RELIABILITY DATA LTC1706 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 536 9827 536 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP 631 631 • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE SAMPLE SIZE NEWEST DATE CODE 0114 0403 OLDEST DATE CODE NEWEST DATE CODE 1,131 0048 1,131 • THERMAL SHOCK FROM -65°C to +150°C SAMPLE SIZE OLDEST DATE CODE K DEVICE HOURS (1) AT +125°C 0201 OLDEST DATE CODE SOIC/SOT/MSOP PACKAGE TYPE NEWEST DATE CODE 295.75 295.75 NEWEST DATE CODE 39.89 39.89 K DEVICE CYCLES 133.10 133.10 K DEVICE CYCLES SOIC/SOT/MSOP 779 9910 0403 779 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 40.02 FITS (3) Mean Time Between Failures in Years = 2,851 Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R399 0 0 NUMBER OF FAILURES K DEVICE HOURS 0403 NUMBER OF (2) FAILURES 97.90 97.90 0 0 NUMBER OF FAILURES 0 0 NUMBER OF FAILURES 0 0 Rev 1