5962R89677

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
92-08-11
M. A. FRYE
Add case outline 2. Make changes to 1.3 and Figure 1.
A
Make changes to END and VOUT tests as specified under Table I.
Changes in accordance with N.O.R. 5962-R228-92.
B
Add case outline D. Make changes to 1.2.2 and Figure 1.
Changes in accordance with N.O.R. 5962-R047-95.
94-12-14
M. A. FRYE
C
Make changes to EN, END, and AVO tests as specified under Table I.
Changes in accordance with N.O.R. 5962-R190-95.
95-08-16
M. A. FRYE
D
Add case outline X. Make changes to 1.2.2 and Figure 1.
Changes in accordance with N.O.R. 5962-R146-97.
96-12-03
R. MONNIN
E
Make changes to slew rate test as specified under TABLE I herein.
Redrawn. – ro
98-12-11
R. MONNIN
03-07-01
R. MONNIN
04-02-06
R. MONNIN
09-08-24
C. SAFFLE
F
Drawing updated to reflect current requirements. -rrp
G
Corrected typo by renumbering the pages. - gt
H
Update boilerplate paragraphs. - ro
J
Update drawing to current MIL-PRF-38535 requirements. -rrp
15-07-24
C. SAFFLE
K
Add device type 03 along with device class V and RHA requirements.
Add table IIB. - ro
16-01-07
C. SAFFLE
REV
SHEET
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SHEET
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REV STATUS
REV
K
K
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OF SHEETS
SHEET
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PMIC N/A
PREPARED BY
RICK OFFICER
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
CHECKED BY
CHARLES REUSING
APPROVED BY
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
MICHAEL A. FRYE
DRAWING APPROVAL DATE
89-10-19
REVISION LEVEL
K
MICROCIRCUIT, LINEAR, QUAD PRECISION
OPERATIONAL AMPLIFIER, MONOLITHIC
SILICON
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
5962-89677
1 OF 17
5962-E145-16
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M)
and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device class M and Q:
5962
-
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
89677
01
C
A
Device
type
(see 1.2.2)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
For device class V:
5962
R
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
03
V
C
A
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
89677
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
01
02
03
Circuit function
LT1014A
LT1014
RH1014
Quad precision operational amplifier
Quad precision operational amplifier
RHA, Quad precision operational amplifier
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designators will not be included in the PIN and will not be marked on the device.
Device class
M
Q or V
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Certification and qualification to MIL-PRF-38535
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
2
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
C
D
X
2
Descriptive designator
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
CDFP3-F14
CQCC1-N20
Terminals
14
14
14
20
Package style
Dual-in-line
Flat pack
Flat pack
Square leadless chip carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absolute maximum ratings. 1/
Positive supply voltage (V+) ........................................................................
Negative supply voltage (V-) .......................................................................
Power dissipation (PD) ................................................................................
Differential input voltage ..............................................................................
Input voltage ...............................................................................................
+22 V
-22 V
500 mW 2/ 3/
30 V
Equal to positive supply voltage
5 V below negative supply voltage
Output short-circuit duration ........................................................................ Indefinite
Storage temperature range ......................................................................... -65C to +150C
Lead temperature:
Device types 01 and 02 (soldering, 60 seconds)
Cases C, D, and X ...................................................................................... +300C
Case 2 ......................................................................................................... +260C
Device type 03 (soldering, 10 seconds) ...................................................... +300C
Junction temperature (TJ) ........................................................................... -65C to +150C
Thermal resistance, junction-to-case (JC) ................................................. See MIL-STD-1835
Thermal resistance, junction-to-ambient (JA):
Device types 01 and 02:
Cases C and X ........................................................................................
Case D ....................................................................................................
Case 2 .....................................................................................................
Device type 03:
Case C ....................................................................................................
Case D ....................................................................................................
100C/W
180C/W
65C/W
95C/W
160C/W
1.4 Recommended operating conditions.
Positive supply voltage (V+) ........................................................................ +15 V
Negative supply voltage (V-) ....................................................................... -15 V
Ambient operating temperature range (TA) ................................................. -55C to +125C
____
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Must withstand the added PD due to short circuit test; e.g., IOS.
