INFINEON IPUH6N03LAG

OptiMOS®2 Power-Transistor
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
Product Summary
Features
• Ideal for high-frequency dc/dc converters
• Qualified according to JEDEC1) for target application
V DS
25
V
R DS(on),max (SMD version)
6
mΩ
ID
50
A
• N-channel, logic level
• Excellent gate charge x R DS(on) product (FOM)
• Superior thermal resistance
• 175 °C operating temperature
• Pb-free lead plating; RoHS compliant
Type
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
Package
PG-TO252-3-11
PG-TO252-3-23
PG-TO251-3-11
PG-TO251-3-1
Marking
H6N03LA
H6N03LA
H6N03LA
H6N03LA
Maximum ratings, at T j=25 °C, unless otherwise specified
Parameter
Symbol Conditions
Continuous drain current
ID
Value
T C=25 °C2)
50
T C=100 °C
50
Pulsed drain current
I D,pulse
T C=25 °C3)
350
Avalanche energy, single pulse
E AS
I D=50 A, R GS=25 Ω
150
Reverse diode dv /dt
dv /dt
I D=50 A, V DS=20 V,
di /dt =200 A/µs,
T j,max=175 °C
6
Gate source voltage4)
V GS
Power dissipation
P tot
Operating and storage temperature
T j, T stg
T C=25 °C
IEC climatic category; DIN IEC 68-1
Rev. 1.5
Unit
A
mJ
kV/µs
±20
V
71
W
-55 ... 175
°C
55/175/56
page 1
2008-04-14
Parameter
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
Values
Symbol Conditions
Unit
min.
typ.
max.
-
-
2.1
minimal footprint
-
-
75
6 cm2 cooling area5)
-
-
50
25
-
-
Thermal characteristics
Thermal resistance, junction - case
R thJC
SMD version, device on PCB
R thJA
K/W
Electrical characteristics, at T j=25 °C, unless otherwise specified
Static characteristics
Drain-source breakdown voltage
V (BR)DSS V GS=0 V, I D=1 mA
Gate threshold voltage
V GS(th)
V DS=V GS, I D=30 µA
1.2
1.6
2
Zero gate voltage drain current
I DSS
V DS=25 V, V GS=0 V,
T j=25 °C
-
0.1
1
V DS=25 V, V GS=0 V,
T j=125 °C
-
10
100
V
µA
Gate-source leakage current
I GSS
V GS=20 V, V DS=0 V
-
10
100
nA
Drain-source on-state resistance
R DS(on)
V GS=4.5 V, I D=30 A
-
8.2
10.2
mΩ
V GS=4.5 V, I D=30 A,
IPD version
-
8
10
V GS=10 V, I D=50 A
-
5.2
6.2
V GS=10 V, I D=50 A,
IPD version
-
5
6
-
1.3
-
Ω
35
69
-
S
Gate resistance
RG
Transconductance
g fs
|V DS|>2|I D|R DS(on)max,
I D=50 A
1)
J-STD20 and JESD22
2)
Current is limited by bondwire; with an R thJC=2.1 K/W the chip is able to carry 80 A.
3)
See figure 3
4)
T j,max=150 °C and duty cycle D <0.25 for V GS<-5 V
5)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
connection. PCB is vertical in still air.
Rev. 1.5
page 2
2008-04-14
Parameter
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
Values
Symbol Conditions
Unit
min.
typ.
max.
-
1800
2390
-
690
920
Dynamic characteristics
Input capacitance
C iss
Output capacitance
C oss
Reverse transfer capacitance
Crss
-
85
130
Turn-on delay time
t d(on)
-
6
9
Rise time
tr
-
5.4
8
Turn-off delay time
t d(off)
-
23
34
Fall time
tf
-
4.2
6.3
Gate to source charge
Q gs
-
5.9
7.8
Gate charge at threshold
Q g(th)
-
2.9
3.8
Gate to drain charge
Q gd
-
4.1
6.1
Switching charge
Q sw
-
7.1
10
Gate charge total
Qg
-
14
19
Gate plateau voltage
V plateau
-
3.3
-
Gate charge total, sync. FET
Q g(sync)
V DS=0.1 V,
V GS=0 to 5 V
-
13
17
Output charge
Q oss
V DD=15 V, V GS=0 V
-
15
20
-
-
50
-
-
350
V GS=0 V, V DS=15 V,
f =1 MHz
V DD=15 V, V GS=10 V,
I D=25 A, R G=2.7 Ω
pF
ns
Gate Charge Characteristics 6)
V DD=15 V, I D=25 A,
V GS=0 to 5 V
nC
V
nC
Reverse Diode
Diode continous forward current
IS
Diode pulse current
I S,pulse
Diode forward voltage
V SD
V GS=0 V, I F=50 A,
T j=25 °C
-
0.93
1.2
V
Reverse recovery charge
Q rr
V R=15 V, I F=I S,
di F/dt =400 A/µs
-
-
10
nC
6)
Rev. 1.5
T C=25 °C
A
See figure 16 for gate charge parameter definition
page 3
2008-04-14
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
1 Power dissipation
2 Drain current
P tot=f(T C)
I D=f(T C); V GS≥10 V
80
60
70
50
60
40
I D [A]
P tot [W]
50
40
30
30
20
20
10
10
0
0
0
50
100
150
200
0
50
100
T C [°C]
150
200
T C [°C]
3 Safe operating area
4 Max. transient thermal impedance
I D=f(V DS); T C=25 °C; D =0
Z thJC=f(t p)
parameter: t p
parameter: D =t p/T
1000
10
1 µs
limited by on-state
