NB3N65027DTGEVB NB3N65027 Evaluation Board User's Manual http://onsemi.com EVAL BOARD USER’S MANUAL Device Name: NB3N65027DT (QSOP20) Board Name: NB3N65027DTGEVB Introduction NB3N65027 device is a 3.3 V Programmable 3 PLL Clock Synthesizer with 6 LVTTL / LVCMOS Outputs w/OE. ON Semiconductor has developed an evaluation board NB3N65027DTGEVB for the NB3N65027 in 20L QSOP (150 mil) package. The evaluation board NB3N65027DTGEVB is offered as a convenience for the customers interested in performing their own engineering assessment on the general performance of NB3N65027. This evaluation board manual contains: • Information on 20L QSOP (150 mil) Evaluation Board • Evaluation board Circuit Schematic • Bill of Materials ACS0 BSC1 This manual should be used in conjunction with the device data sheet, which contains full technical details on the device specifications and operation. Description Evaluation board for testing NB3N65027 in 20L QSOP (150 mil) is a 2” x 2”, 4 layer board with dedicated VDD and GND planes. The top and bottom view of the assembled Evaluation board is shown in Figure 1 and Figure 2. Top and bottom view of the bare printed circuit board (PCB) is shown in Figure 3 and Figure 4. BCS0 GND REFOUT 25MHz Xtal XIN CLKA1 CLKC1 CLKA2 OE ACS1 CLKC2 CLKB2 VDD CLKB1 CCS GND Figure 1. Evaluation Board top View © Semiconductor Components Industries, LLC, 2014 June, 2014 − Rev. 1 Figure 2. Evaluation Board Bottom View 1 Publication Order Number: EVBUM2004/D NB3N65027DTGEVB Figure 3. Evaluation Board top View (Bare PCB) Figure 4. Evaluation Board bottom View (Bare PCB) The state of signal Output Enable (OE) is controlled through 3−pin through hole header OE. The state of control pins ACS0, ACS1, BCS0, BCS1 and CCS are controlled through 3−pin through hole headers of the same name. The selected states of the signals determine the output clocks on CLKA1, CLKA2, CLKB1, CLKB2, CLKC1, and CLKC2 as per the clock selection table. Output clocks REFOUT, CLKA1, CLKA2, CLKB1, CLKB2, CLKC1, and CLKC2 can be monitored at 2−pin through hole headers REFOUT, CLKA1, CLKA2, CLKB1, CLKB2, CLKC1, and CLKC2 respectively, provided close to device. Resistors R1 ~ R7 are the Series terminating resistors on the output clocks. The general performance of NB3N65027 on the evaluation board can be tested using the list of instruments mentioned in the manual. The Schematic of the Evaluation board is shown in Figure 5. The bill of material for the Evaluation board is shown in Table 1. Test and Measurement Set−up and Procedure Power supply is fed to the board through VDD and GND terminals. C6, C7, and C8 are the decoupling capacitors for the power supply into the board. Decoupling capacitors C1 and C2 are provided close to the device on VDD1, while C3 and C4 are provided close to device on VDD2 respectively. Crystal Y1, capacitors C5 and C9 provide the crystal interface to the device at X1 and X2. The values of C5 and C9 are chosen based on the load capacitance (CL) of the crystal used. When Crystal interface is used, XIN, R9 and R10 are not mounted. When crystal interface is not used, clock can be fed from an external source using XIN and R10. R9 is used for output termination of the clock source. http://onsemi.com 2 NB3N65027DTGEVB NB3N65027DTGEVB EVALUATION BOARD SCHEMATIC Figure 5. NB3N65027DTGEVB Evaluation Board Schematic LIST OF INSTRUMENTS 3. Probes: P7260, 6GHz single ended Active Probe 4. Power Supply: Agilent 6624A DC (or equivalent) 5. Digital Voltmeter: Agilent 34410A or 34401 (or equivalent) 1. Signal Generator: Agilent 81110A (or equivalent) if Input Clock is from External Source 2. Oscilloscope: Tektronix TDS7704B (or equivalent) http://onsemi.com 3 NB3N65027DTGEVB BILL OF MATERIAL Table 1. NB3N65027DTGEVB EVALUATION BOARD REV. A BILL OF MATERIAL Item Qty Reference Part Description Size Vendor Vendor Part Number 1 6 BCS1, ACS1, OE, CCS, BCS0, ACS0 3 Pin Header Through Hole HEADER 2.54 mm Samtec TSW−116−11−G−S 2 7 CLKA1, CLKA2, CLKB1, CLKB2, CLKC1, CLKC2, REFOUT 2 Pin Header Through Hole HEADER 2.54 mm Samtec TSW−116−11−G−S 3 3 C1,C3,C8 0.1 mF CAP 0.1 mF 16 V 5% 0402 SMD 0402 Walsin 0402B104K160CT 4 3 C2,C4,C6 0.01 mF CAP 0.01 mF 50 V 5% 0402 SMD 0402 Walsin 0402B103K500CT 5 2 C5,C9 27 pF CAP 27 pF 50 V 5% 0402 SMD 0402 Walsin 0402N270J500LT 6 1 C7 22 mF CAP 22 mF 16 V 5% 6032 SMD 6032 AVX TAJC226K016R 7 7 C10, C11, C12, C13, C14, C15, C16 15 pF CAP 15 pF 50 V 5% 0402 SMD 0402 Walsin 0402N150J500LT 9 7 R1,R2,R3,R4, R5,R6,R7 22E RES 22 W 1/16W 5% 0402 SMD 0402 Walsin WR04X220JTL 10 1 R9 50E RES 50 W 1/16W 5% 0402 SMD 0402 Walsin WR04X500JTL 11 1 R10 0E RES 0 W 1/16W 0402 SMD 0402 Walsin 12 1 U1 NB3N65027 NB3N65027 20L QSOP Device QSOP_20 ON Semicondcutor NB3N65027DTR2G 13 1 XIN SMA 4 Pin SMA Jack Samtec SMA−J−P−H−ST−TH1 14 1 Y1 Crystal 25 MHz, 2 pin Crystal Crystal_ HC45U or UM1 or equivalent Andhra Electronics Limited UM12GH3G118P025M000000 15 2 TP1, TP2 Test Point Miniature SMT Test Point 2.7 mm x 1 mm x 1.5 mm DigiKey 5015KTR−ND 8 Remarks VDD,GND DNP DNP ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). 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