Reliability Report 2015 (January 2012- December 2014), Power Semiconductor Devices

Efficiency Through Technology
RELIABILITY REPORT
2015
Power Semiconductor Devices
January 2012 - December 2014
IXYS Corporation
1590 Buckeye Dr.
Milpitas CA 95035-7418
USA
Published April 2015
Q11 - A. Schlamp
IXYS Semiconductor GmbH
Edisonstrasse 15
D-68623 Lampertheim
Germany
Humidity Test
QUALITY AND RELIABILITY
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
IXYS is committed to setting a new standard for
excellence in Power Semiconductors. Reflecting our
dedication to industry leadership in the manufacture of
medium to high power devices, reliability has
assumed a primary position in raw material selection,
design, and process technology.
Reliability utilizes information derived from applied
research, engineering design, analysis of field
applications and accelerated stress testing and
integrates this knowledge to optimize device design
and manufacturing processes.
All areas that impact reliability have received
considerable attention in order to achieve our goal to
be the # 1 Reliability Supplier of Power
Semiconductor products. We believe IXYS products
should be the most reliable components in your
system.
We have committed significant resources to
continuously improve and optimize our device design,
wafer fab processes, assembly processes and test
capabilities. As a result of this investment, IXYS has
realized a dramatic improvement in reliability
performance on all standardized tests throughout the
product line.
Excellence in product reliability is “built-in”, not testedin. Moreover, it requires a total systems approach,
involving all parties: from design to raw materials to
manufacturing.
In addition to qualifying new products released to the
market, life and environmental tests are periodically
performed on standard products to maintain feedback
on assembly and fabrication performance to assure
product reliability. Further information on reliability of
power devices is provided on www.ixys.com.
Power Cycle (PC)
Failure Modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling can
cause
thermal
and
electrical
performance
degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS,
ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM,
VRRM.
Steady State Temperature Humidity Bias
Life Test (H³TRB)
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
High Accelerated Stress Test (HAST)
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
TERMS IN TABLES
SUMMARY TABLES 1 AND 2:
AF: acceleration factor
RELIABILITY TESTS
High Temperature Reverse Bias (HTRB)
Failure Modes: Gradual degradation of break-down
characteristics due to presence of foreign materials
and polar/ionic contaminants disturbing the electric
field termination structure.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, VTH.
AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k }
(1)
Ea: activation energy; @ HTRB Ea = 1.0 eV
@ HTGB Ea = 0.4 eV
-5
k: Boltzmann’s constant 8.6·10 eV/K
T1: abs. application junction temperature (273+Tj) K
T2: abs. test junction temperature (273+Tj) K
High Temperature Gate Bias (HTGB)
UCL: upper confidence limit (60%)
Total Failures @ 60% UCL:
Failure Modes: Rupture of the gate oxide due to
localized thickness variations, structural anomalies,
particulates in the oxide, channel inversion due to
presence of mobile ions in the gate oxide.
Sensitive Parameters: IGSS, IGES,VTH, IDSS, ICES.
N = r + dr
(2)
r: number of failed devices
dr: additional term, depending on both r and UCL
MTTF: Mean Time To Failures = 1/Failure Rate
9
FIT: 1 FIT = 1 failure / 10 hrs
Temperature Cycle (TC)
TABLES 3:
∆T: max Tj - min Tj during Test
Failure modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling,
causing thermal and electrical performance degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF.
DEFINITION OF FAILURE
Failure criteria are defined according to IEC 60747
standard series
2
Summary of Tables 1A - 1H: HTRB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Table 1A
Table 1B
Table 1C
Table 1D
Table 1E
Table 1F
Table 1G
Table 1H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
123
7
235
7107
1
1,00
4527
271
21
226
0
0,92
10580
634
27
280
0
0,92
4408
264
24
340
1
1,00
1656
99
24
477
0
0,92
4547
272
31
640
0
0,92
918
55
27
567
0
0,92
15293
916
8
160
0
0,92
8101460
925
15445
203230
25
421
86960
11
180
226880
26
433
555420
69
1151
202320
25
419
1002556
124
2077
60160
7
125
Table 3G
Summary of Table 2A - 2B: HTGB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Table 2A
Table 2B
MOSFET/IGBT
MOSFET/IGBT
discrete device
Module
143
46
207
6439
0
0,92
9244
2982
22
216
0
0,92
6419520
797
2469
99520
12
38
Summary of Tables 3A - 3G: Power Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
IXYS Semiconductor GmbH
Table 3A
Table 3B
Table 3C
Table3D
Table 3E
Table 3F
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
275
7053
0
102316000
7
76
0
1620000
13
130
0
2300000
11
102
0
590000
20
400
0
840000
24
400
0
960000
3
18
397
0
1252000
Summary of Tables 4A - 4H: Temperature Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 4A
Table 4B
Table 4C**
Table4D
Table 4E
Table 4F
Table 4G
Table 4H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
268
7627
1
6729800
20
232
0
17300
29
305
0
27100
19
211
0
11200
37
721
0
44550
31
610
0
37400
37
830
0
202800
7
140
0
8000
** Max. storage temperature specified = 125°C. For accelleration temperature cycling conditions Tmax = 150°C applied
Summary of Tables 5A - 5H: Humidity Test
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
Table 5A
Table 5B
Table 5C
Table5D
Table 5E
Table 5F
Table 5G
Table 5H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Breakover
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
Diode
157
5209
1
494784
16
155
0
105192
8
78
0
28080
12
120
0
61760
31
717
0
79232
10
200
0
12480
13
280
0
20160
7
140
0
7680
Table 6G
Summary of Tables 6A - 6G: H³TRB
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
Table 6A
Table 6B
Table 6C
Table 6D
Table 6E
Table 6F
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
discrete device
Module
Module
Rec. Bridge
Diode
discrete device
6
294
0
294000
2
20
0
20000
2
20
0
20000
0
0
0
0
0
0
0
0
1
77
0
77000
*no data
Summary of Tables 7A: HAST
Table 7A
MOSFET/IGBT
discrete device
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
IXYS Semiconductor GmbH
163
5248
0
503808
4
2
97
0
97000
* no data
HTRB (Tables 1A .. 1H)
TABLE 1A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM160-0055X2 SL
3580
2 IEA21PG1200LA
2805
3 IRA37IH1200HJ
4571
4 IXA12IF1200TC
3543
5 IXA20I200PB
4849
6 IXA20IF1200HB
3927
7 IXA20PG1200DHG LA
4228
8 IXA20PG1200DHG LB
3581
9 IXA20PT1200LB
4363
10 IXA20PT1200LB
4363
11 IXA20RG1200DHG LA
3211
12 IXA27IF1200HJ
3376
13 IXA45IF1200HB
3023
14 IXA4IF1200UC
3116
15 IXA55I1200HJ
2585
16 IXA55I200HJ
2389
17 IXBF55N300
TP1243
18 IXBF55N300
TP1332
19 IXBF55N300
TP1337
20 IXBF55N300
TP1339
21 IXBH16N170A
TP1221
22 IXBH40N160
3795
23 IXBH9N160G
2446
24 IXBH9N160G
3075
25 IXBT24N170
TP1202
26 IXCH36N250
TP1139
27 IXDH20N120
3356
28 IXDH30N120D1
2603
29 IXDH30N120D1
4058
30 IXDH35N60BD1
2951
31 IXDH35N60BD1
3229
32 IXDH35N60BD1
4715
33 IXDN55N120D1
4404
34 IXEH25N120D1
2628
35 IXER35N120D1
3607
36 IXER60N120
2306
37 IXFB100N50P
TP1110
38 IXFB110N60P3
TP1412
39 IXFB132N50P3
TP1415
40 IXFB132N50P3
TP1415
41 IXFB210N30P3
SP1224
42 IXFB40N110Q3
TP1405
43 IXFB40N110Q3
TP1403
44 IXFB40N110Q3
TP1420
45 IXFB60N80PK
TS1349
46 IXFB62N80Q3
TS1422
47 IXFB62N80Q3K
TS1349
48 IXFB62N80Q3K
TS1349
49 IXFH12N90
TS1344
50 IXFH12N90
TS1350
51 IXFH12N90
TS1350
52 IXFH12N90
TP1310
IXYS Semiconductor GmbH
Voltage
[V]
44
960
960
960
960
960
960
960
840
960
960
960
960
960
960
960
2400
2400
2400
2400
960
1260
1280
1280
960
960
960
960
960
480
480
480
960
960
960
960
400
480
400
400
240
880
880
880
800
640
800
640
720
720
720
720
Temp.
[°C]
150
125
150
125
125
125
125
125
125
125
125
125
125
150
125
125
90
90
90
90
125
125
125
125
125
90
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
168
168
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
168
168
168
1000
1000
168
168
168
168
168
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
77
60
20
20
20
20
20
20
20
20
20
20
20
20
20
20
30
30
30
30
30
20
20
20
30
30
20
20
20
20
20
20
10
20
20
20
30
25
25
25
30
25
25
30
30
30
30
25
30
30
30
30
Failures
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
5
Device Hours
[hrs]
77000
60000
20000
I_CES increased
20000
3360
3360
20000
20000
20000
20000
20000
20000
3360
20000
20000
20000
30000
30000
30000
30000
30000
3360
3360
3360
30000
30000
3360
3360
3360
3360
3360
3360
1680
3360
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
53 IXFH150N17T
US1401
136
54 IXFH150N17T2
SS1341
136
55 IXFH150N20T
SP1147
160
56 IXFH15N100P
TP1202
800
57 IXFH160N15T
US1401
120
58 IXFH160N15T2
SS1319
120
59 IXFH16N50P3
SP1207
400
60 IXFH16N60P3
SS1142
480
61 IXFH18N90P
TP1202
720
62 IXFH20N50P3
SP1141
400
63 IXFH22N60P3
SP1318
400
64 IXFH26N50
TS1331
500
65 IXFH26N50
TS1331
500
66 IXFH26N50P3
SS1206
400
67 IXFH26N50P3
TP1325
400
68 IXFH26N50Q
TS1343
500
69 IXFH26N50Q
TS1343
500
70 IXFH26N60P
TP1439
480
71 IXFH30N50P
SS1413
400
72 IXFH46N30T
US1408
240
73 IXFH50N50P3
SS1407
400
74 IXFH50N60P3
SP1201
480
75 IXFH50N60P3
TS1414
480
76 IXFH52N50P2
GS1422
400
77 IXFH60N50P3
TP1326
400
78 IXFH60N50P3
GS1408
400
79 IXFH76N15T2
US1406
120
80 IXFH7N100P
TP1143
800
81 IXFH88N30P
TP1237
240
82 IXFK120N25P
TP1239
200
83 IXFK140N30P
TP1242
240
84 IXFK420N10T
SP1347
100
85 IXFK420N10T
SP1347
100
86 IXFK44N80P
TP1219
640
87 IXFK64N50P
TP1242
400
88 IXFK64N60P3
GP1444
480
89 IXFK80N60P3
SP1150
480
90 IXFK80N60P3
TP1415
480
91 IXFK80N60P3
TP1418
480
92 IXFK90N50P2
TP1333
400
93 IXFK90N50P2
TP1337
500
94 IXFK90N50P2
TP1406
500
95 IXFK94N50P2
SF1211
480
96 IXFN100N25
SS1309
200
97 IXFN150N15
SS1309
120
98 IXFN32N120P
TP1230
960
99 IXFN360N10T
US1422
80
100 IXFN38N100P
TP1230
800
101 IXFN64N50P
TS1347
500
102 IXFN90N30
TS1309
240
103 IXFP110N15T2
SS1332
120
104 IXFP110N15T2
US1351
120
105 IXFP110N15T2
US1351
150
106 IXFP14N60P3
SS1144
480
107 IXFP16N50P3
GS1419
400
108 IXFP170N075T2
US1310
60
109 IXFP180N10T2
SS1305
80
110 IXFP22N60P3
TS1324
480
111 IXFP230N075T2
US1309
60
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
77
30
30
30
30
30
23
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
22
22
30
30
29
30
30
30
77
77
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
6
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
77000
30000
30000
30000
30000
30000
23000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
22000
30000
30000
30000
30000
30000
30000
30000
77000
77000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
112 IXFP36N30P3
GS1419
240
113 IXFP4N60P3
SS1143
480
114 IXFP5N50P3
SS1206
400
115 IXFP7N60P3
SS1143
480
116 IXFQ94N30P3
SS1321
240
117 IXFT20N100P
TP1147
800
118 IXFX120N25P
2746
200
119 IXFX140N25T
US1410
200
120 IXFX20N120P
TS1337
960
121 IXFX230N20T
US1408
160
122 IXFX32N100Q3
TP1229
800
123 IXFX44N80Q3
TP1226
640
124 IXFX64N50P
2924
200
125 IXFX64N60P3
TP1429
480
126 IXFX64N60P3
TS1444
480
127 IXFX80N60P3
HP1449
480
128 IXGA20N250HV
TS1222
960
129 IXGA24N170A
TS1215
960
130 IXGD1972
TP1336
960
131 IXGD1972
TP1336
960
132 IXGH100N30C3
SS1250
240
133 IXGH32N60B
TP1205
480
134 IXGH40N120B2D1
TP0940
960
135 IXGH48N60C3D1
TP1148
480
136 IXGH50N60C4
SP1133
480
137 IXGK120N120B3
TP1143
960
138 IXGK120N60B3
SP1146
480
139 IXKH70N60C5
3639
480
140 IXKN75N60C
2955
480
141 IXKR40N60C
3077
480
142 IXLT2025
3914
2300
143 IXLV1861
3061
2300
144 IXSH45N120
TP1204
960
145 IXTA80N10T
SS1150
80
146 IXTF02N450
TP1329
3000
147 IXTH02N450HV
TS1414
3000
148 IXTH12N150
TP1206
960
149 IXTH140N10P
TS1406
80
150 IXTH16P60P
TS1316
-480
151 IXTH1N200P3
TP1338
960
152 IXTH1N200P3HV
TS1404
1600
153 IXTH1N300P3HV
TS1404
2400
154 IXTH1N450HV
TS1404
3000
155 IXTH200N10T
SP1319
80
156 IXTH20N60X
HS1440
480
157 IXTH20N65X
SS1344
520
158 IXTH20N65X
SS1344
520
159 IXTH20N65X
HS1440
520
160 IXTH20P50P
TP1309
-400
161 IXTH32N60X
HS1440
480
162 IXTH32N65X
SS1346
520
163 IXTH32N65X
