REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED 92-08-11 M. A. FRYE Add case outline 2. Make changes to 1.3 and Figure 1. A Make changes to END and VOUT tests as specified under Table I. Changes in accordance with N.O.R. 5962-R228-92. B Add case outline D. Make changes to 1.2.2 and Figure 1. Changes in accordance with N.O.R. 5962-R047-95. 94-12-14 M. A. FRYE C Make changes to EN, END, and AVO tests as specified under Table I. Changes in accordance with N.O.R. 5962-R190-95. 95-08-16 M. A. FRYE D Add case outline X. Make changes to 1.2.2 and Figure 1. Changes in accordance with N.O.R. 5962-R146-97. 96-12-03 R. MONNIN E Make changes to slew rate test as specified under TABLE I herein. Redrawn. – ro 98-12-11 R. MONNIN 03-07-01 R. MONNIN 04-02-06 R. MONNIN 09-08-24 C. SAFFLE F Drawing updated to reflect current requirements. -rrp G Corrected typo by renumbering the pages. - gt H Update boilerplate paragraphs. - ro J Update drawing to current MIL-PRF-38535 requirements. -rrp 15-07-24 C. SAFFLE K Add device type 03 along with device class V and RHA requirements. Add table IIB. - ro 16-01-07 C. SAFFLE REV SHEET REV K K K SHEET 15 16 17 REV STATUS REV K K K K K K K K K K K K K K OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http://www.landandmaritime.dla.mil CHECKED BY CHARLES REUSING APPROVED BY THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A MICHAEL A. FRYE DRAWING APPROVAL DATE 89-10-19 REVISION LEVEL K MICROCIRCUIT, LINEAR, QUAD PRECISION OPERATIONAL AMPLIFIER, MONOLITHIC SILICON SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 5962-89677 1 OF 17 5962-E145-16 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device class M and Q: 5962 - Federal stock class designator \ RHA designator (see 1.2.1) 89677 01 C A Device type (see 1.2.2) Case outline (see 1.2.4) Lead finish (see 1.2.5) / \/ Drawing number For device class V: 5962 R Federal stock class designator \ RHA designator (see 1.2.1) 03 V C A Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) 89677 / \/ Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 02 03 Circuit function LT1014A LT1014 RH1014 Quad precision operational amplifier Quad precision operational amplifier RHA, Quad precision operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device. Device class M Q or V Device requirements documentation Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Certification and qualification to MIL-PRF-38535 STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 2 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter C D X 2 Descriptive designator GDIP1-T14 or CDIP2-T14 GDFP1-F14 or CDFP2-F14 CDFP3-F14 CQCC1-N20 Terminals 14 14 14 20 Package style Dual-in-line Flat pack Flat pack Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (V+) ........................................................................ Negative supply voltage (V-) ....................................................................... Power dissipation (PD) ................................................................................ Differential input voltage .............................................................................. Input voltage ............................................................................................... +22 V -22 V 500 mW 2/ 3/ 30 V Equal to positive supply voltage 5 V below negative supply voltage Output short-circuit duration ........................................................................ Indefinite Storage temperature range ......................................................................... -65C to +150C Lead temperature: Device types 01 and 02 (soldering, 60 seconds) Cases C, D, and X ...................................................................................... +300C Case 2 ......................................................................................................... +260C Device type 03 (soldering, 10 seconds) ...................................................... +300C Junction temperature (TJ) ........................................................................... -65C to +150C Thermal resistance, junction-to-case (JC) ................................................. See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Device types 01 and 02: Cases C and X ........................................................................................ Case D .................................................................................................... Case 2 ..................................................................................................... Device type 03: Case C .................................................................................................... Case D .................................................................................................... 100C/W 180C/W 65C/W 95C/W 160C/W 1.4 Recommended operating conditions. Positive supply voltage (V+) ........................................................................ +15 V Negative supply voltage (V-) ....................................................................... -15 V Ambient operating temperature range (TA) ................................................. -55C to +125C ____ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Must withstand the added PD due to short circuit test; e.g., IOS. 3/ For device type 03, parameter is guaranteed by design, characterization, or correlation to the other tested parameters. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 3 1.5 Radiation features. For device type 03: Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) .................................. = 100 krads(Si) 4/ Maximum total dose available (dose rate = 10 mrads(Si)/s) ......................................... = 50 krads(Si) 4/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. ______ 4/ Device type 03 has been irradiation tested at high dose rate and low dose rate. The end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A to a maximum total dose of 100 krads(Si), and condition D to a maximum total dose of 50 krads (Si). However, device type 03 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects to 100 krads (Si). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 4 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified in figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MILPRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 049 (see MIL-PRF-38535, appendix A). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 5 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type 1 01 Limits Min Input offset voltage 3/ VOS Input offset current 3/ 300 02 550 03 300 2,3 550 D 1 450 L 1 600 R 1 750 1 IOS 0.8 01 1.5 02 5 2,3 1 D Input bias current 3/ 03 10 2,3 20 1 10 L 1 15 R 1 20 1 IB 20 01 30 02 45 2,3 1 nA 30 2,3 1 nA 2.8 2,3 1 V 350 2,3 1 Max 180 2,3 1 Unit 03 30 2,3 45 D 1 60 L 1 100 R 1 175 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Input voltage range 3/ 4/ Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified IVR Group A Device subgroups type Max +13.5 -14.9 +13.0 -15.0 +13.5 -14.9 +13.0 -15.0 13.5 2 0 3.5 1 -15.0 13.5 01 2,3 1 02 2,3 1 Common mode 3/ rejection ratio CMRR VCM = +13.5 V, -15.0 V 1 VCM = +13.0 V, -14.9 V 2,3 VCM = +13.5 V, -15.0 V 1 VCM = +13.0 V, -14.9 V 2,3 VCM = +13.0 V, -15.0 V Power supply rejection 3/ ratio PSRR D 01 02, 03 97 94 03 97 90 01 2,3 V+ = +2 V to +18 V, 1 V- = -2 V to –18 V 1 103 dB 100 02, 03 2,3 D dB 96 R 1 V 100 94 V- = -2 V to –18 V V = 10 V to 18 V 1 03 L V+ = +2 V to +18 V, Unit Min -15.0 1 D, L, R Limits 100 97 03 100 L 94 R 86 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 7 TABLE I. Electrical performance characteristics - Continued. Test Output voltage swing 3/ Symbol VOUT Conditions 1/ 2/ -55C TA +125C unless otherwise specified RL 2 k Group A Device subgroups type Min 4 01 4 02, 03 Large signal voltage 3/ gain AVO RL 2 k, VO = 10 V 12.5 4 01 1.5 02, 03 1.2 0.25 RL 600 , VO = 10 V 4 03 0.5 RL 2 k, D 4 03 500 VO = 10 V L 100 R 50 No load each amplifier 1 01 Power dissipation 3/ PD 02, 03 0.55 0.70 1 03 0.55 