3/ For device type 03, parameter is guaranteed by design, characterization, or correlation to the other tested parameters.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
3
1.5 Radiation features.
For device type 03:
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) .................................. = 100 krads(Si) 4/
Maximum total dose available (dose rate = 10 mrads(Si)/s) ......................................... = 50 krads(Si) 4/
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
______
4/
Device type 03 has been irradiation tested at high dose rate and low dose rate. The end point limits for the noted
parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A to a maximum
total dose of 100 krads(Si), and condition D to a maximum total dose of 50 krads (Si). However, device type 03 may be
dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects to 100 krads (Si).
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
4
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified in figure 1.
3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MILPRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 049 (see MIL-PRF-38535, appendix A).
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
5
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/ 2/
-55C  TA  +125C
unless otherwise specified
Group A
subgroups
Device
type
1
01
Limits
Min
Input offset voltage 3/
VOS
Input offset current 3/
300
02
550
03
300
2,3
550
D
1
450
L
1
600
R
1
750
1
IOS
0.8
01
1.5
02
5
2,3
1
D
Input bias current 3/
03
10
2,3
20
1
10
L
1
15
R
1
20
1
IB
20
01
30
02
45
2,3
1
nA
30
2,3
1
nA
2.8
2,3
1
V
350
2,3
1
Max
180
2,3
1
Unit
03
30
2,3
45
D
1
60
L
1
100
R
1
175
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
6
TABLE I. Electrical performance characteristics - Continued.
Test
Input voltage range 3/ 4/
Symbol
Conditions 1/ 2/
-55C  TA +125C
unless otherwise specified
IVR
Group A Device
subgroups type
Max
+13.5
-14.9
+13.0
-15.0
+13.5
-14.9
+13.0
-15.0
13.5
2
0
3.5
1
-15.0
13.5
01
2,3
1
02
2,3
1
Common mode 3/
rejection ratio
CMRR
VCM = +13.5 V, -15.0 V
1
VCM = +13.0 V, -14.9 V
2,3
VCM = +13.5 V, -15.0 V
1
VCM = +13.0 V, -14.9 V
2,3
VCM = +13.0 V, -15.0 V
Power supply rejection 3/
ratio
PSRR
D
01
02, 03
97
94
03
97
90
01
2,3
V+ = +2 V to +18 V,
1
V- = -2 V to –18 V
1
103
dB
100
02, 03
2,3
D
dB
96
R
1
V
100
94
V- = -2 V to –18 V
V = 10 V to 18 V
1
03
L
V+ = +2 V to +18 V,
Unit
Min
-15.0
1
D, L, R
Limits
100
97
03
100
L
94
R
86
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
7
TABLE I. Electrical performance characteristics - Continued.
Test
Output voltage swing 3/
Symbol
VOUT
Conditions 1/ 2/
-55C  TA +125C
unless otherwise specified
RL  2 k
Group A Device
subgroups type
Min
4
01
4
02, 03
Large signal voltage 3/
gain
AVO
RL  2 k, VO = 10 V
12.5
4
01
1.5
02, 03
1.2
0.25
RL  600 , VO = 10 V
4
03
0.5
RL  2 k,
D
4
03
500
VO = 10 V
L
100
R
50
No load each amplifier
1
01
Power dissipation 3/
PD
02, 03
0.55
0.70
1
03
0.55
No load each amplifier,
1
01
15
guaranteed by ISY limits
2,3
1
Input noise voltage 3/ 5/
CS
02
16.5
EN
21
7
01
123
7
02
120
VO = 10 V, RL = 2 k
7
03
120
f = 0.1 Hz to 10 Hz
4
01, 02
TA = +25C 5/
mW
18
2,3
Channel separation 3/
mA
0.6
2,3
D, L, R
V/mV
0.5
2,3
1
V/V
0.4
5,6
ISY
V
12.5
03
5,6
Power supply current 3/
13
4
4
Max
11.5
5,6
D, L, R
Unit
12
5,6
RL = 10 k
Limits
dB
VP-P
1.1
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