HS1440
520
164 IXTH3N120
TS1136
960
165 IXTH4N150
TS1151
960
166 IXTH4N150
TP1149
960
167 IXTH64N65X
HS1417
520
168 IXTH6N100D2
TP1202
800
169 IXTH6N150
TP1201
960
170 IXTH80N075L2
TS1419
60
171 IXTH86N25T
UP1408
200
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
150
125
125
125
125
125
150
125
125
125
125
125
50
50
125
125
125
125
125
125
125
125
125
125
70
70
125
125
90
90
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
168
300
300
1000
1000
1000
1001
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1001
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
80
30
30
30
30
30
80
30
29
30
10
30
22
22
30
30
30
30
30
30
30
20
10
20
20
20
30
77
22
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
7
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
80000
30000
30000
30000
30000
30000
80000
30000
30000
30000
10000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
3360
1680
3360
6000
6000
30000
77000
22000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
172 IXTH96P085T
SS1302
-68
173 IXTK550N055T2
SP1239
44
174 IXTK550N055T2
UP1242
44
175 IXTK550N055T2
UP1250
44
176 IXTK550N055T2
UP1251
44
177 IXTL2N450
TP1239
3000
178 IXTN15N100
2819
800
179 IXTP02N120P
TS1307
960
180 IXTP02N120P
TS1307
960
181 IXTP100N04T2
SS1341
40
182 IXTP110N055T2
SS1332
55
183 IXTP130N10T
SS1318
80
184 IXTP200N055T2
US1310
44
185 IXTP200N055T2
US1414
55
186 IXTP20N65X
HS1332
520
187 IXTP260N055T2
SS1338
55
188 IXTP2N100P
TS1332
800
189 IXTP2N100P
TS1332
800
190 IXTP450P2
GS1352
500
191 IXTP450P2
GS1411
400
192 IXTP460P2
TS1332
400
193 IXTP460P2
GS1421
400
194 IXTP460P2
GS1421
400
195 IXTP50N28T
US1426
224
196 IXTP76P10T
TS1332
-80
197 IXTP80N10T
SS1150
80
198 IXTP80N10T
SS1318
80
199 IXTQ200N10T
SS1125
80
200 IXTQ200N10T
SS1125
80
201 IXTQ44N50P
GS1408
400
202 IXTQ460P2
SS1236
400
203 IXTQ82N25P
TS1348
200
204 IXTT140P10T
SP1142
-80
205 IXTT6N150
TP1203
960
206 IXTV03N400S
TP1134
960
207 IXTX120P20T
SP1133
-160
208 IXTX200N10L2
TP1137
80
209 IXTX210P10T
SP1130
-80
210 IXXH110N65B4
TS1448
520
211 IXXH110N65B4
TS1448
520
212 IXXH50N60B3D1
TP1150
480
213 IXXH60N65B4
SP1235
520
214 IXXH60N65C4
SP1236
520
215 IXXH80N65B4H1
SP1319
520
216 IXYH24N90C3
TS1144
720
217 IXYH40N120C3
TP1137
960
218 IXYH40N65C3D1
TS1427
520
219 IXYH40N65C3H1
TP1324
520
220 IXYH40N90C3
TS1205
720
221 IXYH50N65C3D1
TS1424
520
222 IXYH60N90C3
SS1205
720
223 IXYH75N65C3
TS1341
650
224 IXYH75N65C3D1
TS1429
520
225 IXYH80N90C3
TP1205
720
226 IXYN100N65C3H1
TS1346
650
227 IXYN100N65C3H1
TS1346
650
228 IXYP10N65C3
TS1319
520
229 IXYP10N65C3
TS1319
520
230 IXYP10N65C3D1
TS1401
520
231 IXYT20N120C3D1HV
TS1247
960
232 IXYX100N120C3
TP1137
960
233 MKE39A600LA
3038
480
234 MPA22R600DHGFC
3919
480
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
90
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
80
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
8
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
80000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
10000
20000
Remark
TABLE 1B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MID200-12A4
3326
2 MITA15WB1200TMH
2502
3 MITB15WB1200TMH
2502
4 MIXA100W1200TEH
3248
5 MIXA40WB1200TED
4543
6 MIXA40WB1200TED
4732
7 MIXA50WB600TED
4090
8 MIXA60WB1200TEH
4155
9 MIXA60WB1200TEH
4155
10 MIXA80WB1200TEH
4800
11 MIXA81WB1200TEH
4012
12 MIXD200W650TEH
4421
13 MIXD80PM650TMI
4249
14 MKI450-12E9
2636
15 MUBW36-12E7
2487
16 MWI35-12T7T
2420
17 VKM60-01P1
4029
18 VMM300-03FP
4201
19 VMM90-09F
2467
20 VMM90-09F
3214
21 VWM270-0075X2
2825
Voltage
[V]
960
960
960
960
960
960
520
960
1120
960
1120
520
520
960
960
960
80
240
720
720
60
Temp.
[°C]
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
336
1000
1000
1000
1000
1000
1000
1000
1000
287
1000
1000
1000
1000
168
1000
168
168
168
168
1000
Sample
Size
20
10
10
10
10
20
10
10
10
10
10
10
10
6
10
10
10
10
10
10
10
Failures
TABLE 1C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 CSM401B
3377
2 CSM401B
3377
3 MCC21-16
3584
4 MCC26-16
3854
5 MCC26-16io1
2616
6 MCC26-16io1
4925
7 MCC26-16io1B
4169
8 MCC310-16
2537
9 MCC312
2820
10 MCC312
4064
11 MCC312-16
3511
12 MCC312-16io1
3099
13 MCC44-16
3969
14 MCC56-16io1
3127
15 MCC56-16io1
3733
16 MCC95-14io1B
4075
17 MCC95-16io1
2450
18 MCC95-16io1B
3276
19 MDD172
3465
20 MDD172-12
3331
21 MDD175-34N1
4595
22 MDD312-16N1
3301
23 MDD312-18N1
2959
24 MDD56
2323
25 MDD95-22
4395
26 MDD95-22N1B
4589
27 UGE0421AY4
2464
Voltage
[V]
2000
2000
1120
1120
1120
1120
1120
1120
1120
1120
1120
1120
1120
1120
1120
980
1120
1120
1260
1260
2380
1120
1260
1260
1540
1540
2240
Temp.
[°C]
60
80
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
350
650
168
168
168
168
168
168
1000
168
168
168
168
168
168
168
168
168
1000
168
168
168
168
1000
168
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
20
10
10
10
Failures
IXYS Semiconductor GmbH
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
9
Device Hours
[hrs]
3360
10000
10000
10000
10000
20000
10000
10000
10000
2870
10000
10000
10000
6000
1680
10000
1680
1680
1680
1680
10000
Remark
Device Hours
[hrs]
3500
6500
1680
1680
1680
1680
1680
1680
10000
1680
1680
1680
1680
1680
1680
1680
1680
1680
10000
1680
1680
1680
1680
20000
1680
1680
1680
Remark
TABLE 1D: Controller/Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MDNA210UB2200PTED4859
2 MDNA660U2200TEH
4861
3 MMO230-14io7
2459
4 VBO21-12NO7
3587
5 VUB116-16NOXT
4927
6 VUB116-16NOXT
4927
7 VUB145-16NOXT
4154
8 VUB145-16NOXT
4154
9 VUC36-16go2
3320
10 VUI72NOXT
3955
11 VUI72NOXT
3955
12 VUO155-16
3101
13 VUO192-16NO7
2615
14 VUO34-18NO1
4362
15 VUO36-16NO8
3806
16 VUO52-16NO1
2563
17 VUO52-16NO1
2824
18 VUO52-16NO1
3118
19 VUO52-16NO1
3655
20 VUO52-16NO1
3822
21 VUO52-16NO1
3887
22 VUO55-16NO7
4745
23 VUO60-16NO3
2326
24 VUO82-16NO7
3087
Voltage
[V]
1360
1540
980
840
960
1120
960
1120
1120
960
1120
1120
1260
1260
1120
1120
1120
1400
1120
1120
1120
1120
1120
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
168
168
2000
1000
1000
1000
336
168
168
168
1000
1168
168
336
1000
1000
168
1000
2000
168
168
168
Sample
Size
10
10
10
10
20
10
10
10
20
10
10
10
10
40
10
20
20
20
10
20
20
10
10
10
Failures
Voltage
[V]
480
480
1440
480
160
480
240
240
960
480
960
160
480
480
960
480
480
480
960
480
480
960
480
960
Temp.
[°C]
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
1000
168
1000
168
1000
168
168
1000
1000
168
168
168
168
168
168
168
168
168
168
168
168
168
168
Sample
Size
20
20
10
20
20
77
20
20
20
40
20
10
10
10
10
10
20
20
20
10
20
20
20
10
Failures
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
10000
10000
1680
1680
40000
I_CES increased
10000
10000
10000
3360
1680
1680
1680
10000
23360
1680
3360
20000
20000
1680
20000
20000
1680
1680
1680
Remark
Device Hours
[hrs]
3360
20000
1680
20000
3360
77000
3360
3360
20000
40000
3360
1680
1680
1680
1680
1680
3360
3360
3360
1680
3360
3360
3360
1680
Remark
TABLE 1E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
DFE10I600PM
DFE30I600QM
DH2x61-18A
DHG60I600HA
DPG30C200HB
DPG60B600LB
DPG80C300HB
DPG80C300HB
DSEC120-12AK
DSEC29-06AC
DSEC60-12A
DSEI2x121-02A
DSEI2x31-06C
DSEI2x31-06P
DSEI2x61-12B
DSEI2x61-12B
DSEI60-06A
DSEP15-06B
DSEP15-12CR
DSEP2x61-06A
DSEP30-06BR
DSEP30-12AR
DSEP60-06A
MEE250-12DA
Date Code
or
Test #
4766
4819
4847
4513
3925
4409
3796
4623
4438
4429
4456
4063
3738
3461
4146
4317
4037
4328
4034
3954
3715
4618
3595
3644
IXYS Semiconductor GmbH
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
10
TABLE 1F: Schottky Diode
Date Code
or
Test #
2956
3801
4209
4621
4295
2316
2532
3451
2577
3350
2404
2622
3794
4036
4785
2953
4494
3608
3181
2478
2772
2981
2982
3199
3699
3072
4101
2878
4130
3928
3446
Voltage
[V]
150
100
120
45
45
100
100
100
150
150
200
200
200
36
180
20
200
45
150
150
150
200
80
20
20
24
36
48
48
48
80
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
100
125
100
125
125
125
125
125
125
125
100
100
100
100
100
100
100
125
Time
[hrs]
1000
168
1000
168
168
168
168
168
1000
168
1000
1000
168
1000
168
1000
168
168
168
168
1000
168
336
1000
1000
1000
1000
1000
1000
1000
168
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
40
20
20
20
20
20
20
20
20
Failures
TABLE 1G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 CLA50E1200HB
4140
2 CLB30I1200HB
4104
3 CLF20E1200PB
4038
4 CMA50E1600TZ
4331
5 CS19-12ho1
3736
6 CS45-12io1
4615
7 CS45-16io1R
4459
8 CSM410LB
4152
9 DAA10P1800PZ
4742
10 DLA100B1200LB
4351
11 DMA10I1600PA
3799
12 DMA10I1600PA
4324
13 DMA30E1600HA
4451
14 DNA30E2200PZ
4454
15 DS2-08A
4015
16 DSA1-16D
4440
17 DSA17-18A
3856
18 DSA17-18A
4734
19 DSA9-18F
4292
20 DSAI35-16A
3708
21 DSDI60-14A
3929
22 DSI30-12A
3610
23 DSI45-16A
4968
24 DSI45-16AR
4161
25 DSP25-16AR
4320
26 DSP25-16AR
4765
27 MCO100-16io1
4656
Voltage
[V]
840
840
840
1120
840
840
1120
1680
1260
960
1120
1120
1260
1540
560
1120
1260
1260
1260
1120
1120
840
1120
1120
1120
1120
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
25
150
150
150
150
150
150
150
150
150
150
150
125
150
150
150
150
125
125
Time
[hrs]
168
1000
168
1000
168
168
168
1000
1000
1000
168
168
1000
168
168
1000
168
168
168
168
168
168
168
168
168
168
168
Sample
Size
20
20
20
20
20
20
20
20
20
77
20
20
20
20
10
40
20
10
10
10
20
20
20
20
20
20
10
Failures
Voltage
[V]
480
640
640
640
720
800
800
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
1000
168
168
168
168
1000
Sample
Size
20
20
20
20
20
20
20
20
Failures
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
DSA10C150PB
DSA20C100PN
DSA20C150PB
DSA20C45PB
DSA30C45PB
DSA50C100QB
DSA50C100QB
DSA50C100QB
DSA60C150PB
DSA70C150HB
DSA90C200HR
DSA90C200HR
DSA90C200HR
DSB80C45HB
DSSK30-018A
DSSK38-0025B
DSSK60-002A
DSSK60-0045A
DSSK60-015A
DSSK60-015AR
DSSK60-015AR
DSSK60-02A
DSSK70-008AR
DSSK80-0025B
DSSK80-0025B
DSSK80-003B
DSSK80-0045B
DSSK80-006B
DSSK80-006B
DSSK80-006BR
DSSS35-008AR
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
20000
3360
20000
3360
3360
3360
3360
3360
20000
3360
20000
20000
3360
20000
3360
20000
3360
3360
3360
3360
20000
3360
6720
20000
20000
20000
20000
20000
20000
20000
3360
Remark
Device Hours
[hrs]
3360
20000
3360
20000
3360
3360
3360
20000
20000
77000
3360
3360
20000
3360
1680
40000
3360
1680
1680
1680
3360
3360
3360
3360
3360
3360
1680
Remark
Device Hours
[hrs]
3360
3360
20000
3360
3360
3360
3360
20000
Remark
TABLE 1H: Breakover Diode
#
Part Number
1
2
3
4
5
6
7
8
IXBOD1-06
IXBOD1-08
IXBOD1-08
IXBOD1-08
IXBOD1-09
IXBOD1-10
IXBOD1-10
IXBOD2-14EPI
Date Code
or
Test #
3458
3079
4212
4749
4041
2436
3721
2905
IXYS Semiconductor GmbH
0
0
0
0
0
0
0
0
11
HTGB (Tables 2A .. 2B)
TABLE 2A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1
GWM160-0055X1SL
2786
2
GWM160-0055X2 SL
3580
3
IEA21PG1200LA
2598
4
IXA17IF1200HJ
4674
5
IXA20PG1200DHG LB
3581
6
IXA20PT1200LB
4363
7
IXA40PG1200DHGLA
3211
8
IXA4IF1200UC
4871
9
IXA55I1200HJ
2585
10 IXA55I200HJ
2511
11 IXA55I200HJ
2511
12 IXBF1958
TP1332
13 IXBF1958
TP1337
14 IXBF1958
TP1339
15 IXBF55N300
TP1243
16 IXBH10N300HV
TS1413
17 IXBH14N300HV
TS1414
18 IXBH16N170A
TP1221
19 IXBH20N360HV
TS1404
20 IXBH22N300HV
TS1421
21 IXBH40N160
3739
22 IXBH5N160G
2983
23 IXBP5N160G
2454
24 IXBT24N170
TP1202
25 IXBX28N300HV
TS1414
26 IXBX50N360HV
TS1414
27 IXCH36N250
TP1139
28 IXDH35N60BD1
4974
29 IXDN75N120
2566
30 IXDN75N120
3952
31 IXDR30N120D1
2541
32 IXER35N120D1
3802
33 IXFB100N50P
TP1110
34 IXFB110N60P3
TS1412
35 IXFB132N50P3
TP1415
36 IXFB210N30P3
SP1224
37 IXFB40N110Q3
TP1405
38 IXFB40N110Q3
TP1403
39 IXFB60N80PK
TS1349
40 IXFB62N80Q3K
TS1349
41 IXFH12N90
TS1344
42 IXFH12N90
TS1344
43 IXFH150N17T
US1401
44 IXFH150N20T
SP1147
45 IXFH15N100P
TP1202
46 IXFH160N15T
US1401
47 IXFH160N15T2
SS1319
48 IXFH16N50P3
SP1207
49 IXFH16N60P3
SS1142
50 IXFH18N90P
TP1202
51 IXFH20N50P3
SP1141
52 IXFH22N60P3
SP1318
53 IXFH22N60P3
GS1429
54 IXFH26N50
TS1331
55 IXFH26N50
TS1331
56 IXFH26N50P3
SS1206
57 IXFH26N50P3
TP1325
58 IXFH26N50Q
TS1343
59 IXFH26N50Q
TS1343
60 IXFH30N50P
SS1413
IXYS Semiconductor GmbH
Voltage
[V]
16
15
16
16
16
16
16
16
16
20
16
25
25
25
25
20
20
20
20
20
16
16
16
20
20
20
20
16
16
16
16
16
24
30
30
16
30
25
30
30
20
20
30
16
24
30
16
24
24
16
16
30
30
20
20
24
30
20
20
30
Temp.
