DICE SPECIFICATION RH1814 Dual 3mA, 100MHz, 750V/µs Operational Amplifier PAD FUNCTION DIE CROSS REFERENCE 8 1 7 2 6 1. 2. 3. 4. 5. 6. 7. 8. 5 3 OUTPUT A –INA +INA V– +INB –INB OUTPUT B V+ LTC Finished Part Number Order DICE CANDIDATE Part Number Below RH1814 RH1814 DICE Please refer to LTC standard product data sheet for other applicable product information. Note: Backside (substrate) maybe connected to V– or no connection. 4 , LT, LTC and LTM are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners. 40mils × 45mils, Thickness: 12mils. Backside metal: Gold. ABSOLUTE MAXIMUM RATINGS (Note 1) Supply Voltage .......................................................12.6V Differential Input Voltage (Note 2).............................±6V Input Voltage.............................................................±VS DICE ELECTRICAL TEST LIMITS Output Short-Circuit Duration .......................... Indefinite Junction Temperature ........................................... 150°C VS = ±5V, VCM = 0V, TA = 25°C unless otherwise noted. SYMBOL PARAMETER CONDITIONS VOS Input Offset Voltage (Note 3) IOS MIN MAX UNITS 1.5 mV Input Offset Current 400 nA IB Input Bias Current ±4 μA RIN Input Resistance AVOL Large-Signal Voltage Gain CMRR VCM = ±3.5V 3 MΩ VO = ±3V, RL ≥ 500Ω 1.5 V/mV VO = ±3V, RL ≥ 100Ω 1 V/mV Input Voltage Range Guaranteed by CMRR ±3.5 V Common-Mode Rejection Ratio VCM = ±3.5V 75 dB Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 1 DICE SPECIFICATION RH1814 DICE ELECTRICAL TEST LIMITS SYMBOL PSRR VOUT PARAMETER VS = ±5V, VCM = 0V, TA = 25°C unless otherwise noted. CONDITIONS MIN MAX UNITS Power Supply Rejection Ratio VS = ±2V to ±5.5V 78 dB Channel Separation VO = ±3V, RL = 100Ω 82 dB Output Voltage Swing RL = 500Ω, 30mV Overdrive ±3.8 V RL = 100Ω, 30mV Overdrive ±3.35 V VOUT = ±3V, 30mV Overdrive ±40 ±75 IOUT Maximum Output Current ISC Output Short-Circuit Current VOUT = 0V, 1V Overdrive IS Supply Current Per Amplifier DICE ELECTRICAL TEST LIMITS mA mA 3.6 mA MAX UNITS (Pre-Irradiation) VS = 5V, VCM = 0V, TA = 25°C unless otherwise noted. SYMBOL PARAMETER CONDITIONS VOS Input Offset Voltage (Note 3) IOS MIN 2 mV Input Offset Current 400 nA IB Input Bias Current ±4 μA RIN Input Resistance VCM = 1.5V to 3.5V 3 MΩ AVOL Large-Signal Voltage Gain VO = 1.5V to 3.5V, RL ≥ 500Ω 1 V/mV VO = 1.5V to 3.5V, RL ≥ 100Ω 0.7 V/mV Input Voltage Range (Positive) Guaranteed by CMRR 3.5 V Input Voltage Range (Negative) Guaranteed by CMRR CMRR Common-Mode Rejection Ratio VCM = 1.5V to 3.5V 73 dB PSRR Power Supply Rejection Ratio VS = ±2V to ±5.5V 78 dB Channel Separation VOUT = 1.5V to 3.5V, RL = 100Ω 81 mA Output Voltage Swing (Positive) RL = 500Ω, 30mV Overdrive 3.9 V RL = 100Ω, 30mV Overdrive 3.7 V VOUT VOUT Output Voltage Swing (Negative) 1.5 V RL = 500Ω, 30mV Overdrive 1.1 V RL = 100Ω, 30mV Overdrive 1.3 V IOUT Maximum Output Current VOUT = 1.5V to 3.5V, 30mV Overdrive ±25 mA ISC Output Short-Circuit Current VOUT = 2.5V, 1V Overdrive ±55 mA IS Supply Current Per Amplifier Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. 4 mA Note 2: Differential inputs of ±6V are appropriate for transient operation only, such as during slewing. Large sustained differential inputs can cause excessive power dissipation and may damage the part. Note 3: Input offset voltage is pulse tested and is exclusive of warm-up drift. Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. I.D.No. 66-13-1814 2 Linear Technology Corporation LT 0807 • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2007