120C3 TP1137 16 225 IXYH40N90C3 TS1205 16 226 IXYH50N120C3 TP1137 16 227 IXYH60N90C3 SS1205 16 228 IXYH75N65C3 TS1341 20 229 IXYH80N90C3 TP1205 16 230 IXYH82N120C3 TP1115 16 231 IXYN100N65C3H1 TS1346 20 232 IXYP8N90C3 TS1144 16 233 IXYT20N120C3D1HV TS1247 16 234 IXYX100N120C3 TP1137 16 235 MKE38P600LB 4179 16 IXYS Semiconductor GmbH Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 168 Sample Size 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 10 15 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 1680 Remark TABLE 2B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MDI75-12A3 3936 2 MID200-12A4 3328 3 MIXA20W1200MC 3089 4 MIXA30WB1200TED 3945 5 MIXA60HU1200VA 3920 6 MIXA81WB1200TEH 4012 7 MUBW35-06A6K 3826 8 MWI100-12E8 3677 9 MWI35-12A7 4019 10 VKM60-01P1 3588 11 VMM90-09F 3217 12 VUB145-16NOXT 3281 13 VUB145-16NOXT 4154 14 VUB160-16NO2 4018 15 VUM33-06PH 3302 16 VVZB170-16IOXT 3282 IXYS Semiconductor GmbH Voltage [V] 16 16 16 16 16 16 16 16 16 16 16 16 16 16 16 16 Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 168 168 168 168 1000 1000 168 168 168 168 168 168 1000 168 168 168 Sample Size 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 16 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 1680 1680 1680 1680 10000 10000 1680 1680 1680 1680 1680 1680 10000 1680 1680 1680 Remark POWER CYCLE (Tables 3A .. 3G) TABLE 3A: MOSFET/IGBT single device Date Code # Part Number or Tj(max) Test # [°C] 1 GWM160-0055X2 SL 3580 125 2 IXA12IF1200TC 3543 125 3 IXA20PG1200DHG LA 4228 125 4 IXA20PG1200DHG LB 3581 125 5 IXA20PG1200DHGLA 3211 125 6 IXBF55N300 TP1243 7 IXBH16N170A TP1221 8 IXBH40N160 3243 125 9 IXBH5N160G 4139 125 10 IXBH9N160G 3357 125 11 IXBT24N170 TP1202 12 IXBX64N250 TP0952 13 IXBX64N250 TP1130 14 IXBX75N170 TP1031 15 IXD50IF600HB 3868 125 16 IXDH20N120D1 3591 125 17 IXFA4N100Q TS1108 18 IXFB100N50P TP1110 19 IXFB100N50Q3 SP1106 20 IXFB110N60P3 SP1110 21 IXFB120N50P2 SP1015 22 IXFB132N50P3 SP1110 23 IXFB170N30P SP0842 24 IXFB210N30P3 SP1224 25 IXFB38N100Q2 TP1115 26 IXFB44N100P TP0930 27 IXFB44N100Q3 SP1106 28 IXFB60N80PK TS1349 29 IXFB62N80Q3 SP1118 30 IXFB82N60P SP0851 31 IXFB82N60Q3 SP1118 32 IXFH100N25P SS1049 33 IXFH120N25T SS1115 34 IXFH120N25T SP1141 35 IXFH12N100F SS1052 36 IXFH12N90 SS0911 37 IXFH150N17T2 SS1341 38 IXFH150N20T SP1147 39 IXFH15N100P TP1202 40 IXFH15N100Q3 SP1121 41 IXFH160N15T2 SS1319 42 IXFH16N50P3 SP1207 43 IXFH16N60P3 SS1142 44 IXFH18N100Q3 SP11136 45 IXFH18N90P TP1202 46 IXFH20N50P3 SP1141 IXYS Semiconductor GmbH ∆Τ [K] 100 80 80 80 80 100 100 80 80 80 100 100 100 100 80 80 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 Number of Cycles 6000 4000 80000 80000 8000 15000 15000 2000 2000 2000 15000 10000 10000 10000 4000 2000 10000 15000 15000 10000 15000 15000 10000 15000 15000 15000 10000 15000 15000 15000 15000 15000 10000 10000 10000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 Sample Size 77 20 20 20 10 24 24 20 20 20 24 24 24 24 20 20 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 77 24 24 24 24 24 24 24 24 24 24 77 24 16 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 462000 80000 1600000 1600000 80000 360000 360000 40000 40000 40000 360000 240000 240000 240000 80000 40000 240000 360000 360000 240000 360000 360000 240000 360000 360000 360000 240000 360000 360000 360000 360000 360000 240000 770000 240000 360000 360000 360000 360000 360000 360000 360000 360000 360000 1155000 360000 Remark TABLE 3A: MOSFET/IGBT single device Date Code # Part Number or Tj(max) Test # [°C] 47 IXFH20N80P SS1121 48 IXFH22N60P3 SS1108 49 IXFH22N60P3 SP1318 50 IXFH26N50P K0843 51 IXFH26N50P3 SS1206 52 IXFH26N50P3 TP1325 53 IXFH28N60P3 SS1115 54 IXFH30N50P SA0915 55 IXFH30N50Q3 SS1117 56 IXFH40N30Q SS1020 57 IXFH40N30Q TP0916 58 IXFH42N60P3 SP1110 59 IXFH44N50P SA0915 60 IXFH44N50Q3 SP1133 61 IXFH50N30Q3 SP1117 62 IXFH50N60P3 SP1109 63 IXFH50N60P3 SP1201 64 IXFH52N50P2 SP1010 65 IXFH60N50P3 SP1109 66 IXFH60N50P3 TP1326 67 IXFH6N120P TP0937 68 IXFH70N15 SP0850 69 IXFH70N20Q3 SS1117 70 IXFH70N30Q3 SP1133 71 IXFH74N20P SS1039 72 IXFH7N100P TP1143 73 IXFH88N30P TP1237 74 IXFH94N30T SS1115 75 IXFH94N30T SP1141 76 IXFK120N25P TP1239 77 IXFK140N30P TP1242 78 IXFK160N30T SP1120 79 IXFK230N20T SP1106 80 IXFK230N20T SP1116 81 IXFK26N120P TP1102 82 IXFK38N80Q2 TP1105 83 IXFK420N10T SP1046 84 IXFK420N10T SP1347 85 IXFK44N80P TP1219 86 IXFK64N50P TP1242 87 IXFK90N50P2 TP1333 88 IXFK90N50P2 TP1337 89 IXFK94N50P2 SP1051 IXYS Semiconductor GmbH ∆Τ [K] 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 Number of Cycles 10000 15000 15000 15000 15000 15000 10000 15000 15000 10000 10000 10000 15000 15000 10000 10000 15000 10000 15000 15000 15000 15000 15000 15000 15000 15000 15000 10000 10000 15000 15000 15000 10000 15000 10000 10000 10000 15000 15000 15000 15000 15000 10000 Sample Size 24 24 24 24 24 23 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 77 24 24 24 24 24 24 24 24 24 24 24 77 77 24 17 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 240000 360000 360000 360000 360000 345000 240000 360000 360000 240000 240000 240000 360000 360000 240000 240000 360000 240000 360000 360000 360000 360000 360000 360000 360000 360000 360000 240000 770000 360000 360000 360000 240000 360000 240000 240000 240000 360000 360000 360000 1155000 1155000 240000 Remark TABLE 3A: MOSFET/IGBT single device Date Code # Part Number or Tj(max) Test # [°C] 90 IXFK94N50P2 SP1111 91 IXFK94N50P2 SF1211 92 IXFN120N20 SS1301 93 IXFN32N120P TP1230 94 IXFN38N100P TP1230 95 IXFN82N60P SS1301 96 IXFN90N30 TS1309 97 IXFP110N15T2 SS1332 98 IXFP14N60P3 SS1144 99 IXFP170N075T2 US1310 100 IXFP180N10T2 SS1305 101 IXFP22N60P3 TS1324 102 IXFP230N075T2 US1309 103 IXFP4N60P3 SS1143 104 IXFP5N50P3 SS1206 105 IXFP76N15T2 SS0920 106 IXFP7N60P3 SS1143 107 IXFQ94N30P3 SS1321 108 IXFR32N100Q3 SP1133 109 IXFR66N50Q2 TP1122 110 IXFT14N80P SP0731 111 IXFT20N100P TP1147 112 IXFX160N30T SP0917 113 IXFX180N25T SS0908 114 IXFX20N120P TS1337 115 IXFX24N100Q3 SP1137 116 IXFX260N17T SS0912 117 IXFX26N120P TP1102 118 IXFX320N17T2 SP0931 119 IXFX32N100Q3 TP1229 120 IXFX32N80Q3 SS1122 121 IXFX32N90P TS1122 122 IXFX44N80P TS1332 123 IXFX44N80Q3 SP1123 124 IXFX44N80Q3 TP1226 125 IXFX48N50Q SF0938 126 IXFX48N60Q3 SS1118 127 IXFX64N50Q3 SP1118 128 IXFX64N60P TP1331 129 IXFX64N60P3 SP1110 130 IXFX64N60P3 SS1332 131 IXFX64N60P3 SS1332 132 IXFX64N60P3 SS1332 IXYS