[°C]
150
150
125
150
150
150
150
150
150
150
150
125
125
125
125
125
125
125
125
125
150
150
150
125
125
125
125
150
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
168
100
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
168
1000
1000
1000
1000
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
10
77
20
20
20
20
20
20
20
32
20
30
30
30
30
30
30
30
30
30
20
20
20
30
30
30
30
20
20
20
10
20
30
25
25
30
25
25
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
23
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
12
Device Hours
[hrs]
10000
77000
20000
3360
2000
20000
20000
3360
20000
32000
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
3360
3360
3360
30000
30000
30000
30000
3360
3360
3360
1680
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
30000
30000
30000
30000
30000
30000
23000
30000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
61 IXFH46N30T
US1408
20
62 IXFH50N50P3
SS1407
30
63 IXFH50N60P3
SP1201
16
64 IXFH50N60P3
TS1414
30
65 IXFH52N50P2
GS1422
30
66 IXFH60N50P3
TP1326
30
67 IXFH60N50P3
GS1408
30
68 IXFH76N15T2
US1406
20
69 IXFH7N100P
TP1143
24
70 IXFH88N30P
TP1237
16
71 IXFK120N25P
TP1239
16
72 IXFK140N30P
TP1242
16
73 IXFK40N90P
TP1434
30
74 IXFK40N90P
TP1444
30
75 IXFK420N10T
SP1347
20
76 IXFK420N10T
SP1347
20
77 IXFK44N80P
TP1219
24
78 IXFK64N50P
TP1242
30
79 IXFK80N60P3
SP1150
24
80 IXFK90N50P2
TP1333
30
81 IXFK90N50P2
TP1337
20
82 IXFK90N50P2
TP1406
30
83 IXFK94N50P2
SF1211
24
84 IXFN100N25
SS1309
16
85 IXFN150N15
SS1309
16
86 IXFN32N120P
TP1230
24
87 IXFN360N10T
US1422
20
88 IXFN38N100P
TP1230
24
89 IXFN64N50P
TS1347
30
90 IXFN90N30
TS1309
16
91 IXFP110N15T2
SS1332
20
92 IXFP110N15T2
US1351
20
93 IXFP14N60P3
SS1144
24
94 IXFP16N50P3
GS1419
30
95 IXFP170N075T2
US1310
16
96 IXFP22N60P3
TS1324
16
97 IXFP230N075T2
US1309
16
98 IXFP36N30P3
GS1419
30
99 IXFP4N60P3
SS1143
24
100 IXFP5N50P3
SS1206
24
101 IXFP7N60P3
SS1143
24
102 IXFQ94N30P3
SS1321
20
103 IXFT20N100P
TP1147
16
104 IXFX120N25P
2746
20
105 IXFX140N25T
US1410
20
106 IXFX20N120P
TS1337
30
107 IXFX230N20T
US1408
20
108 IXFX32N100Q3
TP1229
24
109 IXFX44N80Q3
TP1226
30
110 IXFX64N50P
2924
20
111 IXFX64N60P3
TS1337
20
112 IXFX64N60P3
TP1429
30
113 IXFX78N50P3
TS1337
20
114 IXGA20N250HV
TS1222
16
115 IXGH100N30C3
SS1250
16
116 IXGH32N60B
TP1205
16
117 IXGH40N120B2D1
TP0940
16
118 IXGH48N60C3D1
TP1148
16
119 IXGH50N60C4
SP1133
16
120 IXGK120N120B3
TP1143
16
121 IXGK120N60B3
SP1146
16
122 IXKH35N60C5
4159
16
IXYS Semiconductor GmbH
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
150
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
Sample
Size
30
30
30
30
30
30
20
30
30
30
30
30
77
77
22
22
30
30
30
77
77
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
80
30
30
30
30
30
80
30
30
30
10
30
30
30
30
30
30
30
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
13
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
22000
30000
30000
30000
30000
77000
77000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
80000
30000
30000
30000
30000
30000
80000
30000
30000
30000
10000
30000
30000
30000
30000
30000
30000
30000
3360
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
123 IXKH70N60C5
3359
16
124 IXKN40N60C
4453
16
125 IXKN75N60C
3094
16
126 IXKR40N60C
3360
16
127 IXKR40N60C
4031
16
128 IXSH45N120
TP1204
16
129 IXTA80N10T
SS1150
20
130 IXTH02N450HV
TS1414
20
131 IXTH12N150
TP1206
24
132 IXTH140N10P
TS1406
20
133 IXTH16P60P
TS1316
16
134 IXTH1N200P3
TP1338
20
135 IXTH1N200P3HV
TS1404
20
136 IXTH1N300P3HV
TS1404
20
137 IXTH1N450HV
TS1404
20
138 IXTH1R4N250P3HV
TS1413
20
139 IXTH20N60X
HS1440
30
140 IXTH20N65X
SS1344
30
141 IXTH20P50P
TP1309
16
142 IXTH2N150L
TP1317
30
143 IXTH32N60X
HS1440
30
144 IXTH32N65X
SS1346
30
145 IXTH3N120
TS1136
20
146 IXTH4N150
TS1151
24
147 IXTH4N150
TP1149
24
148 IXTH64N65X
HS1417
30
149 IXTH6N100D2
TP1202
16
150 IXTH6N150
TP1201
16
151 IXTH80N075L2
TS1419
20
152 IXTH86N25T
UP1408
20
153 IXTH96P085T
SS1302
16
154 IXTK550N055T2
SP1239
16
155 IXTK550N055T2
UP1250
16
156 IXTK550N055T2
UP1251
16
157 IXTL2N450
TP1239
16
158 IXTP02N120P
TS1307
20
159 IXTP02N120P
TS1307
20
160 IXTP100N04T2
SS1341
20
161 IXTP110N055T2
SS1332
20
162 IXTP130N10T
SS1318
16
163 IXTP200N055T2
US1310
16
164 IXTP200N055T2
US1414
20
165 IXTP20N65X
HS1332
20
166 IXTP260N055T2
SS1338
20
167 IXTP2N100P
TS1332
20
168 IXTP2N100P
TS1332
20
169 IXTP450P2
GS1352
30
170 IXTP450P2
GS1411
30
171 IXTP460P2
TS1332
30
172 IXTP460P2
GS1421
30
173 IXTP460P2
GS1421
30
174 IXTP50N28T
US1426
20
175 IXTP76P10T
TS1332
15
176 IXTP80N10T
SS1150
16
177 IXTP80N10T
SS1318
16
178 IXTQ200N10T
SS1125
24
179 IXTQ200N10T
SS1125
24
180 IXTQ44N50P
GS1408
30
181 IXTQ460P2
SS1236
24
182 IXTQ82N25P
TS1348
20
183 IXTT140P10T
SP1142
-12
IXYS Semiconductor GmbH
Temp.
