RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1014MW Quad Operational Amplifier for Linear Technology Customer: Linear Technology (PO 50546L) RAD Job Number: 08-200 Part Type Tested: Linear Technology RH1014MW Quad Operational Amplifier Commercial Part Number: RH1014MW Traceability Information: Lot Date Code: 0737A, Fab Run # W10722836.1, W04, Assy Lot #446548.1 Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit. External Traveler: None required Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD, Inc. TID Dose Rate and Maximum Total Dose: 59.3rad(Si)/s to 50krad(Si) total ionizing dose TID Test Increments: Pre-Irradiation, 10krad(Si), 20krad(Si), 30krad(Si) and 50krad(Si) TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168-hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations. Electrical measurements shall be made following each anneal increment. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Hardware and Test Program: LTS2020 Tester, 2101 Family Board, 0600 Fixture and RH1014 DUT Board (BGSS970312B), RH1014L3.SRC. TID Bias Conditions: Serial numbers 1040, 1041, 1042, 1043 and 1046 were biased during irradiation, serial numbers 1047, 1048, 1049, 1050 and 1051 were unbiased during irradiation and serial number 1052 was used as the control. Facility: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO Radiation Sources: Co60 (JLSA 81-24) Irradiation and Test Temperature: Ambient, room temperature, 24°C ± 6°C RLAT Test Result: PASSED. All parts met datasheet specifications to 50krad(Si) with no substantial degradation to any measured parameter An ISO 9001:2000 Certified Company 1 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2000 Certified Company 2 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2000 Certified Company 3 RLAT Report 08-200 090408 R1.2 3.0. Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Test Conditions The RH1014MW quad operational amplifier described in this final report was tested using two bias conditions, biased with a split 15V supply and all pins tied to ground, see Appendix A for details on biasing conditions. These devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The ELDRS bias board was positioned in the Co-60 cell to provide the required 10mrad(Si)/s and was located inside a lead-aluminum box. The lead-aluminum box is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or testfixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum box was determined based on TLD dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work was 59.3rad(Si)/s with a precision of ±5%. An ISO 9001:2000 Certified Company 4 RLAT Report 08-200 090408 R1.2 4.0. Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Tested Parameters The following parameters were tested during the course of this work: 1. Positive Supply Current (ICC+) 2. Negative Supply Current (IEE-) 3. Input Offset Voltage (VOS1-VOS4) 4. Input Offset Current (IOS1-IOS4) 5. + Input Bias Current (IB+1-IB+4) 6. - Input Bias Current (IB-1-IB-4) 7. Common Mode Rejection Ratio (CMRR1-CMRR4) 8. Power Supply Rejection Ratio (PSRR1-PSRR4) 9. Large Signal Voltage Gain (AVOL9-AVOL12) 10. Positive Output Voltage Swing (VOUT+1-VOUT+4) 11. Negative Output Voltage Swing (VOUT-1-VOUT-4) 12. Positive Slew Rate (SlewRate+1-SlewRate+4) 13. Negative Slew Rate (SlewRate-1-SlewRate-4) 14. Positive Supply Current (ICC+2) 15. Negative Supply Current (IEE-2) 16. Input Offset Voltage (VOS5-VOS8) 17. Input Offset Current (IOS5-IOS8) 18. + Input Bias Current (IB+5-IB+8) 19. - Input Bias Current (IB-5-IB-8) 20. Positive Output Voltage Swing (VOUT+5-VOUT+8) 21. Positive Output Voltage Swing (VOUT+9-VOUT+12) 22. Negative Output Voltage Swing (VOUT-5-VOUT-8) 23. Negative Output Voltage Swing (VOUT-9-VOUT-12) 24. Negative Output Voltage Swing (VOUT-13-VOUT-16) Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the ELDRS testing: following the radiation exposure the unit shall pass the specification value and the average value for the each device must pass the specification value when the KTL limits are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot could be logged as an RLAT failure. An ISO 9001:2000 Certified Company 5 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a population representative of recent production runs. Smaller sample sizes may be used if agreed upon between the parties to the test. All of the selected devices shall have undergone appropriate elevated temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical characterization on each part at each dose level. Post irradiation electrical measurements shall be performed per paragraph 3.10 where the low dose rate test is considered Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test does not apply to parameters which exhibit changes that are within experimental error or whose values are below the pre-irradiation electrical specification limits at low dose rate at the specification dose. Therefore, the data in this report can be analyzed along with the high dose rate report titled “Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1014MW Quad Operational Amplifier for Linear Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method. 5.0. RLAT Test Results Using the conditions stated above, the RH1014MW devices passed the RLAT test to 50krad(Si) with no significant degradation to most of the measured parameters. Where radiation induced degradation was observed the degradation was not sufficient to cause the parameter to exceed the specification value. Figures 5.1 through 5.84 show plots of all the measured parameters versus total ionizing dose. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 6 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Tables 5.1 through 5.84 show the raw data, averages, standard deviation, +KTL statistics, -KTL statistics, specification limit and Pass/Fail condition for each parameter. Appendix D provides a list of all the figures in this results section to facilitate the location of a particular parameter. As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the specification even after application of the KTL statistics (with certain exceptions, as noted below). The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained under control during the course of the testing. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. The parameters measured in this report where the preirradiation KTL values are out of specification include Common Mode Rejection Ratio, Power Supply Rejection Ratio and Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2000 Certified Company 7 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Positive Supply Current @ +/-15V (A) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.1. Plot of Positive Supply Current @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 8 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.1. Raw data for Positive Supply Current @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Supply Current @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.48E-03 1.47E-03 1.55E-03 1.57E-03 1.55E-03 1.62E-03 1.55E-03 1.51E-03 1.57E-03 1.55E-03 1.55E-03 10 1.49E-03 1.48E-03 1.55E-03 1.58E-03 1.56E-03 1.67E-03 1.57E-03 1.55E-03 1.61E-03 1.59E-03 1.55E-03 20 1.51E-03 1.49E-03 1.55E-03 1.59E-03 1.57E-03 1.67E-03 1.56E-03 1.54E-03 1.59E-03 1.57E-03 1.55E-03 30 1.48E-03 1.49E-03 1.53E-03 1.57E-03 1.55E-03 1.65E-03 1.54E-03 1.52E-03 1.57E-03 1.55E-03 1.55E-03 50 1.45E-03 1.44E-03 1.48E-03 1.52E-03 1.51E-03 1.62E-03 1.49E-03 1.47E-03 1.52E-03 1.50E-03 1.55E-03 60 1.40E-03 1.39E-03 1.43E-03 1.47E-03 1.46E-03 1.57E-03 1.47E-03 1.45E-03 1.49E-03 1.47E-03 1.55E-03 70 1.34E-03 1.33E-03 1.39E-03 1.42E-03 1.42E-03 1.55E-03 1.47E-03 1.45E-03 1.50E-03 1.47E-03 1.54E-03 1.52E-03 4.42E-05 1.73E-03 1.32E-03 1.53E-03 4.35E-05 1.74E-03 1.33E-03 1.54E-03 4.10E-05 1.73E-03 1.35E-03 1.52E-03 3.87E-05 1.70E-03 1.34E-03 1.48E-03 3.56E-05 1.65E-03 1.31E-03 1.43E-03 3.82E-05 1.61E-03 1.25E-03 1.38E-03 4.26E-05 1.58E-03 1.18E-03 1.56E-03 3.82E-05 1.74E-03 1.38E-03 2.20E-03 PASS 1.60E-03 4.74E-05 1.82E-03 1.38E-03 2.20E-03 PASS 1.59E-03 5.06E-05 1.82E-03 1.35E-03 2.20E-03 PASS 1.57E-03 5.31E-05 1.81E-03 1.32E-03 2.20E-03 PASS 1.52E-03 5.73E-05 1.79E-03 1.26E-03 2.20E-03 PASS 1.49E-03 4.73E-05 1.71E-03 1.27E-03 2.20E-03 PASS 1.48E-03 3.87E-05 1.67E-03 1.30E-03 2.20E-03 PASS An ISO 9001:2000 Certified Company 9 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Negative Supply Current @ +/-15V (A) 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 -2.00E-03 -2.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.2. Plot of Negative Supply Current @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 10 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.2. Raw data for Negative Supply Current @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Supply Current @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -1.48E-03 -1.47E-03 -1.55E-03 -1.57E-03 -1.55E-03 -1.62E-03 -1.55E-03 -1.51E-03 -1.57E-03 -1.54E-03 -1.55E-03 10 -1.50E-03 -1.48E-03 -1.55E-03 -1.58E-03 -1.56E-03 -1.67E-03 -1.57E-03 -1.55E-03 -1.61E-03 -1.59E-03 -1.55E-03 20 -1.51E-03 -1.49E-03 -1.55E-03 -1.59E-03 -1.57E-03 -1.67E-03 -1.56E-03 -1.54E-03 -1.60E-03 -1.58E-03 -1.55E-03 30 -1.48E-03 -1.49E-03 -1.54E-03 -1.57E-03 -1.55E-03 -1.66E-03 -1.54E-03 -1.52E-03 -1.57E-03 -1.55E-03 -1.55E-03 50 -1.45E-03 -1.44E-03 -1.48E-03 -1.52E-03 -1.51E-03 -1.62E-03 -1.50E-03 -1.48E-03 -1.53E-03 -1.51E-03 -1.55E-03 60 -1.40E-03 -1.39E-03 -1.43E-03 -1.47E-03 -1.46E-03 -1.57E-03 -1.47E-03 -1.45E-03 -1.50E-03 -1.48E-03 -1.55E-03 70 -1.34E-03 -1.33E-03 -1.39E-03 -1.43E-03 -1.42E-03 -1.55E-03 -1.47E-03 -1.45E-03 -1.50E-03 -1.47E-03 -1.54E-03 -1.52E-03 4.39E-05 -1.32E-03 -1.73E-03 -1.53E-03 4.30E-05 -1.33E-03 -1.73E-03 -1.54E-03 4.15E-05 -1.35E-03 -1.74E-03 -1.53E-03 3.88E-05 -1.34E-03 -1.71E-03 -1.48E-03 3.63E-05 -1.31E-03 -1.65E-03 -1.43E-03 3.79E-05 -1.25E-03 -1.61E-03 -1.38E-03 4.36E-05 -1.18E-03 -1.58E-03 -1.56E-03 3.78E-05 -1.38E-03 -1.74E-03 -2.20E-03 PASS -1.60E-03 4.71E-05 -1.38E-03 -1.82E-03 -2.20E-03 PASS -1.59E-03 5.19E-05 -1.35E-03 -1.83E-03 -2.20E-03 PASS -1.57E-03 5.26E-05 -1.32E-03 -1.81E-03 -2.20E-03 PASS -1.52E-03 5.68E-05 -1.26E-03 -1.79E-03 -2.20E-03 PASS -1.49E-03 4.73E-05 -1.27E-03 -1.71E-03 -2.20E-03 PASS -1.49E-03 3.89E-05 -1.30E-03 -1.67E-03 -2.20E-03 PASS An ISO 9001:2000 Certified Company 11 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-04 Offset Voltage 1 @ +/-15V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.3. Plot of Offset Voltage 1 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 12 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.3. Raw data for Offset Voltage 1 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 1 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Total Dose (krad(Si)) 0 -5.68E-06 -4.78E-05 -2.17E-05 6.53E-05 5.88E-05 -5.02E-05 -2.94E-05 2.85E-05 -6.70E-05 3.22E-05 4.94E-05 Biased Statistics Average Biased 9.78E-06 Std Dev Biased 5.01E-05 Ps99%/90% (+KTL) Biased 2.44E-04 Ps99%/90% (-KTL) Biased -2.24E-04 Un-Biased Statistics Average Un-Biased -1.72E-05 Std Dev Un-Biased 4.54E-05 Ps99%/90% (+KTL) Un-Biased 1.95E-04 Ps99%/90% (-KTL) Un-Biased -2.29E-04 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 24-hr Anneal 168-hr Anneal 10 -3.63E-06 -5.45E-05 -2.70E-05 5.48E-05 5.46E-05 -5.42E-05 -2.42E-05 3.03E-05 -6.57E-05 4.32E-05 5.19E-05 20 -2.42E-06 -4.44E-05 -2.55E-05 7.16E-05 6.69E-05 -4.89E-05 -2.07E-05 3.80E-05 -6.06E-05 4.53E-05 5.17E-05 30 -2.98E-05 6.28E-06 -1.38E-05 7.68E-05 7.46E-05 -4.06E-05 -5.32E-06 4.43E-05 -5.56E-05 5.47E-05 4.98E-05 50 2.50E-05 -2.06E-06 6.76E-06 9.93E-05 9.82E-05 -2.96E-05 1.27E-05 6.57E-05 -3.19E-05 7.46E-05 4.90E-05 60 2.35E-05 7.20E-07 1.22E-05 1.05E-04 9.66E-05 -2.96E-05 1.27E-05 5.81E-05 -3.45E-05 6.44E-05 5.06E-05 70 2.08E-05 -8.22E-06 3.13E-06 9.78E-05 1.09E-04 -4.03E-05 -1.70E-06 4.79E-05 -3.39E-05 4.85E-05 4.67E-05 4.85E-06 4.89E-05 2.33E-04 -2.23E-04 1.32E-05 5.33E-05 2.62E-04 -2.35E-04 2.28E-05 5.00E-05 2.56E-04 -2.10E-04 4.54E-05 4.96E-05 2.77E-04 -1.86E-04 4.76E-05 4.94E-05 2.78E-04 -1.83E-04 4.45E-05 5.49E-05 3.01E-04 -2.12E-04 -1.41E-05 4.91E-05 2.15E-04 -2.43E-04 -4.50E-04 PASS 4.50E-04 PASS -9.37E-06 4.89E-05 2.19E-04 -2.37E-04 -4.50E-04 PASS 4.50E-04 PASS -4.88E-07 4.93E-05 2.29E-04 -2.30E-04 -4.50E-04 PASS 4.50E-04 PASS 1.83E-05 5.06E-05 2.55E-04 -2.18E-04 -6.00E-04 PASS 6.00E-04 PASS 1.42E-05 4.67E-05 2.32E-04 -2.04E-04 -6.00E-04 PASS 6.00E-04 PASS 4.10E-06 4.29E-05 2.04E-04 -1.96E-04 -6.00E-04 PASS 6.00E-04 PASS An ISO 9001:2000 Certified Company 13 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-04 Offset Voltage 2 @ +/-15V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.4. Plot of Offset Voltage 2 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 14 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.4. Raw data for Offset Voltage 2 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 2 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Total Dose (krad(Si)) 0 -1.69E-05 3.96E-05 -4.82E-05 3.85E-05 8.27E-05 3.66E-05 3.62E-05 -3.90E-05 -1.00E-05 -1.49E-05 5.33E-05 Biased Statistics Average Biased 1.92E-05 Std Dev Biased 5.17E-05 Ps99%/90% (+KTL) Biased 2.60E-04 Ps99%/90% (-KTL) Biased -2.22E-04 Un-Biased Statistics Average Un-Biased 1.78E-06 Std Dev Un-Biased 3.35E-05 Ps99%/90% (+KTL) Un-Biased 1.58E-04 Ps99%/90% (-KTL) Un-Biased -1.54E-04 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 24-hr Anneal 168-hr Anneal 10 -1.20E-05 4.36E-05 -4.66E-05 4.26E-05 8.16E-05 3.55E-05 3.80E-05 -2.66E-05 -1.09E-06 -3.38E-06 5.42E-05 20 -2.78E-06 5.35E-05 -3.91E-05 5.35E-05 9.31E-05 3.84E-05 5.17E-05 -1.63E-05 6.76E-06 7.20E-07 5.35E-05 30 6.44E-05 5.19E-06 -2.71E-05 6.63E-05 1.05E-04 4.55E-05 6.67E-05 -1.57E-06 1.61E-05 8.33E-06 5.47E-05 50 2.13E-05 8.60E-05 -4.71E-06 9.23E-05 1.24E-04 6.38E-05 9.30E-05 1.69E-05 4.06E-05 1.88E-05 5.48E-05 60 2.52E-05 9.00E-05 1.44E-06 8.08E-05 1.21E-04 6.09E-05 8.16E-05 1.33E-05 2.75E-05 1.55E-05 5.49E-05 70 1.76E-05 6.62E-05 -2.38E-05 7.76E-05 1.15E-04 3.72E-05 5.71E-05 -1.81E-05 -1.70E-06 3.13E-06 5.55E-05 2.18E-05 5.07E-05 2.59E-04 -2.15E-04 3.16E-05 5.23E-05 2.75E-04 -2.12E-04 4.27E-05 5.27E-05 2.89E-04 -2.03E-04 6.38E-05 5.35E-05 3.13E-04 -1.86E-04 6.36E-05 4.89E-05 2.92E-04 -1.65E-04 5.05E-05 5.42E-05 3.04E-04 -2.02E-04 8.50E-06 2.77E-05 1.38E-04 -1.21E-04 -4.50E-04 PASS 4.50E-04 PASS 1.63E-05 2.80E-05 1.47E-04 -1.14E-04 -4.50E-04 PASS 4.50E-04 PASS 2.70E-05 2.83E-05 1.59E-04 -1.05E-04 -4.50E-04 PASS 4.50E-04 PASS 4.66E-05 3.22E-05 1.97E-04 -1.03E-04 -6.00E-04 PASS 6.00E-04 PASS 3.97E-05 3.02E-05 1.80E-04 -1.01E-04 -6.00E-04 PASS 6.00E-04 PASS 1.55E-05 3.07E-05 1.59E-04 -1.28E-04 -6.00E-04 PASS 6.00E-04 PASS An ISO 9001:2000 Certified Company 15 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-04 Offset Voltage 3 @ +/-15V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.5. Plot of Offset Voltage 3 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 16 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.5. Raw data for Offset Voltage 3 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 3 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Total Dose (krad(Si)) 0 3.97E-05 -9.71E-05 -3.09E-05 -8.09E-06 -2.85E-05 -3.45E-05 -2.21E-05 2.95E-05 6.52E-06 2.57E-05 -1.67E-05 Biased Statistics Average Biased -2.50E-05 Std Dev Biased 4.93E-05 Ps99%/90% (+KTL) Biased 2.05E-04 Ps99%/90% (-KTL) Biased -2.55E-04 Un-Biased Statistics Average Un-Biased 1.01E-06 Std Dev Un-Biased 2.85E-05 Ps99%/90% (+KTL) Un-Biased 1.34E-04 Ps99%/90% (-KTL) Un-Biased -1.32E-04 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 24-hr Anneal 168-hr Anneal 10 4.47E-05 -9.80E-05 -3.04E-05 -2.54E-06 -3.94E-05 -3.49E-05 -7.13E-06 3.43E-05 1.09E-05 2.81E-05 -1.61E-05 20 4.54E-05 -9.36E-05 -2.37E-05 4.83E-06 -3.48E-05 -2.94E-05 2.77E-06 4.12E-05 1.65E-05 2.96E-05 -1.49E-05 30 -8.39E-05 5.08E-05 -1.75E-05 1.39E-05 -2.17E-05 -2.28E-05 1.69E-05 5.04E-05 2.23E-05 3.54E-05 -1.69E-05 50 6.24E-05 -7.21E-05 4.59E-06 4.75E-05 -6.52E-06 -1.22E-05 4.69E-05 7.96E-05 5.02E-05 5.05E-05 -1.78E-05 60 6.33E-05 -7.26E-05 1.09E-05 3.65E-05 -2.90E-06 -9.79E-06 3.61E-05 6.99E-05 4.77E-05 4.94E-05 -1.63E-05 70 7.76E-05 -6.04E-05 -1.04E-05 5.14E-05 6.51E-06 -1.11E-05 1.36E-05 6.00E-05 3.66E-05 4.82E-05 -1.79E-05 -2.51E-05 5.23E-05 2.19E-04 -2.69E-04 -2.04E-05 5.13E-05 2.19E-04 -2.60E-04 -1.17E-05 4.98E-05 2.21E-04 -2.44E-04 7.17E-06 5.28E-05 2.54E-04 -2.39E-04 7.02E-06 5.12E-05 2.46E-04 -2.32E-04 1.30E-05 5.39E-05 2.64E-04 -2.39E-04 6.25E-06 2.81E-05 1.37E-04 -1.25E-04 -4.50E-04 PASS 4.50E-04 PASS 1.21E-05 2.73E-05 1.39E-04 -1.15E-04 -4.50E-04 PASS 4.50E-04 PASS 2.04E-05 2.74E-05 1.48E-04 -1.07E-04 -4.50E-04 PASS 4.50E-04 PASS 4.30E-05 3.36E-05 2.00E-04 -1.14E-04 -6.00E-04 PASS 6.00E-04 PASS 3.87E-05 2.97E-05 1.77E-04 -9.99E-05 -6.00E-04 PASS 6.00E-04 PASS 2.95E-05 2.84E-05 1.62E-04 -1.03E-04 -6.00E-04 PASS 6.00E-04 PASS An ISO 9001:2000 Certified Company 17 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-04 Offset Voltage 4 @ +/-15V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.6. Plot of Offset Voltage 4 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 18 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.6. Raw data for Offset Voltage 4 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 4 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Total Dose (krad(Si)) 0 1.53E-05 -7.20E-05 -1.61E-05 5.36E-05 -5.09E-05 3.16E-05 -2.78E-06 3.77E-05 -1.20E-07 4.24E-05 -4.37E-05 Biased Statistics Average Biased -1.40E-05 Std Dev Biased 5.04E-05 Ps99%/90% (+KTL) Biased 2.21E-04 Ps99%/90% (-KTL) Biased -2.49E-04 Un-Biased Statistics Average Un-Biased 2.18E-05 Std Dev Un-Biased 2.15E-05 Ps99%/90% (+KTL) Un-Biased 1.22E-04 Ps99%/90% (-KTL) Un-Biased -7.88E-05 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 24-hr Anneal 168-hr Anneal 10 2.15E-05 -5.93E-05 -1.11E-05 5.88E-05 -4.94E-05 3.59E-05 1.87E-05 5.05E-05 8.40E-07 4.42E-05 -4.04E-05 20 3.07E-05 -5.31E-05 -8.93E-06 7.01E-05 -4.25E-05 3.25E-05 2.81E-05 6.05E-05 1.34E-05 4.76E-05 -4.12E-05 30 -5.10E-05 3.98E-05 -3.50E-06 8.42E-05 -3.85E-05 3.77E-05 3.59E-05 7.56E-05 2.97E-05 6.13E-05 -4.02E-05 50 5.63E-05 -5.34E-05 1.40E-05 1.07E-04 -1.80E-05 4.75E-05 5.95E-05 9.25E-05 5.19E-05 7.83E-05 -3.85E-05 60 5.75E-05 -3.65E-05 2.10E-05 1.10E-05 -2.20E-05 3.97E-05 4.96E-05 8.20E-05 3.97E-05 6.88E-05 -4.14E-05 70 4.72E-05 -3.45E-05 1.74E-05 8.02E-05 -1.82E-05 1.67E-05 2.39E-05 6.52E-05 1.59E-05 6.11E-05 -3.80E-05 -7.90E-06 4.92E-05 2.22E-04 -2.37E-04 -7.50E-07 5.14E-05 2.39E-04 -2.41E-04 6.20E-06 5.61E-05 2.68E-04 -2.55E-04 2.12E-05 6.27E-05 3.14E-04 -2.71E-04 6.20E-06 3.70E-05 1.79E-04 -1.67E-04 1.84E-05 4.69E-05 2.37E-04 -2.00E-04 3.00E-05 2.02E-05 1.24E-04 -6.42E-05 -4.50E-04 PASS 4.50E-04 PASS 3.64E-05 1.82E-05 1.21E-04 -4.83E-05 -4.50E-04 PASS 4.50E-04 PASS 4.80E-05 1.95E-05 1.39E-04 -4.32E-05 -4.50E-04 PASS 4.50E-04 PASS 6.59E-05 1.90E-05 1.54E-04 -2.25E-05 -6.00E-04 PASS 6.00E-04 PASS 5.60E-05 1.88E-05 1.44E-04 -3.16E-05 -6.00E-04 PASS 6.00E-04 PASS 3.65E-05 2.45E-05 1.51E-04 -7.78E-05 -6.00E-04 PASS 6.00E-04 PASS An ISO 9001:2000 Certified Company 19 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 1 @ +/-15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.7. Plot of Offset Current 1 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 20 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.7. Raw data for Offset Current 1 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 1 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 9.30E-11 -1.55E-10 9.00E-12 4.80E-11 -3.20E-11 3.00E-12 -8.00E-12 -4.00E-12 -1.15E-10 1.06E-10 -8.10E-11 10 4.10E-11 -1.15E-10 5.20E-11 1.55E-10 5.20E-11 8.00E-12 6.70E-11 5.00E-12 -1.17E-10 9.00E-11 -6.30E-11 20 1.97E-10 -1.50E-10 9.00E-12 1.94E-10 1.36E-10 1.00E-11 1.43E-10 1.00E-11 -6.10E-11 1.49E-10 -7.90E-11 30 -1.36E-10 3.26E-10 1.90E-10 3.48E-10 1.25E-10 -9.00E-12 1.13E-10 2.00E-11 1.70E-11 1.56E-10 -5.50E-11 50 4.10E-10 -1.01E-10 1.41E-10 8.23E-10 3.10E-10 7.80E-11 2.80E-10 3.90E-11 1.41E-10 2.50E-10 -4.70E-11 60 4.62E-10 -1.22E-10 4.70E-11 3.34E-10 2.85E-10 5.80E-11 2.03E-10 1.53E-10 7.40E-11 2.37E-10 -8.10E-11 70 -3.47E-10 -7.85E-10 -5.18E-10 1.77E-10 -5.86E-10 -5.70E-11 5.10E-11 8.40E-11 7.10E-11 2.62E-10 -1.30E-11 -7.40E-12 9.46E-11 4.34E-10 -4.49E-10 3.70E-11 9.68E-11 4.89E-10 -4.15E-10 7.72E-11 1.48E-10 7.68E-10 -6.14E-10 1.71E-10 1.95E-10 1.08E-09 -7.39E-10 3.17E-10 3.43E-10 1.92E-09 -1.28E-09 2.01E-10 2.35E-10 1.30E-09 -8.95E-10 -4.12E-10 3.65E-10 1.29E-09 -2.11E-09 -3.60E-12 7.82E-11 3.61E-10 -3.69E-10 -1.00E-08 PASS 1.00E-08 PASS 1.06E-11 8.03E-11 3.85E-10 -3.64E-10 -1.00E-08 PASS 1.00E-08 PASS 5.02E-11 9.22E-11 4.80E-10 -3.80E-10 -1.00E-08 PASS 1.00E-08 PASS 5.94E-11 7.11E-11 3.91E-10 -2.72E-10 -1.00E-08 PASS 1.00E-08 PASS 1.58E-10 1.05E-10 6.48E-10 -3.33E-10 -1.50E-08 PASS 1.50E-08 PASS 1.45E-10 7.83E-11 5.10E-10 -2.20E-10 -1.50E-08 PASS 1.50E-08 PASS 8.22E-11 1.15E-10 6.18E-10 -4.54E-10 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 21 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 2 @ +/-15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.8. Plot of Offset Current 2 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 22 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.8. Raw data for Offset Current 