8
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/ 2/
-55C  TA  +125C
unless otherwise specified
Group A
subgroups
Device
type
fO = 10 Hz
4
01, 02
40
nV /
fO = 1 kHz
4
01, 02
30
Hz
TA = +25C
1
01, 02
-60
Limits
Min
Input noise voltage 3/ 5/
density
Output short circuit 3/ 5/
current
Input resistance 3/ 5/
END
ISCISC+
1
RIN
1
01
100
1
02, 03
70
4
01, 02
0.2
4
03
0.2
4
03
0.13
differential mode
SR
Slew rate 3/
5/
RL = 10 k
Input offset voltage 3/
match
VOS
D
0.11
R
0.07
1
mA
M
V/s
360
01
V
700
2,3
1
Max
60
L
Guaranteed by VOS limits
Unit
600
02
1100
2,3
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
9
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/ 2/
-55C  TA  +125C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Input offset voltage 6/
01
280
2,3
01
480
2
01
960
3
01
480
1
02
450
2,3
02
750
2
02
1500
3
02
750
1
03
450
3
03
750
2
03
750
1
03
600
L
750
R
01
900
1.3
VCM = 0.1 V
VCM = 0.1 V
D
1
IOS
2,3
1
1
D
10.0
03
10
20
03
10
L
15
R
20
1
IB
01
35
2,3
1
1
Input voltage range 6/
50
120
03
80
L
125
R
200
IVR
D, L, R
nA
90
02, 03
2,3
D
nA
2.0
2,3
1
V
7.0
02
2,3
Input bias current 6/
Max
1
VOS
VCM = 0.1 V
Input offset current 6/
Unit
1
01
0
3.5
1
02, 03
0
3.5
1
03
0
3.5
V
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
10
TABLE I. Electrical performance characteristics – Continued.
Test
Output voltage swing 6/
Symbol
VOUT
Conditions 1/ 2/
-55C  TA +125C
unless otherwise specified
No load, output low
L
Limits
Min
Unit
Max
4
All
25
4
03
25
40
R
50
L, D, R
Output low, sink = 1 mA
L
All
4
V
4
03
4
4
All
350
mV
4
03
0.6
V
1.0
R
1.6
L, D, R
600  load, output low
4
All
10
4
03
10
5,6
01
15
02, 03
18
600  load, output high
4
All
3.4
600  load, output high
5,6
01
3.2
02, 03
3.1
03
3.4
L
4
D
3.0
R
2.8
Per amplifier
1
01
2,3
1
1
mV
V
0.45
mA
0.55
02, 03
2,3
L, D, R
mV
4
D
600  load, output low
ISY
Device
type
D
No load, output high
Supply current 6/
Group A
subgroups
0.50
0.65
03
0.50
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
11
TABLE I. Electrical performance characteristics – Continued.
Symbol
Conditions 1/ 2/
-55C  TA  +125C
unless otherwise specified
Large signal voltage 5/ 6/
gain
AVO
RL = 2 k to GND,
Power dissipation 6/
PD
Test
Group A
subgroups
Device
type
4
01, 02
No load each amplifier,
1
01
guaranteed by ISY limits
2,3
Limits
Min
V/V
2.25
PSRR
V+ = +2 V to +18 V
1
V- = -2 V to –18 V
2,3
V+ = +2 V to +18 V
1
V- = -2 V to –18 V
2,3
mW
2.75
02
2.5
2,3
1/
Max
0.5
VO = 0.1 V to 3.4 V
1
Power supply 6/
rejection ratio
Unit
3.25
01
103
dB
100
02
100
97
Device type 03 supplied to this drawing has been characterized through all levels D, L, and R of irradiation.
However, this device is tested at RHA level L and R level. Pre and Post irradiation values are identical unless otherwise
specified in Table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C.
2/
Device type 03 has been irradiation tested at high dose rate and low dose rate. The end point limits for the noted
parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A to a maximum
total dose of 100 krads(Si), and condition D to a maximum total dose of 50 krads (Si). However, device type 03 may be
dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects to 100 krads (Si).
3/
Unless otherwise specified, V = 15 V and VCM = 0 V.
4/
IVR is guaranteed by CMRR test.
5/
If not tested, shall be guaranteed to the limits specified in table I herein.