resistance
10 µs
100
0.5
Z thJC [K/W]
1
I D [A]
100 µs
DC
1 ms
0.2
0.1
0.05
10
0.1
10 ms
0.02
0.01
single pulse
1
0.01
0.1
1
10
100
0
0
0
0
0
1
10-5
10-4
10-3
10-2
10-1
100
t p [s]
V DS [V]
Rev. 1.5
0
10-6
page 4
2008-04-14
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
5 Typ. output characteristics
6 Typ. drain-source on resistance
I D=f(V DS); T j=25 °C
R DS(on)=f(I D); T j=25 °C
parameter: V GS
parameter: V GS
100
20
4.5 V
10 V
90
18
80
16
4.1 V
70
14
R DS(on) [mΩ]
60
I D [A]
4.1 V
3.8 V
3.5 V
3.2 V
3.8 V
50
40
12
10
4.5 V
8
3.5 V
30
6
10 V
20
10
3.2 V
4
3V
2
2.8 V
0
0
0
1
2
3
0
20
40
V DS [V]
60
80
100
I D [A]
7 Typ. transfer characteristics
8 Typ. forward transconductance
I D=f(V GS); |V DS|>2|I D|R DS(on)max
g fs=f(I D); T j=25 °C
parameter: T j
100
80
70
80
60
50
I D [A]
g fs [S]
60
40
40
30
20
20
175 °C
10
25 °C
0
0
0
1
2
3
4
5
Rev. 1.5
0
10
20
30
40
50
60
I D [A]
V GS [V]
page 5
2008-04-14
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
9 Drain-source on-state resistance
10 Typ. gate threshold voltage
R DS(on)=f(T j); I D=50 A; V GS=10 V
V GS(th)=f(T j); V GS=V DS
parameter: I D
12
2.5
10
2
300 µA
98 %
6
V GS(th) [V]
R DS(on) [mΩ]
8
typ
1.5
30 µA
1
4
0.5
2
0
0
-60
-20
20
60
100
140
180
-60
-20
20
60
100
140
180
T j [°C]
T j [°C]
11 Typ. capacitances
12 Forward characteristics of reverse diode
C =f(V DS); V GS=0 V; f =1 MHz
I F=f(V SD)
parameter: T j
1000
104
25 °C
Ciss
103
100
Crss
102
175 °C
25 °C, 98%
10
101
1
0
10
20
30
V DS [V]
Rev. 1.5
175 °C, 98%
I F [A]
C [pF]
Coss
0.0
0.5
1.0
1.5
2.0
V SD [V]
page 6
2008-04-14
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
13 Avalanche characteristics
14 Typ. gate charge
I AS=f(t AV); R GS=25 Ω
V GS=f(Q gate); I D=25 A pulsed
parameter: Tj(start)
parameter: V DD
100
12
15 V
10
100 °C
5V
25 °C
20 V
150 °C
V GS [V]
I AV [A]
8
10
6
4
2
1
0
1
10
100
1000
0
5
10
15
20
25
30
Q gate [nC]
t AV [µs]
15 Drain-source breakdown voltage
16 Gate charge waveforms
V BR(DSS)=f(T j); I D=1 mA
30
V GS
Qg
28
V BR(DSS) [V]
27
26
24
V g s(th)
23
Q g(th)
21
Q sw
Q gs
20
-60
-20
20
60
100
140
Q g ate
Q gd
180
T j [°C]
Rev. 1.5
page 7
2008-04-14
Package Outline
Rev. 1.5
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
PG-TO252-3-11
page 8
2008-04-14
Package Outline
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
PG-TO252-3-23
PG-TO252-3-23: Outline
Footprint:
Rev. 1.5
page 9
2008-04-14
Package Outline
Rev. 1.5
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
PG-TO251-3-11
page 10
2008-04-14
Package Outline
Rev. 1.5
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
PG-TO251-3-21
page 11
2008-04-14
IPDH6N03LA G
IPFH6N03LA G
IPSH6N03LA G
IPUH6N03LA G
Published by
Infineon Technologies AG
81726 Munich, Germany
© 2008 Infineon Technologies AG
All Rights Reserved.
Legal Disclaimer
The information given in this document shall in no event be regarded as a guarantee of
conditions or characteristics. With respect to any examples or hints given herein, any typical
values stated herein and/or any information regarding the application of the device,
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,
including without limitation, warranties of non-infringement of intellectual property rights
of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please
contact the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information
on the types in question, please contact the nearest Infineon Technologies Office.
Infineon Technologies components may be used in life-support devices or systems only with
the express written approval of Infineon Technologies, if a failure of such components can
reasonably be expected to cause the failure of that life-support device or system or to affect
the safety or effectiveness of that device or system. Life support devices or systems are
intended to be implanted in the human body or to support and/or maintain and sustain
and/or protect human life. If they fail, it is reasonable to assume that the health of the user
or other persons may be endangered.
Rev. 1.5
page 12
2008-04-14