2 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 2 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 0.00E+00 -6.50E-11 1.80E-11 -4.30E-11 -2.40E-11 1.20E-11 -5.80E-11 -1.24E-10 4.00E-12 -6.00E-12 -1.10E-11 10 1.80E-11 -1.45E-10 1.05E-10 1.64E-10 -2.50E-11 3.40E-11 -4.50E-11 -1.06E-10 4.20E-11 -3.10E-11 -1.50E-11 20 4.10E-11 -1.21E-10 1.22E-10 3.13E-10 9.00E-12 1.00E-10 1.60E-11 -9.40E-11 1.49E-10 -2.30E-11 -2.30E-11 30 -1.22E-10 3.10E-11 6.00E-11 5.80E-10 7.60E-11 1.06E-10 3.20E-11 -5.50E-11 1.87E-10 5.90E-11 -2.90E-11 50 1.81E-10 -1.50E-10 3.80E-11 9.46E-10 8.80E-11 1.55E-10 1.05E-10 -6.00E-11 1.83E-10 3.11E-10 -3.00E-11 60 3.10E-11 -5.80E-11 2.00E-12 4.87E-10 5.60E-11 1.67E-10 2.15E-10 9.00E-11 2.94E-10 3.11E-10 -4.10E-11 70 -5.76E-10 -8.44E-10 -7.17E-10 7.00E-12 -6.46E-10 7.90E-11 2.10E-11 7.20E-11 2.30E-11 9.30E-11 -2.60E-11 -2.28E-11 3.31E-11 1.32E-10 -1.77E-10 2.34E-11 1.20E-10 5.81E-10 -5.34E-10 7.28E-11 1.60E-10 8.21E-10 -6.75E-10 1.25E-10 2.66E-10 1.37E-09 -1.12E-09 2.21E-10 4.23E-10 2.19E-09 -1.75E-09 1.04E-10 2.19E-10 1.12E-09 -9.16E-10 -5.55E-10 3.30E-10 9.82E-10 -2.09E-09 -3.44E-11 5.71E-11 2.32E-10 -3.01E-10 -1.00E-08 PASS 1.00E-08 PASS -2.12E-11 6.10E-11 2.64E-10 -3.06E-10 -1.00E-08 PASS 1.00E-08 PASS 2.96E-11 9.67E-11 4.81E-10 -4.22E-10 -1.00E-08 PASS 1.00E-08 PASS 6.58E-11 8.96E-11 4.84E-10 -3.52E-10 -1.00E-08 PASS 1.00E-08 PASS 1.39E-10 1.35E-10 7.67E-10 -4.90E-10 -1.50E-08 PASS 1.50E-08 PASS 2.15E-10 9.14E-11 6.42E-10 -2.11E-10 -1.50E-08 PASS 1.50E-08 PASS 5.76E-11 3.34E-11 2.13E-10 -9.81E-11 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 23 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 3 @ +/-15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.9. Plot of Offset Current 3 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 24 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.9. Raw data for Offset Current 3 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 3 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 5.50E-11 8.30E-11 -1.48E-10 -1.30E-10 -6.80E-11 -1.30E-11 -8.20E-11 -8.20E-11 5.10E-11 2.30E-11 -8.20E-11 10 1.20E-10 2.20E-11 -1.34E-10 5.00E-11 -8.80E-11 -7.00E-12 -8.00E-12 -1.40E-10 8.80E-11 7.60E-11 -7.40E-11 20 4.60E-11 8.00E-11 -8.80E-11 2.76E-10 1.70E-11 3.60E-11 -1.43E-10 -2.30E-11 4.90E-11 1.43E-10 -6.40E-11 30 9.50E-11 6.90E-11 -2.19E-10 5.14E-10 1.31E-10 1.70E-11 -3.30E-11 3.10E-11 1.17E-10 1.23E-10 -1.09E-10 50 2.07E-10 1.63E-10 -2.39E-10 8.37E-10 2.15E-10 1.64E-10 1.49E-10 1.05E-10 2.37E-10 2.56E-10 -1.00E-10 60 2.83E-10 -4.20E-11 3.67E-10 5.44E-10 3.28E-10 9.70E-11 9.30E-11 1.39E-10 2.90E-10 7.80E-11 -5.80E-11 70 -2.97E-10 -6.54E-10 -2.50E-11 2.11E-10 -1.04E-09 1.95E-10 -1.40E-11 -2.00E-11 2.96E-10 1.75E-10 -1.06E-10 -4.16E-11 1.06E-10 4.52E-10 -5.35E-10 -6.00E-12 1.04E-10 4.77E-10 -4.89E-10 6.62E-11 1.33E-10 6.87E-10 -5.55E-10 1.18E-10 2.61E-10 1.34E-09 -1.10E-09 2.37E-10 3.85E-10 2.03E-09 -1.56E-09 2.96E-10 2.13E-10 1.29E-09 -6.99E-10 -3.60E-10 4.96E-10 1.96E-09 -2.68E-09 -2.06E-11 6.05E-11 2.62E-10 -3.03E-10 -1.00E-08 PASS 1.00E-08 PASS 1.80E-12 9.11E-11 4.27E-10 -4.23E-10 -1.00E-08 PASS 1.00E-08 PASS 1.24E-11 1.05E-10 5.04E-10 -4.79E-10 -1.00E-08 PASS 1.00E-08 PASS 5.10E-11 6.74E-11 3.65E-10 -2.63E-10 -1.00E-08 PASS 1.00E-08 PASS 1.82E-10 6.29E-11 4.76E-10 -1.11E-10 -1.50E-08 PASS 1.50E-08 PASS 1.39E-10 8.72E-11 5.46E-10 -2.67E-10 -1.50E-08 PASS 1.50E-08 PASS 1.26E-10 1.39E-10 7.74E-10 -5.21E-10 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 25 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 4 @ +/-15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.10. Plot of Offset Current 4 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 26 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.10. Raw data for Offset Current 4 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 4 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 8.50E-11 -3.30E-11 -7.50E-11 -5.50E-11 1.10E-11 6.00E-11 -1.25E-10 4.80E-11 -6.90E-11 1.00E-11 -6.10E-11 10 4.30E-11 -1.74E-10 -7.80E-11 1.15E-10 1.39E-10 1.10E-10 -7.50E-11 -1.80E-11 -1.22E-10 -4.80E-11 -1.29E-10 20 1.33E-10 -1.40E-10 9.00E-12 1.52E-10 2.84E-10 1.27E-10 7.90E-11 -4.90E-11 -1.22E-10 -2.20E-11 -8.60E-11 30 -3.72E-10 2.40E-10 2.10E-11 4.61E-10 3.52E-10 6.20E-11 2.80E-11 -1.90E-11 -1.14E-10 -1.33E-10 -1.04E-10 50 2.99E-10 -6.14E-10 -1.01E-10 7.53E-10 4.25E-10 7.00E-11 8.90E-11 4.70E-11 -4.50E-11 -1.12E-10 -8.40E-11 60 2.96E-10 -2.50E-10 -1.30E-11 -1.75E-09 4.00E-10 1.11E-10 3.40E-11 6.40E-11 -9.60E-11 -1.03E-10 -9.80E-11 70 -1.25E-10 -9.50E-10 -5.91E-10 -2.42E-10 -3.71E-10 3.90E-11 1.19E-10 7.00E-12 -2.30E-11 2.60E-11 -4.90E-11 -1.34E-11 6.36E-11 2.83E-10 -3.10E-10 9.00E-12 1.33E-10 6.28E-10 -6.10E-10 8.76E-11 1.60E-10 8.35E-10 -6.60E-10 1.40E-10 3.30E-10 1.68E-09 -1.40E-09 1.52E-10 5.26E-10 2.61E-09 -2.30E-09 -2.63E-10 8.69E-10 3.79E-09 -4.32E-09 -4.56E-10 3.26E-10 1.06E-09 -1.98E-09 -1.52E-11 7.94E-11 3.55E-10 -3.86E-10 -1.00E-08 PASS 1.00E-08 PASS -3.06E-11 8.74E-11 3.77E-10 -4.38E-10 -1.00E-08 PASS 1.00E-08 PASS 2.60E-12 1.00E-10 4.70E-10 -4.65E-10 -1.00E-08 PASS 1.00E-08 PASS -3.52E-11 8.58E-11 3.65E-10 -4.36E-10 -1.00E-08 PASS 1.00E-08 PASS 9.80E-12 8.53E-11 4.08E-10 -3.88E-10 -1.50E-08 PASS 1.50E-08 PASS 2.00E-12 9.67E-11 4.53E-10 -4.49E-10 -1.50E-08 PASS 1.50E-08 PASS 3.36E-11 5.31E-11 2.82E-10 -2.14E-10 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 27 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 1 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.11. Plot of Positive Bias Current 1 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 28 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.11. Raw data for Positive Bias Current 1 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 1 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.17E-08 1.22E-08 1.01E-08 1.19E-08 1.16E-08 1.13E-08 1.19E-08 1.14E-08 1.25E-08 1.02E-08 9.98E-09 10 1.38E-08 1.44E-08 1.22E-08 1.39E-08 1.39E-08 1.33E-08 1.40E-08 1.34E-08 1.48E-08 1.20E-08 9.99E-09 20 1.63E-08 1.71E-08 1.49E-08 1.67E-08 1.67E-08 1.59E-08 1.65E-08 1.59E-08 1.76E-08 1.44E-08 1.00E-08 30 2.01E-08 1.92E-08 1.79E-08 1.97E-08 2.00E-08 1.87E-08 1.94E-08 1.85E-08 2.06E-08 1.70E-08 1.00E-08 50 2.45E-08 2.58E-08 2.35E-08 2.55E-08 2.58E-08 2.42E-08 2.49E-08 2.38E-08 2.66E-08 2.19E-08 9.99E-09 60 2.64E-08 2.77E-08 2.50E-08 2.77E-08 2.74E-08 2.39E-08 2.44E-08 2.33E-08 2.60E-08 2.11E-08 9.97E-09 70 2.48E-08 2.55E-08 2.26E-08 2.52E-08 2.51E-08 2.05E-08 2.10E-08 2.02E-08 2.24E-08 1.81E-08 9.94E-09 1.15E-08 8.19E-10 1.53E-08 7.66E-09 1.36E-08 8.12E-10 1.74E-08 9.85E-09 1.63E-08 8.52E-10 2.03E-08 1.24E-08 1.94E-08 9.01E-10 2.36E-08 1.52E-08 2.50E-08 9.87E-10 2.96E-08 2.04E-08 2.68E-08 1.14E-09 3.21E-08 2.15E-08 2.46E-08 1.14E-09 3.00E-08 1.93E-08 1.15E-08 8.67E-10 1.55E-08 7.42E-09 -3.00E-08 PASS 3.00E-08 PASS 1.35E-08 1.04E-09 1.83E-08 8.65E-09 -6.00E-08 PASS 6.00E-08 PASS 1.60E-08 1.16E-09 2.15E-08 1.06E-08 -7.50E-08 PASS 7.50E-08 PASS 1.89E-08 1.32E-09 2.50E-08 1.27E-08 -7.50E-08 PASS 7.50E-08 PASS 2.43E-08 1.70E-09 3.22E-08 1.63E-08 -1.00E-07 PASS 1.00E-07 PASS 2.37E-08 1.78E-09 3.20E-08 1.55E-08 -1.00E-07 PASS 1.00E-07 PASS 2.04E-08 1.55E-09 2.77E-08 1.32E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 29 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 2 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.12. Plot of Positive Bias Current 2 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 30 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.12. Raw data for Positive Bias Current 2 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 2 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.19E-08 1.22E-08 1.13E-08 1.24E-08 1.25E-08 1.02E-08 1.29E-08 1.31E-08 1.20E-08 1.13E-08 1.05E-08 10 1.40E-08 1.43E-08 1.38E-08 1.44E-08 1.52E-08 1.23E-08 1.48E-08 1.52E-08 1.41E-08 1.33E-08 1.04E-08 20 1.65E-08 1.70E-08 1.67E-08 1.73E-08 1.83E-08 1.48E-08 1.73E-08 1.78E-08 1.68E-08 1.60E-08 1.04E-08 30 1.99E-08 1.95E-08 2.01E-08 2.05E-08 2.18E-08 1.76E-08 2.02E-08 2.07E-08 1.97E-08 1.89E-08 1.05E-08 50 2.50E-08 2.55E-08 2.63E-08 2.64E-08 2.83E-08 2.28E-08 2.56E-08 2.61E-08 2.54E-08 2.41E-08 1.05E-08 60 2.70E-08 2.73E-08 2.78E-08 2.85E-08 3.00E-08 2.20E-08 2.54E-08 2.57E-08 2.47E-08 2.33E-08 1.04E-08 70 2.51E-08 2.56E-08 2.52E-08 2.60E-08 2.76E-08 1.89E-08 2.22E-08 2.22E-08 2.13E-08 2.01E-08 1.04E-08 1.21E-08 4.78E-10 1.43E-08 9.83E-09 1.44E-08 5.27E-10 1.68E-08 1.19E-08 1.72E-08 6.92E-10 2.04E-08 1.39E-08 2.04E-08 8.85E-10 2.45E-08 1.62E-08 2.63E-08 1.27E-09 3.23E-08 2.04E-08 2.81E-08 1.17E-09 3.36E-08 2.27E-08 2.59E-08 1.01E-09 3.06E-08 2.12E-08 1.19E-08 1.18E-09 1.74E-08 6.40E-09 -3.00E-08 PASS 3.00E-08 PASS 1.39E-08 1.16E-09 1.93E-08 8.53E-09 -6.00E-08 PASS 6.00E-08 PASS 1.65E-08 1.18E-09 2.20E-08 1.10E-08 -7.50E-08 PASS 7.50E-08 PASS 1.94E-08 1.21E-09 2.51E-08 1.38E-08 -7.50E-08 PASS 7.50E-08 PASS 2.48E-08 1.32E-09 3.10E-08 1.86E-08 -1.00E-07 PASS 1.00E-07 PASS 2.42E-08 1.53E-09 3.14E-08 1.71E-08 -1.00E-07 PASS 1.00E-07 PASS 2.09E-08 1.45E-09 2.77E-08 1.42E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 31 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 3 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.13. Plot of Positive Bias Current 3 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 32 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.13. Raw data for Positive Bias Current 3 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 3 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.08E-08 1.11E-08 1.11E-08 1.21E-08 1.20E-08 1.03E-08 1.18E-08 1.27E-08 1.17E-08 1.10E-08 1.00E-08 10 1.28E-08 1.31E-08 1.36E-08 1.42E-08 1.46E-08 1.24E-08 1.37E-08 1.46E-08 1.37E-08 1.29E-08 1.00E-08 20 1.53E-08 1.55E-08 1.64E-08 1.69E-08 1.76E-08 1.51E-08 1.62E-08 1.71E-08 1.63E-08 1.55E-08 1.01E-08 30 1.82E-08 1.80E-08 1.97E-08 2.01E-08 2.09E-08 1.79E-08 1.88E-08 2.00E-08 1.92E-08 1.84E-08 1.01E-08 50 2.32E-08 2.34E-08 2.59E-08 2.58E-08 2.71E-08 2.31E-08 2.39E-08 2.52E-08 2.45E-08 2.36E-08 1.01E-08 60 2.49E-08 2.52E-08 2.67E-08 2.78E-08 2.87E-08 2.25E-08 2.36E-08 2.48E-08 2.39E-08 2.28E-08 1.00E-08 70 2.29E-08 2.36E-08 2.22E-08 2.53E-08 2.66E-08 1.91E-08 2.04E-08 2.15E-08 2.06E-08 1.96E-08 9.99E-09 1.14E-08 5.82E-10 1.42E-08 8.73E-09 1.37E-08 7.43E-10 1.71E-08 1.02E-08 1.63E-08 9.53E-10 2.08E-08 1.19E-08 1.94E-08 1.25E-09 2.52E-08 1.36E-08 2.51E-08 1.73E-09 3.31E-08 1.70E-08 2.67E-08 1.62E-09 3.42E-08 1.91E-08 2.41E-08 1.80E-09 3.25E-08 1.57E-08 1.15E-08 9.07E-10 1.57E-08 7.27E-09 -3.00E-08 PASS 3.00E-08 PASS 1.35E-08 8.47E-10 1.74E-08 9.51E-09 -6.00E-08 PASS 6.00E-08 PASS 1.60E-08 7.95E-10 1.98E-08 1.23E-08 -7.50E-08 PASS 7.50E-08 PASS 1.88E-08 8.08E-10 2.26E-08 1.51E-08 -7.50E-08 PASS 7.50E-08 PASS 2.41E-08 8.13E-10 2.79E-08 2.03E-08 -1.00E-07 PASS 1.00E-07 PASS 2.35E-08 9.06E-10 2.77E-08 1.93E-08 -1.00E-07 PASS 1.00E-07 PASS 2.02E-08 9.49E-10 2.47E-08 1.58E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 33 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 4 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.14. Plot of Positive Bias Current 4 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 34 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.14. Raw data for Positive Bias Current 4 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 4 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.20E-08 1.25E-08 1.10E-08 1.24E-08 1.20E-08 1.10E-08 1.23E-08 1.25E-08 1.30E-08 1.07E-08 1.10E-08 10 1.42E-08 1.48E-08 1.34E-08 1.44E-08 1.43E-08 1.30E-08 1.44E-08 1.45E-08 1.52E-08 1.23E-08 1.10E-08 20 1.68E-08 1.76E-08 1.61E-08 1.73E-08 1.72E-08 1.54E-08 1.71E-08 1.71E-08 1.81E-08 1.49E-08 1.09E-08 30 2.06E-08 1.98E-08 1.94E-08 2.04E-08 2.04E-08 1.83E-08 2.01E-08 2.00E-08 2.13E-08 1.76E-08 1.10E-08 50 2.53E-08 2.65E-08 2.55E-08 2.64E-08 2.65E-08 2.39E-08 2.58E-08 2.56E-08 2.76E-08 2.27E-08 1.10E-08 60 2.73E-08 2.84E-08 2.70E-08 2.85E-08 2.80E-08 2.36E-08 2.52E-08 2.51E-08 2.71E-08 2.20E-08 1.09E-08 70 2.53E-08 2.63E-08 2.43E-08 2.63E-08 2.59E-08 2.00E-08 2.17E-08 2.17E-08 2.31E-08 1.87E-08 1.09E-08 1.20E-08 5.85E-10 1.47E-08 9.25E-09 1.42E-08 5.27E-10 1.67E-08 1.18E-08 1.70E-08 5.59E-10 1.96E-08 1.44E-08 2.01E-08 5.38E-10 2.26E-08 1.76E-08 2.60E-08 5.88E-10 2.88E-08 2.33E-08 2.78E-08 6.67E-10 3.09E-08 2.47E-08 2.56E-08 8.53E-10 2.96E-08 2.16E-08 1.19E-08 1.02E-09 1.66E-08 7.15E-09 -3.00E-08 PASS 3.00E-08 PASS 1.39E-08 1.19E-09 1.95E-08 8.32E-09 -6.00E-08 PASS 6.00E-08 PASS 1.65E-08 1.31E-09 2.27E-08 1.04E-08 -7.50E-08 PASS 7.50E-08 PASS 1.95E-08 1.50E-09 2.64E-08 1.25E-08 -7.50E-08 PASS 7.50E-08 PASS 2.51E-08 1.88E-09 3.38E-08 1.63E-08 -1.00E-07 PASS 1.00E-07 PASS 2.46E-08 1.90E-09 3.35E-08 1.57E-08 -1.00E-07 PASS 1.00E-07 PASS 2.10E-08 1.72E-09 2.90E-08 1.30E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 35 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 1 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.15. Plot of Negative Bias Current 1 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 36 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.15. Raw data for Negative Bias Current 1 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 1 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.18E-08 1.21E-08 1.01E-08 1.20E-08 1.16E-08 1.13E-08 1.19E-08 1.15E-08 1.25E-08 1.03E-08 9.99E-09 10 1.40E-08 1.43E-08 1.23E-08 1.41E-08 1.40E-08 1.33E-08 1.41E-08 1.35E-08 1.48E-08 1.22E-08 9.99E-09 20 1.65E-08 1.71E-08 1.50E-08 1.69E-08 1.68E-08 1.60E-08 1.67E-08 1.59E-08 1.77E-08 1.46E-08 1.00E-08 30 2.00E-08 1.95E-08 1.82E-08 2.03E-08 2.03E-08 1.88E-08 1.97E-08 1.86E-08 2.06E-08 1.72E-08 9.97E-09 50 2.51E-08 2.58E-08 2.38E-08 2.64E-08 2.62E-08 2.44E-08 2.53E-08 2.40E-08 2.69E-08 2.22E-08 1.00E-08 60 2.69E-08 2.75E-08 2.52E-08 2.82E-08 2.77E-08 2.42E-08 2.47E-08 2.36E-08 2.63E-08 2.14E-08 1.00E-08 70 2.45E-08 2.48E-08 2.22E-08 2.55E-08 2.46E-08 2.05E-08 2.11E-08 2.03E-08 2.26E-08 1.84E-08 1.00E-08 1.15E-08 8.09E-10 1.53E-08 7.74E-09 1.37E-08 8.11E-10 1.75E-08 9.95E-09 1.65E-08 8.38E-10 2.04E-08 1.26E-08 1.97E-08 8.94E-10 2.38E-08 1.55E-08 2.55E-08 1.04E-09 3.03E-08 2.06E-08 2.71E-08 1.15E-09 3.25E-08 2.18E-08 2.43E-08 1.23E-09 3.00E-08 1.86E-08 1.15E-08 8.04E-10 1.53E-08 7.76E-09 -3.00E-08 PASS 3.00E-08 PASS 1.36E-08 9.76E-10 1.81E-08 9.03E-09 -6.00E-08 PASS 6.00E-08 PASS 1.62E-08 1.13E-09 2.15E-08 1.09E-08 -7.50E-08 PASS 7.50E-08 PASS 1.90E-08 1.27E-09 2.49E-08 1.31E-08 -7.50E-08 PASS 7.50E-08 PASS 2.46E-08 1.73E-09 3.26E-08 1.65E-08 -1.00E-07 PASS 1.00E-07 PASS 2.40E-08 1.77E-09 3.23E-08 1.58E-08 -1.00E-07 PASS 1.00E-07 PASS 2.06E-08 1.54E-09 2.78E-08 1.34E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 37 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 2 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.16. Plot of Negative Bias Current 2 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 38 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.16. Raw data for Negative Bias Current 2 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 2 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.19E-08 1.22E-08 1.14E-08 1.24E-08 1.25E-08 1.03E-08 1.28E-08 1.30E-08 1.21E-08 1.13E-08 1.04E-08 10 1.41E-08 1.43E-08 1.39E-08 1.48E-08 1.53E-08 1.24E-08 1.49E-08 1.51E-08 1.42E-08 1.33E-08 1.04E-08 20 1.67E-08 1.70E-08 1.69E-08 1.78E-08 1.84E-08 1.49E-08 1.75E-08 1.78E-08 1.70E-08 1.61E-08 1.04E-08 30 1.99E-08 1.96E-08 2.02E-08 2.12E-08 2.20E-08 1.77E-08 2.03E-08 2.08E-08 2.00E-08 1.90E-08 1.05E-08 50 2.52E-08 2.54E-08 2.65E-08 2.75E-08 2.85E-08 2.31E-08 2.59E-08 2.62E-08 2.57E-08 2.45E-08 1.05E-08 60 2.71E-08 2.74E-08 2.79E-08 2.90E-08 3.01E-08 2.24E-08 2.57E-08 2.60E-08 2.51E-08 2.37E-08 1.04E-08 70 2.46E-08 2.48E-08 2.45E-08 2.62E-08 2.70E-08 1.90E-08 2.23E-08 2.24E-08 2.15E-08 2.03E-08 1.05E-08 1.21E-08 4.44E-10 1.42E-08 1.00E-08 1.45E-08 5.59E-10 1.71E-08 1.19E-08 1.73E-08 7.23E-10 2.07E-08 1.40E-08 2.06E-08 9.99E-10 2.52E-08 1.59E-08 2.66E-08 1.38E-09 3.31E-08 2.02E-08 2.83E-08 1.26E-09 3.42E-08 2.24E-08 2.54E-08 1.10E-09 3.06E-08 2.03E-08 1.19E-08 1.12E-09 1.71E-08 6.71E-09 -3.00E-08 PASS 3.00E-08 PASS 1.40E-08 1.11E-09 1.92E-08 8.80E-09 -6.00E-08 PASS 6.00E-08 PASS 1.67E-08 1.15E-09 2.20E-08 1.13E-08 -7.50E-08 PASS 7.50E-08 PASS 1.96E-08 1.21E-09 2.52E-08 1.39E-08 -7.50E-08 PASS 7.50E-08 PASS 2.51E-08 1.29E-09 3.11E-08 1.90E-08 -1.00E-07 PASS 1.00E-07 PASS 2.46E-08 1.49E-09 3.15E-08 1.76E-08 -1.00E-07 PASS 1.00E-07 PASS 2.11E-08 1.46E-09 2.79E-08 1.43E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 39 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 3 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.17. Plot of Negative Bias Current 3 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 40 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.17. Raw data for Negative Bias Current 3 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 3 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.08E-08 1.13E-08 1.10E-08 1.21E-08 1.20E-08 1.04E-08 1.18E-08 1.26E-08 1.18E-08 1.10E-08 9.98E-09 10 1.30E-08 1.32E-08 1.35E-08 1.43E-08 1.46E-08 1.26E-08 1.38E-08 1.46E-08 1.38E-08 1.30E-08 1.00E-08 20 1.55E-08 1.57E-08 1.63E-08 1.73E-08 1.77E-08 1.51E-08 1.61E-08 1.73E-08 1.65E-08 1.56E-08 1.00E-08 30 1.84E-08 1.81E-08 1.96E-08 2.06E-08 2.11E-08 1.80E-08 1.88E-08 2.01E-08 1.94E-08 1.85E-08 1.00E-08 50 2.35E-08 2.37E-08 2.57E-08 2.67E-08 2.74E-08 2.35E-08 2.41E-08 2.53E-08 2.49E-08 2.40E-08 1.01E-08 60 2.54E-08 2.53E-08 2.72E-08 2.84E-08 2.91E-08 2.27E-08 2.38E-08 2.50E-08 2.43E-08 2.31E-08 9.97E-09 70 2.28E-08 2.31E-08 2.22E-08 2.57E-08 2.61E-08 1.93E-08 2.05E-08 2.17E-08 2.09E-08 1.99E-08 1.00E-08 1.15E-08 5.69E-10 1.41E-08 8.79E-09 1.37E-08 7.13E-10 1.70E-08 1.04E-08 1.65E-08 9.94E-10 2.11E-08 1.19E-08 1.95E-08 1.31E-09 2.57E-08 1.34E-08 2.54E-08 1.77E-09 3.37E-08 1.71E-08 2.71E-08 1.72E-09 3.51E-08 1.90E-08 2.40E-08 1.78E-09 3.23E-08 1.56E-08 1.15E-08 8.57E-10 1.55E-08 7.55E-09 -3.00E-08 PASS 3.00E-08 PASS 1.35E-08 7.97E-10 1.73E-08 9.83E-09 -6.00E-08 PASS 6.00E-08 PASS 1.61E-08 8.24E-10 2.00E-08 1.23E-08 -7.50E-08 PASS 7.50E-08 PASS 1.90E-08 8.22E-10 2.28E-08 1.52E-08 -7.50E-08 PASS 7.50E-08 PASS 2.43E-08 7.37E-10 2.78E-08 2.09E-08 -1.00E-07 PASS 1.00E-07 PASS 2.38E-08 9.18E-10 2.81E-08 1.95E-08 -1.00E-07 PASS 1.00E-07 PASS 2.05E-08 9.09E-10 2.47E-08 1.62E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 41 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 4 @ +/-15V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.18. Plot of Negative Bias Current 4 @ +/-15V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 42 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.18. Raw data for Negative Bias Current 4 @ +/-15V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 4 @ +/-15V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.21E-08 1.26E-08 1.10E-08 1.23E-08 1.20E-08 1.11E-08 1.22E-08 1.25E-08 1.29E-08 1.07E-08 1.09E-08 10 1.45E-08 1.46E-08 1.34E-08 1.46E-08 1.45E-08 1.31E-08 1.44E-08 1.46E-08 1.52E-08 1.24E-08 1.10E-08 20 1.70E-08 1.75E-08 1.62E-08 1.75E-08 1.76E-08 1.56E-08 1.72E-08 1.72E-08 1.81E-08 1.49E-08 1.09E-08 30 2.05E-08 2.01E-08 1.95E-08 2.09E-08 2.08E-08 1.85E-08 2.03E-08 2.01E-08 2.13E-08 1.76E-08 1.09E-08 50 2.58E-08 2.60E-08 2.55E-08 2.72E-08 2.70E-08 2.41E-08 2.60E-08 2.57E-08 2.76E-08 2.28E-08 1.09E-08 60 2.77E-08 2.82E-08 2.71E-08 2.70E-08 2.86E-08 2.38E-08 2.55E-08 2.52E-08 2.71E-08 2.21E-08 1.09E-08 70 2.53E-08 2.55E-08 2.39E-08 2.61E-08 2.57E-08 2.01E-08 2.19E-08 2.19E-08 2.32E-08 1.88E-08 1.09E-08 1.20E-08 6.16E-10 1.49E-08 9.13E-09 1.43E-08 4.89E-10 1.66E-08 1.20E-08 1.71E-08 5.77E-10 1.98E-08 1.45E-08 2.04E-08 5.70E-10 2.30E-08 1.77E-08 2.63E-08 7.65E-10 2.99E-08 2.28E-08 2.77E-08 7.01E-10 3.10E-08 2.44E-08 2.53E-08 8.51E-10 2.93E-08 2.13E-08 1.19E-08 9.50E-10 1.63E-08 7.46E-09 -3.00E-08 PASS 3.00E-08 PASS 1.40E-08 1.15E-09 1.93E-08 8.57E-09 -6.00E-08 PASS 6.00E-08 PASS 1.66E-08 1.28E-09 2.26E-08 1.06E-08 -7.50E-08 PASS 7.50E-08 PASS 1.96E-08 1.48E-09 2.65E-08 1.26E-08 -7.50E-08 PASS 7.50E-08 PASS 2.52E-08 1.87E-09 3.40E-08 1.65E-08 -1.00E-07 PASS 1.00E-07 PASS 2.47E-08 1.87E-09 3.35E-08 1.60E-08 -1.00E-07 PASS 1.00E-07 PASS 2.12E-08 1.71E-09 2.92E-08 1.32E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 43 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Common Mode Rejection Ratio 1 (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.19. Plot of Common Mode Rejection Ratio 1 (dB) versus total dose. The data show a significant degradation with radiation, however it is not sufficient for the measured parameter to fall below specification. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the An ISO 9001:2000 Certified Company 44 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.19. Raw data for Common Mode Rejection Ratio 1 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 1 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.12E+02 1.18E+02 1.13E+02 1.17E+02 1.35E+02 1.18E+02 1.32E+02 1.18E+02 1.15E+02 1.17E+02 1.18E+02 10 1.11E+02 1.15E+02 1.11E+02 1.14E+02 1.24E+02 1.17E+02 1.27E+02 1.16E+02 1.12E+02 1.15E+02 1.18E+02 20 1.10E+02 1.13E+02 1.10E+02 1.13E+02 1.22E+02 1.15E+02 1.23E+02 1.15E+02 1.11E+02 1.14E+02 1.17E+02 30 1.13E+02 1.09E+02 1.09E+02 1.12E+02 1.20E+02 1.15E+02 1.20E+02 1.14E+02 1.11E+02 1.13E+02 1.18E+02 50 1.09E+02 1.12E+02 1.09E+02 1.11E+02 1.18E+02 1.14E+02 1.18E+02 1.12E+02 1.10E+02 1.12E+02 1.18E+02 60 1.10E+02 1.13E+02 1.10E+02 1.12E+02 1.21E+02 1.15E+02 1.19E+02 1.14E+02 1.10E+02 1.13E+02 1.18E+02 70 1.10E+02 1.15E+02 1.11E+02 1.14E+02 1.27E+02 1.16E+02 1.22E+02 1.15E+02 1.12E+02 1.14E+02 1.18E+02 1.19E+02 9.51E+00 1.63E+02 7.45E+01 1.15E+02 5.53E+00 1.41E+02 8.90E+01 1.14E+02 5.18E+00 1.38E+02 8.95E+01 1.13E+02 4.18E+00 1.32E+02 9.32E+01 1.12E+02 3.82E+00 1.30E+02 9.40E+01 1.13E+02 4.70E+00 1.35E+02 9.12E+01 1.16E+02 6.69E+00 1.47E+02 8.43E+01 1.20E+02 6.96E+00 1.53E+02 8.77E+01 9.70E+01 FAIL 1.17E+02 5.52E+00 1.43E+02 9.15E+01 9.70E+01 FAIL 1.16E+02 4.46E+00 1.36E+02 9.49E+01 9.70E+01 FAIL 1.15E+02 3.40E+00 1.30E+02 9.87E+01 9.70E+01 FAIL 1.13E+02 2.97E+00 1.27E+02 9.92E+01 9.40E+01 PASS 1.14E+02 3.07E+00 1.28E+02 9.95E+01 9.40E+01 FAIL 1.16E+02 3.77E+00 1.33E+02 9.82E+01 9.40E+01 FAIL An ISO 9001:2000 Certified Company 45 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Common Mode Rejection Ratio 2 (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.20. Plot of Common Mode Rejection Ratio 2 (dB) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 46 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.20. Raw data for Common Mode Rejection Ratio 2 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 2 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.13E+02 1.20E+02 1.16E+02 1.15E+02 1.21E+02 1.17E+02 1.15E+02 1.19E+02 1.11E+02 1.14E+02 1.30E+02 10 1.12E+02 1.17E+02 1.14E+02 1.12E+02 1.17E+02 1.15E+02 1.13E+02 1.16E+02 1.10E+02 1.14E+02 1.29E+02 20 1.11E+02 1.16E+02 1.12E+02 1.12E+02 1.16E+02 1.14E+02 1.12E+02 1.15E+02 1.09E+02 1.12E+02 1.32E+02 30 1.15E+02 1.11E+02 1.12E+02 1.12E+02 1.16E+02 1.13E+02 1.11E+02 1.14E+02 1.09E+02 1.12E+02 1.31E+02 50 1.10E+02 1.14E+02 1.11E+02 1.11E+02 1.14E+02 1.12E+02 1.10E+02 1.13E+02 1.08E+02 1.11E+02 1.32E+02 60 1.11E+02 1.15E+02 1.12E+02 1.12E+02 1.16E+02 1.13E+02 1.11E+02 1.14E+02 1.09E+02 1.11E+02 1.32E+02 70 1.12E+02 1.17E+02 1.14E+02 1.13E+02 1.18E+02 1.15E+02 1.13E+02 1.15E+02 1.10E+02 1.13E+02 1.30E+02 1.17E+02 3.60E+00 1.34E+02 1.00E+02 1.14E+02 2.65E+00 1.27E+02 1.02E+02 1.13E+02 2.43E+00 1.25E+02 1.02E+02 1.13E+02 2.30E+00 1.24E+02 1.02E+02 1.12E+02 2.01E+00 1.22E+02 1.03E+02 1.13E+02 2.29E+00 1.24E+02 1.03E+02 1.14E+02 2.57E+00 1.26E+02 1.02E+02 1.15E+02 2.74E+00 1.28E+02 1.02E+02 9.70E+01 PASS 1.14E+02 2.32E+00 1.25E+02 1.03E+02 9.70E+01 PASS 1.13E+02 2.08E+00 1.22E+02 1.03E+02 9.70E+01 PASS 1.12E+02 1.84E+00 1.20E+02 1.03E+02 9.70E+01 PASS 1.11E+02 1.75E+00 1.19E+02 1.03E+02 9.40E+01 PASS 1.12E+02 1.94E+00 1.21E+02 1.03E+02 9.40E+01 PASS 1.13E+02 2.18E+00 1.23E+02 1.03E+02 9.40E+01 PASS An ISO 9001:2000 Certified Company 47 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased 1.30E+02 Common Mode Rejection Ratio 3 (dB) 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.21. Plot of Common Mode Rejection Ratio 3 (dB) versus total dose. The data show some degradation with radiation, however it is not sufficient for the measured parameter to fall below specification. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach.. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the An ISO 9001:2000 Certified Company 48 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.21. Raw data for Common Mode Rejection Ratio 3 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 3 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.16E+02 1.13E+02 1.16E+02 1.16E+02 1.31E+02 1.32E+02 1.13E+02 1.21E+02 1.16E+02 1.30E+02 1.25E+02 10 1.15E+02 1.12E+02 1.14E+02 1.14E+02 1.22E+02 1.24E+02 1.12E+02 1.19E+02 1.14E+02 1.26E+02 1.26E+02 20 1.14E+02 1.11E+02 1.13E+02 1.13E+02 1.21E+02 1.21E+02 1.10E+02 1.16E+02 1.13E+02 1.21E+02 1.25E+02 30 1.11E+02 1.13E+02 1.12E+02 1.13E+02 1.20E+02 1.19E+02 1.10E+02 1.16E+02 1.12E+02 1.20E+02 1.24E+02 50 1.13E+02 1.10E+02 1.11E+02 1.12E+02 1.19E+02 1.17E+02 1.09E+02 1.14E+02 1.11E+02 1.17E+02 1.25E+02 60 1.15E+02 1.11E+02 1.12E+02 1.14E+02 1.21E+02 1.18E+02 1.10E+02 1.14E+02 1.12E+02 1.18E+02 1.25E+02 70 1.15E+02 1.12E+02 1.14E+02 1.15E+02 1.25E+02 1.26E+02 1.11E+02 1.17E+02 1.14E+02 1.22E+02 1.25E+02 1.19E+02 6.91E+00 1.51E+02 8.64E+01 1.16E+02 4.04E+00 1.34E+02 9.66E+01 1.14E+02 3.60E+00 1.31E+02 9.76E+01 1.14E+02 3.51E+00 1.30E+02 9.77E+01 1.13E+02 3.46E+00 1.29E+02 9.68E+01 1.15E+02 3.86E+00 1.33E+02 9.65E+01 1.16E+02 5.26E+00 1.41E+02 9.17E+01 1.23E+02 8.44E+00 1.62E+02 8.31E+01 9.70E+01 FAIL 1.19E+02 6.11E+00 1.47E+02 9.05E+01 9.70E+01 FAIL 1.16E+02 4.69E+00 1.38E+02 9.45E+01 9.70E+01 FAIL 1.15E+02 4.21E+00 1.35E+02 9.57E+01 9.70E+01 FAIL 1.13E+02 3.44E+00 1.29E+02 9.74E+01 9.40E+01 PASS 1.14E+02 3.85E+00 1.32E+02 9.64E+01 9.40E+01 PASS 1.18E+02 6.02E+00 1.46E+02 9.01E+01 9.40E+01 FAIL An ISO 9001:2000 Certified Company 49 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Common Mode Rejection Ratio 4 (dB) 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.22. Plot of Common Mode Rejection Ratio 4 (dB) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 50 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.22. Raw data for Common Mode Rejection Ratio 4 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 4 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.15E+02 1.17E+02 1.17E+02 1.13E+02 1.15E+02 1.08E+02 1.15E+02 1.13E+02 1.11E+02 1.13E+02 1.24E+02 10 1.14E+02 1.15E+02 1.14E+02 1.12E+02 1.14E+02 1.08E+02 1.15E+02 1.13E+02 1.11E+02 1.12E+02 1.25E+02 20 1.13E+02 1.14E+02 1.13E+02 1.11E+02 1.13E+02 1.07E+02 1.14E+02 1.12E+02 1.10E+02 1.12E+02 1.24E+02 30 1.14E+02 1.13E+02 1.12E+02 1.11E+02 1.12E+02 1.07E+02 1.13E+02 1.11E+02 1.09E+02 1.11E+02 1.27E+02 50 1.12E+02 1.14E+02 1.11E+02 1.11E+02 1.11E+02 1.07E+02 1.12E+02 1.10E+02 1.08E+02 1.10E+02 1.24E+02 60 1.12E+02 1.17E+02 1.13E+02 1.12E+02 1.13E+02 1.07E+02 1.13E+02 1.11E+02 1.09E+02 1.10E+02 1.25E+02 70 1.14E+02 1.15E+02 1.15E+02 1.14E+02 1.14E+02 1.07E+02 1.15E+02 1.12E+02 1.10E+02 1.12E+02 1.23E+02 1.15E+02 1.37E+00 1.22E+02 1.09E+02 1.14E+02 8.59E-01 1.18E+02 1.10E+02 1.13E+02 9.15E-01 1.17E+02 1.09E+02 1.12E+02 1.09E+00 1.17E+02 1.07E+02 1.12E+02 1.46E+00 1.19E+02 1.05E+02 1.13E+02 2.29E+00 1.24E+02 1.03E+02 1.14E+02 7.43E-01 1.18E+02 1.11E+02 1.12E+02 2.60E+00 1.24E+02 1.00E+02 9.70E+01 PASS 1.12E+02 2.67E+00 1.24E+02 9.91E+01 9.70E+01 PASS 1.11E+02 2.49E+00 1.22E+02 9.92E+01 9.70E+01 PASS 1.10E+02 2.14E+00 1.20E+02 1.00E+02 9.70E+01 PASS 1.09E+02 1.97E+00 1.19E+02 1.00E+02 9.40E+01 PASS 1.10E+02 2.20E+00 1.20E+02 9.95E+01 9.40E+01 PASS 1.11E+02 2.67E+00 1.24E+02 9.88E+01 9.40E+01 PASS An ISO 9001:2000 Certified Company 51 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Power Supply Rejection Ratio 1 (dB) 1.60E+02 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.23. Plot of Power Supply Rejection Ratio 1 (dB) versus total dose. The data show no significant degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 52 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.23. Raw data for Power Supply Rejection Ratio 1 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 1 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.22E+02 1.40E+02 1.33E+02 1.26E+02 1.53E+02 1.29E+02 1.34E+02 1.23E+02 1.38E+02 1.24E+02 1.24E+02 10 1.23E+02 1.32E+02 1.32E+02 1.30E+02 1.65E+02 1.31E+02 1.32E+02 1.28E+02 1.32E+02 1.27E+02 1.27E+02 20 1.25E+02 1.39E+02 1.51E+02 1.29E+02 1.29E+02 1.47E+02 1.33E+02 1.26E+02 1.34E+02 1.28E+02 1.23E+02 30 1.52E+02 1.25E+02 1.31E+02 1.38E+02 1.40E+02 1.32E+02 1.40E+02 1.23E+02 1.57E+02 1.28E+02 1.24E+02 50 1.31E+02 1.50E+02 1.49E+02 1.31E+02 1.27E+02 1.41E+02 1.30E+02 1.33E+02 1.57E+02 1.38E+02 1.23E+02 60 1.26E+02 1.54E+02 1.36E+02 1.53E+02 1.28E+02 1.53E+02 1.47E+02 1.28E+02 1.41E+02 1.29E+02 1.22E+02 70 1.22E+02 1.31E+02 1.45E+02 1.30E+02 1.41E+02 1.48E+02 1.32E+02 1.25E+02 1.29E+02 1.27E+02 1.22E+02 1.35E+02 1.25E+01 1.93E+02 7.68E+01 1.36E+02 1.62E+01 2.12E+02 6.07E+01 1.34E+02 1.06E+01 1.84E+02 8.52E+01 1.37E+02 1.02E+01 1.85E+02 8.97E+01 1.38E+02 1.09E+01 1.88E+02 8.69E+01 1.40E+02 1.31E+01 2.01E+02 7.85E+01 1.34E+02 8.96E+00 1.76E+02 9.21E+01 1.30E+02 6.33E+00 1.59E+02 1.00E+02 1.00E+02 FAIL 1.30E+02 2.35E+00 1.41E+02 1.19E+02 1.00E+02 FAIL 1.34E+02 8.31E+00 1.73E+02 9.50E+01 9.80E+01 FAIL 1.36E+02 1.33E+01 1.98E+02 7.39E+01 9.80E+01 FAIL 1.40E+02 1.03E+01 1.88E+02 9.20E+01 9.40E+01 FAIL 1.39E+02 1.08E+01 1.90E+02 8.89E+01 9.40E+01 FAIL 1.32E+02 9.33E+00 1.76E+02 8.88E+01 9.40E+01 FAIL An ISO 9001:2000 Certified Company 53 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased 1.60E+02 Power Supply Rejection Ratio 2 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.24. Plot of Power Supply Rejection Ratio 2 (dB) versus total dose. The data show no significant degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 54 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.24. Raw data for Power Supply Rejection Ratio 2 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 2 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.32E+02 1.20E+02 1.32E+02 1.34E+02 1.31E+02 1.22E+02 1.48E+02 1.54E+02 1.34E+02 1.30E+02 1.25E+02 10 1.33E+02 1.20E+02 1.34E+02 1.38E+02 1.34E+02 1.23E+02 1.37E+02 1.40E+02 1.30E+02 1.35E+02 1.25E+02 20 1.35E+02 1.19E+02 1.57E+02 1.39E+02 1.35E+02 1.24E+02 1.30E+02 1.57E+02 1.32E+02 1.35E+02 1.25E+02 30 1.18E+02 1.38E+02 1.43E+02 1.80E+02 1.43E+02 1.23E+02 1.33E+02 1.42E+02 1.39E+02 1.37E+02 1.24E+02 50 1.47E+02 1.19E+02 1.45E+02 1.89E+02 1.52E+02 1.24E+02 1.25E+02 1.33E+02 1.65E+02 1.48E+02 1.25E+02 60 1.43E+02 1.18E+02 1.38E+02 1.57E+02 1.63E+02 1.24E+02 1.30E+02 1.31E+02 1.53E+02 1.41E+02 1.24E+02 70 1.30E+02 1.19E+02 1.42E+02 1.33E+02 1.31E+02 1.22E+02 1.29E+02 1.43E+02 1.33E+02 1.32E+02 1.24E+02 1.30E+02 5.50E+00 1.56E+02 1.04E+02 1.32E+02 6.97E+00 1.64E+02 9.92E+01 1.37E+02 1.38E+01 2.01E+02 7.25E+01 1.45E+02 2.25E+01 2.50E+02 3.95E+01 1.50E+02 2.50E+01 2.67E+02 3.37E+01 1.44E+02 1.75E+01 2.25E+02 6.21E+01 1.31E+02 8.28E+00 1.69E+02 9.22E+01 1.38E+02 1.33E+01 2.00E+02 7.55E+01 1.00E+02 FAIL 1.33E+02 6.84E+00 1.65E+02 1.01E+02 1.00E+02 FAIL 1.35E+02 1.28E+01 1.95E+02 7.57E+01 9.80E+01 FAIL 1.35E+02 7.26E+00 1.69E+02 1.01E+02 9.80E+01 FAIL 1.39E+02 1.75E+01 2.21E+02 5.72E+01 9.40E+01 FAIL 1.36E+02 1.15E+01 1.89E+02 8.20E+01 9.40E+01 FAIL 1.32E+02 7.43E+00 1.67E+02 9.73E+01 9.40E+01 FAIL An ISO 9001:2000 Certified Company 55 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased 1.60E+02 Power Supply Rejection Ratio 3 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.25. Plot of Power Supply Rejection Ratio 3 (dB) versus total dose. The data show no significant degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 56 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.25. Raw data for Power Supply Rejection Ratio 3 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 3 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.21E+02 1.21E+02 1.32E+02 1.26E+02 1.22E+02 1.24E+02 1.34E+02 1.40E+02 1.52E+02 1.19E+02 1.22E+02 10 1.21E+02 1.25E+02 1.28E+02 1.29E+02 1.22E+02 1.24E+02 1.37E+02 1.54E+02 1.45E+02 1.22E+02 1.25E+02 20 1.22E+02 1.30E+02 1.25E+02 1.33E+02 1.22E+02 1.31E+02 1.32E+02 1.30E+02 1.59E+02 1.23E+02 1.22E+02 30 1.30E+02 1.20E+02 1.23E+02 1.48E+02 1.26E+02 1.24E+02 1.50E+02 1.39E+02 1.49E+02 1.22E+02 1.21E+02 50 1.26E+02 1.26E+02 1.24E+02 1.36E+02 1.30E+02 1.26E+02 1.34E+02 1.35E+02 1.34E+02 1.26E+02 1.23E+02 60 1.24E+02 1.25E+02 1.24E+02 1.62E+02 1.29E+02 1.25E+02 1.42E+02 1.52E+02 1.29E+02 1.27E+02 1.21E+02 70 1.20E+02 1.22E+02 1.24E+02 1.37E+02 1.23E+02 1.26E+02 1.54E+02 1.36E+02 1.41E+02 1.23E+02 1.24E+02 1.24E+02 4.72E+00 1.46E+02 1.02E+02 1.25E+02 3.72E+00 1.42E+02 1.08E+02 1.26E+02 4.97E+00 1.50E+02 1.03E+02 1.29E+02 1.09E+01 1.80E+02 7.83E+01 1.28E+02 4.87E+00 1.51E+02 1.06E+02 1.33E+02 1.63E+01 2.09E+02 5.64E+01 1.25E+02 6.56E+00 1.56E+02 9.48E+01 1.34E+02 1.29E+01 1.94E+02 7.36E+01 1.00E+02 FAIL 1.36E+02 1.35E+01 1.99E+02 7.35E+01 1.00E+02 FAIL 1.35E+02 1.39E+01 2.00E+02 7.06E+01 9.80E+01 FAIL 1.37E+02 1.34E+01 1.99E+02 7.41E+01 9.80E+01 FAIL 1.31E+02 4.53E+00 1.52E+02 1.10E+02 9.40E+01 PASS 1.35E+02 1.15E+01 1.89E+02 8.14E+01 9.40E+01 FAIL 1.36E+02 1.25E+01 1.95E+02 7.77E+01 9.40E+01 FAIL An ISO 9001:2000 Certified Company 57 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Power Supply Rejection Ratio 4 (dB) 1.60E+02 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.26. Plot of Power Supply Rejection Ratio 4 (dB) versus total dose. The data show no significant degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 58 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.26. Raw data for Power Supply Rejection Ratio 4 (dB) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 4 (dB) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.24E+02 1.26E+02 1.45E+02 1.23E+02 1.27E+02 1.16E+02 1.28E+02 1.37E+02 1.37E+02 1.28E+02 1.37E+02 10 1.25E+02 1.23E+02 1.78E+02 1.24E+02 1.27E+02 1.16E+02 1.32E+02 1.42E+02 1.44E+02 1.37E+02 1.40E+02 20 1.29E+02 1.20E+02 1.29E+02 1.26E+02 1.26E+02 1.17E+02 1.23E+02 1.37E+02 1.54E+02 1.31E+02 1.37E+02 30 1.23E+02 1.26E+02 1.26E+02 1.30E+02 1.33E+02 1.16E+02 1.27E+02 1.37E+02 1.33E+02 1.27E+02 1.34E+02 50 1.39E+02 1.24E+02 1.32E+02 1.27E+02 1.38E+02 1.16E+02 1.22E+02 1.28E+02 1.28E+02 1.43E+02 1.50E+02 60 1.26E+02 1.25E+02 1.26E+02 1.40E+02 1.38E+02 1.16E+02 1.24E+02 1.44E+02 1.27E+02 1.49E+02 1.34E+02 70 1.25E+02 1.24E+02 1.43E+02 1.25E+02 1.23E+02 1.16E+02 1.24E+02 1.33E+02 1.39E+02 1.37E+02 1.29E+02 1.29E+02 9.18E+00 1.72E+02 8.63E+01 1.36E+02 2.40E+01 2.47E+02 2.36E+01 1.26E+02 3.55E+00 1.43E+02 1.10E+02 1.28E+02 4.00E+00 1.46E+02 1.09E+02 1.32E+02 6.48E+00 1.62E+02 1.02E+02 1.31E+02 7.25E+00 1.65E+02 9.70E+01 1.28E+02 8.26E+00 1.66E+02 8.93E+01 1.29E+02 8.66E+00 1.70E+02 8.88E+01 1.00E+02 FAIL 1.34E+02 1.13E+01 1.87E+02 8.15E+01 1.00E+02 FAIL 1.33E+02 1.41E+01 1.98E+02 6.66E+01 9.80E+01 FAIL 1.28E+02 7.68E+00 1.64E+02 9.20E+01 9.80E+01 FAIL 1.28E+02 9.95E+00 1.74E+02 8.11E+01 9.40E+01 FAIL 1.32E+02 1.36E+01 1.95E+02 6.87E+01 9.40E+01 FAIL 1.30E+02 9.62E+00 1.74E+02 8.46E+01 9.40E+01 FAIL An ISO 9001:2000 Certified Company 59 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 9 RL=10k VO=+/-10V (V/mV) 5.00E+05 0.00E+00 -5.00E+05 -1.00E+06 -1.50E+06 -2.00E+06 -2.50E+06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.27. Plot of Open Loop Gain 9 RL=10k VO=+/-10V (V/mV) versus total dose. The data show significant degradation with radiation, however not sufficient for the average of the measured data to fall below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as An ISO 9001:2000 Certified Company 60 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.27. Raw data for Open Loop Gain 9 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Open Loop Gain 9 RL=10k VO=+/-10V (V/mV) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 7.74E+03 1.60E+04 5.16E+04 1.26E+04 4.07E+04 4.49E+03 1.95E+04 1.08E+06 8.06E+04 6.48E+04 1.60E+04 10 5.18E+03 5.85E+03 1.31E+04 9.95E+03 7.47E+04 4.92E+03 9.99E+04 2.55E+04 6.04E+03 2.94E+04 6.84E+04 20 6.30E+03 6.25E+03 1.03E+04 5.93E+03 1.94E+04 4.92E+03 1.33E+04 8.54E+03 5.64E+03 9.48E+03 8.33E+05 30 6.10E+03 5.34E+03 7.20E+03 5.28E+03 1.43E+04 6.09E+03 7.91E+03 6.65E+03 4.95E+03 1.06E+04 1.74E+04 50 4.53E+03 3.57E+03 3.62E+03 4.11E+03 4.73E+03 6.65E+03 1.45E+04 3.60E+03 3.98E+03 6.83E+03 4.33E+04 60 3.78E+03 3.69E+03 5.37E+03 4.05E+03 6.84E+03 3.90E+03 4.44E+03 4.26E+03 5.58E+03 7.20E+03 1.24E+04 70 2.53E+03 3.17E+03 6.50E+03 2.73E+03 5.69E+03 3.98E+03 8.35E+03 6.63E+03 6.08E+03 5.48E+03 3.36E+04 2.57E+04 1.93E+04 1.16E+05 -6.42E+04 2.18E+04 2.98E+04 1.61E+05 -1.17E+05 9.64E+03 5.77E+03 3.66E+04 -1.73E+04 7.65E+03 3.81E+03 2.54E+04 -1.01E+04 4.11E+03 5.23E+02 6.55E+03 1.67E+03 4.75E+03 1.35E+03 1.10E+04 -1.55E+03 4.12E+03 1.84E+03 1.27E+04 -4.45E+03 2.50E+05 4.65E+05 2.42E+06 -1.92E+06 1.20E+03 FAIL 3.32E+04 3.89E+04 2.15E+05 -1.49E+05 5.00E+02 FAIL 8.37E+03 3.34E+03 2.39E+04 -7.21E+03 2.00E+02 FAIL 7.24E+03 2.16E+03 1.73E+04 -2.84E+03 2.00E+02 FAIL 7.12E+03 4.41E+03 2.77E+04 -1.34E+04 1.00E+02 FAIL 5.07E+03 1.34E+03 1.13E+04 -1.19E+03 1.00E+02 FAIL 6.10E+03 1.60E+03 1.36E+04 -1.36E+03 1.00E+02 FAIL An ISO 9001:2000 Certified Company 61 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 10 RL=10k VO=+/-10V (V/mV) 4.00E+05 2.00E+05 0.00E+00 -2.00E+05 -4.00E+05 -6.00E+05 -8.00E+05 -1.00E+06 -1.20E+06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.28. Plot of Open Loop Gain 10 RL=10k VO=+/-10V (V/mV) versus total dose. The data show significant degradation with radiation, however not sufficient for the average of the measured data to fall below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as An ISO 9001:2000 Certified Company 62 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.28. Raw data for Open Loop Gain 10 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Open Loop Gain 10 RL=10k VO=+/-10V (V/mV) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 6.64E+05 6.62E+04 4.10E+05 1.88E+04 3.73E+04 1.60E+04 3.11E+04 8.29E+03 9.05E+03 2.52E+04 8.11E+04 10 3.53E+04 3.72E+04 1.82E+05 1.63E+04 1.95E+04 1.81E+04 8.66E+03 7.64E+03 1.09E+04 2.50E+04 3.04E+04 20 1.34E+05 2.52E+05 1.47E+04 1.42E+04 2.03E+04 1.06E+04 7.06E+03 5.45E+03 7.20E+03 7.63E+04 5.36E+04 30 1.59E+04 3.82E+04 1.50E+04 6.91E+03 1.06E+04 7.90E+03 5.43E+03 4.17E+03 4.39E+03 9.22E+03 7.47E+04 50 1.14E+04 9.24E+03 5.82E+03 4.64E+03 5.18E+03 7.51E+03 3.91E+03 4.42E+03 4.62E+03 7.32E+03 5.39E+04 60 1.83E+04 6.65E+03 4.65E+03 3.75E+03 6.56E+03 4.22E+03 4.64E+03 3.84E+03 3.58E+03 7.93E+03 5.75E+04 70 1.46E+04 7.74E+03 4.46E+03 4.26E+03 5.43E+03 6.32E+03 4.52E+03 4.41E+03 3.83E+03 1.15E+04 8.94E+05 2.39E+05 2.87E+05 1.58E+06 -1.10E+06 5.80E+04 6.97E+04 3.83E+05 -2.67E+05 8.72E+04 1.05E+05 5.79E+05 -4.05E+05 1.73E+04 1.22E+04 7.43E+04 -3.97E+04 7.25E+03 2.92E+03 2.09E+04 -6.37E+03 7.97E+03 5.88E+03 3.54E+04 -1.95E+04 7.30E+03 4.30E+03 2.74E+04 -1.28E+04 1.79E+04 1.00E+04 6.46E+04 -2.88E+04 1.20E+03 FAIL 1.41E+04 7.34E+03 4.83E+04 -2.02E+04 5.00E+02 FAIL 2.13E+04 3.08E+04 1.65E+05 -1.22E+05 2.00E+02 FAIL 6.22E+03 2.24E+03 1.67E+04 -4.22E+03 2.00E+02 FAIL 5.55E+03 1.72E+03 1.36E+04 -2.45E+03 1.00E+02 FAIL 4.84E+03 1.77E+03 1.31E+04 -3.42E+03 1.00E+02 FAIL 6.12E+03 3.17E+03 2.09E+04 -8.67E+03 1.00E+02 FAIL An ISO 9001:2000 Certified Company 63 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 11 RL=10k VO=+/-10V (V/mV) 5.00E+04 0.00E+00 -5.00E+04 -1.00E+05 -1.50E+05 -2.00E+05 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.29. Plot of Open Loop Gain 11 RL=10k VO=+/-10V (V/mV) versus total dose. The data show significant degradation with radiation, however not sufficient for the average of the measured data to fall below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as An ISO 9001:2000 Certified Company 64 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.29. Raw data for Open Loop Gain 11 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Open Loop Gain 11 RL=10k VO=+/-10V (V/mV) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.68E+04 1.85E+04 2.20E+04 1.42E+04 2.13E+04 3.30E+04 7.21E+03 1.41E+04 1.13E+04 3.61E+04 1.06E+04 10 2.11E+04 1.09E+04 1.12E+04 1.03E+04 3.19E+04 4.00E+04 8.52E+03 1.51E+04 6.53E+03 1.03E+05 1.62E+04 20 1.12E+04 9.53E+03 9.96E+03 8.76E+03 1.18E+04 1.16E+04 4.48E+03 6.10E+03 4.86E+03 1.57E+04 4.82E+04 30 1.15E+04 4.60E+04 6.76E+03 7.34E+03 1.28E+04 6.92E+03 3.24E+03 7.49E+03 4.49E+03 2.91E+04 4.63E+04 50 3.86E+04 4.47E+03 3.99E+03 4.81E+03 7.11E+03 4.27E+03 4.17E+03 3.36E+03 3.62E+03 1.51E+04 1.93E+05 60 3.94E+04 4.83E+03 9.37E+03 5.67E+03 6.30E+03 6.46E+03 2.87E+03 3.93E+03 5.22E+03 7.26E+03 1.37E+04 70 8.22E+03 4.16E+03 7.79E+03 3.71E+03 8.96E+03 8.21E+03 3.90E+03 7.19E+03 5.39E+03 7.02E+03 1.56E+05 1.86E+04 3.22E+03 3.36E+04 3.52E+03 1.71E+04 9.43E+03 6.11E+04 -2.69E+04 1.03E+04 1.24E+03 1.61E+04 4.45E+03 1.69E+04 1.65E+04 9.38E+04 -6.00E+04 1.18E+04 1.50E+04 8.18E+04 -5.83E+04 1.31E+04 1.48E+04 8.22E+04 -5.60E+04 6.57E+03 2.44E+03 1.80E+04 -4.83E+03 2.04E+04 1.33E+04 8.22E+04 -4.15E+04 1.20E+03 FAIL 3.47E+04 4.07E+04 2.24E+05 -1.55E+05 5.00E+02 FAIL 8.55E+03 4.91E+03 3.14E+04 -1.44E+04 2.00E+02 FAIL 1.03E+04 1.07E+04 6.02E+04 -3.96E+04 2.00E+02 FAIL 6.10E+03 5.04E+03 2.96E+04 -1.74E+04 1.00E+02 FAIL 5.15E+03 1.79E+03 1.35E+04 -3.22E+03 1.00E+02 FAIL 6.34E+03 1.70E+03 1.43E+04 -1.58E+03 1.00E+02 FAIL An ISO 9001:2000 Certified Company 65 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 12 RL=10k VO=+/-10V (V/mV) 4.00E+05 2.00E+05 0.00E+00 -2.00E+05 -4.00E+05 -6.00E+05 -8.00E+05 -1.00E+06 -1.20E+06 -1.40E+06 -1.60E+06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.30. Plot of Open Loop Gain 12 RL=10k VO=+/-10V (V/mV) versus total dose. The data show significant degradation with radiation, however not sufficient for the average of the measured data to fall below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes” approach. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as An ISO 9001:2000 Certified Company 66 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.30. Raw data for Open Loop Gain 12 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Open Loop Gain 12 RL=10k VO=+/-10V (V/mV) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 8.11E+03 3.66E+04 7.43E+05 1.05E+04 3.68E+04 8.86E+03 6.27E+04 2.08E+04 1.52E+04 2.41E+04 1.69E+04 10 1.16E+04 2.15E+04 3.12E+04 1.04E+04 1.48E+04 7.45E+03 1.29E+04 9.69E+03 1.91E+04 3.36E+04 2.88E+04 20 8.85E+03 1.33E+04 4.45E+04 8.31E+03 9.47E+03 1.14E+04 2.28E+04 1.51E+04 1.03E+04 8.73E+03 2.79E+05 30 8.97E+03 6.60E+03 2.94E+04 6.48E+03 9.29E+03 5.52E+03 1.45E+04 4.13E+03 8.34E+03 4.98E+03 1.89E+04 50 3.73E+03 4.81E+03 7.01E+03 4.63E+03 5.17E+03 1.36E+04 7.44E+03 7.30E+03 4.20E+03 4.64E+03 7.26E+04 60 2.73E+03 4.33E+03 3.86E+03 3.19E+03 5.21E+03 1.05E+04 2.01E+04 4.73E+03 3.24E+03 7.09E+03 4.04E+04 70 3.15E+03 4.98E+03 5.50E+03 3.16E+03 3.62E+03 9.69E+03 1.16E+04 4.53E+03 3.80E+03 7.83E+03 2.70E+04 1.67E+05 3.22E+05 1.67E+06 -1.34E+06 1.79E+04 8.58E+03 5.79E+04 -2.22E+04 1.69E+04 1.55E+04 8.94E+04 -5.56E+04 1.22E+04 9.74E+03 5.76E+04 -3.33E+04 5.07E+03 1.21E+03 1.07E+04 -5.66E+02 3.86E+03 9.70E+02 8.39E+03 -6.63E+02 4.08E+03 1.09E+03 9.17E+03 -1.00E+03 2.63E+04 2.12E+04 1.25E+05 -7.24E+04 1.20E+03 FAIL 1.65E+04 1.05E+04 6.54E+04 -3.23E+04 5.00E+02 FAIL 1.37E+04 5.60E+03 3.98E+04 -1.25E+04 2.00E+02 FAIL 7.50E+03 4.24E+03 2.73E+04 -1.23E+04 2.00E+02 FAIL 7.44E+03 3.77E+03 2.50E+04 -1.01E+04 1.00E+02 FAIL 9.12E+03 6.70E+03 4.04E+04 -2.22E+04 1.00E+02 FAIL 7.49E+03 3.33E+03 2.30E+04 -8.06E+03 1.00E+02 FAIL An ISO 9001:2000 Certified Company 67 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 1 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.31. Plot of Positive Output Voltage 1 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 68 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.31. Raw data for Positive Output Voltage 1 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 1 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 10 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 30 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 60 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 70 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 2.61E-03 1.41E+01 1.41E+01 1.41E+01 2.61E-03 1.41E+01 1.41E+01 1.41E+01 2.41E-03 1.41E+01 1.41E+01 1.41E+01 2.45E-03 1.41E+01 1.41E+01 1.41E+01 2.61E-03 1.41E+01 1.41E+01 1.41E+01 2.68E-03 1.41E+01 1.41E+01 1.41E+01 2.59E-03 1.41E+01 1.41E+01 1.41E+01 1.23E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.29E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.29E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.29E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.29E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.30E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.25E-02 1.41E+01 1.40E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 69 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 2 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.32. Plot of Positive Output Voltage 2 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 70 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.32. Raw data for Positive Output Voltage 2 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 2 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 10 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 30 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 60 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 70 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 4.34E-03 1.41E+01 1.41E+01 1.41E+01 3.85E-03 1.41E+01 1.41E+01 1.41E+01 4.27E-03 1.41E+01 1.41E+01 1.41E+01 5.18E-03 1.41E+01 1.41E+01 1.41E+01 4.21E-03 1.41E+01 1.41E+01 1.41E+01 3.85E-03 1.41E+01 1.41E+01 1.41E+01 4.77E-03 1.41E+01 1.41E+01 1.41E+01 2.45E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.56E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.56E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.16E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.02E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.56E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.77E-03 1.41E+01 1.41E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 71 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 3 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.33. Plot of Positive Output Voltage 3 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 72 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.33. Raw data for Positive Output Voltage 3 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 3 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 10 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 30 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 60 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 70 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 3.71E-03 1.41E+01 1.41E+01 1.41E+01 4.47E-03 1.41E+01 1.41E+01 1.41E+01 4.56E-03 1.41E+01 1.41E+01 1.41E+01 3.97E-03 1.41E+01 1.41E+01 1.41E+01 5.05E-03 1.41E+01 1.41E+01 1.41E+01 4.77E-03 1.41E+01 1.41E+01 1.41E+01 3.90E-03 1.41E+01 1.41E+01 1.41E+01 2.59E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.03E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.58E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.11E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.03E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.29E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.03E-03 1.41E+01 1.41E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 73 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 4 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.34. Plot of Positive Output Voltage 4 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 74 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.34. Raw data for Positive Output Voltage 4 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 4 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 10 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 30 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 60 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 70 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 2.68E-03 1.41E+01 1.41E+01 1.41E+01 2.83E-03 1.41E+01 1.41E+01 1.41E+01 2.68E-03 1.41E+01 1.41E+01 1.41E+01 2.61E-03 1.41E+01 1.41E+01 1.41E+01 3.21E-03 1.41E+01 1.41E+01 1.41E+01 2.45E-03 1.41E+01 1.41E+01 1.41E+01 2.86E-03 1.41E+01 1.41E+01 1.41E+01 1.25E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.23E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.23E-02 1.41E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.26E-02 1.42E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.28E-02 1.42E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.29E-02 1.42E+01 1.40E+01 1.25E+01 PASS 1.41E+01 1.19E-02 1.41E+01 1.40E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 75 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 1 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.35. Plot of Negative Output Voltage 1 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 76 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.35. Raw data for Negative Output Voltage 1 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 1 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 10 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 30 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 24-hr Anneal 168-hr Anneal 60 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 70 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 4.87E-03 4.49E-03 4.55E-03 4.56E-03 4.45E-03 4.60E-03 4.56E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 6.52E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 5.83E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 6.04E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 5.89E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 77 -1.44E+01 6.42E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 6.65E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 6.39E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 2 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.36. Plot of Negative Output Voltage 2 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 78 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.36. Raw data for Negative Output Voltage 2 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 2 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 10 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 30 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 24-hr Anneal 168-hr Anneal 60 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 70 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 4.00E-03 4.34E-03 4.67E-03 4.67E-03 4.49E-03 4.83E-03 4.64E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.44E+01 -1.44E+01 4.60E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.10E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.10E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.32E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 79 -1.44E+01 4.10E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.15E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.10E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 3 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.37. Plot of Negative Output Voltage 3 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 80 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.37. Raw data for Negative Output Voltage 3 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 3 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 10 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 30 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 24-hr Anneal 168-hr Anneal 60 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 70 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 4.45E-03 4.49E-03 4.34E-03 5.15E-03 4.98E-03 4.67E-03 4.85E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 4.77E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.15E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.15E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 3.58E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 81 -1.44E+01 4.15E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.56E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 4.15E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 4 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.38. Plot of Negative Output Voltage 4 @ +/-15V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 82 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.38. Raw data for Negative Output Voltage 4 @ +/-15V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 4 @ +/-15V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 10 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 30 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 24-hr Anneal 168-hr Anneal 60 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 70 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 4.02E-03 3.85E-03 4.60E-03 4.15E-03 4.56E-03 4.82E-03 3.90E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 6.43E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 5.79E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 6.04E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 5.93E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 83 -1.44E+01 6.27E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 6.32E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS -1.44E+01 6.26E-03 -1.44E+01 -1.45E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Slew Rate 1 @ +/-15V (V/us) 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.39. Plot of Positive Slew Rate 1 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 84 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.39. Raw data for Positive Slew Rate 1 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Slew Rate 1 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.38E-01 4.39E-01 4.88E-01 4.75E-01 4.59E-01 4.94E-01 5.08E-01 4.57E-01 4.80E-01 4.62E-01 4.72E-01 10 4.29E-01 4.31E-01 4.80E-01 4.69E-01 4.56E-01 4.93E-01 5.11E-01 4.56E-01 4.78E-01 4.64E-01 4.77E-01 20 4.34E-01 4.19E-01 4.84E-01 4.66E-01 4.48E-01 4.82E-01 4.96E-01 4.65E-01 4.71E-01 4.59E-01 4.79E-01 30 4.20E-01 4.28E-01 4.75E-01 4.57E-01 4.40E-01 4.86E-01 4.89E-01 4.46E-01 4.60E-01 4.50E-01 4.70E-01 50 4.10E-01 4.04E-01 4.56E-01 4.42E-01 4.27E-01 4.65E-01 4.74E-01 4.31E-01 4.45E-01 4.36E-01 4.76E-01 60 4.08E-01 4.02E-01 4.60E-01 4.41E-01 4.29E-01 4.60E-01 4.71E-01 4.31E-01 4.43E-01 4.31E-01 4.80E-01 70 4.11E-01 4.00E-01 4.55E-01 4.38E-01 4.25E-01 4.78E-01 4.88E-01 4.45E-01 4.55E-01 4.40E-01 4.67E-01 4.60E-01 2.20E-02 5.62E-01 3.57E-01 4.53E-01 2.27E-02 5.59E-01 3.47E-01 4.50E-01 2.57E-02 5.70E-01 3.30E-01 4.44E-01 2.22E-02 5.48E-01 3.40E-01 4.28E-01 2.17E-02 5.29E-01 3.27E-01 4.28E-01 2.38E-02 5.39E-01 3.17E-01 4.26E-01 2.17E-02 5.27E-01 3.24E-01 4.80E-01 2.14E-02 5.80E-01 3.80E-01 2.00E-01 PASS 4.80E-01 2.22E-02 5.84E-01 3.77E-01 1.30E-01 PASS 4.75E-01 1.47E-02 5.43E-01 4.06E-01 1.20E-01 PASS 4.66E-01 2.01E-02 5.60E-01 3.72E-01 1.20E-01 PASS 4.50E-01 1.86E-02 5.37E-01 3.63E-01 1.10E-01 PASS 4.47E-01 1.78E-02 5.30E-01 3.64E-01 1.10E-01 PASS 4.61E-01 2.09E-02 5.59E-01 3.64E-01 1.10E-01 PASS An ISO 9001:2000 Certified Company 85 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Slew Rate 2 @ +/-15V (V/us) 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.40. Plot of Positive Slew Rate 2 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 86 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.40. Raw data for Positive Slew Rate 2 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Slew Rate 2 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.86E-01 4.72E-01 4.92E-01 4.82E-01 5.31E-01 5.06E-01 4.60E-01 4.59E-01 5.03E-01 5.15E-01 5.25E-01 10 4.76E-01 4.69E-01 4.87E-01 4.83E-01 5.33E-01 4.98E-01 4.58E-01 4.71E-01 4.87E-01 5.12E-01 5.25E-01 20 4.83E-01 4.70E-01 4.82E-01 4.83E-01 5.24E-01 4.90E-01 4.45E-01 4.59E-01 4.90E-01 5.00E-01 5.37E-01 30 4.62E-01 4.69E-01 4.77E-01 4.71E-01 5.13E-01 4.80E-01 4.35E-01 4.57E-01 4.75E-01 4.98E-01 5.29E-01 50 4.62E-01 4.56E-01 4.54E-01 4.64E-01 4.95E-01 4.71E-01 4.23E-01 4.33E-01 4.61E-01 4.80E-01 5.32E-01 60 4.62E-01 4.49E-01 4.60E-01 4.57E-01 4.95E-01 4.78E-01 4.35E-01 4.28E-01 4.61E-01 4.76E-01 5.38E-01 70 4.52E-01 4.41E-01 4.57E-01 4.55E-01 4.85E-01 4.80E-01 4.33E-01 4.43E-01 4.65E-01 4.91E-01 5.41E-01 4.93E-01 2.27E-02 5.98E-01 3.87E-01 4.90E-01 2.52E-02 6.07E-01 3.72E-01 4.88E-01 2.06E-02 5.85E-01 3.92E-01 4.78E-01 2.01E-02 5.72E-01 3.85E-01 4.66E-01 1.66E-02 5.44E-01 3.89E-01 4.65E-01 1.77E-02 5.47E-01 3.82E-01 4.58E-01 1.63E-02 5.34E-01 3.82E-01 4.89E-01 2.69E-02 6.14E-01 3.63E-01 2.00E-01 PASS 4.85E-01 2.14E-02 5.85E-01 3.85E-01 1.30E-01 PASS 4.77E-01 2.35E-02 5.87E-01 3.67E-01 1.20E-01 PASS 4.69E-01 2.40E-02 5.81E-01 3.57E-01 1.20E-01 PASS 4.54E-01 2.46E-02 5.68E-01 3.39E-01 1.10E-01 PASS 4.56E-01 2.31E-02 5.63E-01 3.48E-01 1.10E-01 PASS 4.62E-01 2.44E-02 5.76E-01 3.49E-01 1.10E-01 PASS An ISO 9001:2000 Certified Company 87 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Slew Rate 3 @ +/-15V (V/us) 5.00E-01 4.50E-01 4.00E-01 3.50E-01 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.41. Plot of Positive Slew Rate 3 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 88 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.41. Raw data for Positive Slew Rate 3 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Slew Rate 3 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.62E-01 4.57E-01 4.67E-01 4.56E-01 4.85E-01 4.75E-01 4.37E-01 4.36E-01 4.65E-01 4.93E-01 4.92E-01 10 4.61E-01 4.57E-01 4.68E-01 4.67E-01 4.90E-01 4.77E-01 4.34E-01 4.42E-01 4.63E-01 4.94E-01 5.06E-01 20 4.59E-01 4.53E-01 4.56E-01 4.57E-01 4.88E-01 4.66E-01 4.31E-01 4.24E-01 4.61E-01 4.80E-01 5.07E-01 30 4.47E-01 4.47E-01 4.57E-01 4.44E-01 4.87E-01 4.63E-01 4.16E-01 4.20E-01 4.45E-01 4.82E-01 5.02E-01 50 4.34E-01 4.27E-01 4.38E-01 4.39E-01 4.62E-01 4.44E-01 4.05E-01 4.07E-01 4.37E-01 4.55E-01 5.08E-01 60 4.37E-01 4.34E-01 4.38E-01 4.29E-01 4.67E-01 4.44E-01 4.02E-01 4.11E-01 4.38E-01 4.62E-01 5.06E-01 70 4.35E-01 4.18E-01 4.32E-01 4.31E-01 4.64E-01 4.52E-01 4.13E-01 4.16E-01 4.45E-01 4.69E-01 5.09E-01 4.65E-01 1.18E-02 5.20E-01 4.10E-01 4.69E-01 1.28E-02 5.28E-01 4.09E-01 4.63E-01 1.44E-02 5.30E-01 3.96E-01 4.56E-01 1.78E-02 5.39E-01 3.73E-01 4.40E-01 1.32E-02 5.01E-01 3.79E-01 4.41E-01 1.49E-02 5.11E-01 3.71E-01 4.36E-01 1.70E-02 5.15E-01 3.57E-01 4.61E-01 2.47E-02 5.76E-01 3.46E-01 2.00E-01 PASS 4.62E-01 2.47E-02 5.77E-01 3.47E-01 1.30E-01 PASS 4.52E-01 2.39E-02 5.64E-01 3.41E-01 1.20E-01 PASS 4.45E-01 2.81E-02 5.76E-01 3.14E-01 1.20E-01 PASS 4.30E-01 2.25E-02 5.35E-01 3.25E-01 1.10E-01 PASS 4.31E-01 2.46E-02 5.46E-01 3.17E-01 1.10E-01 PASS 4.39E-01 2.40E-02 5.51E-01 3.27E-01 1.10E-01 PASS An ISO 9001:2000 Certified Company 89 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Slew Rate 4 @ +/-15V (V/us) 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.42. Plot of Positive Slew Rate 4 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 90 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.42. Raw data for Positive Slew Rate 4 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Slew Rate 4 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.63E-01 4.56E-01 5.19E-01 5.05E-01 4.80E-01 5.33E-01 5.43E-01 4.78E-01 5.05E-01 4.89E-01 4.97E-01 10 4.52E-01 4.50E-01 5.06E-01 4.94E-01 4.87E-01 5.22E-01 5.36E-01 4.88E-01 5.00E-01 4.89E-01 5.12E-01 20 4.51E-01 4.36E-01 4.98E-01 4.96E-01 4.81E-01 5.20E-01 5.22E-01 4.85E-01 4.94E-01 4.88E-01 5.10E-01 30 4.40E-01 4.48E-01 4.98E-01 4.88E-01 4.64E-01 5.11E-01 5.18E-01 4.67E-01 4.88E-01 4.81E-01 5.07E-01 50 4.31E-01 4.26E-01 4.78E-01 4.69E-01 4.56E-01 4.92E-01 5.00E-01 4.55E-01 4.79E-01 4.65E-01 4.97E-01 60 4.36E-01 4.23E-01 4.82E-01 4.70E-01 4.64E-01 4.81E-01 5.04E-01 4.53E-01 4.77E-01 4.60E-01 5.13E-01 70 4.25E-01 4.14E-01 4.68E-01 4.63E-01 4.57E-01 5.01E-01 5.03E-01 4.56E-01 4.70E-01 4.61E-01 5.00E-01 4.85E-01 2.69E-02 6.10E-01 3.59E-01 4.78E-01 2.54E-02 5.96E-01 3.59E-01 4.72E-01 2.77E-02 6.02E-01 3.43E-01 4.68E-01 2.50E-02 5.84E-01 3.51E-01 4.52E-01 2.29E-02 5.59E-01 3.45E-01 4.55E-01 2.46E-02 5.70E-01 3.40E-01 4.45E-01 2.43E-02 5.59E-01 3.32E-01 5.10E-01 2.79E-02 6.40E-01 3.80E-01 2.00E-01 PASS 5.07E-01 2.12E-02 6.06E-01 4.08E-01 1.30E-01 PASS 5.02E-01 1.78E-02 5.85E-01 4.19E-01 1.20E-01 PASS 4.93E-01 2.12E-02 5.92E-01 3.94E-01 1.20E-01 PASS 4.78E-01 1.86E-02 5.65E-01 3.92E-01 1.10E-01 PASS 4.75E-01 1.99E-02 5.68E-01 3.82E-01 1.10E-01 PASS 4.78E-01 2.23E-02 5.82E-01 3.74E-01 1.10E-01 PASS An ISO 9001:2000 Certified Company 91 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Ps99%/90% (+KTL) Biased Negative Slew Rate 1 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.43. Plot of Negative Slew Rate 1 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 92 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.43. Raw data for Negative Slew Rate 1 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Slew Rate 1 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -4.82E-01 -4.68E-01 -5.57E-01 -5.19E-01 -5.07E-01 -5.70E-01 -5.69E-01 -5.14E-01 -5.35E-01 -5.16E-01 -5.37E-01 10 -4.80E-01 -4.73E-01 -5.59E-01 -5.15E-01 -4.98E-01 -5.61E-01 -5.74E-01 -5.00E-01 -5.31E-01 -5.33E-01 -5.46E-01 20 -4.82E-01 -4.60E-01 -5.45E-01 -5.25E-01 -5.11E-01 -5.47E-01 -5.53E-01 -5.10E-01 -5.29E-01 -5.13E-01 -5.29E-01 30 -4.56E-01 -4.67E-01 -5.35E-01 -5.07E-01 -4.86E-01 -5.45E-01 -5.66E-01 -5.01E-01 -5.11E-01 -5.01E-01 -5.34E-01 50 -4.65E-01 -4.45E-01 -5.15E-01 -4.93E-01 -4.77E-01 -5.19E-01 -5.38E-01 -4.76E-01 -4.90E-01 -4.80E-01 -5.39E-01 60 -4.50E-01 -4.42E-01 -5.09E-01 -4.85E-01 -4.79E-01 -5.32E-01 -5.35E-01 -4.81E-01 -5.00E-01 -4.93E-01 -5.40E-01 70 -4.50E-01 -4.30E-01 -5.18E-01 -4.90E-01 -4.72E-01 -5.32E-01 -5.33E-01 -4.83E-01 -4.98E-01 -4.82E-01 -5.23E-01 -5.07E-01 3.46E-02 -3.45E-01 -6.68E-01 -5.05E-01 3.43E-02 -3.45E-01 -6.65E-01 -5.05E-01 3.39E-02 -3.47E-01 -6.63E-01 -4.90E-01 3.17E-02 -3.42E-01 -6.38E-01 -4.79E-01 2.67E-02 -3.54E-01 -6.04E-01 -4.73E-01 2.72E-02 -3.46E-01 -6.00E-01 -4.72E-01 3.42E-02 -3.12E-01 -6.32E-01 -5.41E-01 2.75E-02 -4.13E-01 -6.69E-01 -2.00E-01 PASS -5.40E-01 2.88E-02 -4.05E-01 -6.74E-01 -1.30E-01 PASS -5.30E-01 1.94E-02 -4.40E-01 -6.21E-01 -1.20E-01 PASS -5.25E-01 2.93E-02 -3.88E-01 -6.61E-01 -1.20E-01 PASS -5.01E-01 2.68E-02 -3.75E-01 -6.26E-01 -1.10E-01 PASS -5.08E-01 2.41E-02 -3.96E-01 -6.21E-01 -1.10E-01 PASS -5.06E-01 2.54E-02 -3.87E-01 -6.24E-01 -1.10E-01 PASS An ISO 9001:2000 Certified Company 93 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Ps99%/90% (+KTL) Biased Negative Slew Rate 2 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.44. Plot of Negative Slew Rate 2 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 94 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.44. Raw data for Negative Slew Rate 2 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Slew Rate 2 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -5.40E-01 -5.12E-01 -5.46E-01 -5.44E-01 -5.74E-01 -5.61E-01 -5.05E-01 -5.12E-01 -5.48E-01 -5.64E-01 -5.97E-01 10 -5.23E-01 -5.41E-01 -5.39E-01 -5.56E-01 -5.84E-01 -5.67E-01 -5.11E-01 -5.17E-01 -5.35E-01 -5.94E-01 -6.02E-01 20 -5.34E-01 -5.28E-01 -5.32E-01 -5.38E-01 -5.78E-01 -5.49E-01 -4.90E-01 -5.01E-01 -5.50E-01 -5.56E-01 -5.86E-01 30 -5.20E-01 -5.22E-01 -5.41E-01 -5.21E-01 -5.78E-01 -5.47E-01 -4.97E-01 -4.89E-01 -5.23E-01 -5.83E-01 -6.01E-01 50 -5.25E-01 -4.99E-01 -5.08E-01 -5.27E-01 -5.77E-01 -5.27E-01 -4.71E-01 -4.97E-01 -5.21E-01 -5.50E-01 -6.15E-01 60 -5.05E-01 -5.11E-01 -5.16E-01 -5.09E-01 -5.60E-01 -5.09E-01 -4.82E-01 -4.88E-01 -5.14E-01 -5.61E-01 -5.93E-01 70 -4.94E-01 -4.89E-01 -5.04E-01 -5.00E-01 -5.51E-01 -5.46E-01 -4.89E-01 -4.94E-01 -5.24E-01 -5.65E-01 -5.79E-01 -5.43E-01 2.20E-02 -4.40E-01 -6.46E-01 -5.49E-01 2.30E-02 -4.41E-01 -6.56E-01 -5.42E-01 2.04E-02 -4.47E-01 -6.37E-01 -5.36E-01 2.48E-02 -4.21E-01 -6.52E-01 -5.27E-01 3.02E-02 -3.86E-01 -6.68E-01 -5.20E-01 2.26E-02 -4.15E-01 -6.26E-01 -5.08E-01 2.49E-02 -3.91E-01 -6.24E-01 -5.38E-01 2.77E-02 -4.09E-01 -6.67E-01 -2.00E-01 PASS -5.45E-01 3.51E-02 -3.81E-01 -7.09E-01 -1.30E-01 PASS -5.29E-01 3.11E-02 -3.84E-01 -6.74E-01 -1.20E-01 PASS -5.28E-01 3.84E-02 -3.49E-01 -7.07E-01 -1.20E-01 PASS -5.13E-01 3.02E-02 -3.72E-01 -6.54E-01 -1.10E-01 PASS -5.11E-01 3.12E-02 -3.65E-01 -6.56E-01 -1.10E-01 PASS -5.24E-01 3.27E-02 -3.71E-01 -6.76E-01 -1.10E-01 PASS An ISO 9001:2000 Certified Company 95 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Ps99%/90% (+KTL) Biased Negative Slew Rate 3 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.45. Plot of Negative Slew Rate 3 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 96 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.45. Raw data for Negative Slew Rate 3 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Slew Rate 3 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -5.00E-01 -4.96E-01 -5.11E-01 -5.10E-01 -5.36E-01 -5.21E-01 -4.84E-01 -4.77E-01 -5.20E-01 -5.56E-01 -5.61E-01 10 -5.25E-01 -5.01E-01 -5.21E-01 -5.12E-01 -5.78E-01 -5.38E-01 -4.84E-01 -4.92E-01 -5.10E-01 -5.62E-01 -5.57E-01 20 -5.04E-01 -4.92E-01 -5.18E-01 -4.97E-01 -5.41E-01 -5.23E-01 -4.59E-01 -4.83E-01 -5.06E-01 -5.30E-01 -5.67E-01 30 -4.90E-01 -5.15E-01 -5.08E-01 -5.01E-01 -5.47E-01 -5.06E-01 -4.50E-01 -4.75E-01 -4.90E-01 -5.33E-01 -5.58E-01 50 -4.91E-01 -4.71E-01 -4.73E-01 -4.80E-01 -5.19E-01 -4.93E-01 -4.55E-01 -4.61E-01 -4.91E-01 -5.17E-01 -5.94E-01 60 -4.82E-01 -4.71E-01 -4.89E-01 -4.91E-01 -5.17E-01 -5.06E-01 -4.44E-01 -4.57E-01 -4.82E-01 -5.18E-01 -5.81E-01 70 -4.75E-01 -4.71E-01 -4.76E-01 -4.77E-01 -5.29E-01 -4.99E-01 -4.57E-01 -4.64E-01 -4.86E-01 -5.13E-01 -5.80E-01 -5.11E-01 1.56E-02 -4.38E-01 -5.83E-01 -5.27E-01 2.98E-02 -3.89E-01 -6.66E-01 -5.10E-01 1.97E-02 -4.18E-01 -6.02E-01 -5.12E-01 2.15E-02 -4.12E-01 -6.13E-01 -4.87E-01 1.96E-02 -3.95E-01 -5.78E-01 -4.90E-01 1.70E-02 -4.11E-01 -5.69E-01 -4.86E-01 2.44E-02 -3.72E-01 -5.99E-01 -5.12E-01 3.20E-02 -3.62E-01 -6.61E-01 -2.00E-01 PASS -5.17E-01 3.25E-02 -3.65E-01 -6.69E-01 -1.30E-01 PASS -5.00E-01 2.93E-02 -3.63E-01 -6.37E-01 -1.20E-01 PASS -4.91E-01 3.13E-02 -3.45E-01 -6.37E-01 -1.20E-01 PASS -4.83E-01 2.54E-02 -3.65E-01 -6.02E-01 -1.10E-01 PASS -4.81E-01 3.14E-02 -3.35E-01 -6.28E-01 -1.10E-01 PASS -4.84E-01 2.34E-02 -3.74E-01 -5.93E-01 -1.10E-01 PASS An ISO 9001:2000 Certified Company 97 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Ps99%/90% (+KTL) Biased Negative Slew Rate 4 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.46. Plot of Negative Slew Rate 4 @ +/-15V (V/us) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 98 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.46. Raw data for Negative Slew Rate 4 @ +/-15V (V/us) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Slew Rate 4 @ +/-15V (V/us) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -5.21E-01 -5.13E-01 -5.58E-01 -5.42E-01 -5.38E-01 -5.84E-01 -5.90E-01 -5.25E-01 -5.71E-01 -5.47E-01 -5.76E-01 10 -4.98E-01 -5.01E-01 -5.69E-01 -5.40E-01 -5.51E-01 -5.69E-01 -5.93E-01 -5.39E-01 -5.75E-01 -5.51E-01 -5.54E-01 20 -5.14E-01 -4.96E-01 -5.79E-01 -5.50E-01 -5.30E-01 -5.80E-01 -5.89E-01 -5.28E-01 -5.53E-01 -5.50E-01 -5.53E-01 30 -4.88E-01 -4.94E-01 -5.67E-01 -5.51E-01 -5.32E-01 -5.57E-01 -6.02E-01 -5.16E-01 -5.69E-01 -5.32E-01 -5.63E-01 50 -4.81E-01 -4.84E-01 -5.34E-01 -5.24E-01 -5.13E-01 -5.59E-01 -5.70E-01 -5.04E-01 -5.40E-01 -5.14E-01 -5.83E-01 60 -4.88E-01 -4.68E-01 -5.39E-01 -5.23E-01 -5.02E-01 -5.41E-01 -5.85E-01 -5.05E-01 -5.30E-01 -5.09E-01 -5.73E-01 70 -4.79E-01 -4.60E-01 -5.58E-01 -5.15E-01 -4.95E-01 -5.45E-01 -5.81E-01 -5.24E-01 -5.48E-01 -5.14E-01 -5.64E-01 -5.34E-01 1.78E-02 -4.51E-01 -6.17E-01 -5.32E-01 3.13E-02 -3.86E-01 -6.78E-01 -5.34E-01 3.22E-02 -3.84E-01 -6.84E-01 -5.26E-01 3.47E-02 -3.65E-01 -6.88E-01 -5.07E-01 2.38E-02 -3.96E-01 -6.18E-01 -5.04E-01 2.80E-02 -3.73E-01 -6.35E-01 -5.01E-01 3.76E-02 -3.26E-01 -6.77E-01 -5.63E-01 2.71E-02 -4.37E-01 -6.90E-01 -2.00E-01 PASS -5.65E-01 2.10E-02 -4.67E-01 -6.64E-01 -1.30E-01 PASS -5.60E-01 2.46E-02 -4.45E-01 -6.75E-01 -1.20E-01 PASS -5.55E-01 3.34E-02 -3.99E-01 -7.11E-01 -1.20E-01 PASS -5.37E-01 2.83E-02 -4.05E-01 -6.69E-01 -1.10E-01 PASS -5.34E-01 3.21E-02 -3.84E-01 -6.84E-01 -1.10E-01 PASS -5.42E-01 2.59E-02 -4.22E-01 -6.63E-01 -1.10E-01 PASS An ISO 9001:2000 Certified Company 99 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Positive Supply Current @ +5V (A) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.47. Plot of Positive Supply Current @ +5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 100 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.47. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Supply Current @ +5V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.30E-03 1.30E-03 1.37E-03 1.40E-03 1.36E-03 1.38E-03 1.37E-03 1.34E-03 1.40E-03 1.36E-03 1.37E-03 10 1.30E-03 1.30E-03 1.36E-03 1.40E-03 1.38E-03 1.45E-03 1.41E-03 1.39E-03 1.45E-03 1.42E-03 1.36E-03 20 1.32E-03 1.32E-03 1.36E-03 1.42E-03 1.39E-03 1.44E-03 1.39E-03 1.37E-03 1.42E-03 1.39E-03 1.37E-03 30 1.29E-03 1.29E-03 1.33E-03 1.38E-03 1.35E-03 1.40E-03 1.36E-03 1.34E-03 1.39E-03 1.36E-03 1.37E-03 50 1.22E-03 1.22E-03 1.25E-03 1.30E-03 1.29E-03 1.34E-03 1.29E-03 1.29E-03 1.32E-03 1.29E-03 1.37E-03 60 1.18E-03 1.18E-03 1.22E-03 1.27E-03 1.25E-03 1.29E-03 1.26E-03 1.26E-03 1.29E-03 1.26E-03 1.37E-03 70 1.13E-03 1.13E-03 1.16E-03 1.22E-03 1.21E-03 1.26E-03 1.26E-03 1.24E-03 1.29E-03 1.25E-03 1.36E-03 1.35E-03 4.67E-05 1.57E-03 1.13E-03 1.35E-03 4.55E-05 1.56E-03 1.13E-03 1.36E-03 4.42E-05 1.57E-03 1.15E-03 1.33E-03 3.89E-05 1.51E-03 1.15E-03 1.26E-03 3.74E-05 1.43E-03 1.08E-03 1.22E-03 3.77E-05 1.40E-03 1.04E-03 1.17E-03 3.96E-05 1.35E-03 9.85E-04 1.37E-03 2.12E-05 1.47E-03 1.27E-03 2.00E-03 PASS 1.42E-03 2.42E-05 1.53E-03 1.31E-03 2.00E-03 PASS 1.40E-03 2.51E-05 1.52E-03 1.28E-03 2.00E-03 PASS 1.37E-03 2.53E-05 1.49E-03 1.25E-03 2.00E-03 PASS 1.31E-03 2.34E-05 1.41E-03 1.20E-03 2.00E-03 PASS 1.27E-03 1.65E-05 1.35E-03 1.20E-03 2.00E-03 PASS 1.26E-03 1.53E-05 1.33E-03 1.19E-03 2.00E-03 PASS An ISO 9001:2000 Certified Company 101 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Negative Supply Current @ +5V (A) 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 -2.00E-03 -2.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.48. Plot of Negative Supply Current @ +5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 102 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.48. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Supply Current @ +5V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -1.28E-03 -1.28E-03 -1.36E-03 -1.38E-03 -1.34E-03 -1.36E-03 -1.35E-03 -1.33E-03 -1.38E-03 -1.34E-03 -1.34E-03 10 -1.28E-03 -1.28E-03 -1.34E-03 -1.39E-03 -1.36E-03 -1.42E-03 -1.38E-03 -1.37E-03 -1.42E-03 -1.39E-03 -1.34E-03 20 -1.30E-03 -1.29E-03 -1.34E-03 -1.39E-03 -1.36E-03 -1.41E-03 -1.38E-03 -1.36E-03 -1.40E-03 -1.37E-03 -1.35E-03 30 -1.27E-03 -1.27E-03 -1.31E-03 -1.36E-03 -1.33E-03 -1.38E-03 -1.34E-03 -1.32E-03 -1.37E-03 -1.34E-03 -1.35E-03 50 -1.21E-03 -1.20E-03 -1.23E-03 -1.28E-03 -1.27E-03 -1.32E-03 -1.28E-03 -1.27E-03 -1.30E-03 -1.27E-03 -1.34E-03 60 -1.16E-03 -1.16E-03 -1.19E-03 -1.25E-03 -1.23E-03 -1.27E-03 -1.24E-03 -1.23E-03 -1.27E-03 -1.24E-03 -1.35E-03 70 -1.11E-03 -1.11E-03 -1.14E-03 -1.19E-03 -1.18E-03 -1.24E-03 -1.23E-03 -1.22E-03 -1.27E-03 -1.23E-03 -1.34E-03 -1.33E-03 4.48E-05 -1.12E-03 -1.54E-03 -1.33E-03 4.62E-05 -1.12E-03 -1.55E-03 -1.34E-03 4.11E-05 -1.15E-03 -1.53E-03 -1.31E-03 4.02E-05 -1.12E-03 -1.50E-03 -1.24E-03 3.67E-05 -1.07E-03 -1.41E-03 -1.20E-03 3.84E-05 -1.02E-03 -1.38E-03 -1.15E-03 4.01E-05 -9.59E-04 -1.33E-03 -1.35E-03 1.90E-05 -1.26E-03 -1.44E-03 -2.00E-03 PASS -1.40E-03 2.24E-05 -1.29E-03 -1.50E-03 -2.00E-03 PASS -1.38E-03 2.16E-05 -1.28E-03 -1.48E-03 -2.00E-03 PASS -1.35E-03 2.64E-05 -1.23E-03 -1.47E-03 -2.00E-03 PASS -1.29E-03 2.30E-05 -1.18E-03 -1.39E-03 -2.00E-03 PASS -1.25E-03 1.86E-05 -1.16E-03 -1.34E-03 -2.00E-03 PASS -1.24E-03 1.75E-05 -1.16E-03 -1.32E-03 -2.00E-03 PASS An ISO 9001:2000 Certified Company 103 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 8.00E-04 Offset Voltage 1 @ +5V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.49. Plot of Offset Voltage 1 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 104 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.49. Raw data for Offset Voltage 1 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 1 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -5.72E-05 -8.93E-05 -5.08E-05 1.65E-05 2.57E-05 -7.37E-05 -6.51E-05 -3.33E-05 -1.09E-04 -1.36E-05 -6.16E-06 10 -5.37E-05 -8.92E-05 -5.57E-05 7.84E-06 2.57E-05 -7.32E-05 -5.87E-05 -2.90E-05 -1.05E-04 -3.26E-06 -7.97E-06 20 -4.95E-05 -7.59E-05 -4.78E-05 2.31E-05 3.67E-05 -7.05E-05 -4.85E-05 -1.86E-05 -9.54E-05 2.77E-06 -6.65E-06 30 -6.16E-05 -3.72E-05 -3.59E-05 3.49E-05 4.73E-05 -5.99E-05 -3.50E-05 -9.18E-06 -8.77E-05 1.51E-05 -6.40E-06 50 -2.29E-05 -3.35E-05 -1.11E-05 5.76E-05 7.20E-05 -4.25E-05 -1.08E-05 1.47E-05 -5.99E-05 3.53E-05 -7.73E-06 60 -2.52E-05 -3.16E-05 -1.16E-05 5.99E-05 7.12E-05 -4.65E-05 -1.61E-05 1.56E-06 -6.86E-05 2.41E-05 -7.25E-06 70 -3.32E-05 -4.79E-05 -2.91E-05 5.27E-05 7.40E-05 -6.41E-05 -3.47E-05 -1.44E-05 -7.50E-05 2.77E-06 -9.18E-06 -3.10E-05 4.99E-05 2.02E-04 -2.64E-04 -3.30E-05 4.80E-05 1.91E-04 -2.57E-04 -2.27E-05 4.95E-05 2.08E-04 -2.54E-04 -1.05E-05 4.84E-05 2.15E-04 -2.36E-04 1.24E-05 4.87E-05 2.40E-04 -2.15E-04 1.25E-05 4.91E-05 2.42E-04 -2.17E-04 3.30E-06 5.58E-05 2.64E-04 -2.57E-04 -5.90E-05 3.71E-05 1.14E-04 -2.32E-04 -4.50E-04 PASS 4.50E-04 PASS -5.38E-05 3.93E-05 1.30E-04 -2.37E-04 -6.00E-04 PASS 6.00E-04 PASS -4.61E-05 3.93E-05 1.37E-04 -2.29E-04 -6.00E-04 PASS 6.00E-04 PASS -3.53E-05 4.05E-05 1.54E-04 -2.24E-04 -6.00E-04 PASS 6.00E-04 PASS -1.26E-05 3.93E-05 1.71E-04 -1.96E-04 -7.50E-04 PASS 7.50E-04 PASS -2.11E-05 3.70E-05 1.52E-04 -1.94E-04 -7.50E-04 PASS 7.50E-04 PASS -3.71E-05 3.27E-05 1.15E-04 -1.90E-04 -7.50E-04 PASS 7.50E-04 PASS An ISO 9001:2000 Certified Company 105 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 2 @ +5V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.50. Plot of Offset Voltage 2 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 106 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.50. Raw data for Offset Voltage 2 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 2 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -4.18E-05 4.32E-05 -6.92E-05 1.64E-05 5.63E-05 -5.56E-06 1.92E-05 -6.26E-05 -3.25E-05 -5.08E-05 9.90E-06 10 -3.44E-05 5.19E-05 -6.53E-05 2.28E-05 5.82E-05 -4.83E-06 2.62E-05 -4.69E-05 -2.13E-05 -3.57E-05 1.04E-05 20 -2.44E-05 6.39E-05 -5.58E-05 3.43E-05 7.21E-05 2.29E-06 4.11E-05 -3.33E-05 -1.11E-05 -2.61E-05 9.66E-06 30 7.88E-05 -1.70E-05 -3.94E-05 4.74E-05 8.29E-05 1.21E-05 6.11E-05 -1.84E-05 -9.70E-07 -2.00E-05 8.57E-06 50 1.45E-06 1.04E-04 -1.63E-05 7.64E-05 1.04E-04 3.12E-05 8.84E-05 7.36E-06 2.78E-05 -5.44E-06 9.54E-06 60 1.81E-06 1.03E-04 -1.33E-05 6.15E-05 9.74E-05 2.31E-05 7.58E-05 -6.09E-07 1.26E-05 -1.38E-05 9.41E-06 70 -9.79E-06 7.80E-05 -4.35E-05 5.37E-05 8.79E-05 -2.66E-06 4.76E-05 -3.84E-05 -2.16E-05 -2.89E-05 1.12E-05 9.88E-07 5.44E-05 2.55E-04 -2.53E-04 6.63E-06 5.44E-05 2.60E-04 -2.47E-04 1.80E-05 5.60E-05 2.79E-04 -2.43E-04 3.06E-05 5.59E-05 2.92E-04 -2.30E-04 5.38E-05 5.73E-05 3.21E-04 -2.14E-04 5.01E-05 5.37E-05 3.01E-04 -2.00E-04 3.33E-05 5.73E-05 3.01E-04 -2.34E-04 -2.65E-05 3.34E-05 1.29E-04 -1.82E-04 -4.50E-04 PASS 4.50E-04 PASS -1.65E-05 2.86E-05 1.17E-04 -1.50E-04 -6.00E-04 PASS 6.00E-04 PASS -5.44E-06 2.94E-05 1.32E-04 -1.43E-04 -6.00E-04 PASS 6.00E-04 PASS 6.76E-06 3.31E-05 1.61E-04 -1.48E-04 -6.00E-04 PASS 6.00E-04 PASS 2.98E-05 3.60E-05 1.98E-04 -1.38E-04 -7.50E-04 PASS 7.50E-04 PASS 1.94E-05 3.44E-05 1.80E-04 -1.41E-04 -7.50E-04 PASS 7.50E-04 PASS -8.79E-06 3.41E-05 1.50E-04 -1.68E-04 -7.50E-04 PASS 7.50E-04 PASS An ISO 9001:2000 Certified Company 107 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 8.00E-04 Offset Voltage 3 @ +5V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.51. Plot of Offset Voltage 3 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 108 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.51. Raw data for Offset Voltage 3 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 3 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -9.54E-06 -1.49E-04 -5.23E-05 -4.53E-05 -7.93E-05 -9.53E-05 -5.56E-05 -1.59E-05 -2.44E-05 -3.01E-05 -7.19E-05 10 -3.75E-06 -1.42E-04 -4.84E-05 -3.85E-05 -8.99E-05 -9.26E-05 -3.85E-05 -7.73E-06 -2.03E-05 -2.69E-05 -7.11E-05 20 4.82E-07 -1.37E-04 -3.95E-05 -3.21E-05 -8.44E-05 -8.72E-05 -2.17E-05 2.89E-06 -1.05E-05 -2.49E-05 -6.99E-05 30 -1.29E-04 6.52E-06 -3.13E-05 -1.79E-05 -6.92E-05 -7.75E-05 -9.66E-06 1.51E-05 4.71E-06 -1.20E-05 -6.97E-05 50 1.85E-05 -1.16E-04 -5.92E-06 1.24E-05 -5.17E-05 -6.10E-05 2.32E-05 4.32E-05 3.18E-05 3.26E-06 -7.23E-05 60 1.91E-05 -1.17E-04 -3.39E-06 3.74E-06 -5.12E-05 -6.23E-05 7.60E-06 3.34E-05 2.60E-05 9.61E-07 -7.29E-05 70 2.47E-05 -1.08E-04 -3.02E-05 1.39E-05 -4.41E-05 -7.45E-05 -1.73E-05 1.68E-05 4.34E-06 -2.30E-06 -7.03E-05 -6.71E-05 5.22E-05 1.76E-04 -3.11E-04 -6.44E-05 5.30E-05 1.83E-04 -3.12E-04 -5.85E-05 5.34E-05 1.90E-04 -3.08E-04 -4.82E-05 5.30E-05 1.99E-04 -2.95E-04 -2.86E-05 5.63E-05 2.34E-04 -2.91E-04 -2.97E-05 5.53E-05 2.29E-04 -2.88E-04 -2.88E-05 5.30E-05 2.18E-04 -2.76E-04 -4.43E-05 3.21E-05 1.06E-04 -1.94E-04 -4.50E-04 PASS 4.50E-04 PASS -3.72E-05 3.29E-05 1.16E-04 -1.91E-04 -6.00E-04 PASS 6.00E-04 PASS -2.83E-05 3.47E-05 1.34E-04 -1.90E-04 -6.00E-04 PASS 6.00E-04 PASS -1.59E-05 3.62E-05 1.53E-04 -1.85E-04 -6.00E-04 PASS 6.00E-04 PASS 8.09E-06 4.13E-05 2.01E-04 -1.85E-04 -7.50E-04 PASS 7.50E-04 PASS 1.13E-06 3.78E-05 1.78E-04 -1.75E-04 -7.50E-04 PASS 7.50E-04 PASS -1.46E-05 3.57E-05 1.52E-04 -1.81E-04 -7.50E-04 PASS 7.50E-04 PASS An ISO 9001:2000 Certified Company 109 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 4 @ +5V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.52. Plot of Offset Voltage 4 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 110 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.52. Raw data for Offset Voltage 4 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Voltage 4 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -2.65E-05 -6.86E-05 -3.54E-05 1.10E-05 -8.29E-05 -9.54E-06 -2.90E-06 2.16E-05 -1.36E-05 5.07E-06 -6.58E-05 10 -1.61E-05 -5.87E-05 -2.78E-05 1.92E-05 -7.81E-05 -1.45E-06 2.03E-05 3.61E-05 -3.14E-06 1.34E-05 -6.42E-05 20 -6.64E-06 -4.45E-05 -1.96E-05 3.50E-05 -6.97E-05 -4.87E-07 3.05E-05 5.10E-05 8.45E-06 2.38E-05 -6.53E-05 30 -4.09E-05 1.45E-06 -1.22E-05 4.71E-05 -6.21E-05 1.69E-06 4.03E-05 6.50E-05 2.40E-05 3.60E-05 -6.57E-05 50 2.38E-05 -4.77E-05 1.10E-05 7.18E-05 -4.29E-05 8.33E-06 6.70E-05 8.88E-05 5.28E-05 5.83E-05 -6.39E-05 60 1.83E-05 -4.07E-05 8.93E-06 -2.34E-05 -4.84E-05 -5.00E-09 5.95E-05 7.62E-05 3.53E-05 4.35E-05 -6.47E-05 70 3.37E-06 -3.25E-05 1.32E-06 3.37E-05 -5.44E-05 -2.81E-05 2.80E-05 5.02E-05 9.53E-06 2.50E-05 -6.29E-05 -4.05E-05 3.69E-05 1.32E-04 -2.13E-04 -3.23E-05 3.78E-05 1.44E-04 -2.09E-04 -2.11E-05 3.96E-05 1.64E-04 -2.06E-04 -1.33E-05 4.19E-05 1.82E-04 -2.09E-04 3.21E-06 4.98E-05 2.35E-04 -2.29E-04 -1.71E-05 2.96E-05 1.21E-04 -1.55E-04 -9.71E-06 3.43E-05 1.50E-04 -1.70E-04 1.19E-07 1.40E-05 6.52E-05 -6.50E-05 -4.50E-04 PASS 4.50E-04 PASS 1.30E-05 1.63E-05 8.89E-05 -6.28E-05 -6.00E-04 PASS 6.00E-04 PASS 2.27E-05 2.00E-05 1.16E-04 -7.07E-05 -6.00E-04 PASS 6.00E-04 PASS 3.34E-05 2.32E-05 1.41E-04 -7.46E-05 -6.00E-04 PASS 6.00E-04 PASS 5.50E-05 2.95E-05 1.93E-04 -8.25E-05 -7.50E-04 PASS 7.50E-04 PASS 4.29E-05 2.87E-05 1.77E-04 -9.08E-05 -7.50E-04 PASS 7.50E-04 PASS 1.69E-05 2.91E-05 1.53E-04 -1.19E-04 -7.50E-04 PASS 7.50E-04 PASS An ISO 9001:2000 Certified Company 111 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 1 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.53. Plot of Offset Current 1 @ +5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 112 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.53. Raw data for Offset Current 1 @ +5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 1 @ +5V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 8.80E-11 -1.51E-10 -2.70E-11 2.00E-12 -8.10E-11 1.40E-11 -1.30E-11 -2.10E-11 -1.09E-10 8.10E-11 -6.20E-11 10 5.30E-11 -1.40E-10 -4.00E-12 1.34E-10 3.00E-11 -2.80E-11 0.00E+00 -2.00E-11 -5.80E-11 1.28E-10 -8.90E-11 20 1.60E-10 -2.17E-10 3.10E-11 1.65E-10 1.17E-10 -1.00E-12 1.11E-10 -2.40E-11 -3.60E-11 1.59E-10 -7.10E-11 30 -1.28E-10 3.18E-10 2.07E-10 3.18E-10 1.84E-10 1.90E-11 1.47E-10 8.00E-12 -3.80E-11 1.21E-10 -6.60E-11 50 4.69E-10 -3.10E-11 1.90E-10 7.29E-10 3.28E-10 9.70E-11 3.50E-10 4.30E-11 1.31E-10 2.16E-10 -7.50E-11 60 5.31E-10 -1.28E-10 7.10E-11 3.53E-10 3.86E-10 5.50E-11 1.50E-10 1.74E-10 6.00E-11 2.30E-10 -7.70E-11 70 -3.54E-10 -8.55E-10 -5.20E-10 2.70E-10 -6.20E-10 -5.90E-11 5.20E-11 4.40E-11 9.00E-11 2.02E-10 -5.20E-11 -3.38E-11 8.96E-11 3.84E-10 -4.52E-10 1.46E-11 1.00E-10 4.82E-10 -4.53E-10 5.12E-11 1.59E-10 7.94E-10 -6.92E-10 1.80E-10 1.83E-10 1.03E-09 -6.73E-10 3.37E-10 2.86E-10 1.67E-09 -1.00E-09 2.43E-10 2.66E-10 1.48E-09 -9.98E-10 -4.16E-10 4.24E-10 1.56E-09 -2.39E-09 -9.60E-12 6.85E-11 3.10E-10 -3.29E-10 -1.00E-08 PASS 1.00E-08 PASS 4.40E-12 7.22E-11 3.41E-10 -3.32E-10 -1.00E-08 PASS 1.00E-08 PASS 4.18E-11 8.77E-11 4.51E-10 -3.67E-10 -1.00E-08 PASS 1.00E-08 PASS 5.14E-11 7.89E-11 4.20E-10 -3.17E-10 -1.00E-08 PASS 1.00E-08 PASS 1.67E-10 1.20E-10 7.27E-10 -3.92E-10 -1.50E-08 PASS 1.50E-08 PASS 1.34E-10 7.55E-11 4.86E-10 -2.18E-10 -1.50E-08 PASS 1.50E-08 PASS 6.58E-11 9.40E-11 5.05E-10 -3.73E-10 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 113 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 2 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.54. Plot of Offset Current 2 @ +5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 114 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.54. Raw data for Offset Current 2 @ +5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 2 @ +5V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 -2.40E-11 -6.50E-11 1.80E-11 -5.80E-11 -1.40E-11 -1.20E-11 -8.00E-11 -1.29E-10 -1.10E-11 3.00E-12 -7.00E-12 10 -1.00E-11 -1.93E-10 9.70E-11 1.57E-10 1.40E-11 3.00E-11 -1.50E-11 -1.27E-10 3.20E-11 -3.30E-11 -1.10E-11 20 -3.00E-12 -1.27E-10 1.95E-10 3.13E-10 1.40E-11 1.05E-10 0.00E+00 -9.60E-11 1.46E-10 -1.10E-11 -4.40E-11 30 -9.90E-11 -1.00E-12 1.00E-10 5.12E-10 9.50E-11 1.21E-10 4.50E-11 -5.50E-11 1.25E-10 2.60E-11 -2.00E-11 50 1.76E-10 -1.88E-10 3.70E-11 7.35E-10 1.14E-10 1.74E-10 1.34E-10 6.20E-11 3.04E-10 1.80E-10 -2.20E-11 60 4.60E-11 -5.10E-11 4.70E-11 4.94E-10 7.10E-11 1.66E-10 1.52E-10 1.70E-10 3.16E-10 2.35E-10 -3.20E-11 70 -6.28E-10 -9.21E-10 -7.59E-10 8.00E-11 -7.03E-10 5.00E-11 4.40E-11 6.30E-11 5.80E-11 9.60E-11 -1.10E-11 -2.86E-11 3.39E-11 1.30E-10 -1.87E-10 1.30E-11 1.33E-10 6.34E-10 -6.08E-10 7.84E-11 1.74E-10 8.92E-10 -7.35E-10 1.21E-10 2.33E-10 1.21E-09 -9.66E-10 1.75E-10 3.42E-10 1.77E-09 -1.42E-09 1.21E-10 2.13E-10 1.12E-09 -8.75E-10 -5.86E-10 3.88E-10 1.22E-09 -2.40E-09 -4.58E-11 5.66E-11 2.18E-10 -3.10E-10 -1.00E-08 PASS 1.00E-08 PASS -2.26E-11 6.48E-11 2.80E-10 -3.25E-10 -1.00E-08 PASS 1.00E-08 PASS 2.88E-11 9.69E-11 4.81E-10 -4.23E-10 -1.00E-08 PASS 1.00E-08 PASS 5.24E-11 7.46E-11 4.01E-10 -2.96E-10 -1.00E-08 PASS 1.00E-08 PASS 1.71E-10 8.81E-11 5.82E-10 -2.40E-10 -1.50E-08 PASS 1.50E-08 PASS 2.08E-10 6.84E-11 5.27E-10 -1.12E-10 -1.50E-08 PASS 1.50E-08 PASS 6.22E-11 2.03E-11 1.57E-10 -3.23E-11 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 115 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 3 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.55. Plot of Offset Current 3 @ +5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 116 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.55. Raw data for Offset Current 3 @ +5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 3 @ +5V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 5.50E-11 5.90E-11 -1.50E-10 -1.15E-10 -5.50E-11 -2.80E-11 -6.50E-11 -7.20E-11 3.50E-11 3.60E-11 -8.90E-11 10 1.04E-10 3.70E-11 -1.24E-10 1.60E-11 -8.00E-12 1.90E-11 -7.00E-12 -1.05E-10 3.50E-11 6.70E-11 -1.20E-10 20 6.30E-11 8.00E-11 -1.69E-10 2.85E-10 5.80E-11 1.30E-11 -7.30E-11 -2.50E-11 2.20E-11 5.20E-11 -8.90E-11 30 8.40E-11 1.11E-10 -2.34E-10 4.63E-10 1.38E-10 6.10E-11 -4.70E-11 3.50E-11 1.45E-10 1.25E-10 -8.90E-11 50 2.41E-10 1.29E-10 -2.74E-10 6.23E-10 2.46E-10 2.95E-10 1.03E-10 1.19E-10 3.02E-10 2.46E-10 -8.90E-11 60 3.46E-10 -1.10E-11 3.69E-10 6.12E-10 3.78E-10 8.50E-11 1.43E-10 2.00E-11 3.16E-10 1.27E-10 -1.36E-10 70 -3.12E-10 -6.81E-10 -4.00E-11 3.61E-10 -7.13E-10 2.18E-10 5.20E-11 7.00E-12 2.67E-10 2.09E-10 -1.32E-10 -4.12E-11 9.59E-11 4.06E-10 -4.89E-10 5.00E-12 8.33E-11 3.94E-10 -3.84E-10 6.34E-11 1.61E-10 8.14E-10 -6.87E-10 1.12E-10 2.47E-10 1.27E-09 -1.04E-09 1.93E-10 3.21E-10 1.69E-09 -1.30E-09 3.39E-10 2.23E-10 1.38E-09 -7.03E-10 -2.77E-10 4.52E-10 1.83E-09 -2.39E-09 -1.88E-11 5.23E-11 2.25E-10 -2.63E-10 -1.00E-08 PASS 1.00E-08 PASS 1.80E-12 6.54E-11 3.07E-10 -3.04E-10 -1.00E-08 PASS 1.00E-08 PASS -2.20E-12 4.82E-11 2.23E-10 -2.27E-10 -1.00E-08 PASS 1.00E-08 PASS 6.38E-11 7.66E-11 4.21E-10 -2.93E-10 -1.00E-08 PASS 1.00E-08 PASS 2.13E-10 9.57E-11 6.60E-10 -2.34E-10 -1.50E-08 PASS 1.50E-08 PASS 1.38E-10 1.10E-10 6.52E-10 -3.76E-10 -1.50E-08 PASS 1.50E-08 PASS 1.51E-10 1.14E-10 6.82E-10 -3.81E-10 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 117 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-08 Offset Current 4 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.56. Plot of Offset Current 4 @ +5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 118 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.56. Raw data for Offset Current 4 @ +5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Offset Current 4 @ +5V (A) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 7.90E-11 -2.00E-11 -8.30E-11 -3.80E-11 5.00E-12 6.80E-11 -2.10E-10 9.00E-12 -1.28E-10 1.30E-11 -1.19E-10 10 2.90E-11 -2.21E-10 -9.20E-11 1.80E-11 1.08E-10 6.60E-11 -1.49E-10 -7.00E-11 -1.86E-10 -8.10E-11 -1.25E-10 20 1.15E-10 -2.35E-10 -1.30E-10 6.70E-11 2.07E-10 -4.50E-11 -2.60E-11 -1.10E-10 -1.74E-10 -2.28E-10 -1.33E-10 30 -2.99E-10 1.84E-10 -1.20E-11 2.57E-10 2.78E-10 -4.90E-11 -8.00E-11 -1.37E-10 -2.21E-10 -2.36E-10 -1.30E-10 50 2.49E-10 -5.43E-10 -1.36E-10 4.20E-10 3.34E-10 8.00E-12 7.70E-11 -1.46E-10 -9.80E-11 -1.28E-10 -1.31E-10 60 3.49E-10 -2.33E-10 2.00E-11 -1.51E-09 4.28E-10 -3.10E-11 -1.60E-10 -1.06E-10 -2.78E-10 -2.85E-10 -1.40E-10 70 -1.09E-10 -1.01E-09 -6.11E-10 -1.83E-10 -3.35E-10 5.00E-12 7.20E-11 1.00E-11 -8.30E-11 2.80E-11 -1.18E-10 -1.14E-11 5.99E-11 2.68E-10 -2.91E-10 -3.16E-11 1.28E-10 5.64E-10 -6.27E-10 4.80E-12 1.82E-10 8.54E-10 -8.45E-10 8.16E-11 2.42E-10 1.21E-09 -1.05E-09 6.48E-11 4.01E-10 1.93E-09 -1.80E-09 -1.89E-10 7.84E-10 3.47E-09 -3.85E-09 -4.49E-10 3.66E-10 1.26E-09 -2.16E-09 -4.96E-11 1.15E-10 4.88E-10 -5.87E-10 -1.00E-08 PASS 1.00E-08 PASS -8.40E-11 9.66E-11 3.67E-10 -5.35E-10 -1.00E-08 PASS 1.00E-08 PASS -1.17E-10 8.53E-11 2.81E-10 -5.14E-10 -1.00E-08 PASS 1.00E-08 PASS -1.45E-10 8.30E-11 2.43E-10 -5.32E-10 -1.00E-08 PASS 1.00E-08 PASS -5.74E-11 9.59E-11 3.90E-10 -5.05E-10 -1.50E-08 PASS 1.50E-08 PASS -1.72E-10 1.10E-10 3.41E-10 -6.85E-10 -1.50E-08 PASS 1.50E-08 PASS 6.40E-12 5.65E-11 2.70E-10 -2.57E-10 -1.50E-08 PASS 1.50E-08 PASS An ISO 9001:2000 Certified Company 119 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 1 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.57. Plot of Positive Bias Current 1 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 120 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.57. Raw data for Positive Bias Current 1 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 1 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.28E-08 1.33E-08 1.14E-08 1.31E-08 1.28E-08 1.25E-08 1.32E-08 1.26E-08 1.38E-08 1.14E-08 1.12E-08 10 1.52E-08 1.58E-08 1.38E-08 1.53E-08 1.53E-08 1.48E-08 1.56E-08 1.48E-08 1.62E-08 1.35E-08 1.13E-08 20 1.80E-08 1.89E-08 1.69E-08 1.84E-08 1.85E-08 1.78E-08 1.85E-08 1.76E-08 1.94E-08 1.62E-08 1.13E-08 30 2.21E-08 2.11E-08 2.01E-08 2.20E-08 2.22E-08 2.09E-08 2.18E-08 2.06E-08 2.29E-08 1.93E-08 1.13E-08 50 2.71E-08 2.82E-08 2.63E-08 2.82E-08 2.84E-08 2.70E-08 2.78E-08 2.64E-08 2.94E-08 2.47E-08 1.13E-08 60 2.88E-08 3.01E-08 2.80E-08 3.03E-08 2.99E-08 2.69E-08 2.75E-08 2.61E-08 2.91E-08 2.41E-08 1.12E-08 70 2.68E-08 2.76E-08 2.50E-08 2.73E-08 2.74E-08 2.26E-08 2.33E-08 2.22E-08 2.46E-08 2.02E-08 1.11E-08 1.27E-08 7.71E-10 1.63E-08 9.08E-09 1.51E-08 7.68E-10 1.86E-08 1.15E-08 1.81E-08 7.65E-10 2.17E-08 1.46E-08 2.15E-08 8.73E-10 2.56E-08 1.74E-08 2.76E-08 9.06E-10 3.19E-08 2.34E-08 2.94E-08 9.91E-10 3.40E-08 2.48E-08 2.68E-08 1.07E-09 3.18E-08 2.18E-08 1.27E-08 8.76E-10 1.68E-08 8.60E-09 -5.00E-08 PASS 5.00E-08 PASS 1.50E-08 1.02E-09 1.97E-08 1.02E-08 -8.00E-08 PASS 8.00E-08 PASS 1.79E-08 1.15E-09 2.33E-08 1.25E-08 -1.00E-07 PASS 1.00E-07 PASS 2.11E-08 1.34E-09 2.73E-08 1.49E-08 -1.00E-07 PASS 1.00E-07 PASS 2.71E-08 1.75E-09 3.52E-08 1.89E-08 -1.25E-07 PASS 1.25E-07 PASS 2.67E-08 1.86E-09 3.54E-08 1.81E-08 -1.25E-07 PASS 1.25E-07 PASS 2.26E-08 1.60E-09 3.01E-08 1.51E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 121 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 2 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.58. Plot of Positive Bias Current 2 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 122 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.58. Raw data for Positive Bias Current 2 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 2 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.32E-08 1.36E-08 1.26E-08 1.37E-08 1.38E-08 1.15E-08 1.41E-08 1.43E-08 1.32E-08 1.26E-08 1.19E-08 10 1.56E-08 1.59E-08 1.54E-08 1.60E-08 1.68E-08 1.39E-08 1.63E-08 1.67E-08 1.56E-08 1.50E-08 1.18E-08 20 1.86E-08 1.90E-08 1.87E-08 1.92E-08 2.03E-08 1.68E-08 1.92E-08 1.97E-08 1.86E-08 1.82E-08 1.19E-08 30 2.21E-08 2.19E-08 2.24E-08 2.28E-08 2.42E-08 1.99E-08 2.24E-08 2.30E-08 2.20E-08 2.14E-08 1.18E-08 50 2.79E-08 2.84E-08 2.93E-08 2.94E-08 3.14E-08 2.58E-08 2.86E-08 2.89E-08 2.82E-08 2.73E-08 1.19E-08 60 2.99E-08 3.01E-08 3.08E-08 3.13E-08 3.29E-08 2.52E-08 2.85E-08 2.87E-08 2.77E-08 2.66E-08 1.19E-08 70 2.76E-08 2.80E-08 2.77E-08 2.82E-08 3.02E-08 2.11E-08 2.44E-08 2.45E-08 2.35E-08 2.25E-08 1.18E-08 1.34E-08 4.77E-10 1.56E-08 1.12E-08 1.59E-08 5.40E-10 1.85E-08 1.34E-08 1.92E-08 6.89E-10 2.24E-08 1.59E-08 2.27E-08 9.19E-10 2.70E-08 1.84E-08 2.93E-08 1.33E-09 3.55E-08 2.31E-08 3.10E-08 1.23E-09 3.67E-08 2.53E-08 2.84E-08 1.06E-09 3.33E-08 2.34E-08 1.32E-08 1.13E-09 1.84E-08 7.86E-09 -5.00E-08 PASS 5.00E-08 PASS 1.55E-08 1.12E-09 2.07E-08 1.03E-08 -8.00E-08 PASS 8.00E-08 PASS 1.85E-08 1.13E-09 2.38E-08 1.32E-08 -1.00E-07 PASS 1.00E-07 PASS 2.18E-08 1.18E-09 2.72E-08 1.63E-08 -1.00E-07 PASS 1.00E-07 PASS 2.77E-08 1.25E-09 3.36E-08 2.19E-08 -1.25E-07 PASS 1.25E-07 PASS 2.73E-08 1.44E-09 3.41E-08 2.06E-08 -1.25E-07 PASS 1.25E-07 PASS 2.32E-08 1.41E-09 2.98E-08 1.66E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 123 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 3 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.59. Plot of Positive Bias Current 3 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 124 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.59. Raw data for Positive Bias Current 3 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 3 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.21E-08 1.23E-08 1.24E-08 1.32E-08 1.32E-08 1.16E-08 1.30E-08 1.38E-08 1.28E-08 1.22E-08 1.14E-08 10 1.43E-08 1.46E-08 1.51E-08 1.56E-08 1.61E-08 1.41E-08 1.51E-08 1.61E-08 1.52E-08 1.44E-08 1.14E-08 20 1.70E-08 1.74E-08 1.83E-08 1.87E-08 1.94E-08 1.70E-08 1.78E-08 1.89E-08 1.81E-08 1.75E-08 1.14E-08 30 2.04E-08 2.01E-08 2.19E-08 2.22E-08 2.31E-08 2.01E-08 2.08E-08 2.21E-08 2.13E-08 2.08E-08 1.14E-08 50 2.58E-08 2.61E-08 2.87E-08 2.86E-08 3.00E-08 2.60E-08 2.65E-08 2.77E-08 2.73E-08 2.65E-08 1.15E-08 60 2.76E-08 2.78E-08 2.95E-08 3.04E-08 3.14E-08 2.56E-08 2.64E-08 2.77E-08 2.68E-08 2.58E-08 1.15E-08 70 2.53E-08 2.58E-08 2.45E-08 2.74E-08 2.90E-08 2.13E-08 2.24E-08 2.35E-08 2.27E-08 2.18E-08 1.14E-08 1.26E-08 5.43E-10 1.52E-08 1.01E-08 1.51E-08 7.40E-10 1.86E-08 1.17E-08 1.82E-08 9.63E-10 2.27E-08 1.37E-08 2.15E-08 1.27E-09 2.74E-08 1.56E-08 2.78E-08 1.82E-09 3.63E-08 1.93E-08 2.93E-08 1.65E-09 3.71E-08 2.16E-08 2.64E-08 1.79E-09 3.47E-08 1.81E-08 1.27E-08 8.10E-10 1.65E-08 8.92E-09 -5.00E-08 PASS 5.00E-08 PASS 1.50E-08 7.81E-10 1.86E-08 1.13E-08 -8.00E-08 PASS 8.00E-08 PASS 1.79E-08 7.06E-10 2.12E-08 1.46E-08 -1.00E-07 PASS 1.00E-07 PASS 2.10E-08 7.28E-10 2.44E-08 1.76E-08 -1.00E-07 PASS 1.00E-07 PASS 2.68E-08 6.88E-10 3.00E-08 2.36E-08 -1.25E-07 PASS 1.25E-07 PASS 2.64E-08 8.16E-10 3.02E-08 2.26E-08 -1.25E-07 PASS 1.25E-07 PASS 2.24E-08 8.29E-10 2.62E-08 1.85E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 125 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 4 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.60. Plot of Positive Bias Current 4 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 126 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.60. Raw data for Positive Bias Current 4 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Bias Current 4 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.33E-08 1.37E-08 1.24E-08 1.36E-08 1.32E-08 1.22E-08 1.37E-08 1.37E-08 1.43E-08 1.19E-08 1.23E-08 10 1.57E-08 1.63E-08 1.50E-08 1.58E-08 1.58E-08 1.46E-08 1.62E-08 1.61E-08 1.70E-08 1.40E-08 1.23E-08 20 1.86E-08 1.94E-08 1.82E-08 1.92E-08 1.91E-08 1.74E-08 1.92E-08 1.90E-08 2.01E-08 1.69E-08 1.23E-08 30 2.28E-08 2.19E-08 2.19E-08 2.28E-08 2.27E-08 2.06E-08 2.25E-08 2.24E-08 2.37E-08 1.99E-08 1.23E-08 50 2.79E-08 2.92E-08 2.87E-08 2.94E-08 2.94E-08 2.67E-08 2.90E-08 2.84E-08 3.07E-08 2.57E-08 1.23E-08 60 2.98E-08 3.10E-08 3.01E-08 3.13E-08 3.09E-08 2.68E-08 2.87E-08 2.83E-08 3.04E-08 2.51E-08 1.23E-08 70 2.76E-08 2.85E-08 2.69E-08 2.85E-08 2.82E-08 2.22E-08 2.41E-08 2.40E-08 2.56E-08 2.10E-08 1.22E-08 1.32E-08 5.28E-10 1.57E-08 1.08E-08 1.57E-08 4.70E-10 1.79E-08 1.35E-08 1.89E-08 5.00E-10 2.13E-08 1.66E-08 2.24E-08 4.60E-10 2.46E-08 2.03E-08 2.89E-08 6.28E-10 3.18E-08 2.60E-08 3.06E-08 6.42E-10 3.36E-08 2.76E-08 2.79E-08 6.83E-10 3.11E-08 2.48E-08 1.32E-08 1.04E-09 1.80E-08 8.30E-09 -5.00E-08 PASS 5.00E-08 PASS 1.56E-08 1.22E-09 2.13E-08 9.87E-09 -8.00E-08 PASS 8.00E-08 PASS 1.85E-08 1.34E-09 2.48E-08 1.23E-08 -1.00E-07 PASS 1.00E-07 PASS 2.18E-08 1.54E-09 2.90E-08 1.46E-08 -1.00E-07 PASS 1.00E-07 PASS 2.81E-08 1.94E-09 3.72E-08 1.90E-08 -1.25E-07 PASS 1.25E-07 PASS 2.79E-08 2.02E-09 3.73E-08 1.85E-08 -1.25E-07 PASS 1.25E-07 PASS 2.34E-08 1.79E-09 3.17E-08 1.50E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 127 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 1 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.61. Plot of Negative Bias Current 1 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 128 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.61. Raw data for Negative Bias Current 1 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 1 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.30E-08 1.33E-08 1.13E-08 1.31E-08 1.28E-08 1.25E-08 1.32E-08 1.26E-08 1.37E-08 1.16E-08 1.12E-08 10 1.54E-08 1.57E-08 1.39E-08 1.55E-08 1.54E-08 1.48E-08 1.56E-08 1.48E-08 1.62E-08 1.36E-08 1.12E-08 20 1.82E-08 1.87E-08 1.70E-08 1.86E-08 1.88E-08 1.78E-08 1.87E-08 1.77E-08 1.94E-08 1.64E-08 1.13E-08 30 2.20E-08 2.16E-08 2.04E-08 2.24E-08 2.24E-08 2.10E-08 2.19E-08 2.07E-08 2.29E-08 1.95E-08 1.12E-08 50 2.77E-08 2.83E-08 2.66E-08 2.90E-08 2.89E-08 2.72E-08 2.83E-08 2.65E-08 2.97E-08 2.50E-08 1.13E-08 60 2.94E-08 3.00E-08 2.81E-08 3.07E-08 3.04E-08 2.70E-08 2.77E-08 2.63E-08 2.93E-08 2.44E-08 1.12E-08 70 2.66E-08 2.69E-08 2.45E-08 2.76E-08 2.68E-08 2.26E-08 2.34E-08 2.23E-08 2.48E-08 2.05E-08 1.12E-08 1.27E-08 7.70E-10 1.63E-08 9.10E-09 1.52E-08 7.34E-10 1.86E-08 1.17E-08 1.83E-08 7.58E-10 2.18E-08 1.47E-08 2.18E-08 8.14E-10 2.56E-08 1.80E-08 2.81E-08 9.77E-10 3.27E-08 2.36E-08 2.97E-08 1.01E-09 3.44E-08 2.50E-08 2.65E-08 1.16E-09 3.19E-08 2.11E-08 1.27E-08 7.95E-10 1.64E-08 9.00E-09 -5.00E-08 PASS 5.00E-08 PASS 1.50E-08 9.70E-10 1.95E-08 1.05E-08 -8.00E-08 PASS 8.00E-08 PASS 1.80E-08 1.12E-09 2.32E-08 1.28E-08 -1.00E-07 PASS 1.00E-07 PASS 2.12E-08 1.31E-09 2.73E-08 1.51E-08 -1.00E-07 PASS 1.00E-07 PASS 2.73E-08 1.76E-09 3.55E-08 1.91E-08 -1.25E-07 PASS 1.25E-07 PASS 2.70E-08 1.82E-09 3.55E-08 1.84E-08 -1.25E-07 PASS 1.25E-07 PASS 2.27E-08 1.56E-09 3.00E-08 1.54E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 129 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 2 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.62. Plot of Negative Bias Current 2 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 130 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.62. Raw data for Negative Bias Current 2 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 2 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.33E-08 1.35E-08 1.27E-08 1.37E-08 1.38E-08 1.16E-08 1.40E-08 1.42E-08 1.33E-08 1.27E-08 1.18E-08 10 1.57E-08 1.59E-08 1.56E-08 1.62E-08 1.68E-08 1.39E-08 1.64E-08 1.66E-08 1.57E-08 1.50E-08 1.19E-08 20 1.87E-08 1.89E-08 1.90E-08 1.96E-08 2.05E-08 1.69E-08 1.92E-08 1.97E-08 1.88E-08 1.82E-08 1.19E-08 30 2.21E-08 2.20E-08 2.25E-08 2.34E-08 2.44E-08 2.01E-08 2.25E-08 2.31E-08 2.22E-08 2.15E-08 1.19E-08 50 2.81E-08 2.83E-08 2.94E-08 3.02E-08 3.16E-08 2.60E-08 2.88E-08 2.91E-08 2.86E-08 2.75E-08 1.19E-08 60 3.00E-08 3.01E-08 3.09E-08 3.18E-08 3.31E-08 2.55E-08 2.88E-08 2.89E-08 2.81E-08 2.69E-08 1.19E-08 70 2.71E-08 2.73E-08 2.70E-08 2.84E-08 2.96E-08 2.13E-08 2.45E-08 2.46E-08 2.37E-08 2.27E-08 1.18E-08 1.34E-08 4.31E-10 1.54E-08 1.14E-08 1.61E-08 5.10E-10 1.84E-08 1.37E-08 1.93E-08 7.21E-10 2.27E-08 1.60E-08 2.29E-08 1.00E-09 2.76E-08 1.82E-08 2.95E-08 1.45E-09 3.63E-08 2.28E-08 3.12E-08 1.31E-09 3.73E-08 2.51E-08 2.79E-08 1.12E-09 3.31E-08 2.27E-08 1.31E-08 1.09E-09 1.82E-08 8.07E-09 -5.00E-08 PASS 5.00E-08 PASS 1.55E-08 1.10E-09 2.07E-08 1.04E-08 -8.00E-08 PASS 8.00E-08 PASS 1.86E-08 1.06E-09 2.35E-08 1.36E-08 -1.00E-07 PASS 1.00E-07 PASS 2.19E-08 1.13E-09 2.72E-08 1.66E-08 -1.00E-07 PASS 1.00E-07 PASS 2.80E-08 1.24E-09 3.38E-08 2.22E-08 -1.25E-07 PASS 1.25E-07 PASS 2.76E-08 1.42E-09 3.43E-08 2.10E-08 -1.25E-07 PASS 1.25E-07 PASS 2.34E-08 1.39E-09 2.99E-08 1.69E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 131 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 3 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.63. Plot of Negative Bias Current 3 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 132 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.63. Raw data for Negative Bias Current 3 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 3 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.21E-08 1.25E-08 1.23E-08 1.32E-08 1.32E-08 1.16E-08 1.29E-08 1.38E-08 1.29E-08 1.23E-08 1.13E-08 10 1.45E-08 1.46E-08 1.50E-08 1.57E-08 1.62E-08 1.42E-08 1.52E-08 1.60E-08 1.53E-08 1.45E-08 1.14E-08 20 1.72E-08 1.75E-08 1.82E-08 1.90E-08 1.96E-08 1.70E-08 1.78E-08 1.89E-08 1.83E-08 1.76E-08 1.13E-08 30 2.05E-08 2.03E-08 2.18E-08 2.27E-08 2.33E-08 2.02E-08 2.08E-08 2.22E-08 2.15E-08 2.10E-08 1.13E-08 50 2.61E-08 2.63E-08 2.85E-08 2.94E-08 3.03E-08 2.63E-08 2.67E-08 2.79E-08 2.76E-08 2.69E-08 1.14E-08 60 2.80E-08 2.79E-08 2.99E-08 3.11E-08 3.19E-08 2.58E-08 2.66E-08 2.77E-08 2.72E-08 2.60E-08 1.14E-08 70 2.51E-08 2.53E-08 2.46E-08 2.78E-08 2.84E-08 2.16E-08 2.25E-08 2.36E-08 2.30E-08 2.22E-08 1.13E-08 1.26E-08 5.08E-10 1.50E-08 1.03E-08 1.52E-08 7.01E-10 1.85E-08 1.19E-08 1.83E-08 1.01E-09 2.30E-08 1.36E-08 2.17E-08 1.29E-09 2.78E-08 1.57E-08 2.81E-08 1.86E-09 3.68E-08 1.94E-08 2.98E-08 1.80E-09 3.82E-08 2.14E-08 2.62E-08 1.74E-09 3.44E-08 1.81E-08 1.27E-08 7.99E-10 1.64E-08 8.97E-09 -5.00E-08 PASS 5.00E-08 PASS 1.50E-08 7.13E-10 1.84E-08 1.17E-08 -8.00E-08 PASS 8.00E-08 PASS 1.79E-08 7.16E-10 2.13E-08 1.46E-08 -1.00E-07 PASS 1.00E-07 PASS 2.11E-08 7.46E-10 2.46E-08 1.77E-08 -1.00E-07 PASS 1.00E-07 PASS 2.71E-08 6.56E-10 3.01E-08 2.40E-08 -1.25E-07 PASS 1.25E-07 PASS 2.67E-08 7.99E-10 3.04E-08 2.29E-08 -1.25E-07 PASS 1.25E-07 PASS 2.26E-08 7.78E-10 2.62E-08 1.90E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 133 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Biased Ps99%/90% (-KTL) Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 4 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.64. Plot of Negative Bias Current 4 @ +/-5V (A) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 134 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.64. Raw data for Negative Bias Current 4 @ +/-5V (A) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Bias Current 4 @ +5V (A) Total Dose (krad(Si)) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.33E-08 1.37E-08 1.23E-08 1.35E-08 1.33E-08 1.23E-08 1.35E-08 1.38E-08 1.42E-08 1.20E-08 1.22E-08 10 1.58E-08 1.61E-08 1.50E-08 1.60E-08 1.60E-08 1.47E-08 1.61E-08 1.61E-08 1.68E-08 1.40E-08 1.22E-08 20 1.88E-08 1.93E-08 1.82E-08 1.94E-08 1.94E-08 1.74E-08 1.92E-08 1.90E-08 2.01E-08 1.68E-08 1.22E-08 30 2.26E-08 2.22E-08 2.20E-08 2.31E-08 2.30E-08 2.07E-08 2.25E-08 2.23E-08 2.36E-08 1.98E-08 1.22E-08 50 2.83E-08 2.88E-08 2.86E-08 2.99E-08 2.99E-08 2.68E-08 2.92E-08 2.84E-08 3.06E-08 2.57E-08 1.23E-08 60 3.02E-08 3.08E-08 3.02E-08 2.99E-08 3.14E-08 2.68E-08 2.86E-08 2.82E-08 3.02E-08 2.49E-08 1.23E-08 70 2.76E-08 2.76E-08 2.64E-08 2.84E-08 2.80E-08 2.23E-08 2.43E-08 2.41E-08 2.56E-08 2.11E-08 1.22E-08 1.32E-08 5.55E-10 1.58E-08 1.07E-08 1.58E-08 4.73E-10 1.80E-08 1.36E-08 1.90E-08 5.17E-10 2.14E-08 1.66E-08 2.26E-08 5.02E-10 2.49E-08 2.02E-08 2.91E-08 7.46E-10 3.26E-08 2.56E-08 3.05E-08 5.88E-10 3.32E-08 2.77E-08 2.76E-08 7.60E-10 3.11E-08 2.40E-08 1.31E-08 9.77E-10 1.77E-08 8.59E-09 -5.00E-08 PASS 5.00E-08 PASS 1.55E-08 1.15E-09 2.09E-08 1.02E-08 -8.00E-08 PASS 8.00E-08 PASS 1.85E-08 1.34E-09 2.48E-08 1.22E-08 -1.00E-07 PASS 1.00E-07 PASS 2.18E-08 1.54E-09 2.90E-08 1.46E-08 -1.00E-07 PASS 1.00E-07 PASS 2.81E-08 1.96E-09 3.73E-08 1.90E-08 -1.25E-07 PASS 1.25E-07 PASS 2.78E-08 2.00E-09 3.71E-08 1.84E-08 -1.25E-07 PASS 1.25E-07 PASS 2.35E-08 1.77E-09 3.17E-08 1.52E-08 -1.25E-07 PASS 1.25E-07 PASS An ISO 9001:2000 Certified Company 135 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 1 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.65. Plot of Positive Output Voltage 1 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 136 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.65. Raw data for Positive Output Voltage 1 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 1 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.27E+00 4.27E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 4.28E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 10 4.27E+00 4.27E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.27E+00 20 4.27E+00 4.27E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.27E+00 30 4.27E+00 4.27E+00 4.28E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 4.26E+00 4.27E+00 4.28E+00 50 4.28E+00 4.29E+00 4.30E+00 4.28E+00 4.29E+00 4.27E+00 4.29E+00 4.27E+00 4.27E+00 4.28E+00 4.28E+00 60 4.31E+00 4.31E+00 4.31E+00 4.29E+00 4.31E+00 4.28E+00 4.30E+00 4.28E+00 4.28E+00 4.29E+00 4.28E+00 70 4.30E+00 4.30E+00 4.30E+00 4.30E+00 4.30E+00 4.28E+00 4.30E+00 4.29E+00 4.29E+00 4.30E+00 4.27E+00 4.27E+00 3.96E-03 4.29E+00 4.25E+00 4.27E+00 4.60E-03 4.29E+00 4.25E+00 4.27E+00 4.15E-03 4.29E+00 4.25E+00 4.27E+00 4.42E-03 4.29E+00 4.25E+00 4.29E+00 6.43E-03 4.32E+00 4.26E+00 4.30E+00 5.50E-03 4.33E+00 4.28E+00 4.30E+00 2.17E-03 4.31E+00 4.29E+00 4.27E+00 5.52E-03 4.30E+00 4.24E+00 4.00E+00 PASS 4.26E+00 4.02E-03 4.28E+00 4.24E+00 4.00E+00 PASS 4.26E+00 4.04E-03 4.28E+00 4.24E+00 4.00E+00 PASS 4.27E+00 4.83E-03 4.29E+00 4.24E+00 4.00E+00 PASS 4.28E+00 6.60E-03 4.31E+00 4.25E+00 4.00E+00 PASS 4.29E+00 7.79E-03 4.32E+00 4.25E+00 4.00E+00 PASS 4.29E+00 9.04E-03 4.33E+00 4.25E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 137 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 2 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.66. Plot of Positive Output Voltage 2 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 138 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.66. Raw data for Positive Output Voltage 2 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 2 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.27E+00 4.26E+00 4.26E+00 4.25E+00 4.26E+00 4.26E+00 4.26E+00 4.25E+00 4.25E+00 4.26E+00 4.26E+00 10 4.27E+00 4.26E+00 4.26E+00 4.25E+00 4.25E+00 4.26E+00 4.25E+00 4.25E+00 4.25E+00 4.25E+00 4.26E+00 20 4.27E+00 4.26E+00 4.26E+00 4.25E+00 4.25E+00 4.26E+00 4.25E+00 4.25E+00 4.25E+00 4.25E+00 4.26E+00 30 4.26E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 4.25E+00 4.25E+00 4.25E+00 4.25E+00 4.26E+00 50 4.28E+00 4.27E+00 4.27E+00 4.27E+00 4.27E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 60 4.30E+00 4.28E+00 4.28E+00 4.27E+00 4.28E+00 4.28E+00 4.27E+00 4.27E+00 4.27E+00 4.27E+00 4.26E+00 70 4.31E+00 4.31E+00 4.30E+00 4.29E+00 4.29E+00 4.28E+00 4.27E+00 4.27E+00 4.27E+00 4.27E+00 4.26E+00 4.26E+00 8.03E-03 4.30E+00 4.22E+00 4.26E+00 7.70E-03 4.29E+00 4.22E+00 4.26E+00 6.67E-03 4.29E+00 4.23E+00 4.26E+00 6.47E-03 4.29E+00 4.23E+00 4.27E+00 6.99E-03 4.30E+00 4.24E+00 4.28E+00 9.44E-03 4.33E+00 4.24E+00 4.30E+00 1.17E-02 4.35E+00 4.24E+00 4.26E+00 3.70E-03 4.27E+00 4.24E+00 4.00E+00 PASS 4.25E+00 3.63E-03 4.27E+00 4.23E+00 4.00E+00 PASS 4.25E+00 3.65E-03 4.27E+00 4.23E+00 4.00E+00 PASS 4.25E+00 4.09E-03 4.27E+00 4.24E+00 4.00E+00 PASS 4.26E+00 5.20E-03 4.29E+00 4.24E+00 4.00E+00 PASS 4.27E+00 6.38E-03 4.30E+00 4.24E+00 4.00E+00 PASS 4.27E+00 6.76E-03 4.30E+00 4.24E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 139 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 3 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.67. Plot of Positive Output Voltage 3 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 140 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.67. Raw data for Positive Output Voltage 3 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 3 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.29E+00 4.29E+00 4.27E+00 4.27E+00 4.27E+00 4.28E+00 