Semiconductor GmbH ∆Τ [K] 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 Number of Cycles 15000 15000 15000 10000 15000 15000 10000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 10000 15000 10000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 10000 10000 15000 10000 15000 10000 10000 15000 15000 15000 15000 Sample Size 77 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 23 24 24 24 15 24 24 24 24 24 15 24 15 15 15 18 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1155000 360000 360000 240000 360000 360000 240000 360000 360000 360000 360000 360000 360000 360000 360000 360000 360000 360000 360000 240000 360000 240000 360000 360000 360000 360000 360000 360000 345000 360000 360000 360000 150000 240000 360000 240000 360000 240000 150000 360000 225000 225000 225000 Remark TABLE 3A: MOSFET/IGBT single device Date Code # Part Number or Tj(max) Test # [°C] 133 IXFX64N60P3 SS1335 134 IXFX64N60P3 SS1335 135 IXFX64N60P3 SS1335 136 IXFX64N60P3 SS1335 137 IXFX64N60P3 TS1337 138 IXFX64N60P3 SS1335 139 IXFX64N60Q3 SS1118 140 IXFX73N30Q SF0938 141 IXFX78N50P3 SP1109 142 IXFX78N50P3 TS1337 143 IXFX80N50Q3 SP1106 144 IXFX80N60P3 SP1109 145 IXFX90N20Q TP0849 146 IXFX98N50P3 SP1110 147 IXGA20N250HV TS1222 148 IXGA24N170A TS1215 149 IXGF25N250 TP1206 150 IXGH100N30C3 SS1250 151 IXGH2N250 TP1010 152 IXGH30N120B3 SS0920 153 IXGH30N60C3D1 SK0840 154 IXGH32N60B TP1205 155 IXGH40N120B2D1 TP0940 156 IXGH40N120C3D1 TK0840 157 IXGH40N60A TP1304 158 IXGH48N60C3D1 TP1148 159 IXGH50N60C4 SP1133 160 IXGH60N60C3D1 SS0931 161 IXGK120N120B3 TP1143 162 IXGK120N60B3 SP1146 163 IXGK75N250 TP1046 164 IXGP20N120A3 TS0905 165 IXGR72N60C3D1 SP0952 166 IXGT32N120A3 TP1121 167 IXKH35N60C5 3160 125 168 IXKR47N60C5 3188 145 169 IXSH45N120 TP1204 170 IXTA02N250 TS1222 171 IXTA3N120 TS1115 172 IXTA76P10T SS1303 173 IXTA80N10T SS1150 174 IXTA96P085T SS1223 175 IXTA96P085T SS1223 IXYS Semiconductor GmbH ∆Τ [K] 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 80 100 100 100 100 100 100 100 100 Number of Cycles 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 10000 15000 10000 10000 15000 15000 10000 15000 15000 15000 10000 15000 15000 15000 10000 15000 15000 10000 2000 2000 15000 15000 10000 10000 10000 10000 10000 Sample Size 24 24 24 24 24 15 24 24 24 24 24 24 24 24 24 24 17 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 20 20 24 24 24 24 77 24 24 19 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 360000 360000 360000 360000 360000 225000 360000 360000 360000 360000 360000 360000 360000 360000 360000 360000 170000 360000 240000 240000 360000 360000 240000 360000 360000 360000 240000 360000 360000 360000 240000 360000 360000 240000 40000 40000 360000 360000 240000 240000 770000 240000 240000 Remark TABLE 3A: MOSFET/IGBT single device Date Code # Part Number or Tj(max) Test # [°C] 176 IXTA96P085T SS1223 177 IXTH12N140 TP1119 178 IXTH12N150 TP1206 179 IXTH140P10T SP1130 180 IXTH16P60P TS1316 181 IXTH1N200P3 TP1338 182 IXTH200N10T SP1319 183 IXTH20N65X SS1344 184 IXTH20P50P TP1309 185 IXTH250N075T SP0801 186 IXTH360N055T2 SP0926 187 IXTH3N120 TS1136 188 IXTH48P20P SS1050 189 IXTH4N150 TS1151 190 IXTH4N150 TP1149 191 IXTH50P10 SS1033 192 IXTH68P20T SP1130 193 IXTH6N150 TP1201 194 IXTH76P10T SS1052 195 IXTH96P085T SP0926 196 IXTH96P085T SS1302 197 IXTK550N055T2 UP1242 198 IXTM21N50 SP1023 199 IXTP02N120P TS1307 200 IXTP100N04T2 SS1341 201 IXTP102N15T K834 202 IXTP10P15T SS1038 203 IXTP120P065T SS1013 204 IXTP130N10T SS1318 205 IXTP15P15T SS1036 206 IXTP1N80P SS0908 207 IXTP200N055T2 US1310 208 IXTP20N65X HS1332 209 IXTP220N04T2 SS1328 210 IXTP22N50PM SS0924 211 IXTP260N055T2 SS1338 212 IXTP26P10T SS1040 213 IXTP3N50P S1048 214 IXTP460P2 TS1332 215 IXTP48P05T SS1040 216 IXTP76P10T TS1332 217 IXTP80N10T SS1150 218 IXTP80N10T SS1318 IXYS Semiconductor GmbH ∆Τ [K] 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 Number of Cycles 10000 15000 15000 10000 15000 15000 15000 15000 15000 15000 15000 10000 10000 15000 15000 10000 10000 15000 10000 10000 15000 15000 10000 15000 15000 15000 10000 10000 15000 15000 10000 15000 15000 15000 15000 15000 10000 15000 15000 15000 15000 15000 15000 Sample Size 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 20 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 240000 360000 360000 240000 360000 360000 360000 360000 360000 360000 360000 240000 240000 360000 360000 240000 240000 360000 240000 240000 360000 360000 240000 360000 360000 360000 240000 240000 360000 360000 240000 360000 360000 360000 360000 360000 240000 360000 360000 360000 360000 360000 360000 Remark TABLE 3A: MOSFET/IGBT single device Date Code # Part Number or Tj(max) Test # [°C] 219 IXTP80N12T2 SS1043 220 IXTQ130N15T SS0920 221 IXTQ200N10T SS1125 222 IXTQ200N10T SS1125 223 IXTQ22N60P SK1040 224 IXTQ450P2 SS1225 225 IXTQ460P2 SS1236 226 IXTQ88N28T SK0842 227 IXTR170P10P SP1106 228 IXTT140P10T SP1142 229 IXTT16N20D2 TP1019 230 IXTT60N20L2 TP1005 231 IXTT6N150 TP1203 232 IXTT80N20L TP1046 233 IXTX20N140 TP1126 234 IXTX210P10T SP1130 235 IXTX24N100 SP0837 236 IXTX600N04T2 SP0945 237 IXTX8N150L TP0912 238 IXXH100N60C3 TP1101 239 IXXH50N60B3 SS1105 240 IXXH50N60B3D1 TP1150 241 IXXH50N60C3 SS1105 242 IXXH60N65B4 SP1235 243 IXXH60N65C4 SP1236 244 IXXH80N65B4H1 SP1319 245 IXYH24N90C3 TS1144 246 IXYH30N120C3 TP1137 247 IXYH40N120C3 TP1137 248 IXYH40N90C3 TS1205 249 IXYH50N120C3 TP1137 250 IXYH60N90C3 SS1205 251 IXYH75N65C3 TS1341 252 IXYH80N90C3 TP1205 253 IXYH82N120C3 TP1115 254 IXYP8N90C3 TS1144 255 IXYT20N120C3D1HV TS1247 256 IXYX100N120C3 TP1137 IXYS Semiconductor GmbH ∆Τ [K] 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 Number of Cycles 15000 15000 15000 15000 10000 15000 15000 15000 10000 10000 10000 10000 15000 10000 10000 15000 15000 15000 15000 10000 15000 15000 15000 15000 15000 15000 15000 10000 15000 15000 15000 15000 15000 15000 15000 15000 15000 15000 Sample Size 24 24 24 24 24 24 24 24 24 77 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 24 21 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 360000 360000 360000 360000 240000 360000 360000 360000 240000 770000 240000 240000 360000 240000 240000 360000 360000 360000 360000 240000 360000 360000 360000 360000 360000 360000 360000 240000 360000 360000 360000 360000 360000 360000 360000 360000 360000 360000 Remark TABLE 3B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MIX300/450 