[°C]
150
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
20
20
20
20
20
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
14
Device Hours
[hrs]
3360
3360
3360
3360
3360
30000
77000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
184 IXTT6N150
TP1203
20
185 IXTV03N400S
TP1134
16
186 IXTX120P20T
SP1133
-12
187 IXTX200N10L2
TP1137
16
188 IXTX210P10T
SP1130
-12
189 IXXH110N65B4
TS1448
20
190 IXXH110N65B4
TS1448
20
191 IXXH50N60B3D1
TP1150
20
192 IXXH60N65B4
SP1235
16
193 IXXH60N65C4
SP1236
16
194 IXXH80N65B4H1
SP1319
16
195 IXYH24N90C3
TS1144
16
196 IXYH30N450HV
TS1413
20
197 IXYH40N120C3
TP1137
16
198 IXYH40N90C3
TS1205
16
199 IXYH60N90C3
SS1205
16
200 IXYH75N65C3
TS1341
20
201 IXYH80N90C3
TP1205
16
202 IXYN100N65C3H1
TS1346
20
203 IXYN100N65C3H1
TS1346
20
204 IXYT20N120C3D1HV
TS1247
16
205 IXYX100N120C3
TP1137
16
206 IXYX40N450HV
TS1414
20
207 MKE38P600LB
4179
16
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
Failures
TABLE 2B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MDI75-12A3
3936
2 MID200-12A4
3328
3 MII300-12E4
2432
4 MIXA200RF1200TED-PF
4868
5 MIXA20W1200MC
3089
6 MIXA30WB1200TED
3945
7 MIXA60HU1200VA
3920
8 MIXA60WB1200TEH
4155
9 MIXA81WB1200TEH
4012
10 MIXD200W650TEH
4421
11 MKI450-12E9
2636
12 MUBW20-06A6K
3007
13 MUBW35-06A6K
3826
14 MWI100-12E8
3677
15 MWI35-12A7
4019
16 MWI452-17E9
2904
17 VKM60-01P1
3588
18 VMM90-09F
3217
19 VMO1200-01F
2480
20 VUM33-06PH
3302
21 VWI20-06P1
2462
22 VWM270-0075X2
2825
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
1000
168
168
1000
1000
1000
1000
1000
168
168
168
168
1000
168
168
168
168
168
1000
Sample
Size
10
10
10
10
10
10
10
10
10
10
6
10
10
10
10
10
10
10
10
10
10
10
Failures
IXYS Semiconductor GmbH
Voltage
[V]
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
15
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
1680
Remark
Device Hours
[hrs]
1680
1680
1680
10000
1680
1680
10000
10000
10000
10000
6000
1680
1680
1680
1680
10000
1680
1680
1680
1680
1680
10000
Remark
POWER CYCLE (Tables 3A .. 3G)
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM160-0055X2 SL
3580
2 IEA21PG1200LA
2598
3 IXA12IF1200TC
3543
4 IXA20I1200PB
4850
5 IXA20PG1200DHG LA
4228
6 IXA20PG1200DHG LB
3581
7 IXA20PG1200DHGLA
3211
8 IXA55I200HJ
2389
9 IXBF55N300
TP1243
10 IXBF55N300
TP1332
11 IXBF55N300
TP1337
12 IXBF55N300
TP1339
13 IXBH10N300HV
TS1413
14 IXBH14N300HV
TS1414
15 IXBH20N360HV
TS1404
16 IXBH22N300HV
TS1421
17 IXBH40N160
2946
18 IXBH40N160
3243
19 IXBH5N160G
4139
20 IXBH9N160G
3357
21 IXBT24N170
TP1202
22 IXBX28N300HV
TS1414
23 IXBX50N360HV
TS1414
24 IXDH20N120D1
3591
25 IXDH35N60BD1
4627
26 IXFB100N50P
TP1110
27 IXFB100N50Q3
SP1106
28 IXFB110N60P3
TS1412
29 IXFB120N50P2
SP1015
30 IXFB132N50P3
SP1110
31 IXFB132N50P3
TP1415
32 IXFB210N30P3
SP1224
33 IXFB40N110Q3
TP1405
34 IXFB40N110Q3
TP1403
35 IXFB44N100P
TP0930
36 IXFB44N100P
TP1404
37 IXFB60N80PK
TS1349
38 IXFB60N80PK
TS1349
39 IXFB62N80Q3
SP1118
40 IXFB62N80Q3
TS1422
41 IXFB62N80Q3
TS1422
42 IXFB62N80Q3K
TS1349
43 IXFB82N60P
SP0851
44 IXFB82N60Q3
SP1118
45 IXFH100N25P
SS1049
46 IXFH12N90
SS0911
IXYS Semiconductor GmbH
Tj(max)
[°C]
125
125
125
125
125
125
125
145
145
145
145
145
145
145
145
145
125
125
125
125
145
145
145
125
125
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
∆Τ
[K]
100
80
80
80
80
80
80
100
100
100
100
100
100
100
100
100
100
80
80
80
100
100
100
80
80
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
6000
80000
4000
2000
80000
80000
8000
4000
15000
2000
2000
15000
15000
15000
15000
15000
2000
2000
2000
2000
15000
15000
15000
2000
2000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
Sample
Size
77
20
20
20
20
20
10
20
24
24
24
24
24
24
24
24
20
20
20
20
24
24
24
20
20
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
462000
1600000
80000
40000
1600000
1600000
80000
80000
360000
48000
48000
360000
360000
360000
360000
360000
40000
40000
40000
40000
360000
360000
360000
40000
40000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
16
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
47 IXFH12N90
TP1310
48 IXFH150N17T
US1401
49 IXFH150N17T2
SS1341
50 IXFH150N20T
SP1147
51 IXFH15N100P
TP1202
52 IXFH15N100Q3
SP1121
53 IXFH160N15T
US1401
54 IXFH160N15T2
SS1319
55 IXFH16N50P3
SP1207
56 IXFH16N60P3
SS1142
57 IXFH18N100Q3
SP11136
58 IXFH18N90P
TP1202
59 IXFH20N50P3
SP1141
60 IXFH20N80P
SS1121
61 IXFH22N60P3
SS1108
62 IXFH22N60P3
SP1318
63 IXFH22N60P3
GS1429
64 IXFH26N50
TS1331
65 IXFH26N50P
K0843
66 IXFH26N50P3
SS1206
67 IXFH26N50P3
TP1325
68 IXFH26N50Q
TS1343
69 IXFH30N50P
SA0915
70 IXFH30N50Q3
SS1117
71 IXFH44N50P
SA0915
72 IXFH44N50Q3
SP1133
73 IXFH46N30T
US1408
74 IXFH50N50P3
SS1407
75 IXFH50N60P3
SP1201
76 IXFH50N60P3
TS1414
77 IXFH52N50P2
GS1422
78 IXFH60N50P3
SP1109
79 IXFH60N50P3
TP1326
80 IXFH6N120P
TP0937
81 IXFH70N15
SP0850
82 IXFH70N20Q3
SS1117
83 IXFH70N30Q3
SP1133
84 IXFH76N15T2
US1406
85 IXFH7N100P
TP1143
86 IXFH88N30P
TP1237
87 IXFH94N30T
SP1141
88 IXFK120N25P
TP1239
89 IXFK140N30P
TP1242
IXYS Semiconductor GmbH
Tj(max)
[°C]
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
15000
Sample
Size
24
24
24
24
24
24
24
24
24
24
24
77
24
24
24
24
24
24
24
24
23
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
77
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
1155000
360000
240000
360000
360000
360000
360000
360000
360000
345000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
770000
360000
360000
17
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
90 IXFK160N30T
SP1120
91 IXFK230N20T
SP1116
92 IXFK38N80Q2
TP1105
93 IXFK40N90P
TP1434
94 IXFK40N90P
TP1444
95 IXFK420N10T
SP1347
96 IXFK420N10T
SP1347
97 IXFK44N80P
TP1219
98 IXFK64N50P
TP1242
99 IXFK90N50P2
TP1333
100 IXFK90N50P2
TP1337
101 IXFK90N50P2
TP1406
102 IXFK94N50P2
SF1211
103 IXFN120N20
SS1301
104 IXFN32N120P
TP1230
105 IXFN360N10T
US1422
106 IXFN38N100P
TP1230
107 IXFN82N60P
SS1301
108 IXFN90N30
TS1309
109 IXFP110N15T2
SS1332
110 IXFP14N60P3
SS1144
111 IXFP16N50P3
GS1419
112 IXFP180N10T2
SS1305
113 IXFP22N60P3
TS1324
114 IXFP230N075T2
US1309
115 IXFP36N30P3
GS1419
116 IXFP4N60P3
SS1143
117 IXFP5N50P3
SS1206
118 IXFP76N15T2
SS0920
119 IXFP7N60P3
SS1143
120 IXFQ94N30P3
SS1321
121 IXFR32N100Q3
SP1133
122 IXFT14N80P
SP0731
123 IXFT20N100P
TP1147
124 IXFT50N60P3
GP1443
125 IXFX120N25P
2746
126 IXFX140N25T
US1410
127 IXFX160N30T
SP0917
128 IXFX180N25T
SS0908
129 IXFX20N120P
TS1337
130 IXFX230N20T
US1408
131 IXFX24N100Q3
SP1137
132 IXFX260N17T
SS0912
IXYS Semiconductor GmbH
Tj(max)
[°C]
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
150
145
145
145
145
145
145
145
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
6000
15000
15000
15000
15000
15000
15000
15000
Sample
Size
24
24
24
77
77
24
24
24
24
77
77
77
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
77
80
24
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
360000
360000
240000
1155000
1155000
360000
360000
360000
360000
1155000
1155000
1155000
360000
360000
240000
360000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
240000
1155000
480000
360000
360000
360000
360000
360000
360000
360000
18
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
133 IXFX26N120P
TP1102
134 IXFX320N17T2
SP0931
135 IXFX32N100Q3
TP1229
136 IXFX32N80Q3
SS1122
137 IXFX32N90P
TS1122
138 IXFX44N80P
TS1332
139 IXFX44N80Q3
TP1226
140 IXFX48N60Q3
SS1118
141 IXFX64N60P
TP1331
142 IXFX64N60P3
SP1110
143 IXFX64N60P3
SS1332
144 IXFX64N60P3
SS1332
145 IXFX64N60P3
SS1332
146 IXFX64N60P3
SS1335
147 IXFX64N60P3
SS1335
148 IXFX64N60P3
SS1335
149 IXFX64N60P3
SS1335
150 IXFX64N60P3
TS1337
151 IXFX64N60P3
SS1335
152 IXFX64N60Q3
SS1118
153 IXFX73N30Q
SF0938
154 IXFX78N50P3
SP1109
155 IXFX78N50P3
TS1337
156 IXFX80N50Q3
SP1106
157 IXFX80N60P3
SP1109
158 IXFX90N20Q
TP0849
159 IXFX98N50P3
SP1110
160 IXGA20N250HV
TS1222
161 IXGA24N170A
TS1215
162 IXGF25N250
TP1206
163 IXGH100N30C3
SS1250
164 IXGH30N60C3D1
SK0840
165 IXGH32N60B
TP1205
166 IXGH40N120B2D1
TP0940
167 IXGH40N120C3D1
TK0840
168 IXGH40N60A
TP1304
169 IXGH48N60C3D1
TP1148
170 IXGH60N60C3D1
SS0931
171 IXGH72N60A3
TS1348
172 IXGK120N120B3
TP1143
173 IXGK120N60B3
SP1146
174 IXGP20N120A3
TS0905
175 IXGR72N60C3D1
SP0952
IXYS Semiconductor GmbH
Tj(max)
[°C]
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
15000
15000
15000
15000
15000
10000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
Sample
Size
24
23
24
24
24
15
24
24
15
24
15
15
15
24
24
24
24
24
15
24
24
24
24
24
24
24
24
24
24
17
24
24
24
24
24
24
24
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
360000
345000
360000
360000
360000
150000
360000
360000
150000
360000
225000
225000
225000
360000
360000
360000
360000
360000
225000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
170000
360000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
19
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
176 IXKH35N60C5
3160
177 IXKR47N60C5
3188
178 IXSH45N120
TP1204
179 IXTA02N250
TS1222
180 IXTA76P10T
SS1303
181 IXTA96P085T
SS1223
182 IXTA96P085T
SS1223
183 IXTA96P085T
SS1223
184 IXTH02N450HV
TS1414
185 IXTH12N140
TP1119
186 IXTH12N150
TP1206
187 IXTH140N10P
TS1406
188 IXTH16P60P
TS1316
189 IXTH1N200P3
TP1338
190 IXTH1N200P3HV
TS1404
191 IXTH1N300P3HV
TS1404
192 IXTH1N450HV
TS1404
193 IXTH1R4N250P3HV
TS1413
194 IXTH200N10T
SP1319
195 IXTH20N65X
SS1344
196 IXTH20N65X
SS1344
197 IXTH20P50P
TP1309
198 IXTH250N075T
SP0801
199 IXTH2N150L
TP1317
200 IXTH32N65X
SS1346
201 IXTH360N055T2
SP0926
202 IXTH3N120
TS1136
203 IXTH4N150
TS1151
204 IXTH4N150
TP1149
205 IXTH64N65X
HS1417
206 IXTH6N150
TP1201
207 IXTH80N075L2
TS1419
208 IXTH86N25T
UP1408
209 IXTH96P085T
SS1302
210 IXTK550N055T2
UP1242
211 IXTP02N120P
TS1307
212 IXTP02N120P
TS1307
213 IXTP100N04T2
SS1341
214 IXTP102N15T
K834
215 IXTP110N055T2
SS1332
216 IXTP130N10T
SS1318
217 IXTP15P15T
SS1036
218 IXTP200N055T2
US1310
IXYS Semiconductor GmbH
Tj(max)
[°C]
125
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
∆Τ
[K]
80
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
2000
2000
15000
15000
10000
10000
10000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
Sample
Size
20
20
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40000
40000
360000
360000
240000
240000
240000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
20
Remark
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
219 IXTP200N055T2
US1414
220 IXTP20N65X
HS1332
221 IXTP220N04T2
SS1328
222 IXTP22N50PM
SS0924
223 IXTP260N055T2
SS1338
224 IXTP2N100P
TS1332
225 IXTP3N50P
S1048
226 IXTP450P2
GS1352
227 IXTP450P2
GS1411
228 IXTP460P2
GS1421
229 IXTP460P2
GS1421
230 IXTP48P05T
SS1040
231 IXTP76P10T
TS1332
232 IXTP80N10T
SS1150
233 IXTP80N10T
SS1318
234 IXTP80N12T2
SS1043
235 IXTQ130N15T
SS0920
236 IXTQ200N10T
SS1125
237 IXTQ200N10T
SS1125
238 IXTQ36N50P
TS1424
239 IXTQ36N50P
TS1424
240 IXTQ36N50P
TS1424
241 IXTQ44N50P
GS1408
242 IXTQ450P2
SS1225
243 IXTQ82N25P
TS1348
244 IXTQ88N28T
SK0842