No load each amplifier, 1 01 15 guaranteed by ISY limits 2,3 1 Input noise voltage 3/ 5/ CS 02 16.5 EN 21 7 01 123 7 02 120 VO = 10 V, RL = 2 k 7 03 120 f = 0.1 Hz to 10 Hz 4 01, 02 TA = +25C 5/ mW 18 2,3 Channel separation 3/ mA 0.6 2,3 D, L, R V/mV 0.5 2,3 1 V/V 0.4 5,6 ISY V 12.5 03 5,6 Power supply current 3/ 13 4 4 Max 11.5 5,6 D, L, R Unit 12 5,6 RL = 10 k Limits dB VP-P 1.1 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 8 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type fO = 10 Hz 4 01, 02 40 nV / fO = 1 kHz 4 01, 02 30 Hz TA = +25C 1 01, 02 -60 Limits Min Input noise voltage 3/ 5/ density Output short circuit 3/ 5/ current Input resistance 3/ 5/ END ISCISC+ 1 RIN 1 01 100 1 02, 03 70 4 01, 02 0.2 4 03 0.2 4 03 0.13 differential mode SR Slew rate 3/ 5/ RL = 10 k Input offset voltage 3/ match VOS D 0.11 R 0.07 1 mA M V/s 360 01 V 700 2,3 1 Max 60 L Guaranteed by VOS limits Unit 600 02 1100 2,3 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 9 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Min Input offset voltage 6/ 01 280 2,3 01 480 2 01 960 3 01 480 1 02 450 2,3 02 750 2 02 1500 3 02 750 1 03 450 3 03 750 2 03 750 1 03 600 L 750 R 01 900 1.3 VCM = 0.1 V VCM = 0.1 V D 1 IOS 2,3 1 1 D 10.0 03 10 20 03 10 L 15 R 20 1 IB 01 35 2,3 1 1 Input voltage range 6/ 50 120 03 80 L 125 R 200 IVR D, L, R nA 90 02, 03 2,3 D nA 2.0 2,3 1 V 7.0 02 2,3 Input bias current 6/ Max 1 VOS VCM = 0.1 V Input offset current 6/ Unit 1 01 0 3.5 1 02, 03 0 3.5 1 03 0 3.5 V See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 10 TABLE I. Electrical performance characteristics – Continued. Test Output voltage swing 6/ Symbol VOUT Conditions 1/ 2/ -55C TA +125C unless otherwise specified No load, output low L Limits Min Unit Max 4 All 25 4 03 25 40 R 50 L, D, R Output low, sink = 1 mA L All 4 V 4 03 4 4 All 350 mV 4 03 0.6 V 1.0 R 1.6 L, D, R 600 load, output low 4 All 10 4 03 10 5,6 01 15 02, 03 18 600 load, output high 4 All 3.4 600 load, output high 5,6 01 3.2 02, 03 3.1 03 3.4 L 4 D 3.0 R 2.8 Per amplifier 1 01 2,3 1 1 mV V 0.45 mA 0.55 02, 03 2,3 L, D, R mV 4 D 600 load, output low ISY Device type D No load, output high Supply current 6/ Group A subgroups 0.50 0.65 03 0.50 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 11 TABLE I. Electrical performance characteristics – Continued. Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Large signal voltage 5/ 6/ gain AVO RL = 2 k to GND, Power dissipation 6/ PD Test Group A subgroups Device type 4 01, 02 No load each amplifier, 1 01 guaranteed by ISY limits 2,3 Limits Min V/V 2.25 PSRR V+ = +2 V to +18 V 1 V- = -2 V to –18 V 2,3 V+ = +2 V to +18 V 1 V- = -2 V to –18 V 2,3 mW 2.75 02 2.5 2,3 1/ Max 0.5 VO = 0.1 V to 3.4 V 1 Power supply 6/ rejection ratio Unit 3.25 01 103 dB 100 02 100 97 Device type 03 supplied to this drawing has been characterized through all levels D, L, and R of irradiation. However, this device is tested at RHA level L and R level. Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C. 2/ Device type 03 has been irradiation tested at high dose rate and low dose rate. The end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A to a maximum total dose of 100 krads(Si), and condition D to a maximum total dose of 50 krads (Si). However, device type 03 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects to 100 krads (Si). 3/ Unless otherwise specified, V = 15 V and VCM = 0 V. 4/ IVR is guaranteed by CMRR test. 5/ If not tested, shall be guaranteed to the limits specified in table I herein. 6/ Unless otherwise specified, V+ = +5 V, V- = 0 V, VCM = 0 V, and VOUT = 1.4 V. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 12 Device types 01, 02 and 03 02 and 03 02 01 and 02 Case outlines C D X 2 Terminal number Terminal symbol 1 OUT A OUT A OUT A NC 2 -IN A -IN A -IN A OUT A 3 +IN A +IN A +IN A -IN A 4 V+ V+ V+ +IN A 5 +IN B +IN B +IN B NC 6 -IN B -IN B -IN B V+ 7 OUT B OUT B OUT B NC 8 OUT C OUT C OUT C +IN B 9 -IN C -IN C -IN C -IN B 10 +IN C +IN C +IN C OUT B 11 V- V- V- NC 12 +IN D +IN D +IN D OUT C 13 -IN D -IN D -IN D -IN C 14 OUT D OUT D OUT D +IN C 15 --- --- --- NC 16 --- --- --- V- 17 --- --- --- NC 18 --- --- --- +IN D 19 --- --- --- -IN D 20 --- --- --- OUT D FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 13 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. . The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table IIA herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table IIA herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 14 TABLE IIA. Electrical test requirements. Test requirements Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group A test requirements (see 4.4) Group C end-point electrical parameters (see 4.4) Group D end-point electrical parameters (see 4.4) Group E end-point electrical parameters (see 4.4) Subgroups (in accordance with MIL-PRF-38535, table III) Subgroups (in accordance with MIL-STD-883, method 5005, table I) Device class M 1 1 1 1,2,3,4,5,6 1,2,3,4,5,6 1/ 1 1,2,3,4, 2/ 5,6,7 1 1,2,3, 1/ 3/ 4,5,6 1,2,3,4, 2/ 5,6,7 1,2,3 3/ 1 1 1,2,3 1/ 1,2,3,4,5,6,7 2/ --- Device class Q Device class V --- 1,7 2/ 1/ PDA applies to subgroup 1. 2/ Subgroup 7, if not tested, shall be guaranteed to the limits specified in table I. 3/ Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be completed with reference to the zero hour electrical parameters (see table I). TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. 1/ Parameters Symbol Endpoint limit Delta limits Min Max Min Max Units Input offset voltage VOS -300 300 -200 200 V Input bias current +IB -30 30 -4 4 nA -IB -30 30 -4 4 nA 1/ VS = 15 V and VCM = 0 V. Deltas are performed at room temperature. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 15 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table IIA herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25C 5C, after exposure, to the subgroups specified in table IIA herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019 condition A and condition D as specified herein. 4.4.4.1.1 Accelerated annealing test. Accelerated annealing tests shall be performed on all devices requiring a RHA level greater than 5 krads(Si). The post-anneal end-point electrical parameter limits shall be as specified in table I herein and shall be the pre-irradiation end-point electrical parameter limit at +25C 5C. Testing shall be performed at initial qualification and after any process or design changes which may affect the RHA response of the device. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 16 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108. 6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0540. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in MIL-HDBK-103 and QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and have agreed to this drawing. 6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DLA Land and Maritime-VA. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89677 A REVISION LEVEL K SHEET 17 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 16-01-07 Approved sources of supply for SMD 5962-89677 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-8967701CA 01295 LT1014AMJB 60264 MTLT1014AQD 3/ LT1014AMJ/883 5962-8967701XA 60264 MTLT1014AQWB 5962-89677012A 01295 LT1014AMFKB 60264 MTLT1014AQLS 01295 LT1014MJB 60264 MTLT1014QD 3/ LT1014MJ/883 5962-8967702DA 3/ LT1014MW/883 5962-8967702XA 60264 MTLT1014QWB 3/ LT1014MW/883 01295 LT1014MFKB 60264 MTLT1014QLS 5962R8967703VCA 64155 RH1014MJ 5962R8967703VDA 64155 RH1014MW 5962-8967702CA 5962-89677022A 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source of supply. 1 of 2 STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued DATE: 16-01-07 Vendor CAGE number Vendor name and address 01295 Texas Instruments, Inc. Semiconductor Group 8505 Forest Lane P.O. Box 660199 Dallas, TX 75243 60264 Minco Technology Labs, Inc. 1805 Rutherford Lane Austin, TX 78754-5101 64155 Linear Technology Corporation 1630 McCarthy Boulevard Milpitas, CA 95035-7417 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin. 2 of 2