R163 Reliability Data

Reliability Data Report
Product Family R163
LTC690 \ LTC691 \ LTC692 \ LTC693 \
LTC694 \ LTC695 \ LTC698 \ LTC699 \
LTC1232 \ LTC1235
Reliability Data Report
Report Number: R163
Report generated on: Fri Apr 01 17:16:02 PDT 2016
OPERATING LIFE TEST
PACKAGE TYPE
SAMPLE SIZE
OLDEST DATE
NEWEST DATE
K DEVICE HRS
CODE
CODE
(+125°C)
1
No. of FAILURES
2,3
SIDEBRAZE
CERDIP
PLASTIC DIP
61
155
360
9726
9101
9101
9726
9101
9652
61
100
277
0
0
0
SOIC/MSOP
Totals
31
607
9325
-
9325
-
16
454
0
0
K DEVICE HRS
No. of FAILURES
PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C
PACKAGE TYPE
SAMPLE SIZE
OLDEST DATE
NEWEST DATE
SSOP/TSSOP
50
CODE
9932
CODE
9932
1
0
PLASTIC DIP
SOIC/MSOP
SOT
2850
6540
50
9502
9502
9929
0250
1351
9929
74
237
1
0
0
0
Totals
9,490
-
-
313
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
TEMP CYCLE FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
CODE
CODE
CYCLES
SSOP/TSSOP
PLASTIC DIP
50
2741
9932
9120
9932
0250
5
277
0
0
SOIC/MSOP
SOT
Totals
3474
50
6,315
9133
9929
-
1351
9929
-
347
5
634
0
0
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
CYCLES
THERMAL SHOCK FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
CODE
CODE
PLASTIC DIP
1745
9120
0250
174
0
SOIC/MSOP
Totals
2638
4,383
9133
-
1351
-
265
439
0
0
(1) Assumes Activation Energy = 0.7 Electron Volts
(2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =26.1 FITS
(3) Mean Time Between Failure in Years = 4373.89
Note: 1 FIT = 1 Failure in One Billion Hours.
Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL1 Preconditioning