3751 2 MIXA60HU1200VA 3920 3 MKI75-06A7T 3740 Tj(max) [°C] 125 125 125 ∆Τ [K] 80 80 80 Number of Cycles 70000 10000 10000 Sample Size 10 20 10 Failures Device Cycles 0 0 0 700000 200000 100000 TABLE 3C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCMA110P1600TA 3996 2 MCMA35P1400TA 3995 3 MCMA50P1600TA 4098 4 MCMA65P1600TA 3998 5 MCMA85P1600TA 3979 6 MDD172-16 3202 7 MDD26-16 3205 8 MDD95-16 3330 9 MDMA85P1600TG 3980 Tj(max) [°C] 125 125 125 125 125 125 125 125 125 ∆Τ [K] 80 80 80 80 80 80 80 80 80 Number of Cycles 20000 20000 20000 20000 50000 10000 10000 10000 20000 Sample Size 10 10 10 10 10 10 10 10 10 Failures Device Cycles 0 0 0 0 0 0 0 0 0 200000 200000 200000 200000 500000 100000 100000 100000 200000 TABLE 3D: Controller, Rectifier Bridge Date Code # Part Number or Test # 1 VUO190-12NO7 3590 2 VUO52-16NO1 3234 3 VUO52-16NO1 3656 4 VUO82-16NO7 3463 5 VUO82-16NO7 4028 6 VVZ40-14 3103 Tj(max) [°C] 125 125 125 125 125 125 ∆Τ [K] 80 80 80 80 80 80 Number of Cycles 2000 5000 5000 2000 2000 5000 Sample Size 10 10 10 10 10 10 Failures Device Cycles 0 0 0 0 0 0 20000 50000 50000 20000 20000 50000 Tj(max) [°C] 145 145 145 125 125 125 145 145 145 145 145 125 125 145 145 145 145 145 145 ∆Τ [K] 100 100 100 80 80 80 100 100 100 100 100 80 80 100 100 100 100 100 100 Number of Cycles 2000 2000 2000 5000 2000 500 2000 2000 2000 2000 2000 5000 5000 2000 2000 2000 2000 2000 2000 Sample Size 20 20 20 20 10 20 20 20 20 20 20 10 10 20 20 20 20 20 20 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 40000 40000 40000 100000 20000 10000 40000 40000 40000 40000 40000 50000 50000 40000 40000 40000 40000 40000 40000 Remark Remark Remark TABLE 3E: FRED # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 DPG15I300PA DPG80C300HB DSEC60-06A DSEi 2x101-06A DSEI2x121-02A DSEI2x61-10B DSEI60-06A DSEK60-02A DSEP15-12CR DSEP15-12CR DSEP29-06B DSEP2x31-03A DSEP2x61-06A DSEP30-06BR DSEP30-12A DSEP60-06A DSEP60-12A DSEP60-12AR DSEP60-12AR IXYS Semiconductor GmbH Date Code or Test # 3354 4132 3924 4148 3093 3815 3719 3448 3606 4128 4059 4413 3603 4460 3789 3071 3179 3444 3792 22 Remark I_R increased TABLE 3F: Schottky Diode # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 DSA30C200PB DSA50C150HB DSA90C200HB DSSK30-018A DSSK40-0015B DSSK40-008B DSSK50-01A DSSK60-0045B DSSK60-02AR DSSK70-0015B DSSK70-008A DSSS35-008AR Date Code or Test # 4046 4129 3716 3074 3926 3450 3349 3592 4033 3812 4323 3714 Tj(max) [°C] 145 145 145 145 125 145 145 145 145 145 145 145 TABLE 3G: Thyristor/Diode single device Date Code # Part Number or Tj(max) Test # [°C] 1 CMA30E1600PB 4050 125 2 CMA30E1600PB 3658 125 3 CS35-14io4 3090 125 4 CS45-12io1 3162 125 5 CSM410LB 4152 145 6 DSA1-18D 3200 7 DSA17-18A 3857 8 DSA30I150PA 3185 145 9 DSA9-18F 4294 10 DSA9-18F 3338 11 DSAI35-16A 3710 145 12 DSI2x55-16A 3340 125 13 DSI30-12A 3490 145 14 DSI45-12A 3227 145 15 DSI45-16A 3810 145 16 DSI45-16AR 3348 145 17 DSP25-12A 3355 145 IXYS Semiconductor GmbH ∆Τ [K] 100 100 100 100 80 100 100 100 100 100 100 100 ∆Τ [K] 80 80 80 80 100 100 100 80 100 100 100 100 100 Number of Cycles 2000 2000 2000 2000 2000 2000 2000 2000 2000 2000 2000 2000 Sample Size 20 20 20 20 20 20 20 20 20 20 20 20 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 40000 40000 40000 40000 40000 40000 40000 40000 40000 40000 40000 40000 Number of Cycles 2000 2000 2000 2000 4000 2000 2000 2000 2000 2000 2000 5000 2000 2000 2000 2000 2000 Sample Size 20 20 10 20 10 20 10 20 20 10 10 10 20 20 20 20 20 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 40000 40000 20000 40000 40000 40000 20000 40000 40000 20000 20000 50000 40000 40000 40000 40000 40000 23 Remark Remark 10min. On/ 10min. Off 10min. On/ 10min. Off ∆Τc=90Κ ∆Τc=90Κ TEMPERATURE CYCLE (Tables 4A .. 4H) TABLE 4A: MOSFET/IGBT single device Date Code Low # Part Number or Temp. Test # [°C] 1 GWM160-0055X2 SL 3580 -40 2 IXA20I200PB 4093 -55 3 IXA20PG1200DHG LB 3581 -40 4 IXA20PT1200LB 4363 -55 5 IXA20SV1200DHGLA 3211 -40 6 IXA27IF1200HJ 3376 -55 7 IXA40PG1200DHGLA 3211 -40 8 IXA55I1200HJ 3743 -55 9 IXA60IF1200NA 3833 -40 10 IXBH15N160 3946 -55 11 IXBH16N170A TP1221 -55 12 IXBH40N160 3497 -55 13 IXBH40N160 4403 -55 14 IXBH40N160 3242 -55 15 IXBH5N160G 4457 -55 16 IXBH5N160G 3076 -55 17 IXBH9N160G 3712 -55 18 IXBT24N170 TP1202 -55 19 IXBX64N250 TP1130 -55 20 IXBX75N170 TP1031 -55 21 IXCH36N250 TP1139 -55 22 IXD50IF600HB 3868 -55 23 IXDD404SIA SA1208 -55 24 IXDH30N120D1 3797 -40 25 IXDH30N120D1 3640 -55 26 IXFA180N10T2 SS1229 -55 27 IXFA4N100Q TS1108 -55 28 IXFA7N60P3 SS1244 -55 29 IXFB100N50P TP1110 -55 30 IXFB100N50Q3 SP1106 -55 31 IXFB110N60P3 SP1110 -55 32 IXFB110N60P3 SP1201 -55 33 IXFB132N50P3 SP1110 -55 34 IXFB210N30P3 SP1224 -55 35 IXFB38N100Q2 TP1115 -55 36 IXFB44N100Q3 SP1106 -55 37 IXFB60N80PK TS1349 -55 38 IXFB62N80Q3 SP1118 -55 39 IXFB62N80Q3K TS1349 -55 40 IXFB82N60Q3 SP1118 -55 41 IXFD64N50P 3195 -40 42 IXFD64N50P 4049 -55 43 IXFH100N25P SS1049 -55 44 IXFH120N25T SS1115 -55 45 IXFH120N25T SP1141 -55 46 IXFH12N100F SS1052 -55 47 IXFH12N80P SS1051 -55 48 IXFH150N17T2 SS1341 -55 49 IXFH150N20T SP1147 -55 50 IXFH15N100P TP1202 -55 51 IXFH15N100Q3 SP1121 -55 52 IXFH15N60 SS1104 -55 53 IXFH160N15T2 SS1319 -55 54 IXFH16N50P3 SP1207 -55 55 IXFH16N60P3 SS1142 -55 56 IXFH18N100Q3 SP1136 -55 IXYS Semiconductor GmbH High Temp. [°C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 125 125 125 125 150 150 150 150 125 125 125 125 125 125 125 125 125 125 125 150 125 150 125 150 150 125 125 125 125 125 150 125 125 125 125 125 125 125 125 Number of Cycles 1000 50 1000 100 1000 100 1000 100 50 50 1000 50 50 50 50 50 50 1000 100 1000 1000 100 1000 50 50 250 1000 1000 1000 1000 500 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 77 20 20 20 10 20 10 20 20 20 30 20 20 20 20 20 20 30 30 30 30 20 77 20 20 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 80 12 30 30 77 30 30 30 30 30 30 30 30 30 30 30 24 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 77000 1000 20000 2000 10000 2000 10000 2000 1000 1000 30000 1000 1000 1000 1000 1000 1000 30000 3000 30000 30000 2000 77000 1000 1000 7500 30000 30000 30000 30000 15000 30000 30000 30000 30000 30000 30000 30000 30000 30000 80000 12000 30000 30000 77000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 4A (cont'd): MOSFET/IGBT single device Date Code Low # Part Number or Temp. Test # [°C] 57 IXFH18N90P TP1202 -55 58 IXFH20N50P3 