245 IXTT60N20L2
TP1005
246 IXTT6N150
TP1203
247 IXTX210P10T
SP1130
248 IXTX24N100
SP0837
249 IXTX600N04T2
SP0945
250 IXTX8N150L
TP0912
251 IXXH50N60B3
SS1105
252 IXXH50N60B3D1
TP1150
253 IXXH50N60C3
SS1105
254 IXXH60N65B4
SP1235
255 IXXH80N65B4H1
SP1319
256 IXXN110N65B4H1
TS1444
Tj(max)
[°C]
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
10000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
2000
Sample
Size
77
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1155000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
240000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
48000
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
257 IXYH24N90C3
TS1144
258 IXYH30N450HV
TS1413
259 IXYH40N120C3
TP1137
260 IXYH40N65C3D1
TS1427
261 IXYH40N90C3
TS1205
262 IXYH50N120C3
TP1137
263 IXYH50N65C3D1
TS1424
264 IXYH60N90C3
SS1205
265 IXYH75N65C3
TS1341
266 IXYH75N65C3D1
TS1429
267 IXYH82N120C3
TP1115
268 IXYH82N120C3
TP1115
269 IXYN100N65C3H1
TS1346
270 IXYN82N120C3H1
TP1413
271 IXYP10N65C3D1
TS1401
272 IXYP8N90C3
TS1144
273 IXYT20N120C3D1HV
TS1247
274 IXYX100N120C3
TP1137
275 IXYX40N450HV
TS1414
Tj(max)
[°C]
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
145
∆Τ
[K]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
15000
Sample
Size
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
360000
IXYS Semiconductor GmbH
21
Remark
Remark
TABLE 3B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MIX300/450
3751
2 MIXA60HU1200VA
3920
3 MIXA60WB1200TEH
2513
4 MKI450-12E9
2636
5 MKI65A7T
2728
6 MKI75-06A7T
3740
7 VWM270-0075X2
2825
Tj(max)
[°C]
125
125
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
80
80
Number
of
Cycles
70000
10000
20000
20000
20000
10000
10000
Sample
Size
10
20
10
6
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
700000
200000
200000
120000
200000
100000
100000
TABLE 3C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC162-14io1
2555
2 MCC44-16io1
2221
3 MCC44-16io1B
2989
4 MCMA110P1600TA
3996
5 MCMA35P1400TA
3995
6 MCMA50P1600TA
4098
7 MCMA65P1600TA
3998
8 MCMA85P1600TA
3979
9 MDD172-16
3202
10 MDD26-16
3205
11 MDD56-16N1
2365
12 MDD95-16
3330
13 MDMA85P1600TG
3980
Tj(max)
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
80
80
80
80
80
80
80
80
Number
of
Cycles
10000
10000
10000
20000
20000
20000
20000
50000
10000
10000
20000
10000
20000
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
100000
100000
100000
200000
200000
200000
200000
500000
100000
100000
200000
100000
200000
TABLE 3D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 VUB116-16NOXT
4927
2 VUB116-16NOXT
4927
3 VUO190-12NO7
3590
4 VUO192-16NO7
2615
5 VUO28-08NO7
4746
6 VUO52-16NO1
3001
7 VUO52-16NO1
3234
8 VUO52-16NO1
3656
9 VUO82-16NO7
3463
10 VUO82-16NO7
4028
11 VVZ40-14io1
3103
Tj(max)
[°C]
125
125
125
125
125
125
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
80
80
80
80
80
80
Number
of
Cycles
80000
10000
2000
5000
2000
5000
5000
5000
2000
2000
5000
Sample
Size
2
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
160000
100000
20000
50000
20000
50000
50000
50000
20000
20000
50000
Tj(max)
[°C]
125
145
150
145
145
145
125
125
145
145
145
145
145
145
125
125
145
145
∆Τ
[K]
80
100
100
100
100
100
80
80
100
100
100
100
100
100
80
80
100
100
Number
of
Cycles
5000
2000
6000
2000
2000
2000
5000
500
2000
2000
2000
2000
2000
2000
5000
5000
2000
2000
Sample
Size
20
20
77
20
20
20
20
20
20
20
20
20
20
20
10
10
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
100000
40000
462000
40000
40000
40000
100000
10000
40000
40000
40000
40000
40000
40000
50000
50000
40000
40000
Remark
Remark
Remark
TABLE 3E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
DH2x61-18A
DPG30I400HA
DPG60B600LB
DPG80C300HB
DSEC30-06A
DSEC60-06A
DSEI2x101-06A
DSEI2x61-10B
DSEI30-12A
DSEI60-06A
DSEP15-12CR
DSEP15-12CR
DSEP29-06B
DSEP29-06B
DSEP2x31-03A
DSEP2x61-06A
DSEP30-12A
DSEP60-12AR
Date Code
or
Test #
4848
4761
4409
4132
4326
3924
4148
3815
3593
3719
3606
4128
4059
4619
4413
3603
3789
3792
IXYS Semiconductor GmbH
22
Remark
TABLE 3F: Schottky Diode
Date Code
or
Test #
4046
3185
4129
2985
3716
2404
4622
4657
3074
3926
3450
3349
3592
2947
4033
2311
3812
4323
4775
3714
Tj(max)
[°C]
145
145
145
145
145
145
145
145
145
125
145
145
145
145
145
125
145
145
145
145
∆Τ
[K]
100
100
100
100
100
100
100
100
100
80
100
100
100
100
100
80
100
100
100
100
Number
of
Cycles
2000
2000
2000
2000
2000
4000
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
2000
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40000
40000
40000
40000
40000
80000
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
40000
TABLE 3G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 CLA30E1200PC
2657
2 CLA50E1200HB
4651
3 CMA30E1600PB
4050
4 CMA30E1600PB
3658
5 CS20-12io1
2957
6 CS30-16io1
2986
7 CS35-14io4
3090
8 CS45-12io1
3162
9 CSM410LB
4152
10 DAA10P1800PZ
4742
11 DSA1-16D
2471
12 DSA1-18D
3200
13 DSA17-18A
2954
14 DSA17-18A
3857
15 DSA9-18F
3338
16 DSA9-18F
4294
17 DSAI35-16A
3710
18 DSI2x55-16A
4777
19 DSI2x55-16A
3340
20 DSI30-12A
3490
21 DSI45-12A
3227
22 DSI45-16A
3810
23 DSI45-16AR
3348
24 DSP25-12A
3355
Tj(max)
[°C]
125
125
125
125
125
125
125
125
145
145
115
115
130
115
115
115
145
125
125
145
145
145
145
145
∆Τ
[K]
80
80
80
80
80
80
80
80
100
100
85
85
100
85
85
85
100
80
80
100
100
100
100
100
Number
of
Cycles
4000
2000
2000
2000
2000
2000
2000
2000
4000
4000
2000
2000
2000
2000
2000
2000
2000
5000
5000
2000
2000
2000
2000
2000
Sample
Size
20
20
20
20
20
20
10
20
10
20
20
20
10
10
10
20
10
10
10
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
80000
40000
40000
40000
40000
40000
20000
40000
40000
80000
40000
40000
20000
20000
20000
40000
20000
50000
50000
40000
40000
40000
40000
40000
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
DSA30C200PB
DSA30I150PA
DSA50C150HB
DSA70C150HB
DSA90C200HB
DSA90C200HR
DSA90C200HR
DSB40C15PB
DSSK30-018A
DSSK40-0015B
DSSK40-008B
DSSK50-01A
DSSK60-0045B
DSSK60-015A
DSSK60-02AR
DSSK70-0015B
DSSK70-0015B
DSSK70-008A
DSSK80-006B
DSSS35-008AR
IXYS Semiconductor GmbH
23
Remark
Remark
TEMPERATURE CYCLE (Tables 4A .. 4H)
TABLE 4A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 FDM47-06KC5
2642
2 GWM160-0055X2 SL
3580
3 GWM160-0055X2SL
2575
4 IEA21/36PG1200
3041
5 IEA21PG1200LA
2598
6 ITF38IF1200HJ
4332
7 IXA12IF1200HB
4650
8 IXA20I200PB
4093
9 IXA20PG1200DHG LB
3581
10 IXA20PT1200LB
4363
11 IXA20SV1200DHGLA
3211
12 IXA27IF1200HJ
3376
13 IXA40PG1200DHGLA
3211
14 IXA55I1200HJ
3743
15 IXA55I200HJ
2389
16 IXA60IF1200NA
2710
17 IXA60IF1200NA
3833
18 IXBH10N300HV
TS1413
19 IXBH14N300HV
TS1414
20 IXBH15N160
3946
21 IXBH16N170A
TP1221
22 IXBH20N360HV
TS1404
23 IXBH22N300HV
TS1421
24 IXBH40N160
4403
25 IXBH40N160
3242
26 IXBH40N160
3497
27 IXBH5N160G
4457
28 IXBH5N160G
3076
29 IXBH9N160G
2446
30 IXBH9N160G
2727
31 IXBH9N160G
3712
32 IXBH9N160G
2952
33 IXBT24N170
TP1202
34 IXBX28N300HV
TS1414
35 IXBX50N360HV
TS1414
36 IXDD404SIA
SA1208
37 IXDH30N120D1
3797
38 IXDH30N120D1
3640
39 IXDH35N60BD1
4972
40 IXDR30N120D1
2442
41 IXEH25N120D1
2542
42 IXFA180N10T2
SS1229
43 IXFA7N60P3
SS1244
44 IXFB100N50P
TP1110
45 IXFB100N50P
TP1409
46 IXFB110N60P3
SP1201
47 IXFB110N60P3
TS1412
48 IXFB132N50P3
TP1415
49 IXFB210N30P3
SP1224
50 IXFB40N110Q3
TP1405
51 IXFB40N110Q3
TP1403
52 IXFB44N100P
TP1404
53 IXFB60N80PK
TS1349
54 IXFB60N80PK
TS1349
55 IXFB62N80Q3
TS1422
56 IXFB62N80Q3
TS1422
IXYS Semiconductor GmbH
Low
Temp.
[°C]
-55
-40
-40
-55
-40
-55
-40
-55
-40
-55
-40
-55
-40
-55
-40
-55
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-40
-55
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
125
150
150
150
150
150
150
150
150
125
125
125
150
125
150
150
125
150
150
150
150
150
150
150
Number
of
Cycles
100
1000
1000
50
1000
100
50
50
1000
100
1000
100
1000
100
100
300
50
1000
1000
50
1000
1000
1000
50
50
50
50
50
50
100
50
50
1000
1000
1000
1000
50
50
50
50
50
250
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
20
77
77
20
20
20
20
20
20
20
10
20
10
20
20
20
20
30
30
20
30
30
30
20
20
20
20
20
20
20
20
20
30
30
30
77
20
20
20
20
20
30
30
30
25
30
25
25
30
25
25
25
30
30
30
30
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
77000
77000
1000
20000
2000
1000
1000
20000
2000
10000
2000
10000
2000
2000
6000
1000
30000
30000
1000
30000
30000
30000
1000
1000
1000
1000
1000
1000
2000
1000
1000
30000
30000
30000
77000
1000
1000
1000
1000
1000
7500
30000
30000
25000
30000
25000
25000
30000
25000
25000
25000
30000
30000
30000
30000
24
Remark
I_CES increased
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
57 IXFB62N80Q3K
TS1349
-55
58 IXFB62N80Q3K
TS1349
-55
59 IXFH12N90
TP1310
-20
60 IXFH150N17T
US1401
-55
61 IXFH150N17T2
SS1341
-55
62 IXFH150N20T
SP1147
-55
63 IXFH15N100P
TP1202
-55
64 IXFH160N15T
US1401
-55
65 IXFH160N15T2
SS1319
-55
66 IXFH16N50P3
SP1207
-55
67 IXFH16N60P3
SS1142
-55
68 IXFH18N90P
TP1202
-55
69 IXFH20N50P3
SP1141
-55
70 IXFH22N60P3
SP1318
-55
71 IXFH22N60P3
GS1429
-55
72 IXFH26N50
TS1331
-55
73 IXFH26N50
TS1331
-55
74 IXFH26N50P3
SS1206
-55
75 IXFH26N50P3
TP1325
-55
76 IXFH26N50Q
TS1343
-55
77 IXFH26N50Q
TS1343
-55
78 IXFH30N50P
SS1413
-55
79 IXFH46N30T
US1408
-55
80 IXFH50N50P3
SS1407
-55
81 IXFH50N60P3
SP1201
-55
82 IXFH50N60P3
TS1414
-55
83 IXFH52N50P2
GS1422
-55
84 IXFH60N50P3
TP1326
-55
85 IXFH75N10
SS1219
-55
86 IXFH76N15T2
US1406
-55
87 IXFH7N100P
TP1143
-55
88 IXFH88N30P
TP1237
-55
89 IXFJ22N60P3
SS1205
-55
90 IXFK120N25P
TP1239
-55
91 IXFK140N30P
TP1242
-55
92 IXFK40N90P
TP1434
-55
93 IXFK40N90P
TP1444
-55
94 IXFK44N80P
TP1219
-55
95 IXFK64N50P
TP1242
-55
96 IXFK80N60P3
SP1150
-55
97 IXFK90N50P2
TP1333
-55
98 IXFK90N50P2
TP1337
-55
99 IXFK90N50P2
TP1406
-55
100 IXFK94N50P2
SF1211
-55
101 IXFN100N25
SS1309
-55
102 IXFN120N20
SP1211
-55
103 IXFN120N20
SS1301
-55
104 IXFN150N15
SS1309
-55
105 IXFN180N15P
SP1210
-55
106 IXFN200N10P
SP1212
-55
107 IXFN32N120P
TP1230
-55
108 IXFN32N120P-BN
SP1217
-55
109 IXFN340N07
SP1213
-55
110 IXFN34N100
SP1111
-55
111 IXFN360N10T
US1422
-55
112 IXFN38N100P
SP1204
-55
113 IXFN38N100P
TP1230
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
150
150
90
150
150
125
125
150
125
125
125
125
125
125
150
150
150
125
125
150
150
150
150
150
125
150
150
125
125
150
125
125
125
125
125
150
150
125
125
125
125
150
150
125
125
125
125
125
125
125
125
125
125
125
150
125
125
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
77
25
30
30
77
77
77
30
30
10
30
30
10
10
30
10
10
10
30
10
30
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
30000
30000
30000
30000
30000
30000
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
77000
25000
30000
30000
77000
77000
77000
30000
30000
10000
30000
30000
10000
10000
30000
10000
10000
10000
30000
10000
30000
25
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
114 IXFN44N100Q3
SP1207
-55
115 IXFN44N80
SP1212
-55
116 IXFN44N80
SP1212
-55
117 IXFN48N50
TP1212
-55
118 IXFN64N50P
SP1208
-55