4.27E+00 4.27E+00 4.27E+00 4.27E+00 4.28E+00 10 4.29E+00 4.28E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 4.28E+00 20 4.28E+00 4.28E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 4.28E+00 30 4.28E+00 4.29E+00 4.27E+00 4.27E+00 4.27E+00 4.28E+00 4.26E+00 4.26E+00 4.27E+00 4.27E+00 4.28E+00 50 4.31E+00 4.30E+00 4.29E+00 4.28E+00 4.29E+00 4.29E+00 4.28E+00 4.27E+00 4.28E+00 4.28E+00 4.28E+00 60 4.32E+00 4.31E+00 4.31E+00 4.30E+00 4.31E+00 4.31E+00 4.29E+00 4.28E+00 4.29E+00 4.29E+00 4.28E+00 70 4.31E+00 4.30E+00 4.30E+00 4.30E+00 4.30E+00 4.30E+00 4.30E+00 4.29E+00 4.30E+00 4.30E+00 4.27E+00 4.28E+00 1.12E-02 4.33E+00 4.22E+00 4.27E+00 9.83E-03 4.32E+00 4.23E+00 4.27E+00 8.44E-03 4.31E+00 4.23E+00 4.28E+00 8.04E-03 4.31E+00 4.24E+00 4.29E+00 1.05E-02 4.34E+00 4.24E+00 4.31E+00 6.50E-03 4.34E+00 4.28E+00 4.30E+00 3.13E-03 4.32E+00 4.29E+00 4.27E+00 3.78E-03 4.29E+00 4.25E+00 4.00E+00 PASS 4.26E+00 3.70E-03 4.28E+00 4.24E+00 4.00E+00 PASS 4.26E+00 4.34E-03 4.28E+00 4.24E+00 4.00E+00 PASS 4.27E+00 4.51E-03 4.29E+00 4.25E+00 4.00E+00 PASS 4.28E+00 6.80E-03 4.31E+00 4.25E+00 4.00E+00 PASS 4.29E+00 1.03E-02 4.34E+00 4.24E+00 4.00E+00 PASS 4.30E+00 4.39E-03 4.32E+00 4.28E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 141 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 4 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.68. Plot of Positive Output Voltage 4 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 142 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.68. Raw data for Positive Output Voltage 4 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 4 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 4.25E+00 4.26E+00 4.26E+00 4.25E+00 4.26E+00 4.25E+00 4.26E+00 4.26E+00 4.25E+00 4.26E+00 4.26E+00 10 4.26E+00 4.26E+00 4.26E+00 4.25E+00 4.26E+00 4.24E+00 4.25E+00 4.25E+00 4.24E+00 4.25E+00 4.26E+00 20 4.25E+00 4.25E+00 4.26E+00 4.25E+00 4.26E+00 4.24E+00 4.26E+00 4.25E+00 4.25E+00 4.25E+00 4.26E+00 30 4.26E+00 4.26E+00 4.26E+00 4.25E+00 4.26E+00 4.25E+00 4.26E+00 4.25E+00 4.25E+00 4.26E+00 4.26E+00 50 4.27E+00 4.27E+00 4.28E+00 4.26E+00 4.27E+00 4.25E+00 4.27E+00 4.26E+00 4.26E+00 4.27E+00 4.26E+00 60 4.28E+00 4.28E+00 4.29E+00 4.27E+00 4.28E+00 4.26E+00 4.27E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 70 4.30E+00 4.30E+00 4.30E+00 4.29E+00 4.29E+00 4.26E+00 4.27E+00 4.27E+00 4.26E+00 4.27E+00 4.25E+00 4.25E+00 3.27E-03 4.27E+00 4.24E+00 4.26E+00 3.63E-03 4.27E+00 4.24E+00 4.25E+00 3.27E-03 4.27E+00 4.24E+00 4.26E+00 3.63E-03 4.28E+00 4.24E+00 4.27E+00 4.42E-03 4.29E+00 4.25E+00 4.28E+00 5.72E-03 4.31E+00 4.25E+00 4.30E+00 7.16E-03 4.33E+00 4.26E+00 4.25E+00 5.50E-03 4.28E+00 4.23E+00 4.00E+00 PASS 4.25E+00 4.27E-03 4.27E+00 4.23E+00 4.00E+00 PASS 4.25E+00 4.82E-03 4.27E+00 4.23E+00 4.00E+00 PASS 4.25E+00 5.59E-03 4.28E+00 4.23E+00 4.00E+00 PASS 4.26E+00 6.99E-03 4.29E+00 4.23E+00 4.00E+00 PASS 4.27E+00 6.47E-03 4.30E+00 4.24E+00 4.00E+00 PASS 4.27E+00 6.04E-03 4.30E+00 4.24E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 143 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 5 RL=600 @ +5V (V) 3.90E+00 3.70E+00 3.50E+00 3.30E+00 3.10E+00 2.90E+00 2.70E+00 2.50E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.69. Plot of Positive Output Voltage 5 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 144 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.69. Raw data for Positive Output Voltage 5 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 5 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 3.81E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 3.86E+00 3.84E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 10 3.81E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 3.87E+00 3.83E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 20 3.81E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 3.87E+00 3.83E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 30 3.81E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 3.86E+00 3.83E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 50 3.81E+00 3.80E+00 3.82E+00 3.81E+00 3.81E+00 3.86E+00 3.83E+00 3.81E+00 3.81E+00 3.81E+00 3.82E+00 60 3.81E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 3.86E+00 3.83E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 70 3.80E+00 3.80E+00 3.82E+00 3.81E+00 3.81E+00 3.86E+00 3.83E+00 3.81E+00 3.81E+00 3.81E+00 3.82E+00 3.81E+00 6.72E-03 3.85E+00 3.78E+00 3.81E+00 6.50E-03 3.84E+00 3.78E+00 3.81E+00 6.40E-03 3.84E+00 3.78E+00 3.81E+00 6.40E-03 3.84E+00 3.78E+00 3.81E+00 6.54E-03 3.84E+00 3.78E+00 3.81E+00 6.62E-03 3.84E+00 3.78E+00 3.81E+00 6.88E-03 3.84E+00 3.78E+00 3.83E+00 2.11E-02 3.93E+00 3.73E+00 3.40E+00 PASS 3.83E+00 2.13E-02 3.93E+00 3.73E+00 3.40E+00 PASS 3.83E+00 2.17E-02 3.93E+00 3.73E+00 3.20E+00 PASS 3.83E+00 2.19E-02 3.93E+00 3.73E+00 3.20E+00 PASS 3.83E+00 2.23E-02 3.93E+00 3.72E+00 3.00E+00 PASS 3.83E+00 2.21E-02 3.93E+00 3.72E+00 3.00E+00 PASS 3.83E+00 2.17E-02 3.93E+00 3.72E+00 3.00E+00 PASS An ISO 9001:2000 Certified Company 145 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 6 RL=600 @ +5V (V) 4.10E+00 3.90E+00 3.70E+00 3.50E+00 3.30E+00 3.10E+00 2.90E+00 2.70E+00 2.50E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.70. Plot of Positive Output Voltage 6 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 146 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.70. Raw data for Positive Output Voltage 6 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 6 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 3.85E+00 3.83E+00 3.83E+00 3.83E+00 3.84E+00 3.83E+00 3.82E+00 3.81E+00 3.83E+00 3.84E+00 3.84E+00 10 3.85E+00 3.83E+00 3.83E+00 3.83E+00 3.84E+00 3.83E+00 3.82E+00 3.81E+00 3.83E+00 3.84E+00 3.84E+00 20 3.85E+00 3.83E+00 3.83E+00 3.83E+00 3.84E+00 3.83E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.84E+00 30 3.83E+00 3.85E+00 3.83E+00 3.83E+00 3.84E+00 3.83E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.84E+00 50 3.85E+00 3.83E+00 3.83E+00 3.82E+00 3.84E+00 3.83E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.84E+00 60 3.85E+00 3.83E+00 3.83E+00 3.82E+00 3.84E+00 3.83E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.84E+00 70 3.85E+00 3.83E+00 3.83E+00 3.82E+00 3.83E+00 3.83E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.83E+00 3.84E+00 8.35E-03 3.87E+00 3.80E+00 3.84E+00 8.49E-03 3.88E+00 3.80E+00 3.84E+00 8.94E-03 3.88E+00 3.79E+00 3.83E+00 9.26E-03 3.88E+00 3.79E+00 3.83E+00 9.42E-03 3.88E+00 3.79E+00 3.83E+00 9.26E-03 3.88E+00 3.79E+00 3.83E+00 9.20E-03 3.87E+00 3.79E+00 3.82E+00 9.23E-03 3.87E+00 3.78E+00 3.40E+00 PASS 3.82E+00 9.68E-03 3.87E+00 3.78E+00 3.40E+00 PASS 3.82E+00 9.89E-03 3.87E+00 3.78E+00 3.20E+00 PASS 3.82E+00 1.02E-02 3.87E+00 3.77E+00 3.20E+00 PASS 3.82E+00 1.02E-02 3.87E+00 3.77E+00 3.00E+00 PASS 3.82E+00 9.86E-03 3.87E+00 3.77E+00 3.00E+00 PASS 3.82E+00 9.86E-03 3.87E+00 3.77E+00 3.00E+00 PASS An ISO 9001:2000 Certified Company 147 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 7 RL=600 @ +5V (V) 3.90E+00 3.70E+00 3.50E+00 3.30E+00 3.10E+00 2.90E+00 2.70E+00 2.50E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.71. Plot of Positive Output Voltage 7 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 148 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.71. Raw data for Positive Output Voltage 7 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 7 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 3.84E+00 3.83E+00 3.82E+00 3.82E+00 3.83E+00 3.82E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.83E+00 10 3.84E+00 3.83E+00 3.82E+00 3.82E+00 3.83E+00 3.82E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.83E+00 20 3.84E+00 3.82E+00 3.82E+00 3.82E+00 3.83E+00 3.82E+00 3.80E+00 3.81E+00 3.82E+00 3.83E+00 3.83E+00 30 3.82E+00 3.84E+00 3.82E+00 3.82E+00 3.83E+00 3.82E+00 3.80E+00 3.80E+00 3.81E+00 3.83E+00 3.83E+00 50 3.84E+00 3.82E+00 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.80E+00 3.80E+00 3.81E+00 3.82E+00 3.83E+00 60 3.84E+00 3.82E+00 3.82E+00 3.82E+00 3.83E+00 3.82E+00 3.80E+00 3.80E+00 3.81E+00 3.83E+00 3.83E+00 70 3.84E+00 3.82E+00 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.80E+00 3.80E+00 3.81E+00 3.82E+00 3.83E+00 3.83E+00 8.56E-03 3.87E+00 3.79E+00 3.83E+00 8.35E-03 3.87E+00 3.79E+00 3.83E+00 8.87E-03 3.87E+00 3.78E+00 3.83E+00 9.28E-03 3.87E+00 3.78E+00 3.82E+00 9.83E-03 3.87E+00 3.78E+00 3.82E+00 9.28E-03 3.87E+00 3.78E+00 3.82E+00 8.87E-03 3.86E+00 3.78E+00 3.82E+00 8.69E-03 3.86E+00 3.78E+00 3.40E+00 PASS 3.82E+00 9.50E-03 3.86E+00 3.77E+00 3.40E+00 PASS 3.81E+00 9.99E-03 3.86E+00 3.77E+00 3.20E+00 PASS 3.81E+00 9.98E-03 3.86E+00 3.77E+00 3.20E+00 PASS 3.81E+00 9.99E-03 3.86E+00 3.76E+00 3.00E+00 PASS 3.81E+00 9.98E-03 3.86E+00 3.77E+00 3.00E+00 PASS 3.81E+00 9.67E-03 3.86E+00 3.77E+00 3.00E+00 PASS An ISO 9001:2000 Certified Company 149 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Positive Output Voltage 8 RL=600 @ +5V (V) 4.10E+00 3.90E+00 3.70E+00 3.50E+00 3.30E+00 3.10E+00 2.90E+00 2.70E+00 2.50E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.72. Plot of Positive Output Voltage 8 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 150 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.72. Raw data for Positive Output Voltage 8 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Positive Output Voltage 8 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 3.82E+00 3.82E+00 3.83E+00 3.82E+00 3.82E+00 3.87E+00 3.85E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 10 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.87E+00 3.84E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 20 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.87E+00 3.84E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 30 3.81E+00 3.82E+00 3.83E+00 3.82E+00 3.82E+00 3.87E+00 3.84E+00 3.82E+00 3.82E+00 3.82E+00 3.83E+00 50 3.81E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.87E+00 3.84E+00 3.82E+00 3.82E+00 3.82E+00 3.83E+00 60 3.81E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.87E+00 3.84E+00 3.82E+00 3.82E+00 3.82E+00 3.83E+00 70 3.81E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.87E+00 3.84E+00 3.82E+00 3.82E+00 3.82E+00 3.83E+00 3.82E+00 6.57E-03 3.85E+00 3.79E+00 3.82E+00 7.37E-03 3.86E+00 3.79E+00 3.82E+00 6.96E-03 3.85E+00 3.79E+00 3.82E+00 7.57E-03 3.86E+00 3.79E+00 3.82E+00 7.57E-03 3.85E+00 3.78E+00 3.82E+00 7.40E-03 3.85E+00 3.78E+00 3.82E+00 7.62E-03 3.85E+00 3.78E+00 3.84E+00 2.07E-02 3.94E+00 3.74E+00 3.40E+00 PASS 3.84E+00 2.07E-02 3.94E+00 3.74E+00 3.40E+00 PASS 3.84E+00 2.13E-02 3.94E+00 3.74E+00 3.20E+00 PASS 3.84E+00 2.14E-02 3.94E+00 3.74E+00 3.20E+00 PASS 3.83E+00 2.18E-02 3.94E+00 3.73E+00 3.00E+00 PASS 3.84E+00 2.19E-02 3.94E+00 3.73E+00 3.00E+00 PASS 3.83E+00 2.13E-02 3.93E+00 3.73E+00 3.00E+00 PASS An ISO 9001:2000 Certified Company 151 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 1 RL=open @ +5V (V) 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.73. Plot of Negative Output Voltage 1 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 152 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.73. Raw data for Negative Output Voltage 1 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 1 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.37E-02 1.37E-02 1.39E-02 1.36E-02 1.37E-02 1.47E-02 1.39E-02 1.37E-02 1.37E-02 1.38E-02 1.37E-02 10 1.38E-02 1.38E-02 1.38E-02 1.38E-02 1.39E-02 1.47E-02 1.39E-02 1.37E-02 1.37E-02 1.38E-02 1.39E-02 20 1.39E-02 1.39E-02 1.39E-02 1.38E-02 1.39E-02 1.47E-02 1.39E-02 1.38E-02 1.38E-02 1.38E-02 1.38E-02 30 1.39E-02 1.40E-02 1.42E-02 1.39E-02 1.40E-02 1.48E-02 1.41E-02 1.39E-02 1.40E-02 1.40E-02 1.39E-02 50 1.40E-02 1.40E-02 1.42E-02 1.41E-02 1.41E-02 1.49E-02 1.42E-02 1.41E-02 1.41E-02 1.42E-02 1.39E-02 60 1.40E-02 1.40E-02 1.43E-02 1.41E-02 1.39E-02 1.49E-02 1.41E-02 1.41E-02 1.41E-02 1.42E-02 1.39E-02 70 1.38E-02 1.39E-02 1.39E-02 1.38E-02 1.38E-02 1.46E-02 1.40E-02 1.38E-02 1.38E-02 1.40E-02 1.38E-02 1.37E-02 1.10E-04 1.42E-02 1.32E-02 1.38E-02 4.47E-05 1.40E-02 1.36E-02 1.39E-02 4.47E-05 1.41E-02 1.37E-02 1.40E-02 1.22E-04 1.46E-02 1.34E-02 1.41E-02 8.37E-05 1.45E-02 1.37E-02 1.41E-02 1.52E-04 1.48E-02 1.34E-02 1.38E-02 5.48E-05 1.41E-02 1.36E-02 1.40E-02 4.22E-04 1.59E-02 1.20E-02 2.50E-02 PASS 1.40E-02 4.22E-04 1.59E-02 1.20E-02 2.50E-02 PASS 1.40E-02 3.94E-04 1.58E-02 1.22E-02 3.00E-02 PASS 1.42E-02 3.65E-04 1.59E-02 1.25E-02 3.00E-02 PASS 1.43E-02 3.39E-04 1.59E-02 1.27E-02 4.00E-02 PASS 1.43E-02 3.49E-04 1.59E-02 1.27E-02 4.00E-02 PASS 1.40E-02 3.29E-04 1.56E-02 1.25E-02 4.00E-02 PASS An ISO 9001:2000 Certified Company 153 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 2 RL=open @ +5V (V) 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.74. Plot of Negative Output Voltage 2 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 154 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.74. Raw data for Negative Output Voltage 2 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 2 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.39E-02 1.39E-02 1.37E-02 1.36E-02 1.38E-02 1.39E-02 1.37E-02 1.36E-02 1.36E-02 1.37E-02 1.38E-02 10 1.40E-02 1.39E-02 1.40E-02 1.36E-02 1.38E-02 1.39E-02 1.38E-02 1.36E-02 1.37E-02 1.38E-02 1.37E-02 20 1.41E-02 1.39E-02 1.40E-02 1.38E-02 1.39E-02 1.40E-02 1.37E-02 1.37E-02 1.37E-02 1.38E-02 1.38E-02 30 1.39E-02 1.41E-02 1.39E-02 1.38E-02 1.39E-02 1.41E-02 1.38E-02 1.38E-02 1.38E-02 1.41E-02 1.38E-02 50 1.42E-02 1.41E-02 1.42E-02 1.39E-02 1.40E-02 1.41E-02 1.40E-02 1.39E-02 1.40E-02 1.41E-02 1.37E-02 60 1.41E-02 1.40E-02 1.42E-02 1.39E-02 1.39E-02 1.42E-02 1.40E-02 1.39E-02 1.40E-02 1.40E-02 1.38E-02 70 1.40E-02 1.39E-02 1.39E-02 1.38E-02 1.38E-02 1.39E-02 1.37E-02 1.37E-02 1.38E-02 1.39E-02 1.37E-02 1.38E-02 1.30E-04 1.44E-02 1.32E-02 1.39E-02 1.67E-04 1.46E-02 1.31E-02 1.39E-02 1.14E-04 1.45E-02 1.34E-02 1.39E-02 1.10E-04 1.44E-02 1.34E-02 1.41E-02 1.30E-04 1.47E-02 1.35E-02 1.40E-02 1.30E-04 1.46E-02 1.34E-02 1.39E-02 8.37E-05 1.43E-02 1.35E-02 1.37E-02 1.22E-04 1.43E-02 1.31E-02 2.50E-02 PASS 1.38E-02 1.14E-04 1.43E-02 1.32E-02 2.50E-02 PASS 1.38E-02 1.30E-04 1.44E-02 1.32E-02 3.00E-02 PASS 1.39E-02 1.64E-04 1.47E-02 1.32E-02 3.00E-02 PASS 1.40E-02 8.37E-05 1.44E-02 1.36E-02 4.00E-02 PASS 1.40E-02 1.10E-04 1.45E-02 1.35E-02 4.00E-02 PASS 1.38E-02 1.00E-04 1.43E-02 1.33E-02 4.00E-02 PASS An ISO 9001:2000 Certified Company 155 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 3 RL=open @ +5V (V) 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.75. Plot of Negative Output Voltage 3 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 156 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.75. Raw data for Negative Output Voltage 3 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 3 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.42E-02 1.38E-02 1.39E-02 1.38E-02 1.37E-02 1.37E-02 1.37E-02 1.37E-02 1.36E-02 1.38E-02 1.37E-02 10 1.42E-02 1.38E-02 1.42E-02 1.38E-02 1.40E-02 1.40E-02 1.37E-02 1.38E-02 1.38E-02 1.40E-02 1.38E-02 20 1.44E-02 1.40E-02 1.40E-02 1.39E-02 1.39E-02 1.41E-02 1.39E-02 1.39E-02 1.40E-02 1.40E-02 1.38E-02 30 1.40E-02 1.43E-02 1.40E-02 1.39E-02 1.41E-02 1.41E-02 1.39E-02 1.40E-02 1.38E-02 1.40E-02 1.38E-02 50 1.44E-02 1.41E-02 1.43E-02 1.41E-02 1.42E-02 1.43E-02 1.41E-02 1.41E-02 1.40E-02 1.42E-02 1.38E-02 60 1.43E-02 1.41E-02 1.42E-02 1.40E-02 1.41E-02 1.43E-02 1.40E-02 1.41E-02 1.41E-02 1.42E-02 1.38E-02 70 1.43E-02 1.39E-02 1.40E-02 1.39E-02 1.39E-02 1.40E-02 1.38E-02 1.38E-02 1.39E-02 1.39E-02 1.38E-02 1.39E-02 1.92E-04 1.48E-02 1.30E-02 1.40E-02 2.00E-04 1.49E-02 1.31E-02 1.40E-02 2.07E-04 1.50E-02 1.31E-02 1.41E-02 1.52E-04 1.48E-02 1.34E-02 1.42E-02 1.30E-04 1.48E-02 1.36E-02 1.41E-02 1.14E-04 1.47E-02 1.36E-02 1.40E-02 1.73E-04 1.48E-02 1.32E-02 1.37E-02 7.07E-05 1.40E-02 1.34E-02 2.50E-02 PASS 1.39E-02 1.34E-04 1.45E-02 1.32E-02 2.50E-02 PASS 1.40E-02 8.37E-05 1.44E-02 1.36E-02 3.00E-02 PASS 1.40E-02 1.14E-04 1.45E-02 1.34E-02 3.00E-02 PASS 1.41E-02 1.14E-04 1.47E-02 1.36E-02 4.00E-02 PASS 1.41E-02 1.14E-04 1.47E-02 1.36E-02 4.00E-02 PASS 1.39E-02 8.37E-05 1.43E-02 1.35E-02 4.00E-02 PASS An ISO 9001:2000 Certified Company 157 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Negative Output Voltage 4 RL=open @ +5V (V) Specification MAX 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.76. Plot of Negative Output Voltage 4 RL=open @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 158 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.76. Raw data for Negative Output Voltage 4 RL=open @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 4 RL=open @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 1.37E-02 1.38E-02 1.39E-02 1.36E-02 1.36E-02 1.45E-02 1.38E-02 1.36E-02 1.36E-02 1.37E-02 1.37E-02 10 1.38E-02 1.38E-02 1.40E-02 1.37E-02 1.38E-02 1.45E-02 1.39E-02 1.37E-02 1.36E-02 1.38E-02 1.37E-02 20 1.38E-02 1.39E-02 1.41E-02 1.38E-02 1.39E-02 1.46E-02 1.39E-02 1.38E-02 1.37E-02 1.39E-02 1.38E-02 30 1.39E-02 1.37E-02 1.40E-02 1.38E-02 1.38E-02 1.46E-02 1.40E-02 1.39E-02 1.38E-02 1.39E-02 1.37E-02 50 1.39E-02 1.41E-02 1.41E-02 1.38E-02 1.40E-02 1.47E-02 1.42E-02 1.41E-02 1.39E-02 1.41E-02 1.37E-02 60 1.40E-02 1.41E-02 1.42E-02 1.39E-02 1.39E-02 1.47E-02 1.41E-02 1.40E-02 1.39E-02 1.39E-02 1.38E-02 70 1.38E-02 1.38E-02 1.40E-02 1.37E-02 1.39E-02 1.46E-02 1.38E-02 1.38E-02 1.38E-02 1.39E-02 1.38E-02 1.37E-02 1.30E-04 1.43E-02 1.31E-02 1.38E-02 1.10E-04 1.43E-02 1.33E-02 1.39E-02 1.22E-04 1.45E-02 1.33E-02 1.38E-02 1.14E-04 1.44E-02 1.33E-02 1.40E-02 1.30E-04 1.46E-02 1.34E-02 1.40E-02 1.30E-04 1.46E-02 1.34E-02 1.38E-02 1.14E-04 1.44E-02 1.33E-02 1.38E-02 3.78E-04 1.56E-02 1.21E-02 2.50E-02 PASS 1.39E-02 3.54E-04 1.55E-02 1.23E-02 2.50E-02 PASS 1.40E-02 3.56E-04 1.56E-02 1.23E-02 3.00E-02 PASS 1.40E-02 3.21E-04 1.55E-02 1.25E-02 3.00E-02 PASS 1.42E-02 3.00E-04 1.56E-02 1.28E-02 4.00E-02 PASS 1.41E-02 3.35E-04 1.57E-02 1.26E-02 4.00E-02 PASS 1.40E-02 3.49E-04 1.56E-02 1.24E-02 4.00E-02 PASS An ISO 9001:2000 Certified Company 159 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Negative Output Voltage 5 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.77. Plot of Negative Output Voltage 5 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 160 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.77. Raw data for Negative Output Voltage 5 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 5 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 5.60E-03 5.50E-03 5.90E-03 5.80E-03 5.60E-03 6.00E-03 5.90E-03 5.70E-03 5.80E-03 5.70E-03 5.80E-03 10 5.70E-03 5.60E-03 6.00E-03 5.90E-03 5.70E-03 6.30E-03 6.00E-03 5.90E-03 6.00E-03 6.00E-03 5.90E-03 20 5.80E-03 5.70E-03 6.00E-03 5.80E-03 5.80E-03 6.20E-03 6.00E-03 5.90E-03 5.90E-03 5.90E-03 6.00E-03 30 5.60E-03 5.70E-03 5.90E-03 5.80E-03 5.80E-03 6.20E-03 6.00E-03 5.90E-03 5.90E-03 5.90E-03 6.00E-03 50 5.70E-03 5.50E-03 5.70E-03 5.80E-03 5.70E-03 6.10E-03 6.00E-03 5.80E-03 5.80E-03 5.80E-03 5.90E-03 60 5.60E-03 5.50E-03 5.80E-03 5.80E-03 5.80E-03 5.90E-03 5.90E-03 5.80E-03 5.90E-03 5.70E-03 5.90E-03 70 5.20E-03 5.30E-03 5.50E-03 5.40E-03 5.40E-03 5.80E-03 5.80E-03 5.60E-03 5.70E-03 5.50E-03 5.80E-03 5.68E-03 1.64E-04 6.45E-03 4.91E-03 5.78E-03 1.64E-04 6.55E-03 5.01E-03 5.82E-03 1.10E-04 6.33E-03 5.31E-03 5.76E-03 1.14E-04 6.29E-03 5.23E-03 5.68E-03 1.10E-04 6.19E-03 5.17E-03 5.70E-03 1.41E-04 6.36E-03 5.04E-03 5.36E-03 1.14E-04 5.89E-03 4.83E-03 5.82E-03 1.30E-04 6.43E-03 5.21E-03 1.00E-02 PASS 6.04E-03 1.52E-04 6.75E-03 5.33E-03 1.00E-02 PASS 5.98E-03 1.30E-04 6.59E-03 5.37E-03 1.00E-02 PASS 5.98E-03 1.30E-04 6.59E-03 5.37E-03 1.00E-02 PASS 5.90E-03 1.41E-04 6.56E-03 5.24E-03 1.00E-02 PASS 5.84E-03 8.94E-05 6.26E-03 5.42E-03 1.00E-02 PASS 5.68E-03 1.30E-04 6.29E-03 5.07E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 161 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 6 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.78. Plot of Negative Output Voltage 6 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 162 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.78. Raw data for Negative Output Voltage 6 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 6 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 5.90E-03 5.90E-03 6.10E-03 6.00E-03 6.00E-03 5.90E-03 6.00E-03 5.90E-03 6.00E-03 6.10E-03 6.00E-03 10 6.10E-03 6.00E-03 6.10E-03 6.10E-03 6.20E-03 6.10E-03 6.10E-03 6.10E-03 6.20E-03 6.30E-03 6.20E-03 20 6.20E-03 6.00E-03 6.20E-03 6.00E-03 6.20E-03 6.10E-03 6.00E-03 6.20E-03 6.00E-03 6.20E-03 6.20E-03 30 6.00E-03 6.10E-03 6.20E-03 6.00E-03 6.10E-03 6.20E-03 6.00E-03 6.10E-03 6.10E-03 6.30E-03 6.20E-03 50 6.00E-03 5.90E-03 6.00E-03 6.00E-03 6.10E-03 5.90E-03 5.90E-03 6.10E-03 6.00E-03 6.10E-03 6.20E-03 60 5.90E-03 5.90E-03 5.90E-03 5.90E-03 6.00E-03 6.00E-03 5.90E-03 5.90E-03 5.90E-03 6.00E-03 6.30E-03 70 5.70E-03 5.60E-03 5.70E-03 5.60E-03 5.70E-03 5.80E-03 5.80E-03 5.70E-03 5.90E-03 5.90E-03 6.10E-03 5.98E-03 8.37E-05 6.37E-03 5.59E-03 6.10E-03 7.07E-05 6.43E-03 5.77E-03 6.12E-03 1.10E-04 6.63E-03 5.61E-03 6.08E-03 8.37E-05 6.47E-03 5.69E-03 6.00E-03 7.07E-05 6.33E-03 5.67E-03 5.92E-03 4.47E-05 6.13E-03 5.71E-03 5.66E-03 5.48E-05 5.92E-03 5.40E-03 5.98E-03 8.37E-05 6.37E-03 5.59E-03 1.00E-02 PASS 6.16E-03 8.94E-05 6.58E-03 5.74E-03 1.00E-02 PASS 6.10E-03 1.00E-04 6.57E-03 5.63E-03 1.00E-02 PASS 6.14E-03 1.14E-04 