SP1141 -55 59 IXFH20N80P SS1121 -55 60 IXFH22N60P3 SS1108 -55 61 IXFH22N60P3 SP1318 -55 62 IXFH26N50 TS1331 -55 63 IXFH26N50P3 SS1206 -55 64 IXFH26N50P3 TP1325 -55 65 IXFH26N50Q TS1343 -55 66 IXFH28N60P3 SS1115 -55 67 IXFH30N50Q3 SS1117 -55 68 IXFH40N30Q SS1020 -55 69 IXFH42N60P3 SP1110 -55 70 IXFH44N50Q3 SP1133 -55 71 IXFH50N30Q3 SP1117 -55 72 IXFH50N60P3 SP1109 -55 73 IXFH50N60P3 SP1201 -55 74 IXFH60N50P3 SP1109 -55 75 IXFH60N50P3 TP1326 -55 76 IXFH70N20Q3 SS1117 -55 77 IXFH70N30Q3 SP1133 -55 78 IXFH75N10 SS1219 -55 79 IXFH7N100P TP1143 -55 80 IXFH88N30P TP1237 -55 81 IXFH94N30T SS1115 -55 82 IXFH94N30T SP1141 -55 83 IXFJ22N60P3 SS1205 -55 84 IXFK120N25P TP1239 -55 85 IXFK140N30P TP1242 -55 86 IXFK230N20T SP1106 -55 87 IXFK230N20T SP1116 -55 88 IXFK26N120P TP1102 -55 89 IXFK38N80Q2 TP1105 -55 90 IXFK420N10T SP1046 -55 91 IXFK44N80P TP1219 -55 92 IXFK64N50P TP1242 -55 93 IXFK80N60P3 SP1150 -55 94 IXFK90N50P2 TP1333 -55 95 IXFK90N50P2 TP1337 -55 96 IXFK94N50P2 SP1051 -55 97 IXFK94N50P2 SP1111 -55 98 IXFK94N50P2 SF1211 -55 99 IXFN100N25 SS1309 -55 100 IXFN120N20 SP1211 -55 101 IXFN120N20 SS1301 -55 102 IXFN150N15 SS1309 -55 103 IXFN170N30P SP1045 -55 104 IXFN180N15P SP1210 -55 105 IXFN200N10P SP1212 -55 106 IXFN32N120P TP1230 -55 107 IXFN32N120P-BN SP1217 -55 108 IXFN340N07 SF1105 -55 109 IXFN340N07 SP1213 -55 110 IXFN34N100 SP1111 -55 111 IXFN34N80 SF1105 -55 112 IXFN38N100P SP1204 -55 113 IXFN38N100P TP1230 -55 IXYS Semiconductor GmbH High Temp. [°C] 125 125 125 125 125 150 125 125 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Number of Cycles 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 100 250 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 500 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 77 30 30 30 30 30 30 20 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 30 25 30 30 77 77 30 77 30 30 10 30 30 30 10 10 30 10 30 10 10 30 10 30 25 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 77000 30000 30000 30000 30000 30000 30000 20000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 77000 30000 30000 30000 30000 30000 30000 3000 7500 25000 30000 30000 77000 77000 30000 77000 30000 30000 10000 30000 30000 15000 10000 10000 30000 10000 30000 10000 10000 30000 10000 30000 Remark TABLE 4A (cont'd): MOSFET/IGBT single device Date Code Low # Part Number or Temp. Test # [°C] 114 IXFN44N100Q3 SP1207 -55 115 IXFN44N60 SP1103 -55 116 IXFN44N80 SP1212 -55 117 IXFN44N80 SP1212 -55 118 IXFN48N50 TP1212 -55 119 IXFN64N50P SP1208 -55 120 IXFN64N50P TS1347 -55 121 IXFN64N60P SP1206 -55 122 IXFN80N50P SP1212 -55 123 IXFN82N60P SS1301 -55 124 IXFN90N30 SF1105 -55 125 IXFN90N30 TS1309 -55 126 IXFP110N15T2 SS1332 -55 127 IXFP14N60P3 SS1144 -55 128 IXFP170N075T2 US1309 -55 129 IXFP180N10T2 SS1305 -55 130 IXFP22N60P3 TS1324 -55 131 IXFP230N075T2 US1309 -55 132 IXFP4N60P3 SS1143 -55 133 IXFP5N50P3 SS1206 -55 134 IXFP7N60P3 SS1143 -55 135 IXFQ94N30P3 SS1321 -55 136 IXFR32N100Q3 SP1133 -55 137 IXFR66N50Q2 TP1122 -55 138 IXFT14N80P SP0731 -55 139 IXFT20N100P TP1147 -55 140 IXFX20N120P TS1337 -55 141 IXFX210N17T SS0912 -55 142 IXFX24N100Q3 SP1137 -55 143 IXFX26N120P TP1102 -55 144 IXFX32N100Q3 TP1229 -55 145 IXFX32N80Q3 SS1122 -55 146 IXFX44N80P TS1332 -55 147 IXFX44N80Q3 SP1123 -55 148 IXFX44N80Q3 TP1226 -55 149 IXFX48N60Q3 SS1118 -55 150 IXFX64N50Q3 SP1118 -55 151 IXFX64N60P TP1331 -55 152 IXFX64N60P3 SP1110 -55 153 IXFX64N60P3 SS1332 -55 154 IXFX64N60P3 SS1332 -55 155 IXFX64N60P3 SS1332 -55 156 IXFX64N60P3 TS1337 -55 157 IXFX64N60P3 SS1335 -55 158 IXFX64N60P3 SS1335 -55 159 IXFX64N60P3 SS1335 -55 160 IXFX64N60P3 SS1335 -55 161 IXFX64N60P3 SS1335 -55 162 IXFX64N60Q3 SS1118 -55 163 IXFX78N50P3 SS1108 -55 164 IXFX78N50P3 SP1109 -55 165 IXFX78N50P3 TS1337 -55 166 IXFX80N50Q3 SP1106 -55 167 IXFX80N60P3 SP1109 -55 168 IXFX98N50P3 SP1110 -55 169 IXGA20N100 TS1235 -55 170 IXGA20N250HV TS1222 -55 IXYS Semiconductor GmbH High Temp. [°C] 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 150 125 125 125 125 125 Number of Cycles 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 500 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 10 30 10 30 10 10 30 10 10 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 18 30 30 10 30 30 30 30 15 30 30 30 30 15 30 15 15 15 30 15 15 15 15 15 30 30 30 30 30 30 30 30 20 26 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 10000 30000 10000 30000 10000 10000 30000 10000 10000 30000 30000 30000 15000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 18000 30000 30000 10000 30000 30000 30000 30000 15000 30000 30000 30000 30000 15000 30000 15000 15000 15000 30000 15000 15000 15000 15000 15000 30000 30000 30000 30000 30000 30000 30000 30000 20000 Remark TABLE 4A (cont'd): MOSFET/IGBT single device Date Code Low # Part Number or Temp. Test # [°C] 171 IXGA24N170A TS1215 -55 172 IXGF25N250 TP1206 -40 173 IXGH100N30C3 SS1250 -55 174 IXGH24N170A TP0917 -55 175 IXGH2N250 TP1010 -55 176 IXGH40N120B2D1 TP0940 -55 177 IXGH40N60A TP1304 -55 178 IXGH48N60C3D1 TP1148 -55 179 IXGH50N60C4 SS1052 -55 180 IXGH50N60C4 SP1133 -55 181 IXGK120N120B3 TP1143 -55 182 IXGK120N60B3 SP1146 -55 183 IXGK75N250 TP1110 -55 184 IXGK75N250 TP1047 -55 185 IXGT32N120A3 TP1121 -55 186 IXKH30N60C5 4022 -55 187 IXKH35N60C5 4158 -55 188 IXKH70N60C5 3358 -55 189 IXKP24N60C5M 4319 -55 190 IXKR40N60C 3713 -40 191 IXSH45N120 TP1204 -55 192 IXSN35N120AU1 TP1208 -55 193 IXSN55N120AU1 TP1017 -55 194 IXTA05N100 TS1236 -55 195 IXTA06N120P TS1247 -55 196 IXTA1N100 TS1047 -55 197 IXTA200N055T2 SS1223 -55 198 IXTA2R4N120P TS1226 -55 199 IXTA36N30P SS1241 -55 200 IXTA3N120 TS1115 -55 201 IXTA3N120 TS1234 -55 202 IXTA3N120 TS1234 -55 203 IXTA50N28T SS1216 -55 204 IXTA62N15P SS1047 -55 205 IXTA80N10T SS1150 -55 206 IXTH12N140 TP1119 -55 207 IXTH140P10T SP1130 -55 208 IXTH16P60P TS1316 -55 209 IXTH1N200P3 TP1338 -55 210 IXTH1N80P TP0905 -55 211 IXTH200N10T SP1319 -55 212 IXTH20N65X SS1344 -55 213 IXTH20P50P TP1309 -55 214 IXTH3N120 TS1136 -55 215 IXTH40N30 SS1248 -55 216 IXTH48P20P SS1050 -55 217 IXTH48P20P SS1105 -55 218 IXTH48P20P SP1049 -55 219 IXTH4N150 TS1151 -55 220 IXTH4N150 TP1149 -55 221 IXTH68P20T SP1130 -55 222 IXTH6N100D2 TP1202 -55 223 IXTH6N150 TP1201 -55 224 IXTH76P10T SS1052 -55 225 IXTH96P085T SS1302 -55 226 IXTK550N055T2 UP1242 -55 227 IXTL2N450 TP1239 -40 IXYS Semiconductor GmbH High Temp. [°C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 