DICE/DWF SPECIFICATION RH1185AMK Negative Regulator with Adjustable Current Limit PAD FUNCTION 2 3 1. 2. 3. 4. 5. 2 DIE CROSS REFERENCE REF VIN VOUT GND FB LTC Finished Part Number Order Part Number RH1185AMK RH1185AMK RH1185AMK DICE RH1185AMK DWF* Please refer to LTC standard product data sheet for other applicable product information. *DWF = DICE in wafer form. 4 1 4 5 L, LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners. 110mils × 116mils Backside metal: Alloyed Gold Layer Backside Potential: VIN Pads 2 DICE/DWF ELECTRICAL TEST LIMITS VIN = 7.4V, VOUT = 5V, IOUT = 1mA, RLIM = 4.02k, unless otherwise noted. PARAMETER CONDITIONS Reference Voltage (at FB Pin, Note 2) VIN – VOUT = 5V, VOUT = VREF MIN TYP MAX UNITS –2.344 –2.37 –2.396 V Feedback Pin Bias Current VOUT = VREF 2 μA Dropout Voltage (Note 3) IOUT = 0.5A, VOUT = 5V IOUT = 3A, VOUT = 5V 0.4 1.05 V V Line Regulation (Note 6) VIN – VOUT = 1V to 20V, VOUT = 5V 0.01 %/V Minimum Input Voltage (Note 4) IOUT = 1A, VOUT = VREF 4.5 V Internal Current Limit (Note 8) VIN – VOUT = 1.5V VIN – VOUT = 20V VIN – VOUT = 30V 3.3 1 0.2 4.2 2.6 1 A A A External Current Limit (Note 7) RLIM = 5k, VOUT = 1V RLIM = 15k, VOUT = 1V 2.7 0.9 3.3 1.1 A A Quiescent Supply Current (Note 5) IOUT = 5mA, VOUT = VREF , 4V ≤ VIN ≤ 25V 3.5 mA Note 1: Dice are probe tested at 25°C to the limits shown except for high current tests. Dice are tested under low current conditions which assure full load current specifications when assembled in packaging systems approved by Linear Technology. For absolute maximum ratings, typical specifications, performance curves and finished product specifications, please refer to the standard product RH data sheet. Note 2: Testing is done using a pulsed low duty cycle technique. See thermal regulation specifications in the LT1185 data sheet for output changes due to heating effects. Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 1 DICE/DWF SPECIFICATION RH1185AMK DICE/DWF ELECTRICAL TEST LIMITS VIN = 7.4V, VOUT = 5V, IOUT = 1mA, RLIM = 4.02k, unless otherwise noted. Note 3: Dropout voltage is tested by reducing input voltage until the output drops 1% below its nominal value. Tests are done at 0.5A and 3A. The power transistor looks basically like a pure resistance in this range so that minimum differential at any intermediate current can be calculated by interpolation; VDROPOUT = 0.25V + 0.25Ω • IOUT. For load current other than 0.5A and 3.0A, see the graph in the LT1185 data sheet. Note 4: Minimum input voltage is limited by base emitter voltage drive of the power transistor section, not saturation as measured in Note 3. For output voltages below 4V, minimum input voltage specification may limit dropout voltage before transistor saturation limit. Note 5: Supply current is measured on the ground pin, and does not include load current, RLIM , or output divider current. Note 6: Line regulation is measured on a pulse basis with a pulse width of ≈2ms to minimize heating. DC regulation will be affected by thermal regulation and temperature coefficient of the reference. See the Applications Information section of the LT1185 data sheet for details. Note 7: External current limit is programmed with a resistor from REF pin to GND pin. The value is 15K • A/ILIMIT . Note 8: For VIN – VOUT = 1.5V, VIN = 5V and VOUT = 3.5V. For all other current limit tests VOUT = 1V. Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. I.D.No. 66-13-1185AMK 2 Linear Technology Corporation LT 1111 REV C • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2009