6.67E-03 5.61E-03 1.00E-02 PASS 6.00E-03 1.00E-04 6.47E-03 5.53E-03 1.00E-02 PASS 5.94E-03 5.48E-05 6.20E-03 5.68E-03 1.00E-02 PASS 5.82E-03 8.37E-05 6.21E-03 5.43E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 163 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 7 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.79. Plot of Negative Output Voltage 7 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 164 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.79. Raw data for Negative Output Voltage 7 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 7 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 5.70E-03 5.70E-03 5.90E-03 5.80E-03 6.00E-03 5.80E-03 5.70E-03 5.70E-03 5.70E-03 5.80E-03 5.90E-03 10 5.90E-03 5.80E-03 5.90E-03 5.90E-03 6.00E-03 5.90E-03 5.90E-03 5.80E-03 5.90E-03 6.20E-03 6.00E-03 20 5.90E-03 5.80E-03 5.90E-03 6.00E-03 6.10E-03 6.10E-03 5.80E-03 5.90E-03 5.90E-03 6.10E-03 6.00E-03 30 5.70E-03 5.90E-03 5.90E-03 5.90E-03 6.00E-03 5.90E-03 5.80E-03 5.90E-03 6.00E-03 6.10E-03 6.00E-03 50 5.80E-03 5.70E-03 5.70E-03 5.80E-03 6.00E-03 5.90E-03 5.70E-03 5.90E-03 5.90E-03 5.90E-03 6.00E-03 60 5.70E-03 5.70E-03 5.70E-03 5.70E-03 5.80E-03 5.80E-03 5.70E-03 5.70E-03 5.80E-03 5.90E-03 6.10E-03 70 5.40E-03 5.40E-03 5.50E-03 5.50E-03 5.60E-03 5.60E-03 5.60E-03 5.50E-03 5.60E-03 5.80E-03 5.90E-03 5.82E-03 1.30E-04 6.43E-03 5.21E-03 5.90E-03 7.07E-05 6.23E-03 5.57E-03 5.94E-03 1.14E-04 6.47E-03 5.41E-03 5.88E-03 1.10E-04 6.39E-03 5.37E-03 5.80E-03 1.22E-04 6.37E-03 5.23E-03 5.72E-03 4.47E-05 5.93E-03 5.51E-03 5.48E-03 8.37E-05 5.87E-03 5.09E-03 5.74E-03 5.48E-05 6.00E-03 5.48E-03 1.00E-02 PASS 5.94E-03 1.52E-04 6.65E-03 5.23E-03 1.00E-02 PASS 5.96E-03 1.34E-04 6.59E-03 5.33E-03 1.00E-02 PASS 5.94E-03 1.14E-04 6.47E-03 5.41E-03 1.00E-02 PASS 5.86E-03 8.94E-05 6.28E-03 5.44E-03 1.00E-02 PASS 5.78E-03 8.37E-05 6.17E-03 5.39E-03 1.00E-02 PASS 5.62E-03 1.10E-04 6.13E-03 5.11E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 165 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 8 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.80. Plot of Negative Output Voltage 8 RL=600 @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 166 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.80. Raw data for Negative Output Voltage 8 RL=600 @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 8 RL=600 @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 5.80E-03 5.80E-03 6.10E-03 6.00E-03 6.00E-03 6.40E-03 6.30E-03 6.00E-03 6.00E-03 6.00E-03 6.10E-03 10 6.00E-03 5.90E-03 6.10E-03 6.10E-03 6.10E-03 6.50E-03 6.40E-03 6.10E-03 6.20E-03 6.20E-03 6.20E-03 20 5.90E-03 5.90E-03 6.20E-03 6.20E-03 6.00E-03 6.60E-03 6.30E-03 6.20E-03 6.20E-03 6.10E-03 6.20E-03 30 5.90E-03 6.00E-03 6.20E-03 6.20E-03 6.10E-03 6.50E-03 6.30E-03 6.00E-03 6.20E-03 6.10E-03 6.10E-03 50 5.90E-03 5.80E-03 6.10E-03 6.00E-03 5.90E-03 6.30E-03 6.30E-03 6.00E-03 6.10E-03 6.00E-03 6.10E-03 60 5.80E-03 5.80E-03 6.10E-03 6.00E-03 5.90E-03 6.40E-03 6.10E-03 5.90E-03 6.10E-03 6.00E-03 6.20E-03 70 5.60E-03 5.60E-03 5.80E-03 5.60E-03 5.70E-03 6.20E-03 6.00E-03 5.80E-03 6.00E-03 5.90E-03 5.90E-03 5.94E-03 1.34E-04 6.57E-03 5.31E-03 6.04E-03 8.94E-05 6.46E-03 5.62E-03 6.04E-03 1.52E-04 6.75E-03 5.33E-03 6.08E-03 1.30E-04 6.69E-03 5.47E-03 5.94E-03 1.14E-04 6.47E-03 5.41E-03 5.92E-03 1.30E-04 6.53E-03 5.31E-03 5.66E-03 8.94E-05 6.08E-03 5.24E-03 6.14E-03 1.95E-04 7.05E-03 5.23E-03 1.00E-02 PASS 6.28E-03 1.64E-04 7.05E-03 5.51E-03 1.00E-02 PASS 6.28E-03 1.92E-04 7.18E-03 5.38E-03 1.00E-02 PASS 6.22E-03 1.92E-04 7.12E-03 5.32E-03 1.00E-02 PASS 6.14E-03 1.52E-04 6.85E-03 5.43E-03 1.00E-02 PASS 6.10E-03 1.87E-04 6.97E-03 5.23E-03 1.00E-02 PASS 5.98E-03 1.48E-04 6.67E-03 5.29E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 167 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Negative Output Voltage 9 IL=1mA @ +5V (V) 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.81. Plot of Negative Output Voltage 9 IL=1mA @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 168 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.81. Raw data for Negative Output Voltage 9 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 9 IL=1mA @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 2.45E-01 2.47E-01 2.39E-01 2.42E-01 2.48E-01 2.36E-01 2.46E-01 2.46E-01 2.42E-01 2.40E-01 2.42E-01 10 2.46E-01 2.47E-01 2.41E-01 2.43E-01 2.48E-01 2.35E-01 2.44E-01 2.45E-01 2.42E-01 2.39E-01 2.42E-01 20 2.46E-01 2.46E-01 2.41E-01 2.43E-01 2.49E-01 2.36E-01 2.44E-01 2.46E-01 2.43E-01 2.40E-01 2.43E-01 30 2.48E-01 2.48E-01 2.43E-01 2.45E-01 2.51E-01 2.36E-01 2.45E-01 2.47E-01 2.44E-01 2.41E-01 2.43E-01 50 2.51E-01 2.51E-01 2.46E-01 2.48E-01 2.53E-01 2.37E-01 2.48E-01 2.49E-01 2.46E-01 2.44E-01 2.43E-01 60 2.53E-01 2.54E-01 2.49E-01 2.50E-01 2.55E-01 2.40E-01 2.50E-01 2.51E-01 2.49E-01 2.46E-01 2.44E-01 70 2.55E-01 2.55E-01 2.51E-01 2.52E-01 2.56E-01 2.39E-01 2.48E-01 2.50E-01 2.47E-01 2.45E-01 2.42E-01 2.44E-01 3.70E-03 2.61E-01 2.27E-01 2.45E-01 2.92E-03 2.59E-01 2.31E-01 2.45E-01 3.08E-03 2.59E-01 2.31E-01 2.47E-01 3.08E-03 2.61E-01 2.33E-01 2.50E-01 2.77E-03 2.63E-01 2.37E-01 2.52E-01 2.59E-03 2.64E-01 2.40E-01 2.54E-01 2.17E-03 2.64E-01 2.44E-01 2.42E-01 4.24E-03 2.62E-01 2.22E-01 3.50E-01 PASS 2.41E-01 4.06E-03 2.60E-01 2.22E-01 6.00E-01 PASS 2.42E-01 3.90E-03 2.60E-01 2.24E-01 8.00E-01 PASS 2.43E-01 4.28E-03 2.63E-01 2.23E-01 8.00E-01 PASS 2.45E-01 4.76E-03 2.67E-01 2.23E-01 1.00E+00 PASS 2.47E-01 4.44E-03 2.68E-01 2.26E-01 1.00E+00 PASS 2.46E-01 4.21E-03 2.65E-01 2.26E-01 1.00E+00 PASS An ISO 9001:2000 Certified Company 169 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 10 IL=1mA @ +5V (V) 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.82. Plot of Negative Output Voltage 10 IL=1mA @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 170 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.82. Raw data for Negative Output Voltage 10 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 10 IL=1mA @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 2.35E-01 2.37E-01 2.40E-01 2.38E-01 2.39E-01 2.39E-01 2.42E-01 2.41E-01 2.38E-01 2.34E-01 2.35E-01 10 2.35E-01 2.36E-01 2.41E-01 2.40E-01 2.38E-01 2.39E-01 2.40E-01 2.40E-01 2.38E-01 2.34E-01 2.35E-01 20 2.35E-01 2.37E-01 2.42E-01 2.40E-01 2.39E-01 2.40E-01 2.41E-01 2.42E-01 2.39E-01 2.35E-01 2.36E-01 30 2.38E-01 2.37E-01 2.44E-01 2.41E-01 2.42E-01 2.41E-01 2.42E-01 2.42E-01 2.40E-01 2.36E-01 2.36E-01 50 2.39E-01 2.41E-01 2.46E-01 2.44E-01 2.44E-01 2.43E-01 2.44E-01 2.44E-01 2.42E-01 2.37E-01 2.36E-01 60 2.42E-01 2.43E-01 2.48E-01 2.46E-01 2.46E-01 2.46E-01 2.46E-01 2.46E-01 2.44E-01 2.39E-01 2.36E-01 70 2.43E-01 2.43E-01 2.49E-01 2.46E-01 2.46E-01 2.44E-01 2.45E-01 2.45E-01 2.42E-01 2.38E-01 2.35E-01 2.38E-01 1.92E-03 2.47E-01 2.29E-01 2.38E-01 2.55E-03 2.50E-01 2.26E-01 2.39E-01 2.70E-03 2.51E-01 2.26E-01 2.40E-01 2.88E-03 2.54E-01 2.27E-01 2.43E-01 2.77E-03 2.56E-01 2.30E-01 2.45E-01 2.45E-03 2.56E-01 2.34E-01 2.45E-01 2.51E-03 2.57E-01 2.34E-01 2.39E-01 3.11E-03 2.53E-01 2.24E-01 3.50E-01 PASS 2.38E-01 2.49E-03 2.50E-01 2.27E-01 6.00E-01 PASS 2.39E-01 2.70E-03 2.52E-01 2.27E-01 8.00E-01 PASS 2.40E-01 2.49E-03 2.52E-01 2.29E-01 8.00E-01 PASS 2.42E-01 2.92E-03 2.56E-01 2.28E-01 1.00E+00 PASS 2.44E-01 3.03E-03 2.58E-01 2.30E-01 1.00E+00 PASS 2.43E-01 2.95E-03 2.57E-01 2.29E-01 1.00E+00 PASS An ISO 9001:2000 Certified Company 171 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Un-Biased Specification MAX Ps99%/90% (+KTL) Biased Negative Output Voltage 11 IL=1mA @ +5V (V) 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.83. Plot of Negative Output Voltage 11 IL=1mA @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 172 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.83. Raw data for Negative Output Voltage 11 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 11 IL=1mA @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 2.40E-01 2.43E-01 2.44E-01 2.44E-01 2.45E-01 2.44E-01 2.47E-01 2.47E-01 2.44E-01 2.40E-01 2.40E-01 10 2.41E-01 2.42E-01 2.45E-01 2.45E-01 2.44E-01 2.43E-01 2.45E-01 2.45E-01 2.43E-01 2.39E-01 2.39E-01 20 2.41E-01 2.42E-01 2.46E-01 2.45E-01 2.45E-01 2.44E-01 2.46E-01 2.46E-01 2.44E-01 2.39E-01 2.41E-01 30 2.43E-01 2.42E-01 2.48E-01 2.47E-01 2.47E-01 2.45E-01 2.47E-01 2.48E-01 2.45E-01 2.41E-01 2.41E-01 50 2.45E-01 2.46E-01 2.51E-01 2.50E-01 2.50E-01 2.48E-01 2.49E-01 2.49E-01 2.48E-01 2.43E-01 2.40E-01 60 2.48E-01 2.50E-01 2.54E-01 2.52E-01 2.52E-01 2.51E-01 2.51E-01 2.52E-01 2.50E-01 2.45E-01 2.41E-01 70 2.50E-01 2.52E-01 2.55E-01 2.54E-01 2.53E-01 2.49E-01 2.51E-01 2.51E-01 2.49E-01 2.44E-01 2.39E-01 2.43E-01 1.92E-03 2.52E-01 2.34E-01 2.43E-01 1.82E-03 2.52E-01 2.35E-01 2.44E-01 2.17E-03 2.54E-01 2.34E-01 2.45E-01 2.70E-03 2.58E-01 2.33E-01 2.48E-01 2.70E-03 2.61E-01 2.36E-01 2.51E-01 2.28E-03 2.62E-01 2.41E-01 2.53E-01 1.92E-03 2.62E-01 2.44E-01 2.44E-01 2.88E-03 2.58E-01 2.31E-01 3.50E-01 PASS 2.43E-01 2.45E-03 2.54E-01 2.32E-01 6.00E-01 PASS 2.44E-01 2.86E-03 2.57E-01 2.30E-01 8.00E-01 PASS 2.45E-01 2.68E-03 2.58E-01 2.33E-01 8.00E-01 PASS 2.47E-01 2.51E-03 2.59E-01 2.36E-01 1.00E+00 PASS 2.50E-01 2.77E-03 2.63E-01 2.37E-01 1.00E+00 PASS 2.49E-01 2.86E-03 2.62E-01 2.35E-01 1.00E+00 PASS An ISO 9001:2000 Certified Company 173 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Average Biased Average Un-Biased Ps99%/90% (+KTL) Biased Ps99%/90% (+KTL) Un-Biased Negative Output Voltage 12 IL=1mA @ +5V (V) Specification MAX 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.84. Plot of Negative Output Voltage 12 IL=1mA @ +5V (V) versus total dose. The data show no significant degradation with radiation. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 174 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table 5.84. Raw data for Negative Output Voltage 12 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Negative Output Voltage 12 IL=1mA @ +5V (V) Device 1040 1041 1042 1043 1046 1047 1048 1049 1050 1051 1052 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 24-hr Anneal 168-hr Anneal 0 2.39E-01 2.41E-01 2.35E-01 2.37E-01 2.42E-01 2.30E-01 2.40E-01 2.41E-01 2.37E-01 2.35E-01 2.36E-01 10 2.40E-01 2.42E-01 2.36E-01 2.38E-01 2.43E-01 2.30E-01 2.38E-01 2.40E-01 2.37E-01 2.35E-01 2.37E-01 20 2.41E-01 2.42E-01 2.37E-01 2.38E-01 2.43E-01 2.30E-01 2.39E-01 2.41E-01 2.37E-01 2.36E-01 2.38E-01 30 2.43E-01 2.42E-01 2.38E-01 2.40E-01 2.45E-01 2.31E-01 2.40E-01 2.42E-01 2.39E-01 2.37E-01 2.38E-01 50 2.45E-01 2.46E-01 2.42E-01 2.43E-01 2.48E-01 2.32E-01 2.42E-01 2.44E-01 2.41E-01 2.39E-01 2.37E-01 60 2.47E-01 2.48E-01 2.43E-01 2.45E-01 2.49E-01 2.33E-01 2.44E-01 2.46E-01 2.43E-01 2.41E-01 2.38E-01 70 2.47E-01 2.48E-01 2.45E-01 2.45E-01 2.50E-01 2.33E-01 2.42E-01 2.44E-01 2.41E-01 2.40E-01 2.36E-01 2.39E-01 2.86E-03 2.52E-01 2.25E-01 2.40E-01 2.86E-03 2.53E-01 2.26E-01 2.40E-01 2.59E-03 2.52E-01 2.28E-01 2.42E-01 2.70E-03 2.54E-01 2.29E-01 2.45E-01 2.39E-03 2.56E-01 2.34E-01 2.46E-01 2.41E-03 2.58E-01 2.35E-01 2.47E-01 2.12E-03 2.57E-01 2.37E-01 2.37E-01 4.39E-03 2.57E-01 2.16E-01 3.50E-01 PASS 2.36E-01 3.81E-03 2.54E-01 2.18E-01 6.00E-01 PASS 2.37E-01 4.16E-03 2.56E-01 2.17E-01 8.00E-01 PASS 2.38E-01 4.21E-03 2.57E-01 2.18E-01 8.00E-01 PASS 2.40E-01 4.62E-03 2.61E-01 2.18E-01 1.00E+00 PASS 2.41E-01 5.03E-03 2.65E-01 2.18E-01 1.00E+00 PASS 2.40E-01 4.18E-03 2.60E-01 2.20E-01 1.00E+00 PASS An ISO 9001:2000 Certified Company 175 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. In addition, all units-under-test received a 24hr room temperature and168hr 100°C anneal, using the same bias conditions as the radiation exposure. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary were presented in this report. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to determine the outcome of the testing: following the radiation exposure each parameter had to pass the specification value and the average value for the ten-piece sample must pass the specification value when the KTL limits are applied. If these conditions were not both satisfied following the radiation exposure, then the lot would be logged as an RLAT failure. Based on these criteria, the RH1014MW quad operational amplifier discussed in this report passed the RLAT to the highest level tested of 50krad(Si) without any appreciable degradation to most of the measured parameters. Where radiation induced degradation was observed the degradation was not sufficient to cause the parameter to exceed the specification value. An ISO 9001:2000 Certified Company 176 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: TID Bias Connections (Extracted from LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet) Biased Samples: Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Function OUT A -IN A +IN A V+ +IN B -IN B OUT B OUT C -IN C +IN C V+IN D -IN D OUT D Bias To Pin 2 Via 10kΩ Resistor To Pin 1 Via 10kΩ Resistor 8V Via 10kΩ Resistor +15V Decoupled to GND W/ 0.1μF 8V Via 10kΩ Resistor To Pin 7 Via 10kΩ Resistor To Pin 6 Via 10kΩ Resistor To Pin 9 Via 10kΩ Resistor To Pin 8 Via 10kΩ Resistor 8V Via 10kΩ Resistor -15V Decoupled to GND W/ 0.1μF 8V Via 10kΩ Resistor To Pin 14 Via 10kΩ Resistor To Pin 13 Via 10kΩ Resistor An ISO 9001:2000 Certified Company 177 RLAT Report 08-200 090408 R1.2 Unbiased Samples (All Pins Tied to Ground): Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Function OUT A -IN A +IN A V+ +IN B -IN B OUT B OUT C -IN C +IN C V+IN D -IN D OUT D Bias GND GND GND GND GND GND GND GND GND GND GND GND GND GND An ISO 9001:2000 Certified Company 178 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure A.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from the LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet. Figure A.2. Package drawing (for reference only). This figure was extracted from the LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet. An ISO 9001:2000 Certified Company 179 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: Photograph of device-under-test to show part markings An ISO 9001:2000 Certified Company 180 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on Radiation Assured Device’s LTS2020 Test System. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2000 Certified Company 181 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table C.1. Measured parameters and test conditions for the RH1014MW. Unless otherwise noted the conditions were selected to match the post-irradiation specifications. See LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet for the post irradiation test conditions and specifications. TEST NUMBER TEST DESCRIPTION TEST CONDITIONS 1 Positive Supply Current (ICC+) VS=±15V 2 Negative Supply Current (IEE-) VS=±15V 3 Input Offset Voltage (VOS1-VOS4) VS=±15V 4 Input Offset Current (IOS1-IOS4) VS=±15V 5 + Input Bias Current (IB+1-IB+4) VS=±15V 6 - Input Bias Current (IB-1-IB-4) VS=±15V 7 Common Mode Rejection Ratio (CMRR1-CMRR4) VCM = 13.5V, –15V 8 Power Supply Rejection Ratio (PSRR1-PSRR4) VS = ±2V to ±18V 9 Large Signal Voltage Gain (AVOL9-AVOL12) VS=±15V, VO = ±10V, RL = 10kΩ 10 Positive Output Voltage Swing (VOUT+1-VOUT+4) VS=±15V, RL= 2kΩ 11 Negative Output Voltage Swing (VOUT-1-VOUT-4) VS=±15V, RL= 2kΩ 12 Positive Slew Rate (SlewRate+1-SlewRate+4) VS=±15V, RL= 10kΩ 13 Negative Slew Rate (SlewRate-1-SlewRate-4) VS=±15V, RL= 10kΩ An ISO 9001:2000 Certified Company 182 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 14 Positive Supply Current (ICC+2) VS=+5V, VOUT=1.4V Using Servo Loop 15 Negative Supply Current (IEE-2) VS=+5V, VOUT=1.4V Using Servo Loop 16 Input Offset Voltage (VOS5-VOS8) VS=+5V 17 Input Offset Current (IOS5-IOS8) VS=+5V 18 + Input Bias Current (IB+5-IB+8) VS=+5V 19 - Input Bias Current (IB-5-IB-8) VS=+5V 20 Positive Output Voltage Swing (VOUT+5-VOUT+8) VS=+5V, No Load 21 Positive Output Voltage Swing (VOUT+9-VOUT+12) VS=+5V, RL= 600Ω 22 Negative Output Voltage Swing (VOUT-5-VOUT-8) VS=+5V, No Load 23 Negative Output Voltage Swing (VOUT-9-VOUT-12) VS=+5V, RL= 600Ω 24 Negative Output Voltage Swing (VOUT-13-VOUT-16) VS=+5V, ISINK= 1mA An ISO 9001:2000 Certified Company 183 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution for the RH1014MW. Pre-Irradiation Specification Measurement Resolution/Precision Positive Supply Current (ICC+) 2.2mA ±4.8E-06A Negative Supply Current (IEE-) -2.2mA ±3.6E-06A Input Offset Voltage (VOS1-VOS4) ±0.3mV ± 1.27E-06V Input Offset Current (IOS1-IOS4) ±10nA ± 2.64E-11A + Input Bias Current (IB+1-IB+4) ±30nA ±5.02E-11A - Input Bias Current (IB-1-IB-4) ±30nA ± 3.95E-11A Common Mode Rejection Ratio (CMRR1CMRR4) 97dB ±1.89dB Power Supply Rejection Ratio (PSRR1-PSRR4) 100dB ±3.35dB 1200V/mV ±1.70E+04V/mV Positive Output Voltage Swing (VOUT+1-VOUT+4) 12.5V ±1.46E-03V Negative Output Voltage Swing (VOUT-1-VOUT-4) -12.5V ±1.63E-03V Positive Slew Rate (SlewRate+1-SlewRate+4) 0.2V/μs ±1.9E-02V/μs Negative Slew Rate (SlewRate-1-SlewRate-4) -0.2V/μs ±2.49E-02V/μs Measured Parameter Large Signal Voltage Gain (AVOL9-AVOL12) An ISO 9001:2000 Certified Company 184 RLAT Report 08-200 090408 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Supply Current (ICC+2) 2.0mA ±4.8E-06A Negative Supply Current (IEE-2) -2.0mA ±3.6E-06A ±0.45mV ± 1.4E-06V Input Offset Current (IOS5-IOS8) ±10nA ± 3.2E-11A + Input Bias Current (IB+5-IB+8) ±50nA ±9.7E-11A - Input Bias Current (IB-5-IB-8) ±50nA ± 5.6E-11A 4.0V ±1.5E-03V 3.4V ±1.2E-03V 25mV ±1.2E-03V 10mV ±1.6E-03V 350mV ±1.5E-03V Input Offset Voltage (VOS5-VOS8) Positive Output Voltage Swing (VOUT+5VOUT+8) Positive Output Voltage Swing (VOUT+9VOUT+12) Negative Output Voltage Swing (VOUT-5-VOUT8) Negative Output Voltage Swing (VOUT-9-VOUT12) Negative Output Voltage Swing (VOUT-13VOUT-16) An ISO 9001:2000 Certified Company 185 RLAT Report 08-200 090408 R1.2 Appendix D: List of Figures 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current @ +/-15V (A) Negative Supply Current @ +/-15V (A) Offset Voltage 1 @ +/-15V (V) Offset Voltage 2 @ +/-15V (V) Offset Voltage 3 @ +/-15V (V) Offset Voltage 4 @ +/-15V (V) Offset Current 1 @ +/-15V (A) Offset Current 2 @ +/-15V (A) Offset Current 3 @ +/-15V (A) Offset Current 4 @ +/-15V (A) Positive Bias Current 1 @ +/-15V (A) Positive Bias Current 2 @ +/-15V (A) Positive Bias Current 3 @ +/-15V (A) Positive Bias Current 4 @ +/-15V (A) Negative Bias Current 1 @ +/-15V (A) Negative Bias Current 2 @ +/-15V (A) Negative Bias Current 3 @ +/-15V (A) Negative Bias Current 4 @ +/-15V (A) Common Mode Rejection Ratio 1 (dB) Common Mode Rejection Ratio 2 (dB) Common Mode Rejection Ratio 3 (dB) Common Mode Rejection Ratio 4 (dB) Power Supply Rejection Ratio 1 (dB) Power Supply Rejection Ratio 2 (dB) Power Supply Rejection Ratio 3 (dB) Power Supply Rejection Ratio 4 (dB) Open Loop Gain 9 RL=10k VO=+/-10V (V/mV) Open Loop Gain 10 RL=10k VO=+/-10V (V/mV) Open Loop Gain 11 RL=10k VO=+/-10V (V/mV) Open Loop Gain 12 RL=10k VO=+/-10V (V/mV) Positive Output Voltage 1 @ +/-15V (V) Positive Output Voltage 2 @ +/-15V (V) Positive Output Voltage 3 @ +/-15V (V) Positive Output Voltage 4 @ +/-15V (V) Negative Output Voltage 1 @ +/-15V (V) Negative Output Voltage 2 @ +/-15V (V) Negative Output Voltage 3 @ +/-15V (V) Negative Output Voltage 4 @ +/-15V (V) Positive Slew Rate 1 @ +/-15V (V/us) An ISO 9001:2000 Certified Company 186 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 5.63 5.64 5.65 5.66 5.67 5.68 5.69 5.70 5.71 5.72 5.73 5.74 5.75 5.76 5.77 5.78 5.79 5.80 Positive Slew Rate 2 @ +/-15V (V/us) Positive Slew Rate 3 @ +/-15V (V/us) Positive Slew Rate 4 @ +/-15V (V/us) Negative Slew Rate 1 @ +/-15V (V/us) Negative Slew Rate 2 @ +/-15V (V/us) Negative Slew Rate 3 @ +/-15V (V/us) Negative Slew Rate 4 @ +/-15V (V/us) Positive Supply Current @ +5V (A) Negative Supply Current @ +5V (A) Offset Voltage 1 @ +5V (V) Offset Voltage 2 @ +5V (V) Offset Voltage 3 @ +5V (V) Offset Voltage 4 @ +5V (V) Offset Current 1 @ +5V (A) Offset Current 2 @ +5V (A) Offset Current 3 @ +5V (A) Offset Current 4 @ +5V (A) Positive Bias Current 1 @ +/-5V (A) Positive Bias Current 2 @ +/-5V (A) Positive Bias Current 3 @ +/-5V (A) Positive Bias Current 4 @ +/-5V (A) Negative Bias Current 1 @ +/-5V (A) Negative Bias Current 2 @ +/-5V (A) Negative Bias Current 3 @ +/-5V (A) Negative Bias Current 4 @ +/-5V (A) Positive Output Voltage 1 RL=open @ +5V (V) Positive Output Voltage 2 RL=open @ +5V (V) Positive Output Voltage 3 RL=open @ +5V (V) Positive Output Voltage 4 RL=open @ +5V (V) Positive Output Voltage 5 RL=600 @ +5V (V) Positive Output Voltage 6 RL=600 @ +5V (V) Positive Output Voltage 7 RL=600 @ +5V (V) Positive Output Voltage 8 RL=600 @ +5V (V) Negative Output Voltage 1 RL=open @ +5V (V) Negative Output Voltage 2 RL=open @ +5V (V) Negative Output Voltage 3 RL=open @ +5V (V) Negative Output Voltage 4 RL=open @ +5V (V) Negative Output Voltage 5 RL=600 @ +5V (V) Negative Output Voltage 6 RL=600 @ +5V (V) Negative Output Voltage 7 RL=600 @ +5V (V) Negative Output Voltage 8 RL=600 @ +5V (V) An ISO 9001:2000 Certified Company 187 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-200 090408 R1.2 5.81 5.82 5.83 5.84 Negative Output Voltage 9 IL=1mA @ +5V (V) Negative Output Voltage 10 IL=1mA @ +5V (V) Negative Output Voltage 11 IL=1mA @ +5V (V) Negative Output Voltage 12 IL=1mA @ +5V (V) An ISO 9001:2000 Certified Company 188 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800