119 IXFN64N50P
TS1347
-55
120 IXFN64N60P
SP1206
-55
121 IXFN80N50P
SP1212
-55
122 IXFN82N60P
SS1301
-55
123 IXFN90N30
TS1309
-55
124 IXFP110N15T2
SS1332
-55
125 IXFP110N15T2
US1351
-55
126 IXFP14N60P3
SS1144
-55
127 IXFP16N50P3
GS1419
-55
128 IXFP170N075T2
US1309
-55
129 IXFP180N10T2
SS1305
-55
130 IXFP22N60P3
TS1324
-55
131 IXFP230N075T2
US1309
-55
132 IXFP36N30P3
GS1419
-55
133 IXFP4N60P3
SS1143
-55
134 IXFP5N50P3
SS1206
-55
135 IXFP7N60P3
SS1143
-55
136 IXFQ94N30P3
SS1321
-55
137 IXFT20N100P
TP1147
-55
138 IXFT50N60P3
GP1443
-55
139 IXFX120N25P
2746
-55
140 IXFX140N25T
US1410
-55
141 IXFX20N120P
TS1337
-55
142 IXFX210N17T
SS0912
-55
143 IXFX230N20T
US1408
-55
144 IXFX32N100Q3
TP1229
-55
145 IXFX44N80P
TS1332
-55
146 IXFX44N80Q3
TP1226
-55
147 IXFX64N60P
TP1331
-55
148 IXFX64N60P3
SS1332
-55
149 IXFX64N60P3
SS1332
-55
150 IXFX64N60P3
SS1332
-55
151 IXFX64N60P3
TS1337
-55
152 IXFX64N60P3
SS1335
-55
153 IXFX64N60P3
SS1335
-55
154 IXFX64N60P3
SS1335
-55
155 IXFX64N60P3
SS1335
-55
156 IXFX64N60P3
SS1335
-55
157 IXFX78N50P3
TS1337
-55
158 IXGA20N100
TS1235
-55
159 IXGA20N250HV
TS1222
-55
160 IXGA24N170A
TS1215
-55
161 IXGF25N250
TP1206
-40
162 IXGH100N30C3
SS1250
-55
163 IXGH40N120B2D1
TP0940
-55
164 IXGH40N60A
TP1304
-55
165 IXGH48N60C3D1
TP1148
-55
166 IXGH72N60A3
TS1348
-55
167 IXGK120N60B3
SP1146
-55
168 IXKH30N60C5
4022
-55
169 IXKH35N60C5
4158
-55
170 IXKH70N60C5
3358
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
125
125
125
125
125
150
125
125
125
125
125
150
125
150
125
125
125
125
150
125
125
125
125
125
150
150
150
150
125
150
125
125
125
125
125
125
125
150
125
125
125
125
125
150
125
125
125
125
125
125
125
125
150
125
150
150
150
Number
of
Cycles
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
500
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
250
1000
1000
1000
1000
1000
100
50
50
Sample
Size
10
10
30
10
10
30
10
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
80
30
30
10
30
30
15
30
15
15
15
15
30
15
15
15
15
15
30
30
20
30
20
30
30
30
30
30
30
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
10000
10000
30000
10000
10000
30000
10000
10000
30000
30000
15000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
77000
80000
30000
30000
10000
30000
30000
15000
30000
15000
15000
15000
15000
30000
15000
15000
15000
15000
15000
30000
30000
20000
30000
20000
7500
30000
30000
30000
30000
30000
2000
1000
1000
26
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
171 IXKP24N60C5M
4319
-55
172 IXKR40N60C
3713
-40
173 IXKR47N60C5
2979
-55
174 IXLF19N250A
4306
-55
175 IXLT2025
3914
-55
176 IXLV1861
3061
-40
177 IXRH25N120
2500
-55
178 IXSH45N120
TP1204
-55
179 IXSN35N120AU1
TP1208
-55
180 IXTA05N100
TS1236
-55
181 IXTA06N120P
TS1247
-55
182 IXTA200N055T2
SS1223
-55
183 IXTA2R4N120P
TS1226
-55
184 IXTA36N30P
SS1241
-55
185 IXTA3N120
TS1234
-55
186 IXTA3N120
TS1234
-55
187 IXTA50N28T
SS1216
-55
188 IXTA80N10T
SS1150
-55
189 IXTH02N450HV
TS1414
-55
190 IXTH140N10P
TS1406
-55
191 IXTH16P60P
TS1316
-55
192 IXTH1N200P3
TP1338
-55
193 IXTH1N200P3HV
TS1404
-55
194 IXTH1N300P3HV
TS1404
-55
195 IXTH1N450HV
TS1404
-55
196 IXTH1R4N250P3HV
TS1413
-55
197 IXTH200N10T
SP1319
-55
198 IXTH20N65X
SS1344
-55
199 IXTH20P50P
TP1309
-55
200 IXTH2N150L
TP1317
-55
201 IXTH32N65X
SS1346
-55
202 IXTH3N120
TS1136
-55
203 IXTH40N30
SS1248
-55
204 IXTH48P20P
SP1049
-55
205 IXTH4N150
TS1151
-55
206 IXTH4N150
TP1149
-55
207 IXTH64N65X
HS1417
-55
208 IXTH6N100D2
TP1202
-55
209 IXTH6N150
TP1201
-55
210 IXTH76P10T
SS1052
-55
211 IXTH80N075L2
TS1419
-55
212 IXTH86N25T
UP1408
-55
213 IXTH96P085T
SS1302
-55
214 IXTK550N055T2
UP1242
-55
215 IXTL2N450
TP1239
-40
216 IXTN210P10T
SP1215
-55
217 IXTN40P50P
SP1212
-55
218 IXTP02N120P
TS1307
-55
219 IXTP05N100M
TS1245
-55
220 IXTP100N04T2
SS1341
-55
221 IXTP110N055T2
SS1332
-55
222 IXTP130N10T
SS1318
-55
223 IXTP200N055T2
US1310
-55
224 IXTP200N055T2
US1414
-55
225 IXTP20N65X
HS1332
-55
226 IXTP220N04T2
SS1328
-55
227 IXTP260N055T2
SS1338
-55
IXYS Semiconductor GmbH
High
Temp.
[°C]
150
150
150
150
150
150
150
125
125
125
125
125
125
125
125
125
125
125
150
150
125
125
150
150
150
150
125
150
125
150
150
125
125
125
125
125
150
125
125
125
150
150
125
125
125
125
125
150
125
150
150
125
125
150
125
125
150
Number
of
Cycles
50
50
50
100
100
100
100
1000
1000
1000
1000
1000
1000
1000
20
20
250
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
20
20
20
20
20
20
20
30
10
30
30
30
30
30
15
50
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
10
30
30
30
30
30
30
77
30
30
30
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
1000
1000
2000
2000
2000
2000
30000
10000
30000
30000
30000
30000
30000
300
1000
7500
77000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
10000
10000
30000
30000
30000
30000
30000
30000
77000
30000
30000
30000
27
Remark
TABLE 4A (cont'd): MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
228 IXTP2N100P
TS1332
-55
229 IXTP2N100P
TS1332
-55
230 IXTP450P2
GS1352
-55
231 IXTP450P2
GS1411
-55
232 IXTP460P2
TS1332
-55
233 IXTP460P2
GS1421
-55
234 IXTP460P2
GS1421
-55
235 IXTP50N28T
US1426
-55
236 IXTP76P10T
TS1332
-55
237 IXTP80N10T
SS1150
-55
238 IXTP80N10T
SS1318
-55
239 IXTQ200N10T
SS1125
-55
240 IXTQ200N10T
SS1125
-55
241 IXTQ36N50P
TS1424
-55
242 IXTQ36N50P
TS1424
-55
243 IXTQ36N50P
TS1424
-55
244 IXTQ44N50P
GS1408
-55
245 IXTQ460P2
SS1236
-55
246 IXTQ82N25P
TS1348
-55
247 IXTT12N150
TP1206
-55
248 IXTT6N150
TP1203
-55
249 IXTV03N400S
TP1134
-55
250 IXTX200N10L2
TP1137
-55
251 IXTY01N100D
TS1014
-55
252 IXXH50N60B3D1
TP1150
-55
253 IXXH60N65B4
SP1235
-55
254 IXXH60N65C4
SP1236
-55
255 IXXH80N65B4H1
SP1319
-55
256 IXYH30N450HV
TS1413
-55
257 IXYH40N120C3
TP1137
-55
258 IXYH40N65C3D1
TS1427
-55
259 IXYH40N90C3
TS1205
-55
260 IXYH50N65C3D1
TS1424
-55
261 IXYH60N90C3
SS1205
-55
262 IXYH75N65C3
TS1341
-55
263 IXYH75N65C3D1
TS1429
-55
264 IXYH80N90C3
TP1205
-55
265 IXYT20N120C3D1HV
TS1247
-55
266 IXYX40N450HV
TS1414
-55
267 MMIX1N64N300
TP1137
-40
268 MTI200WX75GD-SMD
4372
-55
High
Temp.
[°C]
150
150
150
150
125
150
150
150
125
125
125
125
125
150
150
150
150
125
150
125
125
125
125
125
125
125
125
125
150
125
150
125
150
125
150
150
125
125
150
125
150
Number
of
Cycles
1000
1000
1000
1000
500
1000
1000
1000
500
1000
1000
100
100
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
16
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
7
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
30000
30000
30000
30000
15000
30000
30000
30000
15000
30000
30000
3000
3000
30000
30000
30000
30000
16000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
10000
7000
TABLE 4B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MID550-12A4
4203
2 MID75-12A3
3832
3 MIXA100PM650TMI
4021
4 MIXA150Q1200VA
3861
5 MIXA30WB1200TED
3804
6 MIXA40WB1200TED
4543
7 MIXA40WB1200TED
4543
8 MIXA40WB1200TED
4732
9 MIXA40WB1200TED
4732
10 MIXA80WB1200TEH
4800
11 MIXA81WB1200TEH
4012
12 MIXD200W650TEH
4421
13 MIXD80PM650TMI
4249
14 MKI75-12E8
3599
15 MUBW15-12A6K
4872
16 MUBW35-06A6K
3827
17 MUBW50-17T8
3784
18 VKM60-01P1
4030
19 VMM90-09F
4405
20 VMM90-09P
4405
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
25
50
50
100
100
100
100
100
100
100
100
50
100
25
50
10
100
100
Sample
Size
10
20
10
10
10
10
10
20
20
10
10
10
10
10
12
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
500
1000
250
500
500
1000
1000
2000
2000
1000
1000
1000
1000
500
1200
250
500
100
1000
1000
IXYS Semiconductor GmbH
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
28
Remark
Remark
TABLE 4C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 CSM400A
2501
2 CSM400A
2847
3 CSM400A
3333
4 CSM400A
4834
5 MCC162-16
2451
6 MCC21-14io8
2617
7 MCC225-14
3102
8 MCC255-14io1
4935
9 MCC26-14
3104
10 MCC312
2865
11 MCC312-16
3470
12 MCC312-16io1
4065
13 MCC44-16io1
2770
14 MCC56-16
3881
15 MCC56-16io1B
3275
16 MCC56-16io1B
4097
17 MCC95-14
2902
18 MCC95-16
3510
19 MCC95-16io1
2450
20 MCC95-18io1B
4610
21 MCD225-14
4417
22 MCD95-16io1
3943
23 MDD175-28N1
3622
24 MDD175-28N1
4602
25 MDD312-16N1
3274
26 MDD95
4115
27 MDD95
4844
28 MDD95-22N1B
3600
29 UGE0421AY4
2464
Low
Temp.
[°C]
-40
-25
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
85
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
1000
25
50
50
50
50
100
50
100
50
50
100
100
50
50
50
50
50
50
50
50
50
50
50
50
50
50
10
Sample
Size
10
10
10
20
10
10
10
10
10
10
10
10
20
10
10
10
10
10
10
10
9
10
6
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
10000
250
1000
500
500
500
1000
500
1000
500
500
2000
1000
500
500
500
500
500
500
450
500
300
500
500
500
500
500
100
TABLE 4D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
4863
1 MDNA900U1600PTEH-P
2 VBO21-12NO7
3586
3 VHF36-12io5
3645
4 VUB116-16NOXT
4174
5 VUB145-16NOXT
4797
6 VUM33-05N
3779
7 VUM33-06PH
3780
8 VUO121-16NO1
3889
9 VUO34-20NO1
4710
10 VUO36-12NO8
3807
11 VUO52-16NO1
3732
12 VUO52-16NO1
3846
13 VUO52-16NO1
3887
14 VUO52-16NO1
3887
15 VUO52-16NO1
4534
16 VUO80-16NO1
3944
17 VVY50-16io1
4116
18 VVZ40-14io1
4425
19 VVZB120-14io2
3769
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
10
25
50
50
100
100
100
50
10
50
50
50
50
25
20
25
25
25
Sample
Size
10
10
10
10
10
20
20
10
11
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
100
250
500
500
2000
2000
1000
550
100
500
500
500
500
250
200
250
250
250
IXYS Semiconductor GmbH
29
Remark
Remark
TABLE 4E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
DFE10I600PM
DFE30I600QM
DH2x60-18A
DHG100x1200NA
DHG100x1200NA
DHG10C600PB
DPG30C300HB
DPG30C400HB
DPG60C200HB
DPG60C300HB
DPG60C300HJ
DSEC120-12AK
DSEC16-06AC
DSEC29-06AC
DSEI12-06A
DSEI12-12A
DSEI2x101-06A
DSEI2x101-12A
DSEI2x101-12A
DSEI2x101-12A
DSEI2x61-06A
DSEI30-06A
DSEI30-06A
DSEI30-10A
DSEIx101-12P
DSEP15-12CR
DSEP2x25-12C
DSEP2x31-03A
DSEP30-12AR
DSEP60-06AT
MEE250-12DA
MEE250-12DA
MEE250-12DA "H"
MEE250-12DA "H"
MEE75-12DA
MEO550-02DA
MEO550-02DA
Date Code
or
Test #
4767
4819
3770
4646
4646
3883
4131
4044
3718
3957
4125
4438
3798
4429
3934
4545
4147
4930
3711
3964
3602
4455
4624
4327
4744
3930
4045
4414
3793
3764
4435
4105
3886
3886
4709
4396
3967
Low
Temp.
[°C]
-55
-40
-40
40
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-55
-40
-40
-55
-55
-40
-40
-40
-40
40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
100
50
50
100
50
50
50
100
50
100
50
100
50
100
20
20
20
50
20
50
50
50
10
50
20
20
50
100
100
50
100
100
50
50
50
Sample
Size
20
20
20
20
20
20
20
20
20
40
20
20
20
40
20
40
20
20
20
20
20
20
20
20
10
20
20
20
20
20
10
10
10
10
11
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
2000
2000
1000
1000
2000
1000
1000
1000
4000
1000
2000
1000
4000
1000
4000
400
400
400
1000
400
1000
1000
1000
100
1000
400
400
1000
2000
1000
500
1000
1000
550
500
500
Date Code
or
Test #
2956
4209
2848
4322
3182
2448
2456
2577
3717
4762
4035
4127
2803
3347
2622
2404
3935
2495
4493
2774
2539
3791
2880
2975
4616
2772
3452
3073
3609
3445
4458
Low
Temp.
