Reliability Data Report Product Family R575 LTC3350 Reliability Data Report Report Number: R575 Report generated on: Tue Feb 09 17:43:10 PST 2016 OPERATING LIFE TEST PACKAGE TYPE QFN/DFN Totals SAMPLE SIZE 231 231 OLDEST DATE NEWEST DATE K DEVICE HRS CODE CODE (+125°C) 1149 - 1149 - 231 231 1 No. of FAILURES 2,3 0 0 HIGHLY ACCELERATED STRESS TEST AT +130 DEG C / 85% RH PACKAGE TYPE QFN/DFN Totals SAMPLE SIZE 76 76 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES 4 CODE CODE (+85°C) 1410 - 1410 - 291 291 0 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN 141 Totals 141 OLDEST DATE NEWEST DATE CODE CODE 1317 1334 47 0 - - 47 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CODE CODE CYCLES 1317 - 1334 - 154 154 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE QFN/DFN Totals SAMPLE SIZE 154 154 THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE CYCLES QFN/DFN 153 1317 1334 153 0 Totals 153 - - 153 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE 1317 - 1334 - 154 154 0 0 HIGH TEMPERATURE BAKE AT 175 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN Totals 154 154 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =51.29 FITS (3) Mean Time Between Failure in Years = 2225.48 (4) Assumes 20X Acceleration from 85 °C to +130 °C Note: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL1 Preconditioning