NB3N65027 3.3V Programmable 3-PLL Clock Synthesizer with 6 LVTTL/LVCMOS Outputs w/OE The NB3N65027 is a LVCMOS PLL−synthesized clock generator. It accepts a 10 MHz to 27 MHz clock or fundamental mode crystal as the reference source and drives three independent, low noise phase−locked loops (PLLs). Control lines ACSx, BCSx and CCS will select their appropriate bank output frequencies. ACS1 and BCS1 are two−level LVTTL/LVCMOS inputs, High and Low. ACS0, BCS0 and CCS are three−level LVCMOS inputs, High, Mid and Low. The NB3N65027 has three independent LVTTL/LVCMOS output banks of two outputs each. Banks A and B offer a 1X and a 1/2X output. Using a 25 MHz crystal, the selectable output frequencies range from 16 2/3 MHz to 133 1/3 MHz. A 12.5 MHz crystal offers from 8 1/3 MHz to 66 2/3 MHz. In addition, the NB3N65027 will generate a buffered reference LVTTL/LVCMOS output, REFOUT, 10 MHz to 27 MHz. See Tables 2 through 9 for the variety of available output frequencies. The OE pin, when set LOW, will disable the output drivers to high impedance. The NB3N65027 operates from a single +3.3 V supply across the operating temperature range from −40°C to +85°C, and is offered in a QSOP−20 RoHS compliant package. The NB3N65027 provides the optimum combination of low cost, flexibility, and high performance for Network, PCI and SDRAM applications. Features • 12.5 MHz or 25 MHz Fundamental Crystal or Clock • • • • • • • • Input Six Output Clocks with Selectable Frequencies Buffered Crystal Reference Output SDRAM Frequencies of 67, 83, 100, and 133 MHz LVCMOS with 25 mA Output Drive Capability at TTL Levels http://onsemi.com MARKING DIAGRAM 3N65027 AWLYWWG QSOP20 CASE 492AC 3N65027 A WL Y WW G = Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 6 of this data sheet. Operating Range: VCC = 3.3 V ±10% QSOP−20 Package, 150 mil −40°C to +85°C Ambient Operating Temperature These Devices are Pb−Free and are RoHS Compliant VDD CLKA1 PLLA ACS1 ACS0 PLLB BCS1 BCS0 CCS CLKB1 CLKB2 B2 X1/ICLK PLLC CLKC1 Clock Synthesis and Control Circuitry CLKC2 Buffer / Oscillator 25 or 12.5 MHz crystal or clock X2 CLX2 REFOUT CLX1 GND Figure 1. Simplified Logic Diagram © Semiconductor Components Industries, LLC, 2011 June, 2011 − Rev. 2 CLKA2 B2 1 OE (all outputs) Publication Order Number: NB3N65027/D NB3N65027 ACS0 1 20 BCS1 X2 2 19 BCS0 X1/ICLK 3 18 REFOUT CLKA1 VDD 4 17 ACS1 5 16 VDD GND 6 15 OE CLKC1 7 14 GND CLKC2 8 13 CLKA2 CLKB2 9 12 NC CLKB1 10 11 CCS Figure 2. Pinout: QSOP−20 (Top View) Table 1. PIN DESCRIPTION (Note 1) Pin Number Pin Name Pin Type 1 ACS0 Tri−Level Input 2 X2 Input Crystal connection. Connect to a fundamental crystal or leave unconnected for a clock input. 3 X1/ICLK Input Crystal or Clock input connection. If a clock input is used, drive it into X1 and leave X2 unconnected. 4 VDD Power 5 ACS1 Two−Level Input Pin Description A Clock Select 0. Selects outputs on CLKA1 and CLKA2 per table on page 3. Connect to +3.3 V. Must be the same as pin 16. A Clock Select 1. Selects outputs on CLKA1 and CLKA2 per table on page 3. Internal pull−up. 6 GND Power Connect to ground. 7 CLKC1 Output Output Clock C1. Depends on setting of CCS per table on page 3. 8 CLKC2 Output Output Clock C2. Depends on setting of CCS per table on page 3. Same as CLKC1. 9 CLKB2 Output Output Clock B2. Depends on setting of BCS1, 0 per table on page 3. 10 CLKB1 Output Output Clock B1. Depends on setting of BCS1, 0 per table on page 3. 11 CCS Tri−Level Input Clock C select pin. Selects outputs on CLKC1 and CLKC2 per table on page 3. 12 NC − 13 CLKA2 Output No Connect Output Clock A2. Depends on setting of ACS1, 0 per table on page 3. 14 GND Power Connect to ground. 15 OE Input 16 VDD Power Connect to +3.3 V. Must be the same as pin 4. 17 CLKA1 Output Output Clock A1. Depends on setting of ACS1, 0 per table on page 3. 18 REFOUT Output Buffered reference clock output. Same frequency as crystal or clock input. 