150 150 150 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Number of Cycles 1000 1000 250 1000 250 1000 1000 1000 500 1000 1000 1000 1000 1000 1000 100 50 50 50 50 1000 1000 100 1000 1000 1000 1000 1000 1000 1000 20 20 250 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 20 30 10 30 30 30 30 30 30 30 30 30 77 30 20 20 20 20 20 30 10 30 30 30 30 30 30 30 30 15 50 30 30 77 30 30 30 30 10 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 27 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 30000 20000 7500 10000 7500 30000 30000 30000 15000 30000 30000 30000 30000 77000 30000 2000 1000 1000 1000 1000 30000 10000 3000 30000 30000 30000 30000 30000 30000 30000 300 1000 7500 30000 77000 30000 30000 30000 30000 10000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 4A (cont'd): MOSFET/IGBT single device Date Code Low # Part Number or Temp. Test # [°C] 228 IXTM21N50 SP1023 -55 229 IXTN210P10T SP1215 -55 230 IXTN21N100 SF1105 -55 231 IXTN40P50P SP1212 -55 232 IXTP02N120P TS1307 -55 233 IXTP05N100M TS1245 -55 234 IXTP100N04T2 SS1341 -55 235 IXTP102N15T K834 -55 236 IXTP110N055T2 SS1332 -55 237 IXTP120P065T SS1013 -55 238 IXTP130N10T SS1318 -55 239 IXTP1N80P SS0908 -55 240 IXTP200N055T2 US1310 -55 241 IXTP20N65X HS1332 -55 242 IXTP220N04T2 SS1051 -55 243 IXTP220N04T2 SS1328 -55 244 IXTP260N055T2 SS1338 -55 245 IXTP2N100P TS1332 -55 246 IXTP32N20T SS1051 -55 247 IXTP3N50P SS1048 -55 248 IXTP450P2 SS1047 -55 249 IXTP460P2 TS1332 -55 250 IXTP76P10T TS1332 -55 251 IXTP80N10T SS1150 -55 252 IXTP80N10T SS1318 -55 253 IXTP80N12T2 SS1043 -55 254 IXTP8N50P SS1050 -55 255 IXTQ110N10P SS1045 -55 256 IXTQ170N10P SS1041 -55 257 IXTQ200N10T SS1125 -55 258 IXTQ200N10T SS1125 -55 259 IXTQ22N60P SS1104 -55 260 IXTQ36N30P SS1029 -55 261 IXTQ460P2 SS1236 -55 262 IXTR170P10P SP1106 -55 263 IXTT12N150 TP1206 -55 264 IXTT140P10T SP1142 -55 265 IXTT16N20D2 TP1019 -55 266 IXTT60N20L2 TP1005 -55 267 IXTT6N150 TP1203 -55 268 IXTT80N20L TP1046 -55 269 IXTV03N400S TP1134 -55 270 IXTX120P20T SP1133 -55 271 IXTX200N10L2 TP1137 -55 272 IXTX20N140 TP1126 -55 273 IXTX210P10T SP1130 -55 274 IXTY01N100D TS1014 -55 275 IXXH100N60C3 TP1101 -55 276 IXXH50N60B3 SS1105 -55 277 IXXH50N60B3D1 TP1150 -55 278 IXXH50N60C3 SS1105 -55 279 IXXH60N65B4 SP1235 -55 280 IXXH60N65C4 SP1236 -55 281 IXXH80N65B4H1 SP1319 -55 282 IXYH24N90C3 TS1144 -55 283 IXYH30N120C3 TP1137 -55 284 IXYH40N120C3 TP1137 -55 IXYS Semiconductor GmbH High Temp. [°C] 125 125 125 125 150 125 150 125 150 125 125 125 125 125 125 125 150 150 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Number of Cycles 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 500 500 1000 1000 1000 1000 250 1000 100 100 1000 1000 1000 250 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 250 250 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 10 30 10 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 16 30 30 77 30 30 30 30 30 30 30 30 27 30 30 30 30 30 30 30 30 30 30 30 28 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 30000 10000 30000 10000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 15000 15000 30000 30000 30000 30000 7500 30000 3000 3000 30000 30000 16000 7500 30000 77000 30000 30000 30000 30000 30000 30000 30000 30000 27000 30000 7500 7500 30000 30000 30000 30000 30000 30000 30000 30000 Remark TABLE 4A (cont'd): MOSFET/IGBT single device Date Code Low # Part Number or Temp. Test # [°C] 285 IXYH40N90C3 TS1205 -55 286 IXYH50N120C3 TP1137 -55 287 IXYH60N90C3 SS1205 -55 288 IXYH75N65C3 TS1341 -55 289 IXYH80N90C3 TP1205 -55 290 IXYH82N120C3 TP1115 -55 291 IXYP8N90C3 TS1144 -55 292 IXYT20N120C3D1HV TS1247 -55 293 IXYX100N120C3 TP1137 -55 294 MMIX1N64N300 TP1137 -40 High Temp. [°C] 125 125 125 150 125 125 125 125 125 125 Number of Cycles 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 30 30 30 30 30 30 30 30 10 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 30000 30000 30000 30000 30000 30000 30000 30000 30000 10000 TABLE 4B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MID 550-12 A4 4203 2 MID75-12A3 3832 3 MIXA20W1200TML 3207 4 MIXA30WB1200TED 3804 5 MIXA40WB1200TED 4543 6 MIXA40WB1200TED 4543 7 MIXA81WB1200TEH 4012 8 MIXD80PM650TMI 4249 9 MKI75-12E8 3599 10 MUBW15-12A7 3146 11 MUBW35-06A6K 3827 12 MUBW50-17T8 3784 13 VKM60-01P1 4030 14 VMM90-09F 3215 15 VMM90-09P 4405 Low Temp. [°C] -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 High Temp. [°C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 50 50 50 50 100 100 100 100 50 50 25 50 10 50 100 Sample Size 10 20 20 10 10 10 10 10 10 10 10 10 10 10 10 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 500 1000 1000 500 1000 1000 1000 1000 500 500 250 500 100 500 1000 TABLE 4C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC225-14 3102 2 MCC26-14 3104 3 MCC312-16 3470 4 MCC312-16io1 4065 5 MCC56-16io1B 3275 6 MCC56-16iob 4097 7 MCC95-16 3510 8 MCD225-14 4417 9 MCD95-16io1 3943 10 MDD175-28N1 3622 11 MDD312-16N1 3274 12 MDD95 4115 13 MDD95-22N1B 3600 Low Temp. [°C] -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 High Temp. [°C] 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 50 50 50 50 50 50 50 50 50 50 50 50 50 Sample Size 10 10 10 10 10 10 10 9 10 6 10 10 10 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 500 500 500 500 500 500 500 450 500 300 500 500 500 IXYS Semiconductor GmbH 29 Remark Remark Remark TABLE 4D: Controller, Rectifier Bridge Date Code # Part Number or Test # 1 MMO62-16io6 3223 2 VBO21-12NO7 3586 3 VHF36-12io5 3645 4 VUB116-16NOXT 4174 5 VUB120-16NOXT 3297 6 VUB72-16 3086 7 VUO36-12NO8 3807 8 VUO52 3118 9 VUO52 3846 10 VUO52-16 3887 11 VUO52-16 3887 12 VUO52-16 4534 13 VUO52-16NO1 3732 14 VUO80-16 3944 15 VVY50-16 3235 16 VVY50-16io1 4116 17 VVZ40-14 4425 18 VVZB120-14io2 3769 Low Temp. [°C] -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 High Temp. [°C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 20 10 25 50 100 25 10 150 50 50 50 25 50 20 50 25 25 25 Sample Size 20 10 10 10 10 10 10 40 10 10 10 10 10 10 10 10 10 10 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 400 100 250 500 1000 250 100 6000 500 500 500 250 500 200 500 250 250 250 Low Temp. [°C] -40 -55 -55 -55 -55 -55 -55 -55 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -55 -55 -55 -40 -40 -55 -55 -55 -40 -40 -40 -40 High Temp. [°C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 100 