[°C]
-55
-55
-40
-55
-55
-55
-55
-55
-55
150
-55
-55
-55
-55
-55
-55
-55
-55
-55
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
50
50
50
100
50
100
50
-55
50
50
100
50
100
100
50
100
50
50
50
50
50
50
50
100
50
50
50
50
50
Sample
Size
20
20
10
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
500
1000
1000
2000
1000
2000
1000
-1100
1000
1000
2000
1000
2000
2000
1000
2000
1000
1000
1000
1000
1000
1000
1000
2000
1000
1000
1000
1000
1000
Remark
TABLE 4F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
DSA10C150PB
DSA20C150PB
DSA300I100NA
DSA30C150HB
DSA30I150PA
DSA50C100HB
DSA60C100PB
DSA60C150PB
DSA70C100HB
DSA70C150HB
DSA70C150HB
DSA90C200HB
DSA90C200HB
DSA90C200HB
DSA90C200HR
DSA90C200HR
DSB30C30PB
DSB60C30PB
DSB60C45HB
DSS2x101-015A
DSSK20-015A
DSSK30-018A
DSSK30-18A
DSSK60-015A
DSSK60-015A
DSSK60-015AR
DSSK60-02A
DSSK70-008A
DSSK80-006B
DSSS35-008AR
DSSS35-008AR
IXYS Semiconductor GmbH
30
Remark
TABLE 4G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 CLA60PD1200NA
4160
2 CLF20E1200PB
4039
3 CMA80E1600HB
3976
4 CMA80E1600HB
3976
5 CS1710
3901
6 CS19-12H01
3737
7 CS20-22MO F1
4017
8 CS22-08io1M
3800
9 CS30-12io1
4829
10 CS30-16io1
4318
11 CSM410LB
3818
12 CSM410LB
4152
13 DAA10P1800PZ
4742
14 DLA100B1200LB
4351
15 DLA100B1200LB
4178
16 DLA60I1200HA
4617
17 DMA30E1600HA
4451
18 DMB30E188HA
4451
19 DSA1-16D
4440
20 DSA17-18A
3855
21 DSA17-18A
4735
22 DSA75-16B
4505
23 DSA75-16B
4506
24 DSA75-18B
3923
25 DSA9-18
4143
26 DSA9-18F
4293
27 DSAI17-16A
3641
28 DSAI35-16A
3709
29 DSI2x55-12A
4316
30 DSI30-08A
4501
31 DSI45-16A
4969
32 DSI45-16AR
4958
33 DSI45-16AR
4625
34 DSP26-16AT
3835
35 DSP45-12A
4141
36 DSP45-12A
4878
37 DSP45-16AR
4764
Low
Temp.
[°C]
-40
-55
-55
-55
-40
-40
-55
-55
-55
-55
-40
-55
-55
-55
-55
-55
-55
-55
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-55
-55
-55
-55
-40
-55
-40
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
50
100
100
100
50
50
50
100
50
1300
100
100
1000
50
50
100
100
50
20
20
50
50
20
20
20
20
20
20
50
50
100
50
100
50
100
50
Sample
Size
20
20
20
40
40
20
20
20
20
20
60
20
20
80
20
20
20
20
40
10
10
20
20
10
10
10
10
10
20
20
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
1000
2000
4000
4000
1000
1000
1000
2000
1000
78000
2000
2000
80000
1000
1000
2000
2000
2000
200
200
1000
1000
200
200
200
200
200
400
1000
1000
2000
1000
2000
1000
2000
1000
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
Number
of
Cycles
50
50
50
50
50
50
100
Sample
Size
20
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
1000
1000
1000
1000
1000
1000
2000
Remark
TABLE 4H: Breakover Diode
#
Part Number
1
2
3
4
5
6
7
IXBOD1-06
IXBOD1-08
IXBOD1-08
IXBOD1-09
IXBOD1-10
IXBOD1-10
IXBOD2-14EPI
Date Code
or
Test #
3459
3079
4750
4042
2436
3722
2905
IXYS Semiconductor GmbH
31
Remark
HUMIDITY TEST (Tables 5A .. 5H)
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM160-0055 X2 SL
4542
2 GWM160-0055X1SL
2786
3 GWM160-0055X2 S
3455
4 GWM160-0055X2 SL
3580
5 IXA12IF1200HB
4411
6 IXA12IF1200TC
3543
7 IXA20PT1200LB
4363
8 IXA55I1200HJ
3743
9 IXA55I200HJ
2389
10 IXA60IF1200NA
2710
11 IXBF55N300
TP1243
12 IXBH10N300HV
TS1413
13 IXBH14N300HV
TS1414
14 IXBH16N170A
TP1221
15 IXBH20N360HV
TS1404
16 IXBH22N300HV
TS1421
17 IXBH40N160
3932
18 IXBP5N160G
2454
19 IXBT24N170
TP1202
20 IXBX28N300HV
TS1414
21 IXDH30N120D1
4975
22 IXDH35N60BD1
4973
23 IXDH35N60BD1
3161
24 IXDN75N120
2566
25 IXFB110N60P3
TS1412
26 IXFB132N50P3
TP1415
27 IXFB210N30P3
SP1224
28 IXFB40N110Q3
TP1405
29 IXFB60N80PK
TS1349
30 IXFB62N80Q3K
TS1349
31 IXFH120N25T
SP1141
32 IXFH150N17T
US1401
33 IXFH150N17T2
SS1341
34 IXFH150N20T
SP1147
35 IXFH160N15T
US1401
36 IXFH160N15T2
SS1319
37 IXFH16N50P3
SP1207
38 IXFH18N100Q3
SP1136
39 IXFH22N60P3
GS1429
40 IXFH26N50
TS1331
41 IXFH26N50P3
SS1206
42 IXFH26N50Q
TS1343
43 IXFH30N50P
SS1413
44 IXFH46N30T
US1408
45 IXFH50N50P3
SS1407
46 IXFH50N60P3
TS1414
47 IXFH52N50P2
GS1422
48 IXFH70N30Q3
SP1133
49 IXFH75N10
SS1219
50 IXFH76N15T2
US1406
51 IXFH7N100P
TP1143
52 IXFH94N30T
SP1141
53 IXFJ75N10
TS1219
54 IXFK120N25P
TP1239
55 IXFK40N90P
TP1434
56 IXFK40N90P
TP1444
57 IXFK44N80P
TP1219
58 IXFK64N50P
TP1242
IXYS Semiconductor GmbH
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
96
96
96
48
96
96
96
96
96
96
96
96
96
96
96
48
48
96
96
48
48
48
168
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
20
20
77
77
20
20
20
20
20
20
30
30
30
30
30
30
20
20
30
30
20
20
20
20
25
25
30
25
30
30
77
30
30
30
30
30
30
30
30
30
30
30
21
30
30
30
30
30
30
30
30
77
30
30
77
77
30
30
Failures
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
32
Device Hours
[hrs]
1920
1920
7392
7392
960
1920
1920
1920
1920
1920
I_CES increased
2880
2880
2880
2880
2880
2880
960
960
2880
2880
960
960
960
3360
2400
2400
2880
2400
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2016
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
7392
7392
2880
2880
Remark
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
59 IXFK80N60P3
SP1150
60 IXFK90N50P2
TP1333
61 IXFK90N50P2
TP1337
62 IXFK90N50P2
TP1406
63 IXFK94N50P2
SF1211
64 IXFK94N50P2
SP1111
65 IXFK98N50P3
SP1142
66 IXFN100N25
SS1309
67 IXFN120N20
SS1301
68 IXFN150N15
SS1309
69 IXFN360N10T
US1422
70 IXFN64N50P
TS1347
71 IXFN82N60P
SS1301
72 IXFN90N30
TS1309
73 IXFP110N15T2
SS1332
74 IXFP16N50P3
GS1419
75 IXFP180N10T2
SS1305
76 IXFP230N075T2
US1309
77 IXFP36N30P3
GS1419
78 IXFP5N50P3
SS1206
79 IXFQ94N30P3
SS1321
80 IXFT20N100P
TP1147
81 IXFT50N60P3
GP1443
82 IXFX120N25P
2746
83 IXFX140N25T
US1410
84 IXFX20N120P
TS1337
85 IXFX230N20T
US1408
86 IXFX44N80Q3
TP1226
87 IXFX64N60P3
TS1337
88 IXFX78N50P3
TS1337
89 IXFX80N50Q3
SP1106
90 IXGH100N30C3
SS1250
91 IXGH40N120B2D1
TP0940
92 IXGH48N60C3D1
TP1148
93 IXGH50N60C4
SP1133
94 IXGH72N60A3
TS1348
95 IXGK120N120B3
TP1143
96 IXKN75N60C
2955
97 IXLT2025
3914
98 IXTH02N450HV
TS1414
99 IXTH140N10P
TS1406
100 IXTH16P60P
TS1316
101 IXTH1N200P3
TP1338
102 IXTH1N200P3HV
TS1404
103 IXTH1N300P3HV
TS1404
104 IXTH1N450HV
TS1404
105 IXTH1R4N250P3HV
TS1413
106 IXTH200N10T
SP1208
107 IXTH200N10T
SP1319
108 IXTH20N65X
SS1344
109 IXTH20P50P
TP1309
110 IXTH2N150L
TP1317
111 IXTH32N65X
SS1346
112 IXTH3N120
TS1136
113 IXTH4N150
TS1151
114 IXTH64N65X
HS1417
115 IXTH80N075L2
TS1419
IXYS Semiconductor GmbH
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
48
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
77
77
77
77
30
77
25
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
80
30
30
30
30
30
30
30
30
30
30
30
30
30
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
33
Device Hours
[hrs]
7392
7392
7392
7392
2880
7392
2400
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
7680
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
960
1920
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
116 IXTH86N25T
UP1408
117 IXTH96P085T
SS1302
118 IXTK550N055T2
UP1242
119 IXTP100N04T2
SS1341
120 IXTP110N055T2
SS1332
121 IXTP130N10T
SS1318
122 IXTP200N055T2
US1310
123 IXTP200N055T2
US1310
124 IXTP200N055T2
US1414
125 IXTP20N65X
HS1332
126 IXTP260N055T2
SS1338
127 IXTP2N100P
TS1332
128 IXTP450P2
GS1352
129 IXTP450P2
GS1411
130 IXTP460P2
TS1332
131 IXTP460P2
GS1421
132 IXTP460P2
GS1421
133 IXTP50N28T
US1426
134 IXTP76P10T
TS1332
135 IXTP80N10T
SS1150
136 IXTP80N10T
SS1318
137 IXTQ200N10T
SS1125
138 IXTQ200N10T
SS1125
139 IXTQ44N50P
GS1408
140 IXTQ460P2
SS1236
141 IXTQ82N25P
TS1348
142 IXTT12N150
TP1206
143 IXTT140P10T
SP1142
144 IXTT6N150
TP1203
145 IXTX120P20T
SP1133
146 IXXH50N60B3D1
TP1150
147 IXXH60N65B4
SP1235
148 IXXH60N65C4
SP1236
149 IXYH30N450HV
TS1413
150 IXYH40N90C3
TS1205
151 IXYH60N90C3
SS1205
152 IXYH75N65C3
TS1341
153 IXYH80N90C3
TP1205
154 IXYN100N65C3H1
TS1346
155 IXYT20N120C3D1HV
TS1247
156 IXYX40N450HV
TS1414
157 MCB60I1200TZ
4913
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample
Size
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
77
30
30
30
30
30
30
30
30
30
30
30
30
30
10
Failures
TABLE 5B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MIX300/450
3751
2 MIXA150Q1200VA
3861
3 MIXA225PF1200TSF
3825
4 MIXA40WB1200TED
4543
5 MIXA40WB1200TED
4543
6 MIXA60WB1200TEH
2514
7 MIXA60WB1200TEH
4155
8 MIXA80WB1200TEH
4800
9 MIXA81WB1200TEH
4538
10 MIXD80PM650TMI
4249
11 MKI450-12E9
2636
12 MWI100-12E8
3676
13 VKM60-01P1
3589
14 VMM90-09F
3216
15 VMO1200-01F
2480
16 VWM270-0075X2
2825
Temp.
[°C]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
168
168
168
168
1000
Sample
Size
10
10
9
10
10
10
10
10
10
10
6
10
10
10
10
10
Failures
IXYS Semiconductor GmbH
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
34
Device Hours
[hrs]
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
960
Remark
Device Hours
[hrs]
960
10000
1512
10000
10000
10000
10000
10000
10000
10000
6000
1680
1680
1680
1680
10000
Remark
TABLE 5C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 CSM400A
2847
2 CSM400A
4851
3 MCC21-14io8
3885
4 MCC501-16io1
2415
5 MCD162
3465
6 MCD162-16
3471
7 MCD162-16io1
2482
8 MDD95-18N1B
4708
Temp.
[°C]
85
85
85
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
85
85
85
Time
[hrs]
1000
168
168
1000
1000
168
168
168
Sample
Size
10
10
10
3
5
10
10
20
Failures
TABLE 5D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 VGO36-14io7
2460
2 VUB116-16NOXT
4927
3 VUB145-16NOXT
4154
4 VUE22-06NO7
4027
5 VUO192-16NO7
2615
6 VUO36-16NO8
4916
7 VUO52-16NO1
2563
8 VUO52-16NO1
3887
9 VUO52-16NO1
3887
10 VVZB120-14io2
3902
11 VVZB135-16ioXT
4210
12 VVZB170ioXT
4590
Temp.
[°C]
85
85
85
85
85
85
85
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
168
1000
1000
168
1000
168
168
1000
1000
168
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
Failures
Temp.