19 BCS0 Tri−Level Input 20 BCS1 Two−Level Input Output enable. Tri−states all outputs when low. Internal pull−up. B Clock Select 0. Selects outputs on CLKB1 and CLKB2 per table on page 3. B Clock Select 1. Selects outputs on CLKB1 and CLKB2 per table on page 3. Internal pull−up. 1. All VDD and GND pins must be externally connected to a power supply for proper operation. http://onsemi.com 2 NB3N65027 FOR A 25 MHz FUNDAMENTAL CRYSTAL OR CLOCK INPUT, THE FOLLOWING FOUR TABLES APPLY: Table 2. A CLOCKS SELECT TABLE (outputs in MHz) Table 4. C Clocks Select Table (outputs in MHz) CCS CLKC1 CLKC2 ACS1 ACS0 CLKA1 CLKA2 0 125 125 0 0 100 off (low) M Test Test 0 M Test Test 1 75 75 0 1 75 off (low) 1 0 33.3333 16.6667 1 M Test Test Table 5. REFERENCE OUTPUT CLOCK FREQUENCY (in MHz) 1 1 66.6667 33.3333 REFOUT 25 Table 3. B CLOCKS SELECT TABLE (outputs in MHz) BCS1 BCS0 CLKB1 CLKB2 0 0 Test Test 0 M 66.6667 33.3333 0 1 100 50 1 0 83.3333 41.6667 1 M Test Test 1 1 133.3333 66.6667 FOR A 12.5 MHz FUNDAMENTAL CRYSTAL OR CLOCK INPUT, THE FOLLOWING FOUR TABLES APPLY: Table 6. A CLOCKS SELECT TABLE (outputs in MHz) ACS1 ACS0 CLKA1 CLKA2 Table 8. C CLOCKS SELECT TABLE (outputs in MHz) CCS CLKC1 CLKC2 0 0 50 off (low) 0 62.5 62.5 0 M Test Test M Test Test 0 1 37.5 off (low) 1 37.5 37.5 1 0 16.6667 8.3333 1 M Test Test 1 1 33.3333 16.6667 Table 9. REFERENCE OUTPUT CLOCK FREQUENCY (in MHz) REFOUT 12.5 Table 7. B CLOCKS SELECT TABLE (outputs in MHz) BCS1 BCS0 CLKB1 CLKB2 0 0 Test Test 0 M 33.3333 16.6667 0 1 50 25 1 0 41.6667 20.8333 1 M Test Test 1 1 66.6667 33.3333 0 = connect directly to GND M = leave unconnected (automatically self biases to VDD/2) 1 = connect directly to VDD http://onsemi.com 3 NB3N65027 Table 10. ATTRIBUTES Characteristics Value ESD Protection Human Body Model Machine Model > 2 kV > 200 V BCS1, OE ACS1 430 kW 120 kW RPU − Internal Input Pull−up Resistor ZOUT − Nominal Output Impedance 20 W Moisture Sensitivity (Note 2) QSOP−20 Flammability Rating Oxygen Index: 28 to 34 Level 1 UL 94 V−0 @ 0.125 in Transistor Count 16700 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 2. For additional information, see Application Note AND8003/D. Table 11. MAXIMUM RATINGS Symbol Parameter Condition 1 Rating Unit VDD Positive Power Supply GND = 0 V 4.5 V VIO All Inputs and Outputs GND = 0 V −0.5 to VDD +0.5 V TA Operating Temperature Range −40 to +85 °C Tstg Storage Temperature Range θJA Thermal Resistance (Junction−to−Ambient) (Note 3) θJC Thermal Resistance (Junction−to−Case) (Note 3) Tsol Wave Solder Tempearture − Pb−Free 0 lfpm 1 m/s air flow 3 m/s air flow v 20 sec −65 to +150 °C 135 typ 93 typ 78 typ °C/W °C/W °C/W 60 typ °C/W 260 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 3. JEDEC standard multilayer board – 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad. http://onsemi.com 4 NB3N65027 Table 12. DC CHARACTERISTICS VDD = 3.3V $10%, GND = 0 V, TA = −40°C to +85°C Symbol Characteristic Min Typ Max Unit 3.0 3.3 3.6 V 40 60 mA POWER SUPPLY VDD Power Supply Voltage; GND = 0 V IDD Power Supply Current for VDD (Inputs and Outputs Open) OUTPUTS VOH Output HIGH Voltage; VDD = 3.3V VOL Output LOW Voltage; IOS Output Short Circuit Current, Each Output IOH = −25 mA IOH = −8mA 2.4 VDD – 0.4 V IOL = 25 mA 0.8 V mA ±50 X1/CLK INPUT PIN, ONLY VIH Input HIGH Voltage VIL Input LOW Voltage VDD / 2 + 1 V VDD / 2 − 1 V TRI−LEVEL TYPE INPUTS: ACS0, BCS0, CCS VIH Input HIGH Voltage VIL Input LOW Voltage VDD – 0.5 V 0.5 V TWO−LEVEL TYPE INPUTS: ACS1, BCS1, OE VIH Input HIGH Voltage VIL Input LOW Voltage 2.0 V 0.8 V NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. Table 13. AC CHARACTERISTICS VDD = 3.3V $10%, GND = 0 V, TA = −40°C to +85°C Symbol Characteristic Min Typ Max Unit fIN Input Frequency, Crystal or Clock 10 12.5 or 25 27 MHz tDC Output Clock Duty Cycle at VDD/2, 15 pF Load 40 50 60 % 0 ppm 1.5 ns Frequency Error, all clocks, 15 pF Load tor,, tof