50 50 50 50 50 50 50 50 100 20 20 10 50 50 50 50 20 50 50 50 20 20 50 50 100 50 50 50 50 Sample Size 20 20 20 20 20 20 20 20 20 40 20 20 10 20 20 20 20 20 20 20 20 20 20 20 20 20 10 10 10 10 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 2000 1000 1000 1000 1000 1000 1000 1000 1000 4000 400 400 100 1000 1000 1000 1000 400 1000 1000 1000 400 400 1000 1000 2000 500 500 500 500 Remark TABLE 4E: FRED # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 DH2x60-18A DPG15I300PA DPG30C300HB DPG30C400HB DPG60C200HB DPG60C300HJ DSEC16-06AC DSEC60-06A DSEI12-06A DSEI12-12A DSEI2x101-06A DSEI2x101-12A DSEI2x31-06P DSEI2x61-12B DSEI30-06A DSEI30-10A DSEI30-10A DSEIP2x61-06A DSEP15-12CR DSEP15-12CR DSEP29-12A DSEP2x25-12C DSEP2x31-03A DSEP30-12AR DSEP30-12AR DSEP60-06AT MEE250-12DA MEK95-06DA € MEO550-02DA MEO550-02DA IXYS Semiconductor GmbH Date Code or Test # 3770 3353 4131 4044 3718 4125 3798 3449 3934 4545 4147 3711 3462 3456 4455 3070 4327 3602 3930 3096 3184 4045 4414 3345 3793 3764 4105 3213 4396 3967 30 Remark TABLE 4F: Schottky Diode Low Temp. [°C] -55 -55 -55 -55 -55 -55 -55 -55 -55 -55 -55 -55 -55 -55 High Temp. [°C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 100 50 50 50 50 50 50 50 50 50 50 50 50 50 Sample Size 20 20 20 20 20 20 20 20 20 20 20 20 20 20 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 2000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 TABLE 4G: Thyristor/Diode single device Date Code Low # Part Number or Temp. Test # [°C] 1 CLA50E1200HB 3346 -55 2 CLA60PD1200NA 4160 -40 3 CLF20E1200PB 4039 -55 4 CMA80E1600HB 3976 -55 5 CS19-12H01 3737 -40 6 CS19-12ho1 3119 -40 7 CS19-12ho1 3484 -40 8 CS20-22MO F1 4017 -55 9 CS22-08io1M 3800 -55 10 CS23-16 3336 -40 11 CS30-12io1 3300 -40 12 CS30-16io1 4318 -55 13 CS35-14io4 3090 -40 14 CS45-12io1 3098 -40 15 CSM400A 3333 -40 16 CSM410LB 4152 -55 17 DLA100B1200LB 4178 -55 18 DMA30E1800HA 3273 -55 19 DSA1-16D 4440 -40 20 DSA17-18A 3855 -40 21 DSA30I150PA 3182 -55 22 DSA35-18A 3442 -40 23 DSA75-16B 4506 -40 24 DSA75-16B 4505 -40 25 DSA75-18B 3923 -40 26 DSA9-12F 3178 -40 27 DSA9-18 4143 -40 28 DSA9-18F 4293 -40 29 DSAI17-16A 3641 -40 30 DSAI35-16A 3709 -40 31 DSDI60-18A 3228 -40 32 DSI2x55-12A 4316 -40 33 DSI2x55-16A 3341 -40 34 DSI30-08A 4501 -55 35 DSP26-16AT 3835 -40 36 DSP45-12A 4141 -55 37 DSP45-16A 3193 -55 High Temp. [°C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 50 50 50 100 50 100 50 50 50 20 100 50 20 50 25 100 50 100 50 20 50 20 50 50 20 20 20 20 20 20 50 20 20 50 100 50 100 Sample Size 20 20 20 40 20 20 20 20 20 10 20 20 10 20 10 20 20 20 40 10 20 10 20 20 10 10 10 10 10 10 20 20 19 20 20 20 80 Failures Device Cycles 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1000 1000 1000 4000 1000 2000 1000 1000 1000 200 2000 1000 200 1000 250 2000 1000 2000 2000 200 1000 200 1000 1000 200 200 200 200 200 200 1000 400 380 1000 2000 1000 8000 High Temp. [°C] 150 150 150 150 Number of Cycles 50 50 50 50 Sample Size 20 20 20 20 Failures Device Cycles 0 0 0 0 1000 1000 1000 1000 # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 DSA20C150PB DSA30C150HB DSA70C100HB DSA70C150HB DSA90C200HB DSA90C200HB DSB30C30PB DSB60C45HB DSSK30-018A DSSK60-02A DSSK70-008A DSSK80-006B DSSS35-008AR DSSS35-008AR Date Code or Test # 4209 4322 3717 4035 4127 3347 3935 4493 3791 3452 3073 3609 4458 3445 Remark Remark TABLE 4H: Breakover Diode # Part Number 1 2 3 4 IXBOD1-06 IXBOD1-08 IXBOD1-09 IXBOD1-10 IXYS Semiconductor GmbH Date Code or Test # 3459 3079 4042 3722 Low Temp. [°C] -40 -40 -40 -40 31 Remark HUMIDITY TEST (Tables 5A .. 5H) TABLE 5A: MOSFET/IGBT single device Date Code # Part Number or Test # 1 GWM160-0055 X2 SL 4542 2 GWM160-0055X2 S 3455 3 GWM160-0055X2 SL 3580 4 IXA12IF1200HB 4411 5 IXA12IF1200TC 3543 6 IXA20PG1200DHG LA 4228 7 IXA20PG1200DHG LB 3581 8 IXA20PT1200LB 4363 9 IXA55I1200HJ 3743 10 IXBF55N300 TP1243 11 IXBH16N170A TP1221 12 IXBH40N160 3932 13 IXBT24N170 TP1202 14 IXD50IF600HB 3868 15 IXDH35N60BD1 3161 16 IXFB210N30P3 SP1224 17 IXFB60N80PK TS1349 18 IXFB62N80Q3K TS1349 19 IXFD64N50P 3195 20 IXFH120N25T SP1141 21 IXFH150N17T2 SS1341 22 IXFH150N20T SP1147 23 IXFH160N15T2 SS1319 24 IXFH16N50P3 SP1207 25 IXFH18N100Q3 SP1136 26 IXFH26N50 TS1331 27 IXFH26N50P3 SS1206 28 IXFH26N50Q TS1343 29 IXFH70N30Q3 SP1133 30 IXFH75N10 SS1219 31 IXFH7N100P TP1143 32 IXFH94N30T SP1141 33 IXFJ75N10 TS1219 34 IXFK120N25P TP1239 35 IXFK44N80P TP1219 36 IXFK64N50P TP1242 37 IXFK80N60P3 SP1150 38 IXFK90N50P2 TP1333 39 IXFK90N50P2 TP1337 40 IXFK94N50P2 SF1211 41 IXFK94N50P2 SP1111 42 IXFK98N50P3 SP1142 43 IXFN100N25 SS1309 44 IXFN120N20 SS1301 45 IXFN150N15 SS1309 46 IXFN64N50P TS1347 47 IXFN82N60P SS1301 48 IXFN90N30 TS1309 49 IXFP110N15T2 SS1332 50 IXFP180N10T2 SS1305 51 IXFP230N075T2 US1309 52 IXFP5N50P3 SS1206 53 IXFQ94N30P3 SS1321 54 IXFT20N100P TP1147 55 IXFX20N120P TS1337 56 IXFX44N80Q3 TP1226 57 IXFX64N60P3 TS1337 58 IXFX78N50P3 TS1337 IXYS Semiconductor GmbH Temp. [°C] 121 121 121 121 121 85 85 121 121 121 121 121 121 121 121 121 121 121 85 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 Rel. H. [%] 100 100 100 100 100 85 85 100 100 100 100 100 100 100 100 100 100 100 85 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 Time [hrs] 96 96 96 48 96 1000 1000 96 96 96 96 48 96 96 48 96 96 96 1000 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 Sample Size 20 77 77 20 20 20 20 20 20 30 30 20 30 20 20 30 30 30 72 77 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 77 77 77 30 77 25 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 32 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 1920 7392 7392 960 1920 20000 20000 1920 1920 2880 2880 960 2880 1920 960 2880 2880 2880 72000 7392 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 7392 2880 2880 2880 2880 7392 7392 7392 2880 7392 2400 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 Remark TABLE 5A: MOSFET/IGBT single device Date Code # Part Number or Test # 59 IXFX80N50Q3 SP1106 60 IXGH100N30C3 SS1250 61 IXGH40N120B2D1 TP0940 62 IXGH48N60C3D1 TP1148 63 IXGH50N60C4 SP1133 64 IXGK120N120B3 TP1143 65 IXTH16P60P TS1316 66 IXTH1N200P3 TP1338 67 IXTH200N10T SP1208 68 IXTH200N10T SP1319 69 IXTH20N65X SS1344 70 IXTH20P50P TP1309 71 IXTH3N120 TS1136 72 IXTH4N150 TS1151 73 IXTH96P085T SS1302 74 IXTK550N055T2 UP1242 75 IXTP100N04T2 SS1341 76 IXTP110N055T2 SS1332 77 IXTP130N10T SS1318 78 IXTP200N055T2 US1310 