[°C]
85
85
85
85
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
85
85
85
85
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
1000
1000
168
168
96
96
48
96
96
96
96
96
96
96
96
96
48
48
96
48
96
48
48
48
48
168
96
48
48
48
96
Sample
Size
10
10
10
10
20
20
20
20
20
20
20
77
40
20
20
40
20
20
40
20
20
20
20
20
20
20
20
20
20
20
40
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
10000
1680
1680
3000
5000
1680
1680
3360
Remark
Device Hours
[hrs]
1680
10000
10000
1680
10000
1680
1680
10000
10000
1680
1680
1680
Remark
Device Hours
[hrs]
10000
10000
1680
1680
1920
1920
960
1920
1920
1920
1920
7392
3840
1920
1920
3840
960
960
3840
960
1920
960
960
960
960
3360
1920
960
960
960
3840
Remark
TABLE 5E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
MEE250-12DA "H"
MEE250-12DA "H"
MEO450-12
MEO500-06DA
DHG100x1200NA
DHG20I1200PA
DHG40C1200HB
DHG60I1200HA
DHG60I600HA
DPF60C300HB
DPG30C400HB
DPG60B600LB
DPG60C300HB
DPG80C400HB
DSEC120-12AK
DSEC29-06AC
DSEC60-06B
DSEE55-24N1F
DSEI12-12A
DSEI2x101-12A
DSEI2x101-12A
DSEI2x31-12B
DSEI2x61-12B
DSEI30-06A
DSEI60-06A
DSEI60-10A
DSEP15-06A
DSEP15-12CR
DSEP29-06B
DSEP30-06BR
DSEP60-06A
Date Code
or
Test #
3886
3886
4202
3963
4646
4620
3811
2518
4513
2395
2831
4409
3957
2396
4438
4429
3095
2627
4545
3222
3325
4951
3953
2949
4845
2439
3002
3097
4060
4032
2830
IXYS Semiconductor GmbH
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
35
TABLE 5F: Schottky Diode
Date Code
or
Test #
3192
4047
2456
4846
4658
2772
4977
3790
3351
4763
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
48
48
48
48
96
48
96
48
48
Sample
Size
20
20
20
20
20
20
20
20
20
20
Failures
TABLE 5G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 DLA20IM800PC
2291
2 DSP45-12A
2455
3 CLA30E1200PC
2657
4 DSP25-16A
2950
5 CS60-16io1
2960
6 DSDI60-16A
3342
7 DSP45-16AR
3605
8 DSI30-12A
3611
9 DSP26-16AT
3835
10 DSA1-16D
4440
11 DSP45-12A
4760
12 DSA1-16D
4938
13 DSI45-16A
4971
Temp.
[°C]
121
121
121
121
121
121
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
96
48
96
48
96
48
48
48
96
96
48
96
48
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
40
20
Failures
Temp.
[°C]
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
Time
[hrs]
48
48
48
48
48
48
96
Sample
Size
20
20
20
20
20
20
20
Failures
#
Part Number
1
2
3
4
5
6
7
8
9
10
DSA30C100PB
DSA30C200PB
DSA60C100PB
DSA90C200HB
DSB40C15PB
DSSK60-015AR
DSSK60-015AR
DSSK60-02A
DSSK80-006B
DSSS35-008AR
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1920
960
960
960
960
1920
960
1920
960
960
Remark
Device Hours
[hrs]
1920
960
1920
960
1920
960
960
960
1920
1920
960
3840
960
Remark
Device Hours
[hrs]
960
960
960
960
960
960
1920
Remark
TABLE 5H: Breakover diode
#
Part Number
1
2
3
4
5
6
7
IXBOD1-06
IXBOD1-08
IXBOD1-08
IXBOD1-09
IXBOD1-10
IXBOD1-10
IXBOD2-14EPI
Date Code
or
Test #
3460
3079
4748
4040
2436
3723
2905
IXYS Semiconductor GmbH
0
0
0
0
0
0
0
36
H³TRB TEST (Table 6A … 6C)
TABLE 6A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 GWM160-0055X2 S
3455
2 GWM160-0055X2 SL
3580
3 IEA21PG1200LA
2805
4 IXA20PG1200DHG LB
3581
5 IXA20SV1200DHGLA
3211
6 IXTN15N100
2819
Voltage
[V]
44
44
100
80
80
100
Temp.
[°C]
85
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
85
Time
[hrs]
1000
1000
1000
1000
1000
1000
Sample Failures
Size
77
0
77
0
20
0
20
0
20
0
80
0
Device Hours
[hrs]
77000
77000
20000
20000
20000
80000
Remark
TABLE 6B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MIXA100W1200TEH
3248
2 MIXD50W650TED
4420
Voltage
[V]
100
100
Temp.
[°C]
85
85
Rel. H.
[%]
85
85
Time
[hrs]
1000
1000
Sample Failures
Size
10
0
10
0
Device Hours
[hrs]
10000
10000
Remark
TABLE 6C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 CSM401B
3377
2 MCC255-16io1
4055
Voltage
[V]
100
100
Temp.
[°C]
85
85
Rel. H.
[%]
85
85
Time
[hrs]
1000
1000
Sample Failures
Size
10
0
10
0
Device Hours
[hrs]
10000
10000
Remark
Voltage
[V]
Temp.
[°C]
Rel. H.
[%]
Time
[hrs]
Sample Failures
Size
Device Hours
[hrs]
Remark
Date Code
or
Test #
2518
4409
Voltage
[V]
100
100
Temp.
[°C]
85
85
Rel. H.
[%]
85
85
Time
[hrs]
1000
1000
Sample Failures
Size
20
0
77
0
Device Hours
[hrs]
20000
77000
Remark
Date Code
or
Test #
Voltage
[V]
Temp.
[°C]
Rel. H.
[%]
Time
[hrs]
Sample Failures
Size
Device Hours
[hrs]
Remark
Voltage
[V]
100
Temp.
[°C]
85
Rel. H.
[%]
85
Time
[hrs]
1000
Sample Failures
Size
77
0
Device Hours
[hrs]
77000
Remark
TABLE 6D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1
2
TABLE 6E: FRED
#
Part Number
1
2
DHG60I1200HA
DPG60B600LB
TABLE 6F: Schottky Diode
#
Part Number
1
2
TABLE 6G: Thyristor/Diode single device
Date Code
# Part Number
or
Test #
1 DLA100B1200LB
4351
2
TABLE 7A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 IXFT18N90P
SP0837
2 IXFB100N50P
TP1110
3 IXFK80N60P3
SP1150
4 IXGH40N120B2D1
TP0940
5 IXTV03N400S
TP1134
6 IXTP80N10T
SS1150
7 IXFH150N20T
SP1147
8 IXFT20N100P
TP1147
9 IXFH18N90P
TP1202
10 IXXH50N60B3D1
TP1150
11 IXTH3N120
TS1136
12 IXFP14N60P3
SS1144
13 IXTA80N10T
SS1150
14 IXFP4N60P3
SS1143
15 IXFP7N60P3
SS1143
16 IXTH4N150
TS1151
17 IXTH4N150
TP1149
18 IXBT24N170
TP1202
19 IXTT6N150
TP1203
20 IXSH45N120
TP1204
21 IXYH40N90C3
TS1205
22 IXYH60N90C3
SS1205
23 IXGF25N250
TP1206
24 IXTH200N10T
SP1208
25 IXFH15N100P
TP1202
26 IXFB110N60P3
SP1201
27 IXFH50N60P3
SP1201
28 IXGA24N170A
TS1215
29 IXFH26N50P3
SS1206
30 IXFP5N50P3
SS1206
31 IXFH16N50P3
SP1207
32 IXFK420N10T
SP1217
33 IXFH75N10
SS1219
34 IXFK94N50P2
SS1222
35 IXFK94N50P2
SS1222
36 IXFK94N50P2
SS1222
37 IXTH6N150
TP1201
38 IXTA02N250
TS1222
39 IXGA20N250HV
TS1222
40 IXFX32N100Q3
TP1229
41 IXFB210N30P3
SP1224
42 IXFN32N120P
TP1230
43 IXFN38N100P
TP1230
44 IXFH88N30P
TP1237
45 IXTL2N450
TP1239
46 IXTK550N055T2
UP1242
47 IXBF55N300
TP1243
48 IXYT20N120C3D1HV
TS1247
49 IXXH60N65B4
SP1235
50 IXXH60N65C4
SP1236
51 IXXH110N65C4
SS1302
52 IXTH96P085T
SS1302
53 IXFN120N20
SS1301
54 IXFP180N10T2
SS1305
55 IXGH40N60A
TP1304
56 IXTH20P50P
TP1309
57 IXFN90N30
TS1309
58 IXFN100N25
SS1309
59 IXFN150N15
SS1309
60 IXTP200N055T2
US1310
Voltage
[V]
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
Temp.
[°C]
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample Failures
Size
30
0
30
0
25
0
30
0
30
0
30
0
30
0
30
0
77
0
30
0
30
0
30
0
77
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
20
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
Device Hours
[hrs]
2880
2880
2400
2880
2880
2880
2880
2880
7392
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
1920
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 7A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
61 IXFP230N075T2
SS1309
62 IXFP170N075T2
US1310
63 IXFN48N50Q
SP1304
64 IXFN210N30P3
SP1223
65 IXFN80N50
SP1312
66 IXTH16P60P
TS1316
67 IXTP80N10T
SS1318
68 IXTP130N10T
SS1318
69 IXTH200N10T
SP1319
70 IXFH160N15T2
SS1319
71 IXXH80N65B4H1
SP1319
72 IXFQ94N30P3
SS1321
73 IXBF12N300
TP1218
74 IXBF15N300C
TP1313
75 IXFP22N60P3
TS1324
76 IXFH22N60P3
TS1326
77 IXFX140N30P
TS1330
78 IXFX90N50P2
TP1330
79 IXFK140N30P
TP1330
80 IXFK90N50P2
TP1330
81 IXTP20N65X
HS1332
82 IXFP110N15T2
SS1332
83 IXTP76P10T
TS1332
84 IXTP460P2
TS1332
85 IXFK90N50P2
TP1333
86 IXFN48N60P
SS1333
87 IXFN48N60P
SS1333
88 IXFN64N50P
TS1333
89 IXFX78N50P3
TS1337
90 IXFN64N50P
TS1333
91 IXFX64N60P3
SS1335
92 IXTP260N055T2
SS1338
93 IXFX20N120P
TS1337
94 IXTH1N200P3
TP1338
95 IXFK90N50P2
TP1137
96 IXFH150N17T2
SS1341
97 IXBH16N170A
TP1221
98 IXTP100N04T2
SS1341
99 IXTP110N055T2
SS1332
100 IXTH20N65X
SS1344
101 IXFK420N10T
SP1347
102 IXFN64N50P
TS1347
103 IXTP02N120P
TS1307
104 IXFH12N90
TS1344
105 IXFB60N80PK
TS1349
106 IXTP2N100P
TS1332
107 IXFH26N50
TS1331
108 IXFH26N50Q
TS1343
109 IXTH32N65X
SS1346
110 IXFP110N15T2
US1351
111 IXTH1N200P3HV
TS1404
112 IXTH1N300P3HV
TS1404
113 IXTH1N450HV
TS1404
114 IXFH12N90
TP1310
115 IXTH140N10P
TS1406
116 IXBH20N360HV
TS1404
Voltage
[V]
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
32
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
Temp.
[°C]
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample Failures
Size
30
0
30
0
30
0
30
0
10
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
25
0
25
0
30
0
30
0
30
0
30
0
77
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
77
0
30
0
30
0
30
0
30
0
30
0
22
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
Device Hours
[hrs]
2880
2880
2880
2880
960
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2400
2400
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2112
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
Remark
TABLE 7A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
117 IXTP450P2
GS1352
118 IXTP450P2
GS1411
119 IXFH150N17T
US1401
120 IXFH160N15T
US1401
121 IXFH76N15T2
US1406
122 IXFK90N50P2
TP1406
123 IXFX230N20T
US1408
124 IXTQ44N50P
GS1408
125 IXFH60N50P3
GS1408
126 IXTQ82N25P
TS1348
127 IXTH02N450HV
TS1414
128 IXTP200N055T2
US1414
129 IXFX140N25T
US1410
130 IXFH50N60P3
TS1414
131 IXFH46N30T
US1408
132 IXBH10N300HV
TS1413
133 IXTH1R4N250P3HV
TS1413
134 IXFX160N30T
SS1339
135 IXYH30N450HV
TS1413
136 IXTH86N25T
UP1408
137 IXYX40N450HV
TS1414
138 IXFN360N10T
US1422
139 IXBX50N360HV
TS1414
140 IXTH2N150L
TP1317
141 IXBX28N300HV
TS1414
142 IXBH14N300HV
TS1414
143 IXFH52N50P2
GS1422
144 IXFP16N50P3
GS1419
145 IXTH80N075L2
TS1419
146 IXTH64N65X
HS1417
147 IXFH50N60P3
GP1428
148 IXBH22N300HV
TS1421
149 IXFH50N50P3
SS1407
150 IXTP50N28T
US1426
151 IXFH22N60P3
SG1429
152 IXTP460P2
GS1421
153 IXTP460P2
GS1421
154 IXFK40N90P
TP1434
155 IXFK40N90P
TP1444
156 IXFP36N30P3
GS1419
157 IXFT50N60P3
GP1443
158 IXTH20N65X
HS1440
159 IXTH32N60X
HS1440
160 IXTH20N60X
HS1440
161 IXFB40N110Q3
TP1420
162 IXGR72N60A3H1
TP1352
163 IXFH30N50P
SS1413
Voltage
[V]
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
42
Temp.
[°C]
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
130
Rel. H.
[%]
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
85
Time
[hrs]
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
96
Sample Failures
Size
30
0
30
0
30
0
30
0
30
0
77
0
30
0
30
0
30
0
30
0
30
0
77
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
30
0
77
0
77
0
30
0
77
0
30
0
30
0
30
0
30
0
21
0
27
0
Device Hours
[hrs]
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
7392
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
2880
7392
7392
2880
7392
2880
2880
2880
2880
2016
2592
Remark