Output Rise/Fall Times; 0.8 V to 2.0 V, 15 pF Load Absolute Jitter, short−term; variation from mean, 15 pF Load $120 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. http://onsemi.com 5 NB3N65027 External Components Where: CL = Crystal Spec Load Capacitance CL1 = X1 Pin Total Load Capacitance CL2 = X2 Pin Total Load Capacitance 2. If CL = 18 pF, then CL1 = CL2 = 2CL, or 36 pF. Stray capacitance, CLS1 and CLS2, must be considered and subtracted from each total load capacitance, CL1 and CL2. Furthermore: CL1 = CLX1 + CLS1 CL2 = CLX2 + CLS2 Where: CLX1 = Load Capacitor Board Component for CL1 CLX2 = Load Capacitor Board Component for CL2 CLS1 = Stray Load Capacitance at X1 CLS2 = Stray Load Capacitance at X2 As an example, for 4 pF of stray capacitance, CLS1 = CLS2 = 4 pF, then, Board Component Capacitors CLX1 = CLX2 = 2CL – CLS(1or2), or 36 pF – 4 pF = 32 pF. The NB3N65027 requires a minimum number of external components for proper operation. Decoupling Capacitor Decoupling capacitors of 0.01 mF must be connected between each VDD and GND (pins 4 and 6, pins 16 and 14), as close to the device as possible. For optimum device performance, the decoupling capacitor should be mounted on the component side of the PCB. Avoid the use of vias in the decoupling circuit. Series Termination Resistor When the PCB trace between the clock outputs and the loads are over 1 inch, series termination should be used. To series terminate a 50 W trace (a commonly used trace impedance), place a 33 W resistor in series with the clock line as close to the clock output pin as possible. The nominal impedance of the clock output is 20 W. Crystal Information The crystal used should be a fundamental mode (do not use third overtone), parallel resonant. Crystal load capacitors should be connected from pins X1 to ground and X2 to ground to optimize the frequency accuracy, See Figure 1. A crystal in parallel resonance will require the spec CL as a balanced loading for each side of the crystal, so CL is distributed in two equal series load caps, CL1 and CL2. All stray and additional capacitance must be subtracted from this total loading. 1. Crystal load capacitance, CL, is: CL + ǒ C L1 @ C L2 Table 14. RECOMMENDED CRYSTAL PARAMETERS Parameter Value Crystal Cut Fundamental AT Cut Resonance Parallel Resonance Load Capacitance 18 pF Operating Range −40 to +85°C Shunt Capacitance 5 pF Max Equivalent Series Resistance (ESR) Correlation Drive Level Ǔ 50 W Max 1.0 mW Max C L1 ) C L2 ORDERING INFORMATION Package Shipping† NB3N65027DTG QSOP20 (Pb−Free) 55 Units / Rail NB3N65027DTR2G QSOP20 (Pb−Free) 2500 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 6 NB3N65027 PACKAGE DIMENSIONS QSOP20 CASE 492AC−01 ISSUE O 2X NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: INCHES. 3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. 4. DIMENSION D DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS. MOLD FLASH, PROTRUSIONS, OR GATE BURRS SHALL NOT EX CEED 0.005 PER SIDE. DIMENSION E1 DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. IN TERLEAD FLASH OR PROTRUSION SHALL NOT EX CEED 0.005 PER SIDE. D AND E1 ARE DETERMINED AT DATUM H. 5. DATUMS A AND B ARE DETERMINED AT DATUM H. 0.004 C D D 20 A L2 D 11 GAUGE PLANE SEATING PLANE E E1 C L C DETAIL A 2X 2X 10 TIPS 0.004 C D 1 10 20X e B b 0.007 0.004 C M C A-B D A2 0.004 C 20X 0.008 C D A1 C h x 45 _ H A SEATING PLANE DETAIL A M DIM A A1 A2 b c D E E1 e h L L2 M INCHES MIN MAX ---0.069 0.004 0.010 0.049 ---0.008 0.012 0.004 0.010 0.341 BSC 0.236 BSC 0.154 BSC 0.025 BSC 0.010 0.020 0.016 0.050 0.010 BSC 0_ 8_ MILLIMETERS MIN MAX ---1.75 0.10 0.25 1.24 ---0.20 0.30 0.10 0.25 8.66 BSC 5.99 BSC 3.91 BSC 0.635 BSC 0.25 0.51 0.41 1.27 0.25 BSC 0_ 8_ SOLDERING FOOTPRINT 20X 20X 0.42 1.12 20 11 6.40 1 10 0.635 PITCH DIMENSIONS: MILLIMETERS ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). 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