79 IXTP200N055T2 US1310 80 IXTP20N65X HS1332 81 IXTP260N055T2 SS1338 82 IXTP2N100P TS1332 83 IXTP460P2 TS1332 84 IXTP76P10T TS1332 85 IXTP80N10T SS1150 86 IXTP80N10T SS1318 87 IXTQ200N10T SS1125 88 IXTQ200N10T SS1125 89 IXTQ460P2 SS1236 90 IXTT12N150 TP1206 91 IXTT140P10T SP1142 92 IXTT6N150 TP1203 93 IXTX120P20T SP1133 94 IXXH50N60B3D1 TP1150 95 IXXH60N65B4 SP1235 96 IXXH60N65C4 SP1236 97 IXYH40N90C3 TS1205 98 IXYH60N90C3 SS1205 99 IXYH75N65C3 TS1341 100 IXYH80N90C3 TP1205 101 IXYN100N65C3H1 TS1346 102 IXYT20N120C3D1HV TS1247 IXYS Semiconductor GmbH Temp. [°C] 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 121 Rel. H. [%] 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 100 Time [hrs] 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 Sample Size 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 30 30 30 30 33 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 7392 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 Remark TABLE 5B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MIX300/450 3751 2 MIXA225PF1200TSF 3825 3 MIXA40WB1200TED 4543 4 MIXA40WB1200TED 4543 5 MIXA81WB1200TEH 4538 6 MIXD80PM650TMI 4249 7 MWI100-12E8 3676 8 VKM60-01P1 3589 9 VMM90-09F 3216 Temp. [°C] 85 85 85 85 85 85 85 85 85 Rel. H. [%] 85 85 85 85 85 85 85 85 85 Time [hrs] 1000 168 1000 1000 1000 1000 168 168 168 Sample Size 10 9 10 10 10 10 10 10 10 Failures TABLE 5C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC21-14io8 3885 2 MCD162 3465 3 MCD162-16 3471 Temp. [°C] 85 85 85 Rel. H. [%] 85 85 85 Time [hrs] 168 1000 168 Sample Size 10 5 10 Failures TABLE 5D: Controller, Rectifier Bridge Date Code # Part Number or Test # 1 MMO90-16 3813 2 VUB145-16NOXT 4154 3 VUE22-06NO7 4027 4 VUO52-16 3887 5 VUO52-16 3887 6 VVZB120-14io2 3902 7 VVZB135-16ioXT 4210 Temp. [°C] 121 85 85 85 85 85 85 Rel. H. [%] 100 85 85 85 85 85 85 Time [hrs] 48 1000 168 1000 1000 168 168 Sample Size 10 10 10 10 10 10 10 Failures Date Code or Test # 3811 4513 3095 4545 3325 3222 3953 3097 4060 4032 4202 3963 Temp. [°C] 121 121 121 121 121 121 121 121 121 121 85 85 Rel. H. [%] 100 100 100 100 100 100 100 100 100 100 85 85 Time [hrs] 48 96 48 96 96 48 48 48 48 48 168 168 Sample Size 20 20 20 40 20 20 20 20 20 20 10 10 Failures Date Code or Test # 3192 4047 3790 3351 Temp. [°C] 121 121 121 121 Rel. H. [%] 100 100 100 100 Time [hrs] 96 48 96 48 Sample Size 20 20 20 20 Failures TABLE 5G: Thyristor/Diode single device Date Code # Part Number or Temp. Test # [°C] 1 CMA80E1600HB 3976 85 2 CSM410LB 4152 121 3 DSDI60-16A 3342 121 4 DSI30-12A 3611 121 5 DSP109-3300V 4305 85 6 DSP26-16AT 3835 121 7 DSP45-16AR 3605 121 Rel. H. [%] 85 100 100 100 85 100 100 Time [hrs] 1000 96 48 48 1000 96 48 Sample Size 40 20 20 20 20 20 20 Failures Rel. H. [%] 100 100 100 100 Time [hrs] 48 48 48 48 Sample Size 20 20 20 20 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 10000 1512 10000 10000 10000 10000 1680 1680 1680 Remark Device Hours [hrs] 1680 5000 1680 Remark Device Hours [hrs] 480 10000 1680 10000 10000 1680 1680 Remark Device Hours [hrs] 960 1920 960 3840 1920 960 960 960 960 960 1680 1680 Remark Device Hours [hrs] 1920 960 1920 960 Remark Device Hours [hrs] 40000 1920 960 960 20000 1920 960 Remark Device Hours [hrs] 960 960 960 960 Remark TABLE 5E: FRED # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 DHG40C1200HB DHG60I600HA DSEC60-06B DSEI12-12A DSEI2x101-12A DSEI2x101-12A DSEI2x61-12B DSEP15-12CR DSEP29-06B DSEP30-06BR MEO450-12 MEO500-06DA 0 0 0 0 0 0 0 0 0 0 0 0 TABLE 5F: Schottky Diode # Part Number 1 2 3 4 DSA30C100PB DSA30C200PB DSSK60-02A DSSK80-006B 0 0 0 0 0 0 0 0 0 0 0 TABLE 5H: Breakover diode # Part Number 1 2 3 4 IXBOD1-06 IXBOD1-08 IXBOD1-09 IXBOD1-10 IXYS Semiconductor GmbH Date Code or Test # 3460 3079 4040 3723 Temp. [°C] 121 121 121 121 34 0 0 0 0 H³TRB TEST (Table 6A 6C) TABLE 6A: MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 1 GWM160-0055X2 S 3455 44 2 GWM160-0055X2 SL 3580 44 3 IXA20PG1200DHG LB 3581 80 4 IXA20SV1200DHGLA 3211 80 Temp. [°C] 85 85 85 85 Rel. H. [%] 85 85 85 85 Time [hrs] 1000 1000 1000 1000 Sample Size 77 77 20 20 Failures TABLE 6B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MIXA100W1200TEH 3248 2 MIXD50W650TED 4420 Voltage [V] 100 100 Temp. [°C] 85 85 Rel. H. [%] 85 85 Time [hrs] 1000 1000 Sample Size 10 10 Failures TABLE 6C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC255-16io1 4055 Voltage [V] 100 Temp. [°C] 85 Rel. H. [%] 85 Time [hrs] 1000 Sample Size 10 Failures TABLE 6G: Thyristor/Diode single device Date Code # Part Number or Voltage Test # [V] 1 CSM401B 3377 100 2 DLA100B1200LB 4351 100 Temp. [°C] 85 85 Rel. H. [%] 85 85 Time [hrs] 1000 1000 Sample Size 10 77 Failures TABLE 7A: MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 1 IXBF12N300 TP1218 42 2 IXBF15N300C TP1313 42 3 IXBF55N300 TP1243 42 4 IXBH16N170A TP1221 42 5 IXBT24N170 TP1202 42 6 IXBX64N250 TP0952 42 7 IXBX64N250 TP1130 42 8 IXFA4N100Q TS1108 42 9 IXFB100N50P TP1110 42 10 IXFB100N50Q3 SP1106 42 11 IXFB110N60P3 SP1201 42 12 IXFB210N30P3 SP1224 42 13 IXFB38N100Q2 TP1115 42 14 IXFB40N110P TP1026 42 15 IXFB44N100P TP0930 42 16 IXFB44N100Q3 SP1106 42 17 IXFB60N80PK TS1349 42 18 IXFB62N80Q3 SP1118 42 19 IXFB82N60Q3 SP1118 42 20 IXFH120N25T SS1115 42 21 IXFH120N25T SP1141 42 22 IXFH12N90 SS0911 42 23 IXFH12N90 TS1344 42 24 IXFH150N17T2 SS1341 42 25 IXFH150N20T SP1147 42 26 IXFH15N100P TP1202 42 27 IXFH15N100Q3 SP1121 42 28 IXFH160N15T2 SS1319 42 29 IXFH16N50P3 SP1207 42 30 IXFH16N60P3 SS1142 42 31 IXFH18N100Q3 SP1136 42 32 IXFH18N90P TP1202 42 33 IXFH20N50P3 SP1141 42 34 IXFH22N60P3 SS1108 42 35 IXFH22N60P3 SS1143 42 36 IXFH22N60P3 TS1326 42 37 IXFH26N50 TS1331 42 38 IXFH26N50P SK0843 42 39 IXFH26N50P3 SS1206 42 40 IXFH26N50Q TS1343 42 41 IXFH28N60P3 SS1115 42 42 IXFH28N60P3 SS1144 42 43 IXFH30N50Q3 SS1117 42 44 IXFH40N30Q TP0916 42 45 IXFH42N50P2 SP1009 42 46 IXFH44N50Q3 SP1133 42 47 IXFH50N30Q3 SP1117 42 48 IXFH50N60P3 SP1201 42 49 IXFH6N120P TP0937 42 50 IXFH70N15 SP0850 42 51 IXFH70N20Q3 SS1117 42 52 IXFH70N30Q3 SP1133 42 53 IXFH75N10 SS1219 42 54 IXFH7N100P TP1143 42 55 IXFH88N30P TP1237 42 56 IXFH94N30T SS1115 42 57 IXFH94N30T SP1141 42 58 IXFK140N30P TP1330 42 59 IXFK160N30T SP1120 42 60 IXFK180N25T SP1120 42 Temp. [°C] 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 Rel. H. [%] 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 Time [hrs] 