Reliability Data Report Product Family R414 LTC2050 / LTC2051 / LTC2052 / LTC2053 Reliability Data Report Report Number: R414 Report generated on: Mon Feb 01 11:45:54 PST 2016 OPERATING LIFE TEST PACKAGE TYPE SOIC/MSOP SOT Totals SAMPLE SIZE 850 2052 2,902 OLDEST DATE NEWEST DATE K DEVICE HRS 1 No. of FAILURES 2,3 CODE CODE (+125°C) 9927 1118 - 1333 1451 - 580 386 966 0 0 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE QFN/DFN 226 CODE CODE 0231 SSOP/TSSOP SOIC/MSOP 0521 35 0 50 4191 0025 9946 0025 1407 21 488 0 0 SOT Totals 9032 13,499 0110 - 1416 - 217 761 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE CYCLES QFN/DFN SSOP/TSSOP 227 50 0231 0025 0521 0025 92 52 0 0 SOIC/MSOP SOT 6759 8827 9946 0110 1407 1416 1555 882 0 0 Totals 15,863 - - 2,581 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE CYCLES QFN/DFN SSOP/TSSOP SOIC/MSOP 175 50 2970 0231 0025 9948 0521 0025 1407 90 51 1046 0 0 0 SOT Totals 9218 12,413 0110 - 1416 - 921 2,108 0 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE HIGH TEMPERATURE BAKE AT 175 DEG C PACKAGE TYPE SAMPLE SIZE SOIC/MSOP 417 0951 1335 417 0 Totals 417 - - 417 0 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =12.27 FITS (3) Mean Time Between Failure in Years = 9306.56 Note: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL1 Preconditioning