6/
Unless otherwise specified, V+ = +5 V, V- = 0 V, VCM = 0 V, and VOUT = 1.4 V.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
12
Device types
01, 02 and 03
02 and 03
02
01 and 02
Case outlines
C
D
X
2
Terminal number
Terminal symbol
1
OUT A
OUT A
OUT A
NC
2
-IN A
-IN A
-IN A
OUT A
3
+IN A
+IN A
+IN A
-IN A
4
V+
V+
V+
+IN A
5
+IN B
+IN B
+IN B
NC
6
-IN B
-IN B
-IN B
V+
7
OUT B
OUT B
OUT B
NC
8
OUT C
OUT C
OUT C
+IN B
9
-IN C
-IN C
-IN C
-IN B
10
+IN C
+IN C
+IN C
OUT B
11
V-
V-
V-
NC
12
+IN D
+IN D
+IN D
OUT C
13
-IN D
-IN D
-IN D
-IN C
14
OUT D
OUT D
OUT D
+IN C
15
---
---
---
NC
16
---
---
---
V-
17
---
---
---
NC
18
---
---
---
+IN D
19
---
---
---
-IN D
20
---
---
---
OUT D
FIGURE 1. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
13
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. . The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) TA = +125C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
14
TABLE IIA. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
1
1
1
1,2,3,4,5,6
1,2,3,4,5,6 1/
1
1,2,3,4, 2/
5,6,7
1
1,2,3, 1/ 3/
4,5,6
1,2,3,4, 2/
5,6,7
1,2,3 3/
1
1
1,2,3
1/
1,2,3,4,5,6,7 2/
---
Device
class Q
Device
class V
---
1,7 2/
1/ PDA applies to subgroup 1.
2/ Subgroup 7, if not tested, shall be guaranteed to the limits specified in table I.
3/ Delta limits as specified in table IIB shall be required where specified,
and the delta limits shall be completed with reference to the zero hour
electrical parameters (see table I).
TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. 1/
Parameters
Symbol
Endpoint limit
Delta limits
Min
Max
Min
Max
Units
Input offset voltage
VOS
-300
300
-200
200
V
Input bias current
+IB
-30
30
-4
4
nA
-IB
-30
30
-4
4
nA
1/ VS = 15 V and VCM = 0 V. Deltas are performed at room temperature.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
15
4.4.1 Group A inspection.
a.
Tests shall be as specified in table IIA herein.
b.
Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b.
TA = +125C, minimum.
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a.
End-point electrical parameters shall be as specified in table IIA herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
TA = +25C 5C, after exposure, to the subgroups specified in table IIA herein.
4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883
method 1019 condition A and condition D as specified herein.
4.4.4.1.1 Accelerated annealing test. Accelerated annealing tests shall be performed on all devices requiring a RHA level
greater than 5 krads(Si). The post-anneal end-point electrical parameter limits shall be as specified in table I herein and shall be
the pre-irradiation end-point electrical parameter limit at +25C 5C. Testing shall be performed at initial qualification and after
any process or design changes which may affect the RHA response of the device.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
16
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in
MIL-HDBK-103 and QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein)
to DLA Land and Maritime-VA and have agreed to this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime-VA.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89677
A
REVISION LEVEL
K
SHEET
17
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 16-01-07
Approved sources of supply for SMD 5962-89677 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8967701CA
01295
LT1014AMJB
60264
MTLT1014AQD
3/
LT1014AMJ/883
5962-8967701XA
60264
MTLT1014AQWB
5962-89677012A
01295
LT1014AMFKB
60264
MTLT1014AQLS
01295
LT1014MJB
60264
MTLT1014QD
3/
LT1014MJ/883
5962-8967702DA
3/
LT1014MW/883
5962-8967702XA
60264
MTLT1014QWB
3/
LT1014MW/883
01295
LT1014MFKB
60264
MTLT1014QLS
5962R8967703VCA
64155
RH1014MJ
5962R8967703VDA
64155
RH1014MW
5962-8967702CA
5962-89677022A
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
1 of 2
STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued
DATE: 16-01-07
Vendor CAGE
number
Vendor name
and address
01295
Texas Instruments, Inc.
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
60264
Minco Technology Labs, Inc.
1805 Rutherford Lane
Austin, TX 78754-5101
64155
Linear Technology Corporation
1630 McCarthy Boulevard
Milpitas, CA 95035-7417
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
2 of 2