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 Sample Size 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 77 25 30 30 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 77000 77000 20000 20000 Remark Device Hours [hrs] 10000 10000 Remark Device Hours [hrs] 10000 Remark Device Hours [hrs] 10000 77000 Remark Device Hours [hrs] 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 7392 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 7392 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 7392 2400 2880 2880 Remark TABLE 7A: MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 61 IXFK230N20T SP1116 42 62 IXFK26N120P TP1037 42 63 IXFK26N90 SP0936 42 64 IXFK32N80Q3 SP1119 42 65 IXFK32N90P TP1123 42 66 IXFK38N80Q2 TP1105 42 67 IXFK420N10T SP1217 42 68 IXFK420N10T SP1347 42 69 IXFK64N50Q3 SP1121 42 70 IXFK64N60Q3 SP1119 42 71 IXFK80N60P3 SP1142 42 72 IXFK80N60P3 SP1142 42 73 IXFK80N60P3 SP1150 42 74 IXFK90N50P2 TP1330 42 75 IXFK90N50P2 TP1333 42 76 IXFK90N50P2 TP1137 42 77 IXFK94N50P2 SS1222 42 78 IXFK94N50P2 SS1222 42 79 IXFK94N50P2 SS1222 42 80 IXFK98N50P3 SP1142 42 81 IXFK98N50P3 SP1142 42 82 IXFN100N25 SS1309 42 83 IXFN120N20 SS1301 42 84 IXFN150N15 SS1309 42 85 IXFN210N30P3 SP1223 42 86 IXFN32N100Q3 SP1132 42 87 IXFN32N120P TP1230 42 88 IXFN38N100P TP1230 42 89 IXFN48N50Q SP1304 42 90 IXFN48N60P SS1333 42 91 IXFN48N60P SS1333 42 92 IXFN64N50P TS1333 42 93 IXFN64N50P TS1333 42 94 IXFN64N50P TS1347 42 95 IXFN80N50 SP1312 42 96 IXFN90N30 TS1309 42 97 IXFP110N15T2 SS1332 42 98 IXFP14N60P3 SS1144 42 99 IXFP170N075T2 US1310 42 100 IXFP180N10T2 SS1305 42 101 IXFP22N60P3 TS1324 42 102 IXFP230N075T2 SS1309 42 103 IXFP4N60P3 SS1143 42 104 IXFP5N50P3 SS1206 42 105 IXFP7N100P SS0931 42 106 IXFP7N60P3 SS1143 42 107 IXFQ94N30P3 SS1321 42 108 IXFR32N100Q3 SP1133 42 109 IXFR64N50Q3 SP1123 42 110 IXFR66N50Q2 TP1122 42 111 IXFT14N80P SP0731 42 112 IXFT18N90P SP0837 42 113 IXFT20N100P TP1147 42 114 IXFX120N27P3 SS1120 42 115 IXFX140N30P TS1330 42 116 IXFX20N120P TS1337 42 Temp. [°C] 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 Rel. H. [%] 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 Time [hrs] 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 Sample Size 30 30 30 30 30 30 30 22 30 30 25 25 25 25 77 77 30 30 30 25 25 30 30 30 30 30 30 30 30 30 30 30 30 30 10 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 2880 2880 2880 2880 2880 2880 2880 2112 2880 2880 2400 2400 2400 2400 7392 7392 2880 2880 2880 2400 2400 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 960 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 Remark TABLE 7A: MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 117 IXFX24N100Q3 SP1137 42 118 IXFX32N100Q3 TP1229 42 119 IXFX32N80Q3 SS1122 42 120 IXFX44N80Q3 SP1123 42 121 IXFX48N50Q SF0938 42 122 IXFX48N60Q3 SS1118 42 123 IXFX64N50P SS0939 42 124 IXFX64N50Q3 SP1118 42 125 IXFX64N50Q3 SS1118 42 126 IXFX64N60P3 SS1335 42 127 IXFX64N60Q3 SS1118 42 128 IXFX78N50P3 TS1337 42 129 IXFX80N50Q3 SP1106 42 130 IXFX90N50P2 TP1330 42 131 IXGA20N250HV TS1222 42 132 IXGA24N170A TS1215 42 133 IXGF25N250 TP1206 42 134 IXGH2N250 TP1010 42 135 IXGH32N170 TP0907 42 136 IXGH40N120B2D1 TP0940 42 137 IXGH40N60A TP1304 42 138 IXGH48N60C3D1 TP1148 42 139 IXGH50N60C4 SP1052 42 140 IXGH50N60C4 SP1133 42 141 IXGK120N120B3 TP1143 42 142 IXGK120N60B3 SP1146 42 143 IXGT32N120A3 TP1121 42 144 IXSH45N120 TP1204 42 145 IXTA02N250 TS1222 42 146 IXTA3N120 TS1115 42 147 IXTA80N10T SS1150 42 148 IXTH140P10T SP1130 -42 149 IXTH16P60P TS1316 42 150 IXTH1N200P3 TP1338 42 151 IXTH1N80P TP0905 42 152 IXTH200N10T SP1208 42 153 IXTH200N10T SP1319 42 154 IXTH20N65X SS1344 42 155 IXTH20P50P TP1309 42 156 IXTH3N120 TS1136 42 157 IXTH48P20P SS1105 -42 158 IXTH48P20P SS1040 -42 159 IXTH4N150 TS1151 42 160 IXTH4N150 TP1149 42 161 IXTH68P20T SP1130 -42 162 IXTH6N150 TP1201 42 163 IXTH75N10 TP0848 42 164 IXTH96P085T SP0926 -42 165 IXTH96P085T SS1302 42 166 IXTK550N055T2 UP1242 42 167 IXTL2N450 TP1239 42 Temp. [°C] 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 Rel. H. [%] 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 Time [hrs] 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 Sample Size 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 20 27 30 30 30 30 28 30 30 30 30 30 30 30 77 30 30 30 10 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 1920 2592 2880 2880 2880 2880 2688 2880 2880 2880 2880 2880 2880 2880 7392 2880 2880 2880 960 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 Remark TABLE 7A: MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 168 IXTP02N120P TS1307 42 169 IXTP100N04T2 SS1341 32 170 IXTP102N15T K834 42 171 IXTP10P15T SS1038 -42 172 IXTP110N055T2 SS1332 42 173 IXTP120P065T SS1013 -42 174 IXTP130N10T SS1318 42 175 IXTP15P15T SS1036 -42 176 IXTP182N055T SS1003 42 177 IXTP1N80P SS0908 42 178 IXTP200N055T2 US1310 42 179 IXTP20N65X HS1332 42 180 IXTP220N04T2 SS1051 42 181 IXTP220N04T2 SS0927 42 182 IXTP260N055T2 SS1338 42 183 IXTP26P10T SS1040 -42 184 IXTP2N100 SS0914 42 185 IXTP2N100P TS1332 42 186 IXTP3N50P S1048 42 187 IXTP460P2 TS1332 42 188 IXTP48P05T SS1040 -42 189 IXTP76P10T TS1332 42 190 IXTP80N10T SS1150 42 191 IXTP80N10T SS1318 42 192 IXTP80N12T2 SS1043 42 193 IXTP8N50P SS1050 42 194 IXTQ130N15T SK0715 42 195 IXTT140P10T SP1142 -42 196 IXTT16N20D2 TP1019 42 197 IXTT60N20L2 TP1005 42 198 IXTT6N150 TP1203 42 199 IXTV03N400S TP1134 42 200 IXTX120P20T SP1133 -42 201 IXTX210P10T SP1130 -42 202 IXXH110N65C4 SS1302 42 203 IXXH50N60B3D1 TP1150 42 204 IXXH50N60C3 SS1105 42 205 IXXH60N65B4 SP1235 42 206 IXXH60N65C4 SP1236 42 207 IXXH80N65B4H1 SP1319 42 208 IXYH24N90C3 TS1144 42 209 IXYH30N120C3 TP1137 42 210 IXYH40N120C3 TP1137 42 211 IXYH40N90C3 TS1205 42 212 IXYH50N120C3 TP1137 42 213 IXYH60N90C3 SS1205 42 214 IXYH82N120C3 TP1115 42 215 IXYH82N120C3 TP1115 42 216 IXYP8N90C3 TS1144 42 217 IXYT20N120C3D1HV TS1247 42 Temp. [°C] 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 130 Rel. H. [%] 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 85 Time [hrs] 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 96 Sample Size 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 24 30 30 30 30 30 30 30 30 30 30 77 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2304 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 7392 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 2880 Remark